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AN 672: Transceiver Link Design Guidelines For High-Gbps Data Rate Transmission

Design Guidelines for high speed

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0% found this document useful (0 votes)
61 views34 pages

AN 672: Transceiver Link Design Guidelines For High-Gbps Data Rate Transmission

Design Guidelines for high speed

Uploaded by

mohamed
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© © All Rights Reserved
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AN 672: Transceiver Link Design Guidelines for High-

Gbps Data Rate Transmission


2020.01.29

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As transceiver data rates increase and the unit interval time (UI) decrease, the end-to-end link design of a
transceiver channel becomes increasingly critical to the overall performance of the link. Consider a
Stratix® V FPGA with transceiver channels operating up to 28 Gbps. At this data rate, the UI is less than
36 ps. Any signal degradation of the channel can impact jitter margin and increase eye closure, resulting in
increased bit error rates (BER). Two of the proposed standards for 100-Gpbs data transmission using
fewer lanes are CEI-25G-LR and CEI-28G-VSR.
CEI-25G-LR is intended for 25 Gbps data transmission across long-reach backplane architectures.
Likewise, CEI-28G-VSR specifies a 28-Gbps data rate for very short-reach chip-to-module and chip-to-
chip applications. For these standards, the total insertion loss budget for the link at the Nyquist rate is
approximately -25 dB for CEI-25G-LR and -10 dB for CEI-28G-VSR. Successful data transmission across
these types of links requires the designer to minimize signal degradation caused by the channel to meet
stringent loss requirements. Understanding the various factors that contribute to channel loss allows the
designer to make appropriate design choices to mitigate adverse effects and achieve optimal link perform‐
ance. This application note describes how to optimize a complete transceiver link for these very high-Gbps
data transmission designs.

Intel Corporation. All rights reserved. Intel, the Intel logo, Altera, Arria, Cyclone, Enpirion, MAX, Nios, Quartus and Stratix words and logos are trademarks of
Intel Corporation or its subsidiaries in the U.S. and/or other countries. Intel warrants performance of its FPGA and semiconductor products to current ISO
specifications in accordance with Intel's standard warranty, but reserves the right to make changes to any products and services at any time without notice. 9001:2015
Intel assumes no responsibility or liability arising out of the application or use of any information, product, or service described herein except as expressly Registered
agreed to in writing by Intel. Intel customers are advised to obtain the latest version of device specifications before relying on any published information
and before placing orders for products or services.
*Other names and brands may be claimed as the property of others.

www.altera.com
101 Innovation Drive, San Jose, CA 95134
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2 AN 672: Transceiver Link Design Guidelines for High-Gbps Data Rate Transmission 2020.01.29

Figure 1: Typical System End-to-End Transceiver Links

Backplane Connectors
Signal thru
TX Breakout connector

Vias
Stratix V Device Egress
PCB Material transceiver serial link

Backplane Reach
GND Ref Plane

Backplane
Vias Vias
Backplane Connectors
RX Breakout Signal thru
connector
Stratix V Device

Vias
Ingress Blocking Cap

PCB Material GND Ref Plane transceiver serial link

Vias Vias Vias

(a) Line Cards Over Backplane Link

TX & RX Breakout Blocking Cap


Stratix V Device Signal thru Plugable Module
Ingress connector
GND Ref Plane
PCB Material GND Ref Plane transceiver serial link

Vias Egress Vias

(b) Chip-to-module Link

TX & RX Breakout
Stratix V Device Blocking Cap TX & RX Breakout Stratix V Device
Ingress
PCB Material GND Ref Plane transceiver serial link GND Ref Plane
Vias Egress Vias Vias

(c) Chip-to-chip Link

A typical end-to-end transceiver link can be separated into three main components:
• PCB material
• stack-up design
• channel design
Designers must give careful consideration to each of these components to avoid degraded link perform‐
ance. Link optimization involves understanding and managing the first-order factors that impact signal
performance for each of the three components. For high-speed signal transmission, these first-order
factors are:
• Signal attenuation
• Impedance control and discontinuities
• Crosstalk

