Artisan: Definitive
Artisan: Definitive
- ~ ARTISAN®
~I TECHNOLOGY GROUP
with experienced engineers and technicians on staff.
FISCHERSCOPE® X-RAY to measure coating Microhardness testing system POROSCOPE® HV20 to test for pores and pinholes
thickness using the X-Ray fluorescence method. FISCHERSCOPE® H100C. in nonconductive coatings.
The high quality standard of FISCHER FISCHER is a reliable and competent Today, FISCHER instruments are used
instruments is the result of our efforts to partner, offering expert advice, extensive successfully in all technological fields of
provide the very best instrumentation to service, and training seminars. industry and research.
our customers.
Helmut Fischer GmbH+Co.KG Fischer Instrumentation (G.B.) Ltd. Fischer Technology, Inc.
71069 Sindelfingen, Germany Lymington/Hampshire SO41 8JD, England Windsor, Ct. 06095, USA
Tel. (+49) 70 31 303-0, Fax (+49) 70 31 303-79 Tel. (+44) 1590-683663, Fax (+44) 1590-684110 Tel. 860 683-0781, Fax 860 688-8496
Internet: http://www.Helmut-Fischer.com Internet: http://www.fischergb.co.uk Internet: http://www.fischer-technology.com
Sole Agent for Helmut Fischer GmbH+Co.KG, Germany: Fischer Instruments, S.A. Fischer Instrumentation (S) Pte Ltd.
08018 Barcelona, Spain Singapore 118529, Singapore
Helmut Fischer Elektronik und Messtechnik AG Tel. (+34) 93 309 79 16, Fax (+34) 93 485 05 94 Tel. (+65) 276 67 76, Fax (+65) 276 76 67
CH-6331 Hünenberg, Switzerland E-Mail: [email protected] E-Mail: [email protected]
Tel. (+41) 41 785 08 00, Fax (+41) 41 785 08 01
E-Mail: [email protected] Helmut Fischer Meettechniek B.V. Nantong Fischer Instrumentation Ltd.
5627 GB Eindhoven, The Netherlands Shanghai 200437, P.R.C., China
Tel. (+31) 40 248 22 55, Fax (+31) 40 242 88 85 Tel. (+86) 21 6555 7455, Fax (+86) 21 6555 2441
Branch Offices of Helmut Fischer AG, Switzerland: E-Mail: [email protected]
E-Mail: [email protected]
Fischer Instrumentation Electronique Fischer Instruments K.K.
78180 Montigny le Bretonneux, France Saitama-ken 340, Japan
Tel. (+33) (0) 1 30 58 00 58, Fax (+33) (0) 1 30 58 89 50 Tel. (+81) 489 32 3621, Fax (+81) 489 32 3618
E-Mail: [email protected] E-Mail: [email protected]
Helmut Fischer S.R.L., Tecnica di Misura Fischer Instrumentation (Far East) Ltd. ISO 9001
20128 Milano, Italy Kwai Chung, N.T., Hong Kong SQS Registration
01/01
Tel. (+39) 02 255 26 26, Fax (+39) 02 257 00 39 Tel. (+852) 24 20 11 00, Fax (+852) 24 87 02 18 No. 11899
E-Mail: [email protected] E-Mail: [email protected] Valid for Helmut Fischer AG and Branch Offices
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Measuring Methods and Processing Measuring Signals Technical Data and Selection of Probes
This technical information material introduces standard mag- probes to measure coating thickness. The fundamental, phy- Tables for the selection of probes
netic probes, magnetic induction probes and eddy current sical principles are explained below. The solution for many different coating thickness measurements The following tables provide an overview of all standard probes.
with the magnetic, magnetic induction or eddy current method The technical data and values shown should facilitate selection of
depends upon the selection of the „correct“ probe. Often the the probe best suited for your specific application. Explanations
permanent magnet probe soft iron core low frequency probe ferrite core high frequency measurement accuracy and measurement precision can be opti- are listed below.
alternating alternating
magnetic field magnetic field mized by using a more suitable probe.
exciting current
N I~ exciting current
I~
Explanation to the Technical Data
measurement signal
measurement U = f(d)
signal Hall measurement signal
U = f(Th) effect U = f(d) Measurement Range The measurement uncertainly of a group ment uncertainty is not stated.
S sensor
The measurement range of the probe spe- mean measurement is then calculated
Nickel thickness Th
coating thickness Th
cifies the limits of the coating thickness that according to DIN 1319 section 3 as The values of u s and u z are listed in the
can be measured. follows: following tables as either absolute values
t .s (for example: 1 µm) or as relative values
Measurement Accuracy
non-conducting
non-ferrous } substrate Wirbelströme uz =
√n referring to the measurement value (for
iron/steel substrate (DIN 55350 section 13, paragraph 2.1.1)
coating thickness Th example: 0.5 %).
The measurement accuracy has been
non-ferrous substrate
determined with plastic foils of specific For group size n=10 a student’s t value of
2.5 applies. The values listed represent the optimum
Magnetic Method Magnetic Induction Method Eddy Current Method thickness. The specified value u s cor-
values which have been determined with
A permanent magnet produces a con- The energizing alternating current pro- The energizing current produces a high responds to the measured systematic de-
Comments FISCHER standards. In many cases
tinuous magnetic field (DIN EN ISO 2178) duces a low frequency magnetic field (DIN frequency magnetic field (DIN EN ISO 2360) viation (bias) between the measured thick-
The most important quality attributes of a marginal values may be obtained due to
the strength of which depends upon the EN ISO 2178) the strength of which de- which induces eddy currents in the sub- ness value and true thickness value of the
measurement method are mainly measure- less than ideal surface conditions.
thickness of the coating to be measured pends upon the distance between the strate material (or in the coating material to calibration foil.
ment accuracy, measurement precision FISCHER cannot be held accountable for
(Ni/Fe), or the distance between probe probe and the substrate. The magnetic flux be measured with the modified test method). Example: 50 - 1000 µm: 0.5%
∆u and measurement uncertainty. marginal values obtained from rough
and substrate (NF/Fe). The strength of the density is measured by means of a pickup The magnitude of the induced eddy currents s surfaces.
The measurement uncertainty u (DIN 55350
magnetic field is measured with an appro- coil. The induced measurement signal ob- depends upon the distance (coating thick- This parameter is a quality indicator show-
section 13, par 4.1) is calculated from
priate sensor and the coating thickness is tained is converted into the coating thick- ness) between probe and substrate. The ing how good the measurement signal from
u z and u s according to:
log d normalized probe signal Test Specimen Geometry Measurement point The limit value D indicates the substrate
Probe
For the above mentioned measurement convex curvature thickness below which the measurement
methods the geometry of the measurement diameter value deviates more than 10% from an
area influences the measurement value. “infinitely“ thick base metal.
The following tables list two values for each ø
log d(X n1) hyper- Coating
geometry dependent factor (except for The limiting values have been determined
linear bolic substrate thickness). with a foil thickness, which produces a
measurement measure-
range
reading which is approximately in the
ment ø
logarithmic The upper value indicates the smallest dia- concave curvature center of the probe measuring range.
range
measurement meter of the object that can be measured, diameter
range for which the curvature dependent mea- With increasing measured thickness the
surement bias will not exceed 10% of the 10% bias error is obtained with smaller
0 X n1 1 Xn Specimen
true value. Calibration was performed on curvature diameters, and respectively
a flat surface of “infinite” area using the smaller substrate thicknesses.
Normalization of the probe signal is per- X : probe signal from the measured coa- The characteristic probe output function is
same substrate material.
formed as follows: ting thickness d. stored in the memory chip of the probe diameter of the
– Xo
X The normalized signal X n therefore is only connector and thus the probe contains all test area
Xn = The lower value indicates the limiting dia- ø
able to assume values between 0 and 1. information required for the measurement.
Xs – Xo meter at which if exceeded a measurement
The operator simply recalls the measure-
The variables are: X n is then converted over the characteristic is no longer possible due to the geometry
ment application; the system is ready to
X o : probe signal from the uncoated sub- probe output function into the measured of the probe (for example: the probe tip no
measure immediately. Measurements
strate coating thickness value d. longer contacts the surface), or at which
performed at intermittent time intervals
the measurement signal is too small due to
X s : probe signal from infinitely thick coa- therefore always start with the same refe- D substrate thickness D
insufficient material volume.
ting (saturation thickness) rence value.
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®
Measuring Methods and Processing Measuring Signals Technical Data and Selection of Probes
This technical information material introduces standard mag- probes to measure coating thickness. The fundamental, phy- Tables for the selection of probes
netic probes, magnetic induction probes and eddy current sical principles are explained below. The solution for many different coating thickness measurements The following tables provide an overview of all standard probes.
with the magnetic, magnetic induction or eddy current method The technical data and values shown should facilitate selection of
depends upon the selection of the „correct“ probe. Often the the probe best suited for your specific application. Explanations
permanent magnet probe soft iron core low frequency probe ferrite core high frequency measurement accuracy and measurement precision can be opti- are listed below.
alternating alternating
magnetic field magnetic field mized by using a more suitable probe.
exciting current
N I~ exciting current
I~
Explanation to the Technical Data
measurement signal
measurement U = f(d)
signal Hall measurement signal
U = f(Th) effect U = f(d) Measurement Range The measurement uncertainly of a group ment uncertainty is not stated.
