Feritscope FMP30: Operators Manual
Feritscope FMP30: Operators Manual
FERITSCOPE® FMP30
FERITSCOPE® FMP30
Operators Manual
© 2008 Copyright by
Helmut Fischer GmbH
Institut für Elektronik und Messtechnik, Sindelfingen (Germany).
All rights reserved. No part of this manual may be reproduced by any
means (print, photocopy, microfilm, or any other method) or processed,
multiplied or distributed by electronic means without the written consent
of Helmut Fischer GmbH Institut für Elektronik und Messtechnik.
1 Important Information . . . . . . . . . . . . . . . . . . . . . . . . . . 9
1.1 Trademarks and Liabilities . . . . . . . . . . . . . . . . . . . . . . . 9
1.2 Symbols and Conventions Used in the Manual . . . . . . . 9
1.3 Intended Use . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
1.4 General Information . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
1.5 Requirements on the Operating Personnel . . . . . . . . . 10
1.6 Power Connection . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
1.7 Environmental Conditions . . . . . . . . . . . . . . . . . . . . . . 11
1.8 Probe Handling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
1.9 Handling, Storage and Transport of the Base and
the Calibration Standards . . . . . . . . . . . . . . . . . . . . . . 13
1.10 Instrument Repairs . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
1.11 Warranty . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
4 Probe Handling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
4.1 Handling During Measurements . . . . . . . . . . . . . . . . . 42
4.2 Assigning a New Probe . . . . . . . . . . . . . . . . . . . . . . 43
5 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
5.1 Setting Up an Application . . . . . . . . . . . . . . . . . . . . . . 45
5.2 Selecting the Desired Application . . . . . . . . . . . . . . . 48
5.3 Deleting an Application . . . . . . . . . . . . . . . . . . . . . . . . 49
5.4 List of Set Up Applications . . . . . . . . . . . . . . . . . . . . . 50
5.5 Assigning Application Designations . . . . . . . . . . . . . . 52
5.6 Application Specific Settings . . . . . . . . . . . . . . . . . . . . 52
5.6.1 Tolerance Limits . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
5.6.2 Measurement Display Resolution . . . . . . . . . . . . . . 56
5.6.3 Automatic Block Size and Block Creation . . . . . . . . . 57
5.6.4 Auto-Averaging Mode . . . . . . . . . . . . . . . . . . . . . . . . 58
5.6.5 Outlier rejection . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
5.6.6 Measured Variables . . . . . . . . . . . . . . . . . . . . . . . . . 61
5.7 Linking Applications . . . . . . . . . . . . . . . . . . . . . . . . . . 63
5.7.1 Application Linking Procedure . . . . . . . . . . . . . . . . . . 63
5.7.2 Enabling and Disabling the Linking Mode . . . . . . . . . 64
5.7.3 Example for Linked Applications . . . . . . . . . . . . . . . . 64
7 Measuring . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86
7.1 Preparing for a Measurement . . . . . . . . . . . . . . . . . . 86
7.2 Parameters That Influence the Ferrite Content
Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 87
7.3 Making a Measurement . . . . . . . . . . . . . . . . . . . . . . . 87
7.3.1 Measurement Acquisition . . . . . . . . . . . . . . . . . . . . 89
7.3.2 Measurements With External Start Enabled . . . . . . . 90
7.3.3 Automatic Measurement Acquisition . . . . . . . . . . . . 90
7.3.4 Audible Signals After the Measurement Acquisition 93
7.3.5 Measurements With Tolerance Limits Enabled . . . . 94
7.3.6 Measurements With a Fixed Block Size . . . . . . . . . . 94
7.3.7 Measurements in Auto-Averaging Mode . . . . . . . . . 96
7.3.8 Measurements With Outlier Rejection Enabled . . . . 97
7.4 Documenting the Measurement with a Printer . . . . . . . 98
7.5 Erroneous Readings . . . . . . . . . . . . . . . . . . . . . . . . . 101
7.5.1 Deleting Erroneous Readings . . . . . . . . . . . . . . . . 101
7.5.2 Deleting All Readings of a Block That Has
Not Been Closed . . . . . . . . . . . . . . . . . . . . . . . . . . 101
7.5.3 Deleting All Readings of an Application . . . . . . . . . 101
7.5.4 Overwriting Individual Erroneous Measurements
at a Later Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . 102
7.6 Measurements in the Free-Running Display Mode . 104
8 Evaluation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 124
8.1 Evaluation of the Current Block “Block Result” . . . . 125
8.1.1 Documenting the Block Result With a Printer . . . . . 128
8.1.2 Printout of the List of Single Readings . . . . . . . . . . . 129
8.1.3 Computed parameters - Block result . . . . . . . . . . . . 130
8.2 Evaluation of the Open Application “Final Result” . . 131
8.2.1 Documenting the Final Result with a Printer . . . . . 133
8.2.2 Computed Parameters - Final Result . . . . . . . . . . . 135
8.2.3 Histogram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 136
12 Glossary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 205
12.1 Terms and Formula Symbols . . . . . . . . . . . . . . . . . . . 205
12.2 Additional Literature . . . . . . . . . . . . . . . . . . . . . . . . . . 230
12.2.1 Statistics and ferrite content measurement . . . . . . . 230
12.2.2 Standards . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 231
13 Index . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 233
Important Information
1.1 Trademarks and Liabilities
FERITSCOPE® is a registered trademark of the Helmut Fischer GmbH Institute
for Electronics and Metrology.
The fact that the trademark characters ® and ™ may be missing
does not indicate that a name is a free trademark.
Great care has been exercised in creating this operator's manual. The Helmut Fis-
cher GmbH Institute for Electronics and Metrology assumes no liability for po-
tentially remaining erroneous or incomplete statements and their results. We
would, however, appreciate if you can make us aware of potentially existing er-
rors or incomplete information.
z Listing.
ENTER Writing convention for instrument keys and command buttons on the
display.
The values shown for the measured ferrite contents and the texts of the
information lines of the LCD display serve as examples for possible dis-
plays. It is entirely possible that different values appear on the LCD dis-
play or in the printout without having made any mistakes.
Important Information
To avoid damage to the instrument or wrong measurement
results due to a wrong line voltage, the instruments must be
connected to a power outlet only via the AC adapter pro-
vided by Helmut Fischer GmbH Institute for Electronics and
Metrology. The line voltage must agree with the line voltage
rating stated on the nameplate of the AC adapter.
Low Voltage
The instrument adheres to the Low Voltage Directive 2006/95/EC.
Probe-
connector ca-
ble
R t 50 mm !
During the measurement, the magnetic poles of the probes are placed directly
onto the specimen. Observe the following to keep wear of the magnetic poles dur-
ing the contacting measurement to a minimum:
1.11 Warranty
The Helmut Fischer GmbH Institute for Electronics and Metrology will assume
no warranties in the following instances:
z Use of instrument or accessories for purposes other than the intended use.
10 Battery compartment,
9
Page 31
10
The LCD display consists of several display elements. When powering up the in-
strument using ON/OFF ( Page 36), all display elements will appear briefly at
the same time.
Fig. 2-2 Display elements of the LCD display after power up (example)
Bell:
Tolerance limits are enabled ( beginning on Page 94).
Padlock:
Restricted operating mode is enabled, i.e., the keys
MENU, ZERO and CAL are not active, the service func-
tions cannot be retrieved, applications cannot be deleted
( beginning on Page 171).
Arrow circle:
“Free-running display” is enabled, measurements are
displayed continuously when the probe is placed on the
specimen
( beginning on Page 104).
Alternatively:
Area measurement display
Automatic measurement display
Arrow up:
Upper specification limit is exceeded.
Arrow down:
Measurement below lower specification limit.
Battery:
The battery must be replaced or the rechargeable bat-
tery must be charged because the voltage dropped be-
low a minimum value ( beginning on Page 30).
Hourglass:
Measurements are currently not possible because an in-
strument-internal routine is running.
Information lines:
...SCOPE ... Instrument type:
FKA... Instrument-internal software version
Key Function
Key Function
.. and then :
Ends the display of the block result (return to the measurement
screen) without closing the open measurement block (the cur-
rent measurement series can be continued).
.. and then :
Displays the block result of the previous or following measure-
ment block of the open Application.
All block results of the open Application can be retrieved in
succession through repeated pressing of .
.. and then PRINT:
Prints the displayed block result.
.. and then MENU:
Displays the single readings of the evaluated measurement
data block (then all single readings can be displayed by press-
ing or ). Pressing MENU again ends the single reading
display.
.. and then DEL:
Deletes the readings of the last measurement data block that
has not been concluded and ends the display of the block re-
sult (return to the measurement screen).
