Gloss Testing
Gloss Testing
r. Introduction
The appearance of an object depends upon ANGLE OF T A N G L E OF
INCIDENCE SPECULAR
several factors; the illuminant, the reflection char- a REFLECTION
acteristics of the material , the surface texture, the a'
PERPENDICULAR
illuminating and viewing geometry, and the
observer . The color and glossiness of a specimen
are determined by the spectral composition and
geometrical distribution of the incident light and
upon the transformations that take place upon
reflection from the specimen. These two appear-
ance attributes, color and gloss, arc somewhat PAINT SPECI MEN
related. Color measurement may require cor- FIGURE 1. T ypical goniophotometric curve for a paint
rection for surface glossiness. Specular gloss spe6men , with defining terms.
measurement may require correction for diffuse
reflectance. has not yet been developed a satisfactory method
The complete description of the light-reflecting for reducing the former to a simple meaningful
properties of a specimen would require an infinite numeric or set of numerics as has been done for
number of measurements of reflectance throughout the latter. B ecause of these circumstances, one
a hemisphere for an infinite number of directions must generally be content to m easure the specular
of illumination. Even an approach to such a reflectance for one direction of illumination.
set of data is uneconomical to obtain with present Previous investigations have shown that the
goniophotometric equipment. Usually one must choice of direction as well as aperture for illumina-
be content to obtain one goniophotometric reflec- tion and view is governed by the type of material
tion curve for a single direction of illumination involved. Hunter and Judd [1]1 found that 60°
(see fig. 1). Furthermore, the question of how to specular gloss correlated most satisfactorily with
interpret a gon iophotometric curve still remains,
1 Figures ill brackets indicate the literature references at the end of this
for in contrast to spectrophotometric curves there paper.
l
The most important terms, definitions, and Goni ophotometric reflection curve . A plot of the
symbols used in this paper are given b elow. geometric distribution of r eflect ed luminous
Illuminance. Luminous flux incident per unit flux, for a specified distribution of inciden t flux,
area of surface . as a function of angle of view (see fig. 1) .
Luminous intensity (of r eflected luminous flux in Gloss . The function of luminous directional r e-
any direc tion). The solid-angular flux density. flectance of a specimen responsible for its shiny
Luminance. Luminous flux emitted per unit solid or lustrous appearance.
angle and p er unit proj ect ed area. Sp ecular gloss, Gs . The ratio of t hc specularly
Luminous (total ) reflecti on. A general term for r eflected luminous flux , F x , from a specimen
the process by which a part of th e incident surface for a specified angle of incidence, (J, to the
luminous flux leaves a specimen from th e inci- specularly r eflected luminous flux, F ., from a
dent side. standard surface for the same angle of incidence.
Specular angle, (J'. The angle b etween the per- Written symbolically :
p endicular to a plane surface and th e r efl ect ed (1)
ray. This angle is numerically equal to the
angle of inciden ce, (J , and lies in the same plane wher e (J' is the specular angle.
on the opposite side of th e perp endicular; it is S p ecular glossm eter. An instrument for measur-
often designated -(J (refer t o fig. 1). ing specular gloss at a fixed specular angle.
Lumi nous sp ecular reflecti on. The process by Geom etric conditions of i llumination and view.
which incident luminous flux is r efl ected from a Include the specular angle and the apertures of
surface in an image-forming state. the source and r eceiver .
Lumi nous diffuse reflection . The process by which S ource . A luminous body or area by which the
incident luminous flux is reemitted (in a non- specimen is illuminated.
image-forming state) . R eceiver. A photocell or an enclosure equipped
Luminous specular reflectance. R atio of luminous with phot ocells r esponding t o luminous flux
fiux leaving a surface in an image-forming state from the specimen. The sensitive surface of the
to the inciden t luminous flux . photocell or the opening to the enclosure is
Luminous diffuse reflectance . Ratio of luminous called the receiver entrance window.
flux reemitted at the illuminated urface of a Plane of measurement . The plane passing thr'ough
nonself-Iuminous specimen to the inciden t t he axes of incidence and view.
luminous flux. A perture (of a source or receiver) . The plane angle
subtended b y the source or r eceiver en trance
Luminous (total ) reflectance. R atio Of luminous
window at the respective collimating lenses.
flux reflect ed by a specimen to the luminous
With rectangular apertures th e angles, ex and (3,
flux incident on it. Diffuse r efl ectance plus
may be used t o describe the angular size of the
specular r efl ectance equals total r eflec tance.
aperture in the plane and perp endicular to the
It should b e noted that the specular and diffuse
plane of measurement, r espectively . In com-
r efl ectance components often cannot be sepa-
puting an aperture it is convenient to find the
rated for m easurement.
tangent of tIle half angle of th e aper ture. For
Luminous directi onal refl ectance . Ratio of lumi- example: the source 8-perture, lX , in the plan e of
nous flux from the specimen when illuminated measuremen t is equal to 2 tan- J(y/f), where y
and viewed from specified directions to that is the half dimension of the source in the plane
from the perfectly reflecting , perfectly diffusing of measurem ent, and f is th e focal length of the
specimen, similarly illuminated and viewed. collimating lens.