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PCB Material Selection


The printed circuit board (PCB) material is the substrate upon which the channel design is constructed. It
consists of the core, prepreg dielectric layers, and copper foils stacked and glued together to from the
complete PCB stack-up. The dielectric and copper layers form the reference planes and routing layers for
the channel design. The sources of signal attenuation resulting from the PCB material include dielectric
loss, conductor loss, reflections due to mismatched impedance, and radiation loss. Losses due to radiation
are usually very small and can be ignored. The remaining losses can be attributed to the various properties
of the material choice. Material properties that directly affect the link performance include:
• Loss tangent (tan(δ)/Df)
• Dielectric constant (Er/Dk)
• Fiberglass weave composition
• Copper surface roughness

Loss Tangent and Dissipation Factor


Loss tangent (tan(δ)) (also referred to as dissipation factor (Df) by many PCB manufacturers) is a measure
of signal attenuation as the signal propagates down the transmission line. This attenuation is the result of
electromagnetic wave absorption in the dielectric material and is commonly known as dielectric loss. As
frequency increases, the dielectric loss also increases proportionally. Common material choices for high-
speed signal layers include Nelco 4000-13EPSI, Rogers 4350B, and Panasonic Megtron 6. For very high-
Gbps transceiver designs, Intel has successfully used Panasonic’s Megtron 6 material as the laminates for
the core and prepreg layers surrounding the high-speed routing layers.

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Figure 2: Comparison of Material Loss Tangent

Note: Given the choice, select the material with the lower loss tangent to reduce signal attenuation from
dielectric losses.

Dielectric Constant
The dielectric Constant (Ɛr or Dk in many material data sheets) is a measure of the insulating properties of
the material and affects the capacitance of the conductor embedded within it as well as the speed of signal
propagation on the transmission line. Lower dielectric constant provides better insulation, faster signal
propagation, higher trace impedance for a given trace geometry and smaller stray capacitance.

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Figure 3: Stripline Differential Trace

Table 1: 100-Ω Stripline FR4 vs. Megtron-6 Construction


Material Er W (mils) S (mils) T (mils) H1 H2 Zo (Ω) Zdiff Tpd (ps/ C (pF/in)
(mils) (mils) (Ω) in)
FR4 4.6 6 15 0.7 7 11 52 100 182 3.5
Meg-6 3.4 6 15 0.7 5 8 100 156 3.1

Consider a 100-Ω differential stripline pair constructed with an optimal trace width (W) of 6 mils and pair
separation (S) of 15 mils. For FR4, the total dielectric thickness is 18.7 mils (T+H1+H2). For the same
trace construction dimensions using Megtron-6 the total thickness is 13.7 mils. This reduction of total
thickness by 5 mils is significant because it quickly adds up for high density boards that require many
signal layers. For instance, a typical FPGA board with 6 stripline routing layers can result in 30 mils of
PCB thickness savings using the Megtron 6 vs. FR4. This can be the difference between boards that are
easily manufactured using standard via drilling processes vs. ones that require more expensive laser
drilling techniques because of the smaller board thickness to via aspect ratio. Furthermore, lower Ɛr results
in faster signal propagation (Tpd) and lower trace capacitance (C), which improves signal performance.
An additional consideration for Ɛr is that it usually decreases as frequency increases. Decreasing Ɛr affects
the transmission line in two ways:
• The trace impedance increases with decreasing Ɛr causing reflections that further degrade signal quality
• The signal velocity increases with decreasing Ɛr causing dispersion of the different harmonics that
comprise the digital signal. This results in increased phase jitter at the receiver
Note: Always choose lower Ɛr with a flat frequency response for best signal performance and to reduce
signal dispersion that adds phase jitter.

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Fiberglass Weave
PCB boards are constructed of strands of fiberglass yarn woven into bundles with epoxy resin to form the
fiberglass sheets that make up the core and prepreg laminates.
Figure 4: Commonly Available Styles of Fiberglass Weaves

Since the dielectric constant of the fiber bundles and epoxy resin differ, the density of the fiber weaves
affects the uniformity of the dielectric constant of the laminate. Sparsely woven cores and prepregs have
less uniform dielectric constant and can result in impedance and signal velocity variations along the trace
route. For example, consider a differential pair trace routed over 7268 style fiberglass vs. the same pair
routed over 106 style fiberglass. The 7268 glass provides a more uniform dielectric constant since the
copper traces always reside over the glass. However, traces routed over 106 style glass can result in having
a differential pair with one leg routed over glass while the other alternates between glass and resin. The
main concern is each leg having different impedances and skew in the differential signal. Although there
are routing techniques such as using zig-zag, jogged routing, and placing the complete board design at a
slight cant on the PCB panel to average out the on-weave/off-weave problem and mitigate the signal
velocity variation, these techniques trade off valuable board real estate while not fully resolving the
impedance variation and reflection problem. Additionally, these compensation techniques increases the
trace lengths, causing additional loss.

