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Four Year, B. Tech Second Year, 3rd SEMESTER Batch 2009 (Electronics and Communication Engineering) Scheme of Papers

This document outlines the scheme of courses for the second year, third semester of the Electronics and Communication Engineering program. It lists 10 courses with their course codes, titles, credits, and brief descriptions. Some key courses covered include Electronic Devices, Electrical and Electronic Instrumentation, Electromagnetic Field Theory, Measurement Science and Techniques, and Visual Programming. The document also notes that some courses like the labs do not include a theory exam. It recommends textbooks for each course.

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Garry Mehrok
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© © All Rights Reserved
Available Formats
Download as DOC, PDF, TXT or read online on Scribd
0% found this document useful (0 votes)
65 views

Four Year, B. Tech Second Year, 3rd SEMESTER Batch 2009 (Electronics and Communication Engineering) Scheme of Papers

This document outlines the scheme of courses for the second year, third semester of the Electronics and Communication Engineering program. It lists 10 courses with their course codes, titles, credits, and brief descriptions. Some key courses covered include Electronic Devices, Electrical and Electronic Instrumentation, Electromagnetic Field Theory, Measurement Science and Techniques, and Visual Programming. The document also notes that some courses like the labs do not include a theory exam. It recommends textbooks for each course.

Uploaded by

Garry Mehrok
Copyright
© © All Rights Reserved
Available Formats
Download as DOC, PDF, TXT or read online on Scribd
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Four year, B.