.. and then ENTER:
Ends the display of the block results (return to the measure-
ment screen) and closes the current block. The next measure-
ment opens a new block.
ON/OFF Turns the instrument on and off ( beginning on Page 36)
ZERO Retrieves the normalization ( beginning on Page 68)
CAL Retrieves the corrective calibration ( beginning on
Page 71)
.. and then CAL:
Cancels the corrective calibration.
.. and then DEL:
Deletes the corrective calibration of the open Application.
Key Function
z Tolerance Limits
z Resolution
z Block size
z i individual values
z Outlier
5 x ENTER:
Calls the service functions
The instrument settings in the Service Functions menu are
password-protected. “157” will be displayed after pressing EN-
TER 5 times. Press 2 times to increase this value to the fac-
tory-default password “159” and confirm the entry with
ENTER.
A so-called base is used for the normalization; for the corrective calibration, one,
two or three calibration standards (ferrite standards) are used in addition to the
base.
Different calibration standard sets (corrective sets) are available for the correc-
tive calibration of the instrument for the different measurement ranges. The cal-
ibration standard sets include:
z Base
z 3 calibration standards with ferrite contents according to the desired mea-
surement range
A probe-specific calibration standard set for the master calibration (can be or-
dered as an option) and a probe-specific calibration standard set for the corrective
calibration (included with the probe) are available for each probe model and have
been compiled specifically for this probe model.
You can obtain additional calibration standards on request from Helmut Fischer
GmbH Institute for Electronics and Metrology or from your authorized supplier.
Calibration standards
(Ferrite standards)
Base
Ferrite con-
tent informa-
Set number of tion
the calibration
standard set
You can obtain information about available calibration standard sets from the
Helmut Fischer GmbH Institute for Electronics and Metrology or from your au-
thorized supplier.
2.3.3 Printer
For an overview of printers suitable to be connected to the instrument see the
menu Service Functions / PRINT ( Chapter 10.5.1 ‘Printer Selection’, be-
ginning on Page 164).
To connect the instrument to the line voltage via the AC adapter, the AC adapter
must be connected to the instrument and to the line power outlet. The instrument
must be switched off for this purpose!
1. Use ON/OFF ( Page 36) to switch the instrument off (if not yet done).
2. Place the instrument with its back pointing up on the table. Open and
remove the battery compartment cover on the rear of the instrument as
depicted below.
3. If old batteries are in the instrument, remove them from the unit. Other-
wise, install new batteries directly; observe the correct polarity of the bat-
teries
Disposal: Do not dispose of batteries with regular household waste!
Place damaged or used batteries / rechargeable batteries in designated
collection containers! Please observe the guidelines in your region con-
cerning proper handling of waste electrical and electronic equipment and
accessories.
- - -
-
LR6 1.5V
LR6 1.5V
LR6 1.5V
LR6 1.5V
+
+ + +
Fig. 3-2 Inserting the batteries and closing the battery compartment cover
1. Use ON/OFF ( Page 36) to switch the instrument off (if not yet done).
3. Plug the probe plug of the new probe into the probe connector socket of
the instrument.
When inserting the plug, ensure that the key of the plug fits
into the groove of the socket. Otherwise, an erroneous con-
nection between the instrument and the plug may occur or
the contact pins of the probe plug may be damaged.
Connector socket
Instrument
Exception: A flashing symbol for the measurement method on the LCD display
indicates that the instrument does not recognize the connected probe. In such a
case:
z A new Application must be set up for the connected probe
( 5.1 ‘Setting Up an Application’, beginning on Page 45) and/or
z The probe must be assigned to the instrument or to the respective Applica-
tion, respectively ( 4.2 ‘Assigning a New Probe’, beginning on Page 43)
or
z The probe that has been linked to the respective Application thus far must be
reconnected.
.
A new corrective calibration must be performed after the probe has been
assigned ( Page 71)!
Unit Explanation
If [Ferrite] flashes on the display, an Application has not yet been set up
using the connected probe. It is not possible to make measurements
when the display is flashing.
To make measurements, an Application must be set up using the con-
nected probe
( 5.1 ‘Setting Up an Application’, beginning on Page 45).
[%] or [FN]:
Unit of measurement for the displayed
reading (Setting: 10.7.5 ‘Unit’, begin-
ning on Page 184)
Alternatively to the LCD displays presented above, the following displays may
appear after power-up:
The current Application has not yet been set up. To make
ferrite content measurements, an Application must be set
up using the connected probe
( 5.1 ‘Setting Up an Application’, beginning on
Page 45).
z Countrate X
z Fe % / FN and Xs
z Xn and Xs
may appear on the display.
3.4 Cleaning
Wipe off dirt immediately to avoid it from drying onto the surface!
z Always hold the probe at its grip sleeve (right fig- Grip sleeve
ure).
Specimen
z Always place the probe gently and at a right angle
on the specimen surface.
z Slide the grip sleeve to the specimen surface such
that the sleeve rests on the specimen (center and bot-
tom Figure, right).
z With the default setting, a beep will signal the mea-
surement capture.
z Lift the probe off the specimen before making the
next measurement.
Probe Handling
The instrument recognizes if the probe connected to the unit is different than the
one expected according to the probe identification in the current Application.
Reason: Each individual probe has a name that is comprised of the identification
number and the model designation (e.g., FGAB 1.3F). The probe must be “regis-
tered” in the instrument under this name.
z If a user has more than one probe of the same probe model, a problem occurs
if a not yet assigned probe is connected to the instrument. In such a case, it is
advisable to identify the probes and/or instruments with numbers.
If the measurements of an opened Application have not been made with the con-
nected probe, [Ferrite] will flash on the display.
Applications
All relevant settings and parameters for a measuring application as well as the
captured measurement data are stored in a file - we refer to this file as an Appli-
cation.
The instrument has the capability of setting up up to 100 different Applications.
A maximum of 20,000 readings can be stored in these Applications. The mea-
surements can be combined in up to 4,000 blocks.
Due to the magnetic induction measuring method, which captures
all ferromagnetic components in the same manner, the measure-
ments are always stated in ferrite. No distinction is made between
the different material components, such as ferrite and martensite.
Once the linking mode is enabled (indicated by: on the LCD display),
an automatic check will be carried out to see, whether one or more Applications
have already been set up with the connected probe. If this is the case, no normal-
ization is required when setting up the Application. Instead, the normalization
and corrective calibration of the Application(s) that has/have been set up with this
probe will be used.
Procedure
The following options exist if an Application has not yet been set up using the
connected probe:
z Setting up a new Application using the connected probe ( 5.1 ‘Setting Up
an Application’, beginning on Page 45),
z Overwriting an existing Application using the connected probe
( 5.3 ‘Deleting an Application’, beginning on Page 49),
z Connecting a probe that has already been used to set up an Application
( 3.2 ‘Connecting Probes’, beginning on Page 33).
Having the tolerance limits enabled allows for a simple and quick determination
if the measured ferrite contents are within specified limits
( 7.3.5 ‘Measurements With Tolerance Limits Enabled’, beginning on
Page 94).
If the upper and lower specification limits are mixed up when entering the set-
tings, the instrument will automatically select the lower values as the lower spec-
ification limit and the higher value as the upper specification limit.
The measurement display resolution specifies the resolution for displaying the
readings on the LCD display.
Resolution 0.0 ...0.999 1.0 ...9.99 10 ...99.99 100 ...999.9 1000 ...9999
Applications
“Automatic block creation” must be enabled and a block size must be defined for
a certain number of readings to be combined in a block automatically during the
measurement. The block size must be between 2 and 99 ( 7.3.6 ‘Measurements
With a Fixed Block Size’, beginning on Page 94).
Automatic block creation is not available in the matrix measuring
mode.
The block size can be modified even if automatic block creation has already been
enabled. However, the prompt for deleting previously made measurements will
appear again because the subsequent statistical evaluation does not permit blocks
containing different numbers of readings.
If the “i” value is modified during a test series, the prompt to delete
all readings obtained before will appear here as well - for statistical
reasons. If this is not carried out, it will not be possible to modify the
“i” value.
With outlier rejection enabled, recognized outliers will be indicated on the LCD
display and announced through an audible signal ( 7.3.8 ‘Measurements With
Outlier Rejection Enabled’, beginning on Page 97).
The following methods are available for the outlier rejection function:
z Grubbs Test ( Glossary)
z Countrate X
z Fe % / FN and Xs
z Xn and Xs
Explanation of the measured variables: Glossary
The measured variable can be set differently in each Application.
The settings of the measured variables of the other Applications will
not be affected.
