TLA TechSpecs
TLA TechSpecs
ZZZ
Tektronix Logic Analyzer Series Product Specications & Performance Verication Technical Reference Manual
www.tektronix.com
077-1763-03
Copyright Tektronix. All rights reserved. Licensed software products are owned by Tektronix or its subsidiaries or suppliers, and are protected by national copyright laws and international treaty provisions. Tektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication supersedes that in all previously published material. Specications and price change privileges reserved. TEKTRONIX and TEK are registered trademarks of Tektronix, Inc. MagniVu and iView are registered trademarks of Tektronix, Inc.
Contacting Tektronix
Tektronix, Inc. 14200 SW Karl Braun Drive P.O. Box 500 Beaverton, OR 97077 USA For product information, sales, service, and technical support: In North America, call 1-800-833-9200. Worldwide, visit www.tektronix.com to nd contacts in your area.
Warranty 2
Tektronix warrants that this product will be free from defects in materials and workmanship for a period of one (1) year from the date of shipment. If any such product proves defective during this warranty period, Tektronix, at its option, either will repair the defective product without charge for parts and labor, or will provide a replacement in exchange for the defective product. Parts, modules and replacement products used by Tektronix for warranty work may be new or reconditioned to like new performance. All replaced parts, modules and products become the property of Tektronix. In order to obtain service under this warranty, Customer must notify Tektronix of the defect before the expiration of the warranty period and make suitable arrangements for the performance of service. Customer shall be responsible for packaging and shipping the defective product to the service center designated by Tektronix, with shipping charges prepaid. Tektronix shall pay for the return of the product to Customer if the shipment is to a location within the country in which the Tektronix service center is located. Customer shall be responsible for paying all shipping charges, duties, taxes, and any other charges for products returned to any other locations. This warranty shall not apply to any defect, failure or damage caused by improper use or improper or inadequate maintenance and care. Tektronix shall not be obligated to furnish service under this warranty a) to repair damage resulting from attempts by personnel other than Tektronix representatives to install, repair or service the product; b) to repair damage resulting from improper use or connection to incompatible equipment; c) to repair any damage or malfunction caused by the use of non-Tektronix supplies; or d) to service a product that has been modied or integrated with other products when the effect of such modication or integration increases the time or difculty of servicing the product. THIS WARRANTY IS GIVEN BY TEKTRONIX WITH RESPECT TO THE PRODUCT IN LIEU OF ANY OTHER WARRANTIES, EXPRESS OR IMPLIED. TEKTRONIX AND ITS VENDORS DISCLAIM ANY IMPLIED WARRANTIES OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE. TEKTRONIX RESPONSIBILITY TO REPAIR OR REPLACE DEFECTIVE PRODUCTS IS THE SOLE AND EXCLUSIVE REMEDY PROVIDED TO THE CUSTOMER FOR BREACH OF THIS WARRANTY. TEKTRONIX AND ITS VENDORS WILL NOT BE LIABLE FOR ANY INDIRECT, SPECIAL, INCIDENTAL, OR CONSEQUENTIAL DAMAGES IRRESPECTIVE OF WHETHER TEKTRONIX OR THE VENDOR HAS ADVANCE NOTICE OF THE POSSIBILITY OF SUCH DAMAGES.
Table of Contents
Preface ............................................................................................................... Related Documentation ....................................................................................... Specications and Characteristics ................................................................................ Characteristic Tables .......................................................................................... Atmospheric Characteristics for the Tektronix Logic Analyzer Family ................................. TLA7000 System Specications.................................................................................. TLA7012 Portable Mainframe Specications ................................................................... TLA7016 Benchtop Mainframe Characteristics ............................................................... TLA7PC1 Controller Specications............................................................................. TL708EX TekLink 8-Port Hub Characteristics ................................................................ TLA700 System Specications .................................................................................. TLA715 Dual Monitor Portable Mainframe Specications................................................... Benchtop and Expansion Mainframe Specications........................................................... TLA721 Dual Monitor Benchtop Controller Specications .................................................. TLA600 Series Specications.................................................................................... TLA7Axx/TLANAx Series Logic Analyzer Module Specications ........................................ TLA7Lx/Mx/Nx/Px/Qx Module Specications................................................................ TLA7PG2 Module Specications ............................................................................... DSO Module Specications ...................................................................................... External Oscilloscope (iView) Characteristics ................................................................. Performance Verication Procedures............................................................................ Summary Verication ........................................................................................ Test Equipment................................................................................................ Functional Verication ....................................................................................... Certication ................................................................................................... Performance Verication Procedures ....................................................................... Calibration Data Report........................................................................................... TLA7012 and TLA7016 Test Record ...................................................................... System Clock Test Data ...................................................................................... v v 1 1 2 3 9 14 19 22 24 29 34 38 41 52 62 68 71 76 78 78 78 79 81 81 83 83 83
Table of Contents
List of Figures
Figure 1: Figure 2: Figure 3: Figure 4: Figure 5: Figure 6: Figure 7: Figure 8: Dimensions of the TLA7012 Portable mainframe ................................................. Dimensions of the TLA7016 Benchtop mainframe ................................................ Dimensions of the TLA7016 Benchtop mainframe with rackmount option..................... Dimensions of the TLA7PC1 Benchtop PC Controller............................................ Dimensions of TLA715 Portable mainframe ....................................................... Dimensions of the benchtop and expansion mainframe ........................................... Dimensions of the benchtop and expansion mainframe with rackmount option................ Dimensions of the TLA600 series logic analyzer .................................................. 13 18 18 21 33 36 37 51
List of Tables
Table 1: Atmospheric characteristics............................................................................. Table 2: TLA7000 Backplane interface.......................................................................... Table 3: System trigger and external signal input latencies (Typical) ........................................ Table 4: System trigger and external signal output latencies (Typical) ....................................... Table 5: Intermodule latencies for LA source (Typical)........................................................ Table 6: TLA7000 External signal interface .................................................................... Table 7: TLA7012 Internal controller ............................................................................ Table 8: TLA7012 Display system .............................................................................. Table 9: TLA7012 Front-panel interface ....................................................................... Table 10: TLA7012 Rear-panel interface ....................................................................... Table 11: TLA7012 AC power source .......................................................................... Table 12: TLA7012 Portable mainframe transportation and storage ........................................ Table 13: TLA7012 Cooling ..................................................................................... Table 14: TLA7012 Mechanical ................................................................................. Table 15: TLA7016 Benchtop mainframe AC power source (Serial numbers B020000 and higher).... Table 16: TLA7016 Benchtop mainframe AC power source (Serial numbers B01000 B019999)..... Table 17: TLA7016 Benchtop mainframe transportation and storage....................................... Table 18: TLA7016 Benchtop mainframe cooling ............................................................ Table 19: Enhanced monitor ..................................................................................... Table 20: TLA7016 Benchtop mainframe Interface Module front panel characteristics .................. Table 21: TLA7016 Benchtop mainframe mechanical ........................................................ Table 22: TLA7PC1 Internal specications .................................................................... Table 23: External controls and connectors .................................................................... 2 3 4 5 6 7 9 10 11 11 11 12 12 13 14 14 15 15 16 16 17 19 20
ii
Table of Contents
Table 24: Table 25: Table 26: Table 27: Table 28: Table 29: Table 30: Table 31: Table 32: Table 33: Table 34: Table 35: Table 36: Table 37: Table 38: Table 39: Table 40: Table 41: Table 42: Table 43: Table 44: Table 45: Table 46: Table 47: Table 48: Table 49: Table 50: Table 51: Table 52: Table 53: Table 54: Table 55: Table 56: Table 57: Table 58: Table 59: Table 60: Table 61: Table 62: Table 63: Table 64:
TLA7PC1 mechanical................................................................................. TL708 EX TekLink 8-Port Hub signal switching characteristics ................................ TL708EX TekLink 8-Port Hub AC power source characteristics................................ TL708EX TekLink 8-Port Hub atmospherics ...................................................... TL708EX TekLink 8-Port Hub miscellaneous ..................................................... TL708EX TekLink 8-Port Hub mechanical ........................................................ TLA700 Backplane interface......................................................................... TLA700 Backplane latencies......................................................................... TLA700 External signal interface ................................................................... TLA715 Internal controller ........................................................................... TLA715 display system............................................................................... TLA715 front-panel interface ........................................................................ TLA715 rear-panel interface ......................................................................... TLA715 AC power source............................................................................ TLA715 cooling ....................................................................................... TLA715 mechanical................................................................................... Benchtop and expansion mainframe AC power source ........................................... Benchtop and expansion mainframe cooling ....................................................... Enhanced monitor ..................................................................................... Benchtop and expansion mainframe mechanical................................................... TLA721 benchtop controller characteristics........................................................ Front panel characteristics ............................................................................ TLA600 input parameters with probes .............................................................. TLA600 timing latencies ............................................................................. TLA600 external signal interface .................................................................... TLA600 channel width and depth ................................................................... TLA600 clocking ...................................................................................... TLA600 trigger system ............................................................................... TLA600 MagniVu feature ............................................................................ TLA600 Data handling................................................................................ TLA600 internal controller ........................................................................... TLA600 display system............................................................................... TLA600 front-panel interface ........................................................................ TLA600 rear-panel interface ......................................................................... TLA600 AC power source............................................................................ TLA600 cooling ....................................................................................... TLA600 mechanical characteristics ................................................................. TLA7Axx/TLA7NAx input parameters (with probes) ............................................ TLA7Axx analog output .............................................................................. Channel width and depth.............................................................................. Clocking ................................................................................................