Tech
Second Year, 3rd SEMESTER
Batch 2009
(Electronics and Counication En!ineerin!"
SC#EME $F %&%ERS
C$'
E
T( T)E $F %&%ER
)$&'
) T % CR.
ECE
201
Electronic
Devices
3 1 0 3.5
ECE
202
Electrical and
Electronic
Instrumentation
3 1 0 3.5
ECE
203
Electro-Magnetic
Field Theor
3 1 0 3.5
ECE
205
Measurement !cience
" Techni#ues
3 1 0 3.5
C$E
20%
&isual
$rogramming
3 1 0 3.5
'(!
201
)umerical Methods "
a**lications
3 1 0 3.5
ECE
251
Electronic
Devices +a,-
0 0 2 1.0
C$E
25%
&isual
$rogramming +a,-
0 0 2 1.0
'(!
251
)umerical Methods "
a**lications +a,-
0 0 2 1.0
--
1. % % 2*
Total contact hours/ 30
- ECE 2510 C$E 25%0 '(! 251 are *ractical *a*ers onl. There 1ill not ,e an
theor e2amination 3or these *a*ers.
- - In addition to a,ove mentioned su,4ects0 there 1ill ,e an additional course on
Environmental !cience as a #uali3ing su,4ect.
ECE 20+ E)ECTR$,(C 'E-(CES
) T % Cr
3 + 0
3..
Section/&
Seiconductor 'iodes0 5ualitative analsis o3 a $-) 4unction as a diode0 &-I characteristics and
its tem*erature de*endence0 'rea6 do1n diodes0 &aractor diode0 Tunnel diode0 !emiconductor
*hoto voltaic e33ect0 +ight emitting diodes.
&11lication o2 'iodes 0 Diodes as a cli**er0 Diode as a clam*er0 !am*ling gate0 Diode as a
recti3ier/ 7al3 1ave recti3ier0 Full 1ave recti3ier0 'ridge recti3ier0 ri**le 3actor0 regulation0
ca*acitor in*ut 3ilters0 inductor in*ut 3ilter0 +-t*e and 8 t*e-3ilters0 Electronic &oltage regulator
9!eries and !hunt t*e:.
Section/B
Transistor Characteristics0 ;unction transistor current com*onents0 Transistor as an am*li3ier0
Transistor construction/ Common ,ase0 Common emitter0 Common collector con3iguration0
&arious regions0 *hoto transistor0 <ni-4unction transistor.
Transistor at )o3 2re4uencies 0 =ra*hical analsis o3 CE con3iguration t1o *ort devices and
h,rid model0 h-*arameters0 Conversion 3ormulas 3or *arameters o3 three con3igurations.
(nalsis o3 a transistor am*li3ier circuit using h-*arameter0 Miller theorem " its dual0
com*arison o3 am*li3ier con3iguration.
Section/C
Transistor Biasin! and Theral Sta5ili6ation0 >*erating *oint0 'ias sta,ilit0 !ta,ili?ation
against variation in lco0 &'E and @0 !el3 ,ias circuit0 Com*ensation0 Thermal run a1a0 Thermal
sta,ilit.
Field E22ect Transistors0 ;unction 3ield e33ect transistor0 $inch o33 voltage0 ;FET characteristics0
and e#uivalent circuit0 M>!FET!0 Their construction and characteristics0 'iasing o3 ;FETs.
Section/'
Thyristors0 Construction and characteristics o3 3our laer diodes0 9$)$):. The silicon controlled
recti3ier " TAI(C.
(nte!rated Circuits0 IC technolog0 ,asic Monolithic ICBs E*ito2ial gro1th0 Mas6ing and
etching0 Di33usion o3 im*urities0 Transistors 3or Monolithic ICBs0 Monolithic ICBs0 Monolithic
diodes0 Integrated resistors0 ca*acitors and inductors0 Isolation methods0 'asics o3 M!I0 +!I and
&+!I chi*s.
REC$MME,'E' B$$7S0
1. Integrated Electronics , Millman " 7al6ias Mc-=ra1 7ill $u,lication 1CCD edition.
2. Electronic Devices and circuits0 MC-=ra1 7ill $u,lication 1CCD edition , Millman
" 7al6ias.
3. Electronic Devices and Circuits0 !. !alivahanan etal0 Tata Mc=ra1 hill 0 )e1 Delhi
ECE 202 E)ECTR(C&) &,' E)ECTR$,(CS (,STR8ME,T&T($,
) T % Cr
3 + 0 3..
Section/&
&>+T(=E " C<AAE)T ME(!<AEME)T /- Measurement o3 d.c. " a.c. current "
voltageE 'asics o3 indicating instruments.
$rinci*le o3 o*eration and 1or6ing o3 $MMC0 dnamometer0 Moving Iron0 Aecti3ier and
Thermocou*le Instruments. &T&M0 T&M-Aam* T*e0 Integrating T*e0 $otentiometric
T*e0 !uccessive a**ro2imation T*e0 continuous 'alance T*e.
Section/B
A+C Measurements/- Measurement o3 DC medium resistance 91heatstone method.: (C
1heatstone 'ridge0 Ma21ell0 7a0 Fien and !chering 'ridge0 T1in-T " 'ridged-T null
net1or6s0 5 Meter.
Section/C
CA> " Dis*la Devices/- 'asic 'loc6 diagram0 3unctions o3 'loc6s " 'asic CA>
circuits0 Measurement o3 voltage0 current0 3re#uenc and *hase angle0 Dual ,eam
oscillosco*e0 digital dis*la devices/ construction " 1or6ing *rinci*le-+ED0 +CD0 )i2ie
tu,e0 Magnetic Aecorders0 Digital recorders0 Introduction o3 digital storage oscillosco*e.
