First Time, Every Time –

Practical Tips for Phase-

Locked Loop Design
Dennis Fischette
Email: [email protected]
Website: http://www.delroy.com

Copyright, Dennis Fischette, 1

2007
 Outline
• Introduction
• Basic Feedback Loop Theory
• Jitter and Phase Noise
• Common Circuit Implementations
• Circuit Verification
• Design for Test

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2007
Introduction

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2007
 How Are PLL’s Used?
• Frequency Synthesis (e.g. generating a 1 GHz clock from a
100 MHz reference in a CPU)
• Skew Cancellation (e.g. phase-aligning an internal clock to
the I/O clock) (May use a DLL instead)
• Extracting a clock from a random data stream (e.g. serial-
link receiver)
• Reference Clean-Up (e.g. low-pass filter source-synchronous
clock in high-speed I/O)

• Frequency Synthesis is the focus of this course.

• Design Priority? Frequency and/or phase accuracy?

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2007
 What is a PLL?
• Negative feedback control system where fout tracks fin and rising edges of
input clock align to rising edges of output clock
• Mathematical model of frequency synthesizer

φin φout
( ) ( )
Phase-
Vin (t ) ∝ sin 2π fin t Locked Vout (t ) ∝ sin 2π Nf in t
Loop

• Phase = ∫ frequency
1 d φ (t )
φ (t ) = 2π ∫ f (t ) dt ↔ f (t ) =
2π dt

• When phase-locked, φout = Nφin → f out = Nf in

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2007
 Charge-Pump PLL Block Diagram

GoFaster

RefClk Phase- Charge Vctl Level-

ClkOut
Freq VCO
Pump VCO Shifter
Detector
GoSlower
C1 C2

Feedback
FbClk Div

• Sampled-system (phase-error is input variable)

• Phase error is corrected by changing frequency (φ(t) = ∫ f(t) dt)
• Resistor provides means to separate correction of frequency error
from correction of phase error
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2007
 Components in a Nutshell
• Phase-Frequency Detector (PFD): outputs digital pulse
whose width is proportional to sampled phase error
• Charge Pump (CP): converts digital error pulse to analog
error current
• Loop Filter (LPF): integrates (and low-pass filters in
continuous time) the error current to generate VCO control voltage
• VCO: low-swing oscillator with frequency proportional to control
voltage
• Level Shifter (LS): amplifies VCO levels to full-swing

• Feedback Divider (FBDIV): divides VCO clock to generate

FBCLK clock for phase comparison w/reference

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2007
PLL Feedback Loop Theory

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 What Does PLL Bandwidth Mean?
• PLL acts as a low-pass filter with respect to the reference
modulation. High-frequency reference jitter is rejected
• Low-frequency reference modulation (e.g., spread-spectrum
clocking) is passed to the VCO clock
• PLL acts as a high-pass filter with respect to VCO jitter
• “Bandwidth” is the modulation frequency at which the PLL
begins to lose lock with the changing reference (-3dB)

Φout lower BW
Φout
BW
Φref BW
rejects Φvco higher BW
ref noise
rejects
VCO noise
log(frequency) log(frequency)

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2007
Closed-Loop PLL Transfer Function
• Transfer function describes how PLL responds to “excess”
reference phase. i.e. RefClk phase modulation
• Analyze PLL feedback in frequency-domain
– Phase is state variable, not frequency
– “s” is the reference modulation frequency, not reference
oscillation frequency
– Assumes continuous-time (not sampled) behavior
• H(s) = φfb/φref = G(s)/(1+G(s)) Æclosed-loop gain
• G(s) = (Kvco/s)IcpF(s)*e-sTd/M Æ open-loop gain
– where φerr
• Kvco = VCO gain in Hz/V
• Icp = charge pump current in Amps
• F(s) = loop filter transfer function in Volt/Amp
• M = feedback divisor
• Td = delay in feedback-loop (e.g. FBDIV, Tpfd/2)

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2007
PLL Components in Frequency
Domain
(1+s*rc1)
Vctl(s) / Icp(s) =
s*( (c1+c2)+(s*rc1*c2)
Charge
Pump

φref φerr Vctl φvco

sub Icp/2pi Kvco/s

PFD VCO
C1 C2

φfb
1/N

FBDIV

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2007
 Closed-loop PLL Transfer Function
• H(s) = ωn2 (1+ s/ωz) / (s2+2sζωn + ωn2)
– where
• ωn = undamped natural frequency (rad/s)
• ωz = stabilizing zero = 1 /RC1 (rad/s)
• ζ = damping factor
– 2nd-order (two poles p1,p2 and one zero)
– 2nd-order ignores C2 cap and feedback delays

• If ζ< 1, complex poles lead to damped oscillation

– Real Æ exponential decay(ζωn) , Imag Æ oscillation (ωn)

• If ζ > 1, z and p1 cancel: BW(-3dB) ~ 2sζωn

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2007
 What is a “Zero”?
• The “Zero” of the closed-loop transfer function is
the frequency in radians/s where the gain of the
integral and proportional paths are equal.

• Classic loop: ωz = 1 /RC1 (rad/s)

• Concept can be applied to loop filters that do not

contain a resistor.

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2007
 Open-Loop Transfer Function
• log(Gain) vs. log(Modulation Frequency)
• 2 poles @ origin, 1 zero @ wz, 1 pole @wp

-40dB/dec
Open-Loop Gain (dB)

-20dB/dec
log(wmod)

wz wn wc wp

-40dB/dec
wz = 1/RC1
wp = 1/RC2
wc = crossover frequency
wn = natural frequency

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2007
 Bandwidth
• Undamped Natural Frequency:
– ωn = sqrt(Kvco*Icp/( M*C1)) in rad/sec
– where
• Kvco = VCO gain in Hz/V
• Icp = charge pump current in Amps
• M = feedback divisor
• C1 = large LPF capacitor

• For stability: ωn/2π < ~1/15 reference frequency

• Typical value: 500 kHz < ωn/2π < 10MHz

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2007
 Stability, Damping, and Phase Margin
• Damping Factor: ζ = Rlpf * C1 * ωn /2
– Dimensionless, Usually ~0.45 < ζ < ~2
– Lower end of range for low period jitter
– Higher end of range for accurate ref phase tracking
– Rlpf provides means to set stability independent of bandwidth

• φm (degrees) = (180/π)*(atan(ωc*RC1)–atan(ωc*RC2)-ωc*Tdly)
– ωc == crossover frequency
• frequency where open-loop gain G(s) = 0dB
– For stability: 1/RC1 (zero) < ωc < 1/RC2 (parasitic pole)
– Typical Range: 1.2*ωn < ωc < 2.5*ωn

