Integrated Ferroelectrics

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Equivalent circuit models using CPE for impedance

spectroscopy of electronic ceramics

Shukdev Pandey, Devendra Kumar, Om Parkash & Lakshman Pandey

To cite this article: Shukdev Pandey, Devendra Kumar, Om Parkash & Lakshman Pandey (2017)
Equivalent circuit models using CPE for impedance spectroscopy of electronic ceramics, Integrated
Ferroelectrics, 183:1, 141-162, DOI: 10.1080/10584587.2017.1376984

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INTEGRATED FERROELECTRICS
, VOL. , –
https://doi.org/./..

Equivalent circuit models using CPE for impedance

spectroscopy of electronic ceramics
Shukdev Pandeya , Devendra Kumara , Om Parkasha , and Lakshman Pandeyb
a
Department of Ceramic Engineering, IIT(BHU), Varanasi, India; b Department of Physics and Electronics,
Rani Durgavati University, Jabalpur, India

ABSTRACT ARTICLE HISTORY

Complex immittance (Impedance Z, Modulus M, Admittance Y, Received  March 
Permittivity ε) spectra for some equivalent circuit models involv- Accepted  August 
ing resistances, capacitances and constant phase angle elements
KEYWORDS
(CPE) are calculated for different ratios of the parameters. A com- Impedance spectroscopy;
parison of experimentally obtained complex immittance plots ceramic; constant phase
with these diagrams greatly facilitates the search for the most angle elements (CPE);
appropriate equivalent circuit representing the electrical proper- equivalent circuit model;
ties of electronic ceramics. An equivalent circuit for Ba1-x Srx TiO3 CNLS
(x = 0.35) ceramic system is developed by using these simulated
plots.

1. Introduction
Electronic ceramics are technological materials having vast variety of applica-
tions such as actuators and sensors, computers memories, electrically controlled
microwave tuning devices for RADAR applications etc and are playing key role in
electronics industry today [1–3]. In actual practice the ceramics are integrated to
some other systems or components. A prior knowledge of an equivalent circuit suit-
able to represent their behavior in a given frequency range may greatly facilitate the
overall optimum design of the systems. In the study of electrical behavior of ceram-
ics Impedance Spectroscopy is being increasingly used which, in turn, is proving
to be very useful for obtaining equivalent circuit models also [4–6]. In this tech-
nique, depending upon the possible charge transfer processes thought to be present
in the material, suitable equivalent circuits are chosen to represent the electrical
behavior by comparing the experimental plots with the simulated ones for various
model circuits. Usually combinations of resistances (R) and capacitances (C) suf-
fice for dielectrics, combinations of R and inductance L suffice for magnetic systems
and combinations of R, L and C suffice for ferro/piezoelectrics [4–17]. Sometimes
it is found that the lumped – component – type of models do not yield good fits
and their simulated patterns do not show even qualitative resemblance with the

CONTACT Shukdev Pandey devshuk.p@gmail.com; spandey.rs.cer@iitbhu.ac.in

Color versions of one or more of the figures in the article can be found online at www.tandfonline.com/ginf.
©  Taylor & Francis Group, LLC
142 S. PANDEY ET AL.

experimental plots. The situation is then rescued by assuming presence of dis-

tributed components and/or resorting to Constant Phase angle Elements (CPE)
connected in a suitable way [4, 5]. Large amount of literature on impedance spec-
troscopy of electronic ceramics is available where various types of models have
been used [4–19]. As the technique of Impedance Spectroscopy has expanded to
diverse fields from electrochemistry to electronic ceramics to medical diagnostics
etc. increasing use of variety of models involving CPE and other components and
their interpretations is being witnessed [4,18–44]. However, a clear cut recipe for
inferring the presence of CPE, the way a CPE may be incorporated in the equivalent
circuit model and the values of the parameters be estimated is not available.
In this paper simulated complex plane plots of immittance functions viz
impedance (Z), admittance (Y), electric modulus (M) and permittivity (ε) for some
simple equivalent circuit models containing CPE are presented with a view to facil-
itate the choice of models involving CPE by comparing the experimental results
with the simulated plots. The experimental data obtained for Ba1-x Srx TiO3 (x =
0.35) ceramic system is analyzed and a model equivalent circuit involving CPE rep-
resenting the data is developed. The values of the components are estimated and
their accurate values are obtained by using complex non-linear least squares (CNLS)
procedure [4]. In the next section general ideas of impedance spectroscopy and
the most important features of models involving resistive, capacitive and induc-
tive elements are summarized for ready reference. This is followed by simulation of
models involving CPE, analysis of the available experimental impedance data and
conclusions.

