Qoriq Ls1043A Design Checklist: 1 About This Document
Qoriq Ls1043A Design Checklist: 1 About This Document
Contents
This document provides recommendations for new designs 2 Before you begin............................... ........................1
based on the LS1043A/LS1023A processor, which is a cost- 3 Simplifying the first phase of design.........................2
effective, power-efficient, and highly integrated system-on-
chip (SoC) design that extends the reach of the NXP Value 4 Power design recommendations.......... ..................... 5
Performance line of QorIQ communications processors. 5 Interface recommendations......................................16
This document can also be used to debug newly-designed 6 Hardware design considerations........ ..................... 53
systems by highlighting those aspects of a design that merit
special attention during initial system start-up. 7 Thermal................................ ................................... 62
Secure Boot
QUICC Engine
DMA
Parse, classify, Watchpoint
SATA 3.0
Cross
2x DUART distribute Trigger
4x I2C, 4x GPIO
Perf Trace
Buffer 1G 1G 1G 1/2.5G Monitor
8x FlexTimer Manager
1G 1G 1/2.5/10G
3x USB3.0 w/PHY
Core Complex
Accelerators and Memory Control
Basic Peripherals, Interconnect and Debug
Networking Elements
Arm® ARM
Cortex ®-A53
Cortex-
ARM
64-bit Cortex-
Core
A53 64b Cores
A53 ARM
64b Cores
Cortex-
A53
ARM64b Cores
Cortex-
32 KB 32 KB
32 KB A53 64b 32 KB
Cores
32
32 KB
D-Cache
KB 32
32 KB
I-Cache KB 32-bit
D-Cache I-Cache
D-Cache
D-Cache I-Cache
I-Cache DDR3L/4
Memory Controller
1 MB L2 - Cache
Secure Boot
QUICC Engine
Parse, classify, Watchpoint
SATA 3.0
Cross
2x DUART distribute Trigger
4x I2C, 4x GPIO
Perf Trace
Buffer 1G 1G 1G 1/2.5G Monitor
8x FlexTimer Manager
1G 1G 1/2.5/10G
3x USB3.0 w/PHY
Core Complex
Accelerators and Memory Control
Basic Peripherals, Interconnect and Debug
Networking Elements
NOTE
Design requirements in the device datasheet supersede requirements mentioned in design
checklist and design requirements mentioned in design checklist supersede the design/
implementation of the NXP reference design (RDB) system.
NOTE
1. For supported voltage/frequency options, refer to orderable part list of QorIQ
LS1043A and LS1023A Multicore Communications Processors at www.nxp.com
2. If all USB power supplies are connected to GND when USB is not used, the JTAG
IEEE Std 1149.1-2001 Boundary Scan Register (BSR) will not shift contents
between TDI and TDO. USB_SVDD must be powered in order for the USB BSR
cells to shift. In this case, the USB boundary cells cannot observe or control USB
pins. This affects the USB BSR cells during EXTEST, EXTEST_PULSE,
EXTEST_TRAIN, CLAMP and SAMPLE. The only fails are related to USB IO’s
when USB_SVDD is powered on, and USB_SDVDD and USB_HVDD are
powered off. If all USB power supplies are connected to GND, the other 1149.1
JTAG or DAP debug instructions will still operate.
Provide independent filter circuits per PLL power supply, as illustrated in the following figure.
Where
• R = 5 Ω ± 5%
• C1 = 10 μF ± 10%, 0603 or smaller, X5R or better (X7R or C0G are fine), with ESL ≤ 0.5 nH
• C2 = 1.0 μF ± 10%, 0402 or 0201, X5R, with ESL ≤ 0.5 nH
• Low-ESL surface-mount capacitors
R
1.8 V source AVDD_PLAT, AVDD_D1
AVDD_CGA1, AVDD_CGA2
C1 C2
0.33 Ω
X1VDD AVDD_SD1_PLLn
47 µF 4.7 µF 0.003 µF
NFM18PC225B1A3
VDD or linear or 2.2 µF
Bulk Decoupling
low-noise switching S1VDD
capacitors capacitors
regulator
2.2 µF
GRM155R60J225KE95
VDD or linear or
Bulk Decoupling
low-noise switching S1VDD
capacitors capacitors
regulator
2.2 µF 2700 PF
GRM155R60J225KE95 GRM155R71H272KA01
NFM18PC225B1A3
linear or 2.2 µF
Bulk Decoupling
low-noise switching X1VDD
capacitors capacitors
regulator
2.2 µF
GRM155R60J225KE95
linear or
Bulk Decoupling
low-noise switching X1VDD
capacitors capacitors
regulator
2.2 µF 2700 PF
GRM155R60J225KE95 GRM155R71H272KA01
2.2 µF
GRM155R60J225KE95
2.2 µF 2700 PF
GRM155R60J225KE95 GRM155R71H272KA01
NFM18PC225B1A3
2.2 µF
Bulk Decoupling
VDD
capacitors capacitors USB_SVDD
2.2 µF
GRM155R60J225KE95
2.2 µF 2700 PF
GRM155R60J225KE95 GRM155R71H272KA01
2.2 µF 2700 PF
GRM155R60J225KE95 GRM155R71H272KA01
5 Interface recommendations
This section details the pin termination guidelines for different interfaces. In general, any unused input pin should be
terminated by a pull down unless recommended otherwise.
