Contact Mechanics
Contact Mechanics
1. Introduction
The topography of rough surfaces influences a number of the curvature are used for characterization (Nayak, 1971). The
tribological phenomena such as friction, wear and lubrication. theories of elastic (Greenwood and Williamson, 1966) and
It is well known that the geometric structure of rough surfaces plastic (Nayak, 1973a; Gupta and Cook, 1972; Bhushan,
is random and that roughness features are found at a large 1989a) contacts between rough surfaces use these parameters
number of length scales between the length of the sample and for their analysis. However, it has been found that the
atomic scales. To study the mechanisms of any tribological variances of slope and curvature depend strongly on the
phenomenon it is absolutely necessary to characterize such resolution of the roughness-measuring instrument or any
multiscale rough surfaces and to know the structure at all other form of filter and are hence not unique (Thomas, 1982a;
length scales relevant to the phenomenon. This study em- Bhushan et al., 1988). It is also known that surface
phasizes the role of fractal geometry in understanding the ef- topography is a nonstationary random process for which the
fect of surface roughness in tribology. variance of the height distribution is related to the length of
Conventionally, the deviation of a surface from its mean the sample (Sayles and Thomas, 1978). Consequently, in-
plane is assumed to be a random process for which statistical struments with different resolutions and scan lengths yield dif-
parameters such as the variances of the height, the slope and ferent values of these statistical parameters for the same sur-
face. The conventional methods of characterization are
therefore fraught with inconsistencies which give rise to the
On sabbatical from IBM Research Division, Almaden Research Center, San term "parameter rash" (McCool, 1987) commonly used in
Jose, CA 95120. contemporary literature. The underlying problem with the
Contributed by the Tribology Division of THE AMERICAN SOCIETY or conventional methods is that although rough surfaces contain
MECHANICAL ENGINEERS and presented at the STLE/ASME Joint Tribology roughness at a large number of length scales, the characteriza-
Conference, Fort Lauderdale Fla., October 16-19,1989. Manuscript received by
the Tribology Division April 3, 1989. Paper No. 89-Trib-20. tion parameters depend only on a few particular length scales,
Nomenclature
A area [m2]
B fractional Brownian motion;
also exponent in number-area
rule S power in a spectrum [m3] a = standard deviation of heights,
D = dimension t time [s] Vrn^ [m]
G = surface characterization x distance [m]; also exponent in
parameter [m] equation (35) a' = standard deviation of slope,
H = exponent in fractional Brown- height [m] •4m2
ian motion; also hardness of ZP = mean height of asperity peaks
material [N/m 2 ] a = surface parameter used for a" = standard deviation of cur-
l,L length [m] elastic contact theory vature, Vrri4 [m _ 1 ]
m0 zeroth moment of power length-scaling factor
spectrum, variance of height scaling ratio determining the w = frequency, l / / [ m _ 1 ]
[m2] spectral density
second moment of power unit of measurement [m] Subscripts
m0
spectrum, variance of slope surface parameter described a = referring to apparent area
fourth moment of power in equation (24) c = referring to a cavity
spectrum, variance of cur- mean curvature of peaks h = referring to high frequency
vature [m~ 2 ] [m- 1 ] limit
M measure [mD] thermal conductivity / = referring to low frequency
N number [Wm-'K-1] limit
Pr mean pressure, [N/m 2 ] number of contact spots L = referring to largest spot or
P load, [N] thermal resistance [W ~' K] cavity
resolution of surface measur- parameters for elastic contact p = referring to asperity peaks
ing instrument [m] theory, equation (18) / = referring to the total area
Distance (microns)
£0 120 IBB 240
(a)
Distance (microns)
X
(a) ~~
10 13
3 '
£ 10"'
o
D x -direction
v y -direction
suggests some scaling relation between the roughness structure textured channels along the x-direction which appear quite
at different length scales. periodic in the ^-direction, which correspond to the cir-
The surface topography of a smooth magnetic thin film cumferential and radial directions, respectively. The
rigid disk was obtained by the optical profiler and is shown in anisotropy is also seen in the two-dimensional spectrum of
Fig. la. The wavelength of light used was 653. \nm and the Fig. 8£>. The averaged spectra follow power laws of co~2-38
disk used was of type C as described by Bhushan and Doerner (D=1.31) in the ^-direction and CJ~3-52 (D=l) in the y-
(1989c). The topography appears random and isotropic, as direction, as shown in Fig 8c. Due to the presence of textured
can be qualitatively seen in the two-dimensional power spec- grooves along the x-direction, the .y-spectrum contains more
trum in Fig. lb. The circumferential direction corresponds to power than the x-spectrum. However, the trends in the y-
the x axis whereas the radial direction corresponds to the y, spectrum suggests that at higher frequencies, undetected by
axis. The spectra in the x and the y directions coincide and the optical profiler, the spectra in the two directions would
follow a power law of co-2-24 corresponding to a fractal dimen- meet. Although the roughness in the two directions follow a
sion of 1.38 at the length scales shown in Fig. 1c. In com- fractal and non-fractal structure, the spectra of both are seen
parison to a smooth disk, Fig. 8 shows the measurements of a to follow power laws, as observed for the previous case.
textured magnetic thin film rigid disk which was optically The profiles and the spectra of lapped and ground stainless
measured by a wavelength of 653.1M/M. The disk used was of surfaces are shown in Figs. 9a and 9b, respectively. The
type Bl as described by Bhushan and Doerner (1989c). The roughness measurements were made by traversing a diamond
topography in Fig. 8a is strongly anisotropic and consists of stylus, of radius 2.5/iW, in contact with the surface. The in-
" -o.et
v^^^
Fractal Simulation
(a)
xz 0.6
••'Vi/VyiA'^^
(*)
" 0 1 2 3 4 5
Horizontal Distance, x (mm)
-51E -259 0 259 51E
Spatial frequency (1/mm)
(=)
„ 10"'
1 10" 2 3
o v v -direction
102 103 104 105
FREQUENCY, a [m~