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M4140 Application Note

This document discusses using the M4100 instrument and M4140 clamp-on current probe to test individual capacitors in a capacitor bank without disconnecting them. Some key advantages noted are that it reduces test time by not requiring disconnecting each capacitor, provides automatic data recording to facilitate analysis, and enhances the usefulness of the M4100 for current users. The test procedure involves applying a voltage source through the M4110 and using the M4100 to measure the voltage and current of each capacitor to determine parameters like power factor and capacitance.

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100% found this document useful (1 vote)
122 views

M4140 Application Note

This document discusses using the M4100 instrument and M4140 clamp-on current probe to test individual capacitors in a capacitor bank without disconnecting them. Some key advantages noted are that it reduces test time by not requiring disconnecting each capacitor, provides automatic data recording to facilitate analysis, and enhances the usefulness of the M4100 for current users. The test procedure involves applying a voltage source through the M4110 and using the M4100 to measure the voltage and current of each capacitor to determine parameters like power factor and capacitance.

Uploaded by

upt vadodara
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
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M4140 Capacitor Bank Testing

Application Note

This application note discusses using the M4100 and the M4140 clamp-on CT probe to
test individual capacitors in a capacitor bank without disconnecting them from the
bank.
For this application, the M4100 serves solely as the measurement instrument. The power
source is the M4110, which provides much higher AC output (up to 25 A). The M4100
monitors the voltage supplied by the M4110 through the red low-voltage (LV) lead. The
M4100 measures the current drawn by the individual capacitor through a clamp-on CT
probe connected to the blue low-voltage lead.
Advantages of using this application of the M4100 to test capacitor banks are:
• Does not require disconnecting each capacitor unit from the bank, reducing test
time.
• Each capacitor unit test takes about one minute to perform.
• Provides more effective troubleshooting of high-voltage AC capacitors than a
low DC voltage capacitance test.
• Test conditions and test data are automatically recorded and saved. This greatly
facilitates data analysis, management, and exchange, and avoids human error.
• A comprehensive bank of test data and conditions (voltage, current, watts loss,
power factor, capacitance, correction factors, temperature, humidity, date and
time) is essential for comparison and trend analysis.
• For M4100 users, this test requires little investment and further enhances the
usefulness of the M4100.
• The M4110 affords extensive control and protection of the external source
voltage.
The capacitor bank test has been used to successfully troubleshoot an intermittent
voltage unbalance and assess the condition of capacitor banks [1, 4]. The test procedure
and interpretation are simple and can be easily implemented in a maintenance program
or used for troubleshooting.
This test cannot detect fluid leaks in early stages that have not affected the capacitor’s
internal condition. Visual inspection is the best technique for this problem.

72A-2703-01 Rev. B 2/08 1


M4140 Capacitor Bank Testing Application Note

Requirements
Hardware:
• M4100 instrument
• M4140 Capacitor Bank Test Kit (clamp-on CT probe and lead)
• M4110 Leakage Reactance Interface
Software:
• M4000 software with M4120 External Reference Module, version 2.1 or later

Test Principle
The M4110 applies an external source voltage to the capacitor bank (Figure 5 through
Figure 8). The M4100 measures the test potential and individual cell current magnitude
and angle (angle reference to the applied voltage). From this data, the software extracts
the electrical parameters (voltage, current, watts, % PF, and capacitance) for each
individual cell and displays it on the External Reference screen of the M4000 software.
The changes in % PF and capacitance indicate the change in condition of the capacitor.
The current of each capacitor Ii is measured through the clamp-on current probe
(Figure 1), which is connected to the M4100 via the blue LV lead (Figure 6). The test
voltage is measured via the red LV lead through the M4110 Red terminal (Figure 6). The
M4100 determines the watts loss, power factor, and capacitance of each tested
capacitor using the measured voltage, current, and phase angle between the voltage and
current, in the same manner as in power factor testing [2].

