Overview of Power Semiconductor Devices and Power Modules: Lab No. 2
Overview of Power Semiconductor Devices and Power Modules: Lab No. 2
Lab no. 2
1. Introduction
The power structure of the static converters contains as basic elements various
power semiconductor devices which act as an electronic switch (static breaker).
During the on steady state these power devices never operate in their linear (active)
region, where they act as a variable resistance, because unacceptable power losses
would occur. For this reason, in power electronics the semiconductor devices operate
only in two stable modes: the full conduction mode (on-state) when the electric
current is fully permitted to flow through the device, ideally without a voltage drop
across it, and the blocking mode (off-state) when the current flow is completely
disrupted. The transitions between the two steady states can be induced by the power
circuit or by a control circuit and must be fast in order to minimize the switching
power losses. For this reason and in order to reduce the size of the power electronic
equipments by increasing the switching frequency, the transitions speed of the power
semiconductor devices wants to be great. Also, because the power semiconductor
devices operate, usually, with high voltages and/or large currents the semiconductor
structure of these devices is different than the structure of low-power devices.
precisely, a reverse voltage is applied on the device (reverse biased). The off-state
cannot be induced through the gate and for this reason one can say that the thyristor is
a half-controlled device. The research efforts to obtain a semiconductor structure
closer to the thyristor with controlled turn-off feature have lead to achieve the Gate
Turn-Off Thyristor (GTO). This is a device from the full controlled devices class. The
triac may be equated with a structure consisting of two thyristors connected in parallel.
3) Controllable power devices – there are switch elements which can be
brought into an on-state and an off-state through the control signals. With a few
exceptions (e.g. GTO, MOS Controlled Thyristor-MCT) the opening signal must be
continuously applied on the control terminal in order to maintain their on-state as long
as the device is forward biased. The off-state happens automatically when the signal is
removed or falls below a certain threshold. Yet, in many applications there is a
preference to obtain the turn-off transition and to maintain the off-state with a reverse
control signal in order to be sure that they won’t open accidentally. In this last
situation can appear short-circuits in the power electronic circuits.
Depending on the nature of the control signals, the controllable power devices
can be further divided into two distinct groups:
a. Current-controlled devices :
¾ Bipolar Junction Transistors (BJT) – there are relatively a low-speed
devices (high switching power losses), but they have the advantages
of a low on-state voltage drop (small on-state power losses).
¾ Gate-Turn-Off Thyristors (GTO) – used in high power applications.
A positive current pulse with low amplitude is needed to opening
these devices (same as for the thyristor) and a negative current pulse
with high amplitude is needed to blocking them.
b. Voltage-controlled devices – they are also called power semiconductor
devices with MOS (Metal-Oxide-Semiconductor) gate or isolated gate.
Taking into account their undisputed qualities (low control power, high
switching frequency etc.), the research concerning power semiconductors
and the technological efforts involved in manufacturing have been focused
on developing these particular devices. Today, the market offers a plethora
of these devices. The following MOS gate examples are those that are the
most used or have played a central role in power electronics’ evolution:
¾ MOSFET power transistors (MOS Field Effect Transistors) – are
fast devices (with small switching power losses) and for this reason
they are used in converters with high switching frequencies (tens or
hundreds of kHz). Their limitation involves a rapid increase in the on-
state resistance (rDS(on) – catalogue parameter) along with the rise of
the maximum blocking voltage rating. These increases will lead to
Lab no.2: Overview of power semiconductor devices and power modules 3
important power losses during conduction. For this reason, they are
not used in high power applications.
¾ Insulated Gate Bipolar Transistor – IGBT is a hybrid transistor, a
mixture between the bipolar junction transistor whose main quality is
the low on-state power losses and the MOSFET transistor from which
it borrowed the high switching speed (low switching power losses).
The result was a transistor that can be used in switch-mode converters
with high switched frequencies (kHz ÷ tens of kHz) and until powers
of megawatts. Today the IGBT transistor is the engine of power
electronics, the most widely used semiconductor device from this
technical field.
Taking into consideration the diversity of the controllable power devices and
their common capacity to be brought in on-state or in off-state through the control
signals, it results the need to represent these devices by a unique, a generic symbol in
the power schemes. In Fig. 2.1 there are two versions of the same symbol used in the
literature.
iT iT
+ +
T vT T vT
- -
a) b)
The first version (Fig. 2.1.a) is similar to the symbol used for an electric
contact of a contactor or a relay. The second version (Fig. 2.1.b) is more stylized and
highlights the unidirectional current conduction feature of these devices (the arrow of
the contact) [Mohan et al.]. The variables iT and vT represent the current that flow
through the device T and the voltage drop across it, respectively. In the following
laboratory works, version (b) will be preferred to version (a), because the latter is
more adequate for the bidirectional electronic switch used in matrix converters.