Luminous fracti onal reflectan ce of a specimen. Fresnel reflector (nonmetallic). Specularly reflects
Ratio of luminous flux reflect ed wit-hin a sp ecified a fraction, Gs , of luminous flux computed from
solid angle to the luminous flux incident on the the Fresnel equation [2],
specimen .
Goni ophotometer. An instrument used to obtain G _ !!;. [sin 2 (i- r ) tan2 (i- r)]
the geometric distribution of luminous flux . .- 2 sin2 (i+ r ) +tan2 (i+ r) ,
(2)
2. Practical Glossmeters
Perfect d~fJnsor. Reflects light according to
Lambert's Cosine Law, which states that the Most glossmeters in commercial use today em-
solid angular density of the luminous flux re- ploy an incandescent-filament lamp as a ligh t
flected from the surface in any direction varies source, a source lens to collimate the inciden t beam,
as th e cosine of the angle between that direc- a receiver lens to obtain at the receiver entrance
tion and the perpendicular to the surface. window an image of the source reflected from a
Glossiness. The lustrous appearance of a surface Fresnel reflector, and some type of photoelectric
ascribable to its gloss. receiver [4], (see fig. 3). The source aperture I S
Lightness. That appearance attribute of a speci-
PRACTICAL P E RPENOICULAR
men which correlates with its luminous diffuse SOURCE
PR ACTICA L
REC E IVER
CO LLIMATOR
reflectance. COLLIMATOR
,/
PRACTICAL
III. Glossmeters SO UR CE
tric modification of the McNicholas goniophotom- FIGURE 3. P rac tical glossmeter, em ploying practical source
eter, which is the earliest known photoelectric and practical receiver.
specular glossmeter. Since then glossmeters of
this type and similar photoelectric types have been determined by the dimensions of the source and
manufactured commercially. the focal length of th e collimating lens. The re-
ceiver aperture is determined in a similar manner,
1. Theoretical Glossmeter using the dimensions of the receiver entrance
window. Standard apertures may be specified,
The theoretical glossm eter consists of a so urcc, but errors of duplication cannot be avoided.
:source and receiver collimators, and a receiver The collimating lenses used in commercial
(see fig. 2). If we had to deal only with an in- glossmeters are usually simple, uncorrected lenses,
finitesimal, un polarized light so urce of high inten- subject to such lens errors as astigmatism, spheri-
'sity, an infinitesimal receiver of high response, and cal and chromatic aberration, and coma. Cor-
perfect collimators, the problem of geometric tol- rected lenses could be used, but the accuracy re-
erance specification would be eliminated. Such q uired in mos t gloss measurements can be obtained
hypothe tical glossmeter elements would have min- without this added expense. Because most com-
imum aperatures and no lens aberrations and mercial glossmeters are compactly made, the dis-
,could be duplicated without causing error in the tances between elements and the apertures are
gloss readings. Measurement of specular gloss physically small. This leads to errors in the set-
would then be completely reproducible from in- ting of the specular angle, measurement of the
:strument Lo instrument if the specular angles source and receiver apertures, collimation of the
were accurately determined. incident beam, and positioning of the focussed im-
mirror surface.
LIGHT
SOURCE
fig . 4). This glossmeter has provision for ac- BLACK GL ASS STANDARD
curately controlling (1) the source and r eceiver FIG U RE 4. NBS versatile glossmetel', emplo ying variable
apertures in bo th the a and (3 planes; (2) the angles sou rce and receiver apertw'es, achl'omatic colli mators, and
of illumination and view; (3) the collimation; and variable angles of i llu mination and view.
(4) the position of the source image relative to the bc pointed out that the specular r efl ectance, and
plane of the receiver aperture. Each of these consequently the gloss, of a nonmetall ic specimen
variables can be changed individually to any is a function of the index of refraction of the
desired degr ee of departure from the ASTM material of the specimen (see eq 3) as well as
specifications. of the smoothness of the surface. Polished black
Control of th e source ap erture is accomplish cd glass of known index of refraction h as been used
by employing a pair of cond ensing lenses to foc~s to calibrate the upper end of the gloss scale.
