Jitter Basics Advanced PDF
Jitter Basics Advanced PDF
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Agenda, Part 2
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Jitter is caused by many things…
• Causes of Random Jitter
◦ Thermal noise
▪ Generally Gaussian
▪ External radiation sources
▪ Like background conversations…random and ever changing
◦ PLL’s problems
▪ Loop bandwidth (tracking & overshoot)
▪ Deadband (oscillation / hunting)
◦ Transmission Losses
▪ There is no such thing as a perfect conductor
▪ Circuit Bandwidth
▪ Skin Effect Losses
▪ Dielectric Absorption
▪ Dispersion – esp. Optical Fiber
▪ Reflections, Impedance mismatch, Path discontinuities (connectors)
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Types of Jitter
Period Jitter
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Types of Jitter
Period Jitter
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Types of Jitter
Period Jitter
Cycle-to-Cycle Jitter
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Types of Jitter (Visualization)
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Types of Jitter
Period Jitter
Cycle-to-Cycle Jitter
TIE (Time Interval Error)
– Period Jitter is the first-order difference of the TIE Jitter (plus a constant)
Pn = TIEn - TIEn-1 + K
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Types of Jitter (Visualization)
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Advanced Jitter - Decomposition
Rj / Dj Separation
Motivations for Jitter Decomposition
• Speed: Directly measuring error performance at 1e-12 requires directly
observing MANY bits (1e14 or more). This is time consuming!
Extrapolation from a smaller population can be done in seconds instead of
hours.
• Knowledge: Jitter decomposition gives great insight into the root causes of
eye closure and bit errors, and is therefore invaluable for analysis and
debug.
• Flexibility: Already have a scope on your bench? You can do Jitter@BER
measurements without acquiring more, perhaps somewhat specialized
equipment.
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Common Terms
• Random Jitter (RJ)
• Deterministic Jitter (DJ)
◦ Periodic Jitter (PJ)
◦ Sinusoidal Jitter (SJ)
◦ Duty Cycle Distortion (DCD)
◦ Data-Dependent Jitter (DDJ)
◦ Inter-Symbol Interference (ISI)
• Bit Error Rate (BER)
• Total Jitter ~ (TJ or TJ@BER)
• Eye Width @BER
◦ versus Actual or Observed Eye Width
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Random Jitter (RJ)
• Jitter of a random nature is assumed to have a Gaussian distribution
◦ Central Limit Theorem
• Peak-to-Peak = … unbounded!
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Deterministic Jitter (DJ)
• Deterministic jitter has a bounded distribution: the
observed peak-to-peak value will not grow over time
Peak-to-Peak
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Periodic Jitter (PJ, SJ)
• TIE vs. time is a repetitive waveform
Peak-to-Peak
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Duty Cycle Distortion (DCD)
• DCD is the difference between mean TIE for rising edges and mean TIE for falling edges
• Causes
◦ Asymmetrical rise-time vs. fall-time
◦ Non-optimal choice of decision threshold
0.0v
-0.1v
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Data-Dependent Jitter
• DDJ or PDJ – used interchangeably
• ISI – usually considered to be the physical/electrical effect that causes DDJ (and DDN)
• Characterizes how the jitter on each transition is correlated with specific patterns of prior bits
◦ Due to the step response of the system
◦ Due to transmission line effects (e.g. reflections)
24” ISI
No ISI
” ISI
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Bounded Uncorrelated Jitter
• Interconnect and board layout technology is advancing and the
greatest area of focus is in reducing the insertion loss and
Signal-to-Crosstalk ratio.
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Bounded Uncorrelated Jitter (BUJ)
• Definitions of Jitter Properties:
◦ Bounded: Having a PDF (histogram) that does not grow in width as the observation interval increases
◦ NPJ or NP-BUJ: Non-Periodic (Bounded Uncorrelated) Jitter. This is basically random jitter with a bounded PDF
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Jitter Measurement in the Presence of
Crosstalk: Problem Summary
• Crosstalk-caused jitter typically is Bounded Uncorrelated Jitter (BUJ); depending on the spectra this should be separated as
either
• In traditional oscilloscope-based jitter measurement methodology the more spectrally diffuse BUJ components
(i.e. NPJ) are not distinguished from RJ.