21 22 22 23 23 23 24 25 27 29 30 31 31 31 32 32 34 34 35 35 38 40 41 41 42 43 44 45 47 47 47 48 49 49 50 50 50 52 53 53 53
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Table of Contents
Table 65: TLA7Axx/TLA7NAx module trigger system ...................................................... Table 66: MagniVu acquisition .................................................................................. Table 67: Merged modules ....................................................................................... Table 68: Data placement......................................................................................... Table 69: NVRAM ................................................................................................ Table 70: Mechanical ............................................................................................. Table 71: LA module channel width and depth ................................................................ Table 72: LA module clocking................................................................................... Table 73: LA module trigger system ............................................................................ Table 74: LA module MagniVu feature ......................................................................... Table 75: LA module data handling ............................................................................. Table 76: LA module input parameters with probes........................................................... Table 77: LA module mechanical ............................................................................... Table 78: PG module electrical specication, operational mode............................................. Table 79: PG module clocking ................................................................................... Table 80: PG module event processing ......................................................................... Table 81: PG module inter-module interactions ............................................................... Table 82: PG module merged PG modules ..................................................................... Table 83: PG module mechanical................................................................................ Table 84: DSO module signal acquisition system ............................................................. Table 85: DSO module timebase system ....................................................................... Table 86: DSO module trigger system .......................................................................... Table 87: DSO module front-panel connectors ................................................................ Table 88: DSO module mechanical ............................................................................. Table 89: External oscilloscope (Integrated View or iView) characteristics ................................ Table 90: TDS1000B, TDS2000B, TDS1000, and TDS2000 Series oscilloscope waveform edge alignment ...................................................................................................... Table 91: Test equipment ......................................................................................... Table 92: Functional verication procedures................................................................... Table 93: Performance verication procedures ................................................................
58 60 60 61 61 61 62 62 64 66 66 66 67 68 69 70 70 70 70 71 73 73 75 75 76 77 78 79 81
iv
Preface
This document lists characteristics and specications of the following Tektronix Logic Analyzer Family products: TLA7000 series mainframes TLA7PC1 Controller TL708EX TekLink 8-Port Hub TLA700 series mainframes TLA600 series logic analyzers TLA7Axx/TLA7Nx series logic analyzer modules TLA7Lx/Mx/Nx/Px/Qx series logic analyzer modules TLA7PG2 pattern generation modules DSO digital storage oscilloscope modules Other Tektronix Logic Analyzer modules, microprocessor-related products, and individual logic analyzer probes have their own documentation for characteristics and specications. This document also contains performance verication procedures for the TLA7000 Series mainframes. To prevent personal injury or damage consider the following requirements before attempting service: Read the General Safety Summary and Service Safety Summary found in the Tektronix Logic Analyzer Family Product Safety & Compliance Instructions (Tektronix part number 071-2591-xx).
Related Documentation
Refer to the individual service manuals for the performance verication procedures and adjustment procedures for earlier TLA products. The following table lists related documentation available for your logic analyzer. The documentation is available on the TLA Documentation CD and on the Tektronix Web site (www.tektronix.com/manuals). You can also check the release notes on the instrument for additional information. To access the release notes, select Start > All Programs > Tektronix Logic Analyzer > TLA Release Notes.
Preface
Related Documentation
Item TLA Quick Start User Manuals Online Help Purpose High-level operational overview In-depth operation and UI help Location
High-level installation information Detailed rst-time installation information Logic analyzer basics
Declassication and Securities instructions Application notes Product Specications & Performance Verication Procedures TPI.NET Documentation Field upgrade kits Optional Service Manuals
Data security concerns specic to sanitizing or removing memory devices from Tektronix products Collection of logic analyzer application specic notes TLA Product specications and performance verication procedures Detailed information for controlling the logic analyzer using .NET Upgrade information for your logic analyzer Self-service documentation for modules and mainframes
vi
Characteristic Tables
All specications are guaranteed unless noted Typical. Typical characteristics describe typical or average performance and provide useful reference information. Specications that are marked with the symbol are checked directly (or indirectly) using performance verication procedures. For mainframes and modules, the performance limits in this specication are valid with these conditions: The logic analyzer must be in an environment with temperature, altitude, humidity, and vibration within the operating limits described in these specications. The logic analyzer must have had a warm-up period of at least 30 minutes. For modules, the performance limits in this specication are valid with these conditions: The modules must be installed in a Logic Analyzer Mainframe. The module must have been calibrated/adjusted at an ambient temperature between +20 C and +30 C. The DSO module must have had its signal-path-compensation routine (self calibration or self cal) last executed after at least a 30 minute warm-up period. After the warm-up period, the DSO module must have had its signal-path-compensation routine last executed at an ambient temperature within 5 C of the current ambient temperature. For optimum performance using an external oscilloscope, please consult the documentation for any external oscilloscopes used with your Tektronix Logic Analyzer to determine the warm-up period and signal-path compensation requirements.
For TLA7012 instruments, the operating temperature is +5 C to +45 C, 11 C/hr maximum gradient, noncondensing (derated 1 C per 1000 ft above 5000 ft (1524 m) altitude) TLA7Axx series module operating temperature is +40 C maximum. TLA7Axx series module operating humidity is 5% to 90% up to +30 C, 75% from +30 to +40 C, noncondensing. Maximum wet-bulb temperature is +29.4 C. TLA7NAx series module operating humidity is 5% to 90% up to +30 C, 75% from +30 to +40 C, 45 % from +40 to +50 C, noncondensing. Maximum wet-bulb temperature is +29.4 C. TLA7Axx/TLA7NAx series module nonoperating humidity is 5% to 90% limited by a wet bulb temperature of +40 C.