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Figure 5: Zig-zag, Jogged Routing, and Canted PCB Compensation Technique

As a result, for very high-Gbps data rates, select higher density fiberglass laminates for the high speed
routing layers while relegating sparsely dense fiberglass to lower speed and power layers to offset the PCB
cost.
Note: Always choose more densely woven fiberglass style for the core and prepreg material surrounding
the high speed signal layers for more uniform Ɛr that minimizes impedance and signal velocity
variations.
Note: Choose sparsely dense fiberglass styles for power layers and slower general purpose signal layers to
reduce PCB cost.

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Copper Surface Roughness


In addition to dielectric loss, material losses also result from conductor loss. Conductor loss is the resistive
attenuation on the copper conductor. Resistive loss is usually mitigated by using appropriately wide traces.
However, for very high frequency designs, the majority of the current distribution is pushed towards the
outer surface of the copper conductor as a result of the skin effect. At frequencies where the skin depth
approaches the average roughness of the copper, the current flow is further impeded by the copper surface
roughness, causing increased resistance and conductor loss.
Figure 6: Skin Effect and Copper Surface Roughness

The roughness of the copper surface varies depending on the construction of the copper foils. These foils
are either electrodeposited (commonly referred to as ED copper) or rolled and pressed to create a
smoother copper foil surface. The copper roughness is specified as an average value (Ra) in micrometers
(µm). As a comparison, typical ED copper roughness has Ra of 1 µm or more while rolled copper ranges
from 0.3 to 0.4 µm. The effect of this copper roughness can be approximated by a correction factor (KSR)
to the attenuation of the conductor (αCond).

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Figure 7: Copper Roughness Approximation Equations

α C΄ond =α C ond × K SR

Ra
2 tan −1 [ 1.4 ( )]
K SR =1 + δ
π

1
δ=
σ ·π · µ 0 · µ r · f

Where:
α Cond = Conductor attenuation without copper surface roughness correction
α’Cond = Conductor attenuation with copper surface roughness correction
K SR = Surface Roughness correction factor
R a = Average roughness usually specified in micrometers. For the
K SR equation above, Ra must be entered in meters.
δ = skin depth, in meters
σ = conductivity of copper conductor = 5.8 x 107 seimens/m
μ 0 = permeability of free space = 4π x 10-7 H/m
μ r = relative permeability of copper conductor = 1
f = frequency, in Hz

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Figure 8: Attenuation Effects of Copper Surface Roughness of 6-inch Microstrip Test Trace

The red curve is the high frequency structural simulator (HFSS) simulated attenuation of the conductor
(αCond ) without the effects of surface roughness correction. The green curve is the same result with the
surface roughness correction factor (KSR) included. The blue curve is the actual vector network analyzer
(VNA) measurement of the same test trace for correlation purposes.
Note: To mitigate conductor loss, use wider traces and choose rolled copper foils over traditional electro‐
deposited (ED) copper foils in the PCB construction.
Note: Certain simulation tools may not include loss effects from surface roughness. In these cases, the
correction factor (KSR) must be added to get realistic prediction of the actual loss.

Related Information
• PCB Dielectric Material Selection and Fiber Weave Effect on High-Speed Channel Routing
Application Note
• Modeling Copper Surface Roughness for Multi-gigabit Channel Designs

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Stackup Design
The assignment of critical high-speed routing layers within the PCB stack-up is a critical part of the design
decision. The assignment of high-speed signal layers within the stackup directly affects the signal perform‐
ance. Signals routed on external layers of the PCB board are referred to as microstrip, while those routed
on internal layers are called stripline.
Figure 9: Differential Microstrip vs. Stripline Construction

By manipulating the various parameters such as trace width (W), separation (S), and height from the
reference plane (H for microstrip and H1, H2 for stripline), the trace impedance can be adjusted appropri‐
ately. Additionally, edge-coupled crosstalk from neighboring traces can be well-controlled by adjusting the
pair separation (D). For more information on crosstalk, refer to Crosstalk Control on page 20.