Section/'
Fre#uenc " $eriod measurement/- 7eterodne 3re#uenc meter0 Ca*acitor charge
discharge method0 $ulse counting method0 Digital 3re#uenc meter0 $eriod measurement.
Measurement o3 $o1er/ - Measurement o3 $o1er using 'olometer 'ridge method0
Fattmeter/ *rinci*le o3 o*eration o3 dnamometer T*e " Induction T*e0 Measurement
o3 $o1er " $o1er 3actor using one 1attmeter0 t1o 1attmeter " 3 1attmeter method.
Recoended Boo9s0/
9a: Electrical " electronic Measurement " Instrumentation , (.G.!a1hne0
Dhan*at Aai " !ons.
9,: Electronic Instrumentation " Measurement Techni#ues , F.D.Coo*er0 $7I0
)e1 Delhi.
9c: Electronic Measuremnet , Terman " $ettit/ Tata MC=ra1 7all.
9d: Electronic Instrumentation , 7.!.Galsi.
ECE 203 E)ECTR$ M&:,ET(C F(E)' T#E$RY
) T % Cr
3 + 0 3..
Section/&
Conce1ts o2 ;ector al!e5ra< Del o*erator0 Curl0 Divergence0 =radient0 +a*lacian >*erator
=auss divergence theorem0 !to6es theorem.
Electrostatic Fields0 Aevie1 o3 Coulom,Bs la10 =aussian la10 +a*laceHs and $oissonHs e#uation
in various coordinate sstems0 E33ect o3 dielectric on ca*acitance0 'oundar conditions at electric
inter3aces.
Section/B
Electroa!netic (nduction0 FaradaBs la10 sel3 and mutual inductance o3 transmission lines and
ca,les0 Energ stored in Electric and Magnetic 3ields.
Ma!netic Fields0 Interaction o3 currents and magnetic 3ields0 (m*ereBs la10 Magnetic vector
*otential0 'oundar conditions at magnetic inter3aces.
Section/C
Ma=3ell>s E4uation0 Continuit e#uation0 Conce*t o3 dis*lacement current0 Ma21ellBs
e#uation in integral and di33erential 3orm 3or static and time varing 3ields.
Electroa!netic ?a;es0 Fave e#uation0 $ro*agation o3 uni3orm *lane 1ave in 3ree s*ace and
conducting medium0 $olari?ation0 Ae3lection and Ae3raction o3 *lane 1aves0 !ur3ace im*edance.
Section/'
:uided 3a;es0 TE0 TM and TEM 1aves0 Fave motion ,et1een *arallel *lanes0 Conce*t o3
$ontingBs vector0 $ontingBs theorem0 $o1er loss in a *lane conductor.
Transission )ines0 Circuit re*resentation o3 *arallel *lane transmission lines0 $arallel
*lane transmission line 1ith losses0 +o1 loss AF and <7F transmission lines0 Distortion
less condition0 !mith Chart and its use in transmission lines.
REC$MME,'E' B$$7S0
1. Graus0 Electromagnetics0 Mc=ra1 7ill.0 )e1 Ior6
2. !adi6u0 Elements o3 Electromagnetics0 >23ord $ress.
3. G.D. $rasad0 (ntenna " Fave $ro*agation
J. F.7. 7at. Engineering Electromagnetics0 Mc=ra1 7ill0 )e1 Ior6
5. E.C. ;ordan0 Electromagnetic Faves and radiating sstems0 $rentice 7all o3 India0
)e1 Delhi.
%. T.(. ;ohn Engg. Electromagnetics " Fields.
ECE 205 ME(!<AEME)T !CIE)CE " TEC7)I5<E!
) T % CR
3 + 0 3..
Section/&
(ntroduction0 De3inition0 !igni3icance0 modes and a**lications o3 measurement sstems0
Instrument classi3ication0 =enerali?ed measurement sstem and its 3unctional elements0 In*ut-
out*ut con3iguration o3 measuring instruments0 Methods o3 correction 3or inter3ering "
modi3ing in*uts0 !tandards0 Cali,ration0 Introduction to !tatic characteristics and Dnamic
characteristics0 !election o3 instruments0 +oading e33ects.
Section/B
Error &nalysis0 T*es o3 errors0 Methods o3 error analsis0 !tatistical analsis0 =aussian error
distri,ution0 Chi-!#uare test 0 !igni3icance test0 Method o3 least s#uare0 =ra*hical re*resentation
and curve 3itting o3 data.
Section/C
Sensors and Transducers0 De3inition0 classi3ication0 'asic *rinci*le " a**lications o3
Aesistive0 Inductive0 Ca*acitive0 $ie?oelectric0 7all-E33ect0 *hoto electric transducer0 load cell
and Digital Transducers0 selection o3 sensors0 Aecent trends and smart sensors0 Instrumentation
(m*li3iers.
Measureent o2 %araeters0 Measurement o3 Tem*erature0 $ressure0 Flo10 !*eed0 Force0
Tor#ue0 +evel0 Concentration 9Conductivit and *7: measurement0 &oltage 9$MMC0 Dual slo*e:0
Current and $o1er.
Section/'
Teleetry, 'is1lay de;ices @ Recorders0 Telemetr " Aemote !ensing0 &arious dis*la
devices " Aecorders0 CA> 9,asic ,loc6 diagram0 de3lection sensitivit0 voltage0 current0
3re#uenc and *hase angle measurement:0 digital 3re#uenc meter.