2. General ideas
A polycrystalline ceramic comprises a large number of small crystallites called
grains joined in random crystallographic orientations. The inter-grain region, called
the grain boundary has, because of their mismatch, strained bonds. Therefore, the
properties of inter-grain regions are different from those of the bulk i.e. grains. This
fact gives rise to some very interesting and useful properties which are exploited in
commercial devices [1]. In glass – ceramics the grain boundary consists of uncrys-
tallized glassy matrix [45–50]. Usually, it is the interplay of ‘grain’ and ‘grain bound-
ary’ behavior that bestows ceramics with several technologically useful properties.
The understanding and controlling of this interplay with the help of processing vari-
ables, additives, ingredients or reduction in grain size dwelling in nanometers range
is the subject of intensive research activities at present. A ceramic material prepared
in powder form or as a glass – ceramic is processed and fabricated in some shape to
which usually suitable electrodes are connected for device applications. Thus the
overall property of a ceramic sample would get contributions from grains, grain
boundary and electrode interfaces and an electronic ceramic component may be
treated as a grain – grain boundary – electrode system. In order to get a repro-
ducible behavior and to develop materials having desired properties these contribu-
tions must be separated out. The method of Impedance Spectroscopy or Complex
 INTEGRATED FERROELECTRICS 143

Impedance Analysis has emerged as a very powerful tool for this purpose in recent
years [4].
The electrical behavior of a system can be expressed in terms of interrelated func-
tions known as impedance (Z∗ = Z’ –j Z”), admittance (Y∗ = (Z∗ )−1 = Y’ + j Y”),
permittivity (ε ∗ = (j ω C0 Z∗ )− 1 = ε’ – j ε”) and modulus (M∗ = (ε ∗ )−1 = j ω C0 Z∗
= M’ + j M”), where j = −1, ω = 2π f, f being the frequency of the AC excitations
used in the measurement and C0 is the capacitance of the empty cell used to house
the sample [4]. Due to specific relationship between these broadly termed immit-
tance functions they are suitably used to extract information about the components
used in the equivalent circuit models [4, 7–18] and hence about the behavior of the
system. It has been reported that a study of the ceramic system based on the infor-
mation conveyed by only one of these four functions does not suffice and two or
more functions should be looked at [4, 7, 9, 14].
For complex impedance analysis, the real and imaginary parts of the complex
impedance (Z∗ = Z –j Z”) are measured as a function of frequency. The values of Z’
and Z” are plotted as a function of frequency and also in the complex plane (i.e. Z” vs
Z’). The resulting plots are, in general, collectively called impedance spectra. The Z”
vs Z’ plots are usually semicircular distorted/ overlapping arcs [4–7]. These arcs are
attributed to stem from various charge transfer processes thought to be present in
the system, such as those in grains, grain boundary and electrodes etc, that may be
represented by suitable equivalent circuit models. As a parallel RC circuit possesses
one time constant RC, this circuit model is generally used to represent one charge
transfer / polarization process. The various immittance functions for this model are
given as [4, 7]
   
1 ωCR
Z = R , Z = R (1)
1 + ω 2 C2 R 2 1 + ω 2 C2 R 2
1
Y = , Y = ω C (2)
R
C0 ω2 C2 R2 C0 ωCR
M = , M = (3)
C 1 + ω 2 C2 R 2 C 1 + ω 2 C2 R 2
C C 1
ε = , ε  = (4)
C0 C0 ω CR

The limiting values at ω→0 and ω→ are given below

Z |ω→0 = R, Z |ω→∞ = 0, Z |ω→0 = 0, Z |ω→∞ = 0 (5)

1 1
Y |ω→0 = , Y |ω→∞ = , Y |ω→0 = 0, Y |ω→∞ = ∞ (6)
R R
  C0
M |ω→0 = 0, M |ω→∞ = , M |ω→0 = 0, M |ω→∞ = 0 (7)
C
C C 
ε |ω→0 = , ε  |ω→∞ = , ε |ω→0 = ∞, ε  |ω→∞ = 0 (8)
C0 C0
144 S. PANDEY ET AL.

Also Z’, Z”, M’, M” satisfy the following equations

  2
Z −R/2 + Z =(R/2)2
2
(9)
  2
M − C0 /2C + M =(C0 /2C)2
2
(10)

which indicate that Z” vs Z’ plot for this model circuit is a semicircular arc passing
through the origin and has center at the point (R/2, 0). This arc intercepts the Z’
axis at the point (R, 0) at the low frequency side and shows maximum value when
ωRC = 1. Thus values of R and C can be obtained by noting the low frequency
intercept of the Z” vs Z’ curve with the Z’ axis and the value of frequency where
Z” peaks. As indicated by Eq. (10) the corresponding M” vs M’ plot is also a semi-
circular arc passing through origin and having a high frequency intercept with the
M’ axis at C0 /C that too can be used for determining the value of C [4, 7]. The Y”
vs Y’ and ε” vs ε’ plots are vertical straight lines. A simple equivalent circuit model
that could be used to represent two polarization/ charge transfer processes such as
sample-electrode system would have two parallel RC’s connected in series. A general
practice is to choose one parallel RC circuit to represent one process and add fur-
ther RC’s in series to represent the other processes. Thus a simple equivalent circuit
model for representing grain – grain boundary – electrode system may comprise
three parallel RC’s connected in series. Choice of a suitable model is a difficult pro-
cess, becoming more so since several models can be found that show same behavior
[4, 7]. However, attempts are made to choose a simple equivalent circuit model to
start with. This is greatly facilitated by comparing the experimental plots with simu-
lated ones and keeping in mind the charge transfer/ polarization processes thought
to be possibly present in the system [4–14].
Simulated immittance patterns for various models involving resistance (R),
capacitance (C) inductance (L) are available in literature and have been used [4–
17]. In what follows some extremely useful hints for choosing a model to represent
experimental results are summarized:
(i) Study of a ceramic system based on the information conveyed by only one of
the four immittance functions might lead to erroneous conclusions and two
or more functions viz impedance (Z∗ ) and modulus (M∗ ) or admittance (Y∗ )
and permittivity (ε ∗ ) should be looked at [7, 12].
(ii) Appearance of clear semicircular arc in both Z∗ and M∗ complex plane plots
indicate that the experimental data may be modeled by a single parallel RC
circuit [4, 7].
(iii) A semicircle in Z” vs Z’ plot and a depressed looking arc in M” vs M’ plot or
vice -versa indicate that the model may comprise at least two parallel RC’s (say
R1 -C1 and R2 -C2 ) in series with ratios of time constants, R2 C2 /R1 C1 , in the
range 1 to 5 [7]. Appearance of two clear semicircular arcs indicates presence
of two processes.
(iv) A semicircular arc with steeply rising branch (not a linear) at low frequency
side in Z” vs Z’ plot and a shifted arc in the corresponding M” vs M’ plot
indicates the presence of series C [14].
 INTEGRATED FERROELECTRICS 145