With every modification of the measured variable, a prompt for
deleting readings already stored in the open Application will appear
because it is not possible to evaluate different types of measured
variables statistically. This prevents erroneous interpretations of the
measurement results.
Applications
( 10.6.4 ‘Linking Applications’, beginning on Page 177)
If the linking mode is enabled, all applications that have set up using the same
probe (identified by the same serial number) will be linked with each other. Ap-
plications that have been linked to each use the same normalization and/or cor-
rective calibration to determine measurements.
Example:
If a separate Application has been set up for each batch of a component (using
the same probe each time), it is useful to link the Applications to each other in
order to compare the Applications to each other. Because these are the same kind
of components, only from different batches, the same normalization and/or cor-
rective calibration should be used every time.
Applications that have been set up with different probes of the same
probe model (indicated by the same model designation but different
serial numbers) will not be linked.
The linking mode is enabled or disabled from the Service functions of the instru-
ment ( 10.6.4 ‘Linking Applications’, beginning on Page 177).
After disabling the linking mode, all Applications will again be inde-
pendent of each other!
Each Application can again be normalized and.or calibrated sepa-
rately.
4
Fig. 5-2 Explanation to Fig. 5-3
6.2 Normalization
With the normalization, a new zero point is established for the calibration curve
of the open Application and stored in the open Application. The coefficients of
the master characteristic stored in the EEPROM of the probe plug are not affect-
ed.
Required materials
Base from the calibration standard set
Required materials
z Suitable calibration standard set for the corrective calibration (in the desired
measurement range)
For the user master calibration, the master calibration standard set avail-
able from the Helmut Fischer GmbH Institute for Electronics and Metrol-
ogy as an option should be used! Only in this manner can the specified
trueness be ensured during the subsequent measurements.
During the user master calibration, the master characteristic can be determined
only if suitable calibration standards are used. If the master calibration standards
of the Helmut Fischer GmbH Institute for Electronics and Metrology are not
used, the normalized countrates Xn of the master calibration standards used in
their place must be within the specific Xn ranges. The Xn values can be displayed
after the 1st step of the user master calibration (normalization)
( 6.4.4 ‘Displaying Xn Ranges for Calibration Standards for the Master Cali-
bration’, beginning on Page 83).
z The master calibration applies to all Applications that have been set up with
the same probe that has been used for the master calibration (because the
coefficients have been stored in the probe plug of the EEPROM)! This
applies to both an enabled and a disabled linking mode.
z After a master calibration is completed, the normalizations and corrective
calibrations of all Applications that have been set up with the same probe
that has been used for the master calibration will be deleted automatically.
Required materials
z Calibration standard set of the Helmut Fischer GmbH Institute for Electron-
ics and Metrology or
z other suitable certified standards
If you press DEL again after deleting the master calibration in order to
exit the menu, subsequent measurements will be made with the factory
master calibration - without a corrective calibration.
Pressing FINAL-RES:
Determination of the Normalized Countrate
Xn of a Calibration Standard During a Mas-
ter Calibration Page 85.
Pressing BLOCK-RES:
Displaying Xn Ranges for Calibration Stan-
dards for the Master
Calibration Page 83.
Measuring
surement
The following factors influence the readings of a ferrite content measurement:
z Specimen curvature
z Specimen thickness
z Cladding thickness
z the distance of the measurement location from the edge is less than 2 mm.
For very low ferrite contents, in particular the influence of the thickness
should be determined specific to the measurement application.
z To avoid erroneous readings, do not allow the probe to hover above the spec-
imen.
z To obtain a correct air value, the distance to the specimen should be at least
25 mm.
z To allow sufficient time for a measurement accept, the time between individ-
ual measurements must be greater than 0.5 seconds.
Measurement Object
Measurement Object
Measuring
As long as automatic measurement acquisition is enabled, measurement acquisi-
tion occurs automatically immediately after the probe is placed on the specimen.
An audible signal will sound after the measurement acquisition (unless it has
been disabled) ( 7.3.4 ‘Audible Signals After the Measurement Acquisition’,
beginning on Page 93).
With the “free-running display mode on, measurement acquisition can be trig-
gered in the following manner ( 7.6 ‘Measurements in the Free-Running Dis-
play Mode’, beginning on Page 104):
z Pressing the ENTER key
With external start enabled, the measurement acquisition can be triggered manu-
ally in the following ways once the probe is positioned on the measurement loca-
tion:
z Press the key
(not with a normalization or calibration)
z Press the FINAL-RES key
(only during a normalization or calibration)
z Transmitting the “ES” command via the USB port
( 9.4.2 ‘Control Commands’, beginning on Page 142)
Measuring
tribution is to be determined quickly within a reference area. This mean value is
added to a measurement series as a single reading.
With online output of the single readings via the USB port enabled, only this
mean value will be output as well.
The magnetic poles are subject to increased wear when moving the
probe across a surface.
Measuring
An audible signal will sound after the measurement acquisition (unless it has
been disabled). The measurement acquisition signal indicates that a signal arriv-
ing from the probe has been recognized and that the probe can be lifted off the
specimen.
In addition to measurement acquisition signal, the audible signals listed in the
following Table may sound. Where applicable, the signals may sound in succes-
sion.
For example, if at a measurement with a fixed block size the last reading of a
block has exceeded the upper specification limit, the measurement acquisition
signal will sound followed by two short signals for exceeding the upper specifi-
cation limit and one finally a long signal indicating the end of the block.
As an option, the measurement acquisition signal can be disabled
( 10.7.1 ‘Audible Signal’, beginning on Page 178).
The other audible signals cannot be disabled!
Signal Meaning
Having the tolerance limits enabled allows for a simple and quick determination
if the measured ferrite contents are within specified limits ( Page 54).
As long as the tolerance limits are enabled, will appear on the LCD
display.
If the measurement acquisition signal has been disabled, only the signal, or the
signals, for violating the tolerance limits will sound.
With outlier rejection enabled, the audible signals indicating an outlier measure-
ment will sound when an outlier is recognized. In this case, the violation of the
tolerance limit will not be indicated acoustically.
z appears on the LCD display after the last measurement of the block has
been taken, and
Measuring
ment acquisition signal has been disabled, only the signal to indicated the
block closure will sound).
With a connected and powered up printer, it is now possible to print the block re-
sult automatically after the block closure or upon ( 10.5.4 ‘Block Result’, be-
ginning on Page 167).
In the auto-averaging mode and with outlier rejection enabled, the single readings
that are recognized as outliers will not be integrated in the measurement calcula-
tion! For example, if an outlier is recognized at i = 5, only the 4 remaining read-
ings will be used to generate the mean value.
Measuring
When making measurements with outlier rejection enabled:
z the outlier measurements recognized by the instrument will appear on the
LCD display and will be indicated acoustically ( 5.6.5 ‘Outlier rejection’,
beginning on Page 60),
z two long audible signals will sound to indicated the outlier measurement in
addition to the audible signal for the measurement acquisition,
z recognized outliers will not be integrated in the evaluation of the current
block or the current Application.,
z only the signals for indicating the outlier measurements will sound if the
measurement acquisition signal has been disabled,
z outlier measurements recognized in the auto-averaging mode will not be
integrated in the measurement calculation, and
z only the audible signals indicating an outlier measurement will sound when
an outlier is recognized (a violation f the tolerance limits will not be indi-
cated).
Detail of the LCD Explanation
display
If tolerance limits are enabled when making measurements, the readings will be
entered between or next to the tolerance limits on the printout ( Fig. 7-4).
For measurements in auto-averaging mode, only the mean value computed from
the single readings will be printed and stored. The individual readings are not
stored.
Measuring
Block Creation’, beginning on Page 57), the readings and the block results of all
blocks of the open Application will be printed in succession:
Measuring
7.5.1 Deleting Erroneous Readings
If an erroneous reading is recognized directly after measurement acquisition, the
reading can be deleted by pressing DEL.
The deleted reading will then not be included in the generation of the block and
final results.
Repeated pressing of DEL will delete all readings of the open block in succes-
sion.
7.5.2 Deleting All Readings of a Block That Has Not Been Closed
Pressing DEL during an evaluation of an open block will delete all readings that
are stored in the open block that has not been closed ( 8.1 ‘Evaluation of the
Current Block “Block Result”’, beginning on Page 125).
Time
During the evaluation of the current block, individual erroneous measurements
of the current block or of earlier blocks can be overwritten with new readings.
The instrument does not carry out outlier rejection when overwriting
stored measurement data (even if outlier rejection is enabled).
z the date are output continuously via the USB port only if [Free-running
transmit on] has been selected from the Service functions.