◦ The inflated RJ is multiplied by a factor, thereby grossly inflating TJ
Example: TJ = DJ + 14*RJ (at BER = 1e-12)
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Crosstalk Problem Summary (Graphical Version)
Case 1:
RJ + PJ
Spectral separation
works very well
Case 2:
RJ + NPJ
Spectral separation
is no help at all
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Theory: Q-Scale Analysis for Detecting NPJ
• Cumulative Distribution Function
(CDF) for a Gaussian Distribution:
• Q Scale Definition:
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Separation of BUJ and RJ Jitter Components Methodology
• After PJ and DDJ are removed using the spectral
approach, RJ + NPJ is converted to a histogram and then
plotted using the Q Scale
• Straight lines are fitted to the left and right tails to
determine both the RJ sigma and the dual-dirac weight of
the NPJ
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BUJ Separation Example
• Victim: PRBS7, 8 Gbps
• Aggressor: PRBS31, 10 Gbps
Raw View Folded View
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BUJ vs. Legacy Jitter Decomposition Results
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DPOJET Setup for BUJ / NPJ Measurements
• Enable Spectral+BUJ either through the Preferences Setup or the Jitter Map
Default
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DPOJET Results for BUJ / NPJ Measurements
• Until the population requirement has been met, dependent measurements say “< Min # of UI”
• Clock NPJ measurement shows actual progress toward the population requirement
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Jitter Visualization
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Jitter Visualization - Histogram
Shows the measurement values in a data set against the frequency
of occurrence
– Data sets with a large number of measurements provide a good
estimate of the probability density function (pdf) of the set
Useful for identifying bi-modal distributions
Shape of the histogram can identify source of jitter
– Random jitter has a Gaussian shape
– Period jitter is a saddle shape
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Jitter Visualization – Bathtub Plot
Shows the Eye Opening at a Specified BER Level
Note the eye closure of System I vs. System II due to the RJ- RJ is unbounded so the
closure increases as BER level increases
System I has .053UI of RJ with no PJ
System II has .018UI of RJ and .14UI of PJ @ 5 and 10Mhz
System I System I
System II System II
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Jitter Visualization – Time Trend
Histogram does not have any context of time
Time Trend can reveal repeating patterns that may indicate
modulation on the signal
For example 5 cycle of SSC @ 30khz as shown below
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Jitter Visualization – Spectral Plot
Frequency domain view of the signal content
Deterministic components show as lines above the noise
DDJ is at frequencies of the bit rate / pattern length (example
below is 5Gb/s PRBS7) Note the spikes at intervals of 40Mhz in
the plot.
Constant Clock CR was used
DDJ
SSC
RJ
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TIE Jitter needs a Reference Clock
• The process of identifying the reference clock is called Clock Recovery.
• There are several ways to define the reference clock:
◦ Constant Clock with Minimum Mean Squared Error
▪ This is the mathematically “ideal” clock
▪ But, only applicable when post-processing a finite-length waveform
▪ Best for showing very-low-frequency effects
▪ Also shows very-low-frequency effects of scope’s timebase
◦ Phase Locked Loop (e.g. Golden PLL)
▪ Tracks low-frequency jitter (e.g. clock drift)
▪ Models “real world” clock recovery circuits very well
◦ Explicit Clock
▪ The clock is not recovered, but is directly probed
◦ Explicit Clock (Subrate)
▪ The clock is directly probed, but must be multiplied up by some integral factor
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Importance of Clock Recovery
• From spec, “The jitter measurement device shall comply with the JTF”.
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JTF vs PLL Loop Bandwidth
• Configuring the correct PLL settings is key to correct measurements
• Most standards have a reference/defined CR setup
◦ For example, USB 3.0 uses a Type II with JTF of 4.9Mhz
• Type I PLL
◦ Type I PLL has 20dB of roll off per decade
◦ JTF and PLL Loop Bandwidth are Equal
• Type 2 PLL
◦ Type II PLL has 40dB of roll off per decade
◦ JTF and PLL Loop Bandwidth are not Equal
▪ For example, USB 3.0 uses a Type 2 PLL with a JTF of 4.9Mhz. The corresponding loop bandwidth is
10.126 Mhz
▪ Be careful not to confuse or swap Loop Bandwidth with JTF!
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PLL Loop Bandwidth vs. Jitter Transfer Function (JTF)
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Results depend on CR Settings USB 3.0 Example
• The example below shows the effects of using a JTF set to 4.9Mhz vs. Loop Bandwidth set to 4.9Mhz for
a Type II PLL
Note: More
LF Attenuation
for case where
JTF set to
4.9Mhz and
lower TJ
Constant
Type I
Clock
20 dB roll
All Jitter
off per
Passes
decade @
Through
4.9Mhz
Type II Type II
40 dB roll 40 dB roll off
off per per decade
decade @ @ 2.3Mhz
4.9Mhz (JTF to
illustrate JTF
! = Loop
Bandwidth
Type I Type II
20 dB roll off per 40 dB roll off per decade @
decade @ 4.9Mhz 2.3Mhz (JTF to illustrate
JTF ! = Loop Bandwidth)
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JTF Filtering Effects based on different PLL bandwidths
f3dB = 30 kHz f3dB = 300 kHz f3dB = 3 MHz
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How do I know my JTF is compliant?
