Modulation of The Band Gap of Graphene Oxide-The Role of AA-stacking
Modulation of The Band Gap of Graphene Oxide-The Role of AA-stacking
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A. Hunt a,*, D.A. Dikin b, E.Z. Kurmaev d, Y.H. Lee c, N.V. Luan c, G.S. Chang a,
A. Moewes a
a
Department of Physics and Engineering Physics, University of Saskatchewan, 116 Science Place, Saskatoon, Saskatchewan S7N 5E2, Canada
b
Department of Mechanical Engineering, Northwestern University, 2145 Sheridan Road, Evanston, IL 60208-3111, USA
c
Department of Energy Science (DOES), Sungkyunkwan University, Suwon 440-746, Republic of Korea
d
X-ray Emission Spectroscopy Lab, Institute of Metal Physics, RAS Ural Div., 18 Kovalevskoi Str., 620990 Yekaterinburg, Russia
A R T I C L E I N F O A B S T R A C T
Article history: The unique electronic properties of graphene make it an advantageous material for use in
Received 31 May 2013 many applications, except those that require a band gap. Much work has been done to
Accepted 13 September 2013 introduce an appropriately tuned band gap into graphene, including uniaxial strain and
Available online 23 September 2013 oxidation, with varying levels of success. We report here that the stacking configuration
of the sheets in multilayered graphene oxide can have a significant impact on the band
gap. Through comparison of X-ray absorption near-edge spectra of multilayered pristine
graphene sheets with spectra simulated using density functional theory, we have found
that AA-stacking pushes unoccupied states closer to the Fermi level than AB-stacking by
widening the p* resonance in both graphene oxide and graphene. If the near-Fermi states
have been removed such that the nearest unoccupied state to the Fermi level is the p* band,
then AA-stacked multilayered graphene oxide will have a smaller band gap than AB-
stacked graphene oxide. We have confirmed this by measuring the band gap of graphene
oxide and reduced graphene oxide indirectly using X-ray absorption near-edge spectros-
copy and X-ray emission spectroscopy. Controlling the stacking configuration of multilay-
ered graphene oxide may provide a novel method for tuning its band gap.
Ó 2013 Elsevier Ltd. All rights reserved.
properties and can be used in polymer composites [9] and not possess, and the transition probabilities are not modified
dielectric layers in electronic devices [10]. Indeed, GO has by Franck–Condon factors like optical gap measurements,
shown to be a better transparent conducting film than graph- allowing for a detailed and unambiguous study of the carbon
ene in solar cell applications [11,12]. GO can be applied used states that populate the near-Fermi energy regime.
in various biological applications [13], for example, GO–
Fe3O4 nanoparticles can be used for drug delivery and release 2. Experimental
[14].
For electronic device applications [15], a band gap is re- 2.1. XES measurements
quired to control the type and concentration of carriers, how-
ever, graphene is a zero-gap semiconductor [16]. There are The XES measurements on the carbon 1s edges were per-
numerous methods by which one may introduce a band gap formed at Beamline 8.0.1 at the Advanced Light Source at
into graphene [17,18]. However, a natural point where one the Lawrence Berkeley National Laboratory using the soft
may study how to engineer the band gap of graphene is GO, X-ray fluorescence (SXF) endstation [25]. Emitted radiation
given its role in the preparation of graphene. GO has a finite was measured using a Rowland circle type spectrometer
electronic band gap due to oxidization of the carbon basal with a large spherical grating and a photon-counting area
plane by oxygen-containing functional groups: phenol, hy- detector. The total experimental resolution was 0.3 eV
droxyl, and epoxide groups on the plane and carboxylic FWHM. The fluorescence measurements were made using
groups at the lateral edge [19,20]. Interestingly, the effect that a depolarized configuration, which means that the vector E
the stacking arrangement of the graphene oxide sheets has of the incidence beam lies at the scattering plane, i.e.
on the band gap of multilayered GO has not been studied, de- p-polarization was used. The SXF endstation is configured
spite the fact that p–p overlap between graphene and func- such that the path of the emitted photons that can be
tionalizing adsorbed aromatics is known to alter electrical detected by the spectrometer and the incident beam are
characteristic of graphene [21]. There are many possible perpendicular to each other.
graphene stacking configurations, but two of the most impor-
tant are the AB-stacking (Bernel stacking) and the AA-stack- 2.2. XANES measurements
ing configurations. The two stacking configurations are
shown in Fig. 1. The images in Fig. 1 were made using VESTA High-resolution XANES spectra on the C 1s edge were mea-
[22]. AB-stacking is the lowest-energy configuration, and this sured at the Spherical Grating Monochromator (SGM) beam-
is the dominant stacking mode found in highly-oriented pyro- line at the Canadian Light Source [26]. The GO X-ray
lytic graphite (HOPG). It is known that the way in which absorption near-edge spectra (XANES) were measured in total
graphene sheets stack has a significant impact on the vibron- electron yield (TEY) and total fluorescence yield (TFY) modes.