S sensor
The measurement range of the probe spe- mean measurement is then calculated
Nickel thickness Th
coating thickness Th
cifies the limits of the coating thickness that according to DIN 1319 section 3 as The values of u s and u z are listed in the
can be measured. follows: following tables as either absolute values
t .s (for example: 1 µm) or as relative values
Measurement Accuracy
non-conducting
non-ferrous } substrate Wirbelströme uz =
√n referring to the measurement value (for
iron/steel substrate (DIN 55350 section 13, paragraph 2.1.1)
coating thickness Th example: 0.5 %).
The measurement accuracy has been
non-ferrous substrate
determined with plastic foils of specific For group size n=10 a student’s t value of
2.5 applies. The values listed represent the optimum
Magnetic Method Magnetic Induction Method Eddy Current Method thickness. The specified value u s cor-
values which have been determined with
A permanent magnet produces a con- The energizing alternating current pro- The energizing current produces a high responds to the measured systematic de-
Comments FISCHER standards. In many cases
tinuous magnetic field (DIN EN ISO 2178) duces a low frequency magnetic field (DIN frequency magnetic field (DIN EN ISO 2360) viation (bias) between the measured thick-
The most important quality attributes of a marginal values may be obtained due to
the strength of which depends upon the EN ISO 2178) the strength of which de- which induces eddy currents in the sub- ness value and true thickness value of the
measurement method are mainly measure- less than ideal surface conditions.
thickness of the coating to be measured pends upon the distance between the strate material (or in the coating material to calibration foil.
ment accuracy, measurement precision FISCHER cannot be held accountable for
(Ni/Fe), or the distance between probe probe and the substrate. The magnetic flux be measured with the modified test method). Example: 50 - 1000 µm: 0.5%
∆u and measurement uncertainty. marginal values obtained from rough
and substrate (NF/Fe). The strength of the density is measured by means of a pickup The magnitude of the induced eddy currents s surfaces.
The measurement uncertainty u (DIN 55350
magnetic field is measured with an appro- coil. The induced measurement signal ob- depends upon the distance (coating thick- This parameter is a quality indicator show-
section 13, par 4.1) is calculated from
priate sensor and the coating thickness is tained is converted into the coating thick- ness) between probe and substrate. The ing how good the measurement signal from
u z and u s according to:
log d normalized probe signal Test Specimen Geometry Measurement point The limit value D indicates the substrate
Probe
For the above mentioned measurement convex curvature thickness below which the measurement
methods the geometry of the measurement diameter value deviates more than 10% from an
area influences the measurement value. “infinitely“ thick base metal.
The following tables list two values for each ø
log d(X n1) hyper- Coating
geometry dependent factor (except for The limiting values have been determined
linear bolic substrate thickness). with a foil thickness, which produces a
measurement measure-
range
reading which is approximately in the
ment ø
logarithmic The upper value indicates the smallest dia- concave curvature center of the probe measuring range.
range
measurement meter of the object that can be measured, diameter
range for which the curvature dependent mea- With increasing measured thickness the
surement bias will not exceed 10% of the 10% bias error is obtained with smaller
0 X n1 1 Xn Specimen
true value. Calibration was performed on curvature diameters, and respectively
a flat surface of “infinite” area using the smaller substrate thicknesses.
Normalization of the probe signal is per- X : probe signal from the measured coa- The characteristic probe output function is
same substrate material.
formed as follows: ting thickness d. stored in the memory chip of the probe diameter of the
– Xo
X The normalized signal X n therefore is only connector and thus the probe contains all test area
Xn = The lower value indicates the limiting dia- ø
able to assume values between 0 and 1. information required for the measurement.
Xs – Xo meter at which if exceeded a measurement
The operator simply recalls the measure-
The variables are: X n is then converted over the characteristic is no longer possible due to the geometry
ment application; the system is ready to
X o : probe signal from the uncoated sub- probe output function into the measured of the probe (for example: the probe tip no
measure immediately. Measurements
strate coating thickness value d. longer contacts the surface), or at which
performed at intermittent time intervals
the measurement signal is too small due to
X s : probe signal from infinitely thick coa- therefore always start with the same refe- D substrate thickness D
insufficient material volume.
ting (saturation thickness) rence value.
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Characteristic values and technical data of probes for the magnetic induction measurement method
EGAW1.3 0-50 µm : 0.25 µm ø : 14 mm (550 mils) ø : 8 mm (320 mils) 0.75 mm (30 mils) 23 mm (0.9“) Single tip right angle probe with spring-loaded measuring system.
50-1000 µm : 0.5 % Measures nonferrous- and nonmetal coatings on steel or iron
602-119 min. ø : 1 mm (40 mils) min. ø : 2 mm (80 mils) substrate (NF, Iso/Fe). Especially well suited for coating thick-
1000-1500 µm : < 2.5 %
Heat treated steel 14 mm (0.6“) nesses of ≤ 10 µm (0.4 mil) in pipes, bore holes, recesses, etc.
The probe tip is subject to wear on hard and abrasive surfaces.
0-1500 µm 0-50 µm : 0.1 µm ø : 36 mm (1.4“) The EGAWB1.3 probe should be used for coating thicknesses
D : 0.2 mm (8 mils) yes 72 mm (2.8“)
0-60 mils 50-1500 µm : 0.2 % min. ø : 18 mm (700 mils) > 100 µm (4 mils).
EGAB1.3 601-793 Axial single tip probe with spring-loaded measuring system. Mea-
0-100 µm : 0.5 µm ø : 18 mm (700 mils) ø : 8 mm (320 mils) 0.75 mm (30 mils) --- sures nonferrous- and nonmetal coatings on steel or iron substrate
EGAB1.3.L 602-794 100-1000 µm : 0.5 % min. ø : 2 mm (80 mils) min. ø : 2 mm (80 mils) (NF, Iso/Fe). Most commonly used probe for electroplated metal
EGAB1.3.T 602-359 1000-2000 µm : < 3 % and organic coatings. For the measurement of nonferrous metal
PVD coated 10 mm (0.4“) coatings on steel or iron. Scatter of the measuring values on rough
(for example: grit blasted) surfaces is however relatively high.
0-2000 µm 0-50 µm : 0.1 µm ø : 35 mm (1.4“) Double pole probes should be used in such instances if the geo-
D : 0.2 mm (8 mils) yes 110 mm (4.3“
0-80 mils 50-2000 µm : 0.2 % min. ø : 10 mm (400 mils) metry of the parts permits the use of this type of probe.
0-100 µm : 0.5 µm Single tip right angle probe with spring-loaded measuring system.
EGABW1.3 601-964 ø : 16 mm (640 mils) ø : 8 mm (320 mils) 0.75 mm (30 mils) 23 mm (0.9“) Measures nonferrous- and nonmetal coatings on steel or iron
100-1000 µm : 0.5 % substrate (NF, Iso/Fe). Most commonly used probe for electro-
EGABW1.3.L 602-925 min. ø : 1 mm (40 mils) min. ø : 2 mm (80 mils)
1000-2000 µm : < 3 % plated metal and organic coatings in pipes, bore holes, recesses,
PVD coated 14 mm (0.6“) etc. Scatter of the measuring values on rough (for example: grit
0-2000 µm ø : 35 mm (1.4“) blasted) surfaces is however relatively high. Double pole probes
0-50 µm : 0.1 µm
D : 0.2 mm (8 mils) 72 mm (2.8“) should be used in such instances if the geometry of the parts
0-80 mils 50-2000 µm : 0.2 % min. ø : 18 mm (720 mils) yes
permits the use of this type of probe.
Single tip probe for inside measurement applications with fixed mea-
V1EGA1HR34 602-109 0-50 µm : 0.5 µm ø : 18 mm (700 mils) ø : 6 mm (240 mils) 0.8 mm (32 mils) 4.3 mm (0.17“) surement system. Measures nonferrous- and nonmetal coatings on
V1EGA1HR34L 602-367 50-1000 µm : 1 % min. ø : 2 mm (80 mils) min. ø : 2 mm (80 mils) steel or iron substrate (NF, Iso/Fe). Suitable for measurements in
bore holes, pipes or grooves. To obtain the smallest possible mea-
Tungsten carbide 4 mm (0.16“) surement uncertainty, externally triggered measurement acquisition
0-1000 µm 0-100 µm : 0.2 µm ø : 35 mm (1.4“) should be used when measuring small inside diameters to prevent
D : 0.2 mm (8 mils) no 120 mm (4.7“) measurement errors. Smallest permissible inside diameter: 7 mm
0-40 mils 100-1000 µm : 0.2 % min. ø : 7 mm (280 mils)
(0.28“). Maximum insertion depth: 60 mm (2.4“).
