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Irg4Rc10Kd: Insulated Gate Bipolar Transistor With Ultrafast Soft Recovery Diode Short Circuit Rated Ultrafast Igbt

This document summarizes the key specifications of an insulated gate bipolar transistor (IGBT) with an integrated ultrafast soft recovery diode. The IGBT is optimized for high switching frequencies above 5 kHz and short circuit protection up to 10 microseconds. It offers high power density for motor controls. The co-packaged diode has minimized recovery characteristics to reduce switching losses and noise. The IGBT has a 600V voltage rating and can handle continuous currents up to 9 amps or pulsed currents up to 18 amps.

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0% found this document useful (0 votes)
55 views10 pages

Irg4Rc10Kd: Insulated Gate Bipolar Transistor With Ultrafast Soft Recovery Diode Short Circuit Rated Ultrafast Igbt

This document summarizes the key specifications of an insulated gate bipolar transistor (IGBT) with an integrated ultrafast soft recovery diode. The IGBT is optimized for high switching frequencies above 5 kHz and short circuit protection up to 10 microseconds. It offers high power density for motor controls. The co-packaged diode has minimized recovery characteristics to reduce switching losses and noise. The IGBT has a 600V voltage rating and can handle continuous currents up to 9 amps or pulsed currents up to 18 amps.

Uploaded by

khawar mukhtar
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
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PD 91736A

IRG4RC10KD
INSULATED GATE BIPOLAR TRANSISTOR WITH Short Circuit Rated
ULTRAFAST SOFT RECOVERY DIODE UltraFast IGBT
C
Features
• Short Circuit Rated UltraFast: Optimized for VCES = 600V
high operating frequencies >5.0 kHz , and Short
Circuit Rated to 10µs @ 125°C, VGE = 15V
• Generation 4 IGBT design provides tighter VCE(on) typ. = 2.39V
G
parameter distribution and higher efficiency than
previous generation @VGE = 15V, IC = 5.0A
• IGBT co-packaged with HEXFREDTM ultrafast, E
ultra-soft-recovery anti-parallel diodes for use in n-ch an nel
bridge configurations
• Industry standard TO-252AA package

Benefits
• Latest generation 4 IGBT's offer highest power density
motor controls possible
• HEXFREDTM diodes optimized for performance with IGBTs.
Minimized recovery characteristics reduce noise, EMI and
switching losses D-PAK
• For hints see design tip 97003 TO-252AA
Absolute Maximum Ratings
Parameter Max. Units
VCES Collector-to-Emitter Voltage 600 V
IC @ TC = 25°C Continuous Collector Current 9.0
IC @ TC = 100°C Continuous Collector Current 5.0
ICM Pulsed Collector CurrentQ 18 A
ILM Clamped Inductive Load Current R 18
IF @ TC = 100°C Diode Continuous Forward Current 4.0
IFM Diode Maximum Forward Current 16
tsc Short Circuit Withstand Time 10 µs
VGE Gate-to-Emitter Voltage ± 20 V
PD @ TC = 25°C Maximum Power Dissipation 38
W
PD @ TC = 100°C Maximum Power Dissipation 15
TJ Operating Junction and -55 to +150
TSTG Storage Temperature Range °C
Soldering Temperature, for 10 sec. 300 (0.063 in. (1.6mm) from case)

Thermal Resistance
Parameter Typ. Max. Units
RθJC Junction-to-Case - IGBT ––– 3.3
RθJC Junction-to-Case - Diode ––– 7.0 °C/W
RθJA Junction-to-Ambient (PCB mount)* ––– 50
Wt Weight 0.3 (0.01) ––– g (oz)
* When mounted on 1" square PCB (FR-4 or G-10 Material).
For recommended footprint and soldering techniques refer to application note #AN-994
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Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V(BR)CES Collector-to-Emitter Breakdown Voltageƒ 600 — — V VGE = 0V, IC = 250µA
∆V(BR)CES/∆TJ Temperature Coeff. of Breakdown Voltage — 0.58 — V/°C VGE = 0V, IC = 1.0mA
VCE(on) Collector-to-Emitter Saturation Voltage — 2.39 2.62 IC = 5.0A VGE = 15V
— 3.25 — V IC = 9.0A See Fig. 2, 5
— 2.63 — IC = 5.0A, TJ = 150°C
VGE(th) Gate Threshold Voltage 3.0 — 6.5 VCE = VGE, IC = 250µA
∆VGE(th)/∆TJ Temperature Coeff. of Threshold Voltage — -11 — mV/°C VCE = VGE, IC = 250µA
gfe Forward Transconductance „ 1.2 1.8 — S VCE = 50V, IC = 5.0A
ICES Zero Gate Voltage Collector Current — — 250 µA VGE = 0V, VCE = 600V
— — 1000 VGE = 0V, VCE = 600V, TJ = 150°C
VFM Diode Forward Voltage Drop — 1.5 1.8 V IC = 4.0A See Fig. 13
— 1.4 1.7 IC = 4.0A, TJ = 150°C
IGES Gate-to-Emitter Leakage Current — — ±100 nA VGE = ±20V

