Scribd
Upload
195 views

We Have Learnt: Today's Objective

This document discusses different methods for measuring texture in polycrystalline materials, including X-ray diffraction, neutron diffraction, electron backscatter diffraction (EBSD), and optical microscopy. It explains that X-ray diffraction measures average surface texture to a depth of microns, neutron diffraction measures average bulk texture to a depth of centimeters, and EBSD provides high resolution local surface texture information to a depth of nanometers. The document also describes how pole figures are obtained through X-ray diffraction by fixing the diffracting planes and rotating the sample to bring different orientations into coincidence with the diffracting normal.

Uploaded by

Vladimir Morote
Copyright
© Attribution Non-Commercial (BY-NC)
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
195 views

We Have Learnt: Today's Objective

This document discusses different methods for measuring texture in polycrystalline materials, including X-ray diffraction, neutron diffraction, electron backscatter diffraction (EBSD), and optical microscopy. It explains that X-ray diffraction measures average surface texture to a depth of microns, neutron diffraction measures average bulk texture to a depth of centimeters, and EBSD provides high resolution local surface texture information to a depth of nanometers. The document also describes how pole figures are obtained through X-ray diffraction by fixing the diffracting planes and rotating the sample to bring different orientations into coincidence with the diffracting normal.

Uploaded by

Vladimir Morote
Copyright
© Attribution Non-Commercial (BY-NC)
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
You are on page 1/ 11

We have learnt

How do the crystallites arrange in a polycrystalline material How to represent polycrystal information in stereographic projection Macro- and micro- texture

Todays objective
To learn the principles of macro or bulk texture measurements by X-ray diffraction

Texture Measurement
X-ray diffraction method -most common method

Neutron diffraction method -used, where X-ray methods fail Electron diffraction methods -SEM (EBSD) and TEM (OIM) Synchrotron X-ray method -very specialised, quite powerful

Ultrasonic methods

-non-destructive method

How to Measure Texture


Measurement of pole figure
X-ray diffraction; pole figures; measures average texture at a surface (ms penetration); projection (2 angles).
Neutron diffraction; type of data depends on neutron source; measures average texture in bulk (cms penetration in most materials) ; projection (2 angles). Electron [back scatter] diffraction; easiest [to automate] in scanning electron microscopy (SEM); local surface texture (nms penetration in most materials); complete orientation (3 angles).

Optical microscopy: optical activity (plane of polarization); limited information (one angle).

Virtually all techniques for texture analysis are based upon diffraction of radiation by the crystal lattice: X-ray, electrons, neutrons.
light wavelength [nm]
energy [eV]
400-700 1 0 0 -

neutrons X-rays electrons


0.05-0.3 10-2 0 1.67x10-24 10-100 0.05-0.3 104 0 0.001-0.01 105 -1.602x10-19 9.11x10-28 10-3

charge[C] rest mass [g] penetration depth, absorption length [mm]

0
0.01-0.1

Particle beams (electrons, neutrons): de Broglie relation: = h/mv

or, = h/ 2mEkin

Interaction of radiation with lattice atoms and penetration depth / absorption length utimately decides whether a particular radiation will be giving information about microtexture or macrotexture.

electrons X-ray neutrons

nuclei + shell electrons microtexture shell electrons macrotexture nuclei macro texture

Special attributes of each technique


X-ray diffraction; measures average texture at surface (m penetration). Neutron diffraction; type of data depends on neutron source; measures average texture in bulk (cms penetration in most materials).
Electron [back scatter] diffraction; easiest [to automate] in scanning electron microscopy (SEM); local surface texture (nm penetration in most materials). Optical microscopy; optical polarization); limited information. activity (plane of

All diffraction methods use


a monochromatic beam of radiation with the Bragg condition fixed for a single set of reflecting planes which is maintained throughout the determination of a particular pole figure. the normal K of the diffracting planes (hkl) remains fixed in space and the specimen is rotated through a wide range of angles

many different orientations in the sample are brought into coincidence with the diffracting normal
Total diffracted intensity (at any instant) volume of the specimen in which the (hkl) planes are so-oriented

All diffraction methods use a monochromatic beam of radiation with the Bragg condition fixed

For a single set of reflecting planes maintained throughout the determination of a particular pole figure the normal K of the diffracting planes (hkl) remains fixed in space and the specimen is rotated through a wide range of angles. This brings many different orientations in the sample are brought into coincidence with the diffracting normal
Total diffracted intensity (at any instant) volume of the specimen in which the (hkl) planes are so-oriented

X-ray Pole Figures


X-ray pole figures are the most common source of texture information; easiest to measure.

Pole figure represents variation in diffracted intensity with respect to direction in the specimen. Pole figures are represented by mapping of crystal directions w.r.t. sample reference frame.

Pole figures: Historical perspective


1924: Wever (Berlin) generated 1st pole figure from evaluating the inhomogeneous intensity distribution along the Debye-Scherrer rings. Introduction of texture goniometer and Geiger counters (Decker et al., Norton).
Schulz initiated modern quantitative X-ray texture analysis. Pole figure determination by neutron diffraction. Automated computer-controlled systems are available and the corresponding measuring techniques and the necessary correction methods are well-established.

1948:

1949:

Since 1960s: Today,

Questions
1. Microtexture is mainly measured by (a) X-ray diffraction; (b) Neutron diffraction; (c) Electron back scatter diffraction; (d) Optical microscopy.

2. Bulk texture can be measured by (a) Transmission electron microscopy; (c) Neutron diffraction;

(b) X-ray diffraction (d) Optical microscopy

3. Which of the following has the highest depth of penetration. (a) X-ray; (b) Neutron (c) Electron;

(d) All are equal.

4. The sample is subjected to different tilts during X-ray measurement of texture for (a) bringing all the grains in diffraction condition (b) increasing the statistics of measurent (c) to impose the sample reference direction on the pole figure (d) none of the above
5. (a) (b) (c) (d) Which of the following statements are true. X-ray diffraction provides better spatial resolution and statistics X-ray diffraction provides better statistics, but poor spatial resolution. EBSD provides better spatial resolution and statistics EBSD provides better spatial resolution, but poor statistics

You might also like