Introduction To Langmuir Probes - Hiden Analytical Tech Info Sheet531
Introduction To Langmuir Probes - Hiden Analytical Tech Info Sheet531
=
Technical Information Sheet 531 5 Hiden Analytical
m
e
= Electron Mass
n
I
= Ion Density
n
e
= Electron Density
I
esat
= Electron Saturation Current
e = electron charge
I = I
ion
+ I
electron
I
e
= electron current
f
E
(V) = electron energy distribution as
a function of probe voltage
Technical Information Sheet 531 6 Hiden Analytical
Appendix I - definitions
- Plasma Potential
The plasma potential is the voltage
inside the plasma. It is always positive
with respect to the most positive body
with which it is in contact. In many
cases, the plasma potential provides a
good indication of the energy of positive
ions incident on surfaces of interest.
- Floating Potential
This is the potential at which an object
in contact with the plasma collects no
current. Or in other words, the potential
attained by an electrically isolated body
in the plasma. The separation between
the floating and plasma potential are
related though the electron energy
distribution and ion mass.
- Electron Density
The electron density is simply the
number of electrons per unit volume
within the plasma.
- Ion Density
The ion density is the number density
of the ions per unit volume within the
plasma. Ions can be negative or
positive. For an electropositive
discharge, all ions formed in the plasma
have a positive charge and the ion and
electron densities in the bulk of the
plasma are equal. For an
electronegative discharge, the ions may
be either positive or negative, in which
case the sum of electron and negative
ion densities must equal the positive ion
density.
- Electron Temperature
The electron temperature (assuming a
Maxwellian distribution of velocities) is
the mean energy of electrons in the
plasma.
- Electron Energy Distribution
Function (EEDF)
In a typical cold laboratory plasma, the
electrons are usually much more
energetic than the ions and the majority
of the energy within the plasma is
contained in the electrons. Electrons
usually have a spread of energies and
knowing the distribution of these
energies is of key importance since the
electrons are largely responsible for
many of the reactions in the plasma.
The figure below shows the EEDF of a
Maxwellian plasma for several electron
temperatures.
0 10 20 30 40 50
0.0
0.1
0.2
0.3
0.4
0.5
T=10eV
T=5eV
T=2eV
T=1eV
f
(
E
)
Energy (eV)
Technical Information Sheet 531 7 Hiden Analytical
Appendix II - Frequently
asked questions (FAQs)
The information of the preceding
sections provides a general overview of
the Langmuir probe technique. The
following FAQs and corresponding
responses attempt to deal with issues
arising in specific applications by
describing the features of Hidens
ESPION probe which have been
specifically developed.
Q1 How can the ESPION help me?
A1 The ESPION provides detailed
information about the key parameters in
your plasma process. Knowledge of
these can assist in identifying
processing problems, in designing and
troubleshooting new processes and in
checking for deviations between
chambers.
Q2 My process uses depositing /
etching gases, will the ESPION probe
become contaminated and will this
affect the results?
A2 The ESPION probe has been
developed with these applications in
mind. ESPsoft software enables
the active probe tip to be automatically
toggled between acquire and clean
cycles between individual scans
ensuring that data is always acquired
with a clean probe tip. Cleaning
is achieved by ion bombardment
sputtering or by joule heating when
collecting an electron current.
Q3 My plasma is generated with RF
voltages, will this affect the
measurements?
A3 In an RF plasma, a significant
AC voltage can develop between the
plasma and probe tip. The ESPION
uses a passive technique incorporating
a high frequency compensation
electrode together with a string of
inductors immediately behind the tip,
effectively a tuned LC circuit, in order to
remove this AC component and its
harmonics. The inductors are air cooled
to prevent degradation in hot
environments.
Q4 What type of tip materials are
used?
A4 ESPION can be supplied with
many different types of tip materials
including Molybdenum, Tungsten,
Platinum etc. The tips are easily user
interchangeable.
Q5 My chamber is often coated with
insulating materials, does this affect the
measurements?
A5 ESPION employs an integral low
frequency reference electrode which
compensates for chambers with
poor or no ground reference. The
reference probe also serves to track and
eliminate low frequency noise due to
mains/power supply instabilities.
Q6 Can I use pulsed plasmas?
A6 Yes. The ESPION probe is
capable of making measurements in
plasmas which are modulated upto 100
kHz. The gating resolution is 1
microsecond. The complete timing
electronics, gating, delay etc. are
contained within the ESPION control
unit and controlled by ESPsoft software
so that only the pulse which modulates
the plasma is required as an input.
Technical Information Sheet 531 8 Hiden Analytical
Q7 Can I make spatially resolved
measurements?
A7 Yes. The ESPION can be
supplied with an automated z-drive
which is controlled via ESPsoft software
allowing data to be taken as a function
of position within the chamber.