Midtest Exercise Chris
Midtest Exercise Chris
by a machining process.
Sample x1 x2 x3 x4 x5 x-bar R
Number
1 138.1 110.8 138.7 137.4 125.4 130.1 27.9
2 149.3 142.1 105.0 134.0 92.3 124.5 57.0
3 115.9 135.6 124.2 155.0 117.4 129.6 39.1
4 118.5 116.5 130.2 122.6 100.2 117.6 30.0
5 108.2 123.8 117.1 142.4 150.9 128.5 42.7
6 102.8 112.0 135.0 135.0 145.8 126.1 43.0
7 120.4 84.3 112.8 118.5 119.3 111.1 36.1
8 132.7 151.1 124.0 123.9 105.1 127.4 46.0
9 136.4 126.2 154.7 127.1 173.2 143.5 47.0
10 135.0 115.4 149.1 138.3 130.4 133.6 33.7
11 139.6 127.9 151.1 143.7 110.5 134.6 40.6
12 125.3 160.2 130.4 152.4 165.1 146.7 39.8
13 145.7 101.8 149.5 113.3 151.8 132.4 50.0
14 138.6 139.0 131.9 140.2 141.1 138.2 9.2
15 110.1 114.6 165.1 113.8 139.6 128.6 55.0
16 145.2 101.0 154.6 120.2 117.3 127.7 53.6
17 125.9 135.3 121.5 147.9 105.0 127.1 42.9
18 129.7 97.3 130.5 109.0 150.5 123.4 53.2
19 123.4 150.0 161.6 148.4 154.2 147.5 38.2
20 144.8 138.3 119.6 151.8 142.7 139.4 32.2
a. Set up x-bar and R control charts on this process. Verify that the process is in statistical control.
Following the establishment of control charts in part (a) above, 10 new samples were collected. Plot the x-bar
b.
and R values on the control chart you established in part (a) and draw conclusions.
Sample x1 x2 x3 x4 x5 x-bar R
Number
1 131.0 184.8 182.2 143.3 212.8 170.8 81.8
2 181.3 193.2 180.7 169.1 174.3 179.7 24.1
3 154.8 170.2 168.4 202.7 174.4 174.1 47.9
4 157.5 154.2 169.1 142.2 161.9 157.0 26.9
5 216.3 174.3 166.2 155.5 184.3 179.3 60.8
6 186.9 180.2 149.2 175.2 185.0 175.3 37.7
7 167.8 143.9 157.5 171.8 194.9 167.2 51.0
8 178.2 186.7 142.4 159.4 167.6 166.9 44.3
9 162.6 143.6 132.8 168.9 177.2 157.0 44.4
10 172.1 191.7 203.4 150.4 196.3 182.8 53.0
Suppose that the assignable cause responsible for the action signals generated in part (b) has been identified
c. and adjustments made to the process to correct its performance. Plot the x-bar and R values from the following
new subgroups, which was taken following the adjustment, against the control chart limits established in part
(a). What are your conclusions?
Sample x1 x2 x3 x4 x5 x-bar R
Number
1 131.5 143.1 118.5 103.2 121.6 123.6 39.9
2 111.0 127.3 110.4 91.0 143.9 116.7 52.9
3 129.8 98.3 134.0 105.1 133.1 120.1 35.7
4 145.2 132.8 106.1 131.0 99.2 122.9 46.0
5 114.6 111.0 108.8 177.5 121.6 126.7 68.7
6 125.2 86.4 64.4 137.1 117.5 106.1 72.7
7 145.9 109.5 84.9 129.8 110.6 116.1 61.0
8 123.6 114.0 135.4 83.2 107.6 112.8 52.2
9 85.8 156.3 119.7 96.2 153.0 122.2 70.5
10 107.4 148.7 127.4 125.0 127.5 127.2 41.3
on of a part produced
no1 a
x d bar 130.9
r bar 40.9
control. 10 points
1c
2 The net weight (in oz) of a dry bleach product is to be monitored by x-bar and R control charts using a sample
size of n = 5. Data for 20 preliminary samples are as follows.
