Testing With the State

Sequencer Test Module

Practical Example of Use

 Testing With the State Sequencer Test Module

Manual Version: Expl_SEQ.ENU.2 - Year 2011

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2
 Preface
This paper describes how to test the trip times of two elements of directional or non-directional overcurrent
protection relays with IDMT or DTOC trip time characteristics. It contains an application example which will
be used throughout the paper.

The theoretical background for testing the trip times with the State Sequencer will be explained. This paper
also covers the definition of the necessary Test Object settings as well as the Hardware Configuration for
testing the trip times of directional or non-directional overcurrent relays.

Finally the State Sequencer is used to perform the tests which are needed for testing the trip time
characteristic of directional or non-directional overcurrent protection relays.

Supplements: Sample Control Center file Example_StateSequencer_Overcurrent.occ (referred to in this

document).
Requirements: Test Universe 2.40 or later; State Sequencer and Control Center licenses.

Note: The pick-up test is not explained in this file.

© OMICRON 2011 Page 3 of 20

1 Application Example
10.5 kV

Protection functions

1st element (67) / directional characteristic forward (IDMT)

2nd element (50/51) /

200/1 non-directional characteristic (DTOC)

Overcurrent Relay

Figure 1: Feeder connection diagram of the application example

Parameter Name Parameter Value Notes

Frequency 50 Hz
VT (primary/secondary) 10500 V / 110 V
CT (primary/secondary) 200 A /1 A
IEC Very Inverse Tripping characteristic
Directional Fwd Directional characteristic Forward
300 A Pick-up 1.5 x In CT primary
1st element
Time multiplier setting (TD; TMS; P, etc.) (only
1.2
for IDMT characteristics)
Relay characteristic angle (only for directional
45°
protection function)

DTOC Tripping characteristic

2nd element 600 A Pick-up 3 x In CT primary
100 ms Trip time delay

Table 1: Relay parameters for this example

© OMICRON 2011 Page 4 of 20

2 Theoretical Introduction

2.1 Tripping Characteristics

There are two major overcurrent characteristic types: Inverse time and definite time.

Tripping Characteristics

Inverse-Definite Minimum Time

Definite Time Overcurrent Relay
Overcurrent Relay

Trip-time charateristic of a two- Trip-time characteristic of an

element DTOC relay IDMT overcurrent relay

t/s t/s

t(1st el.)

t(2nd el.) t(2nd el.)

1stelement 2ndelement I/I 1stelement 2ndelement I/IP

P
50-1/51 or 50N-1/51N 50-2 or 50N-2 51 or 51N or 67

Inverse time characteristics can have different basic shapes such as these:

Characteristic Formula Annotation

120
t T
I IP   1 P
LTI (long time inverse) Suitable for motors, for example.

0.14
SI (standard inverse) t  TP
I IP 0.02  1
13.5
t T
I IP   1 P
VI (very inverse)

80
EI (extremely inverse) t  TP Suitable for co-ordination with fuse
I IP   1
2
tripping characteristics.

Table 2: IDMT tripping characteristics (see IEC 60255-3 or BS 142, section 3.5.2)

t = trip time in seconds

TP or TMS = setting value of the time multiplier
I = fault current
IP = setting value of the pick-up current

Note: Some relays have an increased pick-up value for IDMT characteristics. For example, the relay
used in this example has an actual pick-up value that is 1.1 times higher than the IP setting.

© OMICRON 2011 Page 5 of 20

2.2 Define the Test Points for Testing the Trip Time Characteristic
In this example we will use the following time and current tolerances to define the test points (test shots).

Parameter Name Absolute Relative

Delay time ±10 ms ±1%
Pick-up current ±10 mA ±3%
1)
Angle faults ±3°
Pick-up time Approximately 40 ms
1) only necessary for directional overcurrent relays
Table 3: Relay tolerances and technical data (only valid for this example)

Note: The tolerances and the pick-up time depend on the relay type. They can be obtained from the
technical specification in the relay manual.

1000
Very Inverse (element 1)

DTOC (element 2)
Trip time / s

100
-1% +1%

10

0.1

200 300 400 500 600 700 800

Ip 1.1·Ip Fault current /A

= Pick-up current tolerances of element 1 (±3% = 1.07 · IP … 1.13 · IP)

= Pick-up current tolerances of element 2 (±3%)

= Test points

Figure 2: Position of the test points for a test of the IDMT trip time characteristic ‘Very Inverse’ (based on IEC 60255-3)

© OMICRON 2011 Page 6 of 20

 2.5
Trip time / s

DTOC (element 1)

1.5 DTOC (element 2)

-1% +1%

0.5

200 300 400 500 600 700 800

Fault current / A

= Pick-up current tolerances of element 1 (±3%)

= Pick-up current tolerances of element 2 (±3%)

= Test points (±4%)

Figure 3: Position of the test points for the test of a DTOC trip time characteristic

As shown in Figure 2 and Figure 3, the test points can be placed along the tripping characteristic. For a
DTOC element it is recommended that these test points are positioned approximately 1% outside of the
tolerance band. This ensures not only an assessment of the trip times, it also confirms that the pick-up value
of this overcurrent stage is within the specified tolerances.