(v) A semicircular arc with steeply rising branch (not a linear) at high frequency
side in M” vs M’ plot and a shifted arc in Z” vs Z’ plot indicates the presence
of series R in the equivalent circuit [7].
(vi) A semicircular arc with changed sign of Z” in the whole frequency range in
Z” vs Z’ plot points towards the possible presence of parallel R-L circuits [8].
(vii) From an experimental Z” vs Z’ plot showing a cross over from positive val-
ues of Z” to negative values or vice versa within the overall frequency range
covered in the experiment presence of all R, L and C is inferred [4, 11, 13].
(viii) A linear portion in the Z” vs Z’ or/and other immittance plots may indicate
the presence of a series CPE in the model [4, 27]. A depressed semicircular
immittance plot may indicate the presence of parallel CPE [4, 51].
A glance at all the immittance plots of the experimental data obtained for differ-
ent variables, such as composition and temperature, collectively together, and keep-
ing in mind the hints listed above is found to be of great help in choosing a model
[13]. Once the model has been chosen, the values of the components are estimated
by comparing the experimental plots with the simulated ones. The values are deter-
mined more accurately by using these as initial guesses in a complex non-linear least
square (CNLS) fitting procedure [4, 52]. When the fittings are poor the model is
modified keeping in mind the possibilities of processes present/dormant, emerging
or dominating in the system under study as the variables are altered. In the situa-
tions where two or more models seem physically feasible, that particular model is
to be accepted which gives lowest value of the sum of squares of errors in the CNLS
runs [4].
For usual dielectric materials models involving lumped resistive (R) and capaci-
tive (C) components suffice where as for magnetic or piezoelectric materials induc-
tive (L) elements are also included [4, 8, 11, 13]. For the cases where the experi-
mental impedance data can not be represented by equivalent circuit models based
on lumped circuit elements (i.e. the CNLS does not show a good fit), presence of
certain distributed elements or constant phase elements (CPE) is invoked [4]. A
CPE is a mathematical realization of a system in which the phase angle between
applied ac voltage and resulting current remains independent of the frequency [4].
There are various view points for the possible sources of such a behavior. However,
larger consensus leans towards the belief that the CPE behavior arises due to pres-
ence of distribution in time constants in the material- electrode systems. This is
one of the reasons for the widespread use of CPE in Impedance Spectroscopy [4,
40–44]. Therefore when good fits are achieved by using models involving CPE, it is
concluded that the system at hand possesses distribution in certain properties. The
importance of a constant phase response was probably first emphasized by Fricke
[53]. The CPE was explicitly mentioned by Cole and Cole [54] and its importance
has been emphasized in recent times by Johnscher [5] and Macdonald [4]. Num-
ber of equivalent circuit models involving CPE are available in literature and ever
increasing trend is being witnessed for the application of impedance spectroscopy
in diverse fields including agriculture and medical diagnostics by using CPE [18, 19,
22–45]. In the next section complex plane immittance plots of some simple models
146 S. PANDEY ET AL.

involving CPE are given that may be useful for selecting suitable models for repre-
senting experimental data. Their spectroscopic plots are not shown for brevity and
only complex plane plots are shown.

3. Models

3.1. Model 1: Parallel combination of R and CPE

A parallel combination of resistance R and Constant Phase angle Element (CPE) is

shown schematically in Fig. 1(a). The impedance of a CPE is given as [4]
   −1    
−1 ψ 1 ψπ 1 ψπ
ZCPE = (YCPE ) = A0 jω = cos −j sin
A0 ωψ 2 A0 ωψ 2
(11)
The Z vs Z plot is a straight line with slope tan( ψπ
2
). For  = 0, the imaginary
part becomes zero and ZCPE = 1/A0 Ohms and the CPE behaves like an ideal resistor
of value 1/A0 . For  = 1, the real part becomes zero and ZCPE = 1/(j ω A0 ) and the
CPE behaves like an ideal capacitor of capacitance A0 [4].
The expressions for real and imaginary parts of Y∗ for the above model are given
in Eq. (12)
   
