Republic of the Philippines

EASTERN VISAYAS STATE UNIVERSITY

Tacloban City

ELECTRONIC COMPONENTS TESTER

A Project Study

Presented to

The ECE Department

College of Engineering

In partial fulfillment of the requirements for ECE 513

By:

Calzita, Alissa Jyn A.

Go, Queenie Ann P.

Reas, Rica D.

January 2020
ii
 TABLE OF CONTENTS

Page

TITLE PAGE…………………………………………………………………………….i

TABLE OF CONTENTS ……………………………………………..………………...ii

CHAPTER I

INTRODUCTION 1

Background of the Study ………………………………………………….…….1

Statement of the Problem ……………………………………………………….3

Objectives of the Study …………………………………………………………4

Conceptual Framework …………………………………………………………5

Significance of the Study ……………………………………………………….6

Scope and Delimitation of the Study …………………………………………...7

Definition of Terms …………………………………………………………….8

CHAPTER II

REVIEW OF RELATED LITERATURE AND STUDIES …………………….9

Related Literature …………………………………………………………….9

Modal 570A Analog ……………………………………………………….9

575A Digital IC Tester …………………………………………….………10

DROK Electronic Component Tester……….……………………..………12

Related Studies ………………………………………………………………..13

555 and 741 IC Electronic IC Testing Device………………………………….13

Low Cost Transistor Tester…………………………………………………….14

IC Tester Using PIC Microcontroller…………………………………..………14

CHAPTER III

METHODOLOGY ………………………………………………………………..16

Research Design …………………………………………………………….…16

Research Instruments …………………………………………………………..23

Flow Chart ……………………………………………………………………..25

Research Output ……………………………………………………………….28

Operation’s Manual ……………………………………………………………29

Test Procedures…………………………………………………………………30

Bibliography…………………………………………………………………………….31

iii
 CHAPTER I

INTRODUCTION

BACKGROUND OF THE STUDY

Electronic components are the basic building blocks of an electronic circuit. These

are industrial products that have several electrical terminals which can be used to create

an electronic circuit with a specific function. They are classified into two categories:

active components like transistor, diodes, ICs; and passive components like resistors,

inductors, capacitors, etc. Many circuits are designed using various electronic

components. They are also used in different types of electrical and electronic projects.

In the manufacturing industry, there are continuous efforts in cost reduction, quality

upgrade and improvement of overall efficiencies. In the electronics industry, with the

increase in circuit complexity and the need for higher levels of reliability, one major

contributor of cost in any product is testing its functionality. Companies give a lot of time

in testing products before they are sold in the market. However, sometimes a glitch can

happen to the system, some defective products pass through the system unnoticed and

end up being sold in the market. This kind of situation is common in manufacturing

industries and leads to problematic issues for the person who will use the product.[1]

In research centers and colleges especially engineering, electronic components are

frequently used for laboratories and projects. Some components bought are already

defective due to manufacturing errors and some tend to fail due to excessive use and

mishandling. These defective components can result to wrong outputs that in turn, lead to
wrong evaluation and analysis. Many students face problems like these during

construction of projects. They devote so much time in debugging and reconstructing the
circuit multiple times, without knowing that the components used might actually be

non-functional. Thus, it is very essential to test first the components before using them in

any application.

Some components can be manually tested using a multitester, but some can’t be.

Additional devices like a digital tester is needed to test especially active components.

The manual operation includes testing of each individual component by making

necessary connections and verifying the output for each component terminal. It will be

based on the truth table and datasheet of the specific components. It is a time consuming

and tedious process. There are laboratories that need to be done at once and doing these

manual tests will cause a burden.

It is to this regard that the researchers come up with an idea to develop an instrument

that will help test the component’s functionality and to determine its condition without

exerting much effort and time. The tester will be able to identify if the component is

functional or faulty. It will include all commonly used components such as transistors,

and some integrated circuit components (Logic ICs, voltage regulators, operational

amplifiers and timers). A component can be tested by simply inserting it on a ZIF socket

and selecting on the android LCD screen the type of component that is under test. Result

will be displayed on the screen immediately; either “GOOD” or “FAULTY”.

This research will be designed for the advantage of engineering students, especially

Electronics Engineering students who always use electronic components. This will help

solve the problems encountered during experiments and projects and will lessen the time

consumed by students in troubleshooting.