Measurements that are outside the measurement range, e.g., when the
probe is lifted off the surface, are also output to the USB port.
Measuring
To enable the free-running display mode: Press the arrow key.
z The “free-running” display mode remains enabled until it is disabled; i.e., it
does not need to be enabled every time the instrument is powered up.
To disable the free-running display mode: Press the arrow key again.
The magnetic poles are subject to increased wear when moving the
probe across a surface.
As long as the tolerance limits have not been enabled, the measurement range
limits of the connected probe will be displayed as the limits for the analog dis-
play. Once the tolerance limits have been enabled, the set tolerance limits will be
displayed as the limits for the analog display. 5.6.1 ‘Tolerance Limits’, begin-
ning on Page 54
With the free-running mode enabled, the tolerance limits cannot be set
through a measurement but only via the arrow keys.
If a reading violates the upper or lower specification limit when making measure-
ments in the “free-running” display mode and the measurement acquisition signal
is enabled, the respective signal for indicating the violation of the tolerance limit
will sound ( 7.3.4 ‘Audible Signals After the Measurement Acquisition’, be-
ginning on Page 93 or 7.3.5 ‘Measurements With Tolerance Limits Enabled’,
beginning on Page 94).
If the measurement acquisition signal is disabled during measurements in the
“free-running” display mode, the audible signal for indicating a violation of the
tolerance limits is automatically disabled as well ( 10.7.1 ‘Audible Signal’, be-
ginning on Page 178).
Measuring
Mode
The preparations required for making the actual measurement are independent of
the selected measuring mode and are described in the Chapters
“ 7.1 ‘Preparing for a Measurement’, beginning on Page 86 and
7.3 ‘Making a Measurement’, beginning on Page 87.
Measuring modes can be changed from the service functions only
( 10.6.3 ‘Matrix Mode’, beginning on Page 174).
The instrument is re-initialized automatically when changing from the
standard to the matrix measuring mode. During a re-initialization, all
Applications and all measurement data stored in them are deleted and
all settings of the service functions are reset to their default settings.
After the re-initialization, i.e., also after changing the measuring mode,
the required Applications will need to be set up anew and the desired
settings need to be established again in the service functions!
Reference area
Block 5
Readings pipe 5
Fig. 7-7 Example for the configuration of the Application in the Standard measuring mode
Measuring
When changing to the matrix measuring mode, the number of Applications and
the number of blocks must be entered. The same number of blocks is set up for
each Application. Each block can receive the same maximum number of read-
ings.
After entering the number of Applications and blocks, the instrument will auto-
matically compute and display the maximum number of readings. For example,
if HMatrix mode on (3/20/318)G appears when the instrument configuration is
displayed, a maximum of 3 Applications each with 20 blocks each with a maxi-
mum number 318 readings can be set up.
The matrix measuring mode is suited for ferrite content measurements when the
measurements are to be made on different specimens of the same type in succes-
sion, always at certain reference areas, and the measurements of corresponding
areas are to be combined into blocks. The matrix measuring mode is used, for ex-
ample, in the chemical industry or in the boiler and steel construction industries.
When selecting a reference area where measurements in an Application
are to be made, it should be observed that the same normalization and
corrective calibration is underlying the determination of the ferrite con-
tent. Thus, only such reference areas should be selected for which no
other normalization or corrective calibration is required.
Automatic block creation is not available in the matrix measuring mode. Corre-
spondingly, it is not possible to set a block size for automatic block creation dur-
ing the application-specific settings using MENU ( 5.6 ‘Application Specific
Settings’, beginning on Page 52).
In the matrix measuring mode, it is possible to change the blocks, i.e., to select
the block where the next reading is to be stored manually or automatically
( 10.6.3 ‘Matrix Mode’, beginning on Page 174).
Measuring
Automatic Block changing must be selected for the next reading to be stored in
the next block automatically. Free block selection is not available with automatic
block changing!
After the audible signal for the measurement acquisition, a long audible signal
will sound to indicate block changing ( 7.3.4 ‘Audible Signals After the Mea-
surement Acquisition’, beginning on Page 93).
A block will be closed automatically when during the measurement in the matrix
measuring mode the maximum number of readings that can be stored in a block
is reached. appears on the LCD display.
In addition, a long acoustical signal indicating the block closures sounds after the
audible signal for the measurement acquisition.
If the measurement acquisition signal has been disabled, only the signal indicat-
ing the block closure will sound.
Details about the audible signals: Page 93.
If additional measurements are made in the matrix measuring mode
while appears on the LCD display, these measurements will not be
stored, printed or taken into account during the evaluation. After the
measurement, the LCD display will briefly show the error message:
“E024 - Block is full”.
To store additional readings, select the block where the readings are to
be stored (i.e., change the blocks manually) or delete the readings.
Measuring
When making measurements in the Matrix mode, a customer-specific designa-
tion that can be comprised of a max. of 16 ASCII characters can be assigned to
every Application and every block ( 5.5 ‘Assigning Application Designa-
tions’, beginning on Page 52).
Assigning the block designation can be carried out in the following manner:
z Use of the optional software MPNAME (the software is available from your
authorized supplier or directly from the Helmut Fischer GmbH Institute for
Electronics and Metrology.)
z Transmitting the command “SBN” via the USB port ( 9.4.2 ‘Control
Commands’, beginning on Page 142)
Once Application or block designations have been assigned, the designations ap-
pear in the information lines of the LCD display, where applicable, alternating
with the respective numbers. On printouts, the Application or block designation
will appear in place of the Application or block number.
z Specimen thickness
z Cladding thickness
z Surface roughness
However, the surface roughness is strongly dependent on the ferrite content
and the influence cannot be stated quantitatively. The influence is relatively
small for ferrite contents of < 10%Fe. It rises with an increasing ferrite con-
tent and can be reduced best by combining a sufficient number of single
readings to one meaningful mean value.
These influences can be corrected by multiplication with the respective correc-
tion factors that can be obtained from the following information.
Example:
A ferrite content of 50 FN is measured at the longitudinal line on the circumfer-
ence of a cylinder with a diameter of 20 mm.
A corrective factor of 1.05 can be obtained from Fig. 7-9.
The actual ferrite content is computed in the following manner:
Few = Fem • correction factor
Few = 50 FN • 1.05 = 52.5 FN
Measuring
With ferrite content measurements on thin specimens (e.g., sheet metal), the mea-
sured ferrite content deviates increasingly from the actual (true) ferrite content as
the thickness of the specimen decreases.
The actual (true) ferrite content can be computed in the following manner:
Few = Fem • correction factor
where:
Few: actual (true) ferrite content
Fem: measured ferrite content
The correction factor, which is dependent on the thickness of the specimen can
be obtained from Fig. 7-11. Fig. 7-11 shows that the influence of the spec-
imen thickness is negligibly small for specimens with a thickness greater than 2
mm.
Example:
A ferrite content of 1.72 FN is measured on a 1 mm cladding. A corrective factor
of 0.6 can be obtained from Fig. 7-12. The actual ferrite content is computed
in the following manner:
Few = Fem • correction factor
Few = 1.72 • 0.6 = 1.03 FN
tion
The reading deviates with a decreasing distance of the measurement location
from the edge increasingly from the actual (true) ferrite content.
The actual ferrite content can be computed in the following manner:
Few = Fem • correction factor
where:
Few: actual (true) ferrite content
Fem: measured ferrite content
The correction factor, which is dependent on the edge distance can be obtained
from Fig. 7-13. Fig. 7-13 shows that the influence of the edge distance is
negligibly small for edge distances greater than 2 mm.
Measuring
A ferrite content of 24 FN is measured at a distance of the probe tip of 1 mm to
the edge of the specimen. A correction factor of 1.1 can be obtained from Fig. 7-
13. The actual ferrite content is computed in the following manner:
Few = Fem • correction factor
Few = 24 FN • 1.1 = 26.4 FN
The following options are available for evaluating the measured ferrite contents:
z Evaluation of the current block (Block result)
z Evaluation of the open Application (Final result)
An evaluation cannot be carried out in an Application, where no measurements
have not yet been stored or where the measurements have been deleted! In this
case, the display will not change after pressing BLOCK-RES or FINAL-RES.
The following parameters will be determined during the evaluation from the
readings of the current block, or the open Application, respectively, and can be
displayed in succession:
z Block or Application number
z Date and time of the block closure of the evaluated block or the current date
(if the evaluated block is not yet closed).
z Mean value
z Lowest and highest reading or lowest and highest block mean value (if auto-
matic block creation is enabled)
z Range R
Evaluation
z Standard deviation sa (only for the final result if automatic block creation is
enabled)
z Specification limit values LSL and USL
z Process capability indices Cp and Cpk as well as the estimated value s^ for
the standard deviation (only if tolerance limits and automatic block creation
are enabled)
z Histogram with information whether a normal distribution is present, skew-
ness and kurtosis as well as sum frequencies of the histogram classes (only
for the final result if the corresponding histogram mode is set from the ser-
vice functions).