Description Portable mainframe Benchtop mainframe 4 13 10 MHz 100 ppm 2 ns 2 ns -3 ns 1 TLA7Nx/Px/Qx sample 0.5 ns 1 TLA7Axx/TLA7NAx sample 0.5 ns 1 TLA7Nx/Px/Qx sample 0.5 ns 2 ns 2 ns 4 ns
Includes typical jitter, slot-to-slot skew, and probe-to-probe variations to provide a "typical" number for the measurement. Assumes standard accessory probes are utilized. For time intervals longer than 1 ms between modules, add 0.01% of the difference between the absolute time measurements to the relative time correlation error to account for the inaccuracy of the CLK10 source.
Same mainframe tip 2 266 ns 626 ns 1202 ns 958 ns 30 ns 0,1) 3 212 ns + Clk 535 ns + Clk 1190 ns + Clk 950 ns 30 ns 0,1) 3 4 208 ns + Clk 627 ns + Clk 1186 ns + Clk 950 ns 30 ns
To expansion frame 202 ns 562 ns 1143 ns 1221 ns 30 ns 148 ns + Clk 471 ns + Clk 1118 ns + Clk 1220 ns 30 ns 144 ns + Clk 556 ns + Clk 1043 ns + Clk 1116 ns 30 ns
All system trigger and signal input latencies were measured from a falling edge transition (active true low) with signals in the wired-OR conguration. In the Waveform window, triggers are always marked immediately except when delayed to the rst sample. In the Listing window, triggers are always marked on the next sample period following their occurrence. Clk represents the time to the next master clock at the destination logic analyzer module. With asynchronous clocking this represents the delta time to the next sample clock. With synchronous sampling this represents the time to the next master clock generated by the setup of the clocking state machine and the supplied SUT clocks and qualication data. Signals 1 and 2 (ECLTRG0, 1) are limited to a broadcast mode where only one source can drive the signal node at any one time. The signal source can be used to drive any combination of destinations.
Same mainframe (skid) 2 376 ns + Smpl 794 ns + Smpl 1332 ns + Smpl 1170 ns 30 ns 0,1) 3 366 ns + Smpl 793 ns + Smpl 1328 ns + Smpl 950 ns 30 ns 379 ns + Smpl 803 ns + Smpl 1340 ns + Smpl 950 ns 30 ns (ECLTRG0,1) 3 4 374 ns + Smpl 793 ns + Smpl 1330 ns + Smpl 950 ns 30 ns
428 ns + Smpl 854 ns + Smpl 1390 ns + Smpl 1011 ns 30 ns 457 ns + Smpl 881 ns + Smpl 1418 ns + Smpl 1028 ns 30 ns 444 ns + Smpl 863 ns + Smpl 1399 ns + Smpl 1019 ns 30 ns
2 3 4
SMPL represents the time from the event to the next valid data sample at the probe tip of the LA module. With asynchronous sampling, this represents the delta time to the next sample clock. With MagniVu asynchronous sampling, this represents 500 ps or less. With synchronous sampling, this represents the time to the next master clock generated by the setup of the clocking state machine, the system-under-test supplied clocks, and the qualication data. Skid is commonly referred to as the system level system trigger and signaling output latency. This is the absolute time from when the event rst appears at the input probe tips of a module to when the corresponding event that it generates appears at the system trigger or external signal outputs. All signal output latencies are validated to the rising edge of an active (true) high output. Signals 1 and 2 (ECLTRG0, 1) are limited to a broadcast mode where only one source can drive the signal node at any one time. The signal source can be used to drive any combination of destinations.
Same mainframe
Frame to frame
(TTLTRG7) 1 2 66 ns + Smpl 108 ns + Smpl 82 ns + Smpl 105 ns 30 nsl 108 ns + Smpl + Clk 115 ns + Smpl + Clk 95 ns + Smpl + Clk 85 ns 30 ns 128 ns + Smpl 118 ns + Smpl 145 ns + Smpl 167 ns 30 ns 170 ns + Smpl +Clk 180 ns + Smpl + Clk 162 ns + Smpl +Clk 147 ns 30 ns
178 ns + Smpl + Clk 192 ns + Smpl + Clk 166 ns + Smpl + Clk 192 ns 30 ns
128 ns + Smpl + Clk 184 ns + Smpl + Clk 158 ns + Smpl + Clk 1012 ns 30 ns
In the Waveform window, triggers are always marked immediately except when delayed to the rst sample. In the Listing window, triggers are always marked on the next sample period following their occurrence. SMPL represents the time from the event to the next valid data sample at the probe tip of the LA module. With asynchronous sampling, this represents the delta time to the next sample clock. With MagniVu asynchronous sampling, this represents 500 ps or less. With synchronous sampling, this represents the time to the next master clock generated by the setup of the clocking state machine, the system-under-test supplied clocks, and the qualication data. Clk represents the time to the next master clock at the destination logic analyzer module. With ascynchronous clocking this represents the delta time to the next sample clock. With synchronous sampling this represents the time to the next master clock generated by the setup of the clocking state machine and the supplied SUT clocks and qualication data. Signals 1 and 2 (ECLTRG0, 1) are limited to a broadcast mode where only one source can drive the signal node at any one time. The signal source can be used to drive any combination of destinations.
Output Protection
Output Bandwidth 2
Outputs signals during valid acquisition periods, resets signals to false state between valid acquisitions Outputs 10 MHz clock continuously Short-circuit protected (to ground) Minimum bandwidth up to which the intermodule signals are specied to operate correctly Signal 1, 2 50 MHz square wave minimum Signal 3, 4 10 MHz square wave minimum
1 2
The Input Bandwidth specication only applies to signals to the modules; it does not apply to signals applied to the External Signal Input and sent back to the External Signal Output. The Output Bandwidth specication only applies to signals from the modules; it does not apply to signals applied to the External Signal Input and sent back to the External Signal Output.
Cache memory RTC, CMOS setup, & PNP NVRAM retention time (Typical) Bootable replaceable hard disk drive
Secondary video port with DVI digital and analog VGA signalling through an adapter
Maximum resolution on the analog VGA is 1600 x 1200 with 32-bit color at 75 Hz. Internal display Classication Color LCD (NEC TFT NL10276BC30-24D) Color LCD module NL10276BC30-24D is composed of the amorphous silicon thin lm transistor liquid crystal display (a-Si TFT LCD) panel structure with driver LSIs for driving the TFT (Thin Film Transistor) array and a backlight. This LCD display will be driven directly by the motherboard via LVDS signaling. 1024 pixels horizontal by 768 pixels vertical (1024X768) at 60 Hz refresh rate Area of 304 mm (11.7 in) by 228 mm (9 in) of viewing area. 262, 144 colors (6-bit RGB) with a color gamut of 42% at center to NTSC
10
11
12
Shipping conguration
13
Inrush surge current Steady state input current Power factor correction (Typical) ON/Standby switch and indicator
Table 16: TLA7016 Benchtop mainframe AC power source (Serial numbers B01000 B019999)
Characteristic Source voltage Maximum power consumption Fuse rating (Current and voltage ratings and type of fuse used to fuse the source line voltage) 90 V - 132 VACRMS Operation High-power/Low line (159-0379-00) 103 V - 250 VACRMS Operation (159-0256-00) Description 100 VRMS to 240 VRMS 10%, 45 Hz to 66 Hz 100 VRMS to 120 VRMS, 360 Hz to 440 Hz 1450 W line power (the maximum power consumed by a fully loaded, 6-module instrument) Safety: UL198G/CSA C22.2 Size: 0.25 in 1.25 in Style: Slow acting Rating: 20 A/250 V Safety: UL198G/CSA C22.2 Size: 0.25 in 1.25 in Style: No. 59/Fast acting Rating: 15 A/250 V Safety: IEC 127/Sheet 1 Size: 5 mm 20 mm Style: Fast acting "F", high-breaking capacity Rating: 6.3 A/250 V
14
Table 16: TLA7016 Benchtop mainframe AC power source (Serial numbers B01000 B019999) (cont.)