Figure 1. Clamp-on Current Probe (Rated 600 V) Connected to Blue LV Lead

Capacitor Bank Assembly and Unit Identification


Assembly
A capacitor bank is typically assembled in one of four possible arrangements: simple
parallel group (Figure 2a), multiple parallel groups (Figure 2b), series-parallel groups
(Figure 2c), or serial string groups (Figure 2d). Normally, a capacitor group consists of
four to twenty capacitors mounted in parallel in the same rack. Therefore, they are

2 72A-2703-01 Rev. B 2/08


Unit Identification

subjected to the same voltage. Then the group can be connected to other groups, to
form multiple parallel or series-parallel groups. They can also be connected in a serial
string in different racks, and then the strings are connected together in parallel (Figure 8
through Figure 10 and Figure 2d).

(a) Parallel Group (b) Multiple Parallel Groups (c) Series Parallel Groups (d) Serial String Groups

Figure 2. Capacitor Bank Configuration

Unit Identification
Parallel Group
For a parallel group, we use Xn to identify the group and Xn-m to identify a unit in the
group, where:
X = phase identification (ex. A, B, and C)
n = rack position starting from the line end to neutral for series-parallel groups or
from top to bottom starting from the outside rack for parallel groups
m = unit position in the rack, starting from left to right when facing the capacitor
rack
Serial String
For a serial string, we use Xk-n to identify a string in the group and Xk-n-m to identify a
unit in the string, where:
X = phase identification (ex. A, B, and C)
k = position of the string group
n = string position in the group, starting from the current-transformer side
m = unit position in the string, starting from phase end (top) to neutral end (bottom)
Figure 3 and Figure 4 are examples of capacitor identification for a capacitor bank that
consists of five-series parallel groups.

72A-2703-01 Rev. B 2/08 3


M4140 Capacitor Bank Testing Application Note

A3-1
Rack Position Number Unit Position
1 1 2 ... 14

3
2
A3-14

4
5

Phase C Phase B Phase A

Figure 3. Five Series-Parallel Groups

Unit Position Rack Position Unit Position


Line Terminal Number Number Number
Line Terminal
Rack Position 14 ... 3 2 1
Number 1 1 2 ... 14
1
2 ...
1 2 3 ... 14 3 ...
2 3
4 ...

1 2 3 ... 14 5 ...
5 4
Grounded Neutral
Grounded Neutral Terminal
Terminal
Figure 4. One Phase of the Five Series-Parallel Groups

Test Procedures
WARNING Before attempting to test a capacitor bank, establish a safety procedure that complies
with your policies, standards, and regulations. Isolate, ground, and discharge the
capacitor bank.

Parallel Group
To test a unit in a parallel or series-parallel group: Move the current probe from unit to
unit until the end of the group (Figure 5 and Figure 6). The same process applies to each
group for multiple parallel or series-parallel groups (Figure 7).

4 72A-2703-01 Rev. B 2/08


Serial String

Clamp-on Current Probe


Top Bar
M4110 Ii

Bottom Bar
M4100

Figure 5. Test Principle for a Unit in a Parallel Group

M4110
Top Bar

Bottom Bar
M4100

Sensor PC
Figure 6. Test Connection for a Unit in a Parallel Group

Line
M4110

M4100

Neutral

Figure 7. Test Connection for Multiple Series-Parallel Groups

Serial String
To test an entire serial string: Move the current probe from one string to the next until
the end of the group (Figure 8). The same process applies to each string in the group.
To test a unit in a serial string: Move the Voltage Sense lead from unit to unit until the
end of the string (Figure 9 and Figure 10).

72A-2703-01 Rev. B 2/08 5


M4140 Capacitor Bank Testing Application Note

Common Phase Bar


Source Lead

Voltage Lead

Current Lead
Clamp-on Is
M4100 Probe
M4110

Source Lead VT
Common Neutral Bar
Figure 8. Test Principle for an Entire Serial String

Common Phase Bar


Source Lead

Voltage Lead
Vi
Current Lead
Is
Clamp-on
M4100 Probe
M4110 To Other
Groups
Source Lead VT
Common Neutral Bar
Figure 9. Test Principle for a Unit in a Serial String

Source Lead Common Phase Bar

M4110

Voltage Lead Vi

M4100

Current Lead
Is

Sensor PC
VT
Common Neutral Bar
Figure 10. Test Connection for a Unit in a Serial String

6 72A-2703-01 Rev. B 2/08


Table 1 summarizes the test procedures.

Table 1 summarizes the test procedures.