ic structure of multilayered graphene sheets [23]. Given that The graphene XANES spectra, however, were also measured
the states that frame the band gap in GO will also be located in partial fluorescence yield (PFY) mode. The PFY spectra were
in the interplanar region, it stands to reason that the way in measured using a silicon drift detector (SDD) that acted as a
which the layers interact will affect the band gap. This work very low-resolution spectrometer (FWHM 150 eV). Integrat-
studies that very interaction. ing all counts detected by the SDD would yield a TFY spec-
We have been studying the many facets of the electronic trum, whereas isolating only the emission line from carbon
and physical structure of graphene oxide [24]. Here, we probe produces a C 1s PFY spectrum. This was necessary in this case
the band gap of multilayered GO (simply referred to as GO because the graphene and multilayered graphene samples
henceforth) and GO that has been reduced with hydrazine hy- were mounted on SiO2 substrates. Second order contamina-
drate (rGO). The band gap is studied indirectly through a com- tion from the monochromator allows for near-resonant exci-
bination of X-ray absorption near-edge fine structure tation of the O sites in the SiO2 substrate, as the O 1s
(XANES), to probe the unoccupied partial density of states absorption threshold lies at nearly twice the energy of the C
(pDOS), and non-resonant X-ray emission spectroscopy 1s edge. Although second order light from the monochroma-
(XES), to probe the occupied pDOS. Plotted on a common en- tor is significantly weaker than the first order light that reso-
ergy scale with respect to the core hole, the band gap is the nantly excites the graphene, the SiO2 substrate has orders of
energy separation between XES and XANES. These techniques magnitude more oxygen than the graphene layers has carbon.
boast site- and chemical-specificity that other techniques do Thus, O Ka emission from the substrate strongly competes
with the C Ka emission from the graphene.
For normalization, in all cases, the PFY, TFY, and TEY spec-
tra were normalized to the current generated in a photodiode
when this photodiode was exposed to the incident beam. This
photodiode current spectrum was not taken simultaneously
with the sample spectrum, but rather directly afterwards.
This technique allows one to directly measure the light inten-
sity hitting the sample as a function of energy. This method
allows one to correctly account for intensity fluctuations in
the incident beam due to carbon contamination on all opti-
Fig. 1 – The AB- and AA-stacking configurations for graphite cally active beamline components. Such contamination can
and multilayered graphene. introduce false features into carbon spectra.
CARBON 6 6 ( 2 0 1 4 ) 5 3 9 –5 4 6 541
3. Results
‘squishing’ of high-intensity features. In order to correct for shown by their second derivatives? (2) Which local minimum
saturation effects, the displayed TFY spectra have been trea- does one use for the determination of the band gap of GO?
ted using the correction method of Eisebitt et al. [30,31]. Neither question can be answered until it is known what is
The second derivative method was chosen to analyze the causing the double-dip structure in the TFY of both samples.
band gap of GO. The second derivative is particularly useful As we shall show later, the answers to both of these questions
for analyzing the pre-edge of a spectrum because weak but involves the AA-stacking mode, and in particular, how this
sharp features show much more prominently in the second configuration behaves when subjected to pressure within
derivative than broad yet strong features. This property helps the bulk of a material.
to extract details from the near-Fermi portions of the XES and
XANES spectra. Other researchers have successfully deter- 3.1. Pristine graphene
mined the band gaps of various materials indirectly using a
combination of XANES and XES [32–34]. Calculating the sec- The first step to answer the two questions stated above is to
ond derivatives of XANES and XES spectra has proven to be determine whether the double-dip structure is due to func-
an accurate and highly reproducible method of finding the tionalization, or if one can see this structure in pristine mul-
band onsets, and thus the band gaps [35–38]. tilayered graphene. To test this possibility, eight samples of
Minima in the second derivative correspond to features pristine graphene mounted on SiO2 substrates were prepared:
(maxima) in the spectrum. The band gap is therefore the en- two each of graphene, bilayered graphene, multilayered
ergy separation between the highest-energy minimum in the graphene with four to six layers, and multilayered graphene
second derivative of an XES spectrum (denoted d2XES/dE2) with ten or more layers, hereafter referred to as Gr, 2Gr, 4Gr,
and the lowest-energy minimum in second derivative of an and 10Gr. The first set taken as is, and the second was an-
XANES spectrum. Depending on how the XANES spectrum nealed at 900°; further details of the synthesis can be found
is measured (TEY or TFY), the second derivative is denoted
d2TEY/dE2 or d2TFY/dE2.