2
2
STATEMENT OF THE PROBLEM

Eastern Visayas State University students particularly those taking up Bachelor of

Science in Electronics and Communications Engineering are trained to have an expert

understanding of circuits in devices and other modern technologies. This explains the

countless laboratory activities and projects every year. The instructional laboratory plays

a vital role for ECE students, because it is the only source of hands-on instruction that

will complement the understanding of theories discussed during lecture which involves

the use of different electronic components. This makes it easier for students to learn and

apply those theories.

During lab sessions, there will always be successful and unsuccessful activities. One

of the difficult parts of having projects and laboratories is troubleshooting. It is always

accompanied with errors. The amount of time spent on testing the components is a

burden especially that not all the components can be tested using the multitester alone.

In order to avoid spending too much time in testing the functionality of the

components that will be used, the researchers propose a way to easily test a component

and to identify whether it is still functional or not.

3
OBJECTIVE OF THE STUDY

The main objective of the researchers in this study is to design and develop a device

that can test electronic components such as transistors and some integrated circuits which

are Logic IC’s, voltage regulators, operational amplifiers and timers using Arduino

Atmega Microcontroller.

Specifically, the study is guided by the following objectives:

1. To test logic IC’s based on truth tables or function tables.

2. To test timer IC’s using Astable and Monostable Circuits.

3. To test operational amplifier IC’s using Non-Inverting Circuit.

4. To test transistors using transistor tester circuit which employs the properties of

NAND Gate.

4
CONCEPTUAL FRAMEWORK

INPUT PROCESS OUTPUT

Knowledge in:
 Logic IC’s
 BJT Transistor
 Arduino System Development
programming  Program Coding
 Prototype Arduino based
Development Electronic
Hardware:
Components
 Microcontroller System Testing Tester
 ZIF socket
 Circuit Board  Prototype Testing
 Android LCD  Implementation
Screen
 Regulated power
supply

Fig. 1.1 Input-Process-Output

In this study, the overall concept is to develop a device which will be able to test the

functionality of selected electronic components that are commonly used by Electronics

and Communications Engineering students in Eastern Visayas State University, Main

Campus. It will be able to display if the component under test is working or not. The

study requires knowledge on the components that will be tested and Arduino

programming. The following are the hardware to be used: a ZIF socket used to connect

the component under test to the microcontroller via socket, a circuit board for

5
components that will need additional circuits for testing, a microcontroller, android LCD

screen as user’s interface, and a power supply to provide power to the device.

The block diagram will serve as the basis of the overall development of the device. It

will require program coding to display the overall result. Some components will require

5
additional circuits in order to test its functionality, but some can be tested with the use of

the microcontroller alone. The final output must meet all the requirements then testing

must be made in order to ensure functionality and accurateness of the device.

SIGNIFICANCE OF THE STUDY

The study may be beneficial to the following:

Students. This study will benefit the students because it can detect defective

components. They will be able to use this device during experiments and in constructing

projects. Students can finish their experiments on time because they don’t need to

manually test the components in a multitester. They can save time and can utilize the

remaining time in other activities. It can also help lessen the time spent in

troubleshooting circuits.

Entrepreneurs. Electronic components shop owners can check the components

using this tester. They will be notified if products bought from their supplier is

functioning properly or not. This can avoid future complaints from consumers who have

purchased defective items.

Researchers. This study could help the researchers enhance their skills in designing

and building projects that is in line with their course. It will also improve their capability

in decision making as a future Engineer.

6
SCOPE AND DELIMITATION OF THE STUDY

SCOPE:

The subject of this study covers certain scopes.

1. The project consists of an Arduino Atmega as the brain of the project.

2. The proposed project will be capable of testing the following components:

a. Logic IC’s

b. 555 IC

c. 741 IC

d. Voltage Regulators

e. BJT Transistors

3. The additional testing circuits for timer IC’s are the Astable Circuit and

Monostable Circuit.

4. The additional testing circuit for operational amplifiers is only the Non-Inverting

Circuit.

5. The proposed project is capable of identifying the type of transistor: PNP or

NPN.

6. The result of the test will be displayed on an Android LCD screen as “GOOD” or

“FAULTY”.

DELIMITATION:

1. The electronic components tester will not be capable of testing two or more

components at the same time.

7
2. It is assumed that the correct ZIF slot is used by the user for the component under

test.

7
DEFINITION OF TERMS

This study contains some terms with which the reader may be unfamiliar. The

meanings associated with them are included here.

Android LCD Screen – a touchscreen LCD to be used as a selector of the

components to be tested. It will also display the output from the microcontroller.