Table 1. Capacitor Bank Test Procedures Using the M4110

Test
M4110 Connections M4100 Connections Description

Blue LV Lead –
Test Voltage Sense Lead Red Lead Black Lead Mode Red LV Lead Current Probe

1 Black to Black Lead Cap. Group Cap. Group UST-B M4110 Red Cap. Unit Fig.1B
White to Red Lead Top Bottom Terminal Bushing and 4

Repeat Test 1 on each unit in the group by moving only the current probe. Repeat the process for each
parallel group in the capacitor bank. The current probe polarity must agree with the current circulation or
source polarity. If the M4110 main breaker trips when the safety switch is depressed, remove the ground on
the capacitor bank neutral.

2 Across the capacitor Cap. String Cap. String UST-B M4110 Red Cap. Unit Fig. 2C
unit Bottom Top Terminal Bushing

Repeat Test 2 on each unit in the string by moving only the Voltage Sense lead. Repeat the process for each
parallel string in the capacitor bank. The current probe and VS lead polarity must agree with the current
circulation or source polarity. The black VS leads are across the capacitor unit under test, with the black lead
closer to the black source lead and the white lead closer to the red source lead.

Using the External Reference Screen


M4000 software is necessary for these tests. This software has an External Reference
screen (Figure 11) similar to the Clipboard screen. Use the following settings:
• External Cap./Res. provides a choice of two coupling devices: capacitor (pF) or
resistor (ohms). Select Ohms, with 72000 as the default value, when using the
M4110. The pF option is only for using an external coupling capacitor.
• Cap./Res. %PF Value allows you to enter a correction factor for coupling
capacitor loss. Use the direct-measured % PF when using a coupling capacitor,
and leave the field blank when using the M4110.
• Max. Voltage should be ≤ 0.6kV.
• Current Atten. is the (attenuation or ratio of the current probe. Use 1000 in this
column for the Doble current probe.
• Corr. Fctr. is the correction factor for the measured power factor. Use -1 in this
column for the Doble current probe.
The information in the first four items above is essential for the measurement; these
fields must be properly filled out before beginning to test. It is also a good idea to
include as much nameplate and Test Condition information as possible, for future
reference and test data analysis. You can enter additional information in the Sheet Note
at the bottom of the screen.

72A-2703-01 Rev. B 2/08 7


M4140 Capacitor Bank Testing Application Note

Figure 11. Test Plan Template

Creating a Test Plan


It is advisable to create a test plan before going to the field, using nameplate information
and a drawing of the capacitor unit and bank.
Two test-plan templates are provided: CapBank_Template2.m4k and
CapBank_Template5.m4k, for capacitor banks with two and five racks per phase,
respectively, and fourteen capacitors in each rack.
You can modify these templates for other capacitor banks with different arrangements.
To add a test line, press Ctrl + Ins or select Tools > Insert A Test Line. To delete a test line,
press Ctrl + Del or select Tools > Remove An Empty Test Line.
Other test templates are available on request by contacting a Doble Client Service
engineer.

8 72A-2703-01 Rev. B 2/08


Running a Test

Running a Test
1. Place the cursor on the desired starting test line.
2. Press F2, click the Single Test (lightning bolt) icon, or select Test > Run The Tests.
The External Reference Test dialog box appears (Figure 12).

Figure 12. External Reference Test Dialog Box

Only the NORMAL test needs to be performed.


3. Click Run The Test.
The first time you run a test, a message appears (Figure 13), indicating that the
instrument is measuring and recording the line frequency.

Figure 13. M4000 Communications Dialog Box

4. The Test-In-Progress dialog box appears (Figure 14), with the message SET TEST
VOLTAGE for LINE (x), where (x) is the selected line number.

72A-2703-01 Rev. B 2/08 9


M4140 Capacitor Bank Testing Application Note

Figure 14. Test-in-Progress Dialog Box

5. If this is the first test in the capacitor group, use the M4110 voltage knob to
adjust the test voltage to the desired level (240 V), displayed in the voltage
ramping bar.
If this is a subsequent test in the group, go to step 6.
6. When you are ready to take the measurement, press F3.
The message DO NOT CHANGE VOLTAGE – COLLECTING DATA appears.
7. When the message TEST DONE, LINE (x) appears, press one of the function keys
indicated at the bottom of the screen to continue. These options are also
available from the toolbar and menus.
• F1. Opens the Help window.
• F2/F11. F2 restarts a single test; F11 restarts a multiple test.
• F5. Accepts the results of the test. When performing multiple tests, only
those completed before a stopped test are accepted.
• F6. Discards the results.
• F7. Prints the results.
• F8. Saves the results.

