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Exam #1 Problem 1 (30 Points) Doping A Semiconductor

This document contains an exam for the course 8.044 Statistical Physics I given in Spring 2004 at MIT. It consists of 3 multi-part problems related to doping semiconductors, collision products in high energy physics, and equipment failure in an experiment. The problems involve calculating probability distributions, expected values, variances, and time required to determine a parameter to a given uncertainty. Integrals and formulas relevant to the problems are provided at the end.

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130 views

Exam #1 Problem 1 (30 Points) Doping A Semiconductor

This document contains an exam for the course 8.044 Statistical Physics I given in Spring 2004 at MIT. It consists of 3 multi-part problems related to doping semiconductors, collision products in high energy physics, and equipment failure in an experiment. The problems involve calculating probability distributions, expected values, variances, and time required to determine a parameter to a given uncertainty. Integrals and formulas relevant to the problems are provided at the end.

Uploaded by

*83*22*
Copyright
© © All Rights Reserved
Available Formats
Download as PDF, TXT or read online on Scribd
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MASSACHUSETTS INSTITUTE OF TECHNOLOGY

Physics Department

8.044 Statistical Physics I Spring Term 2004

Exam #1

Problem 1 (30 points) Doping a Semiconductor

FN

�

 l @ N

When diffusing impurities into a particular semiconductor the probability density


p(x) for finding the impurity a distance x below the surface is given by

p(x) = (0.8/l) exp[−x/l] + 0.2 δ(x − d) x≥0


= 0 x<0

where l and d are parameters with the units of distance. The delta function arises
because a fraction of the impurities become trapped on an accidental grain boundary
a distance d below the surface.

a) Make a carefully labeled sketch of the cumulative function P (x) which displays
all of its important features. [You do not need to give an analytic expression
for P (x).]

b) Find < x >.

c) Find the variance of x, Var(x) ≡< (x− < x >)2 >.

The contribution to the microwave surface impedance due to an impurity decreases


exponentially with its distance below the surface as e(−x/s) . The parameter s, the
“skin depth”, has the units of distance.

d) Find < e(−x/s) >.

1
Problem 2 (40 points) Collision Products

-*�∆

 ! " #
-)�∆

A certain collision process in high energy physics produces a number of biproducts.


When the biproducts include a pair of elementary particles A and B the energies of
those particles, EA and EB , are distributed according to the joint probability density

4EB (EA − EB )
p(EA , EB ) = exp[−(EA + EB )/∆] for EA > 0 and EA > EB > 0
∆4
= 0 elsewhere

∆ is a parameter with the units of energy. A contour plot of p(EA , EB ) is shown


above. Note that the energy EA is always positive and greater than the energy EB .

a) Find p(EB ). Sketch the result.


b) Find the conditional probability density p(EA | EB ). Sketch the result.
c) Are EA and EB statistically independent? Explain your reasoning.

The collisions are statistically independent random events that occur at some uniform
rate in time. The pair A and B only occurs in a fraction f of the collisions. When the
pair is produced, it is detected with 100% efficiency. When the pair is not produced,
there are no competing background events.

d) If the overall collision rate is 106 per hour, how long must one run the experiment
in order that the uncertainty in the determination of f is of the order of one
part in 104 of the value of f measured in that run? Note: one does not need
the answers to a), b), or c) to answer this question.

2
Problem 3 (30 points) Equipment Failure

A graduate student begins an experiment which depends on two critical pieces of


apparatus: a dilution refrigerator and a sophisticated laser system. Each is prone to
failure, the failures are statistically independent, and a failure of either one ends the
experimental run. The probability of failure after a time t for the refrigerator is given
by

p(tr ) = (1/α) exp[−tr /α] tr ≥ 0


= 0 tr < 0

and for the laser by

p(tl ) = (1/β) exp[−tl /β] tl ≥ 0


= 0 tl < 0

We want to find the probability density for the duration of an experimental run T ;
that is, we want to find the probability density for T ≡ Min(tr , tl ).

a) Find an analytic expression for the cumulative function P (T ). No short cuts


here; do the integrals. [Hint: a bit of thought beforehand can decrease the work
considerably.]

b) Find the probability density p(T ) and sketch the result.

3
Integrals

eax
eax dx =
a

eax
x eax dx = (ax − 1)
a2

eax 2 2
x2 eax dx = (a x − 2ax + 2)
a3
  
dx ex
= ln
1 + ex 1 + ex

Definite Integrals

For integer n and m


 ∞
xn e−x dx = n!
0

 ∞ −x
√
e
√ dx = π

0 x
 ∞
2 −1/2
x2n e−x
2 /2σ 2
(2πσ ) dx = 1 · 3 · 5 · · · (2n − 1) σ n
−∞

 ∞
1
x e−x dx =

0 2

 1
n!m!
xm (1 − x)n dx =
0 (m + n + 1)!

4
MIT OpenCourseWare
http://ocw.mit.edu

8.044 Statistical Physics I


Spring 2013

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