Table 8. DDR4 and DDR3L SDRAM interface pin termination checklist (continued)
Signal name1 I/O Used Not used Completed
type
DDR3L signal DDR4 signal2
• For either full- or half-
driver strength calibration
of DDR IOs, use the
same MDIC resistor
value of 162 Ω.
• The memory controller
register setting can be
used to determine if
automatic calibration is
done to full- or half-drive
strength.
D1_MDM[0:3], O - These pins can be left
unconnected.
D1_MDM[8]
D1_MDQ[0:32]3 I/O - These pins can be left
unconnected.
D1_MDQS[0:3]/D1_MDQS[0:3]_B, I/O - These pins can be left
D1_MDQS[8]/D1_MDQS[8]_B unconnected.
D1_MECC[0:3] I/O - These pins can be left
unconnected.
D1_MAPAR_ERR D1_MALERT_B I Recommend that a weak pull- This pin should be pulled up to
_B up resistor (2-10 kΩ) for G1VDD.
SDRAM DDR4/DDR3L to
G1VDD.
When using discrete DRAM,
the MALERT_B pin needs a
strong pull-up resistor (50-100
Ω) to G1VDD.
D1_MAPAR_OUT O - This pin can be left
unconnected.
D1_MODT[0:1] O Ensure the MODT signals are These pins can be left
connected correctly. Two dual unconnected.
ranked DIMMs topology is not
supported on LS1043A.
For a single, dual-ranked
DIMM, consider the following
connections
• MODT(0), MCS(0),
MCKE(0)
• MODT(1), MCS(1),
MCKE(1)
Table 8. DDR4 and DDR3L SDRAM interface pin termination checklist (continued)
Signal name1 I/O Used Not used Completed
type
DDR3L signal DDR4 signal2
These pins are actively driven
during reset instead of being
released to high impedance.
D1_MRAS_B O Must be properly terminated to This pin can be left
VTT unconnected.
D1_MCAS_B O Must be properly terminated to This pin can be left
VTT unconnected.
D1_MWE_B O Must be properly terminated to This pin can be left
VTT unconnected.
D1_MVREF DDR4 Vref is IO DDR reference voltage: 0.49 x This pin must be connected to
provided G1VDD to 0.51 x G1VDD. GND.
internally, the
• D1_MVREF can be
external vref
generated using a divider
signal needs to be
from G1VDD as MVREF.
grounded when
• Another option is to use
using DDR4
supplies that generate
SDRAM
G1VDD, VTT, and
D1_MVREF voltage.
NOTE
1. DDR3L signals are muxed with DDR4 signals.
2. For DDR4, bit and byte swapping rules and layout guidelines, see the application
note Hardware and Layout Design Considerations for DDR4 SDRAM Memory
Interfaces (document AN5097).
3. When DDR4 Discrete DRAM is soldered on the board, and two chip selects are
used, and the second chip select is bit swizzling (meaning bits mapping from CS0
is additionally swapped in CS1 by swapping DQ0 with DQ1, DQ2 with DQ3, DQ4
with DQ5, and DQ6 with DQ7). Then bit map orders of 0x10 (2 1 3 0) and 0x30 (6
5 7 4) are not allowed.
NOTE
1. Stacked memory for DDR4 are not supported
2. DDR3L and DDR4 RDIMMs are not supported.
3. For devices with four ECC pins, ensure to connect one of the ECC pins to the
Prime DQ of ECC DRAM.