• Using DPOJET Transfer Function Plot the JTF can be
validated (SAS Example)
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Jitter for Busy People
Hints, Tips and Common Errors
Using the Jitter Analysis Tools
• Issues manifested in different layers of the protocol stack
◦ Crosstalk, jitter, reflections, skew
◦ Disparity, encoding or CRC errors
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Hints for Successful Jitter Analysis
• Verify that signal integrity (i.e. probing) is reasonable
◦ Reflections due to mid-bus probing can cause “duplicate” edges
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More Hints for Successful Jitter Analysis
• Clock Recovery has a great deal of influence on jitter results. Think about what
you’re trying to accomplish.
◦ Constant-Clock is the most “unbiased”
▪ Often best if you’re trying to see very-low-frequency effects
▪ But it can also show wander in the scope’s timebase
◦ PLL recovery can model what a real data receiver will see
▪ It can track and remove low-frequency effects, allowing you to “see through” to the jitter that
really contributes to eye closure
◦ Explicit-Clock is appropriate if your design uses a forwarded clock
▪ Make sure your probes are deskewed
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Hints for looking at Spread-Spectrum Clock
• If you don’t want to see the SSC effects, use TIE and PLL clock recovery with a bandwidth of at
least 1 MHz. A Type-II (2nd-order) PLL will track out the SSC more effectively than a Type-I PLL.
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Fast Isolation of Jitter Issues
Deep memory capture
– Long records needed for low frequency
events (SSC, periodic jitter, low speed clocks)
– Frequency window related to time capture
– 1 SSC cycle (33kHz) => Need 30us time record
Debugging Jitter
– Knowledge of jitter types and sources
aids in debug
– Common jitter sources
– Power supply coupling
– PLL (tracking or overshoot)
– Limited channel bandwidth and reflections (ISI)
– Driver imbalance (Rise/fall time asymmetry)
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Key Points
• In order to define edges within real signals, we must first identify one or more reference levels.
◦ Reference levels have a great deal of influence over jitter measurements.
◦ Improper choice of reference levels can cause clock recovery problems
• Different type of jitter measurement (TIE, Period, Cy-Cy) are mathematically related but
◦ Emphasize (or hide) different parts of the frequency spectrum
◦ Can distort modulation shapes due to integration or differentiation
• For TIE measurements, clock recovery is used to establish “ideal” clock locations. Choice of clock
recovery method and its parameters can greatly influence how jitter is revealed.
+ + + + + + + +
Pre-Emphasis
Equalizer
- - - - - - - -
Transmitter Receiver
Channel
• Why not use ONLY BERTs for Serial Data Link Analysis?
◦ Difficult to model/emulate equalizer
◦ Measurements could take a very long time
◦ Instruments are more expensive and less flexible
◦ Less analysis of the root causes of link impairments
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Jitter and Noise Decomposition
• Jitter and Noise Decomposition provide deep insight into BER
Full Jitter Analysis vs. Mask Testing
• Jitter separation analysis is able to extrapolate total jitter or eye closure at various Bit Error Rates
at a specific voltage threshold but it doesn’t reveal the statistical eye closure at any
other voltage.
• Conventional mask testing considers both time and voltage but cannot extrapolate eye
closure at low BER.
• The methodology is analogous to current jitter analysis, but is performed across both dimensions of
the eye
◦ Jitter and noise are separated into components (Random, Periodic, Data-Dependent,…)
◦ The components are reassembled into a model that allows accurate extrapolation.
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Timing-Induced Jitter
• Since jitter is defined as a shift in an edge’s time relative to its expected position, it is
easy to think of jitter as being caused by horizontal (chronological) displacement.
• Note that the displaced edge (green) has not moved vertically in this example.
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Noise-Induced Jitter
• Consider a burst of voltage noise (right) that displaces a waveform vertically.
◦ In this case, the displaced edge (green) has not moved horizontally.
• The jitter as measured at the chosen reference voltage is identical in these cases!
◦ So, why should we care?
• Two fundamentally different effects have caused the same amount of jitter, and either one will close the eye
by the same amount at this reference voltage, but:
◦ They will have different effects at other voltages where the slew rate is different.
◦ Their differences give insight to root cause
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Noise-to-Jitter (AM-to-PM) Conversion
• Since waveform transitions are never instantaneous, the slope (slew rate) of the edge acts as a gain
constant that controls how effectively noise is converted to “observed jitter”.
• An analogous effect occurs when voltage is measured at the center of the bit interval: If the slew rate is
not zero, then jitter will cause PM-to-AM conversion and appear as noise!