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Characteristic values and technical data of probes for the magnetic induction measurement method
EGAW1.3 0-50 µm : 0.25 µm ø : 14 mm (550 mils) ø : 8 mm (320 mils) 0.75 mm (30 mils) 23 mm (0.9“) Single tip right angle probe with spring-loaded measuring system.
50-1000 µm : 0.5 % Measures nonferrous- and nonmetal coatings on steel or iron
602-119 min. ø : 1 mm (40 mils) min. ø : 2 mm (80 mils) substrate (NF, Iso/Fe). Especially well suited for coating thick-
1000-1500 µm : < 2.5 %
Heat treated steel 14 mm (0.6“) nesses of ≤ 10 µm (0.4 mil) in pipes, bore holes, recesses, etc.
The probe tip is subject to wear on hard and abrasive surfaces.
0-1500 µm 0-50 µm : 0.1 µm ø : 36 mm (1.4“) The EGAWB1.3 probe should be used for coating thicknesses
D : 0.2 mm (8 mils) yes 72 mm (2.8“)
0-60 mils 50-1500 µm : 0.2 % min. ø : 18 mm (700 mils) > 100 µm (4 mils).
EGAB1.3 601-793 Axial single tip probe with spring-loaded measuring system. Mea-
0-100 µm : 0.5 µm ø : 18 mm (700 mils) ø : 8 mm (320 mils) 0.75 mm (30 mils) --- sures nonferrous- and nonmetal coatings on steel or iron substrate
EGAB1.3.L 602-794 100-1000 µm : 0.5 % min. ø : 2 mm (80 mils) min. ø : 2 mm (80 mils) (NF, Iso/Fe). Most commonly used probe for electroplated metal
EGAB1.3.T 602-359 1000-2000 µm : < 3 % and organic coatings. For the measurement of nonferrous metal
PVD coated 10 mm (0.4“) coatings on steel or iron. Scatter of the measuring values on rough
(for example: grit blasted) surfaces is however relatively high.
0-2000 µm 0-50 µm : 0.1 µm ø : 35 mm (1.4“) Double pole probes should be used in such instances if the geo-
D : 0.2 mm (8 mils) yes 110 mm (4.3“
0-80 mils 50-2000 µm : 0.2 % min. ø : 10 mm (400 mils) metry of the parts permits the use of this type of probe.
0-100 µm : 0.5 µm Single tip right angle probe with spring-loaded measuring system.
EGABW1.3 601-964 ø : 16 mm (640 mils) ø : 8 mm (320 mils) 0.75 mm (30 mils) 23 mm (0.9“) Measures nonferrous- and nonmetal coatings on steel or iron
100-1000 µm : 0.5 % substrate (NF, Iso/Fe). Most commonly used probe for electro-
EGABW1.3.L 602-925 min. ø : 1 mm (40 mils) min. ø : 2 mm (80 mils)
1000-2000 µm : < 3 % plated metal and organic coatings in pipes, bore holes, recesses,
PVD coated 14 mm (0.6“) etc. Scatter of the measuring values on rough (for example: grit
0-2000 µm ø : 35 mm (1.4“) blasted) surfaces is however relatively high. Double pole probes
0-50 µm : 0.1 µm
D : 0.2 mm (8 mils) 72 mm (2.8“) should be used in such instances if the geometry of the parts
0-80 mils 50-2000 µm : 0.2 % min. ø : 18 mm (720 mils) yes
permits the use of this type of probe.
Single tip probe for inside measurement applications with fixed mea-
V1EGA1HR34 602-109 0-50 µm : 0.5 µm ø : 18 mm (700 mils) ø : 6 mm (240 mils) 0.8 mm (32 mils) 4.3 mm (0.17“) surement system. Measures nonferrous- and nonmetal coatings on
V1EGA1HR34L 602-367 50-1000 µm : 1 % min. ø : 2 mm (80 mils) min. ø : 2 mm (80 mils) steel or iron substrate (NF, Iso/Fe). Suitable for measurements in
bore holes, pipes or grooves. To obtain the smallest possible mea-
Tungsten carbide 4 mm (0.16“) surement uncertainty, externally triggered measurement acquisition
0-1000 µm 0-100 µm : 0.2 µm ø : 35 mm (1.4“) should be used when measuring small inside diameters to prevent
D : 0.2 mm (8 mils) no 120 mm (4.7“) measurement errors. Smallest permissible inside diameter: 7 mm
0-40 mils 100-1000 µm : 0.2 % min. ø : 7 mm (280 mils)
(0.28“). Maximum insertion depth: 60 mm (2.4“).
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Characteristic values and technical data of probes for the magnetic induction measurement method
EKB4 0-100 µm : 0.5 µm ø : 20 mm (800 mils) ø : 30 mm (1.2“) 1.25 mm (49 mils) 21 mm (0.8“)
Double pole probe for angular measurements with fixed mea-
602-108 100-2000 µm : 0.5 % min. ø : 2 mm (80 mils) min. ø : 15 mm (590 mils) surement system. Measures nonferrous- and nonmetal coatings
PVD coated 12 mm (0.5“) on steel or iron substrate (NF, Iso/Fe). Well suited for thin coatings.
Higher measurement precision on rough surfaces than single
0-2000 µm 0-50 µm : 0.15 µm ø : 38 mm (1.5“) pole probes.
D : 0.4 mm (16 mils) yes 18 mm (0.7“)
0-80 mils 50-2000 µm : 0.3 % min. ø : 13 mm (510 mils)
V1EKB4 1.25 mm (49 mils) --- Double pole probe for inside measurements with spring-loaded
0-100 µm : 0.5 µm ø : 20 mm (800 mils) ø : 30 mm (1.2“)
measuring system. Measures nonferrous- and nonmetal coatings
602-126 100-2000 µm : 0.5 % min. ø : 2 mm (80 mils) min. ø : 15 mm (590 mils) on steel or iron substrate (NF, Iso/Fe). Suitable for measurement in
PVD coated 8.5 mm (0.3“) bore holes, pipes or grooves. Greater measuring precision on
rough surfaces than with EGABI1.3 -150 (260) probe.
0-2000 µm 0-50 µm : 0.15 µm ø : 38 mm (1.5“) Smallest permissible inside diameter: 8.5 mm (0.34“)
D : 0.4 mm (16 mils) yes 300 mm (11.8“)
0-80 mils 50-2000 µm : 0.3 % min. ø : 20 mm (800 mils) Maximum insertion depth: 185 mm (7.4“)
EKB4 0-100 µm : 0.5 µm ø : 20 mm (800 mils) ø : 30 mm (1.2“) 1.25 mm (49 mils) 21 mm (0.8“)
Double pole probe for angular measurements with fixed mea-
602-108 100-2000 µm : 0.5 % min. ø : 2 mm (80 mils) min. ø : 15 mm (590 mils) surement system. Measures nonferrous- and nonmetal coatings
PVD coated 12 mm (0.5“) on steel or iron substrate (NF, Iso/Fe). Well suited for thin coatings.
Higher measurement precision on rough surfaces than single
0-2000 µm 0-50 µm : 0.15 µm ø : 38 mm (1.5“) pole probes.
D : 0.4 mm (16 mils) yes 18 mm (0.7“)
0-80 mils 50-2000 µm : 0.3 % min. ø : 13 mm (510 mils)
V1EKB4 1.25 mm (49 mils) --- Double pole probe for inside measurements with spring-loaded
0-100 µm : 0.5 µm ø : 20 mm (800 mils) ø : 30 mm (1.2“)
measuring system. Measures nonferrous- and nonmetal coatings
602-126 100-2000 µm : 0.5 % min. ø : 2 mm (80 mils) min. ø : 15 mm (590 mils) on steel or iron substrate (NF, Iso/Fe). Suitable for measurement in
PVD coated 8.5 mm (0.3“) bore holes, pipes or grooves. Greater measuring precision on
rough surfaces than with EGABI1.3 -150 (260) probe.
0-2000 µm 0-50 µm : 0.15 µm ø : 38 mm (1.5“) Smallest permissible inside diameter: 8.5 mm (0.34“)
D : 0.4 mm (16 mils) yes 300 mm (11.8“)
0-80 mils 50-2000 µm : 0.3 % min. ø : 20 mm (800 mils) Maximum insertion depth: 185 mm (7.4“)
flat: 34 x 24 mm
EKB10-OD 602-165 0-0.5 mm : 0.005 mm ø : 50 mm (2“) ø : 30 mm (1.2“) 26 mm (1.0“)
(1300 x 950 mils)
EKB10L-OD 602-760 0.5-8 mm : 1 % min. ø : 2 mm (80 mils) min. ø : 38 mm (1.5“)
Double pole probe for angular measurements with fixed
measurement system.
Polyamide 24 mm (1.0“) The large flat contact surface is especially well suited for thick and
compressible soft coatings (for example rubber sheeting for offset
printing).