∗
 ψ  1 ψ ψπ  ψ ψπ
Y = 1/R + A0 jω , Y = + A0 ω cos , Y = A0 ω sin
R 2 2
(12)
 
It is seen that Y and Y satisfy the equation
   
  ψπ 1 ψπ
Y = Y tan − tan (13)
2 R 2
  
which indicate that Y vs Y plot would be a straight line with intercept with Y axis
at the point (1/R,0) and slope equal to tan( ψπ
2
).
Also
R R
Z∗ =   =   (14)
1 + A0 R j ω 1 + j ωτ
where τ = (A0 R) 1/ .
It can be shown that Z’ and Z” satisfy the equation
     2   
 R 2  R π 2 R 2 π
Z − + Z + cot = 1 + cot (15)
2 2 2 2 2
or,
   2  2
 R 2  R R  
Z − + Z + tanθ = 1 + tan2 θ (16)
2 2 2
which is the equation of a circle with center at ( R2 , − R2 tan θ ) below the Z’ axis and
√
radius ( R2 1 + tan2 θ ). Here tan(θ ) = cot( ψπ2
) i.e  = 1-θ /(π /2) = 1- α. This arc
intercepts the Z’ axis at the point (R, 0) at the low frequency side and θ is the angle
 INTEGRATED FERROELECTRICS 147

Figure . (a) Equivalent circuit model containing a parallel combination of resistance R and CPE.
(b) Plot of Z”/R vs Z’/R for various values of θ , where θ is the angle between the Z’ axis and the line
joining the center of the arc to the origin. The centres for the arcs for θ = , ,  and  in the figure
are at (.,−.), (.,−.), (.,−.), (.,−.) respectively. (c) Plot of Y”/(/R) vs Y’/(/R).
(d) Plot of M”/ (C /A ) vs M’ / (C /A ). (e) Plot of ε”/ (A /C ) vs ε’ / (A /C ). Values used for calculations
are R =  K
, A = .∗ − and C = .∗ − F.


between the Z axis and the line joining the center of the arc to the origin. The corre-
   
sponding values for M , M , ε and ε are obtained by using the relations for permit-
tivity (ε ∗ = (j ω C0 Z∗ )− 1 = ε’ – j ε”) and modulus (M∗ = (ε ∗ )−1 = j ω C0 Z∗ = M’
+ j M”). The simulated immittance plots for this model are shown in Figs. 1 (b–e).
The values have been suitably normalized for easy comparison. The values used for
148 S. PANDEY ET AL.

normalization are as under

Z = R and Y = 1/R for ω = 0. (17)

M = C0 /A0 and ε  =A0 /C0 for  = 1 and ω → ∞ (18)

3.2. Model 2: Series combination of R and CPE

A series combination of resistance R and Constant Phase angle Element (CPE) is
shown schematically in Fig 2(a) .The expressions for real and imaginary parts of Z∗ ,

Figure . (a) Equivalent Circuit Model containing a series combination of resistance R and CPE.
(b) Z”/R vs Z’/R plots, (c) Y”R vs Y’R plots, (d) M”/(C /A ) vs M’/(C /A ) plots, (e) ε”/(A /C ) vs ε”/(A /C )
plots for various values of parameters. Values used for calculations are R =  K
, A = .∗ − and
C = .∗ − F.
 INTEGRATED FERROELECTRICS 149

M∗ , Y∗ and ε ∗ for the above model are given in Eqs. (19–26)

   −1    
∗ ψ  1 ψπ  1 ψπ
Z = R + A0 jω , Z =R+ cos ,Z = sin
A0 ωψ 2 A0 ωψ 2
(19)
  
1 ψπ
M = ωC0 Z = ωC0 ψ
sin (20)
A0 ω 2
  
  1 ψπ
M = ωC0 Z = ωC0 R + cos (21)
A0 ωψ 2

ψπ
   
R + 1
A0 ω ψ cos 2
Y = Z /(Z + Z ) = 
2 2
  
ψπ ψπ
R + A01ωψ cos 2 2+ 1
A0 ω ψ sin 2
2

(22)

1 ψπ
    A0 ω ψ
sin 2
Y = Z (Z + Z ) = 2 2
  
ψπ ψπ
R+ 1
A0 ω ψ
cos 2
2 + 1
A0 ω ψ
sin 2
2

(23)

ε = Y  / (ωC0 ) , ε  = Y  / (ωC0 ) (24)

   
It can be shown that Z , Z , Y and Y satisfy the following equations
   
ψπ ψπ
Z = Z tan − R tan (25)
2 2
  2  2   
 1 2  1 ψπ 1 2 ψπ
(Y − ) + Y + cot = 1 + cot
2R 2R 2 2R 2
(26)
  
Eq (25) indicates that Z vs Z plot would be a straight line with intercept with Z
axis at the point (R,0) and slope tan( ψ2 ). It means that if we get a linear pattern in
 
the Z vs Z plot a CPE connected in series may be used in the model. The values
of  and R are obtained from the slope of the straight line and the intercept on the
  
Z axis. Eq (26) indicates that Y vs Y plot is a semicircular arc with
center at the
cot( ψπ 1 + cot2 ( ψ2 )).

point ( 2R
1
, − 2R
1
2
)) below the Y axis and radius equal to ( 2R
1
 
1
This arc intercepts the Y axis at the point ( 2R , 0). If θ be the angle between the Y
axis and the line joining the center of the arc to the origin, then we get tan(θ ) =
cot( ψπ
2
) which yields π /2− θ = ψπ 2
or  = 1− θ /(π /2) = 1− α, 0 < α < 1 [4]. The
values of  and R are may also be obtained from the coordinates of the centre of the
semicircular arc representing the Y” vs Y’ plot. Some simulated complex plane plots
are shown in Figs. 2(c-d). The values have been appropriately normalized for a clear
visualization. It is evident that the M and ε plots do not reveal much information
and are not so much useful here.
150 S. PANDEY ET AL.

