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Qoriq Ls1043A Design Checklist: 1 About This Document

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453 views

Qoriq Ls1043A Design Checklist: 1 About This Document

Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
You are on page 1/ 69

NXP Semiconductors Document Number: AN5012

Application Note Rev. 5, 05/2020

QorIQ LS1043A Design Checklist

Contents

1 About this document 1 About this document........................... ...................... 1

This document provides recommendations for new designs 2 Before you begin............................... ........................1
based on the LS1043A/LS1023A processor, which is a cost- 3 Simplifying the first phase of design.........................2
effective, power-efficient, and highly integrated system-on-
chip (SoC) design that extends the reach of the NXP Value 4 Power design recommendations.......... ..................... 5
Performance line of QorIQ communications processors. 5 Interface recommendations......................................16
This document can also be used to debug newly-designed 6 Hardware design considerations........ ..................... 53
systems by highlighting those aspects of a design that merit
special attention during initial system start-up. 7 Thermal................................ ................................... 62

NOTE 8 Revision history.......................... ............................ 65


This document applies to the LS1043A and
LS1023A devices. For a list of functionality
differences, see the appendices in QorIQ
LS1043A Reference Manual (document
LS1043ARM).

2 Before you begin


Ensure you are familiar with the following NXP collateral
before proceeding:
• QorIQ LS1043A, LS1023A Data Sheet (document
LS1043A)
• QorIQ LS1043A Reference Manual (document
LS1043ARM)
Simplifying the first phase of design

3 Simplifying the first phase of design


Before designing a system with the chip, it is recommended that you familiarize yourself with the available documentation,
software, models, and tools.
This figure shows the major functional units within the LS1043A chip.

Arm® Cortex ®-A53


ARM Cortex-
ARM
64-bit Cortex-
Core
A53 64b Cores
A53 ARM
64b Cores
Cortex-
A53
ARM64b Cores
Cortex-
32 KB 32 KB
32 KB A53 64b 32 KB
Cores
32 KB
D-Cache 32 KB
I-Cache
D-Cache I-Cache
D-Cache
32 KB I-Cache
32 KB 32-bit
D-Cache I-Cache DDR3L/4
Memory Controller
1 MB L2 - Cache

Secure Boot

Trust Zone CCI-400™ Coherency Fabric


Power Management SMMUs
IFC, QuadSPI, SPI

Security Real Time Debug


SD/SDIO/eMMC Queue Frame Manager
Engine
Manager

PCI Express 2.0


PCI Express 2.0
PCI Express 2.0
(SEC)

QUICC Engine
DMA
Parse, classify, Watchpoint

SATA 3.0
Cross
2x DUART distribute Trigger

4x I2C, 4x GPIO
Perf Trace
Buffer 1G 1G 1G 1/2.5G Monitor
8x FlexTimer Manager
1G 1G 1/2.5/10G
3x USB3.0 w/PHY

6x LPUART DPAA Hardware


4-Lane, 10 GHz SerDes

Core Complex
Accelerators and Memory Control
Basic Peripherals, Interconnect and Debug
Networking Elements

Figure 1. LS1043A block diagram


This figure shows the major functional units within the LS1023A chip.

QorIQ LS1043A Design Checklist , Rev. 5, 05/2020


2 NXP Semiconductors
Simplifying the first phase of design

Arm® ARM
Cortex ®-A53
Cortex-
ARM
64-bit Cortex-
Core
A53 64b Cores
A53 ARM
64b Cores
Cortex-
A53
ARM64b Cores
Cortex-
32 KB 32 KB
32 KB A53 64b 32 KB
Cores
32
32 KB
D-Cache
KB 32
32 KB
I-Cache KB 32-bit
D-Cache I-Cache
D-Cache
D-Cache I-Cache
I-Cache DDR3L/4
Memory Controller
1 MB L2 - Cache

Secure Boot

Trust Zone CCI-400™ Coherency Fabric


Power Management SMMUs
IFC, QuadSPI, SPI

Security Real Time Debug


SD/SDIO/eMMC Queue Frame Manager

PCI Express 2.0

PCI Express 2.0


PCI Express 2.0
Engine
Manager
DMA (SEC)

QUICC Engine
Parse, classify, Watchpoint

SATA 3.0
Cross
2x DUART distribute Trigger

4x I2C, 4x GPIO
Perf Trace
Buffer 1G 1G 1G 1/2.5G Monitor
8x FlexTimer Manager
1G 1G 1/2.5/10G
3x USB3.0 w/PHY

6x LPUART DPAA Hardware


4-Lane 10 GHz SerDes

Core Complex
Accelerators and Memory Control
Basic Peripherals, Interconnect and Debug
Networking Elements

Figure 2. LS1023A block diagram

3.1 Recommended resources


This table lists helpful tools, training resources, and documentation, some of which may be available only under a non-
disclosure agreement (NDA). Contact your local field applications engineer or sales representative to obtain a copy.
Table 1. Helpful tools and references
ID Name Location
Related collateral
LS1043ACE LS1043A Chip Errata Contact your NXP
representative
NOTE: This document describes the latest fixes and workarounds for the
chip. It is strongly recommended that this document be thoroughly
researched prior to starting a design with the chip.
LS1043A QorIQ LS1043A, LS1023A Data Sheet www.nxp.com
LS1043AFS QorIQ LS1043A and LS1023A Communication Processors - Fact Sheet www.nxp.com
LS1043ARM QorIQ LS1043A Reference Manual www.nxp.com
LS1043APB QorIQ LS1043A Product Brief www.nxp.com
AN5125 Introduction to Device Trees - Application note
Arm® Cortex®-A53 MPCore Processor Technical - Reference Manual Attached with LS1043ARM
Revision: r0p4
AN4871 Assembly Handling and Thermal Solutions for Lidless Flip Chip Ball Grid www.nxp.com
Array Packages

Table continues on the next page...

QorIQ LS1043A Design Checklist , Rev. 5, 05/2020


NXP Semiconductors 3
Simplifying the first phase of design

Table 1. Helpful tools and references (continued)


ID Name Location
AN5080 QorIQ P1xxx series to LS1043A Migration Guide - Application Note Contact your NXP reprentative
AN5097 Hardware and Layout Design Considerations for DDR4 SDRAM Memory www.nxp.com
Interfaces - Application Note
AN4311 SerDes Reference Clock Interfacing and HSSI Measurements www.nxp.com
Recommendations
AN3940 Hardware and Layout Design Considerations for DDR3 SDRAM Memory www.nxp.com
Interfaces
Software tools
CodeWarrior Development Software for ARM® v8 64-bit based QorIQ LS- www.nxp.com
Series Processors
Software Development Kit for LS1043A www.nxp.com
Hardware tools
CodeWarrior TAP www.nxp.com
QorIQ LS Processor Probe Tips for CodeWarrior TAP www.nxp.com
QorIQ LS1043A reference design board www.nxp.com
Models
IBIS To ensure first path success, NXP strongly recommends using the IBIS Contact your NXP
models for board-level simulations, especially for SerDes and DDR representative
characteristics.
BSDL Use the BSDL files in board verification. Contact your NXP
representative
Flotherm Use the Flotherm model for thermal simulation. Especially without forced Contact your NXP
cooling or constant airflow, a thermal simulation should not be skipped. representative
Available training
- Our third-party partners are part of an extensive alliance network. More www.nxp.com/alliances
information can be found at www.NXP.com/alliances.
- Training materials from past Smart Network Developer's Forums and NXP www.nxp.com/alliances
Technology Forums (FTF) are also available at our website. These training
modules are a valuable resource for understanding the chip.

NOTE
Design requirements in the device datasheet supersede requirements mentioned in design
checklist and design requirements mentioned in design checklist supersede the design/
implementation of the NXP reference design (RDB) system.

3.2 Product revisions


This table lists the System Version Register (SVR) and Arm Core main ID register (TRCIDR1) values for the various chip
silicon derivatives.

QorIQ LS1043A Design Checklist , Rev. 5, 05/2020


4 NXP Semiconductors
Power design recommendations

Table 2. Chip product revisions (21x21 package)


Part (21x21 Arm® Arm Core System Version Register Value Note
package) Cortex®-A53 Main ID
Silicon Rev 1.0 Silicon Rev 1.1
MPCore Register
Processor
Revision
LS1043A r0p4 0x4100_0404h 0x8792_0110h 0x8792_0111h Without Security
LS1043AE r0p4 0x4100_0404h 0x8792_0010h 0x8792_0011h With Security
LS1023A r0p4 0x4100_0404h 0x8792_0910hh 0x8792_0911h Without Security
LS1023AE r0p4 0x4100_0404h 0x8792_0810h 0x8792_0811h With Security

Table 3. Chip product revisions (23x23 package)


Part (23x23 Arm® Arm Core System Version Register Value Note
package) Cortex®-A53 Main ID
Silicon Rev 1.0 Silicon Rev 1.1
MPCore Register
Processor
Revision
LS1043A r0p4 0x4100_0404h 0x8792_0310h 0x8792_0311h Without Security
LS1043AE r0p4 0x4100_0404h 0x8792_0210h 0x8792_0211h With Security
LS1023A r0p4 0x4100_0404h 0x8792_0B10h 0x8792_0B11h Without Security
LS1023AE r0p4 0x4100_0404h 0x8792_0A10h 0x8792_0A11h With Security

4 Power design recommendations

4.1 Power pin recommendations


Table 4. Power and ground pin termination checklist
Signal name Used Not used Completed
AVDD_CGA1 Power supply for cluster 1.8 V (through a filter) Must remain powered
group A PLL 1 supply
AVDD_CGA2 Power supply for cluster 1.8 V (through a filter) Must remain powered
group A PLL 2 supply
AVDD_D1 Power supply for DDR1 1.8 V (through a filter) Must remain powered
PLL
AVDD_PLAT Power supply for 1.8 V (through a filter) Must remain powered
Platform PLL
AVDD_SD1_PLL1 Power supply for 1.35 V (SerDes, filtered Must remain powered
SerDes1 PLL 1 from X1VDD) (no need to filter from
X1VDD)

Table continues on the next page...

QorIQ LS1043A Design Checklist , Rev. 5, 05/2020


NXP Semiconductors 5
Power design recommendations

Table 4. Power and ground pin termination checklist (continued)


Signal name Used Not used Completed
AVDD_SD1_PLL2 Power supply for 1.35 V (SerDes, filtered Must remain powered
SerDes1 PLL 2 from X1VDD) (no need to filter from
X1VDD)
VDD Core and platform 0.9/1.0 V Must remain powered
supply voltage
S1VDD Core power supply for 0.9/1.0 V Must remain powered
the SerDes logic
transceiver
EVDD eSDHC[0-3]/CLK/CMD, 1.8/3.3 V Must remain powered
GPIO2,LPUART2_CTS
_B,LPUART2_RTS_B,
LPUART3,LPUART5,
LPUART6,
FTM4_CH6/7,FTM4_E
XTCLK/FAULT/
QD_PHA/QD_PHB
DVDD DUART1/2, I2C, DMA, 1.8/3.3 V Must remain powered
QE,
LPUART1,LPUART2_S
OUT/SIN, LPUART4,
GPIO1, GPIO4,GIC
(IRQ 3/4/5/6/7/8/9/10),
FTM 3/8, USB
Control(DRVVBUS,
PWRFAULT),
FTM4_CH0/1/2/3/4/5
G1VDD Power supply for the 1.35 V for DDR3L Must remain powered
DDR3L/DDR4
1.2 V for DDR4
TVDD Ethernet management 1.2/1.8/2.5 V Must remain powered
interface 2 (EMI2)
LVDD Ethernet Interface 1/2, 1.8/2.5 V Must remain powered
Ethernet management
interface 1 (EMI1),
TSEC_1588, GPIO1,
GPIO3,FTM1/2, GIC
(IRQ11)
OVDD IFC, SPI, GIC (IRQ 1.8 V Must remain powered
0/1/2), Temper_Detect,
System control and
power management,
SYSCLK,DDR_CLK,
DIFF_SYSCLK, GPIO2,
GPIO1,eSDHC[4-7]/VS/
DAT123_DIR/
DAT0_DIR/CMD_DIR/
SYNC), Debug,
SYSCLK, JTAG, RTC,
FTM5/6/7,POR signals
X1VDD Pad power supply for 1.35 V Must remain powered
the SerDes transceiver

Table continues on the next page...

QorIQ LS1043A Design Checklist , Rev. 5, 05/2020


6 NXP Semiconductors
Power design recommendations

Table 4. Power and ground pin termination checklist (continued)


Signal name Used Not used Completed
TA_PROG_SFP SFP fuse programming Should only be supplied 1.8V during secure boot
override supply programming. For normal operation, this pin
needs to be tied to GND through a 330 Ω
resistor.
PROG_MTR This pin must be pulled to GND through a 330 Ω resistor.
FA_VL This pin must be pulled to GND through a 330 Ω resistor.
TA_BB_VDD Battery backed security 0.9V/1.0 V This signal should be
monitor supply connected to 0.9V/1.0V
VDD supply.
TH_VDD Thermal monitor unit 1.8 V Must remain powered
supply
USB_HVDD2 USB PHY Transceiver 3.3 V Tie to GND
supply
USB_SDVDD2 Analog and Digital HS 0.9/1.0 V Tie to GND
supply for USBPHY
USB_SVDD2 Analog and Digital SS 0.9/1.0 V Tie to GND
supply for USBPHY
SENSEVDD VDD sense pin Connect to regulator feedback.
GND Core, platform and PLL GND Tie to GND
ground
SENSEGND GND sense pin Connect to regulator feedback.
SD_GND GND pin for SerDes GND Tie to GND
and PLL supplies

NOTE
1. For supported voltage/frequency options, refer to orderable part list of QorIQ
LS1043A and LS1023A Multicore Communications Processors at www.nxp.com
2. If all USB power supplies are connected to GND when USB is not used, the JTAG
IEEE Std 1149.1-2001 Boundary Scan Register (BSR) will not shift contents
between TDI and TDO. USB_SVDD must be powered in order for the USB BSR
cells to shift. In this case, the USB boundary cells cannot observe or control USB
pins. This affects the USB BSR cells during EXTEST, EXTEST_PULSE,
EXTEST_TRAIN, CLAMP and SAMPLE. The only fails are related to USB IO’s
when USB_SVDD is powered on, and USB_SDVDD and USB_HVDD are
powered off. If all USB power supplies are connected to GND, the other 1149.1
JTAG or DAP debug instructions will still operate.

4.2 Power system-level recommendations


Table 5. Power design system-level checklist
Item Completed
General
Ensure to meet all of the requirements in the data sheet, including power sequencing, power down
requirements, THERMAL and MAXIMUM power dissipation, I/O power dissipation, and power on ramp rate.

Table continues on the next page...

QorIQ LS1043A Design Checklist , Rev. 5, 05/2020


NXP Semiconductors 7
Power design recommendations

Table 5. Power design system-level checklist (continued)


Item Completed
Ensure the PLL filter circuit is applied to AVDD_PLAT, AVDD_CGA1, AVDD_CGA2, AVDD_D1. See the "PLL
power supply filtering" section of this table.
If SerDes is enabled, ensure the PLL filter circuit is applied to the respective AVDD_SD1_PLL1,
AVDD_SD1_PLL2 pins. Otherwise, a filter is not required. Even if an entire SerDes module is not used, the
power is still needed to the AVDD pins. However, instead of using a filter, it needs to be connected to the
XVDD rail through a 0 Ω resistor. See the "PLL power supply filtering" section of this table.
Ensure the PLL filter circuits are placed as close to the respective AVDD_SD1_PLL1, AVDD_SD1_PLL2 pin
as possible. If possible, a small cap for the filter should be placed directly at the pin. If no small cap for the
filter is available, consider at least a standard decoupling cap, such as 0.1 μF.
General Power supply decoupling
Because of large address and data buses and high operating frequencies, the device can generate transient
power surges and high frequency noise in its power supply, especially while driving large capacitive loads.
This noise must be prevented from reaching other components in the system, and the device itself, so this
requires a clean, tightly regulated source of power. Therefore, it is recommended that the system designer
place at least one decoupling capacitor at each VDD, TA_BB_VDD, OVDD, TVDD, EVDD, DVDD, LVDD, G1VDD,
S1VDD, X1VDD pin of the device. These decoupling capacitors should receive their power from separate
VDD, TA_BB_VDD, OVDD, TVDD, EVDD, DVDD, LVDD, G1VDD, S1VDD, X1VDD and GND power planes in the
PCB, utilizing short traces to minimize inductance. Capacitors may be placed directly under the device using
a standard escape pattern. Others may surround the part.
These capacitors typically should have a value of approximately 0.1 µF. However, larger values available in
the given package, such as 10 µF for 0402 (supports 1.0 mm pitched parts) or 4.7 µF for 0201 (supports 0.8
mm pitched parts), may be used to provide both decoupling and intermediate capacitance for the power
supply design. For example, a system may have 0.1 µF at the pin, but also needs 22 µF intermediate
capacitance outside the package. Given routing escape density, it may be more beneficial to remove the 22
µF caps and replace the 0.1 µF with 4.7 µF to 10 µF 0201/0402. Thus, it allows more room for routing to
escape as an option. It is best to have one decoupling capacitor at each pin location. Only ceramic surface
mount technology (SMT) capacitors should be used to minimize lead inductance, preferably 0402 or 0603
sizes for 1 mm pitched parts and 0201 for 0.8 mm pitched parts.
As presented in the "Core and platform supply voltage filtering" section of this table, it is recommended that
there be several medium and large sized bulk storage capacitors distributed around the PCB, feeding the
VDD and other planes (for example, TVDD, EVDD, DVDD, LVDD, G1VDD, and so on), to enable quick
recharging of the smaller chip capacitors.
Provide sufficiently-sized power planes for the respective power rail. Use separate planes if possible; split
(shared) planes if necessary. If split planes are used, ensure that signals on adjacent layers do not cross
splits. Avoid splitting ground planes at all costs.
Ensure the bulk capacitors have a low ESR rating to ensure the quick response time necessary.
Ensure the bulk capacitors are connected to the power and ground planes through two vias, as necessary,
to minimize inductance.
Ensure you work directly with your power regulator vendor for best values and types of bulk capacitors. The
capacitors need to be selected to work well with the power supply to be able to handle the chip's power
requirements. Most regulators perform best with a mix of ceramic and other low ESR types, such as
OSCON, POS, and other types of capacitor technologies.
Core and platform supply voltage filtering
The VDD supply is normally derived from a high current switching power supply, which can regulate its output
voltage very accurately despite changes in current demand from the chip within the regulator's relatively low
bandwidth. Several bulk capacitors must be distributed around the PCB to supply transient current demand
above the bandwidth of the voltage regulator.
Bulk capacitors should have a low equivalent series resistance (ESR) rating to ensure the necessary
response time. They should also be connected to the power and ground planes through two vias at each
side, if necessary, to minimize inductance. However, customers should work directly with their power
Table continues on the next page...

