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Characterization 1

This document discusses tools used to characterize nanomaterials. It describes several microscopy techniques including X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), scanning tunneling microscope (STM), field ion microscope (FIM), and nanoindentation. XRD uses X-rays to determine crystal structure by measuring diffraction patterns. SEM and TEM provide information on particle size, shape, and defects through electron microscopy and diffraction. AFM and STM enable high-resolution surface imaging at the atomic level. These tools play a central role in characterizing nanostructured materials and structures.

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70 views6 pages

Characterization 1

This document discusses tools used to characterize nanomaterials. It describes several microscopy techniques including X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), scanning tunneling microscope (STM), field ion microscope (FIM), and nanoindentation. XRD uses X-rays to determine crystal structure by measuring diffraction patterns. SEM and TEM provide information on particle size, shape, and defects through electron microscopy and diffraction. AFM and STM enable high-resolution surface imaging at the atomic level. These tools play a central role in characterizing nanostructured materials and structures.

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sultan ali
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Nano-Materials technology

Part 4
Tools to Characterize Nanomaterials/1
Dr. Ghadeer Al-Malkawi

1
Tools to Characterize Nanomaterials
• The characterization of small structures or small-sized materials in the
nanometric-scale usually calls for sophisticated characterization tools.

• For example, X-ray diffraction (XRD) has been widely used for the
determination of crystalline character, crystallite size, crystal structures
and lattice constants of nanoparticles, nanowires and thin films.

• Scanning electron microscopy (SEM) and transmission electron


microscopy (TEM), together with electron diffraction, have been
commonly used in the characterization of nanoparticles to get an idea
of the size, shape and defects present in these materials.

• Scanning probe microscopy (SPM) is a relatively new characterization


technique and has found widespread application in nanotechnology.

2
Tools to Characterize Nanomaterials
• Although both STM and AFM are true surface imaging techniques that
can produce topographic images of a surface with atomic resolution in all
three dimensions, STM and AFM have found a much broader range of
applications, such as nanoindentation, nano-lithography and patterned
self-assembly.

• Almost all solid surfaces, whether hard or soft, electrically conductive or


not, can be studied with STM/AFM.

• Characterization and manipulation of individual nanostructures require


not only extreme sensitivity and accuracy, but also atomic-level
resolution.

• It therefore leads to various microscopy techniques that will play a central


role in the characterization and measurement of nanostructured
materials and nanostructures.

3
Tools to be covered
1. X-ray Diffraction (XRD)
2. Scanning Electron Microscopy (SEM)
3. Transmission Electron Microscopy (TEM)
4. Atomic Force Microscopy (AFM)
5. Scanning Tunneling Microscope (STM)
6. Field Ion Microscope (FIM)
7. Nanoindentation

4
1- X-ray Diffraction (XRD)
• XRD is extensively used to study the crystal structure of
solids, defects and stresses.

• In XRD, a beam of X-rays, with wavelength ranging from


0.07 to 0.2 nm, is diffracted by the crystalline specimen.

• The diffraction pattern can be used to identify the


crystalline phases and their structural characteristics.

• XRD is non-destructive and does not require detailed


sample preparation.

5
X-Rays to Determine Crystal Structure
• Incoming X-rays diffract from crystal planes.

reflections must
be in phase for
a detectable signal
extra l Adapted from Fig. 3.20,
q q
distance
Callister & Rethwisch 8e.
travelled
by wave “2” spacing
d between
planes
Measurement of critical
angle, qc, allows X-ray
nl
computation of planar intensity d=
(from 2 sin qc
spacing, d.
detector)
q
qc
6

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