3.3. Model 3: Series combination of parallel R1 – CPE1 and parallel R2 – CPE2

A series combination of parallel R1 – CPE1 and parallel R2 – CPE2 is shown schemat-

ically in Fig. 3(a). The expressions for real and imaginary parts of Z∗ for the above

Figure . (a) Equivalent circuit model containing series combination of parallel R – CPE and parallel
R – CPE . (b-d) Plot of Z /(R + R ) vs Z /(R + R ) for various values of R /R , τ  / τ  , k (θ  = k θ  ) and
θ  , where θ  is the angle between Z’axis and the line joining the origin to the centre ( R21 , − R21 tan θ1 )
of the arc corresponding to the parallel combination R -CPE . θ  is the angle between Z’ axis and the
line joining the point (R ,) to the centre ( R22 , − R22 tan θ2 ) of the arc corresponding to the parallel
combination R -CPE . (e-g) Plots of Y”(R + R ) vs Y’(R + R ) for various values of R /R , τ  / τ  , k (θ 
= k θ  ) and θ  , (h-j) Plots of M”/(C /A + C /A ) vs M’/(C /A + C /A ) for various values of R /R ,
 
τ  / τ  , k (θ  = k θ  ) and θ  . (k) Plot of ε /[(/C ){C (R /(R + R )) + C (R /(R + R )) }] vs ε /[(/C ){C
(R /(R + R )) + C (R /(R + R )) }] for various values of R /R , τ  / τ  , k (θ  = k θ  ) and θ  . Values used
 

for calculations are R =  K

, A = .∗ − and C = .∗ − F.
 INTEGRATED FERROELECTRICS 151

model are given in Eqs (27,28)

R1 R2
Z∗ =  1 +   (27)
1 + A01 R1 j ω 1 + A02 R2 j ω 2
R1 R2
=  1 +   (28)
1 + j ωτ 1 1 + j ωτ 2 2

where τ1 = (A01 R1 )(1/1) , 1 = 1−θ1 /(π /2) = 1−α1 (29)

and τ2 = (A02 R2 )(1/2) , 2 = 1−θ2 /(π /2) = 1−α2 (30)

It may be noted here that parallel R1 -CPE1 and parallel R2 -CPE2 connected in
series would give rise to two separate depressed circular arcs when their response
frequencies are widely separated. If we assume that R1 -CPE1 responds at much
higher frequencies that R2 -CPE2 then in that case θ 1 would be the angle between
Z’ axis and the line joining the centre„ (R1 /2, -(R1 /2) tan θ 1 ), of the depressed cir-
cular arc corresponding to R1 -CPE1 to the origin. The low frequency side intercept
for this only will be at the point (R1 ,0). Therefore θ 2 would be the angle between Z’
axis and the line joining the centre, (R2 /2, -(R2 /2) tan θ 2 , of the depressed low fre-
quency side circular arc corresponding to R2 -CPE2 , to the point (R1 ,0). The overall
low frequency intercept of this combination will be at the point (R1 + R2 ,0).
The values of other immittance functions are obtained by using their inter rela-
tionship. The simulated immittance plots for this model are shown in Fig 3 (b-e).
The values have been normalized for easy comparison. The limiting values of vari-
ous immittance functions given below were used for normalization:

Z = R1 + R2 and Y = 1/ (R1 + R2 ) for ω = 0 (31)

M = C0 (1/A01 +1/A02 ) for  = 1 and ω → ∞ and (32)

ε = (C1 /C0 ) [R1 / (R1 + R2 )]2 + (C2 /C0 ) [R2 / (R1 + R2 )]2 for  = 1 and ω → 0
(33)

3.4. Model 4: Series combination of parallel R1 C1 , parallel R2 C2 and CPE

A series combination of parallel R1 C1 , parallel R2 C2 and CPE is shown schematically
in Fig. 4 (a). The expressions for real and imaginary parts of Z∗ for the above model
are given in Eqs. (34,35).
   
 R1 R2 ψπ
1
Z = 2 + + cos (34)
1 + (ωC1 R1 ) 1 + (ωC2 R2 )2 A0 ωψ
2
   
 ωC1 R1 R1 ωC2 R2 R2 1 ψπ
Z = + + sin (35)
1 + (ωC1 R1 )2 1 + (ωC2 R2 )2 A0 ωψ 2
152 S. PANDEY ET AL.