Arduino Mega Microcontroller – serves as the brain of the system. It is a

microcontroller board based on ATmega2560. It has more pins than typical the ordinary

Arduino Uno microcontroller. All outputs coming from the ZIF socket is processed here.

Circuit Board – it is a printed circuit board (PCB) composed of circuits that is used

in testing the components. The following components are the Timer 555, transistor,

diode and operational amplifier.

LM555 – also known as the timer IC. It is used in timers, pulse generation and

oscillator applications.

Logic IC’s – it is an integrated circuit that can operate logic function.

Operational amplifier – operates as a voltage amplifier. It has two input of

different polarity. It is used in signal processing, measurement and instrumentation.

Power supply – supplies electric power to the microcontroller. We designed a 9v

power supply that is regulated in order to protect the system from power surges.

Transistor – a three terminal semiconductor device that is used in amplification and

as a switch.

8
Voltage Regulator - a device that is designed to maintain a constant voltage level.

ZIF socket – it is where the electronic components will be mounted for testing.

8
 CHAPTER II

REVIEW OF RELATED LITERATURE AND STUDIES

This chapter presents the related literature and studies after the thorough and

in-depth research done by the proponents of this study. This will also present the

synthesis of the theoretical and conceptual framework to fully understand the research to

be done.

Review of Related Literature

Modal 570A Analog

Fig. 2.1 Linear IC Tester Model 570A

The Model 570A Analogue IC Testers from B&K Precision is a compact, hand held,

battery powered tester which offers advanced functionality and ease of use. The 2-line x

16 character dot matrix LCD shows the result of the test as a PASS or FAIL, together

with individual pin diagnostics, test made, and possible equivalents. It has a built-in test

library which includes common Analogue ICs including op-amps, comparators, voltage
regulators, voltage references, analogue switches & multiplexes, opto-isolators &

couplers, and audio ICs.[2]

• Auto identification mode

• Functional test unit emulates passive circuitry to implement a

• Comprehensive test in a variety of configurations and gain settings

• Displays diagnostic information down to individual component pins

• Rugged, hand held, battery operated

• Built-in membrane keypad, 2 x 16 dot matrix alphanumeric LCD, and high quality

16 pin ZIF socket

575A Digital IC Tester

Fig. 2.2 Digital IC Tester Model 575A

The Model 575A (from B&K Precision Corporation Company) is able to locate

temperature related faults by using its unconditional or conditional loop testing modes.

Unknown device identification is easily accomplished by selecting SEARCH from the

menu, selecting the number of pins on the device and activating Search Mode. The 575A
10
will search its library and identify the device, displaying possible functional equivalents

for replacement. As part of the IC test, the specific IC number,the functional description

of the device, and the status of faulty pins are scrolled through on the built-in display.[3]

The following are the features of Model 575A Digital IC Tester:

• Comprehensive device library covers most TTL, CMOS, memory and interface

devices

• 40 pin capability (NAND gates or CPUs)

• Identifies unmarked and house-coded devices

• Detects intermittent and temperature related faults

• Displays diagnostic information for individual pins

• Battery operated

The researchers comprehended that integrated circuits are easily identified and tested

with these IC Testers. Two models are available, one for linear and one for digital ICs,

Model 570 A is for linear while 575A is for digital both with extensive built-in libraries.

Small, hand held design and is battery powered for portability.

The researchers are going to use the idea of automatic identification of IC under test

and displaying the specific IC number,the functional description of the device, and the

status of faulty pins.

11
DROK Electronic Component Tester

Fig. 2.3 DROK Electronic Component Tester

The DROK Electronic Component Tester is powered by a 9V battery. This

multifunctional meter is automatic identification type, which can detect the pin sequence,

graphic display and parameters automatically. For example, in testing a triode, there is

no need to worry about the BEC order of 1,2,3 pin. You just insert the triode into the

testing interface optionally and then push the testing button. The meter will identify if it

is triode, field-effect tube, controlled silicon or resistance capacitance. After that, the

tester will detect it if it is NPN or PNP and the BCE order and other information.[4]

The researchers will used the idea of automatic identification of what type of

transistor is under test: PNP or NPN.