Characteristic Inrush surge current Steady state input current Power factor correction (Typical) ON/Standby switch and indicator Description 70 A maximum 16.5 ARMS maximum at 90 VACRMS 6.3 ARMS maximum at 207 VACRMS 0.99 at 60 Hz operation and 0.95 at 400 Hz operation Front Panel On/Standby switch with integral power indicator. Switch allows users to turn the instrument on. A soft power down is implemented so that users can turn off the instrument without going through the Windows shutdown process; the instrument powers down normally.
Slot activation
Pressurization Slot airow direction Mainframe air intake Mainframe air exhaust D Temperature readout sensitivity (Typical) Temperature sense range (Typical) Clearance
15
Table 20: TLA7016 Benchtop mainframe Interface Module front panel characteristics
Characteristic TekLink interface bus Input signal characteristics Output signal characteristics Reference clock characteristics External Trigger input External Signal input System Trigger output External Signal output GBit LAN port Description Connector supports Reference Clock (10 MHz), Power On Signaling, Run event, System Trigger, General purpose events LVDS compatible inputs via rear-panel 40-pin connector LVDS compatible outputs via rear-panel 40-pin connector LVDS compatible inputs via rear-panel 40-pin connector Trigger input routed to the system trigger line Signal input routed to one of four internal signals Internal system trigger routed as TTL-compatible output One of four internal signals routed to the signal output connector. The internal 10 MHz reference clock can be routed to this output. RJ-45 connector 10/100/1000 Mbps
16
Finish type
17
18
19
B02, B03 Source voltage and frequency Fuse Maximum power consumption Steady-state input current
20
21
22
Altitude
Cooling clearance
2.7 kg (5 lbs 14 oz) minimum conguration with power cord and accessories 4.66 kg (10 lbs 4 oz) minimum conguration Chassis parts are constructed of aluminum alloy; circuit boards constructed of glass laminate. Tektronix silver-gray
23
Description 4 10 (three slots taken up by the controller module) 13 10 MHz 100 ppm 2 ns 2 ns -3 ns 1 TLA7Lx/Mx/Nx/Px/Qx sample 0.5 ns 1 TLA7Axx/TLA7NAx sample 0.5 ns 1 TLA7Lx/Mx/Nx/Px/Qx sample 0.5 ns 2 ns 2 ns 4 ns 3 ns 2 ns 1 TLA7Lx/Mx/Nx/Px/Qx sample + 2 ns 1 TLA7Axx/TLA7NAx sample + 2 ns 3 ns 2 ns 3 ns
Includes typical jitter, slot-to-slot skew, and probe-to-probe variations to provide a "typical" number for the measurement. Assumes standard accessory probes are utilized.
24
2 3
For time intervals longer than 1 s between modules, add 0.01% of the difference between the absolute time measurements to the relative time correlation error to account for the inaccuracy of the CLK10 source. The DSO module time correlation is measured at the maximum sample rate on one channel only.
Description Expansion
-230 ns -617 ns -176 ns + Clk -176 ns + Clk -596 ns + Clk -615 ns + Clk 11 ns 412 ns + SMPL 830 ns + SMPL 402 ns + SMPL 415 ns + SMPL 828 ns + SMPL 836 ns + SMPL 385 ns + SMPL 385 ns + SMPL 817 ns + SMPL 817 ns + SMPL 104 ns 101 ns 111 ns 89 ns 92 ns 394 ns + SMPL 808 ns + SMPL 102 ns + SMPL 515 ns + SMPL 152 ns + SMPL 396 ns + SMPL
External signal input to TLA7Lx/Mx/Nx/Px/Qx probe tip via Signal 3, 4 External signal input to TLA7Axx/TLA7NAx probe tip via Signal 3, 4 External signal input to TLA7Axx/TLA7NAx probe tip via Signal 1, 2 External system trigger input to DSO probe tip System trigger and external signal output
4
56
latencies 1
(Typical) 376 ns + SMPL 794 ns + SMPL 366 ns + SMPL 379 ns + SMPL 792 ns + SMPL 800 ns + SMPL 364 ns + SMPL 364 ns + SMPL 796 ns + SMPL 796 ns + SMPL 68 ns 65 ns 75 ns 68 ns 71 ns 358 ns + SMPL 772 ns + SMPL 66 ns + SMPL 479 ns + SMPL 116 ns + SMPL 360 ns + SMPL
TLA7Lx/Mx/Nx/Px/Qx probe tip to external system trigger out TLA7Axx/TLA7NAx probe tip to external system trigger out TLA7Lx/Mx/Nx/Px/Qx probe tip to external signal out via Signal 3, 4 3 TLA7Axx/TLA7NAx probe tip to external signal out via Signal 3, 4 3 TLA7Lx/Mx/Nx/Px/Qx probe tip to external signal out via Signal 1, 2 3 6 TLA7Axx/TLA7NAx probe tip to external signal out via Signal 1, 2 3 6 DSO probe tip to external system trigger out DSO Probe tip to external signal out via Signal 3, 4 3 DSO probe tip to external signal out via Signal 1, 2 3 6 Inter-module latencies (Typical) TLA7Lx/Mx/Nx/Px/Qx to DSO inter-module system trigger TLA7Axx/TLA7NAx to DSO inter-module system trigger
14 14 14
OR function AND function OR function AND function normal function inverted logic on backplane normal function inverted logic on backplane OR function AND function normal function inverted logic on backplane
TLA7Lx/Mx/Nx/Px/Qx to TLA7Lx/Mx/Nx/Px/Qx inter-module system trigger TLA7Axx/TLA7NAx to TLA7Lx/Mx/Nx/Px/Qx inter-module system trigger TLA7Axx/TLA7NAx to TLA7Axx/TLA7NAx inter-module system trigger TLA7Lx/Mx/Nx/Px/Qx to DSO inter-module ARM
1 14
14
25
Description 779 ns + SMPL 108 ns + SMPL + Clk 479 ns + SMPL + Clk 111 ns + SMPL + Clk 116 ns + SMPL + Clk 113 ns + SMPL + Clk
156 15 15
815 ns + SMPL 144 ns + SMPL + Clk 533 ns + SMPL + Clk 147 ns + SMPL + Clk 137 ns + SMPL + Clk 134 ns + SMPL + Clk 555 ns + SMPL + Clk 152 ns + SMPL + Clk 160 ns + SMPL + Clk 581 ns + SMPL + Clk -251 ns + SMPL -204 ns -562 ns 86 ns -264 ns + SMPL + Clk -156 ns + Clk -564 ns + Clk 95 ns -158 ns + Clk -273 ns + SMPL + Clk -577 ns + Clk -258 ns + SMPL + Clk -148 ns + Clk -562 ns + Clk
TLA7Lx/Mx/Nx/Px/Qx to TLA7Lx/Mx/Nx/Px/Qx inter-module ARM TLA7Axx/TLA7NAx to TLA7Lx/Mx/Nx/Px/Qx inter-module ARM TLA7Axx/TLA7NAx to TLA7Axx inter-module ARM
156 15
TLA7Lx/Mx/Nx/Px/Qx to TLA7Lx/Mx/Nx/Px/Qx inter-module via Signal 1, 2 TLA7Axx/TLA7NAx to TLA7Axx inter-module via Signal 1, 2
156
TLA7Axx/TLA7NAx to TLA7Lx/Mx/Nx/Px/Qx inter-module via Signal 1, 2 TLA7AxxTLA7NAx to TLA7Axx inter-module via Signal 3, 4
15
534 ns + SMPL + Clk 116 ns + SMPL + Clk 124 ns + SMPL + Clk 545 ns + SMPL + Clk -287 ns + SMPL -240 ns -598 ns 50 ns
TLA7Lx/Mx/Nx/Px/Q to TLA7Lx/Mx/Nx/Px/Qx inter-module via Signal 3, 4 TLA7Axx/TLA7NAx to TLA7Lx/Mx/Nx/Px/Qx inter-module via Signal 3, 4 TLA7Lx/Mx/Nx/Px/Qx to TLA7Axx/TLA7NAx inter-module System Trigger DSO to TLA7Lx/Mx/Nx/Px/Qx inter-module System Trigger DSO to TLA7Axx/TLA7NAx inter-module System Trigger DSO to DSO inter-module System Trigger
4 15 4 4
15 14
TLA7Lx/Mx/Nx/Px/Qx to TLA7Axx/TLA7NAx inter-module ARM DSO to TLA7Lx/Mx/Nx/Px/Qx inter-module ARM DSO to TLA7Axx/TLA7NAx inter-module ARM DSO to DSO inter-module ARM DSO to TLA7Lx/Mx/Nx/Px/Qx inter-module via Signal 1, 2 DSO to TLA7Axx/TLA7NAx inter-module via Signal 1, 2
56 5 5
-294 ns + SMPL + Clk -598ns + Clk -294 ns + SMPL + Clk -184 ns + Clk -598 ns + Clk
TLA7Lx/Mx/Nx/Px/Qx to TLA7Axx/TLA7NAx inter-module via Signal 3, 4 DSO to TLA7Lx/Mx/Nx/Px/Qx inter-module via Signal 3, 4 DSO to TLA7Axx/TLA7NAx inter-module via Signal 3, 4
1
15
2 3 4 5