• Phase margin degradation due to PFD phase error sampling

– -φ = ωc*Tref / 2
– z-domain analysis is more accurate

• Phase margin (φm) ~ 100 * ζ (for ζ < 0.5)

– Usually 45° < PM < 70°

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2007
 Loop Dynamics vs. OSR
• Assumes continuous-time model. Damping = 0.8, wn = 3.7MHz
• φm=62° , BW(-3dB)=8.8MHz, Pk=2.1dB (w/no delay)
OSR Phase Peaking(dB) BW(-3dB)
(wn(Hz)/f(ref) Margin(°) (MHz)
4.5 -4 26 10.6
6.7 18 11 12.6
7.6 24 8.0 13.1
8.9 29 6.0 13.4
10.7 35 4.6 13.5
13.3 40 3.6 13.1
17.8 46 3.0 12.1
26.7 51 2.6 10.9
53.4 56 2.3 9.1
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2007
 Aliasing in a Sampled Loop
• Sampling nature of PFD Æ frequency-domain aliasing
– Can’t low-pass filter ref noise before PFD sampling – unlike A/D’s
– Need z-domain analysis for accurate PLL modeling – analogous to
sample-and-hold
• Phase of modulation with respect to ref affects aliasing
– e.g. ref modulation at ½ * fref. No jitter if sampled at 0°,180°, max at
90°,270°
• Modulation at frequencies > Nyquist (fref/2) appears at other frequencies
– e.g. fref=100MHz Æ ref modulation at 99MHz looks just like 1MHz ref
modulation to the PLL
– continuous-time model says that PLL should reject more 99MHz noise
than 1 MHz noise
fREFCLK
Φout fBW

Φin

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2007
PLL Response vs. Damping

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2007
 Phase Tracking vs. Damping
• Phase Tracking vs. Damping
• Closed-loop Transfer Function (φfb/φref)
• Phase Tracking Æ think “accumulated” period jitter or phase
error
• Peaking at low and high damping factors Æ bad
• Peaking at high damping due to smoothing capacitor pole
(1/RC2) and/or under-sampling (Gardner)
• Peaking very sensitive to (1/RC2) at high R
• Min peaking w/damping ~ 1.0 - 1.5 if C2 ~ 5% * C1
• Typical peaking: 1 – 3 dB (CPU high-end, IO low-end)
• For lower peaking, damping > 2 and C2 small

• Simulation Condition (following slides): C2 = 6.7% * C1

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Closed-loop Transfer Function

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 Phase Response vs. Damping
(time-domain)
• Transient Simulation Conditions (behavioral model):
– step reference phase by 2π radians. Observe phase overshoot
– C2 = 10% * C1 (high end of C2 range requires lower ζ)

• Less ringing and overshoot as ζ Æ 1

• Severe under-damping Æ slow ringing and overshoot
• Severe over-damping Æ fast ringing and overshoot
• Ringing at high damping due to smoothing pole (large RC2)
and/or low over-sampling

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Frequency Response vs. Damping

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Jitter and Phase Noise

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2007
 Phase Noise and Timing Jitter
• Phase Noise (frequency domain) ↔ Jitter (time domain)
• Noise is frequency-dependent with random & deterministic
components

• VCO and loop filter resistor often largest sources of noise

PLL Output Frequency Domain

(
Vout (t ) ∝ sin 2π fout t + φn (t ) )
vs.
φ phase fout fout
noise
jitter Time Domain

vs.
time
Copyright, Dennis Fischette, 29
2007
 Spectral Analysis of VCO Clock
• 5GHz VCO clock with 200MHz reference clock
Relative Power (dB)
0

-20
reference -54.8dBc
spur
-40

0.2GHz
-60

-80
4.7 5.0 5.3
Frequency (GHz)
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2007
 Timing Jitter: Eye Diagram
• Example of timing jitter in serial link.
• Overlay scope traces of several bits on top of each other

timing jitter

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2007
 Jitter Definitions
• Phase Jitter (sec)
– deviation of VCO output edges from ideal placement in time.
– specified over a time interval or frequency range.
– important for I/O apps (e.g. PCI-Express < ±1.5ps RMS)
– measure with spectrum analyzer or scope with jitter package
• Period Jitter (sec)
– deviation of VCO period from ideal period
– derivative of Phase Jitter with respect to time
– peak-to-peak period jitter (Jpp) is max VCO period – min VCO period
– most important for CPU-like apps
– e.g. 10-20ps for 2GHz CPU clock
– easily measured on scope – self-triggered infinite-persistence or jitter
package
• Cycle-to-Cycle Jitter (sec)
– change in VCO period from cycle N to cycle N+1
– derivative of Period Jitter with respect to time
– not important for CPU-like apps

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2007
 Jitter Definitions
• TIE (sec)
– time difference between total of N-consecutive actual VCO cycles and
N ideal cycles
– easily measured on oscilloscope with jitter package – self-triggered
measurement
– TIE – “time-interval error”

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2007
 Noise Sources
• Major internal PLL Noise Sources
– charge-pump (flicker (1/f) and thermal)
– loop filter resistor (thermal) – very significant
– VCO (mostly thermal) - significant
– VCO bias (flicker and thermal) – most significant
– Flicker Noise
• Vn2 (V2/Hz) = Kf / (Cox*W*L* f)
• Kf ~ 10e-24
– Thermal Noise
• In2 (Amp2/Hz) = 4kT*gm*γ
γ ~ 2/3 for older CMOS technologies, much higher in deep
submicron
• PLL feedback loop
– Low-pass filters ref and charge-pump noise
– Band-pass filters loop-filter resistor noise
– High-pass filters VCO noise (1-H(s))

Copyright, Dennis Fischette, 34

2007
 Output Phase Noise
• Measured vs. offset frequency (f) from carrier

• Spectral Density of Phase Fluctuations (Sφ(f))

– Sφ(f)= 2L(f)
• L(f) is Single-Sideband Phase Noise
– Analogous to Power(sideband)/Power(carrier)
– Sφ (f) is specified in a 1Hz band

• Sφ(f) ~ 1 / f2 (thermal region, mid-to-high f) (open-loop)

• Sφ(f) ~ 1 / f3 (flicker region, low f) (open-loop)

• Flicker noise mostly filtered by high BW PLL

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2007
 Single-Sideband Phase Noise Plot
• Open-loop VCO

1 /f^3
SSB Phase Noise (dBc/Hz)

flic k e r
re g io n
1 /f c o rn e r
fre q u e n c y

th e rm a 1 /f^2
l re g io n

lo g (o ffs e t fre q u e n c y)