12
12
Review of Related Studies

Digital IC Tester With Embedded Truth Table

Fig. 2.4 Digital IC Tester With Embedded Truth Table

Bhaskar and et al. have done a project on “Digital IC Tester With Embedded

Truth Table”. This paper presented a proto-type IC tester that is highly capable, highly

reliable as well as cost effective. They develop a program with different functions for

checking 74xx series logic ICs. They systematically analyse and test the prototype for

several ICs, accessing each individual pin with all possible inputs. They also investigate

truth tables associated with different ICs over a display channel.[5]

The researchers are going to use the idea of built-in truth tables and/or function

tables in order to test logic ICs.

555 and 741 IC Electronic IC Testing Device

Aralar and et al. did a work titled “555 and 741 IC Electronic IC Testing Device”.

In this work, the authors have designed a microcontroller based tester that can test 555

13
and 741 ICs. The proposed device is comprised of three circuits - Astable circuit and

Monostable circuit for testing 555 and Non-inverting circuit for testing 741 IC.[6]

13
 The researchers will utilize the whole concept of the study for testing timer and

operational amplifier IC’s. The researchers will be using Arduino Atmega 2560 as a

microcontroller instead of Arduino and ZIF socket instead of DIP socket.

Low Cost Transistor Tester

Katti and et al. did the work on “Low Cost Transistor Tester”. The proposed

project makes use of a circuit which employs the properties of NAND gate. The transistor

tester consists of two LEDs for displaying the condition of the transistor under test. The

transistor tester can also identify pnp and npn types of transistors.[7]

The researchers will utilize the concept of using a circuit which uses NAND gate to

identify the type and condition of transistor under test.

IC Tester Using PIC Microcontroller

S.Devika and et al. published a research paper titled “IC Tester Using PIC

Microcontroller”. The proposed integrated circuit tester is capable of testing both digital

and analog ICs having 14 pin (74 series) and 8 pin (IC 555,LM741) respectively. It has

flexibility in programming any number of ICs and can be tested with the memory

constraints. The required input signal is applied to the IC for checking the condition of

the IC and displays the output in the16x2 Liquid Crystal Display by displaying

“GOOD”or “BAD” along with the IC number. The heart of the IC tester is PIC 16F877A

Microcontroller which is programmed for deciding which IC, provide input, check the

output and display the condition as mentioned.[8]

14
 For the users to identify the status of component under test, the researchers are going

to use the idea of displaying “GOOD” on the screen if the component is in good

condition and “FAULTY” if the component is faulty based on the result of the test.

15
 CHAPTER III

METHODOLOGY

This chapter will show the outgrowth of the Electronic Component Testing

Equipment. The device will be developed to enable the user to test active electronic

components such as Logic ICs, Voltage Regulators, 555 timers, 741 Operational

Amplifiers, and transistors.

RESEARCH DESIGN
Fig. 3.1 Block Diagram of Electronic Component Tester
 Figure 3.1, shows the block diagram of the project which consists of the power

supply unit, MCU or microcontroller, ZIF Sockets, Circuit Boards and Android LCD

screen. The arrow associated with it shows the data flow.

The first block is the ZIF socket. ZIF socket is used to place the component the user

wishes to test. For this project, each type of component has it’s own socket. ZIF socket 1

is for testing voltage regulators and ZIF socket 2 is for logic ICs. Both sockets 1 and 2 is

directly connected to the microcontroller while ZIF sockets 3, 4 and 5 which are used for

testing 555 timers, 741 op-amps, transistors are connected to its particular circuit board.

Testing logic ICs is based on truth tables. The truth tables are stored in database

while coding the microcontroller. A logic IC under test is considered “GOOD” if the

expected output responses match the truth table with the corresponding applied inputs,

otherwise “FAULTY”.

The Arduino Atmega will be used as a digital voltmeter in testing voltage

regulators. A voltage regulator has three pins: input, GND and output.[9] To test a

voltage regulator, the microcontroller will supply an input voltage and will measure the

output voltage. If there is a measured value and it matches the expected value, a voltage

regulator is considered “GOOD” and the measured voltage rating will be displayed,

otherwise “FAULTY”.

The Circuit board block consists of three testing circuits - Astable and monostable

Circuit, Non-inverting Circuit, and Transistor Tester Circuit.

17
 Fig. 3.2 555 timer Tester Circuit

Fig. 3.2 shows the 555 timer tester circuit. The circuit is composed of Astable and

Monostable circuits. The high time and low time duration are the basis for the test. The

High Time and Low Time duration for the Astable Circuit to be working must be

138.6ms and 69.3ms with 10% tolerance, which means that the high time range is

124.7ms – 152.46m and 62.37ms – 76.23ms for low time. For Monostable Circuit to be

in working mode, single output (one shot pulse) will be received by the microcontroller

that will be set to 110ms with a 10% tolerance. Thus, a good IC has a pulse in the range

of 99ms - 121ms.[2]

If one of the Astable or Monostable circuit is not working, the result will be

automatically defective or “FAULTY” for 555 IC.