SMPL represents the time from the event at the probe tip inputs to the next valid data sample of the LA module. With Normal asynchronous sampling, this represents the delta time to the next sample clock. With MagniVu asynchronous sampling, this represents 500 ps or less. With synchronous sampling, this represents the time to the next master clock generated by the setup of the clocking state machine, the system-under-test supplied clocks, and the qualication data. All system trigger and external signal input latencies are measured from a falling-edge transition (active true low) with signals measured in the wired-OR conguration. All signal output latencies are validated to the rising edge of an active (true) high output. In the Waveform window, triggers are always marked immediately except when delayed to the rst sample. In the Listing window, triggers are always marked on the next sample period following their occurrence. "Clk" represents the time to the next master clock at the destination logic analyzer. With asynchronous sampling, this represents the delta time to the next sample clock beyond the minimum asynchronous rate of 4 ns. With the synchronous sampling, this represents the time to the next master clock generated by the setup of the clocking state machine and the supplied system under test clocks and qualication data. Signals 1 and 2 are limited to a "broadcast" mode of operation, where only one source is allowed to drive the signal node at any one time. That single source may be utilized to drive any combination of destinations.
26
27
Output Modes Level Sensitive Output Levels VOH VOL Output Bandwidth Active Period
Outputs signals during valid acquisition periods, resets signals to false state between valid acquisitions Outputs 10 MHz clock continuously Short-circuit protected (to ground) Minimum bandwidth up to which the intermodule signals are specied to operate correctly Signal 1, 2 50 MHz square wave minimum Signal 3, 4 10 MHz square wave minimum
1 2
The Input Bandwidth specication only applies to signals to the modules; it does not apply to signals applied to the External Signal Input and sent back to the External Signal Output. The Output Bandwidth specication only applies to signals from the modules; it does not apply to signals applied to the External Signal Input and sent back to the External Signal Output.
28
Interface Average seek time Average latency I/O data transfer rate Cache buffer CD-RW drive
29
Internal display
TFT (Thin Film Transistor) 26 cm active-matrix color LCD display, CCFL backlight, intensity controllable via software 800 X 600, 262, 144 colors with 211.2 mm (8.3 in) by 158.4 mm (6.2 in) of viewing area 262, 144 colors (6-bit RGB) with a color gamut of 42% at center to NTSC
30
Serial interface port SVGA output Port 1 and Port 2 PC CardBus32 port
31
32
33
Slot activation
Pressurization
34
Rackmount
35
Benchtop controller Expansion module Maximum per slot Rackmount kit adder Size Acoustic noise level (Typical) Benchtop controller Expansion module Variable fan speed (at 860 RPM) Full speed fan (switched at rear) Construction materials Finish type
36
Figure 7: Dimensions of the benchtop and expansion mainframe with rackmount option
37
Real-time clock and CMOS setups NVRAM RTC, CMOS setup, & PnP NVRAM retention time (Typical) Floppy disk drive
38
Interface Average seek time I/O data-transfer rate Average latency Cache buffer CD-RW Drive
39
40
Maximum nondestructive input signal to probe Minimum input pulse width signal (single channel) (Typical) Delay time from probe tip to input probe connector (Typical)
41
Description 376 ns + SMPL OR function AND function 364 ns + SMPL 364 ns + SMPL 366 ns + SMPL 379 ns + SMPL
All system trigger and external signal input latencies are measured from a falling-edge transition (active true low) with signals measured in the wired-OR conguration. In the Waveform window, triggers are always marked immediately except when delayed to the rst sample. In the Listing window, triggers are always marked on the next sample period following their occurrence. "Clk" represents the time to the next master clock at the destination logic analyzer. In the asynchronous (or internal) clock mode, this represents the delta time to the next sample clock beyond the minimum asynchronous rate of 4 ns. In the synchronous (or external) clock mode, this represents the time to the next master clock generated by the setup of the clocking state machine and the supplied system under test clocks and qualication data. Signals 1 and 2 (ECLTRG0, 1) are limited to a "broadcast" mode of operation, where only one source is allowed to drive the signal node at any one time. That single source may be utilized to drive any combination of destinations. SMPL represents the time from the event at the probe tip inputs to the next valid data sample. With asynchronous sampling, this represents the delta time to the next sample clock. With MagniVu asynchronous sampling, this represents 500 ps or less. With synchronous sampling, this represents the time to the next master clock generated by the setup of the clocking state machine, the system-under-test supplied clocks, and the qualication data.
4 5
42
Outputs signals during valid acquisition periods, resets signals to false state between valid acquisitions Outputs 10 MHz clock continuously Short-circuit protected (to ground)
Output Protection
1 2
The Input Bandwidth specication only applies to signals to the modules; it does not apply to signals applied to the External Signal Input and sent back to the External Signal Output. The Output Bandwidth specication only applies to signals from the modules; it does not apply to signals applied to the External Signal Input and sent back to the External Signal Output.
43
PowerFlex options
Maximum window size = Maximum channel-to-channel skew + (2 x sample uncertainty) + 0.4 ns Maximum setup time = User interface setup time + 0.8 ns Maximum hold time = User interface hold time + 0.2 ns Examples: for a P6417 or a P6418 probe and user interface setup and hold of 2.0/0.0 typical: Maximum window size = 1.6 ns + (2 x 500 ps) + 0.4ns = 3.0 ns Maximum setup time = 2.0 ns + 0.8 ns = 2.8 ns Maximum hold time = 0.0 ns + 0.2 ns = 0.2ns
Setup and hold window size (data and qualiers) (Typical) Setup and hold window range
Channel-to-channel skew (typical) + (2 x sample uncertainty) Example: for P6417 or P6418 Probe = 1 ns + (2 x 500 ps) = 2 ns For each channel, the setup and hold window can be moved from +8.5 ns (Ts) to -7.0 ns (Ts) in 0.5 ns steps (setup time). Hold time follows the setup time by the setup and hold window size. 200 MHz in full speed mode (5 ns minimum between active clock edges) 100 MHz (10 ns minimum between active clock edges)
44
Time between DeMux clock edges 4 (Typical) Time between DeMux store clock edges 4 (Typical) Data Rate
4
5 ns minimum between Demux clock edges in full-speed mode 10 ns minimum between Demux clock edges in half-speed mode 10 ns minimum between Demux master clock edges in full-speed mode 20 ns minimum between Demux master clock edges in half-speed mode 400 MHz (200 MHz option required) half channel. (Requires channels to be multiplexed.) These multiplexed channels double the memory depth. Each channel can be programmed with a pipeline delay of 0 through 3 active clock edges.