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Table 2: Microstrip vs. Stripline


Topology Advantages Disadvantages
Microstrip • Thinner dielectric for 100-Ω • Only 2 routing layers possible
traces • Higher EMI radiation
• No via for top routing • Both near-end crosstalk (NEXT) and
• No via stubs for bottom routing far-end crosstalk (FEXT) concerns

Stripline • Many routing layers possible • Thicker dielectric required for 100 Ω
• Inherent EMI shielding • NEXT concerns
surrounding layers • Via must be used
• No FEXT concerns • Via stubs require back-drilling

The decision to use one topology over the other examines the first-order factors that affect signal
bandwidth. While impedance and crosstalk can be well-controlled in both routing topologies, stripline
provides lower signal attenuation vs. microstrip for the same trace width and copper thickness.

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Figure 10: Stripline vs. Microstrip Insertion Loss (Sdd21)

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Figure 11: Stackup Construction

Note: For the same trace width and copper thickness considerations, stripline results in less signal
attenuation compared with microstrip.

Related Information
PCB Stack-up Design Considerations for Altera FPGAs Application Note

Channel Design
The channel is the physical medium for sending data from a transmitting device to a receiving device. The
five common components of a typical transceiver channel construction include:
• BGA channel breakout of the sending and receiving device
• Trace route design
• Signal via
• DC blocking capacitors
• Interface connectors.
Any channel usually involves two or more of these components. To optimize the channel for best signal
performance requires careful consideration of each of these components to minimize their first-order
impact on the channel.

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Figure 12: Channel Design Considerations

BGA Channel Breakout


As the number of very high-speed transceiver pairs on FPGAs continue to increase, the complexity of the
channel breakout design increases as well. Trace breakout can typically use either a single trace or dual
trace topology between the BGA via grid.
Figure 13: Single Trace Breakout
Routing layers are separated by a GND plane.

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Figure 14: Dual Trace Breakout


Routing layers are separated by a GND plane.

In the single trace breakout, more layers are required to fully route all the TX and RX transceiver pairs
because only one trace is routed between the BGA via grid per layer. Because there is ample space for a
maximum trace width of up to 13.37 mils (assuming typical minimum trace-to-copper clearances of 4 mils
for the recommended 18 mil via pad size and 39.37 mil via-to-via center pitch), the trace width and
resulting characteristic impedance is easily made uniform throughout the trace route.
In the dual trace breakout, two traces are used to reduce layer count requirement, but their maximum
trace width is limited to 4.68 mils because of the same trace-to-copper clearance requirements. Because
high-speed transceiver traces are usually routed using trace widths of 6 to 8 mils (or more) to reduce the
impact of skin effect losses at higher frequencies, the reduction of trace width to accommodate dual trace
breakout effectively increases the trace impedance. However, this increase is offset by the reduction of the
trace-to-trace separation in the differential pair, so the net impedance remains unchanged.

Table 3: Net Impedance Effect of Trace Neck Down


Topology Height from Reference Er Trace Width Trace Separation (S in mils) Diff Zo (Ω)
Plane (H1/H2 in mils) (W in mils)
Striplin 9/9 3.7 6 6.5 100
e

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Topology Height from Reference Er Trace Width Trace Separation (S in mils) Diff Zo (Ω)
Plane (H1/H2 in mils) (W in mils)
Striplin 9/9 3.7 4 4 101
e

Another benefit of the trace neck down is that the thinner trace width increases the trace inductance and
helps to compensate for the higher capacitance of the BGA ball pad.

Related Information
PCB Breakout Routing for High-Density Serial Channel Designs Beyond 10 Gbps

Channel Routing Design


The channel routing design involves the selection of critical trace parameters that can affect performance.

Trace Width Selection


PCBs are becoming very constrained, and using fine trace widths down to 4 mils wide is commonly used
to improve routability. However, for high-speed signals, narrow trace geometries increases conductor loss
due to skin effect. As a result, routabilty must be properly balanced with trace width selection for better
performance. Larger signal attenuation occurs for signals at 4 mils vs. 5 to 6 mils. For example, for a 28-
Gbps signal, the difference in attenuation at the Nyquist frequency (14 MHz) is approximately 3 dB for 4
mils versus 6 mils wide trace.