NOTE Capacitance in the Test Results column of Figure 12 or Figure 14 becomes Inductance
when the current probe or Voltage Sense lead polarity does not agree with the source
polarity. Reverse the current probe or VS lead to correct the polarity. Abnormally low
capacitance can also be caused by current-probe jaws that are not fully closed.

10 72A-2703-01 Rev. B 2/08


Test Voltage

8. Click Next to test the next unit.


9. Repeat steps 3 through 8 until the end of the group.
10. Click Done.
11. Return the M4110 voltage knob to the zero position.
To test another group or rack, change the test connection and repeat the above
procedure. The M4110 voltage knob must be reset to zero to initiate another
test. See [2] and [3] for more detailed instructions on M4110 operation.

Test Voltage
The test voltage should not exceed 600 V, due to the rated voltage of the leads and
current probe. The total test current is limited to the rated current of the test source.
In general, the total test current (I) is a function of the test voltage (V), frequency (f), and
total capacitance (C) of the capacitor group under test. Equations 1 and 2 permit
calculating the test current and capacitance of the group under test.

I = 2πfCV (1)

where:
I = total test current
f = test frequency
C = total capacitance
V = test voltage
and

N
C = ∑ Ci (2)
i=1

where:
N = the unit number in the capacitor group
Ci = the capacitance of the unit capacitor
For a 60 Hz system, the preferred test voltage is 240 V. If the total capacitance of the
capacitor group under test is too large, causing the protective devices to operate, reduce
the test voltage to 120 V. For a 50 Hz system, you can use Equation 1 and the above
general guideline. Table 2 shows the summary.

72A-2703-01 Rev. B 2/08 11


M4140 Capacitor Bank Testing Application Note

Table 2. Recommended Test Voltage for Capacitor Banks

60 Hz System 50 Hz System

Test Total Group Test Total Group


Voltage (V) Capacitance (µF) Voltage (V) Capacitance (µF)

240 < 221 = 600 < 3183 * I / V

120 ≥ 221

If the test current still exceeds the rated current of the source due to the size
of the capacitance of the group capacitor, the test voltage can be reduced.

Test Data Interpretation


• Power Factor. The power-factor test is the most effective known field test
procedure for the early detection of contamination, tracking, partial discharge,
and deterioration.
• Capacitance. Short-circuited condenser layers or sections of capacitor result in
increased capacitance and charging current. Conversely, a decreased
capacitance and charging current indicate condenser layer discontinuity, or
delamination due to missing fluid. A capacitance change is a good indication of
internal damage or deformation.
In general, capacitance should be within ±5% of the nameplate value, and power factor
should be 3% or less. These limits should be used in conjunction with historical data
analysis, comparison with test results on similar units, and the manufacturer’s
recommendations. Always consider test conditions in any comparison study, since the
capacitance and % PF can vary with temperature and humidity.
The External Reference software requires manually reviewing the test data. The author
recommends performing this analysis task graphically in a spreadsheet program (Excel),
by exporting the data electronically.

References
[1] Long Pong, “Field Testing Capacitor Banks with M4000 Test Instrument,” Minutes of
the 73nd Annual International Conference of Doble Clients, 2006, in Arresters,
Capacitors, Cables and Accessories Committee paper ACCA 7.
[2] Doble Engineering Company, M4000 Insulation Analyzer User Guide, PN 500-0110.
[3] Doble Engineering Company, M4110 Leakage Reactance Interface User Guide, PN
500-0396.
[4] Long Pong, “Update – Field Testing Capacitor Bank with M4000 Test Instrument,”
Minutes of the 74th Annual International Conference of Doble Clients, 2007, in
Arresters, Capacitors, Cables and Accessories Committee paper ACCA 3.

12 72A-2703-01 Rev. B 2/08

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