PASSIVE INTERMODULATION (PIM)

Testing Guidelines

ADVANTAGE
 PASSIVE INTERMODULATION (PIM)

Passive Intermodulation (PIM) occurs when two or

more high power RF signals encounter PIM sources
or materials in an RF path. These PIM sources
behave like a mixer causing new signals to be
generated at mathematical combinations of the
original RF inputs. In the figure to the right, f1
and f2 represent two Tx frequencies present at
a typical cell site and ± m•f1 ± n•f2 are the PIM
RX Band TX Band
signals generated by those Tx frequencies.

When these PIM signals fall in the Rx band of the

cell site the noise floor rises causing increased Example: f1 = 869 MHz, f2 = 894 MHz
dropped calls, reduced data transmission rates and
IM3 = 2x 869 MHz - 1x 894 MHz = 844 MHz
decreased system capacity. The impact of PIM on
IM3 = 2x 894 MHz - 1x 869 MHz = 919 MHz
the network performance can be severe, especially
IM5 = 3x 869 MHz - 2x 894 MHz = 819 MHz
for modern systems such as CDMA, UMTS or LTE.
IM5 = 3x 894 MHz - 2x 869 MHz = 944 MHz

PIM SOURCES AT A CELL SITE

The primary sources of PIM sources at a cell site - Solid inner conductors distorted in the
are inconsistent metal to metal contacts in high preparation process causing these to be
current density regions such as inside transmission out of round or tapered over the mating
lines, inside RF components or outside the system length
but in the main beam of the antenna. Clean metal - Hollow inner conductors excessively
surfaces with high contact pressure generally enlarged or made oval during the
behave in a linear manner and do not generate preparation process
PIM. Where there is loose contact between
• Nearby metallic objects in the main beam and
metal surfaces, a non-linear relationship develops
side lobes of the transmit antenna including
between the applied voltage and the resulting
roof flashing, vent pipes, guy wires, etc
current flow across the joint causing PIM to be
generated.

In the field, PIM sources can be caused by:

• Contaminated surfaces or contacts due to dirt,
dust, moisture or oxidation
• Loose mechanical junctions due to inadequate
torque, poor alignment or poorly prepared
contact surfaces
• Loose mechanical junctions caused by
transportation shock or vibration
• Metal flakes or shavings inside RF connections.
• Poorly prepared RF connections
- Trapped dielectric materials (adhesives,
foam, etc)
- Cracks or distortions at the end of the
outer conductor of coaxial cables caused
by over tightening the back nut during
installation

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ADVANTAGE
 PIM TEST EQUIPMENT

To find and eliminate sources of passive PIM test equipment works by transmitting two high
intermodulation in RF components Summitek power signals into the line or device under test.
Instruments developed factory PIM test equipment If the test signals encounter a non-linear junction
in 1996. This equipment has been used by RF mixing occurs causing the PIM frequencies to be
equipment vendors worldwide to validate the generated. The PIM signals travel in all directions
PIM performance of new designs and to verify PIM from the point of generation. In a coaxial system
performance of the products they manufacture. this means they travel out toward the antenna
as well as back in the direction of the PIM test
In 2005, Summitek’s sister division Triasx developed equipment. The PIM test equipment measures the
a portable version of this equipment to enable magnitude of the PIM signal generated by the test
PIM testing to be conducted at the cell site. The signals and displays this information to the test
portable PIM test equipment performs the same operator.
function as the factory test equipment but has
been miniaturized and ruggedized to meet field The 3rd order product (IM3) is primarily used to
requirements. This equipment enables network characterize PIM performance both in the factory
operators to find and eliminate PIM sources at the and in the field. The IM3 signal generated by a
cell site in order to improve site performance. PIM source is usually higher magnitude than the
other PIM products enabling higher measurement
accuracy. The higher order products (IM5, IM7,
IM9, etc.) typically drop in magnitude by 5 to 10 dB
for each successive PIM product. By controlling IM3
to a specified level, the higher order products are
held well below that level, often by 10’s of dB’s.

Factory PIM Test Equipment Field PIM Test Equipment

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ADVANTAGE
 PIM MEASUREMENT POWER

The magnitude of the PIM signal generated by a Low power, battery operated test sets are avail-
given defect is highly dependent on the power level able for testing in locations where AC power is not
of the two RF signals interacting with that defect. available or where transporting a 20W test set is
A 3rd order PIM product, for example, will change not feasible. These low power systems are useful
between 2.2 and 3.0 dB in magnitude for every 1 for finding gross PIM failures in components and
dB change in test power. As shown in the figure are useful for troubleshooting sites to determine
below, this rate of change, or PIM slope, remains the location of PIM problems. Absolute results
fairly constant across a wide range of applied Tx may vary, however, when compared to 20W test
power levels. results due to differences in measurement accu-
racy (S/N ratio) between low power testing and
Because the magnitude of PIM generated by a 20W testing.
defect changes depending on the applied test
power, it is important that all specifications clearly
state what power level to use when performing the
test. IEC 62037 recommends that +43dBm (20W)
test tones be used when performing PIM tests on
communications systems. Using a common test
power across the industry both in the factory
and in the field provides a consistent method to
characterize and compare PIM performance to a
common specification.