Switching Characteristics @ TJ = 25°C (unless otherwise specified)


Parameter Min. Typ. Max. Units Conditions
Qg Total Gate Charge (turn-on) — 19 29 IC = 5.0A
Qge Gate - Emitter Charge (turn-on) — 2.9 4.3 nC VCC = 400V See Fig.8
Qgc Gate - Collector Charge (turn-on) — 9.8 15 VGE = 15V
td(on) Turn-On Delay Time — 49 —
tr Rise Time — 28 — TJ = 25°C
ns
td(off) Turn-Off Delay Time — 97 150 IC = 5.0A, VCC = 480V
tf Fall Time — 140 210 VGE = 15V, RG = 100Ω
Eon Turn-On Switching Loss — 0.25 — Energy losses include "tail"
Eoff Turn-Off Switching Loss — 0.14 — mJ and diode reverse recovery
Ets Total Switching Loss — 0.39 0.48 See Fig. 9,10,14
tsc Short Circuit Withstand Time 10 — — µs VCC = 360V, TJ = 125°C
VGE = 15V, RG = 100Ω , VCPK < 500V
td(on) Turn-On Delay Time — 46 — TJ = 150°C, See Fig. 10,11,14
tr Rise Time — 32 — IC = 5.0A, VCC = 480V
ns
td(off) Turn-Off Delay Time — 100 — VGE = 15V, RG = 100Ω
tf Fall Time — 310 — Energy losses include "tail"
Ets Total Switching Loss — 0.56 — mJ and diode reverse recovery
LE Internal Emitter Inductance — 7.5 — nH Measured 5mm from package
Cies Input Capacitance — 220 — VGE = 0V
Coes Output Capacitance — 29 — pF VCC = 30V See Fig. 7
Cres Reverse Transfer Capacitance — 7.5 — ƒ = 1.0MHz
trr Diode Reverse Recovery Time — 28 42 ns TJ = 25°C See Fig.
— 38 57 TJ = 125°C 14 IF = 4.0A
Irr Diode Peak Reverse Recovery Current — 2.9 5.2 A TJ = 25°C See Fig.
— 3.7 6.7 TJ = 125°C 15 VR = 200V
Qrr Diode Reverse Recovery Charge — 40 60 nC TJ = 25°C See Fig.
— 70 105 TJ = 125°C 16 di/dt = 200A/µs
di(rec)M /dt Diode Peak Rate of Fall of Recovery — 280 — A/µs TJ = 25°C See Fig.
During tb — 235 — TJ = 125°C 17
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IRG4RC10KD
1.6

For both:
D uty cy cle: 50%
TJ = 125°C
1.2 T s ink = 55
90°C
LOAD CURRENT (A)

G ate drive as specified


P ow e r Dis sip ation = 1.4 W

S q u a re w a v e :

0.8 6 0% of rate d
volta ge

0.4
Id e a l d io d e s

0.0
0.1 1 10 100
f, Frequency (KHz)

Fig. 1 - Typical Load Current vs. Frequency


(Load Current = IRMS of fundamental)

100 100
I C , Collector-to-Emitter Current (A)
I C , Collector Current (A)


TJ = 25 °C

10 10

TJ = 150 °C


TJ = 150 °C


TJ = 25 °C

1

V GE = 15V
20µs PULSE WIDTH
1

V = 50V
CC
5µs PULSE WIDTH
1.0 2.0 3.0 4.0 5.0 6.0 7.0 5 10 15 20
VCE , Collector-to-Emitter Voltage (V) VGE , Gate-to-Emitter Voltage (V)

Fig. 2 - Typical Output Characteristics Fig. 3 - Typical Transfer Characteristics


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IRG4RC10KD


10 5.0
V GE = 15V
80 us PULSE WIDTH 
I C = 10 A

VCE , Collector-to-Emitter Voltage(V)


Maximum DC Collector Current(A)

8
4.0

3.0

IC = 5 A
4

2.0

I C = 2.5 A
2

0 1.0
25 50 75 100 125 150 -60 -40 -20 0 20 40 60 80 100 120 140 160
TC , Case Temperature ( °C) TJ , Junction Temperature ( ° C)

Fig. 4 - Maximum Collector Current vs. Case Fig. 5 - Typical Collector-to-Emitter Voltage
Temperature vs. Junction Temperature

