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Devais Elektronika SAP

1. The document outlines the course schedule for an Electronics Device course taken place from September 1 to December 19, 2008. 2. The course covers topics such as semiconductor fundamentals, carrier properties, metal-semiconductor contacts, pn junction diodes, bipolar junction transistors, MOS capacitors, and MOS field-effect transistors. 3. Student assessment includes homework assignments, a middle test, seminar presentations, and a final test.

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Mesah Yoga Karisma
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53 views

Devais Elektronika SAP

1. The document outlines the course schedule for an Electronics Device course taken place from September 1 to December 19, 2008. 2. The course covers topics such as semiconductor fundamentals, carrier properties, metal-semiconductor contacts, pn junction diodes, bipolar junction transistors, MOS capacitors, and MOS field-effect transistors. 3. Student assessment includes homework assignments, a middle test, seminar presentations, and a final test.

Uploaded by

Mesah Yoga Karisma
Copyright
© Attribution Non-Commercial (BY-NC)
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as DOC, PDF, TXT or read online on Scribd
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COURSE SCHEDULE 08-09

1. Course : Electronics Device


2. Course Code : EES210804 SKS: 4 Semester: 3
3. Instructor :
1. Prof. Dr. Ir. Djoko Hartanto M.Sc. (DH)
2. Arief Udhiarto, M.T. (AU)
4. Class System : Single Parallel
5. Course Objective : mastering in basic concept of integrated circuit operation
devices specially in silicon integrated circuits
6. Grading (%) : Homework (10), Middle Test (35), Seminar (15), Final
Test (40)
7. Lesson Plan

Date Course Schedule Media Assignment Lecturers


1. 01-09-08 1. Pre-test Power- Topics for DH-AU
2. Introduction to ED Course Point Seminar;
(PP) Device
Journals.
2. 03-09-08 Semiconductor Fundamentals: intro., PP DH-AU
carrier modeling
3. 08-09-08 Carrier properties, distributions, PP DH-AU
concentrations and carrier action
4. 10-09-08 Review of Microelectronics Fabrication PP DH-AU
5. 15-09-08 Metal-Semiconductor Contacts and PP DH-AU
Schottky Diodes
6. 17-09-08 Metal-Semiconductor Contacts and PP DH-AU
Schottky Diodes
7. 22-09-08 pn Junction Diode: electrostatics, I-V PP Homework DH-AU
characteristics, junction capacitance, (HW) –1
transient response
8. 06-10-08 pn Junction Diode: electrostatics, I-V PP Collect HW-1 DH-AU
characteristics, junction capacitance,
transient response
9. 08-10-08 Bipolar Junction Transistor: structure PP DH-AU
and operation
10. 13-10-08 Bipolar Junction Transistor: structure
and operation
11. 15-10-08 BJT static characteristics, BJT dynamic PP DH-AU
performance
12. 20-10-08 BJT static characteristics, BJT dynamic PP Homework DH-AU
performance (HW) –2
13. 22-10-08 Bipolar Junction Transistor: structure PP Collect HW-2 DH-AU
and operation
14. 27-10-08 Middle Test
15. 03-11-08 Metal-Oxide-Semiconductor PP DH-AU
Capacitor
16. 05-11-08 Metal-Oxide-Semiconductor PP DH-AU
Capacitor
17. 10-11-08 MOS Field-Effect Transistor: structure PP DH-AU
and operation, I-V characteristics
18. 12-11-08 MOS Field-Effect Transistor: structure
and operation, I-V characteristics
19. 17-11-08 Seminar PP
20. 19-11-08 Seminar PP
21. 24-11-08 Seminar PP DH-AU
22. 26-11-08 Seminar PP DH-AU
23. 01-12-08 Seminar PP DH-AU
24. 03-12-08 Free week PP DH-AU
25. 10-12-08 Final Test PP DH-AU

8. Text Books
* Primary Text : Semiconductor Device Fundamentals: R. F. Pierret
(Addison Wesley, 1996)
Semiconductor Integrated Circuit Processing
Technologyh: Runyan, Bean (Addison Wesley)

* References Text :
1. Solid State Electronic Devices 4th Edition: B. G.
Stretman, S. Banerjee (Prentice Hall, 2000)
2. Device Electronics for Integrated Circuits 3rd
Edition: R. Muller, T. Kamins (Wiley & Sons, 2003)

9. Related Journal : 1. Sensors and Actuators


2. IEEE Transaction of Electron Devices.
3. IEEE Electron Device Letter.
4. IEEE Journal of Solid-State Circuits.

Academic Calendar Information:

Course Period : 1 Sep – 19 Dec 2008


Middle Test : 27 Oct – 31 Oct 2008
Final Test : 09 Dec – 19 Dec 2008

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