(2W) (5W) (20W) (40W)

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ADVANTAGE
 PIM MEASUREMENT FREQUENCY

PIM test equipment is used to find and eliminate IM3 is specified this will typically require test
PIM sources at the cell site. The specific test tones with wider frequency spacing than can be
frequencies used to identify these defects are not achieved within the licensed frequency block
critical as long as the following criteria are met: for a given market. For this reason, guard band
• All RF components in the path (Cables, frequencies will typically be selected
Antennas, TMA’s, etc.) must be able to pass the
two test frequencies, f1 and f2, and be able to Some test equipment provides the ability to sweep
pass the IM frequency you are measuring the two transmit frequencies across a range of
• The two test frequencies must be within the frequencies during the test. Swept frequency
operator’s licensed spectrum or be guard band modes will transmit frequencies outside of the
frequencies between licensed spectrum blocks. operator’s licensed spectrum. For this reason,
This applies to all system level tests where the swept frequency modes should only be used to test
test frequencies will be broadcast through the systems terminated into a low PIM load.
antenna
• The two test frequencies need to be selected so
that they will produce the specified IM product
within the receive band for that system. When

DYNAMIC VS. STATIC PIM TESTING

During a PIM test, all components and Flex Test Guidelines

interconnections on the line should be subjected
to light mechanical stress or “dynamic” test • For stiff cables, rock the RF connector back &
conditions. If the component or RF connector has forth in two orthogonal directions while hold-
loose internal connections or internal debris that ing the cable rigid
can result in increased PIM (as identified during • For flexible cables, hold the RF connector rigid
dynamic testing) there is a high probability that and flex the cable back & forth in two orthogo-
the condition will present itself in the future and nal directions. Hold the cable approximately
invariably at the most inconvenient time. 12 inches (300mm) away from the connector
and flex the cable ±1 inch (25mm) in each
Tap Test Guidelines direction
PIM rises above the Pass / Fail limit while being
• Tap RF components such as TMA’s, Filters and tapped but passes when static.
Antennas using a hard plastic or rubberized This is a failing result and the defective component
metal object to prevent nicking or damaging should be repaired or replaced.
protective finishes TAPPING TAPPING
• Lightly tap the nut and/or back shell of RF
connectors using a hard plastic or metal object.
Do not tap the coaxial cable itself as this could
cause dents in the line
• Tap with sufficient force to excite PIM problems
if they exist but do not tap with excessive
force. A good rule of thumb is that if you
tapped your unprotected palm with the same
force, it should not hurt
• Tap before weatherproofing is installed on
RF interconnections. If weatherproofing is in
place, substitute a “flex test” to apply stress to
the interconnection

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ADVANTAGE
 ANTENNA PIM MEASUREMENT

When performing a PIM test, high power RF energy

will be radiated from the antenna. Care must
be taken to ensure that people near the test are
not exposed to RF field levels in excess of the
maximum allowable exposure limits and that the
test environment must be free of PIM sources
that could invalidate the results. The following
guidelines should be followed:
• Do not PIM test antennas indoors. (Unless an
anechoic chamber is available designed to
absorb the RF energy)
• Place the antenna on non-metallic supports at
least 1 foot (300mm) off the ground with the
front of the antenna pointing to the sky
• Position the test equipment to the top or bottom
of the antenna (not to the sides.) Typical sector
antennas have minimum radiation at their top
and bottom ends
• Position the antenna so that no metallic
objects obstruct the view of the sky within
the antenna’s half-power beamwidths (both
azimuth and elevation)
Note: Omni directional antennas typically
must be mounted at the top of a tower
during PIM testing to prevent “seeing”
metallic objects within the antenna beam
• Stay away from the front and sides of the
antenna during test
• Make sure the correct band PIM test equipment
is used for each antenna port tested. The
test equipment Tx signals + IM signal must fall
within the operating band of the antenna port
under test

About Kaelus

Kaelus www.kaelus.com, a Smiths Interconnect business formed by the combination of Summitek Instruments,
Allrizon Communications, Triasx Pty Ltd and the telecom division of TRAK Microwave Ltd, designs and
manufactures a wide range of innovative RF and microwave solutions for the wireless telecommunications
sector. Products include specialized filters, combiners, tower mounted amplifiers, Passive Intermodulation
(PIM) test solutions, radio link diplexers, ferrite isolators and circulators. Kaelus’ experience and understanding
of the radio environment enables it to excel by developing technically differentiated offerings that improve
network performance.

For more information visit www.kaelus.com or follow KaelusRF online on:

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ADVANTAGE