3-CMOS Fab Process
3-CMOS Fab Process
Lecture 3 VDD
VDD
CMOS Fabrication Process Qp
Qp
Peter Cheung
Department of Electrical & Electronic Engineering Vi Vo vi vo
Imperial College London
Qn
Qn
GND
URL: www.ee.ic.ac.uk/pcheung/
E-mail: [email protected]
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The CMOS Process - photolithography (1) The CMOS Process - photolithography (2)
(a) Bare silicon wafer (d) Expose resist to UV light (f) Etch away oxide
through a MASK
Silicon Wafer
Silicon Wafer
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Mask 1: N-well Diffusion Mask 2: Define Active Regions
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SiO2 SiO2
n+ n+ n+
n-well n-well
p-substrate p-substrate
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Mask 5: p+ Diffusion Mask 6: Contact Holes
SiO2 SiO2
p + n+ n+ p+ p+ n+ p + n+ n+ p+ p + n+
n-well n-well
p-substrate p-substrate
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Physical Layout of an Inverter Dimension of transistors
n-well
p+ diffusion vi vo
Source Drain Source Drain
Poly 1 (poly-Si gate) n-well Gate
Gate
Qn
Contact Hole
GND n-channel MOSFET p-channel MOSFET
Metal 1
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Latch-up problem (1) Latch-up (con’t)
As shown above, the p+ region of the p-transistor, the n-well and the p- substrate form a
parasitic pnp transistor T1. T1 and T2 form a thyristor circuit.
The n- well, the p- substrate and the p+ source of the n-transistor forms another parasitic If Rw and/or Rs are not 0, and for some
npn transistor T2. reason (power-up, current spike etc), T1 or
There exists two resistors Rw and Rs due to the resistive drop in the well area and the T2 are forced to conduct, Vdd will be
substrate area. shorted to Gnd through the small
resistances and the transistors.
Once the circuit is 'fired', both transistors
will remain conducting due to the voltage
drop across Rw and Rs. The only way to
get out of this mode is to turn the power
off.
This condition is known as latch-up.
To avoid latch-up, substrate-taps (tied to
Gnd) and well-taps (tied to Vdd) are
inserted as frequently as possible. This
has the effect of shorting out Rw and Rs.
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