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2007
 Open-loop Æ Closed-Loop Phase
Noise
• Goal: determine how much open-loop VCO phase noise remains
after applying PLL feedback loop
• Method: multiply VCO’s open-loop single-sideband phase noise by
PLL’s “error function” (1- H(s)) where H(s) is closed-loop transfer
function Output Phase / Open-loop VCO Phase

closed-loop jitter peaking

region

Error Function = 1- H(s)

1/f^2

Modulation Frequency

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2007
 Converting Phase Noise to Jitter
• RMS Phase Jitter

∫ Sφ (f )df
1
J phase =
2πfvco

• Usually dominated by VCO bias and loop filter

• Easily measured using spectrum analyzer – low noise floor
• Ideal reference is measurement trigger
• Integration range depends on application (e.g., PCIe: fmin=
1.5MHz)
– usually stop integration at f0/2 to avoid capturing carrier
and harmonics
– e.g., 5ps from 1MHz to f0/2 with BW=15MHz and
2.5GHz clock (SOI bad for phase jitter)

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2007
 Converting Phase Noise to Jitter
• RMS Period Jitter
2 ⎛ πf ⎞
8∫ Sφ (f ) sin ⎜⎜
1
J period = ⎟⎟df
2πfvco ⎝ fvco ⎠

• Spectrum analyzer can’t do this integral. Post-process

phase noise
– e.g., Jper~300fs w/2.5GHz clock
• Usually dominated by VCO bias and VCO?
• Spectrum analyzer usually has lower noise floor than
scope (scope floor ~800fs @ 40Gsample/sec)

Copyright, Dennis Fischette, 39

2007
 Converting Phase Noise to TIE
• Time-Interval Error (TIE)

8∫ Sφ ( f )sin 2 (πfτ )df

1
J TIE =
2πf vco

• “Tau” is time interval over which phase drift is measured

• Spectrum analyzer can’t do this integral. Post-process
phase noise

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2007
VCO Noise Tracking: Phase Error
vs. Bandwidth
• For random VCO noise (i.e. thermal):
• lower BW Æ more accumulated phase error
• Why? More jittery VCO cycles before feedback can
correct:

ωvco
φerror ∝ J RMS , period ⋅
ζω n

where Jrms = VCO RMS period jitter

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2007
 PLL Circuits
• Phase-Frequency Detector
• Charge-Pump
• Loop Filter
• Voltage-Controlled Oscillator
• Level-Shifter
• Feedback Divider
• Voltage Regulator
• Miscellaneous

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2007
Phase-Frequency
Detector(PFD)

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2007
 PFD Block Diagram
• Edge-triggered - input duty-cycle doesn’t matter - frequency
correction takes precedence over phase correction – no harmonic
locking – 3 state operation
• Output pulse-widths proportional to phase error
• Delay to remove “dead-zone”
• Symmetric NAND used to balance equalize delays from both inputs

Vdd D Q G o F a s te r

DFF
Ref
CK
R
DLY

R
Vdd D Q
G o S lo w e r
DFF
FB
CK

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2007
 Example: PFD

Ref
Cycle Slip

FbClk

GoFaster

GoSlower

Vctl

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2007
 Frequency Lock Detector
• Sample PFD GoFaster signal with rising REFCLK
• Sample PFD GoSlower signal with rising FBCLK
• If either sampled signal is TRUE, then PFD detected two
consecutive REFCLK’s or FBCLK’s Æ cycle slip and loss of frequency
lock
• May apply “sticky bit” to result to capture temporary loss of lock
PFD

Vdd GoFaster Cycle Slip Slow

D Q D Q
DFF DFF
Ref
CK CK
R
DLY

R
Vdd D Q D Q
GoSlower Cycle Slip Fast
DFF DFF
FB
CK CK

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2007
Charge Pump(CP)

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2007
 Charge-Pump Wish List
• Equal UP/DOWN currents over entire control voltage range -
reduce static phase error
• Minimize mismatch caused by finite current sources gds and
Vt mismatches
– ∆Vt ~ 1 / sqrt(W*L)
– long L in current sources for higher gds
– Stacked (a.k.a common) gates in Isources help w/mismatch
– use replica-bias CP and feedback amplifier to balance Iup/Idown
– beware of mismatch between two CP cells
– increase in CP’s phase noise due to finite BW of this feedback?

• Minimal coupling to control voltage during switching and

leakage when off - reduce jitter and phase drift
• Insensitive to power-supply noise and process variations –
loop stability

Copyright, Dennis Fischette, 48

2007
 Charge-Pump Wish List
• Minimize coupling caused by “clock feedthrough” (Cgd) and
charge-injection
– ½ sized dummy switches to reduce charge-injection
• Qinj ~ ½ *Cox*(W*L)*(Vgs-Vt)
– Small (and/or limited swing) switches to reduce clock
feedthrough – watch for leakage with limited-swing
– Balance timing and slew rates of all inputs

• Minimize PFD pulsewidth to minimize phase noise while still

avoiding dead-zone (< 100 ps possible in 65nm)

• Typical Icp: 5µA (mismatch)< Icp < 50 µA (∆Vctl)

Copyright, Dennis Fischette, 49

2007
 Static Phase Error and CP
Up/Down Mismatches
• Static Phase Error: in lock, net UP and DOWN currents must
integrate to zero
– If UP current is 2× larger, then DOWN current source must
be on 2× as long to compensate
– Feedback clock must lead reference for DOWN to be on
longer
– Terr = Tdn - Tup = Treset * (Iup/Idn – 1)
• Narrow reset pulse Æ generally lower static error
• Typical static phase error < 100ps
• Static phase error Æ period jitter @ Tref (reference spurs)

Copyright, Dennis Fischette, 50

2007
 Charge Pump: const I with amp
• Amp keeps Vds of current sources constant (Young ’92), sinking
“waste” current when UP, DOWN off
• Replica-bias ckt and additional amp used to set bias Vbp, setting
Iup=Idn. Start-up needed for Vbp bias (not shown)

Vbp
A d d c a p to V irtV c tl fo r v o lt. s ta b ility

Up U p_n Up

V c tl +
V irtV c tl
-
D own D own
D own_n

Vbn
A m p Ib ia s s h o u ld tra c k Ic p

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2007
 Bandgap-based Ibias
• Ib ~ Vref / R
• Vref generated from PVT-insensitive bandgap reference
• Con: feedback loop may oscillate
– capacitor added to improve stability
– resistor in series w/cap provides stabilizing zero (not shown)
• Pro: VDD-independent, mostly Temp independent
• Pro: Icp*Rlpf = constant Æ less PVT-sensitive loop dynamics

Vref -
m2
+ m1

Vfb Ibias

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2007
Low-Pass Loop Filter (LPF)

Vctl

C1 C2

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2007
 Loop Filter Basics
• Simplest and most commonly-used loop filter is continuous-time,
passive filter

• Filters high-frequency phase error information from PFD/CP while

integrating low-frequency error info onto C1 cap to set avg. freq -
affects bandwidth

• Provides a means of isolating phase correction from frequency

correction – Icp*Rlpf – affects stability

• Filters noise spurs caused by sampling – C2 cap – adds parasitic

pole at 1/RC2

• Other options include digital(FSM-based) filter, sampled-time filter

(see Maneatis, Maxim) , and continuous-time active filter

• Differential designs can reduce sensitivity to VDD and substrate

noise and often area by 2×. Requires common-mode feedback loop.

