Introduction To Computer-Aided Design of VLSI Circuits: Unit 1 1
Introduction To Computer-Aided Design of VLSI Circuits: Unit 1 1
EDA
Unit 1
Y.-W. Chang
Administrative Matters
Time/Location: ?? Instructor: ?? E-mail: ?? URL: ?? Office: ?? Office Hours: ?? Teaching Assistants: ?? Prerequisites: data structures (or discrete math) & logic
design. Required Text: S. H. Gerez, Algorithms for VLSI Design Automation, John Wiley & Sons, 1999 References: ?? (indicated in each unit).
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Chang, Huang, Li, Lin, Liu
Course Contents
Course Objectives:
Study techniques for computer-aided design of VLSI circuits. Study problem-solving (-finding) techniques!!! Introduction to electronic design automation (4 hrs) High-level synthesis (2 hrs) Logic synthesis (6 hrs) Formal verification (6 hrs) Physical design: partitioning, floorplanning, placement, routing, compaction, deep submicron effects (15 hrs) Testing (12 hrs) Simulation (4 hrs)
Course Contents
Unit 1
Grading Policy
Grading
Homework assignments: 25% Mini programming assignments: 25% One in-class open-book, open-note test: 25% Final project + presentation: 25% Team work is permitted (preferably 2 persons at most) Bonus for class participation
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Course contents:
Introduction to VLSI design flow/methodologies/styles Introduction to VLSI design automation tools Semiconductor technology roadmap CMOS technology Chapters 1-2 Appendix A
Readings
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First transistor
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First IC by Kilby
First IC by Noyce
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IBM PC
Chang, Huang, Li, Lin, Liu
Pentium 4
Scanner-on-chip
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Interconnects are determined in physical design. Shall consider interconnections in early design stages.
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Design Actions
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System-level design
Partitioning into hardware and software, co-design, co-simulation, etc. Cost estimation, design-space exploration Behavioral descriptions (e.g. in Verilog, VHDL) High-level simulation High-level (or architectural) synthesis Schematic entry Register-transfer level and logic synthesis Gate-level simulation (functionality, power, etc) Timing analysis Formal verification
Chang, Huang, Li, Lin, Liu
Algorithmic-level design
Logic design:
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Logic Design/Synthesis
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Transistor-level design
Switch-level simulation Circuit simulation Partitioning Floorplanning and Placement Routing Layout editing and compaction Design-rule checking Layout extraction Data bases, frameworks, etc. The idea is approached more and more, but still far away from a single push-buttom operation
Chang, Huang, Li, Lin, Liu
Design management
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Physical Design
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Floorplan Examples
PowerPC 604
Pentium 4
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Routing Example
0.18um technology, pitch = 1 um, 2774 nets.
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IC Design Considerations
Design Complexity: large number of devices/transistors Performance: optimization requirements for high performance Time-to-market: about a 15% gain for early birds Cost: die area, packaging, testing, etc. Others: power, signal integrity (noise, etc), testability, reliability, manufacturability, etc.
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Intel uP
4004
8086
80386
PentiumPro
Pentium 4
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Chip complexity large-scale system design methodology? Supply voltage signal integrity (noise, IR drop, etc)? Wiring level manufacturability? 3D layout? Power consumption power & thermal issues?
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Human factors may limit design more than technology. Keys to solve the productivity crisis: hierarchical design,
abstraction, CAD (tool & methodology), IP reuse, etc.
Complexity limiter
0.1K
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Hierarchical Design
Hierarchy: something is composed of simpler things. Design cannot be done in one step partition the
design hierarchically. hierarchical
flat
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Abstraction
Design domains:
Behavioral: black box view Structural: interconnection of subblocks Physical: layout properties
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Gajskis Y-Chart
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Design Styles
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Logic and interconnects are both prefabricated. Illustrated by a symmetric array-based FPGA
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MOS Transistors
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A CMOS Inverter
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CMOS Properties
Thus, CMOS circuits have dynamic power dissipation. The amount of power depends on the switching frequency.
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Stick Diagram
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Basic layout
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Design Rules
Layout rules are used for preparing the masks for fabrication. Fabrication processes have inherent limitations in accuracy. Design rules specify geometry of masks to optimize yield and
reliability (trade-offs: area, yield, reliability). Three major rules:
Wire width: Minimum dimension associated with a given feature. Wire separation: Allowable separation. Contact: overlap rules. Micron rules: stated at micron resolution. rules: simplified micron rules with limited scaling attributes.
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