A second classification criterion of power semiconductor devices could be the
number of steady state volt-ampere (i-v) characteristics obtained by each device. All
of these, ideally defined, are presented in Fig. 2.2 on the iT – vT axes system. The
following characteristics and their corresponding states of the power semiconductor
devices can be thus emphasized:
9 Forward blocking characteristic – is obtained when the device blocks forward
(positive) voltages. No current flows through the device in this off-state.
iT
Forward conduction
characteristic
Controllable turn-on
Reverse blocking (turn-off)
characteristic
uT
Forward blocking
Controllable turn-on characteristic
(turn-off)
Reverse conduction
characteristic
Fig. 2.2 All the ideal steady state current-voltage (i-v) characteristics which
can be obtained by a power switch.
(a) (b)
Fig.2.3 Bidirectional and controllable switch cells obtained with diodes and discrete
controllable devices having a low reverse blocking capacity.
All the solid state power devices contain an active part built from a
semiconductor chip, hermetically sealed in a capsule. The chip is divided into layers
or regions different doped with impurities. Thus, a semiconductor structure is formed
(e.g. a silicon wafer) on which depend the operating parameters of the device. The
surfaces of the semiconductor chip in contact with the terminals are metallized and the
semiconductor superficial layer under the metallized area is heavily doped in order to
avoid a high contact resistance. The surfaces that remain are passivated and protected
with dielectric materials added or formed directly from the semiconductor material
such as, the silicon dioxide (SiO2).
The capsule of the device has different shapes and sizes depending on its type,
on the producer, on the rating voltages, on the maximum current, of the cooling
method, etc. There is a tendency of the companies to align themselves to the same
standard whether it is the size of the capsule or that of the modules. The capsule has a
multiple role: it gives mechanical resistance to the devices, it assures the protection of
the semiconductor structure against any environment factors such as humidity,
sustains the connection terminals, and last, but not least, assures the heat transfer,
sometimes with galvanic isolation, between the semiconductor chip and the exterior.
The symbol of a semiconductor device is a graphical representation which
defines the device type and highlights all of its power and control terminals. Through
the use of the graphic symbol, the exact position of a semiconductor in a scheme can
be marked and pinpointed, as well as its connexions with other circuit elements or
with other functional blocks.
In order to define the operating performances of a semiconductor device and
having the criteria by which one can compare it with other types of devices, one must
first define its characteristics. These one can be grouped into two categories:
• static (steady state) characteristics: through which the rated voltages are
highlighted, the forward or reverse breakdown voltages, the rating, maximum
and leakage currents, the on-state voltage, the on-state power losses, the
saturation and the active regions, the safe operating aria (SOA) etc. All these
parameters are defined for a steady state operation, conduction and blocking
state. Some of these parameters are presented in the device’s catalogue and
other depends on the control signal value. In general, the static parameters are
given through the volt-ampere (i-v) characteristics drawn in the electric plan
presented in Fig. 2.2.
• dynamic (transient) characteristics: through which the dynamic
performances of the devices are evaluated, more precisely the transition
parameters from the off-state to the on-state and vice versa. These parameters
are: the switching times, the maximum switching frequencies, the switching
power losses, the increase and decrease slopes of the current or voltage
waveforms, the rates of recombination of the charges that contributed to the
conduction, the switching overvoltages, etc.
It must be outlined that during the switches, the voltage and the current
waveforms evolve in different directions, either simultaneously or separately (e.g. the
switching cells with recovery diodes). In the case of a separate evolution, the current
transitions through the power semiconductor device appear all the time when the
voltage drop is quite high. Thus, during a turn-on transition, first there will increase
the current from zero to the Id value, after which the voltage will drop to its on-state
voltage Von (saturation value); during the turn-off transition, the voltage will first rise
from the Von value to the source value Vd, after which the current drops to zero. In
order to generally evaluate the losses, only the last case will be taken into account,
because it covers every situation. From a quantitative point of view, the power losses
can be equated to the energy retained by the static switch in a second time interval,
value which, in fact, corresponds to the average power converted into heat. With these
specifications and knowing that fs opening-blocking transitions pairs occur per second,
it can be obtained the switching power losses equation [see Mohan et al.]:
Ps =
1
2
(
⋅ U d ⋅ I d ⋅ f s ⋅ tc ( on ) + tc ( off ) ) (2.2)
where: tc(on) and tc(off) are mentioned above, fs = 1/Ts is the switching frequency of the
device, Ts = ton + toff is the switching time period, ton is the on-state time interval and
toff is the off-state time interval.
From the (2.2) equation one can conclude that the switching power losses
increase proportionally with the switching frequency and with the rise of the switching
times. Thus, in order to obtain a high switching frequency for a power electronic
equipment, so as to diminish its mass and size, fast and ultra fast devices must be
chosen with very short switching times (e.g. MOSFET type power transistors).