Recoended Boo9s0
&uthor Title %u5lisher
(run 6 ghosh/ Introduction to measurement and instrumentation $7I
7.). )orton 7and,oo6 o3 Transducers $rentice 7all Inc
E.>. Doe,elin Measurement !stems0 (**lications " Design Mc=ra1 7ill
;.$. 7olman E2*erimental Methods 3or Engineers Mc=ra1 7ill
'.C. )a6ra and Instrumentation Measurement and (nalsis TM7
G.G. Chaudhri
(.G !a1hne Electrical and Electronic Measurements
and Instrumentation Dhan*at Aai " !ons

C%E 20A -(S8&) %R$:R&MM(,:
) T % CR
3 + 0 3..
SECT($,/&
(ntroduction to -isual Basic0 Creating <ser Inter3aces 1ith Findo1s Common Controls0
Creating Menus 3or our $rograms0 (dvance Design Features0 For6ing 1ith Collections0
Creating Classes in a $rogram.
SECT($,/B
For6ing 1ith 3orms0 dra1ing 1ith &'0 Multi*le document inter3ace0 ,asic (ctive K controls0
advanced active K controls.
E=tendin! the Ca1a5ilities o2 -isual Basic0 Declaring and using E2ternal Functions0 Creating
(ctive K Control 1ith &isual 'asic.
SECT($,/C
(nte!ratin! -isual Basic 3ith the (nternet0 Friting Internet (**lication 1ith &isual 'asic0
1e, ,ro1sing o,4ects0 using document o,4ect0 (ctive !erver $ages0 using 1e, ,ro1ser controls0
using histor o,4ects.
SECT($,/'
Creatin! 'ata5ase &11lications0 (ccessing Data 1ith Data Control.
<sing visual data manager0 validating data0 selected data 1ith !5+0 advanced data ,ound
controls0 active data o,4ects0 (D> data o,4ects.
REC$MME,'E' B$$7S0
1. &isual 'asic %.0 )o E2*erienced Ae#uired , '$' $u,lication.
2. Mastering &isual ,asic %.0 , '$' $u,lications.
3. !ilver " !*ots0 L!*ecial Edition using &isual 'asic %.0L0 $7I.
J. $rogramming 1ith &isual 'asic %0 TM7.
B&S 20+ ,8MER(C&) MET#$'S @ &%%)(C&T($,S
) T % CR
3 + 0 3..
Section/&
Solution o2 al!e5raic and Transcendental E4uations0 Conditions 3or the convergence o3 the
iteration method0 rate o3 convergence o3 the interactive method0 com*arison o3 3alse *osition0
)e1ton-Aa*hson and secant methods0 conversion o3 a divergent 3unctional iteration scheme into
a convergent one. (cceleration o3 convergence0 error ,onds0 )e1ton-Aa*hson method 3or non-
linear sstem o3 e#uations.
Section/B
,uerical Methods in )inear &l!e5ra 0 Com*utation o3 determinant0 *ivot0 *artial and
com*lete *ivoting techni#ue0 triangulari?ation algorithm0 triangular decom*osition o3 a matri20
*ro*erties o3 triangular matrices0 least s#uares curve 3itting0 solution o3 homogeneous linear
sstems0 matri2inversion0 =aussian elimination0 3actori?ations0 ;aclo,iBs and =auss-!iedal
method0 solution o3 tridiagonal sstems0 Eigenvalues and eigenvectors o3 a matri20
diagonali?ation o3 a matri20 *o1er method 3or least eigenvalue0 eigenvectors as solutions o3
homogeneous e#uations.
Section/C
Inter*olation and *olnomial a**ro2imation0 +angrange a**ro2imation0 )e1ton *olnomials.
,uerical 'i22erentiation and (nte!ration 0 )umerical di33erentiation using 3inite di33erences0
numerical integration0 )e1ton-cotes 3ormulae-Tra*e?oidal rule 3or integration0 !im*sonBs 1M3
