Assignment 9: WW WW
Assignment 9: WW WW
(a) Suppose that one wafer is randomly selected from each lot and
that a single measurement on a critical dimension of interest is
taken. Which components of variation could be estimated with
these data? What type of control charts would you recommend?
(b) Suppose that each wafer is tested at five fixed locations (say, the
center and four points at the circumference). The average and
range of these within-wafer measurements are x̄ww and Rww , re-
spectively. What components of variability are estimated using
control charts based on these data?
(c) Suppose that one measurement point on each wafer is selected
and that this measurement is recorded for five consecutive wafers.
The average and range of these between-wafer measurements are
x̄BW and RBW , respectively. What components of variability are
estimated using control charts based on these data? Would it be
necessary to run separate and R charts for all five locations on the
wafer?
(d) Consider the question in part (c). How would your answer change
if the test sites on each wafer were randomly selected and varied
from wafer to wafer?
(e) What type of control charts and rational subgroup scheme would
you recommend to control the batch-to-batch variability?
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(b) Can you construct control charts that allow within-wafer variabil-
ity to be evaluated?
(c) What control charts would you establish to evaluate variability
between wafers? Set up these charts and use them to draw con-
clusions about the process.
(d) What control charts would you use to evaluate lot-to-lot variabil-
ity? Set up these charts and use them to draw conclusions about
lot-to-lot variability.
(a) Set up the fraction nonconforming control chart for this process.
Plot the preliminary data in Table 7E.1 on the chart. Is the pro-
cess in statistical control?
(b) Assume that assignable causes can be found for any out-of-control
points on this chart. What center line and control limits should
be used for process monitoring in the next period?
7.8 The number of nonconforming switches in samples of size 150 are shown
in Table 7E.4. Construct a fraction nonconforming control chart for
these data. Does the process appear to be in control? If not, assume
that assignable causes can be found for all points outside the control
limits and calculate the revised control limits.