Copyright, Dennis Fischette, 54

2007
 Passive, Continuous-Time Loop Filter
• R may be programmable
– Avoid gate leakage and noise coupling from switches and parasitic
resistance at extreme control voltages

• Leakage in MOSFET caps may be a HUGE problem

– Exponential I vs. V: Ileak~Vgate4 (approximate)
– Weak temperature dependence
– Ileak vs. tox Æ ~2-3× per Angström
– Use metal caps (10× larger) or thick-gate oxide caps to minimize
leakage
– If MOSFET caps, accumulation mode preferred – flatter Cgate vs. V

• Typical values:
– 0.5kΩ < Rlpf < 20kΩ
– 5pF < C1 < 200 pF
– 2% (low phase error) < C2/C1 < 10% (low period jitter)
– Smaller caps are becoming more common w/ higher reference
frequencies and metal cap usage

Copyright, Dennis Fischette, 55

2007
Depletion-Mode MOSFET Cgate vs. V
inversion

Simulated C gate
Vgate

0.0
depletion
V co

0.5
nt

1.0 1.3 1.0

ro
l

V )
(V

V gate (
)

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2007
 Feed-Forward Zero: eliminate R
• Resistor in classic LPF provides an instantaneous IR on the control voltage
causing the VCO V2I to generate a current bump on the oscillator input
• Alternative: eliminate R Æ Add parallel CP path into V2I.
– requires parasitic cap (C2 not shown) to the proportional loop to reduce
reference spurs
– see Maneatis ’96 for continuous time or ’03 for sampled loop filter
• Reduces LPF phase noise? Commonly used in low phase-noise I/O apps.

Vintegral
CP1
V2I
IVCO
Vproportional
CP2
“Res” RO
Virtual Vctl
Copyright, Dennis Fischette, 57
2007
Dual-Loop Charge-Pump Mismatch
• Iup/Idown ratios in proportional and integral charge-pumps
are partly uncorrelated due to random device mismatch

• Net charge from integral CP must integrate to zero for stable

frequency – determines static phase error alone

• Net charge from proportional CP causes frequency kick

every PFD cycle (Kv*I*R) caused by static error and its own
Iup/Idown mismatch

• Upshot: control voltage adjusts up or down from ideal level

to achieve correct average frequency but fVCO varies within
PFD cycle (phase wander)– need well-matched CP’s to avoid
this effect

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2007
 Dual-Loop Charge-Pump Mismatch
• Static error in integral charge-pump Æperiod jitter and
phase wander

R e f C lk

F b C lk

G o F a s te r

G o S lo w e r

Id e a l V c tl A c tu a l V c tl

Copyright, Dennis Fischette, 59

2007
 Sample-Reset Loop Filters
• Single charge-pump for Iint and Iprop – Zero ~ sqrt(C1/C2)
– e.g. Maneatis (JSSC ’03)
• Two charge-pumps to allow for reset (discharge) delay
• Spreads phase correction over Tref – can reduce ref spurs
• Mismatch between CP’s Æ significant VCO phase modulation at fref/2

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2007
Voltage-Controlled Oscillator
(VCO)

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2007
 Voltage-Controlled Oscillator
• VCO usually consists of two parts
– bias generator (e.g. Vctl to Ictl)
– voltage or current controlled ring oscillator (RO)
• Typical VCO gain: Kvco ~ 1-5× * fmax. May vary w/PVT by > 2×
– need frequency range: >2× to allow for PVT
– desire constant gain over most of usable control voltage range
Usable Vctl
Range
VCO frequency

Control Voltage

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2007
 VCO w/Feed-Forward Path
• RO delay stage may receive inputs from multiple prior stages (e.g. N-1 and
N-2)
– allows N-stage VCO to oscillate at speeds otherwise attainable only by
reducing # of stages
– easier to implement with differential signals
– extra care must be taken to ensure that RO will safely oscillate

+ + + + + + + +
S S S S
- - - -
+ - + - + - + -
F F F F
- - - -

S= slow path F = fast path

Copyright, Dennis Fischette, 63

2007
 Voltage-Controlled Oscillator
• Barkhausen criteria for sustained oscillation
– loop gain must exceed 1, loop phase must equal 360°
– more delay stages Æ easier to initiate oscillation
– gain(DC) > 2 for 3 stages, gain > sqrt(2) for 4 stages
• Quadrature clocks (0°, 90°, 180°, 270°)
– requires 4 delay stages or
– divide “differential” VCO outputs by 2, then delay one set of
divided outputs by ½ Tvco to generate quadratures. Allows any
# of delay stages

div_0 div_90
D Q D Q
DFF DFF
vco div_270
CK QB CK QB
div_180

vco_x

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2007
 PLL Suppression of VCO Noise
• PLL acts like a high-pass filter in allowing VCO noise to reach
output

• Need noise-immune VCO to minimize jitter

– Feedback loop cannot react quickly.
– Tradeoff between tuning range & noise sensitivity

• Power-supply noise is usually largest source of VCO noise

• VCO power-supply sensitivity should be at least 10-20× less

than inverter

Copyright, Dennis Fischette, 65

2007
 PLL Suppression of VCO Noise

• High power, fast edges, large swing Æ low random jitter

– Jrms ~sqrt(kT/2NC) / (fvco*Vswing)

• where N=#of stages, C=cap/stage

• Match rise/fall times, inter-stage delays to minimize phase

noise (lowers ISF)

• RMS random jitter (kT) < 0.2% VCO period (typical)