With this understanding of the second derivative method
in mind, let us turn to the d2XES/dE2, d2TEY/dE2, and d2TFY/
dE2 spectra of GO and rGO, displayed within the insets of each
panel in Fig. 2. Before a discussion concerning the band gaps
of the samples can begin, however, the differences in the
d2TEY/dE2 and d2TFY/dE2 spectra of each sample is striking,
particularly in the 284.5–286.5 eV range. For both samples,
the d2TEY/dE2 shows only one minimum, at about 285.2 eV,
whereas the d2TFY/dE2 shows a double-dip structure, with
one minimum at 284.6 eV, the other at 285.6 eV. This double-
dip structure in the TFY is not due to saturation, as saturation
cannot introduce structure into a spectrum [29]. Neither is the
difference in shape due to a normalization artifact from a
contaminated mesh, as all XANES spectra were normalized
using an asynchronously measured photodiode spectrum of
the incident light to act as a background reference [39]. Thus
the difference in shape between the TEY and TFY spectra is
real and inherent. For rGO, there is a similar structure in the
284.5–286.5 eV range as indicated by dashed lines in Fig. 2,
but the problem does not affect the determination of the band
gap because both d2TFY/dE2 and d2TEY/dE2 have minima at
283.3 eV. This leads to a band gap of about 0.3 eV. However,
the determination of the band gap for GO is not so simple,
as it is not obvious, at this point, which minima of the three
available one should use. The three possible band gaps, based
upon the three candidate minima at 284.6 eV, 285.2 eV, and
285.6 eV, are labeled with arrows in panel (a) in Fig. 2. Fig. 3 – XANES spectra of Gr, 2Gr, 4Gr, and 10Gr, measured in
Note that Fig. 2 shows many spectral differences between TEY and PFY modes. XANES spectra of HOPG, measured in
the spectra of GO and rGO, particularly in the range between TEY and TFY mode, is included as a reference. The graphene
287 eV and 290 eV. This energy range is home to the spectral spectra were all measured with an angle of incidence of 80°
signatures of oxidizing functional groups [40–42,24]. The from the sample surface normal. The top two panels show
287–290 eV energy range holds key information about the the spectra measured from samples that were not annealed;
chemical character of the sample in question, but it is not rel- the bottom two panels show spectra that were measured
evant to a study of the band gap of graphene oxide. Therefore, from samples annealed at 900 °C. The second derivatives of
we do not discuss it. each group of spectra are shown in the bottom halves of
We thus present two fundamental questions: (1) Why do each of the panels. (A colour version of this figure can be
the TEY and TFY spectra have such different structure, as viewed online.)
CARBON 6 6 ( 2 0 1 4 ) 5 3 9 –5 4 6 543
in the Experimental section. Fig. 3 displays XANES spectra 4. Discussion and analysis
measured from the samples with different numbers of pris-
tine graphene layers, as well as HOPG. The spectra of the mul- The double-dip structure has now been seen in GO, rGO, and
tilayered graphene samples were recorded in both TEY and multilayered pristine graphene if one stacks up 10 or more
PFY modes; the fluorescence spectrum of HOPG was recorded layers. Given that this structure occurs in pristine graphene
in TFY mode. The reason for the difference in fluorescence and HOPG, it is not due to oxidation. This conclusion is sup-
measurement technique is explained in Section 2. ported by the fact that all prevalent functional groups identi-
As one can clearly see, there are very few features in the fied on graphene oxide, namely carboxyl, hydroxyl, epoxide,
287–290 eV energy range in the graphene spectra, particularly and carbonyl, all have their characteristic resonances in the
for the annealed samples. This marks a sharp contrast with oxidation zone between 286 eV and 290 eV, and this energy re-
the GO samples, but the difference is expected. No spectral gion quite devoid of features. If the double-dip structure is not
features within this energy range indicate that the samples a chemical artifact, could it be due to structural differences,
have not been functionalized. However, there is another such as the interplanar stacking order?
marked difference between the graphene and GO samples We present a theoretical study of the effect of the stacking
worthy of mention: the PFY and TEY spectra of the graphene order on the electronic structure of multilayered graphene, in
samples are very similar in shape. This similarity is to be ex- which we explicitly consider the AA- and AB-stacking config-
pected because of the thinness of the graphene samples. The urations. Fig. 4 shows simulated XANES spectra of several
saturation effects that strongly distort the TFY spectra of GO structures, including graphene, AB- and AA-stacked bilayer
in Fig. 2 are only problematic for samples that are thicker graphene, and AB- and AA-stacked graphite; all simulations
than the penetration depth of the incident radiation, which were performed using the WIEN2k code using the local den-
is on the order of 100–200 nm for soft X-rays. sity approximation (LDA) exchange–correlation functional.