The instantaneous power pT, which determines the losses in the device,
appears not only during the device’s transition, but also during the on-state. The losses
afferent to the conduction state, called on-state power losses (Pon), can be calculated
using the average power taken by the device in the ton time intervals [see Mohan et
al.]:
t
Pon = f s ⋅ Von ⋅ I d ⋅ ton = Von ⋅ I d ⋅ on = Von ⋅ I d ⋅ D (2.3)
Ts
where: D = ton Tc is the duty ratio (duty cycle) of the device.
It can be observed that on-state power losses are proportional with the on-state
voltage Von, with the Id value of the steady state current that flows through the device
and with the on-state time interval ton. In order to increase the Id current without
exceeding the on-state power losses, a device with low on-state voltage Von must be
chosen (e.g. BJT or IGBT type power transistors).
The total power losses during the device operation are given by the sum of the
switching and on-state power losses:
5. Power modules
The constructive solution that won over time resulted from the observation
that mostly of the modern power electronic structures use well-known repetitive
combinations: transistors associated with discharge diodes, half bridge structures with
diodes, thyristors or power transistors, etc. Consequently, the idea of “packaging” has
arisen in order to gather all these standard structures in a single capsule as power
modules. Over time, the concept was adopted and developed by the majority of the
important companies, a certain level of standardization being obtained. This
standardization is reflected today in the topologies incorporated in the modules, in the
capsule shapes, in the arrangement and the numbering of the terminals, in the
manufacturing technology, in the rating voltages and currents etc.
By using the modules in power electronics, the following advantages are
obtained:
9 size decrease and compactness of the power electronic system;
9 increased immunity to the disturbances;
9 decrease of the parasitical inductances and electromagnetic emissions;
9 power losses decrease during operations;
9 radiator isolation from the under voltage parts;
9 easy assembly and cost reduction for the whole system;
Lab no.2: Overview of power semiconductor devices and power modules 9
temperatures in comparison with silicon. This could be silicon carbide (SiC) and in a
distant future, the diamond.
The power semiconductor devices based on silicon carbide were already
obtained. The laboratory testing phases are over and the first devices have been
launched on the market. The tests show remarkable advantages, especially at high
temperatures (around 200°C) at which its can operate without losing their properties.
Consequently, the current densities flowing through the power switches made out of
SiC can increase a few times, while the size, for the same current, diminishes in
comparison with the silicon devices.
Similar to germanium and silicon, the carbon is a tetravalent element. The
crystalline structure of carbon under the form of diamond resembles with the
crystalline structure of the classic semiconductor elements. To be considered an
acceptable semiconductor material for manufacturing controllable switches, the
structure of the diamond has to be perfect. Not even the purest natural diamonds can
be used in these applications. The normal synthetic diamonds obtained through the
sedimentation of carbon vapors do not reach the standards necessary for a usable
semiconductor material. Only via special conditions can the manufactured diamonds
achieve the crystalline structure capable to sustain greater electron mobility than the
silicon carbide. The final result is that of a semiconductor material with a higher
conductivity than presently used, i.e. lower power losses. Moreover, the diamond has
superior advantages due to the stronger electric fields and resistance to higher
temperatures. Therefore, it can be obtain static switches with normal sizes that may
sustain currents of tens of kilo amperes and voltages of tens of kilovolts without
connecting several devices in parallel or in series. It will be the perfect switch.
References
[1] Mohan N., Undeland T., Robbins W.: Power Electronics: Converters, Applications
and Design, Third Edition, Published by John Willey &Sons Inc., USA, 2003.
[2] Baliga B.J., Modern Power Devices, John Willey &Sons, New York, 1987.
[3] Sum Kit K., Switch Mode PowerConversion – Basic Theory and Design, Ed. Marcel
Dekker, New York, 1984.
[4] Masuda H., New Advanced Power Semiconductors, PCIM Europe, Issue 6, 1998,
pp.316-320.
[5] Thurau J., Innovative IGBT Module Concepts for Inverter Technique, PCIM Europe,
Issue 5, 2000, pp.10-15.
[6] Noda S., Hussein K.H., Yamada S. et al., Compact Intelligent Module for Drives,
PCIM Europe, Issue 4, 1997, pp. 226-227.
[7] Backhaus K., Intelligent Power Module Family SKIIP Pack 3-rd Generation, PCIM
Europe Issue 8/9, 2000, pp. 10-14.
[8] Majumdar G., More Functional Integration, PCIM Europe – Special 10 years, 1999,
pp. 23-24.
[9] Arlt B., Smart Power in Electronic, PCIM Europe, May 2003, pp. 10-11.
[10] Heinzel T., IPM for Low Power Drives, PCIM Europe, Issue 4, 1999, pp. 8-14.