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 VCO w/current-starved
inverters(CSI)
• Usually odd # of stages (usually 5+)
• Feedback INV Æ usually weaker by ~4×
• Tune frequency by adjusting “VDD” of inverters – changes delay
• “Vdd” for inverters is regulated output of VCO V2I

weak weak weak

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2007
 V2I for CSI (V. von Kaenel (JSCC ’96)

• Bias circuit for current-starved inverter-based ring oscillator

• Feedback Æ amp provides good low-freq power-supply rejection
• Caps to Vdd and Vss provide good high-freq rejection but add
parasitic poles Æ e.g., ωp = 1/(Rro*Cn)
• Start-up necessary. Stability a concern

Cp
_
m2
+ m1
Rfb model of
Vfb CSI RO
Ivco
Cn
model of V2I Vctl m3 Rro

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2007
 Diff-Amp VCO w/Replica-Bias V2I
• Vswing = Vctl (Maneatis ’96)
• Amp provides DC power-supply rejection
• Stable, but getting high BW and good PSRR tricky
• Start-up necessary
Vctl

m3 m6 m7 m4

Vfb
m1 m2 3-stage RO

Vctl

+ Vbn + - + - + -
m5
- - - -
Vctl Vbn
+ + +
Cn
Dummy delay cell

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2007
 VCO: Level-Shifter
• Differential-pair without tail current
• Need sufficient gain at low VCO frequency – use low-Vt NMOS
• Use NMOS input pair if VCO swing referenced to VSS for better
power-supply rejection
• For best duty-cycle, use two instances of level-shifter (swap
inputs), and couple complementary outputs with weak inverters
• Typical duty cycle: 50 ± 3% with random mismatch

m3a m4a weak INV m4b m3b

z zn

m1a m2a m2b m1b

in ip in ip
weak INV

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2007
Feedback Divider

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2007
 Feedback Divider (FBDIV)
• Typical Implementation: synchronous digital counter
• Max FBDIV frequency should be greater than max VCO
frequency to avoid “run-away”
– beware of Synthesized, Placed & Routed designs
• Counter output may glitch Æ re-sample with VCO output to
clean up glitch, reduce latency and phase noise
• Loop Phase Margin Degradation ~ ωc*Tfbdly
– usually insignificant (a few degrees)
• Divider may be internal to PLL or after clock tree to cancel
clock tree skew
• May provide additional output signals used to
deterministically synchronize tester controls to VCO clock
and/or walk signals between various on-chip clock domains

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2007
Auxiliary Circuits

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2007
 Voltage Regulator
• Provides stable, PVT-insensitive, clean power-supply for PLL
– lower jitter, phase noise
– more stable loop dynamics, VCO range, etc.
– aim for > 30dB PSRR, definitely > 20dB

• Uses bandgap reference to set voltage and bias current

levels

• Two voltage regulators sometime used

– High VDD for charge-pump (analog) and lower VDD for VCO
– “Quiet” for analog (CP, VCO bias) and “Dirty” for digital (PFD,
FBDIV)

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2007
 Voltage Regulator
• Requires higher power-supply (e.g., 1.8V Æ 1.2V)
• Wastes current
– higher VDDA and bandgap/regulator over-head (0.5-3mA).
– aim for current overhead < 20%. <5% is achievable in some
apps
• Regulator area (inc. bandgap) is small compared to
decoupling cap area
– Area (MOSFETs, Rpoly, diodes) ~ 70 x 70 µm2 (65nm)
– Area (DECAPs) ~ 125µm x 125um for 100pF (65nm)
– Typical cap ~ 30-200pF
• Vt-mismatch in bandgap amplifier input pair dominates
overall regulator mismatch
– 3mV offset at amp Æ~20mV variation at output
– Goal < 25mV 1-σ variation from device mismatch
– Goal < ±5mV PVT variation (due mostly to diodes)

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2007
Digital PLL’s

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2007
 Why a Digital PLL?
• Replaces process and noise-sensitive analog circuits with
digital equivalents – advances on work with digital DLL’s
• Increases PLL design portability and testability
• Takes advantage of area scaling with nm devices
• Greater flexibility in loop bandwidth – don’t need huge
capacitors for low BW
• Increases ability to test and observe. e.g. open-loop, disturb
loop
• Fast behavioral simulation
• “Good-enough” for frequency synthesis applications
• ISSCC presentations: TI(‘04) and IBM (‘07)

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2007
 Why NOT a Digital PLL?
• Usually not “good enough” for phase-tracking applications

• VCO frequency has finite frequency resolution (e.g. 10-14

bits). May use coarse DAC if high-frequency dithering
available

• VCO has limited range – requires range control and/or

calibration

• VCO may have poor noise rejection if purely digital

frequency control and no voltage regulator (usually analog)

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2007
 Why NOT a Digital PLL?
• Need high-frequency over-sampling clock for sigma-delta
loop filter – VCO? Refclk? Start-up problem?

• TimeError-to-Digital Converter is hard – poor resolution,

high power – usually < 5 bits – is Bang-bang an alternative?
FbDiv internal state contains phase error information

• Digital filter generates large noise spurs, possibly inducing

jitter, and dissipates more power than passive loop filter

• Generating proportional correction can be tricky

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2007
 What is a Digital PLL?
• Replace charge-pump (time error-to-charge) with
TimeError-to-Digital Converter

• Replace loop filter with discrete-time digital filter (usually 2nd

or 3rd order sigma-delta)

• Replace voltage-controlled VCO with digital-control (vary cap

load, interpolation, etc.)

• Are analog components “allowed”? Voltage regulator?

Analog current-steering DAC for VCO?

• Sampled-system modeled in the Z-domain

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2007
Circuit Verification

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2007
 PLL Floorplan
"Q uiet" R egulated V D D
D ecap

VDD
V C O V 2I + B iasC kt D ecap

B andgap
R ef

VCO Bias Comp

RO

Cap
VRO CAP RO B ypass
V oltage LS VCO
M ux
R egulator P ost-
+
D iv
V D D reg B uffers

"Q uiet" R egulated V D D

D ecap LP F C 2 M etC ap C harge P um p P FD FbD iv

C ontrol Logic
LP F C 1 M etC ap +
Test Logic

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2007
 Noise Isolation
• Check extracted netlist for coupling of switching signals onto
sensitive analog signals (e.g. REFCLK Æ Vctl)

• Check that LPF metal caps are present and well-connected

to correct power supplies

• Check that VSS of LPF metal caps and VSS of VCO bias
circuits are well-connected and at same potential

• Check that correct shields for sensitive signals are in place

and well-tied to correct power supplies

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2007
 Noise Isolation
• Account for parasitic capacitance to substrate in “NWELL”
decaps, diodes, and well/diffusion resistors