When making measurements with a fixed block size and the last block has not
been concluded, the next reading will be added to this block (even if ENTER is
used to end the evaluation). In this case, the block will be concluded only after
Notes:
[Change block: ] or [Change block:
]: Use or to display the block re-
sult of the next or previous block.
[Single meas: MENU]:
Use MENU to display the single readings
of the evaluated block (then use or to
display the readings in succession, use
MENU to return to the block result).
[Delete block: DEL]:
Use DEL to delete the readings of the last
not yet closed block (appears only during
the evaluation of not closed blocks).
[Exit: ENTER]: Ends the block result dis-
play. The current block will be closed.
appears on the display once the block
is closed.
If you change during the display of the block result of the current block to the
block result of a previous block (by pressing ), then the block result of this
block can be printed as well using PRINT. The printout will then include a list
of the readings of this block as well.
[Exit: ENTER]:
To end the final results function
without deleting the readings
use ENTER.
ENTER
Use ENTER to finish the final result func-
tion.
Product ..............................
Name ..............................
Appl.No. 0 -- Final result --
from 27.06.08 11:26 to 27.06.08 11:27
If tolerance limits are enabled and measurements were made with the fixed block
size, additional parameters will be output ( Fig. 8-6).
Product ..............................
Name ..............................
Appl.No. 0 -- Final result --
from 27.06.08 11:12 to 27.06.08 11:23
Mean value fe..= 39.84%
Est.StdDev.. Ã^ = 1.88%
COV = 19.11%
smallest Block= 8.89% Displayed only
largest Block = 10.33% when tolerance lim-
its are enabled
1 values < LSL ( 10.20% )= 20.00% Displayed only
0 values > USL ( 10.80% )= 0.00% when measure-
cp = 0.69 cpk = 0.34 s^ = 0.51 ments are made
Fig. 8-6 Printout of a final evaluation with fixed block size and tolerance limits enabled (ex-
ample)
Evaluation
FISCHER FERIT- Instrument type:
SCOPE FMP30
2008-06-27 Current date
Product .....
Name .....
Appl. No. Number of the Application
-- Final result -- Result type
from ... to ... Date and time of the last block closure of the first and
the last block or the current date and the current time
(if the last block is not yet closed).
Mean value Fe./ Mean value/Mean value of the block mean values
Fe.. with a 95% confidence interval
Std dev. s Standard deviation
Est.StdDev. Estimated standard deviation (only specified with
fixed block sizes).
n Number of evaluated readings
ni Block size (number of readings per block)
Std. dev. sa Standard deviation sa (is specified only if the spread
of the mean values cannot be explained from the
spread within the blocks according to a variance anal-
ysis).
nBl Number of evaluated blocks
COV Coefficient of variation
Smallest value/ Lowest reading (Minimum)/
Smallest block lowest block mean value
Highest value/ Highest reading (Maximum)/
Highest block highest block mean value
LSL/USL Upper / lower specification limit
cp / cpk Process capability index
s^ Estimated value for the standard deviation
A histogram ( Fig. 8-7) will be printed after the final result only if the respec-
tive histogram mode has been set up in the service functions
( 10.5.6 ‘Histogram’, beginning on Page 169) and there are least 30 readings
stored in the Application ( 10.8 ‘Storage Mode’, beginning on Page 187).
To determine whether the evaluated readings have normal distribution, the in-
strument performs a Kolmogorov-Smirnov test (if up to 40 readings are evaluat-
ed) or a F2 test (if more than 40 readings are evaluated) during the final evalua-
tion. The test result is printed out under the histogram and shows if a normal
distribution of the readings was determined [Normal distribution] ( Fig. 8-7)
or not [No normal distribution] ( Fig. 8-8).
HISTOGRAM
n
10.1|
7 |*
12 |*
10.2|
10.3|
7 |*
10.4|
2 |*
10.5|
Normal distribution
NORMAL PROBABILITY CHART
Upper limit Norm. Prop. Chart
10.2 23.33%
10.2 63.33%
10.3 70.00%
10.4 93.33%
10.5 100.00%
Fig. 8-7 Printout of a histogram with normal distribution (example)
Evaluation
normal distribution (with a normal distribution, skewness and kurtosis are Zero!):
HISTOGRAM
n
10.1|
7 |*
10.2|
12 |*
10.2|
2 |*
10.3|
7 |*
10.4|
2 |*
10.5|
Distribution not normal
Skewness= 0.55 Kurtosis= -1.3
NORMAL PROBABILITY CHART
Upper limit Norm. Prop. Chart
10.2 23.33%
10.2 63.33%
10.3 70.00%
10.4 93.33%
10.5 100.00%
Fig. 8-8 Printout of a histogram without normal distribution (example)
The USB port for the instrument is on the unit's rear side. Bi-directional data ex-
change occurs via the USB interface.
The following operations are possible when the USB port is connected to a com-
puter (PC):
z Transfer of the readings and the characteristic statistical data from the instru-
ment to the PC.
z Remote control of the instrument by sending commands from the PC to the
instrument.
z Requesting measurement data and other data (e.g., the name of the current
Application) by sending commands from the PC to the instrument.
z Transfer of data (e.g., designations for Applications) from the PC to the
instrument by sending commands from the PC to the instrument.
Both commercial or one's own data processing programs can be used to process
the data exported by the instrument. Information regarding import and processing
of the data using such programs may be obtained from the respective manuals for
these programs.
Fig. 9-1 Side view of the instrument with the USB port
1. Connect the instrument to the USB port of your PC. The “Found New
Hardware Wizard” opens.
2. Follow the instructions of the Windows wizard. If the driver is not found
automatically, select or enter the source to search for the USB driver (e.g.,
CD-ROM drive. removable media (CD, diskettes, ...) or local path).
Windows XP®:
Ignore the message for the Windows Logo Test (Window “Hardware
Installation”). Click the Continue Installation button and continue the
installation.
The successful installation of the USB driver can be verified in the Windows De-
vice Manager.
z Open the Device Driver: Start/Control Panel/System, Hardware tab, Device
Manager button.
z You will find an additional COM port under “Ports (COM & LPT)”, e.g.,
USB Driver for FMP (COM3) if the instrument is connected to your PC via
the USB interface.
2. Select the data for online export: 10.6 ‘Instrument Mode’, beginning
on Page 171.
The instrument can be remote controlled and can request readings and other data
by sending the control commands from the PC to the instrument. The requested
readings or the data, respectively, are then transmitted by the instrument via the
USB port and received by the PC.
If sending the commands “DAM”, “DAT”, “GAN”, “GBN”, “SAN”, “SBN”,
“SGS” or “SWA” results in an error, i.e., the respective function cannot be ex-
ecuted, the instrument will return the ASCII character „NAK” via the USB port
to the computer.
Response: ACK (ASCII6)
Response in case of an error: NAK (ASCII21)
Command Function
PT2 Sets the measurement date output mode “Single readings with
group separator”, i.e., during the measurement data output, the
single readings are transferred and a group separator (ASCII
GS) is transmitted between each of the measurement blocks.
PT3 Sets the measurement data output mode
“only block mean values”, i.e., during the measurement data
output, only the block mean values are transferred.
ESC0 Operates the DEL key
ESC1 Operates the FINAL-RES key
ESC2 Operates the BLOCK-RES key
ESC3 Operates the ON/OFF key
ESC4 Operates the ZERO key
ESC5 Operates the CAL key
ESC6 Operates the key
ESC7 Operates the key
ESC8 Operates the APPL No key
ESC9 Operates the MENU key
ESC: Operates the PRINT key
ESC; Operates the ENTER key
AN Requests the maximum possible number of Applications that
can be set up in the instrument.
GAA Requests the number of the current Application.
SWA0 Selects the Application with the number 0 (... 99) in the instru-
... ment.
SWA99 Example: The result of the command “SWA2” is that the Appli-
cation with the number 2 is selected in the instrument.
IEX0 Checks if the Application with the number 0 (... 99) is set up in
... the instrument. The instrument outputs “1” if the Application is
IEX99 set yo and “0” if it is not set up.
Command Function
z Connect the USB port of the instrument with the USB port of the Printer.
Use the USB cable supplied with the instrument.