QorIQ LS1043A Design Checklist , Rev. 5, 05/2020


8 NXP Semiconductors
Power design recommendations

Table 5. Power design system-level checklist (continued)


Item Completed
regulator vendor for best values and types of bulk capacitors. Most power supply designs work well with
small ceramic caps at each pin, as discussed in the "General power supply decoupling" section of this table.
But also nearby the SoC should be intermediate caps, such as 22 µF ceramic and larger 330 to 560 µF POS
type caps, as an example. As a guideline for customers and their power regulator vendors, NXP
recommends that these bulk capacitors should be chosen to maintain the positive transient power surges to
less than VDD + 50 mV (negative transient undershoot should comply with specification of VDD - 30 mV) for
current steps of up to 50% to 100% rise and 100% to 50% of max current (based on maximum power in the
datasheet) with a slew rate of 7 A/us. These bulk decoupling capacitors will ideally supply a stable voltage
for current transients into the MHz range. See the "General power supply decoupling" section of this table
for further decoupling recommendations.
PLL supply filtering (core, platform, DDR, filtered from 1.8 V source)
All PLLs are provided with power through independent power supply pins (AVDD_PLAT, AVDD_CGA1/2, and
AVDD_D1 voltages must be derived directly from a 1.8 V voltage source, such as OVDD, through a low
frequency filter. The recommended solution for this type of PLL filtering is to provide independent filter
circuits per PLL power supply, one for each of the AVDD pins. By providing independent filters to each PLL,
the opportunity to cause noise injection from one PLL to the other is reduced. This circuit is intended to filter
noise in the PLL's resonant frequency range from a 500 kHz to 10 MHz range.

Provide independent filter circuits per PLL power supply, as illustrated in the following figure.
Where
• R = 5 Ω ± 5%
• C1 = 10 μF ± 10%, 0603 or smaller, X5R or better (X7R or C0G are fine), with ESL ≤ 0.5 nH
• C2 = 1.0 μF ± 10%, 0402 or 0201, X5R, with ESL ≤ 0.5 nH
• Low-ESL surface-mount capacitors

R
1.8 V source AVDD_PLAT, AVDD_D1
AVDD_CGA1, AVDD_CGA2
C1 C2

Low-ESL surface-mount capacitors

Note the following:


• Each AVDD pin must have its own independent filter circuit.
• Voltage for AVDD is defined at the input of the PLL supply filter and not the pin of AVDD.
• If done properly, it is possible to route directly from the capacitors to the AVDD pins, without the added
inductance of vias.
• It is recommended that an area fill or power plane split be provided for a low-impedance profile, which
helps keep nearby crosstalk noise from inducing unwanted noise.
• Place each circuit as close as possible to the specific AVDD pin being supplied to minimize noise
coupled from nearby circuits.
• Placement should be such that the smaller capacitors are nearest to the AVDD pin. If routing permits,
the smallest cap would be best located at the pin of AVDD.
• Caution: These filters are a necessary extension of the PLL circuitry and are compliant with the
device specifications. Any deviation from the recommended filters is done at the user's risk.
PLL supply filtering (SerDes, filtered from X1VDD)
The AVDD_SD1_PLL1/2 signals provide power for the analog portions of the SerDes PLL. To ensure stability
of the internal clock, ensure the power supplied to the PLL is filtered using a circuit similar to the one shown
in the following figure. The recommended solution for PLL filtering is to provide independent filter circuits per
PLL power supply, one for each side of the AVDD pins. By providing independent filters to each PLL, the
opportunity to cause noise injection from one PLL to the other is reduced.

Table continues on the next page...

QorIQ LS1043A Design Checklist , Rev. 5, 05/2020


NXP Semiconductors 9
Power design recommendations

Table 5. Power design system-level checklist (continued)


Item Completed
Note the following:
• Each AVDD must have its own independent filter circuit.
• AVDD_SD1_PLLn should be a filtered version of X1VDD.
• Voltage for AVDD is defined at the pin of AVDD. This is in contrast to the requirement, for example for
the core PLL filter such as AVDD_CGAn, which is measured at the input of the filter.
• Placement should be such that the smaller capacitors are nearest to the AVDD pin. If routing permits,
the smallest cap would be best located at the pin of AVDD.
• It is recommended that an area fill or power plane split be provided for a low-impedance profile, which
helps keep nearby crosstalk noise from inducing unwanted noise.
• A 47 μF 0805 XR5 or XR7, 4.7 μF 0603 or smaller, and 0.0033 μF 0402 or 0.0033 μF 0201 capacitor
are recommended. The size and material type are important. A 0.33 Ω ± 1% resistor is recommended.
• Caution: These filters are a necessary extension of the PLL circuitry and are compliant with the
device specifications. Any deviation from the recommended filters is done at the user's risk.

0.33 Ω
X1VDD AVDD_SD1_PLLn

47 µF 4.7 µF 0.003 µF

SerDes power supply filtering


The ferrite beads should be placed in parallel to reduce voltage droop. For the linear or low-noise switching
regulator, 10 mVp-p, 50 kHz to 500 MHz is the noise goal. All traces should be kept short, wide, and direct.
Use small area fill, if possible. The goal is to lower the impedance of this net, thus lowering the noise.
S1VDD may be supplied by linear or low noise switching regulator or sourced by a filtered VDD.
Two example solutions for S1VDD filtering, where S1VDD is sourced from VDD, linear or low noise switching
regulator, are illustrated in Figure 3 and Figure 4. Users can choose either one as they see best fit their
needs, but the primary NFM type filter has two advantages: lower DC droop and easier layout than the
ferrite bead solution.

NFM18PC225B1A3
VDD or linear or 2.2 µF
Bulk Decoupling
low-noise switching S1VDD
capacitors capacitors
regulator
2.2 µF
GRM155R60J225KE95

Figure 3. Primary S1VDD power supply filter circuit


BLM18KG121TN1

VDD or linear or
Bulk Decoupling
low-noise switching S1VDD
capacitors capacitors
regulator
2.2 µF 2700 PF
GRM155R60J225KE95 GRM155R71H272KA01

Figure 4. Alternate S1VDD power supply filter circuit


Table continues on the next page...

QorIQ LS1043A Design Checklist , Rev. 5, 05/2020


10 NXP Semiconductors
Power design recommendations

Table 5. Power design system-level checklist (continued)


Item Completed
Note the following:
• See "Power-on ramp rate," in the data sheet for maximum S1VDD power-up ramp rate.
• It is recommended that an area fill or power plane split be provided for a low-impedence profile, which
helps keep nearby crosstalk noise from inducing unwanted noise.
• Place each circuit as close as possible to the specific set of pins being supplied to minimize noise
coupled from nearby circuits.
• Located at each pin should have a decouple capacitor, such as 0.1 μF.
X1VDD may be supplied by a linear or low noise switching regulator or sourced by a filtered G1VDD.
Two example solutions for X1VDD filtering, where X1VDD is sourced from a linear or low noise switching
regulator, are illustrated in Figure 5 and Figure 6. Users can choose either one as they see best fit their
needs, but the primary NFM type filter has two advantages: lower DC droop and easier layout than the
ferrite bead solution

NFM18PC225B1A3
linear or 2.2 µF
Bulk Decoupling
low-noise switching X1VDD
capacitors capacitors
regulator
2.2 µF
GRM155R60J225KE95

Figure 5. Primary X1VDD power supply filter circuit


BLM18KG121TN1

linear or
Bulk Decoupling
low-noise switching X1VDD
capacitors capacitors
regulator
2.2 µF 2700 PF
GRM155R60J225KE95 GRM155R71H272KA01

Figure 6. Alternte X1VDD power supply filter circuit


Note the following:
• See "Power-on ramp rate," in the data sheet for maximum X1VDD power-up ramp rate.
• It is recommended that an area fill or power plane split be provided for a low-impedance profile, which
helps keep nearby crosstalk noise from inducing unwanted noise.
• Place each circuit as close as possible to the specific set of pins being supplied to minimize noise
coupled from nearby circuits.
• Located at each pin should have a decouple capacitor, such as 0.1 μF.
USB_HVDD may be supplied by a linear or low noise switching regulator, which may be the system-wide 3.3
V power supply.
Two example solutions for USB_HVDD filtering, where USB_HVDD is sourced from a linear or low noise
switching regulator, are illustrated in Figure 7 and Figure 8. Users can choose either one as they see best fit
their needs, but the primary NFM type filter has two advantages: lower DC droop and easier layout than the
ferrite bead solution.
Table continues on the next page...

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NXP Semiconductors 11
Power design recommendations

Table 5. Power design system-level checklist (continued)


Item Completed
NFM18PC225B1A3
2.2 µF
Bulk Decoupling
3.3 V USB_HVDD
capacitors capacitors

2.2 µF
GRM155R60J225KE95

Figure 7. Primary USB_HVDD power supply filter circuit


BLM18KG121TN1
Bulk Decoupling
3.3 V USB_HVDD
capacitors capacitors

2.2 µF 2700 PF
GRM155R60J225KE95 GRM155R71H272KA01

Figure 8. Alternate USB_HVDD power supply filter circuit


Note the following:
• It is recommended that an area fill or power plane split be provided for a low-impedence profile, which
helps keep nearby crosstalk noise from inducing unwanted noise.
• Place each circuit as close as possible to the specific set of pins being supplied to minimize noise
coupled from nearby circuits.
• Located at each pin should have a decouple capacitor, such as 0.1 μF.
USB_SVDD and USB_SDVDD are to be filtered from the VDD power supply.
Two example solutions for USB_SVDD and USB_SDVDD filtering, where USB_SVDD and USB_SDVDD are
sourced from a filtered version of VDD, are illustrated in Figure 9, Figure 10, Figure 11 and Figure 12. Users
can choose either one as they see best fit their needs, but the primary NFM type filter has two advantages:
lower DC droop and easier layout than the ferrite bead solution.

NFM18PC225B1A3
2.2 µF
Bulk Decoupling
VDD
capacitors capacitors USB_SVDD

2.2 µF
GRM155R60J225KE95

Figure 9. Primary USB_SVDD power supply filter circuit


BLM18KG121TN1
VDD Bulk Decoupling USB_SVDD
capacitors capacitors

2.2 µF 2700 PF
GRM155R60J225KE95 GRM155R71H272KA01

Figure 10. Alternate USB_SVDD power supply filter circuit

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12 NXP Semiconductors
Power design recommendations

Table 5. Power design system-level checklist


Item Completed
NFM18PC225B1A3
2.2 µF
Bulk Decoupling
VDD
capacitors capacitors
USB_SDVDD
2.2 µF
GRM155R60J225KE95

Figure 11. Primary USB_SDVDD power supply filter circuit


BLM18KG121TN1
VDD Bulk Decoupling USB_SDVDD
capacitors capacitors

2.2 µF 2700 PF
GRM155R60J225KE95 GRM155R71H272KA01

Figure 12. Alternate USB_SDVDD power supply filter circuit


Note the following:
• It is recommended that an area fill or power plane split be provided for a low-impedence profile, which
helps keep nearby crosstalk noise from inducing unwanted noise.
• Place each circuit as close as possible to the specific set of pins being supplied to minimize noise
coupled from nearby circuits.
• Located at each pin should have a decouple capacitor, such as 0.1 μF.

4.3 Power-on reset recommendations


Various chip functions are initialized by sampling certain signals during the assertion of PORESET_B. These power-on reset
(POR) inputs are pulled either high or low during this period. While these pins are generally output pins during normal
operation, they are treated as inputs while PORESET_B is asserted. When PORESET_B de-asserts, the configuration pins
are sampled and latched into registers, and the pins then take on their normal output circuit characteristics.
Table 6. Power-on reset system-level checklist
Item Completed
Ensure PORESET_B is asserted for a minimum of 1 ms after VDD ramps up.
Ensure HRESET_B is asserted for a minimum of 32 SYSCLK cycles.
In cases where a configuration pin has no default, use a 4.7 kΩ pull-up or pull-down resistor for appropriate
configuration of the pin.
Optional: An alternative to using pull-up and pull-down resistors to configure the POR pins is to use a PLD or
similar device that drives the configuration signals to the chip when PORESET_B is asserted. The PLD must
begin to drive these signals at least four SYSCLK cycles prior to the de-assertion of PORESET_B (other
than cfg_eng_use0), hold their values for at least two SYSCLK cycles after the de-assertion of
PORESET_B, and then release the pins to high impedance afterward for normal device operation
NOTE: See the applicable chip data sheet for details about reset initialization timing specifications.

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NXP Semiconductors 13
Power design recommendations

Table 6. Power-on reset system-level checklist (continued)


Item Completed
Configuration settings
Ensure the settings in Configuration signals sampled at reset are selected properly.
NOTE: See the applicable chip reference manual for a more detailed description of each configuration
option.
Power sequencing
The chip requires that its power rails be applied in a specific sequence in order to ensure proper device
operation. For details, see QorIQ LS1043A, LS1023A Data Sheet" (document LS1043A).

4.3.1 Configuration signals sampled at reset


The signals that serve alternate functions as configuration input signals during system reset are summarized in this table.
Reset configuration signals are sampled at the negation of PORESET_B. However, there is a setup and hold time for these
signals relative to the rising edge of PORESET_B, as described in the QorlQ LS1043A Data Sheet (document LS1043A).
The reset configuration signals are multiplexed with other functional signals. The values on these signals during reset are
interpreted to be logic one or zero, regardless of whether the functional signal name is defined as active-low. The reset
configuration signals have internal pull-up resistors so that if the signals are not driven, the default value is high (a one), as
shown in the table below. Some signals must be driven high or low during the reset period. For details about all the signals
that require external pull-up resistors, see the applicable device data sheet.
Table 7. LS1043A reset configuration signals
Configuration Type Functional Pins Comments
Reset configuration word (RCW) source IFC_AD[8:15] They must be set to one of the valid RCW
inputs cfg_rcw_src[0:8] source input option. The 512-bit RCW
IFC_CLE
word has all the necessary configuration
information for the chip. If there is no valid
RCW in the external memory, it can be
programmed using the Code Warrior or
other programmer. The JTAG configuration
files (path: CWInstallDir
\CW4NET_v2019.01\CW_ARMv8\Config
\boards) can be used in the following
situations:
• target boards that do not have RCW
already programmed
• new board bring up
• recovering boards with blank or
damaged flash
IFC external transceiver enable polarity IFC_TE Default is "1"
select (cfg_ifc_te)
DRAM type select (cfg_dram_type) IFC_A[21] Default is DDR3L. This reset configutation
pin selects the proper I/O voltage:
• 0=DDR3L 1.35 V
• 1=DDR4 1.2 V

Ensure the selection value that matches


the DDR type used on board.

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14 NXP Semiconductors
Power design recommendations

Table 7. LS1043A reset configuration signals (continued)


Configuration Type Functional Pins Comments
General-purpose input (cfg_gpinput[0:7]) IFC_AD[0:7] Default "1111 1111", values can be
application defined
"Single Oscillator Source" clock select. IFC_WE0_B • 0=DIFF_SYSCLK/
DIFF_SYSCLK_B(differential)
This field selects between SYSCLK
• 1=SYSCLK (single ended)
(Single ended) and DIFF_SYSCLK/
DIFF_SYSCLK_B (differential) inputs.
Default selection is single ended SYSCLK;
(cfg_eng_use0) "1"
"Single Oscillator Source" clock. IFC_OE_B • 0=Disabled (MUST make sure that
External termination pads of
This field indicates whether on-chip
DIFF_SYSCLK/DIFF_SYSCLK_B
LVDS termination for differential clock is
have proper termination)
enabled or disabled.
• 1 = Enabled (default)
configuration (cfg_eng_use1)
Default is "1".
It is recommened to keep provision for
optional pull-down resistor on board.
"Single Oscillator Source" clock IFC_WP0_B Default is "1". Reserved.
configuration (cfg_eng_use2)

4.3.2 Hard-Coded RCW


The hard-coded RCW can be used as an alternative method for initial board bring-up when there is no valid RCW in the
external memory. .
If a new board is using a blank flash and flash is the source of RCW, then all 0xff value from flash for RCW will put the
device in an unknown state.
There are two methods to workaround this problem:
1. Put switches on cfg_rcw_src signals to select hard-coded RCW(0x9A, 0x9E, 0x9F)2.
2. Use CodeWarrior tool from NXP to override RCW.
NOTE
1. It is recommended to disconnect RESET_REQ_B from PORESET_B when using
Hard-Coded RCW as any different board configuration may push the chip into an
endless reset loop. For more information, refer to Hard-coded RCW options QorIQ
LS1043A Reference Manual (document LS1043ARM).
2. Use 0x9A or 0x9E hard-coded RCW option when external DDR clock (DDRCLK)
provides the reference clock to the DDR PLL. Use 0x9F hard-coded RCW option
when using DIFF_SYSCLK/DIFF_SYSCLK_B as reference clock to the DDR
PLL.
3. For bringing-up a new board when no valid RCW or bootloader is available and
onboard flash is not supported in CodeWarrior then refer to AN12081.