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Figure 15: Trace Width vs. Signal Attenuation

Note: For high-speed transceiver signals, use trace widths of 6 mils or more to reduce conductor loss.
Note: Limit the use of 4 mil trace widths to the BGA breakout area and keep their trace length as short as
possible.

Loose vs. Tight Coupled Traces


The decision to use loose vs. tight coupling is mainly a trade-off between routing density and impedance
control.

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Table 4: Loosely vs. Tightly Coupled Trace Routing


Routing Advantage Disadvantage
Loosely Coupled • Thinner dielectrics required for the same trace Consumes more area vs. tight
width coupling
• Less sensitivity to trace-to-trace variations
provides better impedance control

Tightly Coupled • Higher routing density Impedance control highly


• Smaller trace width for the same trace sensitive to trace-to-trace
impedance variations
• Better common mode noise rejection

For example, differential pair length matching typically requires serpentining of one leg of the differential
pair to maintain P to N skew. For loosely coupled traces, the serpentining does not drastically alter the
differential impedance of the trace. However, for tightly coupled traces, the change in the trace-to-trace
separation can significantly change the nominal differential impedance of the pair beyond the ±10%
tolerance. When applying serpentine routing, it is best to deskew after each bend or node that causes the
trace lengths to be mismatched. Doing so helps reduce common mode noise incurred along the signal
path.
Figure 16: Differential Pair Length Matching

Table 5: Loosely vs. Tightly Coupled Routing Impedance Control


Routing Topology Dielectric Trace Width Trace Height above Zdiff (Ω)
Constant (Er) (W) Separation (S) reference plane (H)
Loosely coupled 3.7 6 mils 12 mils 4 mils 100
microstrip
Loosely coupled 3.7 6 mils 18 mils 4 mils 102
microstrip
Tightly coupled 3.7 6 mils 6 mils 4.8 mils 100
microstrip
Tightly coupled 3.7 6 mils 12 mils 4.8 mils 112
microstrip

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Note: Loosely coupled traces are easier to route and maintain impedance control but take up more
routing area. Tightly coupled traces saves routing space but can be difficult to control impedance.

Crosstalk Control
Crosstalk is induced noise current resulting from mutual capacitive (Cm) and mutual inductive (Lm)
coupling on a victim trace due to switching activity from nearby aggressor trace or traces. The current
coupled from Cm travels along the victim trace in both the forward and reverse direction with the same
polarity. Similarly, the current from Lm travels forward and backwards in opposite polarity. As a result,
crosstalk can be separated into two distinct components referred to as near-end crosstalk (NEXT) and far-
end crosstalk (FEXT). In NEXT, the coupled noise current is the sum of the induced currents from Cm and
Lm as those currents are the same polarity. Conversely, for FEXT, the current is the difference of Cm and
Lm due to the polarity difference. For signals entirely contained within a homogeneous dielectric material
(such as stripline), the capacitive and inductive forward crosstalk are equal and cancel. For non-
homogeneous dielectrics (such as microstrip), the inductive component tends to be larger and the
resulting coupled noise is negative.
Figure 17: NEXT and FEXT Coupling Components

Far -end Far -end

Icm (forward) -ILm (forward)


Lm
Cm

Icm (reverse ) ILm (reverse )

Aggressor Victim Aggressor Victim

Near -end Near -end

Crosstalk control usually involves reducing signal edge rates and maintaining enough trace-to-trace
separation to reduce the mutual capacitive and mutual inductive coupling energy. In high-speed
transceiver designs running at many gigabits per second, reducing the signal edge rate is usually not an
option since the unit interval time (UI) is very small. Therefore, crosstalk control for high-speed
transceiver designs is mainly determined by PCB layout spacing constraints to keep the transceiver traces
far enough apart to minimize the coupling effect. For very high-speed traces, it is desirable to keep the
coupling noise to less than 1% of the source signal if possible.

Edge Coupling
Consider two differential pairs routed on the same signal layer as shown in Figure 9 with a height (H)
from the reference plane.