• Add guard rings as applicable

• Buffer control signals and programmable inputs locally

before use
– avoids problem where GND of control signal doesn’t
match local GND where signal is used
– filters coupling/glitches on long routes

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2007
 Signal EM / ESD
• Inspect wires that conduct DC current and wires that drive
large switching output loads for EM violations (e.g. charge-
pump bias, output clocks)

• Check that signal ESD and/or power supply clamps are well-
connected to power supplies (< 1-2 Ω)
– extract power grids and ESD
– simulate for voltage peaks and diodes wired-backward

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2007
 Power-Grid IR

• Aim for avg IR drops < 5mV over entire PLL, less within and
between related analog blocks

• Decoupling capacitors surround large, switching buffers to

reduce IR drops and are well-connected to grid

• Check for isolated power domain islands

• Plan power domains and level-shifter placement up-front

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2007
 Switching Signals
• Match differential signals – total capacitance and coupling
(e.g. up, up_x, dn, dn_x, clk, clk_x)
– try to match total capacitance < 1-2%

• Maintain fanout (incl. Wires) < ~6 on high-speed paths, <

~10 on DC paths (e.g. encode/decoders)
– reduces crow-bar current and noise glitches

• Setup/Hold checks in PFD, Feedback Divider, and Post-VCO

divider. Needs lots of margin for FBDIV to account for
overshoot, aging, etc.
– strive for FBDIV faster than VCO(max)

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2007
 PLL Instantiation – Visual Checks
• Mismatch on differential signals

• Coupling into refclk, output clocks

• Possible glitches on control inputs

• Signal routes over sensitive areas of PLL (VCO, loop filter,

charge-pump)

• Large buffers on edge of PLL that may inject noise in

substrate (keep-out requirement?)

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2007
 PLL Instantiation – Visual Checks

• Output wires wide enough to handle current load (EM)

• Rise/fall times on inputs/outputs – add max_cap limit into

timing file to flag heavy loads

• VDDA/test signal routes to bumps and/or ESD

• VDD/ VSS power supply connections

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2007
 Functional Modes
• Power-Down/Reset/Test Modes
– chicken-and-egg start-up problems – esp. level-shifters, boot-
strapped regulators
– Contention?
• measure current in every device in these modes
• SLOW clock mode
– drive slow clock at power-on to remove contentious states in
downstream logic
– disable any clock gaters
– mux in separate ring oscillator or force VCO/post-VCO div to
produce low frequency clock in open-loop mode
– avoid glitches when entering/leaving SLOW mode
• Frequency Hopping
– Ensure that FBDIV can’t fail during frequency transition if
RESET not applied

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2007
 Power/Clocking Domains
• Level-shifters are present when crossing power domains and
are connected to correct supplies
– apply writability analysis with mismatch
– check for overstress
– easy to miss
• Add synchonizers or “walk clocks” when crossing clock
domains – easy to miss
• Check metastability on flops, comparators – is there a
failure mechanism? Calculate MTBF.
• Insert bypass mode mux, preferably such that if the
regulator fails, bypass clock still propagates to output

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2007
 RTL vs. Circuit
• Add assertions to RTL model to flag illegal input states

• Verify that RTL and tester don’t assume that dividers, etc.
are initialized to known states upon power-on, frequency-
changes, etc. – add logic to establish determinism if needed

• Model/verify all digital logic in RTL

• Specify expected input states at all analog blocks in various

operating modes

• Simulate PLL exhaustively in VerilogA, Nanosim, etc, if

possible

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2007
 RTL vs. Circuit
• Look for incorrect polarity on input control signals (e.g.,
reset, powerDown) and REFCLK

• Look for glitches on feedback clock and other dividers

• Exercise all divider/counter states

• Check for possible VCO run-away conditions during power-

on and frequency changes (e.g., no reset or feedback
divider is halted)

• Verify that unselected inputs of muxes in critical signal paths

are gated (e.g., VCO post-divider muxes)

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2007
 Behavioral Simulations
• Behavioral simulation –before detailed circuit design define
requirements for each block – e.g. PLLUS, Simulink

• Develop/verify jitter budget – e.g. PCI-Express

• Estimate VCO frequency overshoot

• Loop bandwidth vs. reference noise suppression

• Simulate effects of loop filter leakage, charge-pump

mismatch, feedback delays, OSR, spread-spectrum tracking,
Vctl-sensitive loop parameters, PFD dead-zone, parasitic poles

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2007
 Circuit Simulations
• Start-up circuit safety margin - bandgap, VCO, regulators
• Stability of all internal feedback loops
– AC and transient impulse response
– e.g., bandgap, regulator, charge-pump bias, VCO bias
– Phase margin, gain margin, # of rings
• VCO - RO stage delays rise vs. fall, stage-to-stage – lower
ISF
• Level-shifters’ possible corruption of duty-cycle
• Switching-induced noise spikes on regulated power supplies
• Current dissipation in power

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2007
 Circuit Simulations
• PSRR of voltage regulators, ability of regulators to meet
fast-changing current load

• Step reference phase, observe PLL re-lock

– overshoot, relock time

• Simulate entire sequence from power-on to lock

– sanity check

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2007
 Devices/Circuits
• Estimate effects of Vt mismatch BEFORE starting layout
(monte carlo, dVt ~ 1/sqrt(W*L) )
– most sensitive: bandgap, charge-pump, other low I ckts
• Estimate loop parameter variations, static error, reference
spurs due to PVT and mismatch before starting layout
– Kv, Icp, R, C1 (also vs. Vctl) – esp. dual- charge-pump designs
– circuit techniques to minimize effects: self-bias,
Icp*Rlpf=const
– self-bias not as effective if not all devices the same Leff
• Diode current density (bandgap) – ideality factor may be
sensitive to current density – stay away from cliff

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2007
 Device Reliability
• Gate Overstress
– especially likely during power-down, reset, test
– hspice .biaschk is useful

• Gate Leakage
– LPF especially, Ileak(LPF) < a few nA
– Switches used for test modes
– Gate loads of high-impedance nodes (e.g. bandgap)
– Large op-amp inputs

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2007
 Device Reliability
• Verify that circuits with PMOS devices are not NBTI-sensitive

– Vgs of matched devices should be the same at all times,

even when not selected (e.g. current-steering DAC) –
don’t place switches closest supply rails

– switching circuits such as VCO and FBDIV should have

enough frequency headroom to allow for aging. High Vgs
is bad! 10-20% margin?