an unage of the source on an adj ustable metallIc For low-gloss finish es, such as are used for cam-
aperture. This aperture, servin g as the n ew ouflage by the Armed Services, the plane surface
source of controllable si - e, is located in the fo cal of a block of magnesium carbonate, which ap-
plane of an achromatic collimating l ens, the focal proxlinates the perfect diffuser, has b een used as a
length of which is accurately known. standard at the lower end of the scale. This
The specular angle is easily controlled since the leaves the question of what material to use for
so urce and receiver are located on the hori, ontal interm ediate standards. Horning and Morse [5J
arms of a goniophotometer of which the angular implied that in the medium- to low-gloss range
scale may be set to within ± 0.1 °, and the speci- average paint specimens have reflected light-
m en of which the gloss is to b e m easured is placed flux distributions more like glazed ceramic tiles
vertically on the turntable of the goniophotometer. than like depolished black glass. From t his
The r eceiver collimating lens also is an achro- standpoint tile should be preferable for use as
matic lens for which the focal length is accurately gloss standards in the paint industry.
known. It is of such aperture and so positioned R ecent cooperative work with the Sherwin-
that there is no vignetting of rays that should Williams Co. revealed, however, that better agree-
reach the r eceiver. The receiver aperture is ment in the measurement of high-gloss paints h ad
precisely lo cated so that the image of the so urce been obtained on different glossmeters with the
is brought to focus at the plane of this aperture. use of depolished black glass standards than with
Since there is no need to conserve space, this ceramic tile standards. In fact ceramic tile
glossmeter was made large enough to allow for standards produced much larger instrument dis-
high accuracy of measurement of the apertures crepancies for the same specimens. In order to
and the distances between elements. analyze this situation, goniophotometric curves of
fractional reflectance in the region of specular
IV. Glossmeter Variables
reflection were obtained for the pain t specimen , a
A surface lacking the smoothness of polish ed tile standard, and a sand-blasted depolished black
black glass will r eflect som e of the incident light glass standard having about the sam e 60° specular
in directions adjacent to that of specular reflec- gloss (80 on the ASTM scale). These curves are
tion; consequently, some of the reflected ligh t shown in figure 5. For these m easurements the
may fail to reach the instrument receiver, and a goniophotomeLer SOUl'ee aperture was made 0.3°
lower gloss reading mas: b e obtained. It should circular, and the reeeiver aperture was mad e 0.6°
Z
On the other hand, if the receiver aperture were o
>=
too large, very nearly the true gloss will be obtained Cl
<t
a:
with the glass standard, but a much lower reading h !jj ~
IL SANDS LASTED BLA CK
GLASS
I
will be obtained for this specimen if the tile
standard is used for calibrating the instrument. /I .~
the ratio of source aperture to r eceiver aper ture the receiver apertme. On the other hand, th e
affects significantly the measured gloss value. measmed values for th e depolished black glass
standards remain r easonably constant over the
1. Receiver Aperture wide range of ap ertmes employed. This is ascrib-
To illustrate th e magni.tude of the effect of able to the fact that high-gloss tile produces
variation of th e r ec tangular r eceiver aperture in narrow-angle scattering n ear the specular angle,
the plane in which th e sp ecular angle is measured , whereas depolished blac],:: glass produces 'wide-
designa ted ex, and in the plane in th e polar direc- angle scattering.
tion perp endicular to ex, designated {3, two series
100.----.-----------,----------,-----------,
of measnrement were made on plaques of different
gloss. This was done for both depolish ed (sand-
o------<>----~---..()...---<>-----<> G 90
blasted) black glass, and for glazed ceramic tiles.
The results of th ese measm em en ts are illustrated
~ ___ ~ G 80
graphically in figm es 6 and 7. These figures show 80 0-
=i= ---r -g--
T 80
•
the effect of variation in r eceiver aper ture in the
ex and {3 planes, respectively, on the m easm ed ~ T 70
gloss values of tile and depolish ed black glass ij::.: ~
g ~ ~ G 70
(j)
- __-------<0------- ~ ~g
values for th e tiles arc a pronounced function of ~ 60 0- :;---- -<;----T--=i=--- -g
w
cr
100.----.-----------.-----------.----------,
G 90
T 80
cr
w
~
w
::;:
-
o - ___ -o- ___ -o- ___ -CJ- _ _ -O- _ _ _ _<>
T 50
G 50
(j) 40
T 70 (j)
o
~
80 L?
(j)
L?
Z 20
o
<l
W 60
cr
cr
w
~
w
::;:
0L---74~.4~X~8::~::::4;.4;:X;10;=~==::4~.4~X~,2~~~--~
(j)
T30 RECEIVER APERTURE , DEGREES
(j) 40
o
~
L?
F IG U H E 7. Glossm eter Te adings obtained by varying the
di mension of the receiveT a pertw 'e in the {3 plane.
T 20 T he depolished black glass specimens are designa ted (I , fo llowed by t he
nominal gloss value; the glazed ceramic t ile specimens are designated T, followecl
by tbe nominal gloss valne.