0-8 mm 0-0.5 mm : 0.0015 mm ∞
D : 0.5 mm (20 mils)
0-320 mils 0.5-8 mm : 0.3 % ∞
no 53 mm (2.1“)
ø : 30 mm (1.2“) 1.5 mm (60 mils) --- Double pole probe for angular measurements with
V1EKB10 0-0.5 mm : 0.01 mm ø : 50 mm (2“)
min. ø : 20 mm (800 mils) spring-loaded measuring system.
602-676 0.5-8 mm : 2 % min. ø : 2 mm (80 mils)
Suitable for thick coatings in bore holes, pipes, or recesses.
Greater measuring precision on rough surfaces than with single
PVD coated 13 mm (0.5“) pole probes. Externally triggered measurement acquisition should
be used with small inside diameters to prevent measurement
errors.
0-8 mm 0-0.5 mm : 0.0025 mm ø : 75 mm (3“) D : 0.5 mm (20 mils) Smallest permissible inside diameter: 13 mm (0.5“)
0-320 mils 0.5-8 mm : 0.5 % min. ø : 24 mm (950 mils) 380 mm (15“) Maximum insertion depth : 260 mm (10“)
yes
Note concerning the application of probes using the magnetic induction measurement method:
Please consult with the manufacturer before measuring electrically conducting coatings with thicknesses > 500 µm (20 mils).
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®
Characteristic values and technical data of probes for the magnetic induction measurement method
flat: 34 x 24 mm
EKB10-OD 602-165 0-0.5 mm : 0.005 mm ø : 50 mm (2“) ø : 30 mm (1.2“) 26 mm (1.0“)
(1300 x 950 mils)
EKB10L-OD 602-760 0.5-8 mm : 1 % min. ø : 2 mm (80 mils) min. ø : 38 mm (1.5“)
Double pole probe for angular measurements with fixed
measurement system.
Polyamide 24 mm (1.0“) The large flat contact surface is especially well suited for thick and
compressible soft coatings (for example rubber sheeting for offset
printing).
0-8 mm 0-0.5 mm : 0.0015 mm ∞
D : 0.5 mm (20 mils)
0-320 mils 0.5-8 mm : 0.3 % ∞
no 53 mm (2.1“)
ø : 30 mm (1.2“) 1.5 mm (60 mils) --- Double pole probe for angular measurements with
V1EKB10 0-0.5 mm : 0.01 mm ø : 50 mm (2“)
min. ø : 20 mm (800 mils) spring-loaded measuring system.
602-676 0.5-8 mm : 2 % min. ø : 2 mm (80 mils)
Suitable for thick coatings in bore holes, pipes, or recesses.
Greater measuring precision on rough surfaces than with single
PVD coated 13 mm (0.5“) pole probes. Externally triggered measurement acquisition should
be used with small inside diameters to prevent measurement
errors.
0-8 mm 0-0.5 mm : 0.0025 mm ø : 75 mm (3“) D : 0.5 mm (20 mils) Smallest permissible inside diameter: 13 mm (0.5“)
0-320 mils 0.5-8 mm : 0.5 % min. ø : 24 mm (950 mils) 380 mm (15“) Maximum insertion depth : 260 mm (10“)
yes
Note concerning the application of probes using the magnetic induction measurement method:
Please consult with the manufacturer before measuring electrically conducting coatings with thicknesses > 500 µm (20 mils).
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Characteristic values and technical data of probes for the eddy current measuring method
EGA06H 602-936 0-50 µm : 0.3 µm ø : 18 mm (720 mils) ø : 5 mm (200 mils) 0.3 mm (12 mils) 110 mm (4.4“)
EGA06H-L 602-626 50-700 µm : < 2 % min. ø : 1 mm ( 40 mils) min. ø : 2 mm (80 mils) Axial single tip measurement probe with spring-loaded measuring
system. Measures electrically nonconducting or nonferrous
coatings on steel or iron (NF/Fe).
Tungsten carbide 13 mm (0.52“)
Mechanical design especially suited for installation in customer-
specific probe fixtures or guide devices for precise probe
0-700 µm 0-50 µm : 0.1 µm ø : 30 mm (1.2“) positioning.
D : 0.25 mm (10 mils)
0-28 mils 50-700 µm : < 0.3 % min. ø : 20 mm (800 mils)
no ---
EGA06H-MC 0-70 µm : 0.3 µm ø : 18 mm (720 mils) ø : 5 mm (200 mils) 0.3 mm (12 mils) 110 mm (4.4“)
603-092 70-700 µm : < 2 % min. ø : 1 mm ( 40 mils) min. ø : 2 mm (80 mils) Axial single tip measurement probe with spring-loaded measuringt
system. Measures electrically nonconducting or nonferrous
coatings on steel or iron (NF/Fe).
Tungsten carbide 13 mm (0.52“) Mechanical design especially suited for installation in customer-
specific probe fixtures or guide devices for precise probe
0-700 µm 0-70 µm : 0.08 µm ø : 30 mm (1.2“) positioning.
D : 0.25 mm (10 mils)
0-28 mils 70-700 µm : < 0.08 % min. ø : 20 mm (800 mils)
no ---
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®
Characteristic values and technical data of probes for the eddy current measuring method
EGA06H 602-936 0-50 µm : 0.3 µm ø : 18 mm (720 mils) ø : 5 mm (200 mils) 0.3 mm (12 mils) 110 mm (4.4“)
EGA06H-L 602-626 50-700 µm : < 2 % min. ø : 1 mm ( 40 mils) min. ø : 2 mm (80 mils) Axial single tip measurement probe with spring-loaded measuring
system. Measures electrically nonconducting or nonferrous
coatings on steel or iron (NF/Fe).
Tungsten carbide 13 mm (0.52“)
Mechanical design especially suited for installation in customer-
specific probe fixtures or guide devices for precise probe
0-700 µm 0-50 µm : 0.1 µm ø : 30 mm (1.2“) positioning.
D : 0.25 mm (10 mils)
0-28 mils 50-700 µm : < 0.3 % min. ø : 20 mm (800 mils)
no ---
EGA06H-MC 0-70 µm : 0.3 µm ø : 18 mm (720 mils) ø : 5 mm (200 mils) 0.3 mm (12 mils) 110 mm (4.4“)
603-092 70-700 µm : < 2 % min. ø : 1 mm ( 40 mils) min. ø : 2 mm (80 mils) Axial single tip measurement probe with spring-loaded measuringt
system. Measures electrically nonconducting or nonferrous
coatings on steel or iron (NF/Fe).
Tungsten carbide 13 mm (0.52“) Mechanical design especially suited for installation in customer-
specific probe fixtures or guide devices for precise probe
0-700 µm 0-70 µm : 0.08 µm ø : 30 mm (1.2“) positioning.
D : 0.25 mm (10 mils)
0-28 mils 70-700 µm : < 0.08 % min. ø : 20 mm (800 mils)
no ---
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®
Characteristic values and technical data of probes for the eddy current measuring method
0-50 µm : 0.25 µm 1.2 mm (47 mils) --- Axial single tip probe with spring-loaded measuring system.
ETA3.3H 602-128 ø : 50 mm (2“) ø : 4 mm (160 mils)
50-800 µm : 0.5 % Measurement of nonconductive coatings on nonferromagnetic
ETA3.3HL 602-799 min. ø : 2 mm (80 mils) min. ø : 2 mm (80 mils) substrate (Iso/NF).
800-1200 µm : < 2 %
Tungsten carbide 18 mm (0.7“) Highly impact- and shatter resistant probe tip.
Standard probe for paint and plastic coatings. Should not be used
0-1200 µm 0-50 µm : 0.15 µm ø : 50 mm (2“) when surfaces exhibit a damp condition (acidic contamination of
D : 0.09 mm (3.5 mils) 70 mm (2.8“)
0-45 mils 50-1200 µm : 0.3 % min. ø : 30 mm (1.2“) yes test surface).
0-100 µm : 0.5 µm 1.2 mm (47 mils) --- Axial single tip probe with spring-loaded measuring system.
ETA3.3 ø : 50 mm (2“) ø : 4 mm (160 mils)
100-800 µm : 0.5 % Measurement of nonconductive coatings on nonferromagnetic
601-797 min. ø : 2 mm (80 mils) min. ø : 2 mm (80 mils) substrate (Iso/NF).
800-1200 µm : < 3 %
Jewel tip 18 mm (0.7“) Standard probe for paint and plastic coatings, as well as for
anodized coatings. Can possibly also be used when surfaces
0-1200 µm 0-100 µm : 0.2 µm ø : 55 mm (2.2“) exhibit a damp condition (acidic contamination of test surface).
D : 0.09 mm (3.5 mils) yes 70 mm (2.8“)
0-45 mils 100-1200 µm : 0.2 % min. ø : 30 mm (1.2“) Smaller tilting effect than with ETA3.3F probe.
ETA3.3FG 0-50 µm : 0.25 µm ø : 50 mm (2“) ø : 15 mm (590 mils) 2.5 mm (98 mils) --- Axial single tip probe with spring-loaded measuring system.
602-623 50-1200 µm : 0.5 % min. ø : 2 mm (80 mils) min. ø : 7 mm (280 mils) Measurement of nonconductive coatings on nonferromagnetic
substrate (Iso/NF).