18
 Fig. 3.3 741 Op-Amp Tester Circuit

Fig. 3.3 is an operational amplifier tester circuit. Only Non-inverting Circuit test will

be conducted. Based on the circuit, the input voltage for non – inverting circuit is 5V

which will generate an output voltage of 10V that will pass through the voltage divider

circuit and will result to 3.3V output. With a 10% tolerance, the output voltage must be

within 3.0V – 3.6V for it to be called functional.[6]

19
 Fig. 3.4 Transistor Tester Circuit

In Fig. 3.4, the circuit for transistor tester is shown. Here the first gate(N1) is

designed as a simple oscillator with resistor R1 and capacitor C2.The remaining gates are

used as inverters and buffers.The output of gate N1 is fed to gate N2,which in turn is

used to drive the green half of the bicolour LED1.The cathode of green LED1 gives the

collector current for the transistor under test(TUT).The base of TUT gets biasing voltage

from the output of gate N2 to invert the signal.The emitter of the TUT is connected to the

outputs of gate N3 and N4. If the TUT inserted in the socket is npn type,the current

flows from output of gate N4 through bicolour LED1 and its green half glows.This is due

to the conduction of TUT.If the transistor is of pnp type,the current flow is reversed and

20
the red half of bicolour LED1 glows.This happens due to the high state of output of gates

N3 and N4, respectively.This is because output pin4 of N2 is at low level.The status of

20
the LEDs D1 and D2 reveals the condition of the transistor under test. If red LED is ON,

It indicates that the transistor under test is a good NPN. If green LED is ON, it indicates

that the transistor under test is a good PNP. If both LEDs are ON, it indicates that the

transistor under test is short. If both LEDs are OFF, it indicates that either the transistor is

bad or you may have connected it incorrectly.[7]

This information will be fed to the microcontroller to be processed to be able to

display results on the Android LCD screen.

The Microcontroller block consists of Arduino Mega. The output from the ZIF

socket and the circuit board will be sent to the microcontroller where it will be processed

and analyzed whether the component is functional or not.

The Android LCD screen block will display the output given or sent by the

microcontroller. If the component is functional, the display will be “GOOD” , otherwise

it will display “FAULTY”.

21
 The Power Supply Unit (PSU) block, consists of the components shown in Figure

3.5. A transformer steps-down the voltage from 220V to 15V. This voltage is then fed to

a full-wave bridge rectifier in order to produce positive pulses. Capacitors filter the

ripples from the rectifier in order to produce an almost constant dc voltage. These

pulsating dc voltages are fed to the IC regulators which will now produce a constant DC

voltage which will be used to power up the microcontroller. +9Vdc will be supplied for

the MCU.

Fig. 3.5 Power Supply Unit (PSU)

22
RESEARCH INSTRUMENTS

These are the hardwares and softwares that will be used to develop this research.

HARDWARES

ARDUINO MEGA 2560

Fig. 3.6 Arduino Mega 2560

For this research, the researchers will be utilizing Arduino Mega 2560 for the

microcontroller component. The microcontroller will serve as the processing unit for the

project, where the data will be processed and analyzed.

ZIF SOCKET

23
Fig. 3.7 ZIF Socket

23
 ZIF Socket (Zero Insertion Force Socket) is an IC socket designed to apply

minimum force to the pins of the IC. This is where the components will be mounted for

testing.

ANDROID LCD SCREEN

Fig. 3.8 Android LCD Screen

An android tablet will be used for this project. This will be connected to the

microcontroller using a cable.

SOFTWARES

This project will use Arduino Mega as the microcontroller unit. In order to build the

program, the microcontroller will need a software or integrated development

environment (IDE). This is where the codes are written and uploaded to the physical

board.

And also, Proteus 8.6 software will be used to design and test some circuits that will

be used on circuit boards for this project. This is also where the circuits will be simulated

first.
24
SYSTEM FLOWCHART

The flowchart shown below (Fig 3.9) represents our system algorithm. When the

system is initialized, the screen will display the initial settings. The system will be idle

and will only start to perform its function when the component is placed on the ZIF

socket and the user has already selected the type of component. Once testing is complete,

the microcontroller will now send the result to the Android LCD screen. The result

displayed will be “GOOD” or “FAULTY”.