Fig. 9-2 Side view of the instrument with the USB port
z You can obtain an overview of printers that are suitable for connection to the
instrument from the Helmut Fischer GmbH Institute for Electronics and
Metrology or from your authorized supplier.
For information about operation, maintenance and care of the printer,
consult the instruction manual of the printer.
The default settings of the service function parameters (i.e., the as shipped factory
settings) are underlined below(e.g.,: [Histogram off]. A re-initialization will reset
the settings in the service functions to the default settings ( Page 157). How-
ever, time, date and language are not reset by the re-initialization!
start on
Service menu Functions
Page
10.2 System
10.2.1 Language
Do not select a language for which you do not understand the charac-
ters, e.g., Cyrillic! You might have difficulty returning to a language that is
familiar to you!
10.2.2 Time
z “on w. power unit”: The light is on only with the power unit connected.
or always off
Enter After confirming the selection “always off”
with ENTER you are immediately returned
to the menu in order to enter additional set-
tings.
or always on
Enter After confirming the selection “always on”
with ENTER, you are immediately returned
to the menu in order to enter additional set-
tings.
or on w. power unit
Enter After confirming the selection “on w. power
unit” with ENTER, you are immediately re-
turned to the menu in order to enter addi-
tional settings.
z all settings in the service functions are reset to the default settings (i.e., to the
factory settings) (with the exception of time, date and language); thus, if nec-
essary the settings will have to be made again,
z all settings in the service functions are reset to the default settings (i.e., to the
factory settings) (exception: language); thus, if necessary the settings will
have to be made again,
z the coefficients of the master characteristic that is stored in the EEPROM of
the probe plug are not changed because the re-initialization concerns only
the memory of the instrument.
ENTER
Select the desired groups separator mode
by pressing the arrow keys or and
confirm the selection with ENTER.
ENTER
Select the desired free-running mode by
pressing the arrow keys or and con-
firm the selection with ENTER.
ENTER Enter the value for the left margin width us-
ing the arrow keys or and confirm the
entry with ENTER.
The restricted operating mode will remain enabled even after the instrument is
switched off and on.
To ensure that the Applications linked to each other use the same
normalization and corrective calibration, a normalization or correc-
tive calibration, respectively, must be performed after linking for all
probes for which more than one application has been set up.
Measurement
You can specify the unit of measurement for making measurements in the newly
set up Application.
11.1 Malfunctions
The error messages (E***) and warning messages (W***) that may occur during
instrument operation are contained in the overview on the following pages.
([Delete Appl.?
Yes:DEL N.:EN-
TER]: DEL to deleted
the Application.
[To port?
Yes: DEL N.:EN-
TER], DEL to output
the measurement data
of this Application via
the USB port to a print-
er or a PC.)
Instrument corrected -- --
faulty settings autono-
W 003 mously.
Options
corrected !
Glossary
®
This chapter explains the most common terms and symbols in ferrite content
measurement and related fields (e.g., quality assurance). In some cases, alter-
nate terms or synonyms are mentioned in parentheses.
Rechargeable battery
Accumulator (German abbreviation Akku). Rechargeable. Used like any bat-
tery.
Application
Measurement Application of the User.
In the field of ferrite content measurement, an Application (memory) refers
to a memory that stores the coefficients that are determined during the nor-
malization and corrective calibration for each measurement application as
well as the single readings measured in this Application. In addition, the ap-
plication-specific settings are stored in the applications. Up to 100 different
Applications can be created in the FERITSCOPE® FMP30.
Outlier measurements
Measurements that are considerable larger or considerable smaller than the
other measurements of the measurement series and therefore can be consid-
ered as unexpected or unacceptable. With outlier rejection enabled
( Grubbs Test; Sigma outlier rejection)the FERITSCOPE® FMP30
indicates outlier measurements by two short audible signals immediately after
the measurement acquisition and the simultaneous appearance of and
on the LCD display.
Evaluation
Calculation of statistical parameters, e.g., mean value or standard deviation,
with graphic output on the connected printer if required. With the FERIT-
SCOPE® FMP30, the evaluation can be started using the keys BLOCK-RES
and FINAL-RES. BLOCK-RES will start the display of the block result, FI-
NAL-RES that of the final result.
Base
Component of the calibration standard set. The Base is used for normalization
and corrective calibration of the FERITSCOPE® FMP30.
Baud
Unit of the speed for transferring information (data). 1 baud corresponds to a
data transfer rate of 1 bit per second.
Baud Rate
Data transfer rate. Used mainly in connection with terminal programs for data
transfer. Since data are transferred via a serial port, the transfer rate is calcu-
lated in bits per second.
Bd (Baud) Baud
Glossary
Binary number. 1 bit is the smallest unit in the binary number system. The
value of a bit is either 0 or 1. Being the smallest unit of information in a com-
puter, a bit forms the basis of every computer system. 8 bits are combined to
a byte, or several bytes to a word.
Block
Several measurements are combined into a block. A closed block is indicated
by a k on the LCD display. A block can be closed only by pressing the
BLOCK-RES or FINAL-RES key followed by ENTER (or a measurement).
Block result
After pressing the BLOCK-RES key, the measurements will be combined into
a block and the results of the evaluation of the current block (e.g., mean value
and standard deviation of the measurements combined into this block) will be
displayed or printed.
Block size
Number of single readings that are combined to form a block.
DIP switch
Dual Inline Package = electronic component ready to be installed. In this
case, a series of little switches. They are often used in peripheral devices, i.
e., in printers, to change the basic settings of the device.
Control Limits
If the measurements are documented in a process control chart, the control
limits define the area where the measured variable may be located without the
need for process control measures.
Single reading
Measurement result that is displayed or printed after a single measurement at
the measurement location.
Final result
Evaluation of all readings that are stored in the open Application. The results
of this evaluation (e.g. mean value and standard deviation) will be displayed
or printed after FINAL-RES.
External Start
With external start enabled, the measurement acquisition can be triggered by
pressing the key or by sending the G0 (G Zero) from a connected PC.
Excess Curvature
Glossary
Mean value. The arithmetic mean value Fe. is the sum of Fei readings of a
measurement series (a Blocks), divided by the number N of readings.
N
Fe 1 + Fe 2 + ... + Fe N ¦ Fei
i=1
Fe. = -------------------------------------------------------- = -----------------------
-
N N
Fe..
Mean value of the block mean values of the evaluated blocks. Standard devi-
ation of the readings that have been taken using a fixed block size. Is output
only if fixed block size Block
N
1
Fe.. = -------- ¦ Fe. j
N Bl
j=1
where:Fe.. = Mean value of the block mean values
NBl = Number of evaluated blocks
Fe.j = Block mean values
“Free-running” display
With the probe placed on the specimen, measurements are displayed contin-
uously. Indicated by a p on the LCD display of the FERITSCOPE® FMP30.
Accuracy
Trueness Precision
Agreement between the “true” value Agreement between the individual mea-
and the mean value of a measure- surement results under precisely de-
ment result generally obtained under fined test conditions.
practical circumstances.
Repeatability Reproducibility
Maximum value
Maximum value measured in a test series.
Grubbs Test
Method for outlier rejection. Outlier rejection
Group Separator
mark for the end of a block that can be transferred together with the measure-
ment data to the PC.
3
#@
W
#@!
W
#@#
!WWWWWW
$@%
WWWWW
$@
WW
$@
WW
$@!
Fe
The ferrite content is displayed in dependence of the
countrate X as a calibration curve.
X = XS ferrite content:
0 FN or 0 Fe%
X
XBase XS
Fe
The ferrite content Fe is displayed as a
function of the countrate Xn in a calibra-
tion curve.
Xn
0 1
Glossary
Characteristic Calibration curve (characteristics)
Class
Range between a lower and an upper class boundary (e.g., ferrite content lim-
its). The single readings of a measurement series can be sorted according to
classes of equal width, which cover the entire range of the measurement se-
ries. The number of measurements per class plotted for each class is called a
histogram.
Minimum Value
Minimum value measured in a measurement series.
System Check
A significant part of monitoring the test equipment. Calibration standards or,
even better, reference samples, are used to check the calibration and to verify
the stability of the instrument.
Control chart Process control chart (quality control chart, SPC chart)
Kurtosis Curvature
Unit of measurement
Unit for displaying measurement data. In ferrite content measurement, the
common units of measurement are ferrite numbers (FN) or ferrite percent
(Fe%).
Master calibration
Adjustment of the instrument using calibration standards. During a master
calibration, the master calibration curve is determined. The master calibration
includes calibration and adjustment.
Maximum
Highest reading of a measurement series.