Saturation effects do not distort the PFY spectra of the For all multilayered configurations, the interplanar spacing
graphene samples and thus the PFY and TEY spectra are was optimized. The AB-stacked graphite had an optimized
much similar in shape. However, the PFY and TEY spectra interplanar spacing that was very close to the experimental
are not identical, particularly when comparing the PFY and value of 3.348 Å, which is the reason why the LDA functional
TEY spectra of the multilayered graphene samples. One was chosen. The Perdew–Burke–Ernzerhof generalized gradi-
can immediately see that features b at 284.8 eV and c at ent approximation (PBE-GGA) exchange–correlation func-
285.4 eV that constitute the double-dip structure in the tional did not report an optimal interplanar spacing. The
d2TFY/dE2 of GO shown earlier are seen again. The double AB-stacked bilayer graphene also had a calculated optimal
dip is seen most strongly in the d2PFY/dE2 spectra of both interplanar spacing very close to the known value for bulk
10Gr samples. It would seem that, as one adds layers, the graphite. This result agrees with previous studies [43]. How-
double-dip structure becomes more prominent in the ever, the AA-stacked configurations all preferred to be much
d2PFY/dE2 spectra measured from the sample. This trend is further apart. Separate calculations at 3.348 Å, the interplanar
strongly supported by the HOPG results. However, another spacing preferred by AB-stacked graphite, and at the opti-
pattern also emerges. In the second derivative, the mini- mized spacing of 3.6 Å were performed.
mum at 284.8 eV becomes prominent while the largely posi- The simulations in Fig. 4 show three very important re-
tive feature at 286.3 eV (feature d) is suppressed; the two sults. First, the p* band of graphene, as well as that of bilayer
spectral changes happen simultaneously, suggesting a com- and infinite layer stacked graphene (graphite) in the AB-stack-
mon cause. As layers are added, spectral weight is being ing configuration, has one major feature. In the second deriv-
added at both 284.8 eV and 286.3 eV. ative, this feature produces one minimum in each case.
It is therefore clear that, as one adds more graphene lay- Second, the p* band of bilayer and infinite layer graphene
ers, more states are added at both 284.8 eV and 286.3 eV. In- (graphite) shows a much broader lineshape; in the second
deed, HOPG also shows prominent dips in its d2TFY/dE2 at derivative, this yields two local minima. Third, the relative
these energies, a sample that is highly non-functionalized spacing of the AA-stacked minima (and hence the width of
and has been subjected to none of the chemicals involved the p* band) increases with an increasing number of layers
in either the creation of GO, or the transfer of graphene. An and a decreasing interplanar spacing. If one were to increase
as-yet unidentified layer-dependant phenomenon is affecting the spacing to infinity, the double peak structure in the sec-
these changes. Note that other researchers have noticed fea- ond derivatives of the bilayer graphene simulated XANES
tures in the 284.6–286.3 eV energy range. Indeed, the d2TEY/ spectra would eventually coalesce into one feature, as one ex-
dE2 and d2PFY/dE2 spectra of the non-annealed monolayer pects from graphene. In the AA-stacking bulk limit, when the
graphene sample also show a feature a dip 284.9 eV. In this interplanar distance equals that of AB-stacked graphite of
case, the feature at 284.8 eV is likely caused by another effect, 3.348 Å, the minima in the second derivative of the simulation
such as scattering from point defects, or doping from ad- line up quite well with the minima at 284.7 eV and 286.4 eV of
sorbed gases or solvents. Whatever the source, it is mitigated the d2TFY/dE2 of highly-oriented pyrolytic graphite (HOPG), as
by annealing, as this feature is sharply reduced in the spectra shown in Fig. 4. Thus, it would seem that they layer-depen-
from the annealed monolayer graphene. Spectral weight in dant effect that produces spectral weight at 284.7 eV and
the 284.6–284.9 eV energy range is thus likely a composite 286.4 eV is due to interactions between AA-stacked graphene
from many contributions, but it is the layer-dependent one sheets, whereas the minimum at 285.4 eV is due to AB-
that we seek here. stacking.
544 CARBON 6 6 ( 2 0 1 4 ) 5 3 9 –5 4 6
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