ISBN:978-1535061506

Proceedings of ICRMET-2016

March-C Algorithm for Embedded Memories in FPGA

Hema G D.

Divya Prabha

PG Scholar, VLSI & Embedded Systems, ECE

Department
Sri Siddhartha Institute of Technology
Tumakuru, Karnataka-572105, India

Associate professor, ECE Department

Sri Siddhartha Institute of technology
Tumakuru, Karnataka-572105, India

Abstract-Built in Self Test is one of the widely used methods for

memory testing and it is the cost effective method. The fault in the
memory is due to the complexity of the design rules. For complex
applications, the memories without faults are necessary. There are
many test algorithms for testing of memories, march based tests are
the dominant testing algorithms due to simplicity and ability to test
the faults.

memory location and read back the value from the same
location. If the written data and data obtained after testing are
same then that indicates there is no fault in memory, if both
are different there is a fault in memory.
Most of the memory testing works uses the basic
March-c algorithm. But this method is not suitable for large
memories. Disadvantages in existing system is time of testing
is more, and separate BIST is required for each subgroup of
memory.
The objective is to create both basic march-c
algorithm architecture and optimized March-c algorithm
based BIST architecture to test the memory inside the FPGA
and comparing both in terms of time, area and speed. Finally,
finding the capable architecture which tests the memory in
less time.
This system proposes the architecture to test the
memories using optimized March-c algorithm. It requires less
time to test the memory compared to other architectures.
Advantages of the proposed system is, it uses concurrency in
testing and applicable for large memories. Single BIST is
sufficient for a group of memories.

`
Because of this, march tests are implemented in most
modern memories BIST. In this project, by considering optimized
march-c algorithm to test the faults. This algorithm uses the
concurrent technique. Because of concurrency the testing time is
reduced compared to basic march c algorithm. This technique is
applied to 256x8 memories it can be extended to any size.
For the effectiveness of this algorithm, Built-in self-test
technique is considered to test embedded memory of the FPGA.
Key Words: BIST, March-C, Optimized March-C, FPGA.

I.

INTRODUCTION

Several Field Programmable Gate Array (FGPA)

vendors have complicated memories within their devices.
Xilinx, the Altera and AT40k vendors are the examples of
FPGAs. These memories are highly programmable. Because
of a complexity of design, there is a chance of occurring
manufacturing faults, because of this testing of the memory is
required. The FPGA without fault is important for all
applications. In FPGAs, the chances of occurring faults
include memory resources, logic blocks, or inter-connects.
These defects can be modelled as single and multi-cell
memory faults. The dominant use of embedded memory cores
along with emerging new architectures and technologies
make providing a low cost test solution for these on chip
memories a very challenging task.
Built in self-test is considered in the algorithm for
testing of embedded memory. The memory is modelled in
equivalent gate-level and run using ISIM simulation tool.
Further, the FPGA implementation is done as well.
The usage of embedded memories is increased day
by day; different memories are available in different sizes. To
reduce the Size of the memory, by using complex designs.
Hence, the manufacturing difficulty in producing the memory
also increases. This requires the testing methods to test
memories during manufacturing. The difficult task for design
architect is to test memory. There are many methods are
available for testing, march tests are the one of the main
testing algorithm in use. The main faults occurs in the
memory are stuck at fault and transition fault. The idea behind
testing is that writing some set of data to the particular

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II.

LITERATURE SURVEY

Muddapu Parvathi [1], in this paper, the embedded

memory testing with the traditional march c algorithm is
compared with modified march c algorithm only for stuck-at
faults. Here the complexity of design is reduced to 8n, the
time comparison is also done. In this, the delay for march
elements with and without fault is considered for both basic
march c and modified march c algorithms.
Der-Cheng Huang, Wen-Ben Jone [2], in this paper
BIST architecture is developed to test embedded SRAM in
FPGAs here for testing purpose virtex-4 FPGA is considered.
In this paper number of slices, total lines of VHDL codes are
reduced compared to previously published schemes. Here the
FPGA is modelled in VHDL at the gate level and simulation
is done in Modalism. it gives the basic idea of the BIST
architecture, the architecture is modelled to compare with
other schemes. The functional model is modelled in virtex-4
FPGA and simulation is done in modalism.
Reeja J [3], In this paper the faults occurring in
manufacturing time are tested using march c algorithm. The
design is done by VHDL and simulation is done in Modalism.
In this BIST, core is designed to test 8 bit SRAM using March
c-test patterns. The fault models are detected by bit-oriented
and word-oriented march c- algorithm.
Peng Wang [4], this paper is based on march calgorithm, single event upset failure in SRAM chips is built.