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NXP Semiconductors 15
Interface recommendations

5 Interface recommendations
This section details the pin termination guidelines for different interfaces. In general, any unused input pin should be
terminated by a pull down unless recommended otherwise.

5.1 DDR controller recommendations


The LS1043A/LS1023A chip supports the DDR3L (1.35 V) and DDR4 (1.2 V) SDRAM memories.
The memory interface controls main memory accesses. The interface supports 32-bit data access.

5.1.1 DDR4 and DDR3L SDRAM interface pin termination


recommendations
Table 8. DDR4 and DDR3L SDRAM interface pin termination checklist
Signal name1 I/O Used Not used Completed
type
DDR3L signal DDR4 signal2
D1_MA[0:13] D1_MA[0:13] O Must be properly terminated to These pins can be left
VTT unconnected.
D1_MA[14] D1_MBG1
D1_MA[15] D1_MACT_B
D1_MBA[0:1] D1_MBA[0:1] O Must be properly terminated to These pins can be left
VTT unconnected.
D1_MBA[2] D1_MBG0
D1_MCK[0:1]/D1_MCK[0:1]_B O These pins must be properly All unused MCK pins should be
terminated. disabled via the
DCFG_CCSR_DDRCLKDR
register.
D1_MCKE[0:1] O Must be properly terminated to These pins can be left
VTT unconnected.
These pins are actively driven
during reset instead of being
released to high impedance.
D1_MCS[0:3]_B O Must be properly terminated to These pins can be left
VTT unconnected.
D1_MDIC[0:1] I/O • These pins are used for These pins can be left
automatic calibration of unconnected.
the DDR3L/DDR4 IOs.
The MDIC[0:1] pins must
be connected to 162 Ω
precision 1% resistors.
• MDIC[0] is grounded
through a 162 Ω
precision 1% resistor and
MDIC[1] is connected to
GVDD through a 162 Ω
precision 1% resistor.
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16 NXP Semiconductors
Interface recommendations

Table 8. DDR4 and DDR3L SDRAM interface pin termination checklist (continued)
Signal name1 I/O Used Not used Completed
type
DDR3L signal DDR4 signal2
• For either full- or half-
driver strength calibration
of DDR IOs, use the
same MDIC resistor
value of 162 Ω.
• The memory controller
register setting can be
used to determine if
automatic calibration is
done to full- or half-drive
strength.
D1_MDM[0:3], O - These pins can be left
unconnected.
D1_MDM[8]
D1_MDQ[0:32]3 I/O - These pins can be left
unconnected.
D1_MDQS[0:3]/D1_MDQS[0:3]_B, I/O - These pins can be left
D1_MDQS[8]/D1_MDQS[8]_B unconnected.
D1_MECC[0:3] I/O - These pins can be left
unconnected.
D1_MAPAR_ERR D1_MALERT_B I Recommend that a weak pull- This pin should be pulled up to
_B up resistor (2-10 kΩ) for G1VDD.
SDRAM DDR4/DDR3L to
G1VDD.
When using discrete DRAM,
the MALERT_B pin needs a
strong pull-up resistor (50-100
Ω) to G1VDD.
D1_MAPAR_OUT O - This pin can be left
unconnected.
D1_MODT[0:1] O Ensure the MODT signals are These pins can be left
connected correctly. Two dual unconnected.
ranked DIMMs topology is not
supported on LS1043A.
For a single, dual-ranked
DIMM, consider the following
connections
• MODT(0), MCS(0),
MCKE(0)
• MODT(1), MCS(1),
MCKE(1)

For quad-ranked DIMMS, it is


recommended to obtain a data
sheet from the memory supplier
to confirm required signals. But
in general, each controller
needs MCS(0:3), MODT(0:1),
and MCKE(0:1) connected to
the one quad-ranked DIMM.
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NXP Semiconductors 17
Interface recommendations

Table 8. DDR4 and DDR3L SDRAM interface pin termination checklist (continued)
Signal name1 I/O Used Not used Completed
type
DDR3L signal DDR4 signal2
These pins are actively driven
during reset instead of being
released to high impedance.
D1_MRAS_B O Must be properly terminated to This pin can be left
VTT unconnected.
D1_MCAS_B O Must be properly terminated to This pin can be left
VTT unconnected.
D1_MWE_B O Must be properly terminated to This pin can be left
VTT unconnected.
D1_MVREF DDR4 Vref is IO DDR reference voltage: 0.49 x This pin must be connected to
provided G1VDD to 0.51 x G1VDD. GND.
internally, the
• D1_MVREF can be
external vref
generated using a divider
signal needs to be
from G1VDD as MVREF.
grounded when
• Another option is to use
using DDR4
supplies that generate
SDRAM
G1VDD, VTT, and
D1_MVREF voltage.

These methods help to reduce


differences between G1VDD
and MVREF. D1_MVREF
generated from a separate
regulator is not recommended,
because D1_MVREF does not
track G1VDD as closely.

NOTE
1. DDR3L signals are muxed with DDR4 signals.
2. For DDR4, bit and byte swapping rules and layout guidelines, see the application
note Hardware and Layout Design Considerations for DDR4 SDRAM Memory
Interfaces (document AN5097).
3. When DDR4 Discrete DRAM is soldered on the board, and two chip selects are
used, and the second chip select is bit swizzling (meaning bits mapping from CS0
is additionally swapped in CS1 by swapping DQ0 with DQ1, DQ2 with DQ3, DQ4
with DQ5, and DQ6 with DQ7). Then bit map orders of 0x10 (2 1 3 0) and 0x30 (6
5 7 4) are not allowed.

5.1.2 DDR system-level recommendations


Table 9. DDR system-level checklist
Item Completed
General

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18 NXP Semiconductors
Interface recommendations

Table 9. DDR system-level checklist (continued)


Item Completed
DDR3L /DDR4 mode selection is through por-config signal cfg_dram_type. Ensure that the pin is configured
correctly as per the DDR mode. Setting DDR4 mode while applying GVdd=1.35 V can lead to damage of
IO's.
Data Bus inversion (DBI) signals are muxed on Data Mask (D1_MDM) signals and are optional function for
DDR4. Only one function can be used at a time.
PORESET_B assertion should also reset SDRAM Memory.
CKE termination requirment during self refresh - In order to keep DRAM memory in a self-refresh mode, the
CKE signal must be driven low. For applications requiring LS1043A to be powered off and SDRAM memory
in self refresh, the CKE signal must be driven/pulled low during power ramp up, external to the SoC by
hardware on the board. Refer Achieving Persistent DRAM on PowerQUICC III and QorIQ Processors
(document AN4531).

NOTE
1. Stacked memory for DDR4 are not supported
2. DDR3L and DDR4 RDIMMs are not supported.
3. For devices with four ECC pins, ensure to connect one of the ECC pins to the
Prime DQ of ECC DRAM.

5.2 IFC pin termination recommendations


Table 10. IFC pin termination checklist
Signal name I/O type Used Not used Completed
IFC_A[16:20] O These pins must not be pulled down during power-on reset. It may be pulled
up, driven high, or if there are no externally connected devices, left in tristate.
If these pins are connected to a device that pulls down during reset, an
external pull-up is required to drive these pins to a safe state during reset.
IFC_A[21] O This pin is a reset configuration pin. It has a weak (~20 kΩ ) internal pull-up P-
FET that is enabled only when the processor is in its reset state. The pull-up
is designed such that it can be overpowered by an external 4.7 kΩ resistor.
However, if the signal is intended to be high after reset, and if there is any
device on the net that might pull down the value of the net at reset, a pull-up
or active driver is needed.
IFC_A[22:27] I/O Connect as These pins can be left unconnected.
needed.
IFC_AD[0:15] I/O These pins are reset configuration pins. They have a weak (~20 kΩ ) internal
pull-up P-FET that is enabled only when the processor is in its reset state.
These pull-ups are designed such that it can be overpowered by an external
4.7 kΩ resistor. However, if the signal is intended to be high after reset, and if
there is any device on the net that might pull down the value of the net at
reset, a pull-up or active driver is needed.
IFC_PAR[0:1] I/O Connect as These pins can be left unconnected.
needed.
IFC_CS[0:3]_B O Recommend These pins can be left unconnected.
weak pull-up
resistors (2–10
kΩ) be placed
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NXP Semiconductors 19
Interface recommendations

Table 10. IFC pin termination checklist (continued)


Signal name I/O type Used Not used Completed
on these pins
to OVDD.
IFC_WE[0]_B O These pins are reset configuration pins, they have a weak (~20 kΩ ) internal
pull-up P-FET that is enabled only when the processor is in its reset state.
IFC_OE_B O
The internal pull-ups are designed such that it can be overpowered by an
IFC_WP[0]_B O external 4.7 kΩ resistor. However, It is recommended to keep a provision for
optional pull-up and pull-down resistor on board.
IFC_PERR_B I Connect as This pin should be pulled high through a 2-10 kΩ resistor to
needed. OVDD or can be left floating if configured as GPIO output
IFC_BCTL O Connect as This pin can be left unconnected.
needed.
IFC_TE O This pin is a reset configuration pin. It has a weak (~20 kΩ) internal pull-up P-
FET that is enabled only when the processor is in its reset state. This pull-up
is designed such that it can be overpowered by an external 4.7 kΩ resistor.
However, if the signal is intended to be high after reset, and if there is any
device on the net that might pull down the value of the net at reset, a pull-up
or active driver is needed.
IFC_NDDQS I/O Connect as This pin can be left unconnected.
needed.
IFC_AVD O This pin must not be pulled down during power-on reset. It may be pulled up,
driven high, or if there are no externally connected devices, left in tristate. If
this pin is connected to a device that pulls down during reset, an external pull-
up is required to drive this pin to a safe state during reset.
IFC_CLE O This pin is a reset configuration pin. It has a weak (~20 kΩ) internal pull-up P-
FET that is enabled only when the processor is in its reset state. This pull-up
is designed such that it can be overpowered by an external 4.7 kΩ resistor.
However, if the signal is intended to be high after reset, and if there is any
device on the net that might pull down the value of the net at reset, a pull-up
or active driver is needed.
IFC_RB[0:3]_B I These pins These pins should be pulled high through a 1 kΩ resistor.
should be
pulled high
through a 1 kΩ
resistor to
OVDD.
IFC_CLK[0:1] O Connect as This pin can be left unconnected.
needed.
IFC_NDDDR_CLK O Connect as This pin can be left unconnected.
needed

NOTE
The IFC interface is on OVDD power domain which is 1.8 V only.
For functional connection diagram, see the chip reference manual.

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20 NXP Semiconductors
Interface recommendations

5.3 DUART pin termination recommendations


Table 11. DUART pin termination checklist
Signal name I/O type Used Not used Completed
UART1_SOUT O The functionality of these pins is These pins can be left unconnected.
determined by the UART_BASE and
UART1_RTS_B O
UART_EXT fields in the reset
UART1_SIN I configuration word These pins should be pulled high
(RCW[UART_BASE], through a 2-10 kΩ resistor to DVDD or
UART1_CTS_B I
RCW[UART_EXT]). else programmed as GPIO and output.
UART2_SOUT O These pins can be left unconnected.
UART2_RTS_B O
UART2_SIN I These pins should be pulled high
through a 2-10 kΩ resistor to DVDD or
UART2_CTS_B I
else programmed as GPIO and output.
UART3_SOUT O This pin can be left unconnected.
UART3_SIN I This pin should be pulled high through a
2-10 kΩ resistor to DVDD or else
programmed as GPIO and output.
UART4_SOUT O This pin can be left unconnected.
UART4_SIN I This pin should be pulled high through a
2-10 kΩ resistor to DVDD or else
programmed as GPIO and output.

5.4 LPUART pin termination recommendations


Table 12. LPUART pin termination checklist
Signal Name IO type Used Not Used Completed
LPUART1_CTS_B I The functionality of This pin should be pulled high
LPUART1_CTS_B is determined through a 2-10 kΩ resistor to DVDD
by the UART_EXT field in the or else programmed as GPIO and
reset configuration word output.
(RCW[UART_EXT]).
LPUART[2:3]_CTS_B I The functionality of These pins should be pulled high
LPUART[2:3]_CTS_B is through a 2-10 kΩ resistor to EVDD
determined by the SDHC_EXT or else programmed as GPIOs
field in the reset configuration and outputs.
word (RCW[SDHC_EXT]).
LPUART1_RTS_B O The functionality of These pins can be left
LPUART1_RTS_B is determined unconnected or else programmed
by the UART_EXT field in the as GPIOs and outputs.
reset configuration word
(RCW[UART_EXT]).

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NXP Semiconductors 21
Interface recommendations

Table 12. LPUART pin termination checklist (continued)


Signal Name IO type Used Not Used Completed
LPUART[2:3]_RTS_B O The functionality of
LPUART[2:3]_RTS_B is
determined by the SDHC_EXT
field in the reset configuration
word (RCW[SDHC_EXT]).
LPUART[1:2]_SIN, I The functionality of These pins should be pulled high
LPUART[4]_SIN LPUART[1:2]_SIN and through a 2-10 kΩ resistor to DVDD
LPUART[4]_SIN is determined by or else programmed as GPIOs
the UART_EXT field in the reset and outputs.
configuration word
(RCW[UART_EXT]).
LPUART[3]_SIN, I The functionality of These pins should be pulled high
LPUART[5:6]_SIN LPUART[3]_SIN and through a 2-10 kΩ resistor to EVDD
LPUART[5:6]_SIN is determined or else programmed as GPIOs
by the SDHC_EXT field in the and outputs.
reset configuration word
(RCW[SDHC_EXT]).
LPUART[1:2]_SOUT, O The functionality of These pins can be left
LPUART[4]_SOUT LPUART[1:2]_SOUT and unconnected or else programmed
LPUART[4]_SOUT is determined as GPIOs and outputs.
by the UART_EXT fields in the
reset configuration word
(RCW[UART_EXT]).
LPUART[3]_SOUT, O The functionality of
LPUART[5:6]_SOUT LPUART[3]_SOUT and
LPUART[5:6]_SOUT is
determined by the SDHC_EXT
fields in the reset configuration
word (RCW[SDHC_EXT]).

5.5 I2C pin termination recommendations


Table 13. I2C pin termination checklist
Signal Name I/O type Used Not used Completed
IIC1_SDA I/O Tie these open-drain signals high through These pins should be pulled high through
a nominal 1 kΩ resistor to DVDD. Optimum a 2-10 kΩ resistor to DVDD.
IIC1_SCL I/O
pull-up value depends on the capacitive
loading of external devices and required
operating speed.
IIC2_SDA I/O The functionality of these signals are When IIC2_EXT field is programmed for
determined by the IIC2_EXT field in the IIC2, unused pins should be pulled high
IIC2_SCL I/O
reset configuration word through a 2-10 kΩ resistor. Alternately,
(RCW[IIC2_EXT]). these pins can be programmed as GPIOs
and outputs.
Recommend that a weak pull-up resistor
(1 kΩ) to be placed on these pins to theirs
respective power supply. These pins are
an open-drain signal.

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Interface recommendations

Table 13. I2C pin termination checklist (continued)


Signal Name I/O type Used Not used Completed
IIC3_SDA I/O The functionality of these signals are When SCFG_RCWPMUXCR0 register is
IIC3_SCL I/O determined by the programmed for IIC, unused pins should
SCFG_RCWPMUXCR0 register. be pulled high through a 2-10 kΩ resistor.
IIC4_SDA I/O Alternately, these pins can be
Recommend that a weak pull-up resistor
IIC4_SCL I/O programmed as GPIOs and outputs.
(1 kΩ) to be placed on these pins to theirs
respective power supply. These pins are
an open-drain signal.