10
Thermal Response (Z thJC )

D = 0.50

1
0.20

0.10


0.05

0.02 P DM
0.1 0.01
 SINGLE PULSE
(THERMAL RESPONSE) t1
t2

0.01

Notes:
1. Duty factor D = t 1 / t 2
2. Peak TJ = PDM x Z thJC + TC

0.00001 0.0001 0.001 0.01 0.1 1


t1 , Rectangular Pulse Duration (sec)

Fig. 6 - Maximum Effective Transient Thermal Impedance, Junction-to-Case

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IRG4RC10KD

 
400 20
VGE = 0V, f = 1MHz VCC = 400V
Cies = Cge + Cgc , Cce SHORTED I C = 5.0A
Cres = Cgc

VGE , Gate-to-Emitter Voltage (V)


Coes = Cce + Cgc 16
300
C, Capacitance (pF)


Cies 12

200

100

Coes 4

C
res
0 0
1 10 100 0 4 8 12 16 20
VCE , Collector-to-Emitter Voltage (V) QG , Total Gate Charge (nC)

Fig. 7 - Typical Capacitance vs. Fig. 8 - Typical Gate Charge vs.


Collector-to-Emitter Voltage Gate-to-Emitter Voltage

 
0.40 10
V CC = 480V 50 Ω
RG = Ohm
V GE = 15V VGE = 15V
TJ = 25 ° C VCC = 480V
0.38 I C = 5.0A
Total Switching Losses (mJ)
Total Switching Losses (mJ)


IC = 10 A
0.36

0.34 
IC = 5 A


IC = 2.5 A
0.32

0.30 0.1
0 20 40 60 80 100 -60 -40 -20 0 20 40 60 80 100 120 140 160
RG , Gate Resistance (Ω) TJ , Junction Temperature ( °C )

Fig. 9 - Typical Switching Losses vs. Gate Fig. 10 - Typical Switching Losses vs.
Resistance Junction Temperature
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2.0


RG = 50
Ohm 100
VGE = 20V
TJ = 150° C T J = 125 o C
VCC = 480V

I C, Collector-to-Emitter Current (A)


VGE = 15V
Total Switching Losses (mJ)

1.5

1.0 10

0.5

SAFE OPERATING AREA


0.0 1
0 2 4 6 8 10 1 10 100 1000
I C , Collector Current (A) VCE, Collector-to-Emitter Voltage (V)

Fig. 11 - Typical Switching Losses vs. Fig. 12 - Turn-Off SOA


Collector-to-Emitter Current
100

10 TJ = 150°C

TJ = 125°C

T = 25°C
J

0.1
0.0 1.0 2.0 3.0 4.0 5.0 6.0

F orward V oltage D rop - V F M(V )


Fig. 13 - Maximum Forward Voltage Drop vs. Instantaneous Forward Current
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IRG4RC10KD
50 14
VR = 20 0V
T J = 1 25 °C
T J = 2 5°C
I F = 8.0A 12
45
I F = 4.0A
I F = 8.0A
10
40 I F = 4.0A
trr- (nC)

Irr- ( A)
8

35

30
4

25
VR = 2 00 V 2
T J = 1 2 5°C
T J = 2 5 °C
20 0
100 1000 100 1000
di f /dt - (A/µ s) di f /dt - (A/µ s)
Fig. 14 - Typical Reverse Recovery vs. dif/dt Fig. 15 - Typical Recovery Current vs. dif/dt

200 1000
VR = 2 00 V VR = 20 0V
T J = 1 25°C T J = 1 25 °C
T J = 2 5°C T J = 2 5°C

160

I F = 8.0A I F = 8.0A
di (rec) M/dt- (A /µs)

I F = 4.0A
I F = 4.0A
120
Qrr- (nC)

80

40

A
0 100
100 1000 100 1000
di f /dt - (A/µ s) di f /dt - (A/µ s )
Fig. 16 - Typical Stored Charge vs. dif/dt Fig. 17 - Typical di(rec)M/dt vs. dif/dt,

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IRG4RC10KD

Same ty pe
device as
D .U.T.