Figure . (a) Equivalent circuit model containing series combination of parallel R C , parallel R C and
CPE. Plots of (b-c) Z”/(R + R ) vs Z’/(R + R ) for various values of R /R , R C /R C , A and θ , where
θ is the angle between Z’ axis and the line showing the low frequency linear part corresponding to
CPE and passing through the point (R + R , ) (d) Y”(R + R ) vs Y’(R + R ), (e) M”/(C /C + C /C )
vs M’/(C /C + C /C ) and (f) ɛ”/[(/C ){C (R /(R + R )) + C (R /(R + R )) }] vs ɛ’/[(/C ){C (R /(R +
R )) + C (R /(R + R )) }] for various values of R /R , R C /R C , A and θ .
 INTEGRATED FERROELECTRICS 153

The values of other immittance functions are obtained by using inter relations.
The simulated immittance plots for this model are shown in Fig. 4(b-m). The values
have been suitably normalized for easy comparison.

3.5. Model 5: Series combination of Parallel R1 -CPE1 , R2 and CPE2

A series combination of parallel R1 -CPE1 , R2 and CPE2 is shown schematically in

Fig. 5 (a). The expressions for real and imaginary parts of Z∗ for the above model
are, using Eqs (14,19), given in Eqs (36–38).
R1 1
Z∗ =  1 + R2 +   2 (36)
1 + A01 R1 j ω A02 jω

Figure . (a) Equivalent circuit model having series combination of parallel R -CPE , R and CPE . (b,c)
Plot of Z”/(R + R ) vs Z’/(R + R ) for various values of R /R , τ  / τ  , θ  / θ  and θ . where θ  is the
angle between Z’axis and the line joining the highest frequency intercept point (R ,) to the point (R
+ .R , – .R tan θ  ), the center of the semi circular arc corresponding to parallel R -CPE . (d-f) Plot
of Y”/(/R ) vs Y’/(/R ). (g,h) Plot of M”/(C /A + C /A ) vs M’/(C /A + C /A ). (i) Plot of ɛ”/(A /C )
vs ɛ’/(A /C ).
154 S. PANDEY ET AL.

which yields
 

R1 (1 + A01 R1 ω1 cos 21 π
Z =  2  2
(1 + A01 R1 ω1 cos 21 π + (A01 R1 ω1 sin 21 π
 
1 ψ2 π
+R2 + cos (37)
A02 ω2 2
 
 R1 (A01 R1 ω1 sin 1 2π
Z =  2  2
(1 + A01 R1 ω1 cos 1 2π + (A01 R1 ω1 sin 1 2π
 
1 ψ2 π
+ sin (38)
A02 ω3 2

Expressions for other immittance functions may be derived by using these. For
calculations we have let A01 R1 = τ1 1 and A02 R2 = τ2 2 [4]. Complex plane plots
of various immittance functions are shown in Figs. 5 (b-i) for different values of
the parameters. Values used for calculations are R1 = 5 K
, A01 = 2∗ 10−11 . For
simple visualization of the plots we may remember that if τ 1 << τ 2 ie parallel R1 -
CPE1 responds at much higher frequencies than the series R2 -CPE2 then the higher
frequency portion of the Z” vs Z’ plot (ie the left hand side portion) would be a
depressed semicircular arc having highest frequency intercept with the Z’ axis at the
point (R2 ,0) and centre at (R2 + 0.5 R1 , −0.5 R1 tan θ 1 ). The possible lower fre-
quency intercept would be at the point (R2 + R1 ,0). The angle θ 1 ( = (1- 1 )π /2)
is the angle between Z’ axis and the line joining the point (R2 ,0) to the centre (R2
+ 0.5 R1 , −0.5 R1 tan θ 1 ). The low frequency side (ie right hand side portion) of
the Z” vs Z’ plot, representing the series R2 -CPE2 segment, would be a straight line
passing through the point (R1 + R2 ,0) and making an angle θ 2 with the Z’ axis. The
corresponding Y” vs Y’ plots would have these rolls reversed and the plot would tra-
verse from left side towards right side as the frequency is raised. The low frequency
portion, corresponding to the R2 -CPE2 segment, would now be a depressed semi-
circular arc with centre at (0.5 R2 , −0.5 R2 cot ( 2 π /2). The angle between Y’ axis
and the line joining this centre to the origin would be θ ’2 = (1 –  2 ) π /2 = π /2 –
θ 2 . The high frequency portion would be a straight line making an angle θ ’1 =  1
π /2 = π /2 – θ 1.

3.6. Model 6: Parallel combination R2 C2 in series with parallel combination of

R1 ,C1 and CPE1

A Parallel combination R2 C2 connected in series with parallel combination of R1 ,C1

and CPE1 is shown schematically in Fig. 6 (a). The expressions for real and imagi-
nary parts of Z∗ for the above model are, using Eqs (11,12,14), are given in Eqs (39–
40).
 

R1 (1 + R1 A01 ω1 cos 21 π R2
Z =  1 π   1 π  + (39)
(1 + R1 A01 ω 1 cos 2 ) + (R1 A01 ω 1 sin 2 ) 1 + (ωC2 R2 )2
 2  2
 INTEGRATED FERROELECTRICS 155

Figure . (a) Equivalent circuit model having a parallel combination R C connected in series with
parallel combination of R , C and CPE . Plots of (b-d) Z”/(R + R ) vs Z’/(R + R ) for various values of
R /R , R C /R C , A and θ . (e,f) Y”(R + R ) vs Y’(R + R ), (g,h) M”/(C /C + C /C ) vs M’/(C /C + C /C )
and (i-j) ɛ”/[(C /C )(R /(R + R )) + (C /C )(R /(R + R )) ] vs ɛ’/[(C /C )(R /(R + R )) + (C /C )(R /(R
+ R )) ] for various values of R /R , R C /R C , A and θ .