5.6 eSDHC recommendations


The LS1043A/LS1023A eSDHC interface supports a large variety of devices, as the following list shows:
• SDXC cards upto 2 TB space with UHS-I speed grade are supported
• UHS-I (Ultra high speed grade) SDR12, SDR25, SDR50, SDR104, and DDR50 are supported
• UHS-I cards work on 1.8 V power signaling
• On board dual voltage regulators are needed to support UHS-I cards because card initialization happens at 3.3 V and
regular operations happen at 1.8 V. The SD controller provides a signal to control the voltage regulator, controlled via
SDHC_VS bit
• eMMC 4.5 is supported (HS200, DDR)

Table 14. Supported SD card Modes


Mode 1-bit support 4-bit support 8-bit support
LS1043A/ SD (3.0) LS1043A/ SD (3.0)
LS1023A LS1023A
DS (Default Speed) Yes Yes Yes Yes Neither supported by
the SD standards nor
HS (High Speed) Yes Yes Yes Yes
by the LS1043A/
SDR12 No No Yes Yes LS1023A device.
SDR25 No No Yes Yes
SDR50 No No Yes Yes
SDR104 No No Yes Yes
DDR50 No No Yes Yes

Table 15. Supported MMC/eMMC Modes


Mode 1-bit support 4-bit support 8-bit support
LS1043A/ eMMC (4.5) LS1043A/ eMMC (4.5) LS1043A/ eMMC (4.5)
LS1023A LS1023A LS1023A
DS (Default Speed) Yes Yes Yes Yes Yes Yes
HS(High Speed) Yes Yes Yes Yes Yes Yes
HS200 No No Yes Yes Yes Yes
DDR No No Yes Yes No Yes

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Interface recommendations

5.6.1 eSDHC pin termination recommendations


Table 16. eSDHC pin termination checklist
Signal Name I/O type Used Not used Completed
SDHC_CMD I/O This pin should be pulled high through a Program as GPIO and output.
10-100 kΩ resistor to EVDD.
The functionality is determined by the
SDHC_BASE and SDHC_EXT fields in
the reset configuration word
(RCW[SDHC_BASE],
RCW[SDHC_EXT]).
SDHC_CLK O The functionality is determined by the
SDHC_BASE and SDHC_EXT fields in
the reset configuration word
(RCW[SDHC_BASE],
RCW[SDHC_EXT]).
SDHC_DAT I/O These pins should be pulled high through When SDHC_BASE and SDHC_EXT
A[0:3] a 10-100 kΩ resistor to EVDD. fields are programmed for SDHC, unused
pins should be pulled high through a
The functionality is determined by the
10-100 kΩ resistor to EVDD. Alternately,
SDHC_BASE and SDHC_EXT fields in
these pins can be programmed as GPIOs
the reset configuration word
and outputs.
(RCW[SDHC_BASE],
RCW[SDHC_EXT]).
SDHC_DAT I/O These pins should be pulled high through Program as GPIOs and outputs.
A[4:7] 10-100 kΩ resistors to OVDD.
The functionality is determined by the
SPI_BASE and SPI_EXT fields in the
reset configuration word
(RCW[SPI_BASE], RCW[SPI_EXT]).
SDHC_CD_B I These pins should be pulled high through This pin should be pulled high through a
10-100 kΩ resistors to DVDD. 10-100 kΩ resistor to DVDD or else
programmed as GPIO and output.
The functionality is determined by the
SDHC_WP I SDHC field in the reset configuration word This pin should be pulled low through a
(RCW[IIC2_EXT]). 10-100 kΩ resistor to GND or else
programmed as GPIO and output.
SDHC_CMD_ O These pins should be pulled high through These pins can be left unconnected or
DIR 10-100 kΩ resistors to OVDD. programmed for other functions or else
programmed as GPIOs and outputs.
SDHC_DAT0 O The functionality is determined by the
_DIR SPI_BASE and SPI_EXT fields in the
SDHC_DAT1 O reset configuration word
23_DIR (RCW[SPI_BASE], RCW[SPI_EXT]).
NOTE: DIR signals are used as direction
controls of external voltage
translator
SDHC_VS O This pin should be pulled high through This pin can be left unconnected or
10-100 kΩ resistor to OVDD. programmed for other function or else
programmed as GPIO and output.
The functionality is determined by the
SPI_EXT field in the reset configuration
word (RCW[SPI_EXT]).
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Table 16. eSDHC pin termination checklist (continued)


Signal Name I/O type Used Not used Completed
NOTE: External voltage select, to
change voltage of external
regulator.
SDHC_CLK_ I The functionality is determined by the This pin should be pulled low through a
SYNC_IN SPI_EXT field in the reset configuration weak resistor or else programmed for
word (RCW[SPI_EXT]). other function.
SDHC_CLK_ O This pin can be left unconnected or
SYNC_OUT programmed for other function.

NOTE
1. Separate DIR signals are implemented to support card interrupt on DAT1 in single
bit mode.
2. SDHC_CLK_SYNC_OUT to SDHC_CLK_SYNC_IN connection is required in
SDR50 and DDR50 mode only.
3. In SDR50 and DDR50 mode, all the input signals are sampled with respect to
SDHC_CLK_SYNC_IN.
4. SDHC_CLK_SYNC_OUT and SDHC_CLK_SYNC_IN should be routed as close
as possible to the card, with minimum skew with respect to SD_CLK.
5. When using 8-bit MMC/eMMC configuration, EVDD and OVDD should be set at
same voltage.
6. As per the SD specification, a power cycle is required to reset the SD card working
on UHS-I speed mode. Board design needs to provide some mechanism to power
cycle the SD card during every reset.
7. Refer erratum GEN A-010539, which states that SDHC_CLK_SYNC_OUT,
SDHC_CLK_SYNC_IN, SDHC_VS, SDHC_DAT[4:7], SDHC_DAT0_DIR,
SDHC_DAT123_DIR, SDHC_CMD_DIR, GPIO2_[0:3] are not available when
booting from QSPI. Once the workaround is applied HRESET_B can no longer be
used. Workaround is not needed in following cases:
• When SDHC interface is not used at all.
• SDHC full speed and high speed modes when SDHC_CLK_SYNC_IN and
SDHC_CLK_SYNC_OUT are not used.
• eMMC full speed and high speed in 4 bit mode at 1.8V or 3.3V.
• eMMC HS200 in 4 bit mode and 1.8V.

5.6.2 eSDHC system-level recommendations


Table 17. eSDHC system-level checklist
Item Completed
SD Card interfacing (8-bit is not supported)
SD Card Connections (DS and HS mode)
EVDD configured for 3.3 V
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Table 17. eSDHC system-level checklist (continued)


Item Completed

3.3 V 3.3 V SD
LS1043/LS1023A
CARD
CMD, DAT[0], DAT[1:3],
CLK, CD_B, WP

Figure 13. DS and HS modes


SD Card Connections (SDR12, 25, 50, 104, and DDR50 modes)
UHS-I modes, work on 1.8 V signalling.
The SYNC_OUT, SYNC_IN connections are required in SDR50 and DDR50 modes only.
NOTE: Resistor R=10 K is needed when RCW loading is required to be done from SD card.

Dual voltage
regulator
(3.3 V/1.8 V)

Voltage
select
SDHC_VS
R

3.3 V/1.8 V 3.3 V/1.8 V SD card


LS1043A/LS1023A

SDHC_CLK_SYNC_OUT

SDHC_CLK_SYNC_IN

CMD, DAT[0], DAT[1:3], CLK, CD_B, WP

Figure 14. SDR12, 25, 50, 104, and DDR50 modes


eMMC Interfacing
eMMC Card Connections (DS, HS, HS200 Modes) at 1.8 V card
The 8-bit eMMC interface requires EVDD and OVDD configured at 1.8 V.

1.8 V 1.8 V eMMC


LS1043A/LS1023A
CARD
1.8 V

CMD, DAT[0], DAT[1:7], CLK, CD

Figure 15. DS, HS, and HS200 modes for eMMC (1.8 V)
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26 NXP Semiconductors
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Table 17. eSDHC system-level checklist (continued)


Item Completed
NOTE: • HS200 mode is 1.8 V only mode as per eMMC 4.5 specification
eMMC Card Connection in DDR mode
The 8-bit operation cannot be supported due to RCW selection constraints.
The DDR mode supports both 3.3 V and 1.8 V operation as per eMMC 4.4 specification.

3.3 V/1.8 V 3.3 V/1.8 V


eMMC
LS1043A/LS1023A
SDHC_CLK_SYNC_OUT card

SDHC_CLK_SYNC_IN

CMD, DAT[0], DAT[1:3], CLK, CD


In DDR mode, all input signals are sampled
with respect to SYNC_IN.

Figure 16. DDR mode

5.7 Global Interrupt Controller (GIC) recommendations


Note that the GIC pins in LS1043/LS1023A are distributed over several voltage domains.

5.7.1 GIC pin termination recommendations


Table 18. GIC pin termination checklist
Signal name I/O type Used Not used Completed
IRQ[0:2] I Ensure these pins are driven in the These pins should be tied to non-
non-asserted state. asserted state through a 2-10 kΩ
resistor.
• When non-asserted state is high,
tied to OVDD
• When non-asserted state is low,
tied to GND
IRQ[3:10] I Ensure these pins are driven in the These pins should be tied to non-
non-asserted state. asserted state through a 2-10 kΩ
resistor.
The functionality is determined by the
IRQ_BASE and IRQ_EXT fields in the • When non-asserted state is high,
reset configuration word tied to DVDD
(RCW[IRQ_BASE], RCW[IRQ_EXT]). • When non-asserted state is low,
tied to GND

or else programmed as GPIOs and


ouputs.

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Table 18. GIC pin termination checklist (continued)


Signal name I/O type Used Not used Completed
IRQ[11] I This pin should be tied to non-asserted
state through a 2-10 kΩ resistor.
• When non-asserted state is high,
tied to LVDD
• When non-asserted state is low,
tied to GND

or else programmed as GPIOs and


ouputs.

NOTE
1. Interrupt polarity can be programmed through Interrupt Polarity Register
(SCFG_INTPCR). Default polarity for the IRQs is active high.

5.8 Trust pin termination recommendations


Table 19. Trust pin termination checklist
Signal name IO type Used Not used Completed
TA_BB_RTC I Reserved. Pull to GND through a 2-10 kΩ resistor.
TA_BB_TMP_DETECT_B I If a tamper sensor is used, it must This pin should be pulled
maintain the signal at the specified high through a 2-10 kΩ
voltage (1.0 V) until a tamper is resistor to VDD (1.0 V).
detected. A 1 kΩ pull-down
resistor is strongly recommended.
TA_TMP_DETECT_B I If a tamper sensor is used, it must This pin should be pulled
maintain the signal at the specified high through a 2-10 kΩ
voltage (OVDD) until a tamper is resistor to OVDD.
detected. A 1 kΩ pull-down
resistor is strongly recommended.

5.9 Power Management pin termination recommendations


Table 20. Power Management pin termination checklist
Signal name IO type Used Not used Completed
ASLEEP O The functionality of this signal is This pin can be left unconnected
determined by the ASLEEP field in or else programmed as GPIO and
the reset configuration word output.
(RCW[ASLEEP]).

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5.10 Debug and reserved pin recommendations

5.10.1 Debug and reserved pin termination recommendations


Table 21. Debug and test pin termination checklist
Signal name IO type Used Not used Completed
SCAN_MODE_B I This is a test signal for factory use only and must be pulled up (100 Ω - 1 kΩ)
to OVDD for normal device operation.
TEST_SEL_B I This pin must be pulled to OVDD through a 100 Ω to 1 kΩ resistor for a four
core LS1043A device and tied to the ground for a two core LS1023A device.
EVT[0:4]_B IO Debug event pins By default EVT[0:4]_B signals are
input. EVT0_B has a weak internal pull
up and can be left floating and
EVT[1:4]_B need to be pulled up
through a 2-10 kΩ resistor to OVDD.
Alternately, EVT[0:4]_B can be
programmed as outputs through
EPU_EPEVTCR register early in boot
code and left unconnected.
EVT[5:8]_B IO The functionality of these signals is These pins can be programmed as
determined by the IIC3 and IIC4 field GPIO outputs through
in the SCFG_RCWPMUXCR0 SCFG_RCWPMUXCR0 bits and left
register. unconnected.
EVT_B[9] IO This pin should be connected as This pin should be pulled high through
required. a 2-10 kΩ resistor to OVDD.
Alternately, EVT_B[9] can be
programmed as output through
EPU_EPEVTCR register early in boot
code and left unconnected.
JTAG_BSR_VSEL1 I It is advised that boards are built with the ability to pull up & pull down this pin.
• For normal debug operation, this pin must be pulled low to GND through
4.7 kΩ resistor.
• For boundary scan operation, this pin must be pulled high to OVDD
through 4.7 kΩ resistor.
TBSCAN_EN_B2 I It is advised that boards are built with the ability to pull up & pull down this pin.
• For normal debug operation, this pin must be pulled high to OVDD
through 4.7 kΩ resistor.
• For boundary scan operation, this pin must be pulled low to GND
through 4.7 kΩ resistor.
CKSTP_OUT_B O Reserved. This pin must be pulled to OVDD through a 2-10 kΩ resistor.
Analog Signals
D1_TPA IO Do not connect. These pins should be left floating.
FA_ANALOG_G_V - Reserved. This pin must be pulled to ground (GND).
FA_ANALOG_PIN - Reserved. This pin must be pulled to ground (GND).
TH_TPA - Do not connect. This pin should be left floating.
TD1_ANODE - Connect as required. Tie to GND if not used.
TD1_CATHODE - Connect as required. Tie to GND if not used.

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NOTE
1. JTAG_BSR_VSEL is an IEEE 1149.1 JTAG Compliance Enable pin.
• 0: normal operation.
• 1: To be compliant to the 1149.1 specification for boundary scan functions.
The JTAG compliant state is documented in the BSDL.
2. TBSCAN_EN_B is an IEEE 1149.1 JTAG Compliance Enable pin.
• 0:To be compliant to the 1149.1 specification for boundary scan functions.
The JTAG compliant state is documented in the BSDL.
• 1: JTAG connects to DAP controller for the Arm core debug.

5.11 SerDes pin termination recommendations


Table 22. SerDes pin termination checklist
Signal Name IO type Used Not Used Completed
SD1_IMP_CAL_RX I Tie to S1VDD through a 200 Ω 1% If the SerDes interface is entirely
resistor. unused, these pins must be left
unconnected.
SD1_IMP_CAL_TX I Tie to X1VDD through a 698 Ω 1%
resistor.
SD1_PLL1_TPA O Provide a test point if possible. These pins should be left floating
SD1_PLL1_TPD O
SD1_PLL2_TPA O
SD1_PLL2_TPD O
SD1_REF_CLK1_P I Ensure clocks are driven from an If the PLL is unused, pull it down
appropriate clock source, as per to SD_GND.
SD1_REF_CLK1_N
the protocol selected by the RCW
SD1_REF_CLK2_N I settings.
SD1_REF_CLK2_P
SD1_RX[0:3]_N I Ensure pins are correctly If the SerDes interface is entirely
terminated for the interface type or partly unused, the unused pins
SD1_RX[0:3]_P
used. must be pulled down to SD_GND.
SD1_TX[0:3]_N O Ensure pins are correctly If SerDes interface is entirely or
terminated for the interface type partly unused, the unused pins
SD1_TX[0:3]_P
used. must be left unconnected.

NOTE
1. In the RCW configuration field SRDS_PLL_PD_S1, the respective bits for each
unused PLL must be set to power it down. The SerDes module is disabled when
both of its PLLs are turned off.
2. After POR, if an entire SerDes module is unused, it must be powered down by
clearing the SDEN fields of its corresponding PLL1 and PLL2 reset control
registers (SRDSxPLLaRSTCTL).
3. Unused lanes must be powered down by clearing the RRST_B and TRST_B fields
and setting the RX_PD and TX_PD fields in the corresponding lane's general
control register (SRDSxLNmGCR0).
4. A spread-spectrum reference clock is permitted for PCI Express. However, if any
other high-speed interface, such as SGMII or SATA, is used concurrently on the
same SerDes bank, spread-spectrum clocking is not permitted.
5. If SerDes lanes are routed to a backplane slot or a PCIe connector, SerDes pins can
be left unterminated even if the link partner card is not present. If some SerDes

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lanes are a no-connect, pull down their receiver pins to GND. Then, if the SerDes
block is powered, refer to the RM’s Unused Lanes section for directions on how to
power them down. To power down a SerDes lane, configure the General Control 0
register during the PBI phase. If the whole SerDes block is already powered down,
there is no need to individually power down a lane.

5.11.1 Optimal setting for the SerDes channel Rx Equalization Boost


bit
Select the optimal setting for the SerDes channel Rx Equalization Boost bit suitable for a particular end product system
board.
For certain high speed SerDes protocols, the Rx Equalization Boost bits for all the SerDes lanes in use are initialized with a
default value of 1b by the RCW. In reality, although the default 1b setting does overlap with the 0b setting in terms of Rx
Equalization boost effect, the 0b setting works better for short and normal SerDes channels, while the 1b setting works better
for high loss channels.
For end product system with non-high loss SerDes channels (lanes), using the default 1b setting of the Rx Equalization Boost
bit may adversely enhance the return loss due to some discontinuities possibly presented in the channel. This may further
causes more reflection. Therefore, unless the channel is high loss, to ensure the channel’s health and better performance, the
0b setting of Rx Equalization Boost bit should be used for all the lanes, instead of the default 1b setting.
The following high speed SerDes protocols are related to this issue. If a protocol supports more than one speed, only the
speed(s) listed below is affected.
• SATA 6 Gbaud
• XFI 10.3125 Gbaud

Since the channel characteristics is board and layout dependent, NXP cannot quantify the actual channel loss introduced
during board design, layout and fabrication of all end product systems for our customers. Customers should always perform
board level simulation and also use other appropriate tool (for example, NXP’s SerDes Validation Tool) and/or instrument to
determine whether the SerDes channels (lanes) are in high loss condition and then adopt the best setting suitable for their end
product and application. Instead of quantifying a SerDes channel as high or non-high loss, a more practical way is to try both
the 1b and 0b settings and find out which setting yields better signal integrity for the customer’s particular end product
system or board.
Once determined that the channels are in non-high loss condition, the Rx Equalization Boost bit for all the lanes in use should
be set to 0b during the Pre-boot Initialization (PBI) stage.
Since the Rx Equalization Boost bit is defined in different SerDes registers depending on the SerDes protocols in use, it is
important to select the appropriate SerDes register with the correct offset and value as described below when implementing
the register write in PBI. The SerDes registers involved are defined on a per lane basis. Therefore, PBI register write must be
implemented for all the lanes utilized for the affected SerDes protocols and speeds.
• For SATA 6 Gbaud:
• Perform a PBI write to each lane’s LNaSSCR1 register with a value of 0x0050_2880, which sets this lane’s Rx
Equalization Boost bit, LNaSSCR1 [RXEQ_BST_1] to 0b.
• For XFI 10.3125 Gbaud:
• Perform a PBI write to each lane’s LNaRECR0 register with a value of 0x0000_045F, which sets this lane’s Rx
Equalization Boost bit, LNaRECR0 [RXEQ_BST] to 0b.

