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Surprise Test: Silicon Institute of Technology

The document outlines details for a surprise test being given to students in the ECE-B branch of the Silicon Institute of Technology. It provides information on the subject, time allotted, maximum marks, semester, and date for a test involving the design of a sequence detector using D flip-flops to detect the sequence "111" and produce an output of 1, allowing for overlapping. Student identification numbers and spaces for marks awarded and an examiner's signature are also included.

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48 views1 page

Surprise Test: Silicon Institute of Technology

The document outlines details for a surprise test being given to students in the ECE-B branch of the Silicon Institute of Technology. It provides information on the subject, time allotted, maximum marks, semester, and date for a test involving the design of a sequence detector using D flip-flops to detect the sequence "111" and produce an output of 1, allowing for overlapping. Student identification numbers and spaces for marks awarded and an examiner's signature are also included.

Uploaded by

sushant_pattnaik
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as DOC, PDF, TXT or read online on Scribd
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Silicon Institute of Technology

Surprise Test
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Subject: DEC Branch: ECE-B Semester: 3rd
Time: 45 minutes Max Mark: 10 Date: 1st November 2016

Marks Awarded______________ Signature of the Examiner:__________________


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Question Cum Answer Sheet
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Univ. Regd. No./ Roll No. : SIC No:

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1. Design a sequence Detector which will detect 111 and produce output as 1. Overlapping
is allowed. Use D flip-flop for imlementation.

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