Menu 1, 2, 3 , 4, and 5 is respectively for voltage regulators, logic ICs, 555 timers,

741 Op-Amps, and transistors. If the component under test is voltage regulator and is in

good condition, the screen will display “GOOD” and its actual rating, if not then it is

“FAULTY”. If a logic IC is the component under test, a list of IC numbers will be

displayed on the screen for the user to select. After selection the testing process will start,

then the screen will display the result. If the component under test is a 555 timer or a 741

op-amp and is in good condition the screen will display “GOOD”, otherwise “FAULTY”.

If the component under test is a transistor and is in good condition the screen will display

“GOOD” and if it is an NPN or PNP type of transistor.

25
26
Fig. 3.9 System Flowchart

27
RESEARCH OUTPUT

Shown below is a figure of the expected output of this project by the researchers.

Fig. 3.10 Research

The propose device is comprised of five ZIF sockets, +12V power supply to

drive the microcontroller and the three testing circuits, Arduino Atmega as a

microcontroller and an Android LCD screen to give inputs and to display results.

28
OPERATION MANUAL

1. Press On/off button to initialize the system.

2. In testing the condition for Voltage Regulator, place the IC on the socket for

Voltage Regulator and press the voltage regulator on the menu and wait for

the LCD to display the result.

3. In testing the condition for Logic IC, place the IC on the socket for Logic IC

and press the Logic IC on the menu and wait for the LCD to display the

result.

4. In testing the condition for 555 timer, place the IC on the socket for 555

timer and press the 555 timer on the menu and wait for the LCD to display

the result.

5. In testing the condition for 741 Op-Amp, place the IC on the socket for 741

Op-Amp timer and press the 741 Op-Amp on the menu and wait for the LCD

to display the result.

6. In testing the condition for transistor, place the component on the socket for

transistor and press the transistor on the menu and wait for the LCD to

display the result.

29
TEST PROCEDURES

In order for the proposed device to be called functional and working, certain test

procedures and measures are to be done by the researchers.

1. Testing the Astable Circuit for 555 IC testing. This test will show if the value of

time in high and low pulse will be determined by the microcontroller.

2. Testing the Monostable Circuit for 555 IC testing. This test will also show if the

Monostable duration will be determined by the microcontroller.

3. Testing the Non-Inverting Circuit for 741 IC testing. This test will show if the

output voltage of the circuit will be determined by the microcontroller.

4. Testing the Transistor tester Circuit for Transistor testing. This test will show if

the microcontroller can determine which LED glows.

5. Testing Logic ICs. This test will show if the microcontroller can determine

output responses and can compare it to the database of the particular IC.

6. Manual Testing. This test will check the functionality and accuracy of the device.

30
Bibliography

[1] Prof. D. G. Kanade, Nikhil Zambare, Krishna Rathode. “Digital IC Tester Using

Arduino” International Journal of Trend in Research and Development, Volume 6(1),

ISSN: 2394-9333

[2] http://www.bkprecision.com/products/component-testers/575A-digital-ic-tester.html

[3] http://www.bkprecision.com/products/component-testers/Modal570AAnalog.html

[4] http://www.amazon.com/Transistor-DROK-Capacitor-Capacitance-Automatic.html

[5] Bhaskar Jyoti Borah & Rajib Biswas. “Digital IC tester with embedded truth table”.

Electronics for you. January 2016

[6] J. Aralar, K. Lariba, J. Remanes.”555 and 741 IC Tester Electronic Testing Device”.

March 2016

[7] Shruti Katti, Shweta .S. Guttedar, Trupti , Swati.S. Guttedar.”Low Cost Transistor

Tester” International Research Journal Of Multidisciplinary Studies & Sppp's

Karmayogi Engineering College, Pandharpur Organize National Conference, ISSN

2454-8499, Volume 2, Issue 1, March 2016

[8] S.Devika, K.Anbarasan, C.S.Chiranjeevi,R.Haripriya. “IC TESTER USING PIC

MICROCONTROLLER”, International Journal of Research in Engineering and

Technology.June 2016

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[9] Hawraa Amin Abdul Al-Hussien,Sarah Mhawi Hundull,Ghadeer Mohammed

Shaham.”Digital Voltmeter By Using Arduino”. 2018

32