– effect worse at 45nm and 65nm and may not be well-

modeled

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2007
 Lithography/Devices
• Add dummy poly to reduce ACLV (across chip linewidth
variation), esp. in Lmin devices

• Maintain gate poly on fixed pitch in same orientation to

reduce ACLV (esp. in Lmin devices)

• Try to maintain constant poly density – e.g. no large caps

next to sensitive Lmin devices)

• Add dummy devices if stress/strain is applied and matching

is required (e.g., charge-pump)

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2007
 Tips for Design for Test
• Measuring Jitter and Phase Error

• Measuring Loop Dynamics

• Analog Measurements

• Probing

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2007
 Getting Clocks from PLL to Board
• Differential I/O outputs highly desirable to reject common-
mode noise – use fastest I/O available

• Divide VCO to reduce board attenuation only if necessary

Æ make divider programmable

• Measuring duty-cycle
– Divide-by-odd-integer
– Mux to select either true or inverted VCO clock. Duty-
cycle error = (Duty+ - Duty-) / 2

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2007
 Getting Clocks from PLL to Board
• Ability to disable neighboring I/O when measuring jitter

• Observe REF, VCO, and FBCLK. Gate unused inputs to the

clock source mux

• Phase error measurement: trigger scope on REFCLK on

board. Capture internal REFCLK and FBCLK in infinite
persistence. Measure difference between internal REFCLK
and FBCLK on same pin.

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2007
 Measuring Loop Dynamics
• Modulate reference phase at various modulation frequencies
and measure VCO phase using TIE
– used to construct closed-loop transfer function

• On-chip state-machines
– range from simple to sophisticated
– disturb locked PLL in some way and observe re-lock
behavior

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2007
 Analog Measurements
• Need ability to measure key internal analog
signals without injecting noise
– Loop filter control voltage
– Ring Oscillator regulated supply
– Bandgap reference
– Regulated power supplies
– Charge-pump bias voltages and currents
• Metrics
– Measurement BW ~ PLL Bandwidth or less
– Accuracy ~ 5mV?
– Programmable via JTAG

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2007
 Analog Measurements
• Internal A/D
• Can be fairly slow
• Minimize mux switch leakage into A/D front-end
• Minimize coupling to sensitive signals
• May require external analog pin for calibration
• Compare analog voltage to internally-generated
voltage reference
• Use state-machine to minimize # of comparators to
save area
• Disable when not in use to save power

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2007
 Analog Measurements
• Analog Observation Pins
• Pass-gate mux connects analog signals to outside world
• Force or sense voltage/current
• Low BW – high impedance analog signals and high parasitics
• Need ESD (HBM,CDM) to protect signals –watch for leakage
• Buffer control voltage before sending off-chip to prevent
leakage and extra load from upsetting feedback loop –
watch for gate leakage in unity-gain buffer
• Pull-down to VSS far-side of pass-gates when not in use to
minimize coupling of noisy pin to analog signals (at expense
of increased leakage). Disable pull-downs for ESD testing
• Can wire-OR analog observation pins from several PLL’s but
watch for increased pin leakage causing IR drops across
pass-gates (e.g., 3-6kΩ) or causing high-impedance analog
signals to droop

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2007
 Probing On-chip (last resort!)
• If not flip-chip, then put probe pads on top-layer metal

• Probe pad size >1µm × 1µm. Prefer > 2µm × 2µm

• Place probe pad on a side-branch of analog net to avoid

breaking wire with probe

• Separate probe pads to allow room for multiple probes

• FIB: can add probe pad, add or remove wires

– need room and luck

Copyright, Dennis Fischette, 108

2007
Summary: Uncle D’s PLL Top 5 List
1. Maintain damping factor ~ 1 for low period jitter apps

2. VDD-induced and intrinsic VCO noise – loop can’t do the

work for you

3. Leaky loop filter gate caps will cost you your job

4. Make FBDIV run faster than VCO

5. Observe VCO, FBCLK, REF, clkTree on differential I/O pins –

you can’t fix what you can’t see!

Copyright, Dennis Fischette, 109

2007
 Special thanks to Alvin Loke for
allowing to me “borrow” some of his
diagrams and ideas for this talk…which
ones? The good ones

Copyright, Dennis Fischette, 110

2007
References

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2007
 Paper References
[1] B. Razavi, Monolithic Phase-Locked Loops and Clock-Recovery Circuits, IEEE Press,
1996. – collection of IEEE PLL papers.
[2] I. Young et al., “A PLL clock generator with 5 to 110 MHz of lock range for
microprocessors,” IEEE J. Solid-State Circuits, vol. 27, no. 11, pp. 1599-1607, Nov.
1992.
[3] J. Maneatis, “Low-Jitter Process-Independent DLL and PLL Based on Self-Biased
Techniques,” IEEE J. Solid-State Circuits, vol. 31, no. 11, pp. 1723-1732. Nov.
1996.
[4] J. Maneatis, “Self-Biased, High-Bandwidth, Low-Jitter 1-to-4096 Multiplier Clock
Generator PLL,” IEEE J. Solid-State Circuits, vol. 38, no.11, pp. 1795-1803. Nov.
2003.
[5] F. Gardner, “Charge-pump phase-lock loops,” IEEE Trans. Comm., vol COM-28, no.
11, pp 1849-1858, Nov. 1980.
[6] V. von Kaenel, “A 32- MHz, 1.5mW @ 1.35 V CMOS PLL for Microprocessor Clock
Generation,” IEEE J. Solid-State Circuits, vol. 31, no. 11, pp. 1715-1722. Nov.
1996.
[7] I. Young, “A 0.35um CMOS 3-880MHz PLL N/2 Clock Multiplier and Distribution
Network with Low Jitter for Microprocessors,” Proc. ISSCC 1997, pp. 330-331.
[8] J. Ingino et al., “A 4-GHz Clock System for a High-Performance System-on-a-Chip
Design,” IEEE J. Solid-State Circuits, vol. 36, no. 11, pp. 1693-1698. Nov. 2001.
[9] A. Maxim et al., “A Low-Jitter 125-1250 MHz Process-Independent CMOS PLL Based
on a Sample-Reset Loop Filter,” Proc. ISSCC 2001, pp. 394-395.
[10] N.Kurd et al., “A Replica-Biased 50% Duty Cycle PLL Architecture with 1X VCO,”
Proc. ISSCC 2003, pp.426-427.
[11] K. Wong, et al., ”Cascaded PLL Design for a 90nm CMOS High Performance
Microprocessor,” Proc. ISSCC 2003, pp.422-423.

