Study On Built in Self Test Bist Enabled UART Using Verilog
Study On Built in Self Test Bist Enabled UART Using Verilog
communication technologies were being data’s. The BIST controller can be easily
developed. The microprocessor is a VLSI controlled as a device details for the novel
device. The term is no longer as common as architecture for the further details. The test
it once was, as chips have increased in response analysis could be considered for
complexity into the hundreds of millions of the UART transmitting and the receiving
transistors. data’s form the each bits. The test results
can be detecting the fault address and then it
II. BIST ARCHITECTURE consumes all the details as a database and
BIST architecture consists of a take a look at identifies the fault address and shows the
Pattern Generator (TPG), the circuit to be details. This could be as a process of
tested (CUT), some way to investigate the simulation level waveform.
results (TRA), and some way to compress III. UART ARCHITECTURE
those results (BCU) and also LFSR for
simplicity and handling. CUT could be A universal asynchronous
designed as memory device architecture for receiver/transmitter, abbreviated UART , is
testing the faults. The fault address can be a computer hardware device that translates
data between characters (usually bytes) in a
detected and it could compare to the
computer and an asynchronous serial
comparator for the analysis of the all
communication format that encapsulates
relevant circuits. those characters between start bits and stop
bits.
The UART architecture contains the
transmitter and the receiver. This could be
contain and loads the buffer data for all the
read and write operation. The data transfers
through this serial communication to get the
proper information about the outputs.
V.CONCLUSION
REFERNCES
[1] Mohd Yamani Idna Idris, Mashkuri Yaacob, Zaidi
Razak, “A VHDL Implementation of UART Design
with BIST capability”
[2] Dr. T.V.S.P. Gupta, Y. Kumari, M.Asok
Kumar”UART realization with BIST architecture
using VHDL” International Journal of Engineering
Research and Applications (IJERA) ISSN: 2248-9622
www.ijera.com Vol.3, Issue 1, January -February
2013, pp.636-640
Figure 7: Waveform of BIST architecture [3] M.S. Harvey,Generic UART Manual,Silicon
Valley,December 1999.
[4] P. J. Anderson , “The designer’s guide to VHDL”
, Morgan Kaufman , 2nd edition, 2002.
[5] Neil H.E. Weste, Kim Haase, David Harris , A.
Banerjee , “CMOS VLSI Design: A circuits and
Systems Perspective”, Pearson Education.
[6] K. Zarrineh, and S. J. Upadhyaya, “On
programmable memory built-in self test
architectures”, Design, Automation and Test in
Europe Conference and Exhibition 1999.
Proceedings , 1999, pp. 708 -713.
[7]. Fang Yi-yuan and Chen Xue-jun, “Design and
Simulation of UART Serial Communication Module
Based on VHDL”, in the proceedings of 3rd
International Workshop on Intelligent Systems and
Applications (ISA), IEEE, May 2011, DOI:
Figure 8: Architecture of LFSR
10.1109/ISA.2011.5873448, pp.1-4.