(Typical)
It is possible to use storage control and only store data when it has changed (transitional storage). Applies to asynchronous sampling only. Setup and hold window specication applies to synchronous sampling only. Any or all of the clock channels may be enabled. For an enabled clock channel, either the rising, falling, or both edges can be selected as the active clock edges. The clock channels are stored. Full and half speed modes are controlled by PowerFlex options and upgrade kits. All qualier channels are stored. For custom clocking there are an additional 4 qualier channels on C2 3:0 regardless of channel width.
45
Glitch detector 1 2 Minimum detectable glitch pulse width (Typical) Setup and hold violation detector 1 3
Transition detector 1
Counter/Timers
Trigger States Trigger State sequence rate Trigger Machine Actions Main acquisition trigger Main trigger position MagniVu acquisition trigger MagniVu trigger position Increment counter Start/Stop timer Reset counter/timer
46
1 2 3
Each use of External Signal In, glitch detector, setup and hold violation detector, or transition detector requires a trade-off of one word recognizer resource. Any glitch is subject to pulse width variation of up to the channel-to-channel skew specication + 0.5 ns. Any setup value is subject to variation of up to 1.8 ns; any hold value is subject to variation of up to 1.2 ns.
47
CD-RW Drive
Display Memory
48
49
50
51
Sample uncertainty
52
53
Single channel setup and hold window size (Typical) Single module setup and hold window size (data and qualiers)
Single module setup and hold window size (data and qualiers) (Typical) Setup and hold window range
54
Demultiplex clocking Demultiplex channels (2:1) TLA7AA3, TLA7AA4, TLA7AB4, TLA7AC3, TLA7AC4, TLA7NA3, TLA7NA4 modules
Any individual channel can be demultiplexed with its partner channel. If multiplexing is enabled, all of the A and D channels are multiplexed; there is no individual selection. Channels demultiplex as follows: A3(7:0) to/from A2(7:0) to/from A1(7:0) to/from A0(7:0) to/from C3(7:0) C2(7:0) D1(7:0) TLA7AA2, TLA7AB2, TLA7AC2, TLA7NA2 modules only D0(7:0) TLA7AA2, TLA7AB2, TLA7AC2, TLA7NA2 modules only
55
Unlike the 2:1 Demultiplex, the channels within a group of four cannot arbitrarily drive the others. A1(7:0) to C3(7:0) to A0(7:0), D1(7:0), D0(7:0) TLA7AA2, TLA7AB2, TLA7AC2 TLA7NA2 modules only C2(7:0), A3(7:0), A2(7:0)
Time between Demultiplex clock edges (Typical) Source synchronous sampling (TLA7Axx) Clocks per module Clocks with merged modules Clock groups Size of clock group valid FIFO
Four When merged, the slave modules have two clocks available from the master module. Including the local clocks, the total is six clocks. Four for a single module and for a merged system Four stages when operated at 235 MHz or below (three stages when operated above 235 MHz); this allows four (source synchronous or other) clocks to occur before the clock that completes the Clock Group Valid signal for that group. Channel-to-channel skew only
56
Specication only applies with asynchronous clocking. With synchronous sampling, the setup and hold window size applies. Any clock channel can be enabled. For enabled clock channels, either the rising, falling, or both edges can be selected as active clock edges; clock channels are stored. This is a special mode and has some limitations such as the clocking state machine and trigger state machine only running at 500 MHz.
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From most-signicant probe group to least-signicant probe group: C3 C2 C1 C0 E3 E2 E1 E0 A3 A2 D3 D2 A1 A0 D1 D0 Q3 Q2 Q1 Q0 CK3 CK2 CK1 CK0 Missing channels for modules with fewer than 136 channels are omitted. When merged, the range recognition extends across the modules. The master module contains the most-signicant groups. Channel groups can be enabled to detect glitches. Glitches are subject to pulse width variations of up to 125ps Minimum input pulse width (single channel) P6860, P6960 high density probe: P6880, P6980 differential probe: P6810 general purpose probe: 500 ps 500 ps 750 ps
Glitch detector (normal asynchronous clock mode) Minimum detectable glitch pulse width (Typical)
Any channel can be enabled to detect a setup or hold violation. The range is from 8.0 ns before the clock edge to 8.0 ns after the clock edge in 0.125 ns steps. The channel setup and hold violation size can be individually programmed. The range can be shifted towards the positive region by 0 ns, 4 ns, or 8 ns. With a 0 ns shift, the range is +8 ns to -8 ns; with a 4 ns shift, the range is +12 ns to -4 ns; with an 8 ns shift, the range is +16 ns to 0 ns. The sample point selection region is the same as the setup and hold window. Any setup value is subject to variation of up to the channel skew specication. Any hold value is subject to variation of up to the channel skew specication. 16 transition detectors. Any channel group can be enabled or disabled to detect a rising transition, a falling transition, or both rising and falling transitions between the current valid data sample and the previous valid data sample. 2 counter/timers, 51 bits wide, can be clocked up to 500 MHz Maximum count is 2^50-1 (excluding sign bit) Maximum time is 4.5 X 106 seconds or 52 days Counters can be used as Settable, resettable, and testable ags. Counters can be reset, do nothing, increased, or decreased. Timers can be reset, started, stopped, or not changed. Counters and timers have zero reset latency and one clock terminal count latency. A backplane input signal.
Transition detector
Counter/timers
Signal In 1
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Trigger states Trigger state sequence rate Trigger machine actions Main acquisition trigger Main trigger position MagniVu trigger MagniVu trigger position Increment/decrement counter Start/stop timer Reset counter/timer
Reloadable word recognizer latency Signal Out Trigger Out Storage control Storage
59
Number of channels after merging Merged system acquisition depth Number of clock and qualier channels after merging
60
Weight
61
Channels 32 data and 2 clock 64 data and 4 clock 96 data, 4 clock, and 2 qualier 128 data, 4 clock, and 4 qualier Memory depth 32 K or 128 K samples 1 512 K samples 64 K or 256 K or 1 M or 4 M samples 16 M samples 64 M samples
PowerFlex options
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Setup and hold window size (data and qualiers) (Typical) Setup and hold window range
Maximum synchronous clock rate 4 Demux clocking Demux Channels TLA7N3, TLA7N4, TLA7P4, TLA7Q4, TLA7L3, TLA7L4, TLA7M3, TLA7M4
Channels multiplex as follows: A3(7:0) to A2(7:0) to A1(7:0) to A0(7:0) to C3(7:0) C2(7:0) D1(7:0) TLA7N2, TLA7P2, TLA7Q2, TLA7L2, TLA7M2 only D0(7:0) TLA7N2, TLA7P2, TLA7Q2, TLA7L2, TLA7M2 only
Time between DeMux clock edges 4 (Typical) Time between DeMux store clock edges 4 (Typical) Data Rate (Typical) TLA7N1, TLA7N2, TLA7P2, TLA7Q2, TLA7N3, TLA7N4, TLA7P4, TLA7Q4,
5 ns minimum between DeMux clock edges in full-speed mode 10 ns minimum between DeMux clock edges in half-speed mode 10 ns minimum between DeMux master clock edges in full-speed mode 20 ns minimum between DeMux master clock edges in half-speed mode 400 MHz (200 MHz option required) half channel. (Requires channels to be multiplexed.) These multiplexed channels double the memory depth.