Polyamide 18 mm (0.7“)
Especially suited for anodized coatings when surfaces exhibit a
0-1200 µm 0-50 µm : 0.1 µm ∞ wet (acidic) contamination of the test surface. Larger tilting effect
D : 0.09 mm (3.5 mils) than with ETA3.3 probe.
0-45 mils 50-1200 µm : 0.2 % ∞ yes 70 mm (2.8“)
EAW3.3 602-025 0-50 µm : 0.75 µm ø : 50 mm (2“) ø : 4 mm (160 mils) 1.2 mm (47 mils) 23 mm (0.9“) Single tip angle probe with spring-loaded measuring system.
EAW3.3L 602-922 50-1200 µm : 1.5 % min. ø : 2 mm (80 mils) min. ø : 2 mm (80 mils) Measurement of nonconductive coatings on nonferromagnetic
substrate (Iso/NF).
Jewel tip 14 mm (0.6“) Suitable for measurements on flat objects or in pipes, bore holes
0-1200 µm 0-50 µm : 0.25 µm ø : 50 mm (2“) and recesses. Can also be used when surfaces exhibit a damp
D : 0.09 mm (3.5 mils) yes 72 mm (2.8“) condition (acidic contamination of test surface).
0-45 mils 50-1200 µm : 0.5 % min. ø : 34 mm (1.6“)
1.2 mm (47 mils) 6.5 mm (0.26“) Single tip angle probe with spring-loaded measuring system.
EAI3.3-150 0-200 µm : 1 µm ø : 60 mm (2.4“) ø : 4 mm (160 mils)
Measurement of nonconductive coatings on nonferromagnetic
602-026 200-800 µm : 0.5 % min. ø : 2 mm (80 mils) min. ø : 2 mm (80 mils) substrate (Iso/NF).
Jewel tip 5.5 mm (0.22“) Suitable for measurements in pipes, bore holes and recesses, etc.
Can possibly also be used when surfaces exhibit a wet condition
0-800 µm 0-100 µm : 0.3 µm ø : 55 mm (2.2“) (acidic contamination of test surface). To avoid positioning errors
D : 0.09 mm (3.5 mils) yes 320 mm (12.6“)
0-32 mils 100-800 µm : 0.3 % min. ø : 9 mm (350 mils) externally triggered measurement acquisition should be used.
0-50 µm : 0.25 µm 1.2 mm (47 mils) --- Axial single tip probe with spring-loaded measuring system.
ETA3.3H 602-128 ø : 50 mm (2“) ø : 4 mm (160 mils)
50-800 µm : 0.5 % Measurement of nonconductive coatings on nonferromagnetic
ETA3.3HL 602-799 min. ø : 2 mm (80 mils) min. ø : 2 mm (80 mils) substrate (Iso/NF).
800-1200 µm : < 2 %
Tungsten carbide 18 mm (0.7“) Highly impact- and shatter resistant probe tip.
Standard probe for paint and plastic coatings. Should not be used
0-1200 µm 0-50 µm : 0.15 µm ø : 50 mm (2“) when surfaces exhibit a damp condition (acidic contamination of
D : 0.09 mm (3.5 mils) 70 mm (2.8“)
0-45 mils 50-1200 µm : 0.3 % min. ø : 30 mm (1.2“) yes test surface).
0-100 µm : 0.5 µm 1.2 mm (47 mils) --- Axial single tip probe with spring-loaded measuring system.
ETA3.3 ø : 50 mm (2“) ø : 4 mm (160 mils)
100-800 µm : 0.5 % Measurement of nonconductive coatings on nonferromagnetic
601-797 min. ø : 2 mm (80 mils) min. ø : 2 mm (80 mils) substrate (Iso/NF).
800-1200 µm : < 3 %
Jewel tip 18 mm (0.7“) Standard probe for paint and plastic coatings, as well as for
anodized coatings. Can possibly also be used when surfaces
0-1200 µm 0-100 µm : 0.2 µm ø : 55 mm (2.2“) exhibit a damp condition (acidic contamination of test surface).
D : 0.09 mm (3.5 mils) yes 70 mm (2.8“)
0-45 mils 100-1200 µm : 0.2 % min. ø : 30 mm (1.2“) Smaller tilting effect than with ETA3.3F probe.
ETA3.3FG 0-50 µm : 0.25 µm ø : 50 mm (2“) ø : 15 mm (590 mils) 2.5 mm (98 mils) --- Axial single tip probe with spring-loaded measuring system.
602-623 50-1200 µm : 0.5 % min. ø : 2 mm (80 mils) min. ø : 7 mm (280 mils) Measurement of nonconductive coatings on nonferromagnetic
substrate (Iso/NF).
Polyamide 18 mm (0.7“)
Especially suited for anodized coatings when surfaces exhibit a
0-1200 µm 0-50 µm : 0.1 µm ∞ wet (acidic) contamination of the test surface. Larger tilting effect
D : 0.09 mm (3.5 mils) than with ETA3.3 probe.
0-45 mils 50-1200 µm : 0.2 % ∞ yes 70 mm (2.8“)
EAW3.3 602-025 0-50 µm : 0.75 µm ø : 50 mm (2“) ø : 4 mm (160 mils) 1.2 mm (47 mils) 23 mm (0.9“) Single tip angle probe with spring-loaded measuring system.
EAW3.3L 602-922 50-1200 µm : 1.5 % min. ø : 2 mm (80 mils) min. ø : 2 mm (80 mils) Measurement of nonconductive coatings on nonferromagnetic
substrate (Iso/NF).
Jewel tip 14 mm (0.6“) Suitable for measurements on flat objects or in pipes, bore holes
0-1200 µm 0-50 µm : 0.25 µm ø : 50 mm (2“) and recesses. Can also be used when surfaces exhibit a damp
D : 0.09 mm (3.5 mils) yes 72 mm (2.8“) condition (acidic contamination of test surface).
0-45 mils 50-1200 µm : 0.5 % min. ø : 34 mm (1.6“)
1.2 mm (47 mils) 6.5 mm (0.26“) Single tip angle probe with spring-loaded measuring system.
EAI3.3-150 0-200 µm : 1 µm ø : 60 mm (2.4“) ø : 4 mm (160 mils)
Measurement of nonconductive coatings on nonferromagnetic
602-026 200-800 µm : 0.5 % min. ø : 2 mm (80 mils) min. ø : 2 mm (80 mils) substrate (Iso/NF).
Jewel tip 5.5 mm (0.22“) Suitable for measurements in pipes, bore holes and recesses, etc.
Can possibly also be used when surfaces exhibit a wet condition
0-800 µm 0-100 µm : 0.3 µm ø : 55 mm (2.2“) (acidic contamination of test surface). To avoid positioning errors
D : 0.09 mm (3.5 mils) yes 320 mm (12.6“)
0-32 mils 100-800 µm : 0.3 % min. ø : 9 mm (350 mils) externally triggered measurement acquisition should be used.
EA70 0 - 5 mm : 0.05 mm ø : 2500 mm (98“) ø : 82 mm (3.2“) flat: ø 75 mm (3“) 43 mm (1.9“) Single tip angle probe with fixed measurement systems.
5 - 50 mm : 1 % Measurement of nonconductive coatings on nonferromagnetic
602-028 min. ø : 300 mm (11.9“) min. ø : 74 mm (2.9“)
substrate (Iso/NF).
Polyamide 75 mm (3“) Suitable for measurements of very thick plastic- or rubber
coatings, however mainly to measure wall thickness of, for
0 - 50 mm ∞
0 - 50 mm : 0.3 % D : 0.09 mm (3.5 mils) example, plastic tanks with an aluminum backing foil. For surfaces
0 - 2“ ∞ no 80 mm (3.1“) with larger curvature a V-groove adapter shoe has to be used.
ETA3.3-CuMR1** 1.2 mm (48 mils) 70 mm (2.8“) Axial single tip measurement probe with spring-loaded
0.5 - 15 µm : 0.3 µm --- ø : 2 mm (80 mils)
603-161 measuring system.
Measures nonferrous metal coatings on nonferromagnetic
Jewel tip 18 mm (0.7“) substrate (ISO/NE). Especially well suited for measuring
0.5 - 15 µm 0.5 - 8 µm : 0.1 µm board thickness (Epoxy) Cu coating thickness on pc-boards. The copper may not be
--- laquered.
0.02 - 0.6 mil 8 - 15 µm : 1.2 % 0.4 mm (16 mils) yes ---
ETA3.3-Cr ** 0 - 50 µm : 1 µm ø : 50 mm (2“) ø : 4 mm (160 mils) 1.2 mm (48 mils) --- Axial single tip measurement probe with spring-loaded
measuring system.
602-607 50 - 500 µm : 2 % min. ø : 1 mm (40 mils) min. ø : 2 mm (80 mils)
Measures chrome coatings on nonferrous substrate like steel,
Jewel tip 10 mm (0.4“) aluminum or copper.