Features
Properties of a product. Variable features are the measurable properties of a
product subject to change or variability; e.g., ferrite content is a variable fea-
ture. Attributive features are the properties of a product that usually cannot be
captured by taking measurements. Examples are, deviations in color, or
whether the product is true to gauge size.
Glossary
Measuring is comparing. The probe signal generated at the measuring posi-
tion is compared to the probe signal of the calibration standard. Using the cal-
ibration curve, the instrument converts the probe signal to the measurement
result.
Measuring Application
Structure of the measuring object according to material, thickness and other
properties (hard/soft, porous/dense, homogenous/inhomogeneous, etc.) and
any other conditions relevant to the measurement requirement. These factors
determine the selection of a suitable test method, the probe type and the in-
strument.
Measurement Range
The range between the two limits within which a measurement is possible at
a specified trueness and precision. In a narrower sense, it refers to the range
of the scale of an analog instrument. The measurement range depends on the
test method, the design of the probe, and the measurement application.
Measurement errors
The difference between the actual and the measured value of a measured vari-
able. For measuring instruments, there is a distinction between random (un-
predictable) and systematic (correctable) measurement errors. Random errors
determine the repeatability precision. Systematic errors affect the trueness
and the reproducibility. Systematic errors are far more prevalent in practical
ferrite content measurement applications (see / 12 / for further details). Sys-
tematic errors can be traced to
1. faulty calibration,
2. operation-related or operator-related errors, or
3. changes in test conditions (inhomogeneities of the substrate, aging, etc.).
Systematic errors tend to lean in one direction. With appropriate care,
causes 1 and 2 can usually be avoided or corrected. Causes of the third
kind can be corrected by system checks or can be taken into account in
the result.
System Check
Measuring Object
Object on which the measurements are to be performed to determine the fer-
rite content for example.
Measurement Series
A series of single readings between two block or final results.
Measurement Location
A limited and clearly defined point within the reference area of the specimen
where the ferrite content is to be determined. (For detailed information, see /
13 /.)
Uncertainty of measurement u
Measurement method
Procedures and process to obtain information about the properties of a mea-
suring object. The test method is based on scientific findings and depends on
the application. (For further details, see / 16 /.)
Measurement
Numeric reading of an instrument, expressed in the unit of measurement. The
measurement can be obtained as the result of a single measurement or as
arithmetic mean of several single measurements (e.g., when auto averaging
mode is enabled).
Minimum
Lowest measured value of a test series.
Re-initialization
The restoration of the default settings of the instrument. With a re-initializa-
tion of the instrument, all Applications are deleted, i.e., the stored measure-
ment data as well as the normalization and the corrective calibration of all Ap-
plications. After a re-initialization, all Applications must be set up anew! In
addition all settings in the service functions are reset to the default settings
(i.e., to the factory settings). If necessary, the settings will have to be made
again. However, time, date and language are not reset by the re-initialization.
Glossary
the probe plug are not affected by a re-initialization because the re-initializa-
tion concerns only the memory of the instrument.
P -V P P+V
Figure 16.7: Probability distribution P(X) of a quantity X, which can be classified as hav-
ing normal distribution
Normalization
Adjusting a measuring instrument to a new zero value (countrate X0). Impor-
tant for some applications when the base material changes, or when the test
method is subject to instability (e.g., to drift) (e.g. for beta backscatter and X-
ray fluorescence methods). During normalization, the calibration curve is ad-
justed to the individual measurement application that the open Application is
calibrated for. The coefficients of the adjusted calibration curve are stored in
the open Application. The coefficients of the master calibration curve, which
are stored in the EEPROM of the probe plug, are not affected.
Offline
State of a peripheral device (printer or PC) connected to the instrument that
does not allow it to receive data.
USL
Upper specification limit. Specification limits (LSL and USL)
Online
State of a peripheral device (printer or PC) connected to the instrument that
allows it to receive data; the connected instrument is ready for operation.
Parity
An error checking method where the digits of a number of error-free transmit-
ted bit groups must add up to an even or an odd number. During data transfer
the parity bits are added to the data bits of each character or Byte to be trans-
ferred. In every word, this bit is set such that Ones of the byte always result
in an even or an odd number (corresponding to an even or odd parity). The
type of parity must be defined prior to the data transfer. By checking the par-
ity, the receiver can determine if simple bit transfer errors occurred.
Pin
Connectors for integrated circuits or connecting plugs of technical devices.
Usually in the shape of a pin.
Glossary
Agreement between the single measurement results under precisely defined
test conditions. The precision is composed of reproducibility and repeatabil-
ity. Accuracy; Reproducibility; Repeatability/Repeatability pre-
cision
Process capability
The process capability is assessed by the indices cp and cpk. (For further in-
formation see / 4 /.)
Process capability is met when the process capability exceeds specified val-
ues. Commonly required is:
c p ! 1,33 and c pk ! 1,0
c p = OGW – UGW-
---------------------------------
6 V̂
Statistical Process Control (SPC) often uses random samples to control a pro-
duction such that the production process is under statistical control. To do
this, the variable features of the manufactured product are entered in a process
control chart. Process control charts plot process variation over time and help
to identify the causes of variations. A random sample is taken from the pro-
duction process, is measured and the result (e.g., mean value and standard de-
viation (x-s chart)) is graphically documented. The results of the control chart
are used to determine when action should be taken in the process.
Quality control chart Process control chart (quality control chart, SPC
chart)
Quality assurance
All measures taken by a producer to ensure a controlled production process
within the established quality criteria. One aspect of it is quality control, spe-
cifically, ferrite content measurements where ferrite content limit specifica-
tions are involved.
R
Range R of all measurements being displayed in the process control chart.
The range is the difference between the maximum measurement Femax and the
minimum measurement Femin in a measurement series.
R = Fe max – Fe min
R.
Mean range across all block ranges.
R. = V̂ d 2
where:R. = mean range
Reference area
A portion of the significant surface area of a product where one or more mea-
surements are to be taken. It is recommended to include the reference area or
significant surface area in the production specifications, in addition to the
specifications limits for the ferrite content.
Glossary
Control chart Process control chart (quality control chart, SPC chart)
s
The standard deviation s is a measure of the deviations of single measure-
ments of a measurement series from their common mean value. It is equal to
the mean square deviation of the single measurements from the mean value
and is calculated as follows:
2 2 2
Fe. – Fe 1 + Fe. – Fe 2 + ... + Fe. – Fe N
s = ---------------------------------------------------------------------------------------------------------------------
N – 1
where:s = standard deviation
Fe. = mean value of all single readings
Fei = single readings
N = number of readings
Figure 16.8: Measurement series with the same mean value but different standard de-
viation
s.
Standard deviation of the readings that have been taken using a fixed block
size.
N Bl
1
s. = -------- ¦ s j
N Bl
j=1
where:s. = mean standard deviation of the block standard deviations
NBl = number of evaluated blocks
sj = standard deviation of the readings of a block
sa
Calculated by the FERITSCOPE® FMP30 only when the measurements were
performed with fixed block size and the deviations of the block mean values
cannot be attributed to the deviations within the subgroups, as determined by
analysis of variance methods (A.O.V.). It describes the deviations of the
block mean values in relation to the deviations of the single measurements
within the blocks. With a suitable measurement strategy, sa is a measure of
the product deviation
2 2
s II – V̂
sa = --------------------
Nj
where:sa = deviation of the block mean values corrected with regard to the deviation of the
single readings
sII sII
Nj = block size (number of readings per block)
Glossary
If, for instance, the same number of measurements is performed on several
specimens and the readings on each object are combined into a block (e.g.,
when making measurements with a fixed block size), s. is a measure for the
instrument deviation and sa is the product deviation with the instrument de-
viation eliminated.
sII
Deviation of the block mean value around the overall mean value sII is calcu-
lated as follows:
N Bl
1
s II = N i ----------------- ¦ Fe.. – Fe. j 2
N Bl – 1
j=1
where:sII = deviation of the block mean values
NBl = Number of evaluated blocks
Ni = block size (number of readings per block)
Fe.. = mean value of the block mean values
Fe.j = block mean values
V
Estimated value for the standard deviation V of the population.
s.-
V̂ = ----
c4
where: V̂ = estimated value for the standard deviation V of the population
s. = mean standard deviation
c4 = The factor c4 depends on the random sample size and can be obtained from popu-
lar published tables, e.g., / 4 /.
Skewness
Measure for the asymmetry of a single-peak probability distribution around
its mean value. A positive skewness indicates a distribution whose peak
stretches more towards values that are greater than the mean value. A nega-
tive skewness indicates a distribution whose peak stretches more towards val-
ues that are smaller than the mean value. The skewness of symmetric distri-
butions is zero (e.g., for normal distributions). When evaluating the open
Application with the FERITSCOPE® FMP30, the skewness is calculated ac-
cording to the information in / 20 /.