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1 2 3 4
It is possible to use storage control and only store data when it has changed (transitional storage). Applies to asynchronous sampling only. Setup and hold window specication applies to synchronous sampling only. Any or all of the clock channels may be enabled. For an enabled clock channel, the rising edge, falling edge, or both edges can be selected as the active clock edges. The clock channels are stored. Full and half speed modes are controlled by PowerFlex options and upgrade kits.
From most-signicant probe group to least-signicant probe group: C3 C2 C1 C0 E3 E2 E1 E0 A3 A2 D3 D2 A1 A0 D1 D0 Q3 Q2 Q1 Q0 CK3 CK2 CK1 CK0 Missing channels for modules with fewer than 136 channels are omitted. When merged, the range recognition extends across all the modules; the master module contains the most-signicant groups. The master module is to the left (lower-numbered slot) of a merged pair. The master module is in the center when three modules are merged. Slave module 1 is located to the right of the master module, and slave module 2 is located to the left of the master module. Each channel group can be enabled to detect a glitch 2.0 ns (single channel with a P6417, P6418, or P6434 probe) Each channel can be enabled to detect a setup and hold violation. The range is from 8 ns before the clock edge to 8 ns after the clock edge. The range can be selected in 0.5 ns increments. For the TLA7Lx and TLAMx logic analyzer modules, the user interface restricts the setup and hold violation detector to groups rather than individual channels. The setup and hold violation of each window can be individually programmed. Each channel group can be enabled or disabled to detect a transition between the current valid data sample and the previous valid data sample.
Glitch detector 1 2 Minimum detectable glitch pulse width (Typical) Setup and hold violation detector 1 3
Transition detector 1 4
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Trigger States Trigger State sequence rate Trigger Machine Actions Main acquisition trigger Main trigger position Increment counter Start/Stop timer Reset counter/timer
1 2 3
Each use of a glitch detector, setup and hold violation detector, or transition detector requires a trade-off of one word recognizer resource. Any glitch is subject to pulse width variation of up to the channel-to-channel skew specication + 0.5 ns. For TLA7N1, TLA7N2, TLA7N3, TLA7N4, TLA7P2, TLA7P4, TLA7Q2, and TLA7Q4 Logic Analyzer modules, any setup value is subject to variation of up to 1.8 ns; any hold value is subject to variation of up to 1.2 ns. For TLA7L1, TLA7L2, TLA7L3, TLA7L4, TLA7M1, TLA7M2, TLA7M3, and TLA7M4 Logic Analyzer modules, any setup value is subject to variation of up to 1.6 ns; any hold value is subject to variation of up to 1.4 ns.
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This mode can be used to create transitional storage selections where all channels are enabled.
Probe overdrive
66
Probe cables
Mainframe interlock
67
134 MHz in Full Channel Mode 134 MHz in Half Channel Mode
The maximum operating frequency of the module is a function of the output level, output pattern and the load condition, including the series termination resistor in the probe. Operating conditions exceeding this frequency may result in damage to the probe. 40 to 262,140 (218 - 4) in Full Channel Mode (standard) 80 to 524,280 (219 - 8) in Half Channel Mode (standard) 40 to 1,048,572 (220 - 4) in Full Channel Mode (option 1M or PowerFlex upgrade) 80 to 2,097,144 (221 - 8) in Half Channel Mode (option1M or PowerFlex upgrade)
Pattern length
68
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Signal Output
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20 MHz, 250 MHz, and FULL on each channel Full scale range setting 10.1 V - 100 V 100 mV - 10 V 50 mV - 99.5 mV 20 mV - 49.8 mV 10 mV - 19.9 mV
300:1 at 100 MHz and 100:1 at the rated bandwidth for the channels sensitivity (Full Scale Range) setting, for any two channels having equal sensitivity settings 8
Digitized bits
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10.2 MHz 98 MHz 245 MHz 490 MHz 990 MHz Frequency limit, upper, 20 MHz bandwidth limited (Typical) Frequency limit, upper, 250 MHz bandwidth limited (Typical) Input channels 20 MHz 250 MHz Product TLA7E2 TLA7D2 TLA7E1 TLA7D1 Input coupling Input impedance, DC-1 M coupled Input impedance selections Input resistance, DC-50 coupled Input VSWR, DC-50 W coupled Input voltage, maximum, DC-1 M , AC-1 M, or GND coupled Input voltage, maximum, DC-50 or AC-50 Coupled Lower frequency limit, AC coupled (Typical) Random noise DC, AC, or GND 4
Channels 4 4 2 2
1 M 0.5% in parallel with 10 pF 3 pF 1 M or 50 50 1% 1.3:1 from DC - 500 MHz, 1.5:1 from 500 MHz - 1 GHz 300 VRMS but no greater than 420 V peak, Installation category II, derated at 20 dB/decade above 1 MHz 5 VRMS, with peaks 25 V 10 Hz when AC-1 M Coupled; 200 kHz when AC-50 Coupled 5 Bandwidth selection Full 250 MHz 20 MHz RMS noise (350 V + 0.5% of the full scale Setting) (165 V + 0.5% of the full scale Setting) (75 V + 0.5% of the full scale Setting) Offset range 1 V 10 V 100 V
10 mV to 100 V 6
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Step response
Maximum setting error (%) at 20 ns 100 ns 0.2% 0.5% 0.5% 20 ms 0.1% 0.2% 0.2% 0.5% 1.0% 1.0%
2 V 20 V 200 V
Net offset is the nominal voltage level at the digitizing oscilloscope input that corresponds to the center of the A/D Converter dynamic range. Offset accuracy is the accuracy of this voltage level. The limits given are for the ambient temperature range of 0 C to +30 C. Reduce the upper bandwidth frequencies by 5 MHz for each C above +30 C. The bandwidth must be set to FULL. Rise time (rounded to the nearest 50 ps) is calculated from the bandwidth when Full Bandwidth is selected. It is dened by the following formula: Rise Time (ns) = 450 BW (MHz) GND input coupling disconnects the input connector from the attenuator and connects a ground reference to the input of the attenuator. The AC Coupled Lower Frequency Limits are reduced by a factor of 10 when 10X passive probes are used. The sensitivity ranges from 10 mV to 100 V full scale in a 1-2-5 sequence of coarse settings. Between coarse settings, you can adjust the sensitivity with a resolution equal to 1% of the more sensitive coarse setting. For example, between the 500 mV and 1 V ranges, the sensitivity can be set with 5 mV resolution. The Full Bandwidth settling errors are typically less than the percentages from the table. The maximum absolute difference between the value at the end of a specied time interval after the mid-level crossing of the step, and the value one second after the mid-level crossing of the step, expressed as a percentage of the step amplitude. See IEEE std. 1057, Section 4.8.1, Settling Time Parameters.
512, 1024, 2048, 4096, 8192, and 15000 100 ppm over any 1 ms interval
( ( 2% | Setting) | ) + 0.03 of Full Scale Range + Offset Accuracy) for signals having rise and fall times 20 ns 2 ns to 1 s Source Any Channel Range 100% of full scale range
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Any Channel
Trigger Coupling AC
Typical Signal Level for Stable Triggering Same as the DC-coupled limits for frequencies above 60 Hz; attenuates signals below 60 Hz One and one-half times the DC-coupled limits from DC to 30 kHz; attenuates signals above 30 kHz One and one-half times the DC-coupled limits for frequencies above 80 kHz; attenuates signals below 80 kHz Three times the DC-coupled limits Minimum Pulse Width 1 ns 1 ns Minimum Rearm Width 2 ns + 5% of Glitch Width Setting 2 ns + 5% of Width Upper Limit Setting
Noise Reject Time, Minimum Pulse or Rearm, and Minimum Transition Time, for Pulse-Type Triggering (Typical) Pulse Class Glitch Width Trigger Position Error, Edge Triggering (Typical)
1
The trigger position errors are typically less than the values given here. These values are for triggering signals having a slew rate at the trigger point of 5% of full scale/ns.