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Table 6: Microstrip NEXT vs. Aggressor Separation


Microstrip routing requires a separation of 6H and 7H to properly manage the crosstalk coupling to less
than 1% for NEXT and FEXT, respectively. However, to achieve 1% of crosstalk coupling using stripline
routing, requires only 5H separation for NEXT and 2H separation for FEXT.
Separation (D) Isolation (dB) Coupled Voltage from a 1-V Aggressor Coupling (%)
(mV)
1H 22 79 7.9
2H 27 45 4.5
3H 31 28 2.8
4H 35 18 1.8
5H 36 16 1.6
6H 41 9 0.09

Table 7: Microstrip FEXT vs. Aggressor Separation


Microstrip routing requires a separation of 6H and 7H to properly manage the crosstalk coupling to less
than 1% for NEXT and FEXT, respectively. However, to achieve 1% of crosstalk coupling using stripline
routing, requires only 5H separation for NEXT and 2H separation for FEXT.
Separation (D) Isolation (dB) Coupled Voltage from a 1-V Aggressor Coupling (%)
(mV)
6H 34 20 2.0
7H 41 9 0.09

Table 8: Stripline NEXT vs. Aggressor Separation


Separation (D) Isolation (dB) Coupled Voltage from a 1-V Aggressor Coupling (%)
(mV)
1H 24 63 6.3
2H 32 25 2.5
3H 36 16 1.5
4H 39 11 1.1
5H 40 10 1.0

Table 9: Stripline FEXT vs. Aggressor Separation


Separation (D) Isolation (dB) Coupled Voltage from a 1-V Coupling (%)
Aggressor (mV)
1H 32 25 2.5
2H 40 10 1.0

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Note: Use stripline routing to avoid FEXT concerns. Use stripline traces with 5H differential pair-to-pair
separation to minimize NEXT to 1%.
Note: If microstrip routing is required, used 6H-7H differential pair-to-pair separation to avoid NEXT
and FEXT issues.

Broadside Coupling
For differential pair traces routed on adjacent signal layers, broadside coupling is much stronger if there is
any overlapping of traces. This problem usually occurs under the congested BGA area where routing is
constrained.
Figure 18: Broadside Coupled Traces

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Simply increasing the vertical separation of broadside coupled traces is not practical because the required
vertical separation (S) would need to be 10H for 1% coupling. This causes board thickness to quickly
become unreasonable. Instead, broadside crosstalk minimization techniques should follow edge coupling
rules by maintaining a 5H horizontal separation (D) between pairs on adjacent layer. For the congested
BGA area, the suggested routing implementation helps to avoid trace overlap.
Figure 19: Broadside Coupling Avoidance

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Figure 20: Suggested Routing Under BGA Area

Transparent Via Design


Unless you are routing all transceiver channels with only microstrip traces on the top layer, you must use
vias in the design to transition layers. Unfortunately, the characteristic impedance of differential vias are
lower than 100 Ω. Generally it is in the range of 80 to 85 Ω. This impedance mismatch causes reflections
that degrade the channel performance. To better match the impedance of the via with the 100 Ω differen‐
tial traces requires optimization techniques that minimize the parasitic capacitance (Cvia) and inductance
(Lvia) of the via.
Tip: You can minimize Cvia using the following optimization techniques:
• Reduce the via capture pad size
• Eliminate all non-functional pads (NFP)
• Increase the via anti-pad size to 40 or 50 mils

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Tip: You can minimize Lvia using the following optimization techniques:
• Eliminate and / or reduce via stubs
• Minimize via barrel length by routing the stripline traces near the top surface layer and applying
backdrilling
For example, consider an 8-layer PCB board that uses standard via with 10-mil drill diameter, 20-mil
capture pad diameter, and 30-mil anti-pad diameter. Optimizing this via by successively applying the
techniques above to minimize Cvia and Lvia improves the impedance of the via, and its insertion and return
loss.
Figure 21: TDR of Standard vs. Optimized Via

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Figure 22: Insertion and Return Loss of Standard vs. Optimized Via

Additional improvements besides minimizing Cvia and Lvia involves providing a better AC return path by
adding a ground via next to each signal via as well as applying backdrilling to remove any left over via stub.
Note: Add ground return vias within 35 mils of each signal via to further improve the insertion and
return losses of the via.