430µF
80% 90%
of Vce D .U .T.
Vge 10%

VC
90%
td(off)

10%
Fig. 18a - Test Circuit for Measurement of IC 5%
tr tf
ILM, Eon, Eoff(diode), trr, Qrr, Irr, td(on), tr, td(off), tf t d(on) t=5µs
Eon Eoff
E ts = (Eon +Eoff )

Fig. 18b - Test Waveforms for Circuit of Fig. 18a, Defining


Eoff, td(off), tf


trr
G A T E V O L T A G E D .U .T . trr
Ic
Q rr = Ic ddt
id t
tx
1 0 % +V g
+Vg
tx
1 0 % Irr
10% Vcc
V cc
D UT VO LTAG E
Vce
AN D CU RRE NT V pk
Irr
1 0 % Ic
Vcc Ip k
9 0 % Ic
Ic
D IO D E R E C O V E R Y
W A V E FO R M S
5% Vce
td (o n ) tr


t2
Vce
ce ieIcd t dt


E on = V t4
t1 E re c = VVd
d idIc
d t dt
t3
t1 t2 D IO D E R E V E R S E
REC OVERY ENER GY

t3 t4

Fig. 18c - Test Waveforms for Circuit of Fig. 18a, Fig. 18d - Test Waveforms for Circuit of Fig. 18a,
Defining Eon, td(on), tr Defining Erec, trr, Qrr, Irr

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IRG4RC10KD
V g G AT E SIG NA L
DE VIC E U ND E R T E ST

CU R RE NT D .U .T.

VO L TA G E IN D.U .T.

CU R RE NT IN D 1

t0 t1 t2

Figure 18e. Macro Waveforms for Figure 18a's Test Circuit

L D.U.T. 480V
RL=
4 X IC @25°C
1000V Vc*
0 - 480V
50V
6000µ F
100 V

Figure 19. Clamped Inductive Load Test Circuit Figure 20. Pulsed Collector Current
Test Circuit
Package Outline
TO-252AA Outline
Dimensions are shown in millimeters (inches)
2.3 8 (.0 94 )
6.7 3 (.2 65 ) 2.1 9 (.0 86 )
6.3 5 (.2 50 ) 1.1 4 ( .0 45)
0.8 9 ( .0 35)
-A-
5 .46 (.21 5) 1 .2 7 ( .0 50)
0.58 (.02 3)
5 .21 (.20 5) 0 .8 8 ( .0 35)
0.46 (.01 8)

6.45 (.24 5)
5.68 (.22 4)
6.2 2 (.2 45 )
5.9 7 (.2 35 ) 10 .42 (.41 0)
1 .0 2 (.04 0) 9.4 0 (.3 70 ) L E A D A S S IG N M E NT S
1 .6 4 (.02 5) 1 2 3
1 - G A TE
0.51 (.0 2 0) 2 - D R A IN LEAD ASSIGNMENTS
-B - M IN . 3 - SOURCE
1 .5 2 ( .06 0) 4 - D R A IN 1 - GATE
1 .1 5 ( .04 5)
3X
0.89 (.0 35 ) 2 - COLLECTOR
0.64 (.0 25 ) 0 .5 8 (.0 23)
1.1 4 (.0 45) 0 .4 6 (.0 18) 3 - EMITTER
2 X 0.7 6 (.0 30) 0 .2 5 (.0 10 ) M A M B
4 - COLLECTOR
2.28 (.0 90 ) N OT E S:
1 D IM EN SIO N IN G & TO L E R AN C IN G PE R A N SI Y 14 .5 M, 19 82.
4.57 ( .18 0) 2 C O N TR O LL ING D IM E N S IO N : IN C H.
3 C O N FO R M S T O JE D E C O U TL IN E TO - 252 A A.
4 D IM EN SIO N S S H OW N A RE B E F O RE S O LD E R D IP ,
S O L D ER D IP M A X. + 0.16 (.0 06 ).

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Notes:
Q Repetitive rating: VGE=20V; pulse width limited by maximum junction tem-
perature (figure 20)
R VCC=80%(VCES), VGE=20V, L=10µH, RG= 100Ω (figure 19)
S Pulse width ≤ 80µs; duty factor ≤ 0.1%.
T Pulse width 5.0µs, single shot.

Tape & Reel Information


TO-252AA
TR TRR TR L

1 6 .3 ( .6 4 1 ) 16 .3 ( .64 1 )
1 5 .7 ( .6 1 9 ) 15 .7 ( .61 9 )

12 .1 ( .4 7 6 ) F E E D D IR E C T IO N 8 .1 ( .3 18 )
FE E D D IR E C T IO N
11 .9 ( .4 6 9 ) 7 .9 ( .3 12 )

NOTES :
1 . C O N T R O L L IN G D IM EN S IO N : M IL L IM E T E R .
2 . A L L D IM EN S IO N S A R E S H O W N IN M IL L IM E T E R S ( IN C H E S ).
3 . O U T L IN E C O N F O R M S T O E IA -4 8 1 & E IA -5 4 1 .

1 3 IN C H

16 m m
NOTES :
1 . O U T L IN E C O N F O R M S T O E IA -4 8 1 .

IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.
Data and specifications subject to change without notice. 12/00
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