NOTE
The IFC interface is on OVDD power domain which is 1.8 V only.
For functional connection diagram, see the chip reference manual.
NOTE
1. Separate DIR signals are implemented to support card interrupt on DAT1 in single
bit mode.
2. SDHC_CLK_SYNC_OUT to SDHC_CLK_SYNC_IN connection is required in
SDR50 and DDR50 mode only.
3. In SDR50 and DDR50 mode, all the input signals are sampled with respect to
SDHC_CLK_SYNC_IN.
4. SDHC_CLK_SYNC_OUT and SDHC_CLK_SYNC_IN should be routed as close
as possible to the card, with minimum skew with respect to SD_CLK.
5. When using 8-bit MMC/eMMC configuration, EVDD and OVDD should be set at
same voltage.
6. As per the SD specification, a power cycle is required to reset the SD card working
on UHS-I speed mode. Board design needs to provide some mechanism to power
cycle the SD card during every reset.
7. Refer erratum GEN A-010539, which states that SDHC_CLK_SYNC_OUT,
SDHC_CLK_SYNC_IN, SDHC_VS, SDHC_DAT[4:7], SDHC_DAT0_DIR,
SDHC_DAT123_DIR, SDHC_CMD_DIR, GPIO2_[0:3] are not available when
booting from QSPI. Once the workaround is applied HRESET_B can no longer be
used. Workaround is not needed in following cases:
• When SDHC interface is not used at all.
• SDHC full speed and high speed modes when SDHC_CLK_SYNC_IN and
SDHC_CLK_SYNC_OUT are not used.
• eMMC full speed and high speed in 4 bit mode at 1.8V or 3.3V.
• eMMC HS200 in 4 bit mode and 1.8V.
3.3 V 3.3 V SD
LS1043/LS1023A
CARD
CMD, DAT[0], DAT[1:3],
CLK, CD_B, WP
Dual voltage
regulator
(3.3 V/1.8 V)
Voltage
select
SDHC_VS
R
SDHC_CLK_SYNC_OUT
SDHC_CLK_SYNC_IN
Figure 15. DS, HS, and HS200 modes for eMMC (1.8 V)
Table continues on the next page...
SDHC_CLK_SYNC_IN
NOTE
1. Interrupt polarity can be programmed through Interrupt Polarity Register
(SCFG_INTPCR). Default polarity for the IRQs is active high.
NOTE
1. JTAG_BSR_VSEL is an IEEE 1149.1 JTAG Compliance Enable pin.
• 0: normal operation.
• 1: To be compliant to the 1149.1 specification for boundary scan functions.
The JTAG compliant state is documented in the BSDL.
2. TBSCAN_EN_B is an IEEE 1149.1 JTAG Compliance Enable pin.
• 0:To be compliant to the 1149.1 specification for boundary scan functions.
The JTAG compliant state is documented in the BSDL.
• 1: JTAG connects to DAP controller for the Arm core debug.
NOTE
1. In the RCW configuration field SRDS_PLL_PD_S1, the respective bits for each
unused PLL must be set to power it down. The SerDes module is disabled when
both of its PLLs are turned off.
2. After POR, if an entire SerDes module is unused, it must be powered down by
clearing the SDEN fields of its corresponding PLL1 and PLL2 reset control
registers (SRDSxPLLaRSTCTL).
3. Unused lanes must be powered down by clearing the RRST_B and TRST_B fields
and setting the RX_PD and TX_PD fields in the corresponding lane's general
control register (SRDSxLNmGCR0).
4. A spread-spectrum reference clock is permitted for PCI Express. However, if any
other high-speed interface, such as SGMII or SATA, is used concurrently on the
same SerDes bank, spread-spectrum clocking is not permitted.
5. If SerDes lanes are routed to a backplane slot or a PCIe connector, SerDes pins can
be left unterminated even if the link partner card is not present. If some SerDes
lanes are a no-connect, pull down their receiver pins to GND. Then, if the SerDes
block is powered, refer to the RM’s Unused Lanes section for directions on how to
power them down. To power down a SerDes lane, configure the General Control 0
register during the PBI phase. If the whole SerDes block is already powered down,
there is no need to individually power down a lane.