Related Information
Via Optimization Techniques for High-Speed Channel Designs

Blocking Cap Optimization


Transceiver channels often incorporate DC blocking capacitors to control the common mode voltage at
the receiver. However, the presence of the blocking capacitors in the channel creates an abrupt disconti‐
nuity where the trace meets the capacitor. Similar to via optimization, the layout footprint for the blocking
caps can be optimized to minimize their impact on the channel. Because the larger capacitor pad results in
lowering its characteristic impedance, one way of increasing this impedance to better match the trace
impedance is to increase the distance to the reference by making cut-outs underneath the body of the
capacitor footprint.

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Figure 23: DC Blocking Capacitor Plane Cut-out

By cutting out the first reference plane directly below the capacitor, the impedance increases as it
references the second plane further away. However, if this second reference plane is close to the first
reference plane, the increase may still not be enough. In this case it also becomes necessary to cut out the
second, third, or even more successive planes underneath to further increase the impedance.

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Figure 24: Additional Plane Cut-outs Underneath DC Blocking Cap

Normally, determining the proper plane cutout size and the number of layers below the capacitor to cut is
determined by extensive 3-D simulations. However, a formulaic approach based on simulations for
determining this cutout is also possible.
Figure 25: DC Blocking Capacitor Compensation

Wt

Plane1……
..PlaneN

Wc

Where, Wt = Trace width


Wc = Component width
Lc = Component length
Wg DC Blocking Wg = 0.7 x (Wc -Wt)
LpN
Lp1

Capacitor
Lc

Wp1 = Wc +2Wg
Lp1 = Lc +2mil
WpN = Wp1 + 10mil x (N-1)
LpN = Lp1

Wp1
WpN

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1. Cut out any plane underneath the capacitor whose proximity is within 0.75 Wc.
2. Set the side gap of the cut-out for plane 1 (Wg) = 0.7 (Wc – Wt).
3. Set the cut-out width of plane 1 (Wp1) = Wc+2 Wg.
4. Set the cut-out length of plane 1 (Lp1) = Lc+2 mils.
5. Set the cut-out width of successive plane N (WpN) = Wp1 + 10 (N-1).
6. Set the cut-out length of successive plane N (LpN) = Lp1.
The following example compares the time-domain reflectometer (TDR) results of the DC blocking
capacitor layout with and without the plane cutout improvements. With the plane cutouts properly applied
using the above guidelines, the large discontinuity at the trace to DC blocking capacitor junction is
eliminated.
Figure 26: DC Blocking Capacitor Layout with and without Plane Cutouts

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Figure 27: TDR Plot for DC Blocking Capacitor with and without Plane Cutouts

Related Information
Optimizing Impedance Discontinuity Caused by Surface Mount Pads for High-Speed Channel
Designs

Connectors Optimization
Another component commonly found in the path of transceiver channels are backplane connectors and
optical interface modules such as SFP+, XFP, and CFP2 among many others. For these components, the
manufacturer may have specific design recommendations for the best connector performance, and the
designer should follow those recommendations. If no recommendation is provided by the manufacturer,
perform simulations to determine the best layout optimization. However, because most backplane and
optical connector systems use press-fit through-hole via or surface mount pad technology respectively, the
concept for optimization is very similar to that done for transparent via design and DC blocking capacitor
compensation. The impact of impedance mismatch limits performance. For these cases, you can use the
same methodology to optimize both the vias and surface mount pads in the connectors to better match
the connector impedance to the 100-Ω trace impedance.

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Figure 28: Example Backplane Connector Layout

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Figure 29: Example XFP Optical Module Connector Layout

Notice that the via and surface mount pads show evidence of optimization such as increased via anti-pad
size and plane cut-outs underneath the surface mount pads.
Note: Use manufacturer layout recommendations for connectors if available. In the absence of any
specific manufacturer recommendations, designers can apply the transparent via optimization and
DC blocking capacitor compensation technique to connector systems that use through-hole via and
surface mount pad technologies, respectively.

Summary
A typical end-to-end transceiver link is comprised of three main components:
• PCB material
• Stack-up design
• Channel design

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High-speed channel design involves understanding the first-order factors that impact performance in each
one of those components. These first-order factors are:
• Signal attenuation
• Discontinuities and impedance control
• Crosstalk
Some recommended design choices to oppose those effects are summarized below.