   
 R1 [ R1 A01 ω1 sin 21 π + ωC1 R1 R2 ωC2 R2
Z =  1 π   1 π  +
(1 + A01 R1 ω1 cos 2 )2 + (A01 R1 ω1 sin 2 )2 1 + (ωC2 R2 )2
(40)
Expressions for other immittance functions may be derived by using these.
The simulated immittance plots for this model for various ratios of the compo-
nents are shown in Fig. 6(b-j). The values of some of the components used are R1 =
156 S. PANDEY ET AL.

5 K Ohm, C1 = 20 pF, C0 = 1.6pF. For easy comparison suitably normalized values

have been plotted as labeled on the axes and are given below.
Z = R1 + R2 and Y = 1/ (R1 + R2 ) for ω = 0 and  = 1,
(41)
M = C0 /C1 + C0 /C2 for ω → ∞

ε  = (C1 /C0 ) [R1 / (R1 + R2 )]2 + (C2 /C0 ) [R2 / (R1 + R2 )]2 for  = 1 and ω → ∞
(42)

4. Discussion
From the figures shown in section 3 it is clear that different combinations of CPE
will show different immittance plots. Some immittance plots for various RC com-
binations, RL combinations and RLC combinations have been given earlier [4, 7, 8,
13]. By comparing the experimentally observed plots with those presented in this
paper and in the references given above one can arrive at a guess about a possible
equivalent circuit model that might be used to represent the impedance behavior of
the material. The plots shown in this paper would be useful when the immittance
plots possess depressed arcs or linear portions in complex plane. The choice of an
equivalent circuit model is a difficult process becoming more so as several equiv-
alent circuits may yield the same frequency dependence of the impedance [4, 7].
However a clue can be obtained by looking at the experimental plots for various
conditions viz temperature, composition and microstructure and comparing them
with the simulated plots given in this paper for various models. It is always desirable
to select the simple possible model to start with [6].
As an example we consider the Model 3 having two parallel R-CPE connected in
series. The Z” vs Z’ plots contain well resolved semicircular type depressed arcs when
the time constants are well separated, but show a hump when the time constants
are close to each other. However, the M” vs M’ plots show a hump and a flattening
trend at high frequency side. The Y” vs Y’ and ε” vs ε’ plots do not provide much
information. Thus in an experimental measurement, a flattened type high frequency
trend in M” vs M’ plot and depressed arc(s) in Z” vs Z’ plot would indicate that
a parallel R-CPE combination connected in series with another R-CPE might be a
suitable model to be used to represent the data. We now look at Model 4 that contains
two parallel RC’s connected in series with a CPE. Both the Z” vs Z’ and M” vs M’ plots
possess a linear portion together with overlapping or resolved arcs. An experimental
plot showing a linear portion in the complex plane plot of this type would indicate
that the equivalent circuit would involve a CPE connected in series and the circuit
given in Model 4 might be useful to start with. This model has been used earlier
also [27] but details of other immittance plots were not given. Similarly, we look
at Model 5 which contains a parallel R-CPE, a resistance and a CPE all connected
in series. The Z” vs Z’ plots show a shift (corresponding to R2 ), an arc (owing to
parallel R1 -CPE1 ) and a linear portion (arising due to CPE2 ). The Y” vs Y’ plots show
overlapping or resolved arcs depending upon the ratios of the components. Now let
 INTEGRATED FERROELECTRICS 157

us consider Model 6. A model comprising series combination of a capacitor and CPE