20
2. Source Aperture
~ :::
80
entrance window. Figure 9 illustrates the effect
produced on the measured gloss values. It shows
that th e greatest effect is produced on th e glass
If)
<!l
values of the tile plaques, and that the effect on
~ 60 measured gloss values is no t negligible for tile but
a -.() G 60
"'o--=~'i"~.::-:.:-:..:-<>-~.;:.:==::-<>-~::_
«
w -'T 60 is practically so for depolished glass. The data
0: also show that there is no preferred direction of
••--~.~--~~------.----~~ T5 0
0:
W o---~----<>------~---_o G 50
f-
W 100 r----.-----r----.-----~--~----~----~
::;: 40
If)
• • T 40
If)
o
-' 0------0--------<> G 90
<!l
• • T 30
80 e- ~
-<> G 80
.. T 80
20 • • T 20
• T 10
(j)
<!l
Z
--
0- - ~~ ~ G 70
T 70
o
• • TI <l
w
60
O ~------~----~----~~----~----~~
I x 1.3
SOURCE
2xl.3 3 x l.3
APERTUR E , DEGREE S
4 xl.3
cr:
cr:
W
f-
- ..... T 50
W
0------<>---------0 G 50
FIGURE-:'" 8. Glossmetel' readings obtained by varying the ::i'
dimension of the source aperture in the a plane. ~ 40 - T 40
..-----------------....
The depoJisbed black glass specimens are designated 0, followed by the o
-'
nominal gloss value; t he glazed ceramic tile specimen s are designated T, <!l
followed by the nominal gloss value. • ---------------~
... ..... T 30
----------.- ~--
departure from the plane of the receiver entrance whereas the tile plaques show s light decrease in
window. relative gloss with in creasing angle of incidence .
4 . Specular Angle
1oor-,-----,----.-----.----,-----,----.--.
Glossmeters are usually adjusted so that the
image of the source reflected from a plane reflector, 0------<>------,,-----0------0 G 90
such as that of polished opaque glass, falls on the
center of the receiver entran ce window. Suppose,
80
however, that in making this adjustment the angle "
of incidence is disturbed and that it. is found to be
If)
59 0 or 61 0 instead of 60 0 • What effect will this <!l ~.____~.~--~~==~-=~-~~G70
Z 0-- -0- :!: -- - • T 70
error in the specular angle have on the gloss o
<t
readings? It can be shown from the Fresnel equa - ~ 60 -~- --<> G 60
tion (see definition of Fresnel r efl ector) that a • • T 60
cr
departure of l a in specular angle at 60 0 will cause a LU ··----~·~---+·----~.~--_o. T50
f-
change of approximately 5 percent in the specu- LU -<>- ___ -0 G 50
::E 0 - - - - - --0--- ---0-----
larly reflected flux from a polished surface of re-
fractive index 1.53. In the usual method of oper-
If)
~ 40
.J
.~--_4
.~--~-- __ ~--__.
. T40
ation, the instrument is set to read correctly the <!l
Picture a perfectly reflecting, perfectly diffusing where ex is the aperture angle in the plane of
specimen which reflects no light specularly but measurement (the plane in which the specular
which causes a "gloss" reading on the instrument angle (J' is measured), and {3 is the aperture angle
because some of the diffusely reflected light reaches in the plane perpendicular to the plane of measure-
the receiver. What should be the magnitude of ment. The angles ex and {3 are small and are
the correction to be substracted from the instru- measured in radians. Then
ment reading to obtain the true gloss of the speci-
men? Lambel't [7] showed that a perfectly diffus- f = Ba{3 cos (J'dA. (6)
ing specimen reflects light in such a manner that
the luminous intensity in any direction is propor- Thus, of the reemitted luminous flux, the fraction,
tional to the cosine of the angle, ..p, between the F r , entering the receiver aperture is
perpendicular to the surface and the direction of
f a{3 cos (J'
reflection. He also showed that the perfect diffuser Fr F 7r
(7)
would appear equally bright in all directions, that
is, that the luminance is constant.
For the ASTM receiver,
Let us assume that the luminous flux reemitted
by a perfect diffusor having luminance, B, and
area, dA falls normally on the surface of a hemi-
sphere of radius, R (see fig. 11). First we wish to Thus Fr is computed to be 0.0025. This means
compute the total flux, F, falling upon the entire that the perfectly reflecting, perfectly diffusing
hemisphere. The flux, dF, in a direction making specimen although in reality having no specular
an angle ..p with the perpendicular to the diffusor gloss would cause the instrument to read 2.5 if a
is evidently proportional to the projection of dA perfect plane reflector were to read 1,000.
on a plane perpendicular to the direction ..p, or,
dA cos ..p, and to the solid angle, dQ, sub tended at
the diffusor. The proportionality constant is the
luminance, B. Thus