Probe
The instrument receives the electrical probe signal, which is proportional to
the ferrite content measured, from the probe. The probe signal is then convert-
ed by means of the calibration curve into the ferrite content reading. The Fis-
cher E... probes are equipped with a memory chip (EEPROM) in the probe
plug. The EEPROM stores probe-specific information (e.g., probe type, man-
ufacturing code, test method and coefficients of the master calibration curve).
Range R
SPC
Statistical Process Control. Statistical Process Control (SPC)
SPC chart Process control chart (quality control chart, SPC chart)
Memory
Data storage element of a microprocessor-based measuring instrument.
Information is saved in the memory. Application
Specifications
Requirements according to which production is defined within certain limits
for variable and attributive properties, like for instance the lower and the up-
per specification limit for the ferrite content. Quality control monitors adher-
ence to these requirements.
Glossary
As with every process, test methods are also subject to deviations. This may
lead to systematic measurement errors (e.g., drift), independent of handling.
By examining the stability and by regular checks, one can ensure stability.
Standard deviation s
AC adapter
The FERITSCOPE® FMP30 can be connected to a power outlet via the AC
adapter.
Random sample
A representative group selected from the production lot, using random sample
principles. The sample is used to determine the properties of the entire lot
(batch, unit of production).
Stop bit
With serial asynchronous data transfer, the stop bit is added to the data word
to be transferred. 1 to 2 bit logic Ones are used. After the stop bit, the sender
remains at logic One until the start bit of the next character arrives.
Student factor t
Sum frequency
A form of display of the measurement data distribution, such that the number
of measurements smaller or equal to a particular measurement is calculated
and displayed in percent.
t
The student distribution factor t can be obtained from any popular publication
of mathematical statistics tables (e.g., / 4 /) and is given as follows:
t
§1 – D
---· ;f
© 2¹
Example: At a confidence level of 95 % and N > 200 (resulting in a degree of
freedom f = 199 (because of f = N-1)), the student factor is t97.5;199 =1.96.
u
Uncertainty of measurement. The mean value Fe. of a random sample is not
equal to the mean value P of the population. However, using the measure-
ment uncertainty, it is possible to define an interval, in which the mean value
P of the population will be found with a certain probability (indicated as con-
fidence level):
Fe. – u P Fe. + u
For a population having normal distribution, the uncertainty of measurement
u is calculated as follows for a given confidence level (1-D):
s-
u = t-------
N
where:u = measurement uncertainty
t = student factor
s = standard deviation
N = number of readings
Glossary
N
Data transfer rate Baud Rate
LSL
Lower specification limit. Specification limits (LSL and USL)
C.O.V.
Coefficient of variation. The standard deviation of a measurement series in
percentage points, i.e., the standard deviation in reference to the mean value.
For many manufacturing processes, C.O.V. [%] is a characteristic process
constant. A change in a parameter during the coating process can alter C.O.V.
[%] significantly; thus, a sudden change of C.O.V. [%] indicates a change in
the process conditions. C.O.V. [%] is calculated as follows:
s
V = -------- 100 > % @
Fe.
where:COV = coefficient of variation
Fe. = mean value
s = standard deviation
Variance
Mean squared deviation. The square root of the variance is called standard de-
viation.
Reproducibility Reproducibility
Reference measurement
Measurement on a reference sample to check the normalization or calibration
which was performed before.
Reproducibility
The ability of different operators to achieve practically the same measure-
ment result, when taking measurements with different instruments at the same
measuring position of the same specimen at different locations.
( Accuracy; for detailed information, see / 20 /.)
Specimen with a known ferrite content on a defined reference area that can be
used to check the calibration. The ferrite content within the reference area
should be as regular as possible. The reference sample should have the same
properties (geometry, etc.) as the specimen on which the calibration was per-
formed. The reference samples may be from in-house production or may be
from external sources. The ferrite content of a reference sample should have
been determined using a reliable and properly calibrated instrument. Refer-
ence samples are used for the monitoring of test equipment.
With contacting measurements, reference samples are subject to wear and
tear in the same manner as the calibration standards. The wear and tear is de-
pendent on the properties of the surface and on the probe which used for mea-
surement. For this reason, reference samples have to be checked regularly and
replaced by new reference samples if the wear and tear becomes significant.
Confidence level u
Significant surface
Area on the surface of a specimen containing the ferrite content to be mea-
sured. All properties necessary for the use and appearance of the product must
occur at this significant area.
Repeatability/Repeatability precision
The standard deviation of the measurements taken under repeatability condi-
tions is a measure for the repeatability. The smaller the standard deviation of
these measurements, the better is repeatability. The repeatability is dependent
on the test method and the quality of the instrument, but often also on the
properties of the specimen (e.g., surface roughness). The standard deviation
of the measurements under repeatability conditions can be reduced by gener-
ating the mean value of the measurements (such as in auto-averaging mode).
( Accuracy; for detailed information, see / 20 /.)
Glossary
Excess and Kurtosis are measures for the curvature (e.g., how pointed or how
wide) of a distribution compared to a normal distribution. A positive curva-
ture indicates a relatively narrow, pointed distribution. A negative curvature
indicates a relatively flat distribution. The curvature of a normal distribution
is Zero. When evaluating the open Application with the FERITSCOPE®
FMP30, Excess is calculated according to the information in / 20 / and stated
as curvature.
X
Countrate Countrate
XBase
Zero point of the calibration curve. Countrate obtained when measurements
are taken on the Base of the calibration standard set. Countrate
Xn
Normalized countrate. Countrate
Xs
Countrate obtained when measuring on a measuring object with no ferrite
content. Countrate
Countrate
Digitized form of the measurement signal, which is proportional to the ferrite
content and is produced in the probe by the ferrite content. The larger the fer-
rite content is, the smaller is the countrate. Calibration curve (character-
istics)
The numeric values of the normalized countrate Xn range between 0 and 1,
and are calculated according to the following equation:
X – X Base
Xn = -------------------------
Xs – X Base
where:Xn = normalized countrate
X = count rate measured on the specimen
XBase = countrate measured on the Base of the calibration standard set
Xs = countrate measured on a specimen with no ferrite content
Glossary
/ 12 / DIN 1319, Parts 1, 2 and 3: Basic Concepts in Metrology
/ 13 / DIN EN ISO 2064: Definitions and Conventions Concerning the Mea-
surement of Coating Thicknesses (previously DIN 50 982, Part 1)
/ 14 / DIN EN ISO 2178: Measurement of Coating Thicknesses: Magnetic
Methods (previously DIN 50 981)
/ 15 / ISO 3534: Statistics; Vocabulary and Symbols
/ 16 / DIN EN ISO 3882: Review of Methods for Coating Thickness Measure-
ments
(previously DIN 50 982, Part 2)
/ 17 / DIN ISO 5725: Precision of Test Methods; Determination of Repeatabili-
ty and Reproducibility Through Round Robin Tests
/ 18 / DIN 50 982, Part 3: Principles of Coating Thickness Measurement: Gen-
eral Fundamentals - Selection Criteria and Basic Measurement Procedures
/ 19 / DIN 55 302 Parts 1 and 2: Statistical Evaluation Methods
/ 20 / DIN 55 350: Terminology in Quality Assurance and Statistics
/ 21 / DIN-Taschenbuch 175 - Prüfnormen für metallische und anorganische
nichtmetallische Überzüge - Normen; Berlin, Köln: Beuth Verlag GmbH
/ 22 / DIN-Taschenbuch 223 - Qualitätssicherung und angewandte Statistik -
Begriffe; Berlin, Köln: Beuth Verlag GmbH
/ 23 / DIN-Taschenbuch 224 - Qualitätssicherung und angewandte Statistik -
Verfahren 1; Berlin, Köln: Beuth Verlag GmbH
/ 24 / IIW Document II-1269-95 (II-C-034-95) - Draft Revision of ISO 8249-
1985 (E) and II-C-023-94: Welding - Determination of Ferrite Number in
austenitic and duplex ferritic-austenitic Cr-Ni stainless steel weld metal
/ 25 / DIN EN ISO 8249: Welding - Determination of Ferrite Number (FN) in
austenitic and duplex ferritic-austenitic Cr-Ni stainless steel weld metals
/ 26 / DIN 32 514, Part 1: Determination of the ferrite number in austenitic
weld metal
/ 27 / Basel-Standard (BN2)
DKD-D-33101
Accredited acc. to
DIN EN ISO/IEC 17025
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HELMUT FISCHER AG
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