Since the channel characteristics is board and layout dependent, NXP cannot quantify the actual channel loss introduced
during board design, layout and fabrication of all end product systems for our customers. Customers should always perform
board level simulation and also use other appropriate tool (for example, NXP’s SerDes Validation Tool) and/or instrument to
determine whether the SerDes channels (lanes) are in high loss condition and then adopt the best setting suitable for their end
product and application. Instead of quantifying a SerDes channel as high or non-high loss, a more practical way is to try both
the 1b and 0b settings and find out which setting yields better signal integrity for the customer’s particular end product
system or board.
Once determined that the channels are in non-high loss condition, the Rx Equalization Boost bit for all the lanes in use should
be set to 0b during the Pre-boot Initialization (PBI) stage.
Since the Rx Equalization Boost bit is defined in different SerDes registers depending on the SerDes protocols in use, it is
important to select the appropriate SerDes register with the correct offset and value as described below when implementing
the register write in PBI. The SerDes registers involved are defined on a per lane basis. Therefore, PBI register write must be
implemented for all the lanes utilized for the affected SerDes protocols and speeds.
• For SATA 6 Gbaud:
• Perform a PBI write to each lane’s LNaSSCR1 register with a value of 0x0050_2880, which sets this lane’s Rx
Equalization Boost bit, LNaSSCR1 [RXEQ_BST_1] to 0b.
• For XFI 10.3125 Gbaud:
• Perform a PBI write to each lane’s LNaRECR0 register with a value of 0x0000_045F, which sets this lane’s Rx
Equalization Boost bit, LNaRECR0 [RXEQ_BST] to 0b.
NOTE
USB3.0 PLLs can receive clock either from SYSCLK or DIFF_SYSCLK/
DIFF_SYSCLK_B. Ensure that clock selected has 100 MHz frequency.
USB1_DRVVBUS
VBUS VBUS charge
(USB connector) pump USB1_PWRFAULT
USB1_VBUS
Chip
Table 24. Ethernet Management Interface (EMI1/2) pin termination checklist (continued)
Signal Name IO type Used Not Used Completed
EMI2_MDIO IO The functionality of this signal is
determined by the EM1 field in the
reset configuration word
(RCW[EM2]).
To configure as open drain signal,
write to EMI1_DMODE field in
reset configuration word
(RCW[EMI2_DMODE]).4,6
NOTE
1. Refer Ethernet A-010717: EMI -MDIO to MDC input hold time (tMDDXKH)
specification violation from LS1043A Chip errata.
2. For MDC frequency greater than 2.5 MHz and less than (or equal to) 10 MHz, the
load on the MDC/MDIO pads must not exceed 75pf.
3. If configured as open-drain, pull this pin to LVDD with a suitable resistor.
4. If configured as open-drain, pull this pin to TVDD with a suitable resistor.
5. In open-drain mode, the value of pull-up resistor depends on input impedance of all
the peripherals connected on EMI bus. More the peripherals or more the
impedance, stronger the pull-up. Typically 200Ω pull-up should suffice for 3-4
peripherals. Unless there is a requirement of MDC being an open-drain, it is
advised to configure MDC in "normal functional" mode. In "normal functional"
mode, the MDC will be actively driven and pull up resistors are not required.
6. In open-drain mode, the value of pull-up resistor depends on input impedance of all
the peripherals connected on EMI bus. More the peripherals or more the
impedance, stronger the pull-up. Typically 330Ω pull-up should suffice for 3-4
peripherals. Unless there is a requirement of MDIO being an open-drain, it is
advised to configure MDIO in "normal functional" mode. In "normal functional"
mode, the MDIO will be actively driven. A pull up resistors might still be required
as the peripherals on EMI bus might have their MDIO pins configured as open-
drain. The value of pull-up resistor depends on total input impedance of all the
peripherals connected.
NOTE
1. Either of the EC1_GTX_CLK125 or EC2_GTX_CLK125 can be used to clock
both the EC interfaces in RGMII mode. The selection is through
SCFG_ECGTXCMCR[CLKSEL]. The unused clock pin should be pulled to GND.
NOTE
1. QSPI signals are multiplexed with IFC signals and only select lines are available on
IFC when QSPI is used.
2. To avoid glitches or noise on chip select, it is recommended to use series resistor of
22Ω to 68Ω along with a 20pf capacitor to GND. The capacitor should be placed
close to the receiver.
3. If RCW[IFC_GRP_A_EXT] = 001, then IFC_A26 and IFC_A27 should be pulled
to GND through 4.7 kΩ resistor. Otherwise, these pins should be configured as
output GPIOs and left as unconnected.