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75
TLA application software version Minimum recommended TLA controller Supported external oscilloscopes as of May, 2008 (For the latest list of supported external oscilloscopes, visit our Web site at www.tektronix.com/la.)
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5 ns
1 2 3 4 5 6
If RAM is less than 256 MB, the record length of the external oscilloscope may be limited to 1 M. A GPIB extender is needed to connect the iView cable to the oscilloscope. One end of a standard GPIB cable can be used. If you encounter possible alignment problems with the logic analyzer and oscilloscope waveform edges, refer to Aligning Logic Analyzer and Oscilloscope Waveform Edges. (See page 77, Aligning Logic Analyzer and Oscilloscope Waveform Edges.) A GPIB to USB adapter (TEK-USB-488) is required to connect the iView cable to the oscilloscope. There is a known timing offset between triggers when a TLA logic analyzer is triggered by the oscilloscope. Tektronix is correcting this problem. When used with a TLA7016 mainframe and an external PC (such as TLA7PC1), the instruments must be physically located close together so that the iView cable can span both instruments. Removing the sleeving from the iView cable assembly increases the spacing distance available between the external PC and the TLA7016 mainframe. Includes sampling uncertainty, typical jitter, slot-to-slot skew, and probe-to-probe variations to provide a typical number for the measurement.
The rst time that you take an acquisition after changing the horizontal scale setting on TDS1000B, TDS2000B, TDS1000 or TDS2000 series oscilloscopes, the logic analyzer and oscilloscope waveform edges may not be aligned within the listed specication. You can realign the waveform positions in the waveform window that contains the oscilloscope data (Menu bar > Data > Time Alignment). Make sure that the external oscilloscope is the data source and then adjust the time offset to align the waveforms. Use the following approximate offsets for various horizontal scale settings. (See Table 90.) Table 90: TDS1000B, TDS2000B, TDS1000, and TDS2000 Series oscilloscope waveform edge alignment
Horizontal scale 100 ns 250 ns 500 ns 1 s 2.5 s 5 s 10 s 25 s Time offset 5 ns 11 ns 18 ns 12 ns 50 ns 120 ns 250 ns 650 ns
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Summary Verication
Functional verication procedures verify the basic functionality of the instrument inputs, outputs, and basic instrument actions. These procedures include power-on diagnostics, extended diagnostics, and manual check procedures. These procedures can be used for incoming inspection purposes. Certication procedures certify the accuracy of an instrument and provide a traceability path to national standards. Certication data is recorded on calibration data reports provided with this manual. The calibration data reports are intended to be copied and used for calibration/certication procedures. After completing the performance verication procedures or the certication procedures, you can ll out a calibration data report to keep on le with your instrument. Performance verication procedures conrm that a product meets or exceeds the performance requirements for the published specications documented in the Specications chapter of this manual.
Test Equipment
These procedures use external, traceable signal sources to directly test characteristics that are designated as checked in the Specications chapter of this manual. Always warm up the equipment for 30 minutes before beginning the procedures. Table 91: Test equipment
Item number and description 1. Benchtop Mainframe Minimum requirements TLA7016 Benchtop Mainframe with a logic analyzer module installed and an external computer with TLA application software installed. TLA7012 Portable Mainframe with a logic analyzer module installed Example -
2.
Portable Mainframe
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Functional Verication
The following table lists functional verication procedures for the benchtop and portable mainframes. If necessary, refer to the TLA7000 Series Logic Analyzer Installation Manual for installation instructions. Table 92: Functional verication procedures
Instrument Benchtop and portable mainframe Procedure Power-on and fan operation Power-up diagnostics Extended diagnostics TLA Mainframe diagnostics CheckIt Utilities diagnostics
Complete the following steps to check the power-on and fan operation of the logic analyzer: You will need a mainframe with an LA module installed in each mainframe. 1. Power on the instrument and observe that the On/Standby switch illuminates. 2. Check that the fans spin without undue noise. 3. If everything is properly connected and operational, you should see the modules in the System window of the logic analyzer application. 4. If there are no failures indicated in the System window, the power-on diagnostics pass when you power on the mainframe(s).
Extended Diagnostics
Do the following steps to run the extended diagnostics: NOTE. Running the extended diagnostics will invalidate any acquired data. If you want to save any of the acquired data, do so before running the extended diagnostics.
79
Prerequisites
Perform the following tests to complete the functional verication procedure: NOTE. Installing a module in the mainframe provides a means of verifying connectivity and communication between the module and the mainframe. Try using a different module and repeat the tests to isolate the problem to the mainframe or to the module. 1. If you have not already done so, power on the instrument and start the logic analyzer application if it did not start by itself. 2. Go to the System menu and select Calibration and Diagnostics. 3. Verify that all power-on diagnostics pass. 4. Click the Extended Diagnostics tab. 5. Select All Modules, All Tests, and then click the Run button on the property sheet. All tests that displayed an "Unknown" status will change to a Pass or Fail status depending on the outcome of the tests. 6. Scroll through the tests and verify that all tests pass.
The TLA Mainframe Diagnostics are a comprehensive software test that checks the functionality of the mainframes. To run these diagnostics, do the following steps: 1. Quit the logic analyzer application. 2. Click the Windows Start button. 3. Select All Programs Tektronix Logic Analyzer TLA Mainframe Diagnostics. 4. Select your instrument from the Connection dialog box (in most cases this will be the [Local] selection). 5. Run the mainframe diagnostics.
CheckIt Utilities
CheckIt Utilities is a comprehensive software application used to check and verify the operation of the PC hardware in the portable mainframe. To run the software, you must have either a keyboard, mouse, or other pointing device.
80
NOTE. To check the DVD drive, you must have a test CD installed before starting the CheckIt Utilities. The test CD needs to contain a le with a size between 5 MB and 15 MB. To run CheckIt Utilities, follow these instructions: 1. Quit the logic analyzer application. 2. Click the Windows Start button. 3. Select All Programs CheckIt Utilities. 4. Run the tests. If necessary, refer to the CheckIt Utilities online help for information on running the software and the individual tests.
Certication
The system clock of the controller is checked for accuracy. The instrument is certiable if this parameter meets specications. Complete the performance verication procedures and record the certiable parameters in a copy of the Calibration Data Report at the end of this chapter.
Tests Performed
Do the following tests to verify the performance of the TLA7012 Portable Mainframe and the TLA7016 Benchtop Mainframe. (See Table 93.) You will need test equipment to complete the performance verication procedures. (See Table 91.) If you substitute equipment, always choose instruments that meet or exceed the minimum requirements specied. Table 93: Performance verication procedures
Parameter System clock (CLK
1
Certiable parameter
81
The following procedure checks the accuracy of the 10 MHz system clock:
Frequency counter (item 3) Precision BNC cable (item 4) Warm-up time: 30 minutes
1. Verify that all of the prerequisites above are met for the procedure. 2. Connect the frequency counter to the External Signal Out BNC connector on the instrument. 3. Go to the System window and select System Conguration from the System menu. 4. In the System Conguration dialog box, select 10 MHz Clock from the list of routable signals in the External Signal Out selection box and click OK. 5. Verify that the output frequency at the External Signal Out connector is 10 MHz 1 kHz. Record the measurement on a copy of the calibration data report and disconnect the frequency counter. 6. In the System Conguration dialog box, reset the External Signal Out signal to None.
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83