© OMICRON 2011 Page 7 of 20

2.3 Structure of the State Sequencer
With the State Sequencer a sequence of states (State 1, State 2, State 3, etc.) can be defined which will be
output to the relay one after another. The State Sequencer has several views which are used for the
definition of the state as well as for the assessment of the test.

2.3.1 Table View:

The Table View offers an overview of the states which were defined. Here the output values of each state
can be seen. The names for the states are also defined in this view.

2.3.2 Detail View:

In the Detail View the CMC outputs and the trigger conditions for the selected state can be configured.

1 2 3 4

1. The Analog Out tab defines the values which are generated during the selected state. With the
Set Mode the user can define whether to enter the output voltages and currents directly, or whether to
use calculated values such as symmetrical components, fault values or fault impedances.

Note: The analog values should be set according to realistic fault values. For example, 180° phase shift
of the currents for phase to phase faults.

2. The Binary Out tab defines the binary outputs during the selected state.
3. In the Trigger tab the trigger condition for the selected state can be defined.
4. To start the test on a time synchronized pulse (GPS/IRIG-B) this option has to be selected in the General
tab.

© OMICRON 2011 Page 8 of 20

 Trigger conditions can be specified to control the sequence progression. These events may be defined by:

1. The state duration (Timeout).

2. The test object response (Use binary trigger condition as specified below, e.g., Trip signal).
3. A manual control (User interaction).

Note: A combination of (1) and (2) is possible.

2
1
3

Trigger = valid ? Trigger = valid ?

Start State 3 Start State 4

2.3.3 Measurement View:

The State Sequencer includes the measurement of times between states and triggers (e.g., trip time). These
can be assessed automatically and added to the report.

Note: The definition of these conditions is explained in more detail in the next chapter.

© OMICRON 2011 Page 9 of 20

3 Practical Introduction to Testing with the State Sequencer Test Module
The State Sequencer test module can be found on the Start Page of the OMICRON Test Universe. It can
also be inserted into an OCC File (Control Center document).

3.1 Defining the Test Object

Before testing can begin the settings of the relay to be tested must be defined. In order to do that, the
Test Object has to be opened by double clicking the Test Object in the OCC file or by clicking the
Test Object button in the test module.

© OMICRON 2011 Page 10 of 20

3.1.1 Device Settings
General relay settings (e.g., relay type, relay ID, substation details, CT and VT parameters) are entered in
the RIO function Device.

Note: The parameters V max and I max limit the output of the currents and voltages to prevent
damage to the device under test. These values must be adapted to the respective
Hardware Configuration when connecting the outputs in parallel or when using an amplifier.
The user should consult the manual of the device under test to make sure that its input rating
will not be exceeded.

© OMICRON 2011 Page 11 of 20

3.2 Global Hardware Configuration CMC for Directional Overcurrent Relays
The global Hardware Configuration specifies the general input/output configuration of the CMC test set. It
is valid for all subsequent test modules and, therefore, it has to be defined according to the relay’s
connections. It can be opened by double clicking the Hardware Configuration entry in the OCC file.

3.2.1 Example Output Configuration for Protection Relays with a Secondary Nominal Current of 1 A

VA VC
VB Vn

IA
IB
IC
In

Note: For non-directional overcurrent relays the voltage outputs can be set to <not used>.

© OMICRON 2011 Page 12 of 20

3.2.2 Example Output Configuration for Protection Relays with a Secondary Nominal Current of 5 A

VA VC
VB Vn

IA IC
IB In

Note: Make sure that the rating of the wires is sufficient when connecting the outputs in parallel.

For non-directional overcurrent relays the voltage outputs can be set to <not used>.

The following explanations only apply to protection relays with a secondary nominal current of
1A

© OMICRON 2011 Page 13 of 20

3.2.3 Analog Outputs

The analog outputs, binary inputs and outputs can all be activated individually in the local Hardware
Configuration of the specific test module (see chapter 3.3 ).

3.2.4 Binary Inputs

1
2

1. The start command is optional (it is not necessary but it can be displayed in the Time Signal View of the
State Sequencer for test analysis).
2. The trip command has to be connected to a binary input. BI1 … BI10 can be used.
3. For wet contacts adapt the nominal voltages of the binary inputs to the voltage of the circuit breaker trip
command or select Potential Free for dry contacts.
4. The binary outputs and the analog inputs etc. will not be used for the following tests.
Start
Trip

© OMICRON 2011 Page 14 of 20

3.2.5 Wiring of the Test Set for Directional Overcurrent Relays
Note: The following wiring diagrams are examples only. The wiring of the analog current inputs may
be different if additional protective functions such as sensitive ground fault protection are
provided. In this case IN may be wired separately.