0 - 500 µm Measuring of chrome coatings on stainless steel or titanium or
0 - 50 µm : 0.5 µm ø : 55 mm (2.2“)
0 - 20 mils D : 0.7 mm (28 mils) (Al) other subtrates with very low electrical conductivity is not
50 - 500 µm : 1 % min. ø : 10 mm (400 mils) yes 110 mm (4.4“) possible.
Cr/NF
Patented axial single tip measurement probe with spring-loaded
ETD3.3 0 - 100 µm : 1 µm ø : 4 mm (160 mils) ø : 6 mm (240 mils) 1.2 mm (48 mils) --- measuring system.
602-607 100 - 800 µm : 1 % min. ø : 2 mm (80 mils) min. ø : 3 mm (120 mils) Unique curvature compensation for measuring paint-, laquer-,
plastic and anodized coatings on nonferrous metals.
Jewel tip 16 mm (0.6“) Especially well suited for curved surfaces like motorcar body
0 - 800 µm 0 - 100 µm : 0.2 µm ø : < 40 mm (1.6“) sheet, blinds etc.
D : 0.09 mm (3.6 mils) Probe can be operated with Fischer instrument types
0 - 32 mils 100 - 800 µm : 0.2 % min. ø : 40 mm (1.6“) yes 70 mm (2.8“)
DUALSCOPE® MP20 or MP40.
ET280 ** 0 - 10 cm : 0.05 cm --- 205 mm (8.2“) Axial measurement probe with fixed measurement system.
--- --- Measures nonmetal coatings on nonferromagnetic substrate
602-302 10 - 30 cm : 0.5 %
materials (Iso/NF) or on steel and iron (Iso/Fe).
--- 300 mm (12“) Suited for measurements of the pavement thickness in road
construction, thick synthetic or rubber coatings or for measuring
1 - 30 cm 0 - 10 cm : 0.01 cm
--- --- the thickness of walls of, e.g., large-volume synthetic tanks by
0.4 - 12“ 10 - 30 cm : 0.1 % no --- placing an aluminum foil on the other side.
EA70 0 - 5 mm : 0.05 mm ø : 2500 mm (98“) ø : 82 mm (3.2“) flat: ø 75 mm (3“) 43 mm (1.9“) Single tip angle probe with fixed measurement systems.
5 - 50 mm : 1 % Measurement of nonconductive coatings on nonferromagnetic
602-028 min. ø : 300 mm (11.9“) min. ø : 74 mm (2.9“)
substrate (Iso/NF).
Polyamide 75 mm (3“) Suitable for measurements of very thick plastic- or rubber
coatings, however mainly to measure wall thickness of, for
0 - 50 mm ∞
0 - 50 mm : 0.3 % D : 0.09 mm (3.5 mils) example, plastic tanks with an aluminum backing foil. For surfaces
0 - 2“ ∞ no 80 mm (3.1“) with larger curvature a V-groove adapter shoe has to be used.
ETA3.3-CuMR1** 1.2 mm (48 mils) 70 mm (2.8“) Axial single tip measurement probe with spring-loaded
0.5 - 15 µm : 0.3 µm --- ø : 2 mm (80 mils)
603-161 measuring system.
Measures nonferrous metal coatings on nonferromagnetic
Jewel tip 18 mm (0.7“) substrate (ISO/NE). Especially well suited for measuring
0.5 - 15 µm 0.5 - 8 µm : 0.1 µm board thickness (Epoxy) Cu coating thickness on pc-boards. The copper may not be
--- laquered.
0.02 - 0.6 mil 8 - 15 µm : 1.2 % 0.4 mm (16 mils) yes ---
ETA3.3-Cr ** 0 - 50 µm : 1 µm ø : 50 mm (2“) ø : 4 mm (160 mils) 1.2 mm (48 mils) --- Axial single tip measurement probe with spring-loaded
measuring system.
602-607 50 - 500 µm : 2 % min. ø : 1 mm (40 mils) min. ø : 2 mm (80 mils)
Measures chrome coatings on nonferrous substrate like steel,
Jewel tip 10 mm (0.4“) aluminum or copper.
0 - 500 µm Measuring of chrome coatings on stainless steel or titanium or
0 - 50 µm : 0.5 µm ø : 55 mm (2.2“)
0 - 20 mils D : 0.7 mm (28 mils) (Al) other subtrates with very low electrical conductivity is not
50 - 500 µm : 1 % min. ø : 10 mm (400 mils) yes 110 mm (4.4“) possible.
Cr/NF
Patented axial single tip measurement probe with spring-loaded
ETD3.3 0 - 100 µm : 1 µm ø : 4 mm (160 mils) ø : 6 mm (240 mils) 1.2 mm (48 mils) --- measuring system.
602-607 100 - 800 µm : 1 % min. ø : 2 mm (80 mils) min. ø : 3 mm (120 mils) Unique curvature compensation for measuring paint-, laquer-,
plastic and anodized coatings on nonferrous metals.
Jewel tip 16 mm (0.6“) Especially well suited for curved surfaces like motorcar body
0 - 800 µm 0 - 100 µm : 0.2 µm ø : < 40 mm (1.6“) sheet, blinds etc.
D : 0.09 mm (3.6 mils) Probe can be operated with Fischer instrument types
0 - 32 mils 100 - 800 µm : 0.2 % min. ø : 40 mm (1.6“) yes 70 mm (2.8“)
DUALSCOPE® MP20 or MP40.
ET280 ** 0 - 10 cm : 0.05 cm --- 205 mm (8.2“) Axial measurement probe with fixed measurement system.
--- --- Measures nonmetal coatings on nonferromagnetic substrate
602-302 10 - 30 cm : 0.5 %
materials (Iso/NF) or on steel and iron (Iso/Fe).
--- 300 mm (12“) Suited for measurements of the pavement thickness in road
construction, thick synthetic or rubber coatings or for measuring
1 - 30 cm 0 - 10 cm : 0.01 cm
--- --- the thickness of walls of, e.g., large-volume synthetic tanks by
0.4 - 12“ 10 - 30 cm : 0.1 % no --- placing an aluminum foil on the other side.
ED10 NF/Fe
0-50 µm : 0.2 µm (0.008 mil) ø : 15 mm (600 mils) (NF/Fe) ø :12 mm (480 mils) (NF/Fe)
602-796 0.75 mm (30 mils) --- Axial measurement probe for simultaneous measurement of
50-1500 µm (0-60 mils) : 1 % min. ø : 1 mm (40 mils) (NF/Fe) min. ø : 2 mm (80 mils) (NF/Fe) individual coating thicknesses according to the magnetic induction
Iso/NF method and eddy current method.
ED10L 0-100 µm : 0.5 µm (0.02 mil)
602-093 ø : 75 mm (3“) (Iso/NF) ø : 4 mm (160 mils) (Iso/NF) Especially well suited for measuring paint- and laquer thicknesses
100-1200 µm (4-48 mils) : 0.5 % min. ø : 1 mm (40 mils) (Iso/NF) on steel or iron or aluminum or copper etc. Because of small
min. ø : 2 mm (80 mils) (Iso/NF)
probe tip not suited for measuring on rough e.g. shot-blasted
Tungsten carbide 13 mm (0.5“)
surfaces.
Dual Mode NF/Fe Both electro-galvanized and hot galvanized coatings can be
0-800 µm (0-32 mils) (NE/Fe) 0-50 µm : 0.1 µm (0.004 mil) ø : 30 mm (1.2“) (NF/Fe) measured.
D : 0.2 mm (8 mils) (NF/Fe)
0-800 µm (0-32 mils) (Iso/NE) 50-1500 µm (2-60 mils) : 0.5 % min. ø : 15 mm (600 mils) (NF/Fe) Probe can be connected to instrument models DUALSCOPE®
Single Mode Iso/NF MP10/20/30/40 (depending on the measuring method) and
0-1500 µm (0-60 mils) (NE/Fe) 0-100 µm : 0.2 µm (0.008 mil) ø : 75 mm (3“) (Iso/NF) no 100 mm (4“) FISCHERSCOPE® MMS® module PERMASCOPE®.
100-1200 µm : 0.5 % D : 0.09 mm (4 mils) (Iso/NF)
0-1200 µm (0-48 mils) (Iso/Fe) min. ø : 15 mm (600 mils) (Iso/NF)
Note: Electrical conductivity changes of the base material in the range between 17 MS/m and 58 MS/m (30-100% IACS) cause a measurement error of < 2% with all eddy current probes listed in the tables.
Characteristic values and technical data of probes for the phase-sensitive eddy current measurement method
us* Lift-off h Ø for 10% error Probe tip radius Height Type of probe
Description/No. Probe tip material Diameter/width
s* Convex curvature D for 10% error replaceable probe tip Length (see page 24) Application
6 mm/4 mm (240/160 mils) Measurement of nonferrous metal coatings on steel and iron
0-500 µm (0-20 mils) (Zn/Fe) h : 0-700 µm (0-28 mils) (NF/Fe) at 25 µm (1 mil) Zn/Fe
(NF/Fe) or nonferrous metal coatings on nonferrous substrates
flat: ø 5.5 mm (220 mils) --- (NF/NF), as well as electroplated nickel coatings on steel (Ni/Fe).
