CT Delta Sigma ADC Tutorial
CT Delta Sigma ADC Tutorial
Delta-Sigma Analog-to-Digital
Converters
From System Architecture to Transistor-level
Design
u(t) Continuous-time fs
yc(t) y[n] v[n]
Loop-Filter
vc(t)
L(s)
DAC
[n] p(t)
0 n DAC 0 Ts t 0 Ts t 0 Ts t
NRZ DAC RZ DAC SCR DAC
NTF ( z ) 1 z
2
1
1 1 z 1 z 1
L( z ) 1 1
1
NTF ( z ) 1 z 1
2
1 z 1 z 1
2
l[n] = {0,2,3,4,5}
lc[n] = k1{0,1,1,1,} + k2 {0,1.5, 2.5, 3.5,}
Solving for lc[n]= l[n]: k1=1.5 and k2=1
Z {L z } L {P( s) L( s)}|t nT
1 1
s
j
Complex NTF(z) zeroes, zk e transform into conjugate
loop-filter poles at sk zk j
Here, 123
L0 fin
Alias rejection is given by
L0 f s fin
STF j L0 ( j ) NTF e j
Signal Transfer Function
100
NTF
L0
50 STF
0
10*log|.|
-50
-100
-150
0 0.5 1 1.5
/
NTF NTF
40
FF L0
40
FB L0
STF STF
20 20
0 0
10*log|.|
10*log|.|
-20 -20
-40 -40
-60 -60
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1 1.1 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1 1.1
/ /
fs=1 Hz
Sampled loop-response is delayed due to the finite gain-
bandwidth of the opamp
First sample after unit delay is affected (1-Td)
1 Td z 1 Td z 2
Order of the loop is increased due to the extra delay
Loop gets unstable at Td=1
NTF peaking as Td increases, leading to modulator becoming more
sensitive and prone to instability
kn n 1 n ki
k k1 k2
'
i
n 1! i 1 i 1 !
1
kn' kn
In-band loop-gain
NTF OBG 80
Magnitude (dB)
Maximum stable amplitude (MSA) 40
More stable but degraded NTF
performance 20
Slower design 0
-20
-40 -2 -1 0 1 2
10 10 10 10 10
Frequency (rad/sec)
Nominal
Loop-filter bandwidth 100
Smaller RC
Larger RC
In-band loop-gain
NTF OBG 80
Magnitude (dB)
Maximum stable amplitude (MSA)
Less stable but more aggressive
40
NTF performance 20
Faster design 0
-20
-40 -2 -1 0 1 2
10 10 10 10 10
Frequency (rad/sec)
-20
dBFS
-40
-60
1 1
0.8 0.8
0.6 0.6
0.4 0.4
0.2 0.2
0 0
-0.2
-0.2
-0.4
-0.4
-0.6
-0.6
-0.8
-0.8
-1
0 50 100 150 200 250 300 350 -1
0 50 100 150 200 250 300 350
v[n] n
vc(t)
v[n] DAC vc(t) NRZ DAC t
CLK
vc(t)
RZ DAC
t
t DAC Error
(v[n+1]-v[n])tn+1
v[n+1]
2v[n]tn 2v[n]tn+1/2
t
DAC Error
t
Ts
v[n-1]
v[n+1]
DAC Error
I1
I1
sC1
IDAC
IDAC
sC1
I1 I1
10
L0
Continuous Time lc(t) l[n]
Loop Filter
(n) L(s)
L1
1+ 5
p(t-)
DAC pulse shape Direct path
k0
0
k0 0 1 2 3 4 5 6 7 8
l0(t)
fs
(n) l1(t) l2(t) l3(t) lc(t) l[n]
1+
I1(s) I2(s) I3(s) k3
p(t-)
k2
k1
1.5
dBFS
1
Ideal
0.5 Real Integrator
N=5
N=20
N=50
0
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
/
NTF
dBFS
0.8
0.6
Loop-Filter
u
v
DACim DACip
Thermometer coded v
Leads to distortion
intermodulation of quantization noise into the signal
band
u(t) fs
v[n]
vc(t) L(s)
DAC Scrambler
PN Sequence
as fast as possible 15
0
0 10 20
First-Order Shaping
15
10
0
0 10 20
N=2B
u(t) fs
v N Thermometer
vc(t) L(s) to Binary
B
Accumulator
Barrel N
DAC Shifter
Lower-power implementation
Relaxed bandwidth requirements for the integrators
Inherent Anti-aliasing filtering (AAF)
Eliminates/relaxes input filtering
Fixed resistive input impedance
Higher sampling-rates extending to GHz-range
Suitable for RF integration
Reduces supply and ground noise impact
Less complicated clocking (compared to DT)