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5.12 USB PHY pin termination recommendations


Table 23. USB 1/2/3 PHY pin termination checklist
Signal Name IO type Used Not Used Completed
USB[1/2/3]_D_P IO USB PHY Data Plus Do not connect. These pins should
be left floating.
USB[1/2/3]_D_M IO USB PHY Data Minus
USB[1/2/3]_VBUS I USB power supply pin. A charge Do not connect.These pins should
pump external to the USB 3.0 PHY be left floating.
must provide power to this pin. The
nominal voltage for this pin is 5 V.
USB[1/2/3]_ID I USB PHY ID Detect Pull low through a 1kΩ resistor to
GND.
USB[1/2/3]_TX_P O USB PHY 3.0 Transmit Data Do not connect.These pins should
(positive) be left floating.
USB[1/2/3]_TX_M O USB PHY 3.0 Transmit Data
(negative)
USB[1/2/3]_RX_P I USB PHY 3.0 Receive Data (positive) Connect to ground (GND)
USB[1/2/3]_RX_M I USB PHY 3.0 Receive Data
(negative)
USB[1/2/3]_RESREF IO Attach a 200-Ω 1% 100-ppm/0C Do not connect.These pins should
precision resistor-to-ground on the be left floating.
board.
USB_DRVVBUS O VBUS power enable. For example, if Do not connect.These pins can be
an external hub is used, it can handle left floating.
this signal. The functionality of the
USB_DRVVBUS signal is determined
by the RCW[USB_DRVVBUS] field in
the reset configuration word.
The register
SCFG_USBDRVVBUS_SELCR
selects which of the three controllers
drives USB_DRVVBUS.
USB_PWRFAULT I Indicates that a VBUS fault has Pull low through a 1kΩ resistor to
occurred. For example, if an external GND.
hub is used, it can handle this signal.
The functionality of the
USB_PWRFAULT signal is
determined by the RCW[PWRFAULT]
field in the reset configuration word.
USB_PWRFAULT can be shared by
all the three controllers, selection is
through
SCFG_USBPWRFAULT_SELCR
register bits.
USB2_DRVVBUS O VBUS power enable. For example, if Do not connect.These pins can be
an external hub is used, it can handle left floating.
this signal. The functionality of the
USB2_DRVVBUS signal is
determined by Extended RCW
PinMux Control Register
(SCFG_RCWPMUXCR0) in bitfield
IIC3_SCL.

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Table 23. USB 1/2/3 PHY pin termination checklist (continued)


Signal Name IO type Used Not Used Completed
USB2_PWRFAULT I Indicates that a VBUS fault has Pull low through a 1kΩ resistor to
occurred. For example, if an external GND.
hub is used, it can handle this signal.
The functionality of the
USB_PWRFAULT signal is
determined by by Extended RCW
PinMux Control
Register(SCFG_RCWPMUXCR0) in
bitfield IIC3_SDA.
The register
SCFG_USBPWRFAULT_SELCR[US
B2 _SEL] can be used to select
dedicated USB2_PWRFAULT signal
or to select shared USB_PWRFAULT
signal for USB controller 2.
USB3_DRVVBUS O VBUS power enable. For example, if Do not connect.These pins can be
an external hub is used, it can handle left floating.
this signal. The functionality of the
USB_DRVVBUS signal is determined
by by Extended RCW PinMux Control
Register(SCFG_RCWPMUXCR0) in
bitfield IIC4_SCL.
USB3_PWRFAULT I Indicates that a VBUS fault has Pull low through a 1kΩ resistor to
occurred. For example, if an external GND.
hub is used, it can handle this signal.
The functionality of the
USB_PWRFAULT signal is
determined by by Extended RCW
PinMux Control
Register(SCFG_RCWPMUXCR0) in
bitfield IIC4_SDA.
The register
SCFG_USBPWRFAULT_SELCR[US
B3 _SEL] can be used to select
dedicated USB3_PWRFAULT signal
or to select shared USB_PWRFAULT
signal for USB controller 3.

NOTE
USB3.0 PLLs can receive clock either from SYSCLK or DIFF_SYSCLK/
DIFF_SYSCLK_B. Ensure that clock selected has 100 MHz frequency.

5.12.1 USB1 PHY connections


This section describes the hardware connections required for the USB PHY.
This figure shows the VBUS interface for the chip.

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Interface recommendations

USB1_DRVVBUS
VBUS VBUS charge
(USB connector) pump USB1_PWRFAULT

USB1_VBUS

Chip

Figure 17. USB1 PHY VBUS interface

5.13 Ethernet Management Interface 1/2 pin termination


recommendations
Table 24. Ethernet Management Interface (EMI1/2) pin termination checklist
Signal Name IO type Used Not Used Completed
EMI1_MDC O The functionality of this signal is These pins should be tied low
determined by the EM1 field in the through a 2-10 kΩ resistor to
reset configuration word ground (GND), or may be
(RCW[EM1]). configured as a GPIOs and
outputs.
To configure as open drain signal,
write to EMI1_CMODE field in
reset configuration word
(RCW[EMI1_CMODE]).3,5
EMI1_MDIO IO The functionality of this signal is
determined by the EM1 field in the
reset configuration word
(RCW[EM1]).
To configure as open drain signal,
write to EMI1_DMODE field in
reset configuration word
(RCW[EMI1_DMODE]).3,6
EMI2_MDC O The functionality of these signals These pins should be tied low
is determined by the EM1 field in through a 2-10 kΩ resistor to
the reset configuration word ground (GND), or may be
(RCW[EM2]). configured as a GPIOs and
outputs.
To configure as open drain signal,
write to EMI1_CMODE field in
reset configuration word
(RCW[EMI2_CMODE]).4,5

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Table 24. Ethernet Management Interface (EMI1/2) pin termination checklist (continued)
Signal Name IO type Used Not Used Completed
EMI2_MDIO IO The functionality of this signal is
determined by the EM1 field in the
reset configuration word
(RCW[EM2]).
To configure as open drain signal,
write to EMI1_DMODE field in
reset configuration word
(RCW[EMI2_DMODE]).4,6

NOTE
1. Refer Ethernet A-010717: EMI -MDIO to MDC input hold time (tMDDXKH)
specification violation from LS1043A Chip errata.
2. For MDC frequency greater than 2.5 MHz and less than (or equal to) 10 MHz, the
load on the MDC/MDIO pads must not exceed 75pf.
3. If configured as open-drain, pull this pin to LVDD with a suitable resistor.
4. If configured as open-drain, pull this pin to TVDD with a suitable resistor.
5. In open-drain mode, the value of pull-up resistor depends on input impedance of all
the peripherals connected on EMI bus. More the peripherals or more the
impedance, stronger the pull-up. Typically 200Ω pull-up should suffice for 3-4
peripherals. Unless there is a requirement of MDC being an open-drain, it is
advised to configure MDC in "normal functional" mode. In "normal functional"
mode, the MDC will be actively driven and pull up resistors are not required.
6. In open-drain mode, the value of pull-up resistor depends on input impedance of all
the peripherals connected on EMI bus. More the peripherals or more the
impedance, stronger the pull-up. Typically 330Ω pull-up should suffice for 3-4
peripherals. Unless there is a requirement of MDIO being an open-drain, it is
advised to configure MDIO in "normal functional" mode. In "normal functional"
mode, the MDIO will be actively driven. A pull up resistors might still be required
as the peripherals on EMI bus might have their MDIO pins configured as open-
drain. The value of pull-up resistor depends on total input impedance of all the
peripherals connected.

5.13.1 Ethernet controller pin termination recommendations


The LS1043A/LS1023A supports two Ethernet Controllers (EC) which can connect to Ethernet PHYs using RGMII
protocols. Both, EC1 and EC2 operated using LVDD supply which supports 1.8 V/2.5 V operation.
Table 25. Ethernet controller pin termination checklist
Signal Name I/O type Used Not used Completed
EC1 in RGMII mode
EC1_TXD[0:3], O The functionality of these signals is Entire EC1 interface can be
EC1_TX_EN determined by the EC1 field in the configured as GPIOs and outputs
reset configuration word (RCW[EC1]). through RCW[EC1]
EC1_GTX_CLK O
EC1_RXD[0:3] I FMAN-MAC3 is connected to EC1
interface when RGMII is selected
EC1_RX_DV I through RCW[EC1] field.

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Table 25. Ethernet controller pin termination checklist (continued)


Signal Name I/O type Used Not used Completed
EC1_RX_CLK I EC1_TX_EN requires an external 1-kΩ
pull-down resistor to prevent PHY from
EC1_GTX_CLK1251 I seeing a valid Transmit Enable before
it is actively driven.
EC2 in RGMII mode
EC2_TXD[0:3], O The functionality of these signals is Entire EC2 interface can be
EC2_TX_EN determined by the EC2 field in the configured as GPIOs and outputs
reset configuration word (RCW[EC2]). through RCW[EC2]
EC2_GTX_CLK O
EC2_RXD[0:3] I FMAN-MAC4 is connected to EC2
interface when RGMII is selected
EC2_RX_DV I through RCW[EC2] field.
EC2_RX_CLK I EC2_TX_EN requires an external 1-kΩ
EC2_GTX_CLK1251 I pull-down resistor to prevent PHY from
seeing a valid Transmit Enable before
it is actively driven.

NOTE
1. Either of the EC1_GTX_CLK125 or EC2_GTX_CLK125 can be used to clock
both the EC interfaces in RGMII mode. The selection is through
SCFG_ECGTXCMCR[CLKSEL]. The unused clock pin should be pulled to GND.

5.14 QUICC Engine recommendations


The QUICC Engine block in the LS1043A/LS1023A device supports two TDM/HDLC interfaces.
The functionality of these signals is determined by the QE-TDMA and QE-TDMB fields in the reset configuration word.
The QUICC Engine supports 3.3 V and 1.8 V operation only.

5.14.1 QUICC Engine pin termination recommendations


Table 26. QUICC Engine pin termination checklist
Signal Name I/O type Used Not used Completed
QE Clock Signals
BRGO[1 & 4] O The functionality of these signals is Program as GPIOs and as output.
determined by the IIC3_SDA and
CLK[11:12] I
IIC3_SCL field in
SCFG_RCWPMUXCR0 register.
BRGO[2:3] O The functionality of these signals is Program as GPIOs and as output.
determined by the IIC2_EXT field in
CLK[9:10] I
reset configuration word
(RCW[IIC2_EXT]).
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Table 26. QUICC Engine pin termination checklist (continued)


Signal Name I/O type Used Not used Completed
RCW[QE_CLK_OVRRIDE] field in
reset configuration word provides
options to select other combinations
of BRGs and CLKs. For more details,
see the QorIQ LS1043A Reference
Manual (document LS1043ARM).
UCC1 signals
UC1_CDB_RXER I The functionality of these signals is If UCC1 is not used, all the pins
determined by the RCW[IRQ_EXT] can be programmed as GPIOs and
UC1_CTSB_RXDV I
field in the reset configuration word outputs.
UC1_RXD7 I except for UC1_CDB_RXER which is
UC1_TXD7 O determined by the IIC4_SCL bitfield
in register SCFG_RCWPMUXCR0.
UC1_RTSB_TXEN O
UCC3 signals
UC3_CDB_RXER I The functionality of these signals is If UCC3 is not used, all the pins
determined by the RCW[IRQ_EXT] can be programmed as GPIOs and
UC3_CTSB_RXDV I
field in the reset configuration word outputs.
UC3_RXD7 I except for UC3_CDB_RXER which is
UC3_TXD7 O determined by the IIC4_SDA bitfield
in register SCFG_RCWPMUXCR0.
UC3_RTSB_TXEN O
TDMA signals
TDMA_TXD O The functionality of these signals is If TDMA is not used, all the pins
determined by the RCW[IRQ_EXT] can be programmed as GPIOs and
TDMA_TSYNC I
field in the reset configuration word outputs.
TDMA_RQ O except for TDMA_RQ which is
TDMA_RSYNC I determined by the IIC4_SCL bitfield
in register SCFG_RCWPMUXCR0.
TDMA_RXD I
TDMB signals
TDMB_TXD O The functionality of these signals is If TDMB is not used, all the pins
determined by the RCW[IRQ_EXT] can be programmed as GPIOs and
TDMB_TSYNC I
field in the reset configuration word outputs.
TDMB_RQ O except for TDMB_RQ which is
TDMB_RSYNC I determined by the IIC4_SDA bitfield
in register SCFG_RCWPMUXCR0.
TDMB_RXD I

5.15 QSPI pin termination recommendations


Table 27. QSPI pin termination checklist
Signal Name IO type Used Not Used Completed
QSPI_A_SCK O The functionality of these signals is These pins can be left
determined by the unconnected.
QSPI_B_SCK O
RCW[IFC_GRP_F_EXT] bits of
QSPI_A_CS[0:1]2 O reset configuration word.
QSPI_B_CS[0:1]2 O

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Table 27. QSPI pin termination checklist (continued)


Signal Name IO type Used Not Used Completed
QSPI_A_DATA[0:2] IO If these pins are not used, they
should be pulled to GND through 1
kΩ resistor.
QSPI_A_DATA[3] IO The functionality of these signals is If these pins are not used, it
determined by the should be programmed as GPIOs
RCW[IFC_GRP_A_EXT] bits of and output.
reset configuration word.
QSPI_B_DATA[0:2] IO The functionality of these signals is
determined by the
RCW[IFC_GRP_D_EXT] bits of
reset configuration word.
QSPI_B_DATA[3] IO The functionality of these signals is
determined by the
RCW[IFC_GRP_E1_EXT] bits of
reset configuration word.

NOTE
1. QSPI signals are multiplexed with IFC signals and only select lines are available on
IFC when QSPI is used.
2. To avoid glitches or noise on chip select, it is recommended to use series resistor of
22Ω to 68Ω along with a 20pf capacitor to GND. The capacitor should be placed
close to the receiver.
3. If RCW[IFC_GRP_A_EXT] = 001, then IFC_A26 and IFC_A27 should be pulled
to GND through 4.7 kΩ resistor. Otherwise, these pins should be configured as
output GPIOs and left as unconnected.

5.16 SPI recommendations


The LS1043A/LS1023A serial peripheral interface (SPI) pins are powered from OVDD supply, which supports only 1.8 V
power.

5.16.1 SPI pin termination recommendations


Table 28. SPI pin termination checklist
Signal name I/O type Used Not used Completed
SPI_MISO I The functionality of these signals is These pins should be pulled high
(SPI_SIN) determined by the SPI_BASE and through a 2-10 kΩ resistor to OVDD.
SPI_EXT field in the reset configuration
SPI_MOSI I/O
(SPI_SOUT) (RCW[SPI_BASE],RCW[SPI_EXT]).

SPI_CLK O These pins can be left unconnected.


(SPI_SCK)
SPI_CS[0:3]_B O
(SPI_PCS[0:3])

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NOTE
1. The names in above table follow the following nomenclature:
X(Y) : Name in 21x21, 621 ball package (Name in 23x23, 780 ball package).
2. SPI_CLK is available only when RCW[SPI_EXT]=000 and RCW[SPI_BASE]=00.
Master mode requires that SPI_CLK is generated by Master, therefore only
RCW[SPI_EXT]=000 and RCW[SPI_BASE]=00 can be used for SPI controller on
this device although some SPI signals are also available when
RCW[SPI_EXT]=001/010.

5.17 General Purpose Input/Output pin termination


recommendations
Table 29. General Purpose Input/Output pin termination checklist
Signal Name IO type Used Not Used Completed
GPIO1_13 O The functionality of this signal is For all GPIO1 pins: When
determined by the RCW[ASLEEP] programmed as outputs, no
field in the reset configuration termination is required.
word.
GPIO1_14 IO The functionality of this signal is
determined by the RCW[RTC] field
in the reset configuration word.
GPIO1_[15:22] IO The functionality of these signals
is determined by the
RCW[UART_BASE] &
RCW[UART_EXT] field in the
reset configuration word.
GPIO1_[23:31] IO The functionality of these signals
is determined by the
RCW[IRQ_EXT] and
RCW[IRQ_BASE] fields in the
reset configuration word.
GPIO2_[0:3] IO The functionality of these signals For all GPIO2 pins: When
is determined by the programmed as outputs, no
RCW[SPI_BASE] fields in the termination is required.
reset configuration word.
GPIO2_[4:9] IO The functionality of these signals
is determined by the
RCW[SDHC_BASE] fields in the
reset configuration word.
GPIO2_[10:12] IO The functionality of these signals
is determined by the
RCW[IFC_GRP_E1_BASE] field in
the reset configuration word.
GPIO2_[13:15] IO The functionality of these signals
is determined by the
RCW[IFC_GRP_D_BASE] fields in
the reset configuration word.