0-180 µm (0-7.2 mils) (Cu/Fe)
6 mm/4 mm (240/160 mils) Suited especially for fast, non-destructive measurement of nickel
0-100 µm (0-4 mils) (Ni/Fe) h : 0-200 µm (0-8 mils) (Ni/Fe) at 25 µm (1 mil) Ni/Fe coatings. Produces very little measurement scatter when mea-
ESD1(1) 602-307 suring NF-coatings on very rough steel surfaces. Measurement of
Polyamide 16 mm (0.6“) NF-coatings on NF-substrate if the electrical conductivity of the
ESD1L(1) 602-898 coating material is at least double the conductivity of the substrate
0.04 µm (0.0016 mils) or ø 10%: 4 mm/2 mm (160/80 mils) 0.1 mm (4 mils) material. Due to lift-off compensation of the test signal it is possible
1 % (Zn/Fe) at 25 µm (1 mil) Zn/Fe to perform noncontacting measurements or measurements of
0.1 µm (0.004 mils) or min ø: 4 mm/2 mm (160 mils/80 mils) 0.1 mm (4 mils) coatings under a nonconductive coating up to 700 µm (28 mils)
no 110 mm (4.3“) (for Ni up to 200 µm (8 mils)) thickness. The measurement system
2 % Ni/Fe) at 25 µm (1 mil) Ni/Fe
is moisture proof.
0-200 µm (0-8 mils) (Zn/Fe) h : 0-700 µm (0-28 mils) (NF/Fe) 6 mm/2 mm (240/80 mils)
at 25 µm (1 mil) Zn/Fe flat: ø 5.5 mm (220 mils) --- Axial single tip measurement probe with spring-loaded measuring
0-80 µm 80-3.2 mils) (Cu/Fe) element.
6 mm/2 mm (240/80 mils) Measures nonferrous metal coatings on steel or iron (NF/Fe) or on
0-50 µm (0-2 mils) (Ni/Fe) h : 0-200 µm (0-8 mils) (Ni/Fe)
ESD2 at 25 µm (1 mil) Ni/Fe nonferrous metal coatings (NF/NF) and galvanized nickel coatings
Polyamide 16 mm (0.6“) on steel or iron (Ni/Fe).
602-308 0.02 µm (0.008 mils) or ø 10%: 4 mm/2 mm (160/80 mils) 0.1 mm (4 mils) Same applications and characteristics as ESD1 probe, however
0.5 % (Zn/Fe) at 25 µm (1 mil) Zn/Fe
suitable for thinner coatings. As with probes ESD1 and ESD3 very
0.05 µm (0.002 mils) or min ø: 4 mm/2 mm (160 mils/80 mils) no 110 mm (4.3“) little influence from test area geometry.
1 % (Ni/Fe) at 25 µm (1 mil) Ni/Fe 0.1 mm (4 mils)
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Characteristic values and technical data of probes for the modified eddy current measuring method
ED10 NF/Fe
0-50 µm : 0.2 µm (0.008 mil) ø : 15 mm (600 mils) (NF/Fe) ø :12 mm (480 mils) (NF/Fe)
602-796 0.75 mm (30 mils) --- Axial measurement probe for simultaneous measurement of
50-1500 µm (0-60 mils) : 1 % min. ø : 1 mm (40 mils) (NF/Fe) min. ø : 2 mm (80 mils) (NF/Fe) individual coating thicknesses according to the magnetic induction
Iso/NF method and eddy current method.
ED10L 0-100 µm : 0.5 µm (0.02 mil)
602-093 ø : 75 mm (3“) (Iso/NF) ø : 4 mm (160 mils) (Iso/NF) Especially well suited for measuring paint- and laquer thicknesses
100-1200 µm (4-48 mils) : 0.5 % min. ø : 1 mm (40 mils) (Iso/NF) on steel or iron or aluminum or copper etc. Because of small
min. ø : 2 mm (80 mils) (Iso/NF)
probe tip not suited for measuring on rough e.g. shot-blasted
Tungsten carbide 13 mm (0.5“)
surfaces.
Dual Mode NF/Fe Both electro-galvanized and hot galvanized coatings can be
0-800 µm (0-32 mils) (NE/Fe) 0-50 µm : 0.1 µm (0.004 mil) ø : 30 mm (1.2“) (NF/Fe) measured.
D : 0.2 mm (8 mils) (NF/Fe)
0-800 µm (0-32 mils) (Iso/NE) 50-1500 µm (2-60 mils) : 0.5 % min. ø : 15 mm (600 mils) (NF/Fe) Probe can be connected to instrument models DUALSCOPE®
Single Mode Iso/NF MP10/20/30/40 (depending on the measuring method) and
0-1500 µm (0-60 mils) (NE/Fe) 0-100 µm : 0.2 µm (0.008 mil) ø : 75 mm (3“) (Iso/NF) no 100 mm (4“) FISCHERSCOPE® MMS® module PERMASCOPE®.
100-1200 µm : 0.5 % D : 0.09 mm (4 mils) (Iso/NF)
0-1200 µm (0-48 mils) (Iso/Fe) min. ø : 15 mm (600 mils) (Iso/NF)
Note: Electrical conductivity changes of the base material in the range between 17 MS/m and 58 MS/m (30-100% IACS) cause a measurement error of < 2% with all eddy current probes listed in the tables.
Characteristic values and technical data of probes for the phase-sensitive eddy current measurement method
us* Lift-off h Ø for 10% error Probe tip radius Height Type of probe
Description/No. Probe tip material Diameter/width
s* Convex curvature D for 10% error replaceable probe tip Length (see page 24) Application
6 mm/4 mm (240/160 mils) Measurement of nonferrous metal coatings on steel and iron
0-500 µm (0-20 mils) (Zn/Fe) h : 0-700 µm (0-28 mils) (NF/Fe) at 25 µm (1 mil) Zn/Fe
(NF/Fe) or nonferrous metal coatings on nonferrous substrates
flat: ø 5.5 mm (220 mils) --- (NF/NF), as well as electroplated nickel coatings on steel (Ni/Fe).
0-180 µm (0-7.2 mils) (Cu/Fe)
6 mm/4 mm (240/160 mils) Suited especially for fast, non-destructive measurement of nickel
0-100 µm (0-4 mils) (Ni/Fe) h : 0-200 µm (0-8 mils) (Ni/Fe) at 25 µm (1 mil) Ni/Fe coatings. Produces very little measurement scatter when mea-
ESD1(1) 602-307 suring NF-coatings on very rough steel surfaces. Measurement of
Polyamide 16 mm (0.6“) NF-coatings on NF-substrate if the electrical conductivity of the
ESD1L(1) 602-898 coating material is at least double the conductivity of the substrate
0.04 µm (0.0016 mils) or ø 10%: 4 mm/2 mm (160/80 mils) 0.1 mm (4 mils) material. Due to lift-off compensation of the test signal it is possible
1 % (Zn/Fe) at 25 µm (1 mil) Zn/Fe to perform noncontacting measurements or measurements of
0.1 µm (0.004 mils) or min ø: 4 mm/2 mm (160 mils/80 mils) 0.1 mm (4 mils) coatings under a nonconductive coating up to 700 µm (28 mils)
no 110 mm (4.3“) (for Ni up to 200 µm (8 mils)) thickness. The measurement system
2 % Ni/Fe) at 25 µm (1 mil) Ni/Fe
is moisture proof.
0-200 µm (0-8 mils) (Zn/Fe) h : 0-700 µm (0-28 mils) (NF/Fe) 6 mm/2 mm (240/80 mils)
at 25 µm (1 mil) Zn/Fe flat: ø 5.5 mm (220 mils) --- Axial single tip measurement probe with spring-loaded measuring
0-80 µm 80-3.2 mils) (Cu/Fe) element.
6 mm/2 mm (240/80 mils) Measures nonferrous metal coatings on steel or iron (NF/Fe) or on
0-50 µm (0-2 mils) (Ni/Fe) h : 0-200 µm (0-8 mils) (Ni/Fe)
ESD2 at 25 µm (1 mil) Ni/Fe nonferrous metal coatings (NF/NF) and galvanized nickel coatings
Polyamide 16 mm (0.6“) on steel or iron (Ni/Fe).
602-308 0.02 µm (0.008 mils) or ø 10%: 4 mm/2 mm (160/80 mils) 0.1 mm (4 mils) Same applications and characteristics as ESD1 probe, however
0.5 % (Zn/Fe) at 25 µm (1 mil) Zn/Fe
suitable for thinner coatings. As with probes ESD1 and ESD3 very
0.05 µm (0.002 mils) or min ø: 4 mm/2 mm (160 mils/80 mils) no 110 mm (4.3“) little influence from test area geometry.
