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Tutorial (Problem Session) : Dr. Gargi Raina VIT Chennai

The document discusses the temperature dependence of carrier concentrations in semiconductors. It explains that the intrinsic carrier concentration (ni) increases with temperature and is proportional to T3/2 and e1/T. However, the bandgap (Eg) also decreases with increasing temperature. The carrier concentrations n0 and p0 change with ni and temperature. Examples are provided to illustrate how n0 remains constant with temperature until ni becomes comparable to the doping concentration Nd. The maximum operable temperature range is determined by when ni >> Nd and the material loses its extrinsic property. Problems are included to calculate n0, EF, ni at given temperatures and doping concentrations.
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0% found this document useful (0 votes)
35 views11 pages

Tutorial (Problem Session) : Dr. Gargi Raina VIT Chennai

The document discusses the temperature dependence of carrier concentrations in semiconductors. It explains that the intrinsic carrier concentration (ni) increases with temperature and is proportional to T3/2 and e1/T. However, the bandgap (Eg) also decreases with increasing temperature. The carrier concentrations n0 and p0 change with ni and temperature. Examples are provided to illustrate how n0 remains constant with temperature until ni becomes comparable to the doping concentration Nd. The maximum operable temperature range is determined by when ni >> Nd and the material loses its extrinsic property. Problems are included to calculate n0, EF, ni at given temperatures and doping concentrations.
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© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Tutorial (Problem

Session)
Lecture 1.5

Dr. Gargi Raina VIT Chennai


Temperature Dependence of Carrier Concentrations
• The intrinsic carrier concentration has a
strong temperature dependence, given by

• Thus, explicitly, ni is proportional to T3/2 and to


e 1/T, however, Eg also has a temperature
dependence (decreasing with increasing
temperature, since the interatomic spacing
changes with temperature).

The intrinsic carrier concentration as a


function of inverse temperature for Si, Ge,
and GaAs

Dr. Gargi Raina VIT Chennai


• As ni changes with temperature, so do n0 and p0 .

• With ni and T given, the unknowns are the carrier concentrations and the Fermi
level position with respect to Ei one of these quantities must be given in order to
calculate the other.

• Example: Si doped with 10 15 /cm3 donors (Nd).

• At very low temperature, negligible intrinsic EHPs exist, and all the donor electrons
are bound to the donor atoms.

• As temperature is raised, these electrons are gradually donated to the conduction


band, and at about 100 K (1000/T = 10), almost all these electrons are donated 
this temperature range is called the ionization region.

Dr. Gargi Raina VIT Chennai


Temperature dependence for n0 in doped Si
Once all the donor atoms are ionized, the electron concentration n0 
Nd , since for each donor atom, one electron is obtained.

Carrier concentration vs.


inverse temperature for Si
doped with 1015 donors/cm3

• Thus, n0 remains virtually constant with temperature for a wide range of temperature
(called the extrinsic region), until the intrinsic carrier concentration ni starts to become
comparable to Nd .

• For high temperatures, ni >> Nd , and the material loses its extrinsic property (called the
intrinsic region).

• Note: in the intrinsic region, the device loses its usefulness => determines the maximum
operable temperature range. Dr. Gargi Raina VIT Chennai
Problems

Dr. Gargi Raina VIT Chennai


Problem
A Si sample is doped with 1016 B atoms/cm3. What is the equilibrium electron
concentration n0 at 300K? Where is EF relative to Ei? Assume ni for Si at 300 K =
1.5 x 1010 /cm3.

Dr. Gargi Raina VIT Chennai


Solution

Dr. Gargi Raina VIT Chennai


Problem
An unknown semiconductor has Eg = 1.1 eV and Nc = Nv. It is doped with 1015cm-3
donors, where the donor level is 0.2 eV below Ec. Given that is EF is 0.25 eV below
Ec, calculate ni and the concentration of electrons and holes in the semiconductor at
300 K.

Dr. Gargi Raina VIT Chennai


Solution

Dr. Gargi Raina VIT Chennai


Dr. Gargi Raina VIT Chennai
References

1. Ben G. Streetman and S. Banerjee, “Solid State Electronic


Devices”, Prentice Hall, Sixth edition, 2015

2. NPTEL COURSE on ‘SEMICONDUCTOR DEVICES”- IIT- Delhi

http://nptel.ac.in/courses/Webcourse-contents/IIT-
Delhi/Semiconductor%20Devices/index.htm

Dr. Gargi Raina VIT Chennai

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