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ISBN:978-1535061506

Proceedings of ICRMET-2016

Here the visual test bench is developed to test SRAM based

on lab VIEW. This system is able to identify the failures and
display the single event upset failure data bits and also
identify the address of the failure.
Manoj Vishnoi,[5], in this paper for single port
memory march c algorithm with built-in self test is proposed.
Here the 8n pattern is used to generate state transitions.
Because of this, time and energy for detecting fault is reduced.
The test patterns required is less compared to traditional
methods. The BIST is designed with 64x32 memory and it is
simulated using Leonardo Spectrum in 50mm technology.
But the disadvantages are the BIST is slow, not flexible.
III.

but have poor fault coverage or have good fault coverage but
complex and slow. Due to these imbalanced conflicting traits,
the popularity of these algorithms is decreasing. A Marchbased test algorithm is a finite sequence of March elements.
A March element is specified by an address order and a
number of reads and writes. The different types of march
based tests are MATS, MATS+, March C-, March Y, March
A, March B, and etc. Since March-based tests are all simple
and flexible to possess good fault coverage, and they are
dominant test algorithms implemented in most of the modern
memory BIST.

GENERIC BIST ARCHITECTURE

Test Pattern Generators (TPGs)-generates test pattern to the

circuit under test.
Output Response Analyzer (ORAs)- evaluate the result of cut
and required result.
Circuit Under Test (CUT) is the device used to test for faults
(Memory).

Name

Algorithm

MATS

{(w0);(r0,w1);(r1)}

MATS+

{(w0); (r0,w1);(r1,w0)}

MATS++

{ (w0); (r0,w1); (r1,w0, r0)}

MARCH X

{ (w0); (r0,w1); (r1,w0);(r0)}

MARCH A

{ (w0); (r0,w1,w0,w1); ( r1
,w0,w1);(r1,w0,w1,w0); (r0,w1,w0)}

MARCH Y

{ (w0); (r0,w1, r1); (r1,w0, r0);(r0)}

MARCH B

{ (w0); (r0,w1, r1,w0, r0,w1);

(r1,w0,w1); (r1,w0,w1,w0); (r0,w1,w0)}

Fig.2., Test Algorithms

A. MARCH C Algorithm
March test algorithm is a finite sequence of March
elements. March element is specified by an address
order and number of read/write operations. This section
discusses March tests that are of O(N) complexity.
March tests are named so, because starting with the first
memory location a 1 (or a 0) is written while locations
previous to that keep their written 1 (or 0) values. So it
appears like 1s (or 0s) are marching in from location 0
to the last location in the memory. This notation
unambiguously specifies the testing procedure, and the
number of reads and writes are easily seen that
determine the order of a test procedure.

Fig. 1. Generic BIST Architecture

Distribution system (DIST)-sends the data between TPGs to
CUT and CUT to ORAs.
Interconnections (wires), busses, multiplexers and scan
paths.
BIST controller is used in testing mode to control the BIST
circuitry and CUT.
Test Response Analysis (TRA): It analyses the value
sequence on PO and compares it with the expected output,
based on the value compacted signature is also stored for
future reference.

IV.

The March C algorithm is shown in below.

March C:{(w0); (r0,w1);(r1,w0);
(r1,w0); (r0)}.

TEST ALGORITHMS

Steps in March C- Test:

A test algorithm is a finite sequence of test elements. A test

element contains a number of memory operations, data
pattern specified for the read operation, address specified for
the read and write operations. We divided these test
algorithms into two groups: Traditional tests and Marchbased tests. The following are the well known traditional
tests: zero one, checkerboard, GALPAT and walking 1/0,
sliding diagonal and butterfly. These are either simple, fast

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(r0,w1);

26

In any order write 0s to all cells. (M0: (w0) ).

Read from the lowest address (expected read value
is 0) repeat until the highest address is reached, and
write a 1 at this address. (M1: (r0, w1) ).
Read from the lowest address (expected read value
is 1), write a 0 at this address and repeat until the
highest address is reached (M2: (r1, w0) ).

IAETSD 2016

ISBN:978-1535061506

Proceedings of ICRMET-2016
form will goes to another block of memory. Hence the
test sequence generator requires additionally one
inverter in order to perform test concurrently. The
method directly reduces the time required to write and
read the bit concurrently. This reduces the test time and
test costs also. Finally, there may be additional design
cost in terms of inverter only which need to generate
complement test sequence to other part of the memory
block.