connected in parallel to another capacitor and a resistance was proposed [4] and
used [51] for representing depressed arcs. In order to simulate complex plane plots
having a semicircular arc connected to a depressed arc a simplified circuit shown
in Fig 6(a) was developed. The Z” vs Z’ plot may be a single arc, well resolved arcs
or overlapping arcs or one semicircular arc connected to depressed arc as shown in
Figs. 6(b-d) depending upon the ratios of the components. Similar behavior is seen
in the M” vs M’ plots shown in Figs. 6(g,h).
We now present an analysis of the impedance data obtained for the system
Ba1-x Srx TiO3 (x = 0.35) in our laboratory. The ceramic system Ba1-x Srx TiO3 (x =
0.35) was prepared by solid state reaction method using BaCO3 , SrCO3 and TiO2
as the starting materials. The mixed powder was calcined at 1323°K for 6 hours and
formation of solid solution was confirmed by powder X-ray diffraction. Pellets of
about 13 mm diameter and 1.5 mm thickness were prepared by using a hydraulic
press with 60 KN pressure and then sintered at 1523 K for 6 hrs in a silicon carbide
globar furnace. The sample was coated on its two surfaces by silver paint which was
cured at 773 K by heating for 30 minutes. The pellet was placed between the paral-
lel plates of the sample holder which were connected to the NovoControl Alpha-A
frequency analyzer. The impedance measurements were carried out at room tem-
perature in the frequency range from 0.01 Hz to 1 MHz. In what follows we develop
an equivalent circuit model that represents the data well.
It is known that analysis of the data by using only one immittance formalism does
not suffice and at least two formalisms should be looked at [7]. We chose to consider
Z and M data. Fig. 7 (a) shows Z’ and Z” vs log10 (f) plot and Fig. 7(b) shows Z” vs
Z’ plot for this system at 303 K. Similarly Fig. 7 (c) shows M’ and M” vs log10 (f) and
Fig. 7(d) M” vs M’ plots. The values of M’ and M” were derived from the Z data
by using the relations M’ = ω C0 Z” and M” = ω C0 Z’ where C0 = 8.1697∗ 10−12
F. As there is no steeply rising high frequency branch in the M” vs M’ plot and no
shift in the corresponding Z” vs Z’ plot, presence of series resistance in the model
is ruled out. Similarly there is no shift in M” vs M’ plot indicating that there is no
series capacitance in the model. Also there are no linear portions in the M” vs M’
or Z” vs Z’ plots indicating that the model would not contain any series CPE. The
M” vs M’ plot in Fig. 7(d) has two arcs where the one at low frequency side (at
the left side of the plot) is almost semicircular and the other at higher frequency
side (at the right hand side of the plot) is depressed. Had there been two clear well
separated semicircular arcs, a model comprising two parallel RC circuits in series
would have been useful. Here we have one almost clear semicircular arc and the
other a depressed one. Keeping in mind that a CPE connected in parallel produces
a depressed arc in M” vs M’ plot [4, 51] and comparing the experimental plot with
simulated ones given in section 3, it is seen that the model circuit needed to repre-
sent this system would be similar to the one shown in Fig. 6(a) ie a parallel R2 C2
in series with a parallel R1 C1 which is shunted by a CPE1 . As the Z” vs Z’ plot of
Fig. 7(b) is almost a single arc, it is inferred that R2 C2 is much larger than R1 C1 .The
values of the components are now estimated. From the low frequency intercept of
158 S. PANDEY ET AL.

Figure . Experimental and fitted values of (a) Z” vs Z’, (b) Z”, Z’ vs log f, (c) M” vs M’ and (d) M”,
M’ vs log f for ceramic system Ba-x Srx TiO (x = .) by using the model shown in Fig. (a-d).

a tentative semicircular arc in the Z” vs Z’ plot (Fig. 7 (b)) we assume R2 ∼ 2∗ 108

Ohms and from this we get C2 ∼ 5.4∗ 10−9 F by using ωC2 R2 = 1. Looking at the
simulated M” vs M’ plots of Fig 6(g, h) C1 is chosen approximately equal to C2 i.e C1
∼ 3∗ 10−9 F and A01 ∼10∗ C2 ∼ 5.6∗ 10−8 . Again by comparing the plot of Fig 7(d)
with the simulated plot of Fig 6 (g, h), we assume θ ∼ 10 degrees i.e ψ = 1- θ /90 ∼
0.89. From the high frequency curve of the M” vs M’ plot (Fig. 7(d)) we assume R1 ∼
3445 Ohms. The values of the parameters were determined more accurately by using
CNLS program IMPSPEC. BAS developed by one of the authors and being regularly
used in our laboratory [12,13,16,52] and using the above mentioned values as initial
guesses. The values thus obtained are R1 = (2.31 ± 0.17)∗ 108 Ohms, A01 = (3.53 ±
0.05)∗ 10−8 , C1 = (4.16 ± 0.08)∗ 10−9 F, R2 = (1.30 ±0.03)∗ 108 Ohm, C2 = (9.83 ±
0.07)∗ 10−9 F and ψ = 0.842 ± 0.002. Fig. 7 shows experimental as well as fitted data
in the Z and M plots. The overall impedance behavior of a polycrystalline ceramic
would stem from grain, grain boundary and electrode contributions generally rep-
resented by three parallel RC’s connected in series. The lowest frequency response
is usually attributed to the electrode process and the high frequency to grains. From
 INTEGRATED FERROELECTRICS 159

the equivalent circuit developed above, it seems that the grain and grain boundary
contributions represented by combination of R1 , C1 and CPE1 are engulfed together.
These contributions may be separated out by studying the impedance behavior of
this system as function of temperature and composition. This work is in progress
and would be publishes elsewhere.

5. Conclusions
Complex plane plots for Impedance Z, Modulus M, Admittance Y, Permittivity ε for
equivalent circuit models involving constant phase angle elements (CPE) have been
simulated for different ratios of the parameters. A linear portion appearing in the
complex plane plot may be considered as a signature of presence of series CPE in
the model whereas a depressed arc in the Z” vs Z’ or M” vs M’ plot would indicate
the presence of CPE connected in parallel. The experimental data for the ceramic
system Ba1-x Srx TiO3 (x = 0.35) have been analyzed in the light of these models and
an equivalent circuit model representing the data is obtained. The equivalent circuit
model comprises a parallel combination R2 C2 in series with parallel combination of
and R1 , C1 and CPE1 . The details of how to arrive at this model is also elaborated.

Funding
The financial support received by one of the authors (SP) from IIT(BHU) in the form of Teaching
Assistantship is gratefully acknowledged.

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