PCB Material Selection


• Select the material with the lower loss tangent to reduce signal attenuation from dielectric losses.
• Always choose lower Ɛr with a flat frequency response for best signal performance and to reduce signal
dispersion that adds phase jitter.
• Always choose more densely woven fiberglass style for the core and prepreg material surrounding the
high speed signal layers for more uniform Ɛr that minimizes impedance and signal velocity variations.
• Choose sparsely dense fiberglass styles for power layers and slower general purpose signal layers to
reduce PCB cost.
• Use wider traces and choose rolled copper foils over traditional electrodeposited (ED) copper foils in
the PCB construction to mitigate conductor loss.
• Certain simulation tools may not include loss effects from surface roughness. In these cases, the
correction factor (KSR) must be added to get realistic prediction of the actual loss.

Stackup Design
For the same trace width and copper thickness considerations, stripline results in less signal attenuation
compared with microstrip.

Channel Design
• For high-speed transceiver signals, use trace widths of 6mils or more to minimize conductor loss.
• Limit use of 4-mil trace widths to the BGA breakout area and keep their trace length as short as
possible.
• Loosely coupled traces are easier to route and maintain impedance control but take up more routing
area.
• Tightly coupled traces saves routing space but can be difficult to control impedance.
• Use stripline routing to avoid FEXT concerns.
• Use stripline traces with 5H differential pair-to-pair separation to minimize NEXT to 1%.
• If microstrip routing is required, used 6H-7H differential pair-to-pair separation to avoid NEXT and
FEXT issues.
• Cvia optimization techniques
• Reduce the via capture pad size
• Eliminate all non-functional pads (NFP)
• Increase the via anti-pad size to 40 or 50 mils

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• Lvia optimization techniques:


• Eliminate and / or reduce via stubs
• Minimize via barrel length by routing near the stripline traces near the top surface layer and
applying backdrilling
• Add ground return vias within 35 mils of each signal via to further improve the insertion and return
losses of the via.
• Use manufacturer layout recommendations for connectors if available. In absence of any specific
manufacturer recommendations, designers can apply the transparent via optimization and DC
blocking capacitor compensation.

References
• Base Materials for High Speed, High Frequency PC Boards, Rick Hartley, PCB&A, Mar 2002
• High-Speed Digital Design, Handbook of Black Magic, Howard Johnson & Martin Graham,
Professional Technical Reference, Upper Saddle River, NJ 07458, 1993
• Signal Integrity – Simplified, Dr. Eric Bogatin, Prentice Hall Professional Technical Reference, Upper
Saddle River, NJ 07458, Dec 2006
• A Survey and Tutorial of Dielectric Materials Used In the Manufacture of Printed Circuit Boards, Lee
W. Ritchey, Speeding Edge, Circuitree Magazine, Nov 1999
• High-Speed Digital Systems Design, A Handbook of Interconnect Theory and Design Practices.
Stephen W. Hall, Garrett W. Hall, James A. McCall, New York, John Wiley & Sons, Inc., 2000
• Discussions on Non Functional Pad Removal / Backdrilling and PCB Reliability, Bill Birch, PWB
Interconnect Solutions Inc., 103-235 Stafford Road West, Nepean, Ontario, Canada
• A Practical Method for Modeling PCB Transmission Lines with Conductor Surface Roughness and
Wideband Dielectric Properties, Tao Liang, Stephen Hall, Howard Heck & Gary Brist
• Non-Classical Conductor Losses Due to copper Foil Roughness and Treatment, Gary Brist, Stephen
Hall, Sidney Clouser, & Tao Liang
• CEI-25G-LR and CEI-28G-VSR Multi-Vendor Interoperability Testing White Paper, Optical Internet‐
working Forum, March 2012

Document Revision History for the AN 672: Transceiver Link Design


Guidelines for High-Gbps Data Rate Transmission

Document Changes
Version
2020.01.29 Fixed the formatting and an error in the "Copper Roughness Approximation Equations" in
the Dielectric Constant topic.
2017.05.08 Rebranded as Intel.
2017.02.02 • Changed the KSR equation and added clarification to the Ra note in the Copper Roughness
Approximation Equations figure.
• Clarified the units of measure for WpN in the "DC Blocking Capacitor Compensation"
figure.

2013.02.15 Initial release

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