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Horizontal and Vertical Components of RJ
• We can think of RJ as being composed of two components.
◦ Horizontally induced: RJ(h)
◦ Vertically induced: RJ(v)
• Since these two components are uncorrelated with each other, they add in the
RSS sense:
RJ = RJ(h)2 + RJ(v)2
• Similarly, PJ can be decomposed into PJ(h) and PJ(v) based on root cause
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Horizontal and Vertical Components of RN
• We measure noise at a reference point in the bit interval (usually 50%)
• If slew rate isn’t zero, jitter (horizontal displacement) causes observed noise
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Noise to Jitter and Jitter to Noise Conversion
We can separate the noise
contribution of jitter for diagnostic
Non-impaired bit
purposes by breaking RJ into edge
RJ(v) and RJ(h)
– and Noise
(note that both of Jitter and Noise
result in jitter on edge)
• Average many pattern repeats together. Everything that is uncorrelated with the
pattern averages out. What remains is called the ‘correlated waveform’.
◦ This waveform fully characterizes DDJ, DCD, DDN, ISI – all data dependent effects
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Construction of the BER Eye – Part 2
• The correlated waveform can be snipped into individual bits and overlaid
to form an eye diagram, using the recovered clock as the alignment
reference. This forms the ‘correlated eye’:
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Construction of the BER Eye – Part 3
• Spectral jitter separation is used to find PDFs of the random and periodic jitter.
• The RJ and PJ PDFs are convolved to find the uncorrelated jitter PDF (red)
• A similar analysis of the noise yields the uncorrelated noise PDF (blue)
◦ Care must be taken to properly account for AM-to-PM and PM-to-AM conversion in these
steps; otherwise some noise or jitter would be ‘double-counted’.
• Two-dimensional convolution is used to create a joint PDF of uncorrelated jitter
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Construction of the BER Eye – Part 4
• The jitter/noise set is convolved (two-dimensionally) with the correlated eye for the ‘1’ bits to get the
overall (correlated + uncorrelated) PDF for ‘1’ bits
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Construction of the BER Eye – Part 5
• The ‘1’ bit PDF is integrated vertically (from bottom to top) to get the ‘1’
bit CDF (Cumulative Distribution Function)
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Construction of the BER Eye – Part 6
• A similar treatment for ‘0’ bits yields the ‘0’ bit CDF
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Construction of the BER Eye – Conclusion
Color-Graded View
3D View
• The ‘1’ bit and ‘0’ bit CDFs are added to get the overall “BER Eye”
◦ A particular BER contour can be found in the 3D version of this plot by slicing it
horizontally, or by extracting a specific color on either version
◦ Since this ‘eye’ looks rather unconventional, DPOJET extracts the BER contours and
then overlays them with the rendered eye.
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Benefits of Noise Analysis
• Jitter combined with noise analysis enables us to quickly
determine the eye opening at a target bit ratio
• BER contour plots provide a quick multi-dimensional view
of the progression of eye closure as bit error rate increases
• But, that is not the complete story. Understanding and
decomposing the effects conversion of jitter to noise and
vice versa provides insight into the root cause of eye
closure
What Scope Platform for Jitter and Noise Analysis?
Real-time Scopes
The most versatile tool for
all areas of high-speed
System
digital and analog
applications
Single shot acquisition ideal for
post processing
Sampling Scopes Most advanced trigger system to
identify unique events
For applications that Most flexible software-based
Add-In
place top priority on clock recovery
Debugging and Troubleshooting
Cards waveform precision
Over 60dB of dynamic
range, ideal for PAM
High BW to 100Ghz
Repetitive waveforms
Very Low Jitter Noise Floor
Chip
• Data Visualization
◦ Histogram, Time Trend, Data Array, Spectrum, Phase Noise, Transfer Curve, Eye Diagram, Bathtub, Waveform
Database for Mask Hit Violations, Bathtub, Composite Histogram
◦ NEW: Composite Noise Histogram, Noise Bathtub, BER Eye Contour, PDF Eye, BER Eye, Correlated Eye
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Visualization of Eye Closure
• Noise Bathtub shows the vertical eye closure
• Traditional bathtub shows the horizontal eye closure
Jitter and Noise Distribution
• View the distribution of the individual jitter and noise components
Multiple Views of Eye Diagram
• Acquired Eye with BER Contours
• Correlated Eye
◦ Show the data dependent eye with all uncorrelated
effects removed
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Correlated Eye
• Correlated Eye illustrating the impact of equalization on an 8Gb/s PRBS7 signal
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BER Eye Contour Plot
Please visit www.tek.com/jitter for more information and white papers on jitter
and noise analysis