Read from the highest address (expected read value

is 0), write a 1 at this address, and repeat until the
lowest address is reached (M3: (r0, w1)).
Read from the highest address (expected read value
is 1), write a 0 at this address, and repeat until the
lowest address is reached (M4: (r1, w0)).
In any order (expected read value is 0) read from all
the cell. (M5: (r0)).

This is the pseudo code for basic march c algorithm

V.
always@(posedge clock)
begin
if(reset) addra <= 0;
else if(rst_addr_cntr) addra <= 0;
else if(en_addr_cntr) addra <= addra + 1;
else addra <= addra;
end
always@(posedge clock)
begin
if(reset) dina <= 0;
else if(rst_data_cntr) dina <= 0;
else if(en_data_cntr) dina <= dina + 1;
else dina <= dina;
end

Memory testing is very important but challenging.

Memory BIST is considered the best solution due to
various engineering and economic reasons. March tests
are the most popular algorithms currently implemented
in BIST hardware. Using memory BIST has various
advantages much as no external test equipment, reduced
development efforts, at-speed tests.
REFERENCES
[1]

Modified March C - Algorithm for Embedded

Memory
Testing by muddapu parvathi, N.vasantha, K.Satya Parasad
International Journal of Electrical and Computer Engineering
(IJECE) Vol. 2, No.5, October 2012, pp. 571~576 ISSN: 20888708.
[2] Der-Cheng Huang; Wen-Ben Jone, "A parallel built-in selfdiagnostic method for embedded memory arrays," in ComputerAided Design of Integrated Circuits and Systems, IEEE
Transactions on , vol.21, no.4, pp.449-465, Apr 2002.
[3] Design of Built-in Self-Test Core for SRAM by Reeja J. and
Anusree L. S. International Journal of Engineering Research &
Technology (IJERT) ISSN: 2278-0181 Vol. 3 Issue 3, March
2014.
[4] A Failure Testing System with March C-Algorithm for Single
Event Upset by Peng Wang, ZhenLi, Chengxiang Jiang, Wei
Shao and Qiannan Xue International Journal of Hybrid
Information Technology Vol.7, No.2 (2014), pp.95-102.
[5] Design of Improved Built-In-Self-Test Algorithm (8n) for
Single Port Memory by Manoj Vishnoi, Arun Kumar, Minakshi
Sanadhya International Journal of Soft Computing and
Engineering (IJSCE) ISSN: 2231-2307, Volume-2, Issue-5,
November 2012.
[6] J.vande Goor.Testing Semiconductor Memories: Theory and
Practice. A.J.vande Goor, 1998.
[7] Testing of Embedded System Version 2 EE IIT, Kharagpur
Lesson 40 Built-In-Self-Test (BIST) for Embedded Systems.
[8] M.Bushnell and V.D. Agarwal, Essentials of electronic testing
for digital, memory and mixed-signal VLSI circuits, Kluwer
Academic Publishers, 2000.
[9] S.G.Shi-peng and F.Guoqiang,Experimental Study on Single
Event Effects of Deep Sub-micron SRAM Simulated by Pulsed
Laser,Atomic
Energy
Science
and
Technology,
vol.46,no.8,(2012),pp.1019-1024.
[10] An umol K.A, N.M. Siva Mangai, P .Karthigai kumar Built In
Self Test architecture for testing SRAM using transient current
testing 2013 IEEE conference on Information and
Communication Technologies.
[11] M. Abramovici, M. Breuer, and A. Friedman. Digital Systems
Testing and Testable Design. IEEE Press, 1995.

B. OPTIMIZED MARCH C ALGORITHM

The proposed Optimized March C algorithm
almost similar to March C but it follows concurrency in
testing the sequences. The steps for following the
concurrency are as follows:
Group entire memory into subgroups.
For each subgroup, generate all test vectors for the
first fault in the group.
Simulate all faults in the subgroup to select one
vector that detects most faults in that subgroup. If
more vectors than one detect the same number of
faults within the group, then select the vector that
detects most faults outside the group as well.
Apply the final test vectors to all subgroups
concurrently
The following are the elements in Optimized March
C algorithm.
M1:{(w0);(r0,w1);(r1);(w0);(r0,w1);(r1);
M2:{(w1);(r1,w0);(r0);(w1);(r1,w0);(r0);
The number of March elements is same as
traditional March c and is 6 but because of concurrency
the complexity is reduced.
According to Optimized March C- elements,
when 0s are written in one memory group, 1s will be
written in another group concurrently. So the test
sequence can be taken through an inverter hence true
form will goes to one block of memory and complement

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CONCLUSIONS

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IAETSD 2016