Protection
Relay

VA

VB

VC

(-) (-)

IA

IB

IC

IN

Trip
(+)
optional

Start
(+)

Protection
Relay

VA

VB

VC

(-) (-)

IA

IB

IC

IN

Trip
(+)
optional

Start
(+)

Note: For non-directional overcurrent relays the wiring of the voltage outputs is not necessary.

© OMICRON 2011 Page 15 of 20

3.3 Local Hardware Configuration for Directional Overcurrent Testing
The local Hardware Configuration activates the outputs/inputs of the CMC test set for the selected test
module. Therefore, it has to be defined for each test module separately. It can be opened by clicking the
Hardware Configuration button in the test module.

3.3.1 Analog Outputs

Note: For non-directional overcurrent relays the voltages are already deactivated in the global
Hardware Configuration (see chapter 3.2 ). Therefore, they will not be visible in this tab.

3.3.2 Binary Inputs

Note: The start contact is not needed for the test assessment but it can be used for troubleshooting in
the Time Signal View of the State Sequencer.

© OMICRON 2011 Page 16 of 20

3.4 Defining the Test Configuration
3.4.1 General Approach
For testing the trip time characteristic for directional or non directional overcurrent protection with the
State Sequencer, the following steps are recommended:

Calculation of the Test Values and Trip Times:

As the trip time of element 1 depends on the test current, this stage has to be tested with more than one test
point. On the other hand, the trip time of element 2 is independent of the test current. Therefore, it is
sufficient to test this stage with only one test point. It is also recommended that two test shots are placed
approximately 1% outside of the tolerance band of element 2. This not only provides one test point for
element 1 and the only test point for element 2, it also confirms the position of the pick-up value of
element 2. The position of the test shots is shown in Figure 2. For these shots the test values, the nominal
trip times and the tolerances (including the pick-up time) must also be calculated.

Position Test Current Nominal Trip Time Tolerances

IP(Element 1) · 1.2 1.80 A 81.0 s 810 ms +40 ms = 850 ms
IP(Element 1) · 1.5 2.25 A 32.4 s 324 ms + 40 ms = 364 ms
IP(Element 2) · 0.96 2.88 A 17.61 s 176 ms + 40 ms = 216 ms
IP(Element 2) · 1.04 3.12 A 100 ms 10 ms + 40 ms = 50 ms

Table 4: Calculation of the test points and tolerances

Settings in the Table View / Detail View:

The test points calculated above have to be defined in the State Sequencer but between these test points
the relay has to be reset. This is done by the "Healthy 2 ... 4" states. In addition a pre-fault ("Healthy 1") and
a post-fault state ("No Fault") are defined. These states ensure that the relay is initialized before the first test
point and that the binary signals are recorded after the trip of the last test point.

State Test Current Time Limitation Binary Trigger

Healthy 1 I = 0.5 · In = 500 mA 5s None
I = 1.2 · IP(Element 1) I = 1.80 A 100 s Trip
Healthy 2 I = 0.5 · In = 500 mA 5s None
I = 1.5 · IP(Element 1) I = 2.25 A 100 s Trip
Healthy 3 I = 0.5 · In = 500 mA 5s None
I = 0.96 · IP(Element 2) I = 2.88 A 100 s Trip
Healthy 2 I = 0.5 · In = 500 mA 5s None
I = 1.04 · IP(Element 2) I = 3.12 A 100 s Trip
No Fault 0A 5s None

Table 5: State definitions for the trip times test

Note: For directional overcurrent relays all three voltages have to be set to nominal voltage (with the
exception of the last state).

© OMICRON 2011 Page 17 of 20

 The definition of these states in the Table View is shown below.

Note: The angles of the currents have to be adapted to the fault type. For example, a phase to phase
fault has 180° between each fault current. For directional overcurrent relays the angles also
have to be adjusted to the directional characteristic.

For the trigger conditions in the Detail View two different settings have to be made.

For all "Healthy" states and "No Fault" For all fault states

Note: The Timeout of the fault states has to be longer than the trip time for the tested currents.

© OMICRON 2011 Page 18 of 20

 Settings in the Measurement View:

The assessment of the test is defined in the Measurement View. In this example the trip time of all four test
points is measured and assessed.

1 2 3 4 5

1. A Name can be set for each measurement.

2. Ignore before ensures that the test is not influenced by binary signals which occurred before the relevant
test point.
3. Here the conditions for the Start and the Stop of the measurement can be defined. These conditions can
be either states or binary signals.

Note: If states are used here then the measurement is always triggered at the beginning of these states.

4. The nominal trip times as well as the tolerances have to be entered here.
5. The actual trip time as well as the deviation to the nominal trip time will be displayed after the test. If the
deviation is within the tolerances, the measurement will be assessed as passed otherwise it will be
assessed as failed.

Feedback regarding this application is welcome by email at [email protected].

© OMICRON 2011 Page 19 of 20

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© OMICRON 2011 Page 20 of 20