NOTE
1. The names in above table follow the following nomenclature:
X(Y) : Name in 21x21, 621 ball package (Name in 23x23, 780 ball package).
2. SPI_CLK is available only when RCW[SPI_EXT]=000 and RCW[SPI_BASE]=00.
Master mode requires that SPI_CLK is generated by Master, therefore only
RCW[SPI_EXT]=000 and RCW[SPI_BASE]=00 can be used for SPI controller on
this device although some SPI signals are also available when
RCW[SPI_EXT]=001/010.
TSEC_1588_CLK_OUT O
TSEC_1588_PULSE_O O
UT1
NOTE
When configured for IEEE 1588, the EC2 pins those are not available for IEEE 1588, are
configured for GPIO. All IEEE 1588 pins are referenced to LVDD.
NOTE
1. If on-board programming of NOR and NAND boot flash, QSPI boot flash, or SD
card is needed, then maintain an option (may be via a jumper) that keeps
PORESET_B and RESET_REQ_B disconnected from each other. Booting from a
blank flash causes boot error, which in turn causes assertion of RESET_REQ_B.
When RESET_REQ_B is connected with PORESET_B, the device goes in a
recurring reset loop and does not provide enough time for JTAG to take control of
the device and perform any operation.
2. For RCW override, RESET_REQ_B should be disconnected from PORESET_B or
HRESET_B. An option on board is required.
VDD 1 2 TMS
GND 3 4 TCK
GND 5 6 TDO
KEY
KEY 8 TDI
No pin
GNDDetect 9 10 nRESET
NOTE: The Arm Cortex 10-pin header adds many benefits such as breakpoints, watch points, register and
memory examination/modification, and other standard debugger features. An inexpensive option is to
leave the Arm Cortex 10-pin header unpopulated until needed.
Correct operation of the JTAG interface requires configuration of a group of system control pins as demonstrated in Figure
18. Care must be taken to ensure that these pins are maintained at a valid deasserted state under normal operating conditions,
as most have asynchronous behavior and spurious assertion gives unpredictable results.
1 kΩ
OVDD
nRESET 10 kΩ
10
10 kΩ
OVDD
10 kΩ TRST_B
Other TRST_B source
(for example, boundary scan)
1 2
10 Ω
VDD
3 4
1
5 6
Arm Cortex 10-pin header
KEY
8
No pin
9 10
TMS
2 TMS
TDI
8 TDI
TCK
4 TCK
GNDDetect1 10 kΩ
9
GND
5
GND
3
Note:
1. GNDDetect is an optional board feature. Check with 3rd-party tool vendor.
2. This switch is included as a precaution for BSDL testing. The switch should be open during BSDL testing
to avoid accidentally asserting the TRST line. If BSDL testing is not being performed, ensure this switch is closed.
connections. Where the board does not have blind vias, these capacitors should be placed in a ring around the device as
close to the supply and ground connections as possible.
2. Between the device and any SerDes voltage regulator, there should be a lower bulk capacitor. For example, a 10 uF,
low ESR SMT tantalum or ceramic capacitor. There should also be a higher bulk capacitor. For example, a 100-300 uF
low ESR SMT tantalum or ceramic capacitor.
NOTE
Only SMT capacitors should be used to minimize inductance. Connections from all
capacitors to power and ground should be done with multiple vias to further reduce
inductance.
NOTE
1. In the "Single Oscillator Source" reference clock mode supported by LS1043A,
DIFF_SYSCLK/DIFF_SYSCLK_B (differential) clock inputs are used as primary
clock inputs and SYSCLK is unused. Power-on-configuration signal cfg_eng_use0
selects between SYSCLK (single ended) and DIFF_SYSCLK/DIFF_SYSCLK_B
(differential) clock inputs.
2. In the "Single Oscillator Source" reference clock mode, DIFF_SYSCLK/
DIFF_SYSCLK_B clock inputs can be selected to feed the DDR PLL. RCW bits
[DDR_REFCLK_SEL] are used for this selection and DDRCLK is unused. The
options for RCW bits 186-187 (RCW[DDR_REFCLK_SEL], DDR reference clock
selection) are as follows:
a. 2'b00: The DDRCLK pin provides the reference clock to the DDR PLL
b. 2'b01: DIFF_SYSCLK/DIFF_SYSCLK_B provides the reference clock to
the DDR PLL
3. When SYSCLK is chosen as the primary clock input to the chip, these pins are
unused.