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Table 29. General Purpose Input/Output pin termination checklist (continued)


Signal Name IO type Used Not Used Completed
GPIO2_[25:27] IO The functionality of these signals
is determined by the
RCW[IFC_GRP_A_BASE] field in
the reset configuration word.
GPIO3_[0:1] IO The functionality of these signals For all GPIO3 pins: When
is determined by the RCW[EM1] programmed as outputs, no
field in the reset configuration termination is required.
word.
GPIO3_[2:14] IO The functionality of these signals
is determined by the RCW[EC1]
field in the reset configuration
word.
GPIO3_[15:27] IO The functionality of these signals
is determined by the RCW[EC2]
field in the reset configuration
word.
GPIO4_[0:1] IO The functionality of these signals For all GPIO4 pins: When
is determined by the RCW[EM2] programmed as outputs, no
field in the reset configuration termination is required.
word.
GPIO4_[2:3] IO The functionality of these signals
is determined by the
RCW[IIC2_EXT] field in the reset
configuration word.
GPIO4_[10:11] IO The functionality of these signals
is determined by the IIC3_SCL
and IIC3_SDA fields in
SCFG_RCWPMUXCR0
respectively.
GPIO4_[12:13] IO The functionality of these signals
is determined by the IIC4_SCL
and IIC4_SDA fields in
SCFG_RCWPMUXCR0
respectively.
GPIO4_[29] IO The functionality of these signals
is determined by the
RCW[USB_DRVVBUS] field in the
reset configuration word.
GPIO4_[30] IO The functionality of these signals
is determined by the
RCW[USB_PWRFAULT] fields in
the reset configuration word.

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5.18 FTM1 pin termination recommendations


Table 30. FTM1 pin termination checklist
Signal Name IO type Used Not Used Completed
FTM1_CH[0:7] IO The functionality of these signals Program as GPIOs and outputs.
is determined by the EC1 field in
FTM1_EXTCLK I
the reset configuration
FTM1_FAULT I (RCW[EC1]).
FTM1_QD_PHA I
FTM1_QD_PHB I

5.19 FTM2 pin termination recommendations


Table 31. FTM2 pin termination checklist
Signal Name IO type Used Not Used Completed
FTM2_CH[0:7] IO The functionality of these signals Program as a GPIO and as an
is determined by the EC2 field in output.
FTM2_EXTCLK I
the reset configuration
FTM2_FAULT I (RCW[EC2]).
FTM2_QD_PHA I
FTM2_QD_PHB I

5.20 FTM3 pin termination recommendations


Table 32. FTM3 pin termination checklist
Signal Name IO type Used Not Used Completed
FTM3_CH[0:7] IO The functionality of these signals Program as a GPIO and as an
is determined by the IRQ_BASE output.
and IRQ_EXT fields in the reset
configuration word
(RCW[IRQ_BASE],
RCW[IRQ_EXT]).
FTM3_EXTCLK I The functionality of these signals
is determined by the IIC4_SDA
FTM3_FAULT I
bitfield in register
SCFG_RCWPMUXCR0.
FTM3_QD_PHA I The functionality of these signals
is determined by the IIC2_EXT
FTM3_QD_PHB I
fields in the reset configuration
word (RCW[IIC2_EXT]).

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5.21 FTM4 pin termination recommendations


Table 33. FTM4 pin termination checklist
Signal Name IO type Used Not Used Completed
FTM4_CH[0:7] IO The functionality of FTM4_CH[0-5] Program as a GPIO and as an
signals is determined by the output.
UART_EXT fields in the reset
configuration word
(RCW[UART_EXT]).

The functionality of FTM4_CH6


and FTM4_CH7 signals is
determined by the SDHC_EXT
fields in the reset configuration
word (RCW[SDHC_EXT]).
FTM4_EXTCLK I The functionality of these signals
is determined by the SDHC_EXT
FTM4_FAULT I
fields in the reset configuration
FTM4_QD_PHA I word (RCW[SDHC_EXT]).
FTM4_QD_PHB I

5.22 FTM5 pin termination recommendations


Table 34. FTM5 pin termination checklist
Signal Name IO type Used Not Used Completed
FTM5_CH[0:1] IO The functionality of these signals Program as a GPIO and as an
is determined by the output.
FTM5_EXTCLK I
IFC_GRP_A_EXT fields in the
reset configuration word
(RCW[IFC_GRP_A_EXT]).

5.23 FTM6 pin termination recommendations


Table 35. FTM6 pin termination checklist
Signal Name IO type Used Not Used Completed
FTM6_CH[0:1] IO The functionality of these signals Program as a GPIO and as an
is determined by the output.
FTM6_EXTCLK I
IFC_GRP_D_EXT fields in the
reset configuration word
(RCW[IFC_GRP_D_EXT]).

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5.24 FTM7 pin termination recommendations


Table 36. FTM7 pin termination checklist
Signal Name IO type Used Not Used Completed
FTM7_CH[0:1] IO The functionality of these signals Program as a GPIO and as an
is determined by the output.
FTM7_EXTCLK I
IFC_GRP_E1_EXT fields in the
reset configuration word
(RCW[IFC_GRP_E1_EXT]).

5.25 FTM8 pin termination recommendations


Table 37. FTM8 pin termination checklist
Signal Name IO type Used Not Used Completed
FTM8_CH[0:1] IO The functionality of these signals Program as a GPIO and as an
is determined by the IIC3_SCL output.
and IIC3_SDA bitfields
respectively in register
SCFG_RCWPMUXCR0.

5.26 IEEE 1588 recommendations

5.26.1 IEEE 1588 pin termination recommendations


Table 38. IEEE 1588 pin termination checklist
Signal Name I/O Used Not used Completed
type
TSEC_1588_CLK_IN I Connect to external high- Program as GPIOs and outputs.
precisiontimer reference input.
The functionality of this signal is
determined by the EC2 field in the
reset configuration word
(RCW[EC2]).
TSEC_1588_ALARM_ O The functionality of these signals is
OUT1 determined by the EC2 field in the
TSEC_1588_ALARM_ O reset configuration word
OUT2 (RCW[EC2]).

TSEC_1588_CLK_OUT O
TSEC_1588_PULSE_O O
UT1

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Table 38. IEEE 1588 pin termination checklist (continued)


Signal Name I/O Used Not used Completed
type
TSEC_1588_PULSE_O O
UT2
TSEC_1588_TRIG_IN1 I
TSEC_1588_TRIG_IN2 I

NOTE
When configured for IEEE 1588, the EC2 pins those are not available for IEEE 1588, are
configured for GPIO. All IEEE 1588 pins are referenced to LVDD.

5.27 System control pin termination recommendations


Table 39. System Control pin termination checklist
Signal Name I/O type Used Not used Completed
PORESET_B I This pin is required to be asserted as per the applicable chip data sheet, in
relation to minimum assertion time and during power-up/power-down. It is an
input-only pin and must be asserted to sample power on configuration pins.
HRESET_B I/O This pin is an open drain signal and should be pulled high through a 2-10 kΩ
resistor to OVDD.
RESET_REQ_B O Must not be pulled down during power- This pin should be pulled high through
on reset. a 2-10 kΩ resistor to OVDD and must
not be pulled down during power-on
reset.

NOTE
1. If on-board programming of NOR and NAND boot flash, QSPI boot flash, or SD
card is needed, then maintain an option (may be via a jumper) that keeps
PORESET_B and RESET_REQ_B disconnected from each other. Booting from a
blank flash causes boot error, which in turn causes assertion of RESET_REQ_B.
When RESET_REQ_B is connected with PORESET_B, the device goes in a
recurring reset loop and does not provide enough time for JTAG to take control of
the device and perform any operation.
2. For RCW override, RESET_REQ_B should be disconnected from PORESET_B or
HRESET_B. An option on board is required.

5.28 JTAG pin termination recommendations


Table 40. JTAG pin termination checklist
Signal Name IO type Used Not Used Completed
TCK I Connect to pin 4 of the Arm Cortex 10-pin header. This pin requires a
2-10 kΩ resistor to OVDD.

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Table 40. JTAG pin termination checklist (continued)


Signal Name IO type Used Not Used Completed
TDI I Connect to pin 8 of the Arm Cortex May be left unconnected.
10-pin header. This pin has a
weak (~20 kΩ) internal pull-up P-
FET that is always enabled.
TDO O Connect to pin 6 of the Arm Cortex May be left unconnected.
10-pin header. This output is
actively driven during reset rather
than being tri-stated during reset.
TMS I Connect to pin 2 of the Arm Cortex May be left unconnected.
10-pin header. This pin has a
weak (~20 kΩ) internal pull-up P-
FET that is always enabled.
TRST_B I This pin has a weak (~20 kΩ) Tie TRST_B to PORESET_B
internal pull-up P-FET that is through a 0 kΩ resistor.
always enabled.
Connect as shown in Figure 18.

5.28.1 JTAG system-level recommendations


Table 41. JTAG system-level checklist
Item Completed
Arm®Cortex® 10-pin header signal interface to JTAG port
Configure the group of system control pins as shown in Figure 18.
NOTE: These pins must be maintained at a valid deasserted state under normal operating conditions,
because most have asynchronous behavior and spurious assertion gives unpredictable results.
The JTAG port of these processors allows a remote computer system (typically, a PC with dedicated hardware
and debugging software) to access and control the internal operations of the processor. The Arm Cortex 10-pin
header connects primarily through the JTAG port of the processor, with some additional status monitoring
signals. The Arm Cortex 10-pin header interface requires the ability to independently assert PORESET_B in
order to fully control the processor. If the target system has independent reset sources, such as voltage
monitors, watchdog timers, power supply failures, or push-button switches, then the nRESET signals must be
merged into these signals with logic.
Boundary-scan testing
Ensure that TRST_B is asserted during power-on reset flow to ensure that the JTAG boundary logic does not
interfere with normal chip operation.
Follow the arrangement shown in Figure 18 to allow the Arm Cortex 10-pin header to assert PORESET_B
independently while ensuring that the target can drive PORESET_B as well.
The Arm® Cortex® 10-pin interface has a standard header, shown in the following figure. The connector
typically has pin 7 removed as a connector key. The signal placement recommended in this figure is common
to all known emulators.

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Table 41. JTAG system-level checklist


Item Completed

VDD 1 2 TMS

GND 3 4 TCK

GND 5 6 TDO

KEY
KEY 8 TDI
No pin

GNDDetect 9 10 nRESET

NOTE: The Arm Cortex 10-pin header adds many benefits such as breakpoints, watch points, register and
memory examination/modification, and other standard debugger features. An inexpensive option is to
leave the Arm Cortex 10-pin header unpopulated until needed.

Correct operation of the JTAG interface requires configuration of a group of system control pins as demonstrated in Figure
18. Care must be taken to ensure that these pins are maintained at a valid deasserted state under normal operating conditions,
as most have asynchronous behavior and spurious assertion gives unpredictable results.

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1 kΩ
OVDD

From target HRESET_B HRESET_B


board sources
(if any) PORESET_B 10 kΩ
PORESET_B
2

nRESET 10 kΩ
10
10 kΩ
OVDD

10 kΩ TRST_B
Other TRST_B source
(for example, boundary scan)

1 2
10 Ω
VDD
3 4
1

5 6
Arm Cortex 10-pin header

KEY
8
No pin

9 10
TMS
2 TMS

Arm Cortex 10-pin


TDO
physical pinout 6 TDO

TDI
8 TDI

TCK
4 TCK

GNDDetect1 10 kΩ
9
GND
5
GND
3

Note:
1. GNDDetect is an optional board feature. Check with 3rd-party tool vendor.
2. This switch is included as a precaution for BSDL testing. The switch should be open during BSDL testing
to avoid accidentally asserting the TRST line. If BSDL testing is not being performed, ensure this switch is closed.

Figure 18. JTAG interface connection

5.29 SerDes block power supply decoupling recommendations


The SerDes block requires a clean, tightly regulated source of power (S1VDD and X1VDD) to ensure low jitter on transmit
and reliable recovery of data in the receiver. An appropriate decoupling scheme is outlined below:
1. The board should have at least 1 x 0.1 uF SMT ceramic chip capacitor placed as close as possible to each supply ball of
the device. Where the board has blind vias, these capacitors should be placed directly below the chip supply and ground

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connections. Where the board does not have blind vias, these capacitors should be placed in a ring around the device as
close to the supply and ground connections as possible.
2. Between the device and any SerDes voltage regulator, there should be a lower bulk capacitor. For example, a 10 uF,
low ESR SMT tantalum or ceramic capacitor. There should also be a higher bulk capacitor. For example, a 100-300 uF
low ESR SMT tantalum or ceramic capacitor.

NOTE
Only SMT capacitors should be used to minimize inductance. Connections from all
capacitors to power and ground should be done with multiple vias to further reduce
inductance.

5.30 Clock pin termination recommendations


Table 42. Clock pin termination checklist
Signal Name IO type Used Not Used Completed
EC1_GTX_CLK O The functionality of this signal Program as a GPIO and as an
is determined by the EC1 field output.
EC1_GTX_CLK1254 I
in the reset configuration word
(RCW[EC1]).
The LS1043A chip has a duty
cycle reshaper inside RGMII
block. This allows GTX clock
from RGMII PHY to be used.
EC2_GTX_CLK O The functionality of this signal Program as a GPIO and as an
is determined by the EC2 field output.
EC2_GTX_CLK1254 I
in the reset configuration word
(RCW[EC2]).
The LS1043A chip has a duty
cycle reshaper inside RGMII
block. This allows GTX clock
from RGMII PHY to be used.
SYSCLK1 I This is the single-ended This pin should be pulled low through
primary clock input to the chip. a 2-10 kΩ resistor to GND.
It supports a 64.0 MHz to
100.0 MHz clock range.
Note that 64 MHz SYSCLK
reference frequency is
specifically for Profibus
support on QUICC Engine.
DIFF_SYSCLK3 I These pins are the differential These pins should be pulled low
primary clock input to the chip. through a 2-10 kΩ resistor to GND,
DIFF_SYSCLK_B3 I
These pins support 100 MHz or they can be left floating.
only. When used, these pins
should be connected to a 100
MHz differential clock
generator.
RTC I The functionality of this signal Pull low through a 2-10 kΩ resistor to
is determined by the RTC field GND, or program pin as a GPIO and
in the reset configuration word output.
(RCW[RTC]).
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Table 42. Clock pin termination checklist (continued)


Signal Name IO type Used Not Used Completed
NOTE: RTC is the only clock
source for WDOG
functionality. To
support WDOG
functionality RTC
required 32 KHz
external clock source.
Without supplying the
32 KHz external clock
source the WDOG
functionality will be
inoperable.
DDRCLK2 I The reference clock for the This pin should be pulled low through
DDR controller supports a 64 a 2-10 kΩ resistor to GND.
MHz to 100 MHz input clock
range.

NOTE
1. In the "Single Oscillator Source" reference clock mode supported by LS1043A,
DIFF_SYSCLK/DIFF_SYSCLK_B (differential) clock inputs are used as primary
clock inputs and SYSCLK is unused. Power-on-configuration signal cfg_eng_use0
selects between SYSCLK (single ended) and DIFF_SYSCLK/DIFF_SYSCLK_B
(differential) clock inputs.
2. In the "Single Oscillator Source" reference clock mode, DIFF_SYSCLK/
DIFF_SYSCLK_B clock inputs can be selected to feed the DDR PLL. RCW bits
[DDR_REFCLK_SEL] are used for this selection and DDRCLK is unused. The
options for RCW bits 186-187 (RCW[DDR_REFCLK_SEL], DDR reference clock
selection) are as follows:
a. 2'b00: The DDRCLK pin provides the reference clock to the DDR PLL
b. 2'b01: DIFF_SYSCLK/DIFF_SYSCLK_B provides the reference clock to
the DDR PLL
3. When SYSCLK is chosen as the primary clock input to the chip, these pins are
unused.
4. Either of the EC1_GTX_CLK125 or EC2_GTX_CLK125 can be used to clock
both the EC interfaces in RGMII mode. The selection can be made through
SCFG_ECGTXCMCR[CLKSEL].

5.31 Single source clocking


The chip supports the single source clocking options with single, two, and more reference clocks.

5.32 Single Oscillator Source reference clock mode


In this mode, single onboard oscillator can provide the reference clock (100 MHz) to the following PLLs:
• Platform PLL
• Core PLLs
• USB PLL

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• DDR PLL
• SerDes PLLs

The reset configuration field identifies whether the SYSCLK (single-ended) or DIFF_SYSCLK (differential) is selected as
the clock input to the chip.
The RCW[DDR_REFCLK_SEL] bit is used to select clock input (DIFF_SYSCLK or DDRCLK) to the DDR PLL.
The following figure shows the system view of single oscillator source clocking. In this figure, the on-board oscillator
generates three differential clock outputs. The first differential output is used to provide the clock to system clock associated
PLLs and DDR PLL. However, the second and third differential outputs are used to provide clocks to SerDes PLLs.
A multiplexer between system clock and USBCLK is used to provide the USB PHY reference clock to the USB PLL. And,
multiplexer between DIFF_SYSCLK/DIFF_SYSCLK_B inputs and DDRCLK is used to provide reference clock to the DDR
PLL.
The duty cycle reshaper reshapes the 125 MHz ECn_GTX_CLK125 which is fed into frame manager for transmission as
ECn_GTX_CLK.

RGMII1 TX CLK (125MHz)


EC1_GTX_CLK125
Duty Cycle 125MHz duty cycle corrected clock
MUX

RGMII2 TX CLK (125MHz)


EC2_GTX_CLK125 Reshaper

SYSCLK 1.0 - 1.5 GHz


MUX

SYS_REF_CLK
Core PLL
DIFF_SYSCLK_B/DIFF_SYSCLK
400 MHZ
Platform PLL
Platform Clock
On Board RCW[SYS_PLL_CFG]
Oscillator RCW[SYS_PLL_RAT]
RCW[SYS_PLL_SPD]
100 MHZ
3 Differential outputs

(SCFG_USB_REFCLK_SELCR[1-3])
cfg_eng_use0
SD1_REF_CLK1_P/SD1_REF_CLK1_N
SD1_REF_CLK2_P/SD1_REF_CLK2_N

MUX

USB PHY
3 instances
USBCLK
usb phy clk
MUX

1G-1.6G
DDR Controller
DDR
PLL
DDRCLK

RCW[MEM_PLL_RAT]
RCW[MEM_PLL_CFG]
RCW[DDR_REFCLK_SEL] RCW[MEM_PLL_SPD]

SerDes PLL1

SerDes PLL2

Figure 19. Single oscillator source clocking

5.33 Single Oscillator Source clock select


The single oscillator source clock select input, described in this table, selects between SYSCLK (single ended) and
DIFF_SYSCLK/DIFF_SYSCLK_B (differential) inputs.