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2007
 Paper References
[12] M. Mansuri, et al., “A Low-Power Adaptive-Bandwidth PLL and Clock Buffer With
Supply-Noise Compensation”, IEEE J. Solid-State Circuits, vol. 38, no.11, pp. 1804-
1812. Nov. 2003.
[13] A. Maxim, “A 160-2550 MHz CMOS Active Clock Deskewing PLL Using Analog Phase
Interpolation,” Proc. ISSCC 2004, pp. 346-347.
[14] J. Lin et al, “A PVT Tolerant 0.18MHz to 660MHz Self-Calibrated Digital PLL in 90nm
CMOS Process,” Proc. ISSCC 2004, pp. 488-489.
[15] J. McNeill, “Jitter in Ring Oscillators,” IEEE J. Solid-State Circuits, vol. 32, no.6, pp.
870-878, Jun. 1997.
[16] A. Abidi, “Phase Noise and Jitter in CMOS Ring Oscillators,” IEEE J. Solid-State
Circuits, vol. 41, no.8, pp. 1803-1816, Aug. 2006.
[17] L. Dai et al., “Design of Low-Phase-Noise CMOS Ring Oscillators,” IEEE Trans.
Circuits and Systems-II: Analog and Digital Signal Processing, vol. 49, no. 5, pp.
328-338, May 2002.
[18] U. Moon et al., “Spectral Analysis of Time-Domain Phase Jitter Measurements,” IEEE
Trans. Circuits and Systems-II: Analog and Digital Signal Processing, vol. 49, no. 5,
pp. 321-327, May 2002
[19] J. Kim et al., “Design of CMOS Adaptive-Bandwidth PLL/DLLs: A General Approach,”
IEEE Trans. Circuits and Systems-II: Analog and Digital Signal Processing, vol. 50,
no. 11, pp. 860-869, Nov 2003.
[20] T. Toifl et al., “A 0.94-ps-RMS-Jitter 0.016-mm2 2.5-GHz Multiphase Generator PLL
with 360 Degree Digitally Programmable Phase Shift for 100Gb/s Serial Links,” IEEE
J. Solid-State Circuits, vol. 40, no.12, pp. 2700-2711, Dec. 2005.
[21] S. Wedge, “Predicting Random Jitter,” IEEE Circuits & Devices Magazine, pp. 31-38,
Nov/Dec 2006.
[22] A. Rylyakov et al., “A Wide Power-Supply Range (0.5V-to1.3V) Wide Tuning Range
(500MHz-to-8GHz) All Static CMOS AD PLL in 65nm CMOS SOI,” Proc. ISSCC 2007,
pp. 172-173.
Copyright, Dennis Fischette, 113
2007
 Paper References
[24] R. Staszewski et al, “All-Digital PLL and Transmitter for Mobile Phones,” IEEE J.
Solid-State Circuits, vol. 40, no.12, pp. 2469-2482. Dec. 2005.
[25] R. Staszewski et al, “All-Digital PLL with Ultra Fast Settling,” IEEE Trans. On Circuits
and Systems II: Express Briefs, vol. 54, no.2, pp. 181-185. Feb. 2007.
[26] V. Kratyuk et al, “A Design Procedure for All-Digital Phase-Locked Loops Based on a
Charge-Pump Phase-Locked-Loop Analogy,” IEEE Trans. On Circuits and Systems II:
Express Briefs, vol. 54, no.3, pp. 247-251. Mar. 2007.
[27] J. Hein et al, “z-Domain Model for Discrete-Time PLL’s,” IEEE Trans. On Circuits and
Systems, vol. 35, no.11, pp. 1393-1400. Nov. 1988.

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 Monograph References
[1] B. Razavi, Design of Analog CMOS Integrated Circuits, McGraw-Hill, 2001.
[2] R. Best, Phase-Locked Loops,McGraw-Hill, 1993.
[3] R. Dorf, Modern Control Theory, 4th Edition, Addison-Wesley, 1986.
[4] P.Gray and R. Meyer, Analysis and Design of Analog Integrated Circuits, 3rd Edition, J.
Wiley & Sons, 1993.
[5] K. Bernstein and N. Rohner, SOI Circuit Design Concepts, Kluwer Academic Publishers,
2000.
[6] A. Hajimiri and T. Lee, The Design of Low Noise Oscillators, Kluwer Academic
Publishers, 1999.
[7] T. Lee, The Design of CMOS Radio-Frequency Integrated Circuits, Cambridge
University Press, 1998.
[8] F. Gardner, Phaselock Techniques, 2nd Edition, New York, Wiley & Sons, 1979.

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PLL Failures

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2007
 PLL Failures
• Observation is that VCO frequency is pinned at max value.
Can’t observe Vctl or feedback clock. VCO fails to oscillate at
low frequency because of insufficient gain in 3-stage VCO.
When VCO finally starts, FBDIV can’t keep up, causing “run-
away” Solution: increase gain of delay stage and FBDIV
speed.
• VCO “run-away” when re-locking to higher frequency due to
VCO overshoot and slow FBDIV.
• VCO loses lock occasionally at low frequencies. Due to
insufficient VCO level-shifter gain. Dropped VCO edges.
Required real-time scope for debug
• High jitter at low VCO frequencies due to Vctl approaching
Vt of V2I current source. Solution: operate VCO at 2X.

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2007
 PLL Failures
• Occasional high deterministic jitter caused by coupling into
PLL’s VDDA bondwire.
• Extremely high period jitter – caused by incorrect wiring of
8-bit charge-pump setting. Bandwidth much too high.
Verilog model did not check for legal input settings.
• PLL won’t start-up at low temp due to weak start-up circuit
in voltage regulator and lack of simulation at corners with
slow VDDA ramp-rate.
• PLL period modulated strongly by 400MHz signal, resulting
from oscillating internal feedback loop in VCO bias ckts.
Ultimate cause, fab misprocessing of compensation cap and
insufficient margin in ckt.

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2007
 PLL Failures
• Metastability condition corrupted digital loop filter due to
slow devices, low Vdd, and insufficient design margin.

• Digital VCO out-of-range due to resistor mis-processing.

Solution: fusable chicken-bits to adjust frequency range.

• Race condition in digital loop filter caused by missing

synchonizers in clock domain crossing.

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2007
 PLL Failures
• CDM ESD failures of analog measurement pins – no visual
inspection and no extraction/simulation of connection to
VSS.
• Duty-cycle corruption (> 57%) – caused by unbalanced
fanouts in delay stages after VCO – exacerbated by single-
ended clocking.
• Contention in analog observation signals due to ESD diodes
wired backward and control logic bugs.
• Inconsistent duty cycle. Failure to initialize state in post-VCO
divider exposed VCO duty-cycle error.

Copyright, Dennis Fischette, 120

2007