4. Either of the EC1_GTX_CLK125 or EC2_GTX_CLK125 can be used to clock
both the EC interfaces in RGMII mode. The selection can be made through
SCFG_ECGTXCMCR[CLKSEL].
• DDR PLL
• SerDes PLLs
The reset configuration field identifies whether the SYSCLK (single-ended) or DIFF_SYSCLK (differential) is selected as
the clock input to the chip.
The RCW[DDR_REFCLK_SEL] bit is used to select clock input (DIFF_SYSCLK or DDRCLK) to the DDR PLL.
The following figure shows the system view of single oscillator source clocking. In this figure, the on-board oscillator
generates three differential clock outputs. The first differential output is used to provide the clock to system clock associated
PLLs and DDR PLL. However, the second and third differential outputs are used to provide clocks to SerDes PLLs.
A multiplexer between system clock and USBCLK is used to provide the USB PHY reference clock to the USB PLL. And,
multiplexer between DIFF_SYSCLK/DIFF_SYSCLK_B inputs and DDRCLK is used to provide reference clock to the DDR
PLL.
The duty cycle reshaper reshapes the 125 MHz ECn_GTX_CLK125 which is fed into frame manager for transmission as
ECn_GTX_CLK.
SYS_REF_CLK
Core PLL
DIFF_SYSCLK_B/DIFF_SYSCLK
400 MHZ
Platform PLL
Platform Clock
On Board RCW[SYS_PLL_CFG]
Oscillator RCW[SYS_PLL_RAT]
RCW[SYS_PLL_SPD]
100 MHZ
3 Differential outputs
(SCFG_USB_REFCLK_SELCR[1-3])
cfg_eng_use0
SD1_REF_CLK1_P/SD1_REF_CLK1_N
SD1_REF_CLK2_P/SD1_REF_CLK2_N
MUX
USB PHY
3 instances
USBCLK
usb phy clk
MUX
1G-1.6G
DDR Controller
DDR
PLL
DDRCLK
RCW[MEM_PLL_RAT]
RCW[MEM_PLL_CFG]
RCW[DDR_REFCLK_SEL] RCW[MEM_PLL_SPD]
SerDes PLL1
SerDes PLL2
DIFF_SYSCLK
100 Ohm LVDS
RX
DIFF_SYSCLK_B
DIFF_SYSCLK
CLK_Out
33Ω
LVDS CLK
Clock 100 Ω differential PWB trace 100 Ω Receiver
33Ω
DIFF_SYSCLK_B
CLK_Out
NXP device
LVDS CLK Driver chip
CLK_Out DIFF_SYSCLK
LVDS CLK
Clock 100 Ω differential PWB trace 100 Ω Receiver
CLK_Out DIFF_SYSCLK_B
LVPECL CLK
Driver chip NXP device
CLK_Out DIFF_SYSCLK
R2
R1 LVDS CLK
Clock 100 Ω differential PWB trace 100 Ω Receiver
R2
CLK_Out DIFF_SYSCLK_B
R1
R1=140 Ω to 240 Ω
Single-ended
CLK driver chip
DIFF_SYSCLK
33 Ω
Clock
DIFF_SYSCLK_B
OVDD/2
Table 46. Processor, platform, and memory clocking specifications (VDD = 1.0 V)
Characteristic Maximum processor core frequency Unit Notes
1000 MHz 1200 MHz 1400 MHz 1600 MHz
Min Max Min Max Min Max Min Max
Core cluster group PLL 1000 1000 1000 1200 1000 1400 1000 1600 MHz 1
frequency
Platform clock frequency 256 300 256 300 256 300 256 400 MHz 1
Memory Bus Clock Frequency 500 800 500 800 500 800 500 800 MHz 1, 2, 3
(DDR3L)
Memory Bus Clock Frequency 650 800 650 800 650 800 650 800 MHz 1, 3
(DDR4)
IFC clock frequency - 100 - 100 - 100 - 100 MHz 4
FMan 350 500 350 500 350 500 350 500 MHz
1. Caution:The platform clock to SYSCLK ratio and core to SYSCLK ratio settings must be chosen such that the resulting
SYSCLK frequency, core frequency, and platform clock frequency do not exceed their respective maximum or minimum
operating frequencies.