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Interface recommendations

Table 43. Single oscillator source clock select


Functional signals Reset configuration name Value (binary) Options
IFC_WE0_B cfg_eng_use0 0 DIFF_SYSCLK/DIFF_SYSCLK_B
(differential)
Default (1)
1 SYSCLK (single ended)
IFC_OE_B cfg_eng_use1 0 On-chip LVDS termination disabled
Default (1) On-chip LVDS termination must 1 On-chip LVDS termination enabled
NOT be enabled when external
(off-chip) termination are active.
IFC_WP_B[0] cfg_eng_use2 Don't care Reserved

5.34 DIFF_SYSCLK/DIFF_SYSCLK_B system-level


recommendations
Table 44. DIFF_SYSCLK/DIFF_SYSCLK_B system-level
checklist
Item Completed
DIFF_SYSCLK/DIFF_SYSCLK_B can be selected to provide primary clock to the chip.
Although it is a Low Voltage Differential Signaling (LVDS) type clock driver but it has AC/DC characteristics
identical to the SerDes reference clock inputs which are High-Speed Current Steering Logic (HCSL)-
compatible. This eases system design as same clock driver can be used to provide the various differential
clock inputs required by the chip

DIFF_SYSCLK
100 Ohm LVDS
RX
DIFF_SYSCLK_B

Figure 20. LVDS receiver


Interfacing DIFF_SYSCLK/DIFF_SYSCLK_B with other Differential Signalling levels
Connection with HCSL Clock driver
Table continues on the next page...

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Interface recommendations

Table 44. DIFF_SYSCLK/DIFF_SYSCLK_B system-level checklist


(continued)
Item Completed

HCSL CLK Driver Chip NXP device

DIFF_SYSCLK
CLK_Out
33Ω

LVDS CLK
Clock 100 Ω differential PWB trace 100 Ω Receiver

33Ω

DIFF_SYSCLK_B
CLK_Out

Clock driver vendor dependent


source termination resistor
Total 50 Ω assume clock driver's
output impedance is about 16 Ω.

Figure 21. Interfacing with HCSL clock driver (Reference only)


Connection with LVDS Clock driver

NXP device
LVDS CLK Driver chip

CLK_Out DIFF_SYSCLK

LVDS CLK
Clock 100 Ω differential PWB trace 100 Ω Receiver

CLK_Out DIFF_SYSCLK_B

Figure 22. Interfacing with LVDS clock driver (Reference only)


Connection with LVPECL Clock driver
Table continues on the next page...

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52 NXP Semiconductors
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Table 44. DIFF_SYSCLK/DIFF_SYSCLK_B system-level checklist


(continued)
Item Completed

LVPECL CLK
Driver chip NXP device

CLK_Out DIFF_SYSCLK
R2

R1 LVDS CLK
Clock 100 Ω differential PWB trace 100 Ω Receiver

R2

CLK_Out DIFF_SYSCLK_B
R1

R1=140 Ω to 240 Ω

Figure 23. Interfacing with LVPECL clock driver (Reference only)


Single-Ended Connection with Clock driver
The DIFF_SYSCLK_B should be terminated to OVDD/2

Single-ended
CLK driver chip

Total 50 Ω. Assume clock driver's NXP device


output impedance is about 16 Ω.

DIFF_SYSCLK
33 Ω
Clock

CLK_Out LVDS CLK


100 Ω differential PWB trace 100 Ω receiver

DIFF_SYSCLK_B

OVDD/2

Figure 24. Single ended connection (Reference only)

6 Hardware design considerations

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NXP Semiconductors 53
Hardware design considerations

6.1 System clocking


This section describes the PLL configuration of the chip.

6.1.1 PLL characteristics


Characteristics of the chip's PLLs include the following:
• Core cluster CGA PLL1 generates a clock for all the cores and/or FMAN, from the externally supplied SYSCLK or
LVDS generated (single ended) input.
• Core cluster CGA PLL2 generates a clock for all the cores and/or FMAN & eSDHC, from the externally supplied
SYSCLK or LVDS generated (single ended) input.
• The frequency ratio between the platform and SYSCLK is selected using the platform PLL ratio configuration bits as
described in Platform to SYSCLK PLL ratio.
• The DDR block PLL generates an asynchronous DDR clock from the externally supplied DDRCLK input.
• The 4 lane SerDes blocks has two PLLs which generate a clock from their respective externally supplied
SD1_REF_CLKn_P/SD1_REF_CLKn_N inputs. The frequency ratio is selected using the SerDes PLL RCW
configuration bits as described in Valid reference clocks and PLL configurations for SerDes protocols .

6.1.2 Clock ranges


This table provides the clocking specifications for the processor core, platform, memory, and integrated flash controller.
Table 45. Processor, platform, and memory clocking specifications (VDD = 0.9 V)
Characteristic Maximum processor core frequency Unit Notes
1000 MHz 1200 MHz
Min Max Min Max
Core cluster group PLL frequency 1000 1000 1000 1200 MHz 1
Platform clock frequency 256 300 256 300 MHz 1
Memory Bus Clock Frequency (DDR3L) 500 650 500 650 MHz 1, 2, 3
Memory Bus Clock Frequency (DDR4) 650 650 650 650 MHz 1, 3
IFC clock frequency - 100 - 100 MHz 4
FMan 350 500 350 500 MHz -
1. Caution:The platform clock to SYSCLK ratio and core to SYSCLK ratio settings must be chosen such that the resulting
SYSCLK frequency, core frequency, and platform clock frequency do not exceed their respective maximum or minimum
operating frequencies.
2. The memory bus clock speed is half the DDR3L/DDR4 data rate. DDR3L memory bus clock frequency is limited to min =
1000 MT/s whereas DDR4 memory bus clock frequency is limited to min/max = 1300 MT/s.
3. The memory bus clock speed is dictated by its own PLL.
4. The integrated flash controller (IFC) clock speed on IFC_CLK[0:1] is determined by the IFC module input clock (platform
clock / 2) divided by the IFC ratio programmed in CCR[CLKDIV]. See the chip reference manual for more information.
5. The minimum platform frequency should meet the requirements in Minimum platform frequency requirements for high-
speed interfaces.
6. For supported voltage/frequency options, refer to orderable part list of QorIQ LS1043A and LS1023A Multicore
Communications Processors at www.nxp.com

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Table 46. Processor, platform, and memory clocking specifications (VDD = 1.0 V)
Characteristic Maximum processor core frequency Unit Notes
1000 MHz 1200 MHz 1400 MHz 1600 MHz
Min Max Min Max Min Max Min Max
Core cluster group PLL 1000 1000 1000 1200 1000 1400 1000 1600 MHz 1
frequency
Platform clock frequency 256 300 256 300 256 300 256 400 MHz 1
Memory Bus Clock Frequency 500 800 500 800 500 800 500 800 MHz 1, 2, 3
(DDR3L)
Memory Bus Clock Frequency 650 800 650 800 650 800 650 800 MHz 1, 3
(DDR4)
IFC clock frequency - 100 - 100 - 100 - 100 MHz 4
FMan 350 500 350 500 350 500 350 500 MHz
1. Caution:The platform clock to SYSCLK ratio and core to SYSCLK ratio settings must be chosen such that the resulting
SYSCLK frequency, core frequency, and platform clock frequency do not exceed their respective maximum or minimum
operating frequencies.
2. The memory bus clock speed is half the DDR3L/DDR4 data rate. DDR3L memory bus clock frequency is limited to min =
1000 MT/s whereas DDR4 memory bus clock frequency is limited to min = 1300 MT/s.
3. The memory bus clock speed is dictated by its own PLL.
4. The integrated flash controller (IFC) clock speed on IFC_CLK[0:1] is determined by the IFC module input clock (platform
clock / 2) divided by the IFC ratio programmed in CCR[CLKDIV]. See the chip reference manual for more information.
5. The minimum platform frequency should meet the requirements in Minimum platform frequency requirements for high-
speed interfaces.
6. For supported voltage/frequency options, refer to orderable part list of QorIQ LS1043A and LS1023A Multicore
Communications Processors at www.nxp.com

6.1.2.1 DDR clock ranges


The DDR memory controller can run only in asynchronous mode, where the memory bus is clocked with the clock provided
on the DDRCLK input pin, which has its own dedicated PLL.
This table provides the clocking specifications for the memory bus.
Table 47. Memory bus clocking specifications
Characteristic Min Freq. Max Freq. Min Data Max Data Notes
(MHz) (MHz) Rate (MT/s) Rate (MT/s)
Memory bus clock frequency and Data Rate for 500 800 1000 1600 1, 2, 3
DDR3L
Memory bus clock frequency and Data Rate for 650 800 1300 1600 1, 2, 3
DDR4
Notes:
1. Caution: The platform clock to SYSCLK ratio and core to platform clock ratio settings must be chosen such that the
resulting SYSCLK frequency, core frequency, and platform frequency do not exceed their respective maximum or minimum
operating frequencies. See Platform to SYSCLK PLL ratio, and Core cluster to SYSCLK PLL ratio, and DDR controller PLL
ratios, for ratio settings.

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Hardware design considerations

Table 47. Memory bus clocking specifications


Characteristic Min Freq. Max Freq. Min Data Max Data Notes
(MHz) (MHz) Rate (MT/s) Rate (MT/s)
2. The memory bus clock refers to the chip's memory controllers' Dn_MCK[0:1] and Dn_MCK[0:1]_B output clocks, running at
half of the DDR data rate.
3. The memory bus clock speed is dictated by its own PLL. See DDR controller PLL ratios.
4. For supported voltage/frequency options, refer to orderable part list of QorIQ LS1043A and LS1023A Multicore
Communications Processors at www.nxp.com

6.1.3 Platform to SYSCLK PLL ratio


This table lists the allowed platform clock to SYSCLK ratios.
Because the DDR operates asynchronously, the memory-bus clock-frequency is decoupled from the platform bus frequency.
For all valid platform frequencies supported on this chip, set the RCW Configuration field SYS_PLL_CFG = 0b00.
Table 48. Platform to SYSCLK PLL ratios
Binary Value of SYS_PLL_RAT Platform:SYSCLK Ratio
0_0011 3:1
0_0100 4:1
0_0101 5:1
0_0110 6:1
All Others Reserved
Notes:
1. For supported voltage/frequency options, refer to orderable part list of QorIQ LS1043A and LS1023A Multicore
Communications Processors at www.nxp.com.

6.1.4 Core cluster to SYSCLK PLL ratio


The clock ratio between SYSCLK and each of the core cluster PLLs is determined by the binary value of the RCW
Configuration field CGm_PLLn_RAT. This table describes the supported ratios. For all valid core cluster frequencies
supported on this chip, set the RCW Configuration field CGn_PLL_CFG = 0b00.
This table below lists the supported asynchronous core cluster to SYSCLK ratios.
Table 49. Core cluster PLL to SYSCLK ratios
Binary value of CGm_PLLn_RAT Core cluster:SYSCLK Ratio
00_1010 10:1
00_1011 11:1
00_1100 12:1
00_1101 13:1
00_1110 14:1

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Table 49. Core cluster PLL to SYSCLK ratios


(continued)
Binary value of CGm_PLLn_RAT Core cluster:SYSCLK Ratio
00_1111 15:1
01_0000 16:1
01_0001 17:1
01_0010 18:1
01_0011 19:1
01_0100 20:1
01_0101 21:1
01_0110 22:1
01_0111 23:1
01_1000 24:1
01_1001 25:1
All others Reserved
Notes:
1. For supported voltage/frequency options, see the orderable part list of QorIQ LS1043A and LS1023A multicore
communications processors at www.nxp.com.

6.1.5 Core complex PLL select


The clock frequency of each core is determined by the binary value of the RCW Configuration field C1_PLL_SEL. The
tables describe the selections available for each core, where each individual core can select a frequency from their respective
tables.
Table 50. Core PLL select
Binary Value of C1_PLL_SEL Core cluster ratio
0000 CGA PLL1 /1
0001 CGA PLL1 /2
0100 CGA PLL2 /1
0101 CGA PLL2 /2

6.1.6 DDR controller PLL ratios


DDR memory controller operates asynchronous to the platform.
In asynchronous DDR mode, the DDR data rate to DDRCLK ratios supported are listed in the following table. This ratio is
determined by the binary value of the RCW Configuration field MEM_PLL_RAT (bits 10-15).
The RCW Configuration field MEM_PLL_CFG (bits 8-9) must be set to MEM_PLL_CFG = 0b00 for all valid DDR PLL
reference clock frequencies supported on this chip.

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Table 51. DDR clock ratio


Binary value of MEM_PLL_RAT DDR data- Maximum supported DDR data-rate (MT/s)
rate:DDRCLK
ratio
00_1010 10:1 The product of Input DDR Clock X Multiplication factor
should range between 1000 MHz-1600MHz.
00_1011 11:1 The product of Input DDR Clock X Multiplication factor
should range between 1000 MHz-1600MHz.
00_1100 12:1 The product of Input DDR Clock X Multiplication factor
should range between 1000 MHz-1600MHz.
00_1101 13:1 The product of Input DDR Clock X Multiplication factor
should range between 1000 MHz-1600MHz.
00_1110 14:1 The product of Input DDR Clock X Multiplication factor
should range between 1000 MHz-1600MHz.
00_1111 15:1 The product of Input DDR Clock X Multiplication factor
should range between 1000 MHz-1600MHz.
01_0000 16:1 The product of Input DDR Clock X Multiplication factor
should range between 1000 MHz-1600MHz.
01_0001 17:1 The product of Input DDR Clock X Multiplication factor
should range between 1000 MHz-1600MHz.
01_0010 18:1 The product of Input DDR Clock X Multiplication factor
should range between 1000 MHz-1600MHz.
01_0011 19:1 The product of Input DDR Clock X Multiplication factor
should range between 1000 MHz-1600MHz.
01_0100 20:1 The product of Input DDR Clock X Multiplication factor
should range between 1000 MHz-1600MHz.
01_0101 21:1 The product of Input DDR Clock X Multiplication factor
should range between 1000 MHz-1600MHz.
01_0110 22:1 The product of Input DDR Clock X Multiplication factor
should range between 1000 MHz-1600MHz.
01_0111 23:1 The product of Input DDR Clock X Multiplication factor
should range between 1000 MHz-1600MHz.
01_1000 24:1 The product of Input DDR Clock X Multiplication factor
should range between 1000 MHz-1600MHz.
All Others Reserved -
Notes:
1. For supported voltage/frequency options, refer to orderable part list of QorIQ LS1043A and LS1023A Multicore
Communications Processors at www.nxp.com.

6.1.7 Valid reference clocks and PLL configurations for SerDes


protocols
Each supported SerDes protocol allows for a finite set of valid SerDes-related RCW fields and reference clock frequencies.

The clock ratio between each SerDes PLLs and their respective externally supplied SD1_REF_CLKn_P/SD1_REF_CLKn_N
inputs is determined by a set of RCW configuration fields, SRDS_PRTCL_S1, SRDS_PLL_REF_CLK_SEL_S1, and
SRDS_DIV_PEX as shown in this table.

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Hardware design considerations

Table 52. Valid SerDes RCW encodings and reference clocks


SerDes protocol Valid reference Valid setting for Valid setting for SRDS_PLL_REF Valid setting for
(given lane) clock frequency SRDS_PRTCL_S1 _CLK_SEL_S1 SRDS_DIV_PEX
PLL1 PLL2
High Speed Serial interface
PCI Express 2.5 100 MHz Any PCIe 0: 100 MHz 0: 100 MHz 10: 2.5 G
Gbit/s (doesn't 125 MHz 1: 125 MHz 1: 125 MHz
negotiate upwards)
PCI Express 5 Gbit/s 100 MHz Any PCIe 0: 100 MHz 0: 100 MHz 01: 5 G
(can negotiate up to 125 MHz 1: 125 MHz 1: 125 MHz
5 Gbit/s)
SATA (1.5, 3, 6 100 MHz Any SATA 0: 100 MHz - Don't Care
Gbit/s) 125 MHz 1: 125 MHz -
Networking interfaces
SGMII (1.25 Gbit/s) 100 MHz SGMII @ 1.25 Gbit/s 0: 100 MHz 0: 100 MHz Don't Care
125 MHz 1: 125 MHz 1: 125 MHz
2.5 G SGMII (3.125 125 Mhz SGMII @ 3.125 0: 125 MHz - Don't Care
Gbit/s) Gbit/s
156.25 MHz 1: 156.25 MHz -
QSGMII (5 Gbit/s) 100 MHz Any QSGMII 0: 100 MHz 0: 100 MHz Don't Care
125 MHz 1: 125 MHz 1: 125 MHz
XFI (10.3125 Gbit/s) 156.25 Mhz - -
1: 156.25 MHz
-
Notes:
1) A spread-spectrum reference clock is permitted for PCI Express. However, if any other high speed interface such as SGMII,
QSGMII, SATA, or Debug is used concurrently on the same SerDes bank, spread-spectrum clocking is not permitted.
2) SerDes lanes configured as SATA initially operate at 3.0 Gbit/s. 1.5 Gbit/s operation may later be enabled through the SATA IP
itself. It is possible for software to set each SATA at different rates.

6.1.8 Frequency options


This section discusses interface frequency options.