Sample x1 x2 x3 x4 x5
Number
1 15.8 16.3 16.2 16.1 16.6
2 16.3 15.9 15.9 16.2 16.4
3 16.1 16.2 16.5 16.4 16.3
4 16.3 16.2 15.9 16.4 16.2
5 16.1 16.1 16.4 16.5 16.0
6 16.1 15.8 16.7 16.6 16.4
7 16.1 16.3 16.5 16.1 16.5
8 16.2 16.1 16.2 16.1 16.3
9 16.3 16.2 16.4 16.3 16.5
10 16.6 16.3 16.4 16.1 16.5
11 16.2 16.4 15.9 16.3 16.4
12 15.9 16.6 16.7 16.2 16.5
13 16.4 16.1 16.6 16.4 16.1
14 16.5 16.3 16.2 16.3 16.4
15 16.4 16.1 16.3 16.2 16.2
16 16.0 16.2 16.3 16.3 16.2
17 16.4 16.2 16.4 16.3 16.2
18 16.0 16.2 16.4 16.5 16.1
19 16.4 16.0 16.3 16.4 16.4
20 16.4 16.4 16.5 16.0 15.8
a. Set up x-bar and R charts on these data. Does the process exhibits statistical control?
c. If the specifications are at 16.2 ± 0.5, what conclusions would you draw about process capability.
d. What fraction of containers produced by this process is likely to be below the lower specification limits of 15.7
oz?
harts using a sample
no2 a 2b
mean 16.28
dev 0.2042132
2c usl 16.7
lsl 15.7
st dev 0.2042132
10 points
cp 0.8161404
5 points
2d p 1.2252794
5 points
0.0027062
ication limits of 15.7 5 points
3
Thirty observations on the oxide thickness of individual silicon wafers are shown here, Use
a. these data ti set up a control chart on oxide thickness and a moving range chart. Does the
process exhibit statistical control?
1 45.4 16 58.4
2 48.6 17 51.0
3 49.5 18 41.2
4 44.0 19 47.1
5 50.9 20 45.7
6 55.2 21 60.6
7 45.5 22 51.0
8 52.8 23 53.0
9 45.3 24 56.0
10 46.3 25 47.2
11 53.9 26 48.0
12 49.8 27 55.9
13 46.9 28 50.0
14 49.8 29 47.9
15 45.1 30 53.4
c. Following the establsihment of the control charts in part (a), ten new wafers were observed.
The oxide thickness are as follows:
Oxide Oxide
Wafer Thickness Wafer Thickness
1 54.3 6 51.5
2 57.5 7 58.4
3 64.8 8 67.5
4 62.1 9 61.1
5 59.6 10 63.3
Plot these observations against the control limit determined in part (a). Is the process in
control?
Suppose the assignable cause responsible for the out-of control signal in part (c) is discovered
d. and removed from the process. Twenty additional wafers are subsequently sampled. Plot the
oxide thickness against the part (a) control limits. What conclusions can you draw? The new
data are shown here.
Oxide Oxide
Wafer Thickness Wafer Thickness
1 43.4 11 50.0
2 46.7 12 61.2
3 44.8 13 46.9
4 51.3 14 44.9
5 49.2 15 46.2
6 46.5 16 53.3
7 48.4 17 44.1
8 50.1 18 47.4
9 53.7 19 51.3
10 45.6 20 42.5
10 points
no 3a
5 points
5 points
3b
10 points
Nonconfor Nonconfor
Day Day
ming units ming units
1 3 11 2
2 2 12 4
3 4 13 1
4 2 14 3
5 5 15 6
6 2 16 0
7 1 17 1
8 2 18 2
9 0 19 3
10 5 20 2
What is the smallest sample size that could be used for this process and still give a positive lower control
b. limit?
For the chart established in part (a), what is the probability of detecting a shift in the process fraction
c.
nonconforming to 0.035 on the first sample after a shift has occurred?
10 points
5 points
5 points