2. The memory bus clock speed is half the DDR3L/DDR4 data rate. DDR3L memory bus clock frequency is limited to min =
1000 MT/s whereas DDR4 memory bus clock frequency is limited to min = 1300 MT/s.
3. The memory bus clock speed is dictated by its own PLL.
4. The integrated flash controller (IFC) clock speed on IFC_CLK[0:1] is determined by the IFC module input clock (platform
clock / 2) divided by the IFC ratio programmed in CCR[CLKDIV]. See the chip reference manual for more information.
5. The minimum platform frequency should meet the requirements in Minimum platform frequency requirements for high-
speed interfaces.
6. For supported voltage/frequency options, refer to orderable part list of QorIQ LS1043A and LS1023A Multicore
Communications Processors at www.nxp.com
The clock ratio between each SerDes PLLs and their respective externally supplied SD1_REF_CLKn_P/SD1_REF_CLKn_N
inputs is determined by a set of RCW configuration fields, SRDS_PRTCL_S1, SRDS_PLL_REF_CLK_SEL_S1, and
SRDS_DIV_PEX as shown in this table.
Table 56. SYSCLK multiplier/frequency options when eSDHC operates in High Speed mode
(clocked by CGA PLL2 / 1) (continued)
Core cluster: SYSCLK Ratio SYSCLK (MHz)
64.00 66.67 100.00
Resultant Frequency (MHz)1
18:1 1152 1200
Notes:
1. Resultant frequency values are shown rounded up to the nearest whole number (decimal place accuracy removed)
2. For Low speed operation, eSDHC is clocked from Platform PLL and does not use CGA PLL2.
16
7 Thermal
This section discusses the thermal model and management of the chip.
Adhesive or
thermal interface material
Die
Printed circuit-board
This figure shows the primary heat transfer path for a package with an attached heat sink mounted to a printed-circuit board.
Heat sink
Die/Package
Package/Solder balls
Printed-circuit board
8 Revision history
This table summarizes changes to this document.
Table 58. Revision history
Revision Date Change
5 05/2020 • Added general description for unused pins of different interfaces in Interface recommendations
• In Ethernet controller pin termination recommendations
• Updated description for unused pins
• Added "The unused clock pin should be pulled to GND." in note 1
• Added note 3 regarding the IFC_A26 and IFC_A27 pin termination in QSPI pin termination
recommendations
4 11/2019 • Added "QorIQ" in the main heading
• Changed "ARM" as "Arm"
• Updated Core Reference Manual information in Recommended resources
• Removed Signal type column, updated format and added note for USB power supplies in
Power pin recommendations
• In Core and platform supply voltage filtering, updated "as defined per datasheet" to "based on
maximum power in the datasheet" of Power system-level recommendations
• Updated sentence to "USB_SVDD and USB_SDVDD must be provided by the VDD power
supply." in Power system-level recommendations
• In Power-on reset recommendations
• Replaced "PLL configuration inputs must meet a 100 µs set-up time to HRESET_B" with
"other than cfg_eng_use0"
• Added "1ms after VDD ramps up during PORESET_B assertion"
• Corrected "configuration signals to the chip when HRESET_B is asserted" to
"configuration signals to the chip when PORESET_B is asserted"
• In Configuration signals sampled at reset
• Updated information regarding LS1043A datasheet
• Provided JTAG configuration files path
• Removed "It is recommened to keep provision for optional pull-down resistor on board."
from cfg_eng_use2
• In Hard-Coded RCW
• Added 0x9F hard-coded RCW option
• Updated note regarding DDR CLK reference clock when 0x9A, 0x9E or 0x9F hard-coded
RCW option is selected
• Added note for referring AN12081
• Corrected typo "HRESET_REQ_B" to "RESET_REQ_B"
• In DDR4 and DDR3L SDRAM interface pin termination recommendations
• Updated description for not used D1_MCK pins
• Added description for MALERT_B pin when discrete DRAM is used
• Removed RDIMM information as DDR3L and DDR4 RDIMMs are not supported
• Changed name from D1_MAPAR to D1_MAPAR_OUT
• Changed IO type of D1_MVREF from I to IO
• Added note for case when discrete DDR4 DRAM is used with two chip selects
• In DDR system-level recommendations
• Added CKE termination requirement during self refresh
• Updated note 2 as "DDR3L and DDR4 RDIMMs are not supported."
• In IFC pin termination recommendations
• Changed IO type of IFC_PERR_B from O to I
• Updated description for not used IFC_PERR_B pins
• Changed IFC_RB[0:1]_B to IFC_RB[0:3]_B
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