6.1.8.1 SYSCLK and core cluster frequency options


This table shows the expected frequency options for SYSCLK and core cluster frequencies.
Table 53. SYSCLK and core cluster frequency1
Core cluster: SYSCLK Ratio SYSCLK (MHz)
64.00 66.67 100.00
Core cluster Frequency - (MHz)1
10:1 1000
11:1 1100

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Hardware design considerations

Table 53. SYSCLK and core cluster frequency1 (continued)


Core cluster: SYSCLK Ratio SYSCLK (MHz)
64.00 66.67 100.00
Core cluster Frequency - (MHz)1
12:1 1200
13:1 1300
14:1 1400
15:1 1000 1500
16:1 1024 1067 1600
17:1 1088 1133
18:1 1152 1200
19:1 1216 1267
20:1 1280 1333
21:1 1344 1400
22:1 1408 1467
23:1 1472 1533
24:1 1536 1600
25:1 1600
Notes:
1. Core cluster output is the operating frequency of the core.
2. Core cluster frequency values are shown rounded up to the nearest whole number (decimal place accuracy removed)
3. When using Single Source clocking only 100 MHz input is available.
4. For supported voltage/frequency options, see the orderable part list of QorIQ LS1043A and LS1023A Multicore
Communications Processors at www.nxp.com.

6.1.8.2 SYSCLK and platform frequency options


This table shows the expected frequency options for SYSCLK and platform frequencies.
Table 54. SYSCLK and platform frequency options
Platform: SYSCLK Ratio SYSCLK (MHz)
64.00 66.67 100.00
Platform Frequency (MHz)1
3:1 300
4:1 256 267 400
5:1 320 333
6:1 384 400
Notes:
1. Platform frequency values are shown rounded down to the nearest whole number (decimal place accuracy removed)
2. When using Single source clocking, only 100 MHz options are valid
3. For supported voltage/frequency options, see the orderable part list of QorIQ LS1043A and LS1023A Multicore
Communications Processors at www.nxp.com.

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6.1.8.3 DDRCLK and DDR data rate frequency options


This table shows the expected frequency options for DDRCLK and DDR data rate frequencies.
Table 55. DDRCLK and DDR data rate frequency options
DDR data rate: DDRCLK Ratio DDRCLK (MHz)
64.00 66.67 100.00
DDR Data Rate (MT/s)1
10:1 1000
11:1 1100
12:1 1200
13:1 1300
14:1 1400
15:1 1000 1500
16:1 1024 1067 1600
17:1 1088 1133
18:1 1152 1200
19:1 1216 1266
20:1 1280 1333
21:1 1344 1400
22:1 1408 1466
23:1 1472 1533
24:1 1536 1600
Notes:
1. DDR data rate values are shown rounded up to the nearest whole number (decimal place accuracy removed)
2. When using Single Source clocking, only 100 MHz options are available.
3. Minimum Frequency supported by DDR4 is 1300 MT/s. DDR3 supports a minimum of 1000 MT/s.
4. For supported voltage/frequency options, see the orderable part list of QorIQ LS1043A and LS1023A Multicore
Communications Processors at www.nxp.com.

6.1.8.4 SYSCLK and eSDHC high speed modes frequency options


This table shows the frequency multiplier options for SYSCLK when eSDHC operates in High Speed modes (>=52 MHz).
For low frequency options CGA PLL2 is bypassed and eSDHC receives platform clock directly.
Table 56. SYSCLK multiplier/frequency options when eSDHC operates in High Speed mode
(clocked by CGA PLL2 / 1)
Core cluster: SYSCLK Ratio SYSCLK (MHz)
64.00 66.67 100.00
Resultant Frequency (MHz)1
12:1 1200

Table continues on the next page...

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Thermal

Table 56. SYSCLK multiplier/frequency options when eSDHC operates in High Speed mode
(clocked by CGA PLL2 / 1) (continued)
Core cluster: SYSCLK Ratio SYSCLK (MHz)
64.00 66.67 100.00
Resultant Frequency (MHz)1
18:1 1152 1200
Notes:
1. Resultant frequency values are shown rounded up to the nearest whole number (decimal place accuracy removed)
2. For Low speed operation, eSDHC is clocked from Platform PLL and does not use CGA PLL2.

6.1.8.5 Minimum platform frequency requirements for high-speed


interfaces
The platform clock frequency must be considered for proper operation of high-speed interfaces as described below.
For proper PCI Express operation, the platform clock frequency must be greater than or equal to:

527 MHz x (PCI Express link width)

16

Figure 25. Gen 1 PEX minimum platform frequency

527 MHz x (PCI Express link width)

Figure 26. Gen 2 PEX minimum platform frequency


See section "Link Width," in the chip reference manual for PCI Express interface width details. Note that "PCI Express link
width" in the above equation refers to the negotiated link width as the result of PCI Express link training, which may or may
not be the same as the link width POR selection. It refers to the widest port in use, not the combined width of the number
ports in use.

7 Thermal
This section discusses the thermal model and management of the chip.

7.1 Recommended thermal model


Information about Flotherm models of the package or thermal data not available in this document can be obtained from your
local NXP sales office.

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Thermal

7.2 Thermal system-level recommendations


Proper thermal control design is primarily dependent on the system-level design — the heat sink, airflow, and thermal
interface material.
Table 57. Thermal system-level checklist
Item Completed
Use the recommended thermal model. Information about Flotherm models of the package or thermal data
not available in this document can be obtained from your local NXP sales office.
Use this recommended board attachment method to the heat sink:1
The processor heat sink must be connected to GND at one point for EMC performance.
GND here specifies processor ground.
FC-PBGA package (no lid)
Heat sink

Heat sink clip

Adhesive or
thermal interface material

Die

Printed circuit-board

Figure 27. Cross-secitonal view of FC PBGA with no lid


Ensure the heat sink is attached to the printed-circuit board with the spring force centered over the
package.2
Ensure the spring force does not exceed 15 pounds force (65 Newtons).
A thermal interface material is required at the package-to-heat sink interface to minimize the thermal
contact resistance.3
Ensure the method of mounting heat sinks on the package is by means of a spring clip attachment to the
printed-circuit board.
A thermal simulation is required to determine the performance in the application.4
Notes:
1. The system board designer can choose among several types of commercially available heat sinks to determine the
appropriate one to place on the device. Ultimately, the final selection of an appropriate heat sink depends on factors such as
thermal performance at a given air velocity, spatial volume, mass, attachment method, assembly, and cost.
2. The performance of the thermal interface materials improves with increased contact pressure; the thermal interface vendor
generally provides a performance characteristic to guide improved performance.
3. The system board designer can choose among several types of commercially available thermal interface materials.

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NXP Semiconductors 63
Thermal

Table 57. Thermal system-level checklist


Item Completed
4. A Flotherm model of the part is available.

7.3 Internal package conduction resistance


For the package, the intrinsic internal conduction thermal resistance paths are as follows:
• The die junction-to-case thermal resistance
• The die junction-to-board thermal resistance

This figure shows the primary heat transfer path for a package with an attached heat sink mounted to a printed-circuit board.

External resistance Radiation Convection

Heat sink

Thermal interface material

Die/Package

Internal resistance Die junction

Package/Solder balls

Printed-circuit board

External resistance Radiation Convection

(Note the internal versus external package resistance)

Figure 28. Package with heat sink mounted to a printed-circuit board


The heat sink removes most of the heat from the device. Heat generated on the active side of the chip is conducted through
the silicon and through the heat sink attach material (or thermal interface material), and finally to the heat sink. The junction-
to-case thermal resistance is low enough that the heat sink attach material and heat sink thermal resistance are the dominant
terms.

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64 NXP Semiconductors
Revision history

8 Revision history
This table summarizes changes to this document.
Table 58. Revision history
Revision Date Change
5 05/2020 • Added general description for unused pins of different interfaces in Interface recommendations
• In Ethernet controller pin termination recommendations
• Updated description for unused pins
• Added "The unused clock pin should be pulled to GND." in note 1
• Added note 3 regarding the IFC_A26 and IFC_A27 pin termination in QSPI pin termination
recommendations
4 11/2019 • Added "QorIQ" in the main heading
• Changed "ARM" as "Arm"
• Updated Core Reference Manual information in Recommended resources
• Removed Signal type column, updated format and added note for USB power supplies in
Power pin recommendations
• In Core and platform supply voltage filtering, updated "as defined per datasheet" to "based on
maximum power in the datasheet" of Power system-level recommendations
• Updated sentence to "USB_SVDD and USB_SDVDD must be provided by the VDD power
supply." in Power system-level recommendations
• In Power-on reset recommendations
• Replaced "PLL configuration inputs must meet a 100 µs set-up time to HRESET_B" with
"other than cfg_eng_use0"
• Added "1ms after VDD ramps up during PORESET_B assertion"
• Corrected "configuration signals to the chip when HRESET_B is asserted" to
"configuration signals to the chip when PORESET_B is asserted"
• In Configuration signals sampled at reset
• Updated information regarding LS1043A datasheet
• Provided JTAG configuration files path
• Removed "It is recommened to keep provision for optional pull-down resistor on board."
from cfg_eng_use2
• In Hard-Coded RCW
• Added 0x9F hard-coded RCW option
• Updated note regarding DDR CLK reference clock when 0x9A, 0x9E or 0x9F hard-coded
RCW option is selected
• Added note for referring AN12081
• Corrected typo "HRESET_REQ_B" to "RESET_REQ_B"
• In DDR4 and DDR3L SDRAM interface pin termination recommendations
• Updated description for not used D1_MCK pins
• Added description for MALERT_B pin when discrete DRAM is used
• Removed RDIMM information as DDR3L and DDR4 RDIMMs are not supported
• Changed name from D1_MAPAR to D1_MAPAR_OUT
• Changed IO type of D1_MVREF from I to IO
• Added note for case when discrete DDR4 DRAM is used with two chip selects
• In DDR system-level recommendations
• Added CKE termination requirement during self refresh
• Updated note 2 as "DDR3L and DDR4 RDIMMs are not supported."
• In IFC pin termination recommendations
• Changed IO type of IFC_PERR_B from O to I
• Updated description for not used IFC_PERR_B pins
• Changed IFC_RB[0:1]_B to IFC_RB[0:3]_B
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NXP Semiconductors 65
Revision history

Table 58. Revision history


Revision Date Change
• Updated description for not used UART[1:4]_SIN pins in DUART pin termination
recommendations
• In LPUART pin termination recommendations
• Removed *_BASE RCW fields for determining functionality of LPUART signals
• Updated description for not used LPUART pins
• In I2C pin termination recommendations
• Updated description for not used IIC pins except IIC1_SDA and IIC1_SCL
• Corrected typo in description of used IIC3/4* pins
• In eSDHC pin termination recommendations
• Added RCW[SDHC_EXT] field for determining functionality of SDHC_CMD, SDHC_CLK
and SDHC_DATA[0:3] pins
• Added RCW[SPI_EXT] field for determining functionality of SDHC_DATA[4:7] pins
• Removed RCW[SPI_BASE] field for determining functionality of SDHC_VS and
SDHC_CLK_SYNC_IN/OUT pins
• Added note 6 for reset of SD card when working on UHS-I speed mode
• Added note 7 for availability of SDHC signals when booting from QSPI
• Removed output power line from Dual voltage regulator to SD card in Figure 14
• Removed note "Voltage translator requirment depends upon the chosen eMMC voltage and
OVDD/EVDD voltage configuration" from Table 17
• In GIC pin termination recommendations
• Updated description for not used IRQ pins
• Removed IRQ_OUT_B signal
• Added note for polarity of IRQ signals
• Corrected typo "resistance" to "resistor" in Trust pin termination recommendations
• Updated description for ASLEEP pin in Power Management pin termination recommendations
• In Debug and reserved pin termination recommendations
• Added debug analog signals
• Updated description for EVT pins
• Updated description for JTAG_BSR_VSEL and TBSCAN_EN_B
• Removed section "Analog Signals pin termination recommendations"
• In SerDes pin termination recommendations
• Removed "PLL1 can support 100, 125 and 156.25 MHz, whereas PLL2 can only support
100 and 125 MHz. Therefore, XFI and 2.5 G SGMII 5 which require 156.25 MHz can only
be supported by PLL1."
• Removed "PLL2 supports only 100 and 125 MHz frequency therefore the support is
limited to PCIe, SGMII and QSGMII."
• Removed note "2.5 G SGMII requires 125 or 156.25 MHz to operate."
• Added note for SerDes lanes termination
• Updated description of SCFG_USBPWRFAULT_SELCR for USB_PWRFAULT pins in USB
PHY pin termination recommendations
• Added notes regarding pull-up resistor when MDC and MDIO are configured as open-drain
mode in Ethernet Management Interface 1/2 pin termination recommendations
• In Ethernet controller pin termination recommendations
• Added note "Either of the EC1_GTX_CLK125 or EC2_GTX_CLK125 can be used to
clock both the EC interfaces in RGMII mode. The selection is through
SCFG_ECGTXCMCR[CLKSEL]."
• Updated description for not used EC1_GTX_CLK and EC2_GTX_CLK pins
• In QSPI pin termination recommendations
• Added note "QSPI signals are multiplexed with IFC signals and only select lines are
available on IFC when QSPI is used."
• Added note on chip select "To avoid glitches or noise on chip select, it is recommended
to use series resistor of 22Ω to 68Ω along with a 20pf capacitor to GND. The capacitor
should be placed close to the receiver."
• Added note for SPI_CLK availability in SPI pin termination recommendations
Table continues on the next page...

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66 NXP Semiconductors
Revision history

Table 58. Revision history (continued)


Revision Date Change
• Updated IO type of GPIO1_13 from IO to O in General Purpose Input/Output pin termination
recommendations
• Added note regarding clock selection of EC interface in Clock pin termination recommendations
• Updated value from "reserved" to "don't care" for IFC_WP_B[0] in Single Oscillator Source
clock select
3 03/2017 In Table 42, updated RTC "Note used" column for WDOG functionality.
2 01/2017 • Updated PROG_MTR, FA_VL and SENSEVDD, SENSEGND description Power pin
recommendations
• Updated Core and platform supply voltage filtering in Power system-level recommendations
• Added SVR for silicon rev 1.1 in Product revisions
• Updated description for SDHC_WP in eSDHC pin termination recommendations
• Updated JTAG_BSR_VSEL and TBSCAN_EN_B description in Debug and reserved pin
termination recommendations
1 06/2016 • Added footnote in DDR4 and DDR3L SDRAM interface pin termination recommendations
• Updated comments for CKSTP_OUT_B in Debug and reserved pin termination
recommendations
• Updated comments for TA_BB_RTC, TA_BB_TMP_DETECT_B and TA_TMP_DETECT_B in
Trust pin termination recommendations
• Replaced Freescale instances with NXP in Before you begin, Table 1, Table 44, and
Recommended thermal model sections
• In the section Recommended resources, added more document references and updated the
name, ID, and location for the existing documents
• Corrected product revision for LS1023A and added references for 23x23 package in Product
revisions
• Added description of PROG_MTR, FA_VL, TA_BB_VDD, updated USB supplies state (when
unused) and updated SENSEVDD, SENSEGND description (when used) in Power pin
recommendations
• PoR sequence referred to Design checklist to avoid duplication Power-on reset
recommendations
• Removed even ration limitation from SYS_PLL_RAT from Hardcoded RCW in Configuration
signals sampled at reset
• Added DDR4 reference D1_MALERT_B with DDR3 reference D1_MAPAR_ERR_B in DDR
controller pin termination recommendations
• Updated connectivity diagram in figure 6 in DDR50 mode and updated SDHC_DAT[0:3]
cooments in eSDHC system-level recommendations
• Updated mux selection for UC1 and UC3 in QUICC Engine pin termination recommendations
• Removed QSPI-DQS references in QSPI pin termination recommendations
• Corrected typo in Clock pin termination recommendations
• Updated description for GPIO_2[13:15] and GPIO_2[25:27] General Purpose Input/Output pin
termination recommendations
• Updated single oscillator clock sourcing diagram in Single Oscillator Source clock select
• Removed figures using external translator in DS and HS modes, SDR12, 25, 104 and DDR50
modes, DDR mode in eSDHC system-level recommendations
• Corrected typos in Global Interrupt Controller (GIC) recommendations
• Updated text in SerDes pin termination recommendations
• Added reference for 23x23 package in SPI pin termination recommendations
• Updated power-up sequence time in Power system-level recommendations
• Updated foot note for selecting DIFF_SYSCLK as DDRCLK Clock pin termination
recommendations
• Added note related to MDC/MDIO loading at 10 MHz in Ethernet Management Interface 1/2 pin
termination recommendations
• Updated max current slew rate in Power system-level recommendations
• Added SerDes block level power supply decoupling recommendations in SerDes block power
supply decoupling recommendations
Table continues on the next page...

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NXP Semiconductors 67
Revision history

Table 58. Revision history (continued)


Revision Date Change
• Updated power system level recommendations in Power system-level recommendations
• Added note for hard-coded RCW in Configuration signals sampled at reset
• Distributed "Configureation singals sampled at rest" and "Hard Coded RCW" into two different
sub-headings
• Added EC1/2_TX_EN pull-down recommendations in Ethernet controller pin termination
recommendations
• Removed duplication of information related to D1_MVREF from Analog Signals pin termination
recommendations
• Moved analog pin information from Debug and reserved pin termination recommendations to
Analog Signals pin termination recommendations
• Updated note 1 in System control pin termination recommendations
0 03/2016 Initial release

QorIQ LS1043A Design Checklist , Rev. 5, 05/2020


68 NXP Semiconductors
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Document Number AN5012


Revision 5, 05/2020

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