rule0 !im*sonBs 3M. rule.
Section/'
,uerical Solution o2 'i22erential E4uations0 )umerical solution o3 3irst order ordinar
di33erential e#uations using TalorBs series0 $icardBs EulerBs Modi3ied EulerBs method0 Aunge-
Gutta method o3 3ourth order0 $redictor-corrector method 9MilneBs method and (damBs method:0
choice o3 method0 sta,ilit o3 numerical integration *rocedure. 'oundar value *ro,lems 3or
ordinar di33erential e#uation , 3inite di33erence method.
REC$MME,'E' B$$7S0
1. )umerical Method 3or Mathematics0 !cience " Engineering , ;onn 7. Mathe1s0
$7I
2. )umerical Method in Engineering and !cience , '.!. =re1al0 Ghanna $u,lishers.
3. )umerical (lgorithms , E& Grishnamurth " !.G. !en0 a33iliated East-Fest $ress $vt.
+td.
ECE 2.+ E)ECTR$,(C 'E-(CES )&B
) T % CR
0 0
2 +.0
)ist o2 E=1erients
1. !tud o3 h-$arameters o3 CE transistor.
2. !tud o3 h-$arameters o3 C' transistor.
3. !tud o3 &-I characteristics o3 $hotodiode.
J. !tud o3 &-I characteristics o3 *hoto transistor.
5. !tud o3 &-I characteristics o3 ;FET.
%. !tud o3 &I characteristics o3 M>!FET.
D. !tud o3 Cli**ing " clam*ing CGT using Diode.
.. !tud o3 &-I characteristics o3 !CA.
C. !tud o3 Diode as recti3ier.
10. !tud o3 di33erent 3ilters.
11. !tud o3 &-I characteristics o3 DI(C
12. !tud o3 &-I characteristics o3 TAI(C.
C%E / 2.A -isual %ro!rain! )a5
) T % Cr
0 0 2 +.0
1 Frite a Findo1s a**lication that 3unctions li6e a Mathematical Calculator.
2. Frite a 1indo1s a**lication that 3unctions li6e a !to*1atch.
3. Frite a 1indo1s a**lication that 3unctions li6e a )ote*ad 9using Menu Editor0
Common Dialog Control0 Te2t,o2Hs *ro*erties:.
J. Frite a Findo1s a**lication demonstrating the use o3 Collections.
5. Frite a 1indo1s a**lication that determines a studentHs letter grade 9using !elect Case:.
%. Frite a 1indo1s a**lication that uses gra*hical methods to dra1 directl on a 3orm.
D. Frite a 1indo1s a**lication demonstrating the use o3 (D>+:C
.. Frite a Findo1s a**lication 3or ,uilding a generic control.
C. Frite a 1indo1s a**lication 3or dis*laingH em*loeeHs in3ormation and modi3ing
his salar , given *ercentage 9using Classes:.
10. Frite a Findo1s a**lication that tiles a *icture across a 3ormHs ,ac6ground at runtime.
11. Frite a 1indo1s a**lication demonstrating various MDI 3eatures su**orted in
&'%.
10. Frite a Findo1s a**lication demonstrating the use o3 File Controls.
B&S/2.+ ,uerical Methods @ &11lications )a5
) T % CR
0 0 2 +.0
+ist o3 E2*eriments/
1. F($ to im*lement Aegular Falsi Method.
2. F($ to im*lement !ecant Method.
3. F($ to im*lement )e1ton-Aa*hson Method
J. F($ to im*lement =auss-Elimination Method
5. F($ to im*lement =auss-!iedal Method
%. F($ to im*lement Tra*e?oidal Aule
D. F($ to im*lement !im*sonHs Aule
.. F($ to im*lement EulerHs Method
C. F($ to im*lement Aunge-Gutta Method
10. F($ to im*lement $redictor Corrector Method
11. F($ to im*lement $o1er Method

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