1 % (Ni/Fe) at 25 µm (1 mil) Ni/Fe 0.1 mm (4 mils)
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®
Characteristic values and technical data of probes for the phase- sensitive eddy current measurement method
1 - 800 µm (paint/Zn) ø Probe tip: 0.78 mm Axial single tip probe with spring-loaded measuring system.
no lift-off compensation (31 mils) --- Simultaneous measurement of a double coating, i.e. paint over
1 - 100 µm (Zn/Fe) 10 mm/4 mm (400/160 mils)
zinc on steel.
ESG2(7) 602-311 Suitable to measure so-called Duplex coatings (paint over zinc
Austenitic steel 20 mm (0.8“)
ESG2L(7) 602-724 and zinc alloy on galvanized surfaces) on sheet metal or strips.
1 µm or 1 % (paint/Zn) ø : 20 mm (800 mils) (paint/Zn) Not suitable for thick, hot dipped galvanized coatings, because of
1 µm or 1 % (Zn/Fe) ø : 6 mm (240 mils) (Zn/Fe) 0.2 mm (8 mils) Fe the nonhomogeneous alloy composition with unknown material
no 100 mm (4“)
properties and characteristics.
0 - 170 µm (Cu/Iso) 8 mm/6 mm (320/240 mils) flat: ø 5.5 mm (220 mils) --- Measurement of nonferrous metal coatings on nonconductive
h : 0 - 300 µm (12 mils)
at 100 µm (4 mils) Cu/Iso substrates (NF/NC) and nonferrous metal substrates (NF/NF).
0 - 700 µm (Cr/Cu) no lift-off compensation
ESC1(1) 10 mm/6 mm (400/240 mils)
at 230 µm (9 mils) Cr/Al Polyamide 16 mm (0.63“) Main application is to measure Cu-cladding thickness on
602-658 6 mm/3 mm (240/120 mils) PC-boards, also under a conformal coating; also measures the
0.04 µm or 1 % (Cu/Iso) at 100 µm (4 mils) Cu/Iso --- thickness of metal foils, as well as Cr-coatings on copper,
0.1 µm or 2 % (Cr/Cu) 35 mm/2 mm (1400/80 mils) 0.9 mm (35 mils) CuZn no 110 mm (4.3“) aluminum or brass.
at 230 µm (9 mils) Cr/Al
8 mm/4 mm (320/160 mils) flat: ø 5.5 mm (220 mils) ---
0 - 90 µm (Cu/Iso) h : 0 - 300 µm (12 mils) at 60 µm (2.4 mils) Cu/Iso
0 - 200 µm (Cr/Cu) no lift-off compensation 10 mm/4 mm (400/160 mils)
ESC2 at 150 µm (6 mils) Cr/Al 16 mm (0.63“)
Polyamide Same application as ESC1 probe, however for thinner coatings.
602-237
6 mm/3 mm (240/120 mils)
0.02 µm or 0.5 % (Cu/Iso) ---
35 mm/2 mm (1400/80 mils)
0.05 µm or 1 % (Cr/Cu) 0.5 mm (20 mils) CuZn no 110 mm (4.3“)
at 150 µm (6 mils) Cr/Al
no tip, flat: ø 15 mm
130 mm (5.2“)
90 - 1000 µm (Cu/Iso) 0 - 500 µm (0 - 20 mils) 15 mm (600 mils) (600 mils) Axial single tip measurement probe with spring-loaded measuring
element.
ESC3(1)
Polyamide 18 mm (0.7“) Measures nonferrous metal coatings on nonmetal (NF/Iso) or on
603-039 nonferrous metal substrate materials (NF/NF).
not relevant not relevant Same applications as ESC1 probe, but for thicker coatings.
0.3 µm/0.5 % no ---
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®
Characteristic values and technical data of probes for the phase- sensitive eddy current measurement method
1 - 800 µm (paint/Zn) ø Probe tip: 0.78 mm Axial single tip probe with spring-loaded measuring system.
no lift-off compensation (31 mils) --- Simultaneous measurement of a double coating, i.e. paint over
1 - 100 µm (Zn/Fe) 10 mm/4 mm (400/160 mils)
zinc on steel.
ESG2(7) 602-311 Suitable to measure so-called Duplex coatings (paint over zinc
Austenitic steel 20 mm (0.8“)
ESG2L(7) 602-724 and zinc alloy on galvanized surfaces) on sheet metal or strips.
1 µm or 1 % (paint/Zn) ø : 20 mm (800 mils) (paint/Zn) Not suitable for thick, hot dipped galvanized coatings, because of
1 µm or 1 % (Zn/Fe) ø : 6 mm (240 mils) (Zn/Fe) 0.2 mm (8 mils) Fe the nonhomogeneous alloy composition with unknown material
no 100 mm (4“)
properties and characteristics.
0 - 170 µm (Cu/Iso) 8 mm/6 mm (320/240 mils) flat: ø 5.5 mm (220 mils) --- Measurement of nonferrous metal coatings on nonconductive
h : 0 - 300 µm (12 mils)
at 100 µm (4 mils) Cu/Iso substrates (NF/NC) and nonferrous metal substrates (NF/NF).
0 - 700 µm (Cr/Cu) no lift-off compensation
ESC1(1) 10 mm/6 mm (400/240 mils)
at 230 µm (9 mils) Cr/Al Polyamide 16 mm (0.63“) Main application is to measure Cu-cladding thickness on
602-658 6 mm/3 mm (240/120 mils) PC-boards, also under a conformal coating; also measures the
0.04 µm or 1 % (Cu/Iso) at 100 µm (4 mils) Cu/Iso --- thickness of metal foils, as well as Cr-coatings on copper,
0.1 µm or 2 % (Cr/Cu) 35 mm/2 mm (1400/80 mils) 0.9 mm (35 mils) CuZn no 110 mm (4.3“) aluminum or brass.
at 230 µm (9 mils) Cr/Al
8 mm/4 mm (320/160 mils) flat: ø 5.5 mm (220 mils) ---
0 - 90 µm (Cu/Iso) h : 0 - 300 µm (12 mils) at 60 µm (2.4 mils) Cu/Iso
0 - 200 µm (Cr/Cu) no lift-off compensation 10 mm/4 mm (400/160 mils)
ESC2 at 150 µm (6 mils) Cr/Al 16 mm (0.63“)
Polyamide Same application as ESC1 probe, however for thinner coatings.
602-237
6 mm/3 mm (240/120 mils)
0.02 µm or 0.5 % (Cu/Iso) ---
35 mm/2 mm (1400/80 mils)
0.05 µm or 1 % (Cr/Cu) 0.5 mm (20 mils) CuZn no 110 mm (4.3“)
at 150 µm (6 mils) Cr/Al
no tip, flat: ø 15 mm
130 mm (5.2“)
90 - 1000 µm (Cu/Iso) 0 - 500 µm (0 - 20 mils) 15 mm (600 mils) (600 mils) Axial single tip measurement probe with spring-loaded measuring
element.
ESC3(1)
Polyamide 18 mm (0.7“) Measures nonferrous metal coatings on nonmetal (NF/Iso) or on
603-039 nonferrous metal substrate materials (NF/NF).
not relevant not relevant Same applications as ESC1 probe, but for thicker coatings.
0.3 µm/0.5 % no ---
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®
Characteristic values and technical data of probes for the modified magnetic method
Characteristic values and technical data of probes for the electrical conductivity method
Range I: 0.1 - 10 µm
0.1 - 5 µm = 0.075 µm : 8 x 8 mm
5 - 10 µm = 1.5 % 50 µm (2 mils) 130 mm (5“)
ERCU N (320 x 320 mils)
Range II: 5 - 120 µm only for flat specimen
603-220
5 - 50 µm = 0.5 µm min. : 1 mm
50 - 80 µm = 1 % Four-point probe measuring copper coating thicknesses on
> 80 µm = 2 % the surface of printed circuit boards according to the electric
Heat treated steel 32 mm (1.2“) resistance method. No interference from underlying copper
Range I: 0.1 - 10 µm coatings separated by thin isolating layers.
0.1 - 5 µm = 0.05 µm
0.1-120 µm (0.04 - 4.8 mils) 5 - 10 µm = 1 %
Cu/Epoxy Range II: 5 - 120 µm only for flat specimen not relevant
5 - 50 µm = 0.25 µm no ---
50 - 80 µm = 0.5 %
> 80 µm = 2 %
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®
Characteristic values and technical data of probes for the modified magnetic method
Characteristic values and technical data of probes for the electrical conductivity method
Range I: 0.1 - 10 µm
0.1 - 5 µm = 0.075 µm : 8 x 8 mm
5 - 10 µm = 1.5 % 50 µm (2 mils) 130 mm (5“)
ERCU N (320 x 320 mils)
Range II: 5 - 120 µm only for flat specimen
603-220
5 - 50 µm = 0.5 µm min. : 1 mm
50 - 80 µm = 1 % Four-point probe measuring copper coating thicknesses on
> 80 µm = 2 % the surface of printed circuit boards according to the electric
Heat treated steel 32 mm (1.2“) resistance method. No interference from underlying copper
Range I: 0.1 - 10 µm coatings separated by thin isolating layers.
0.1 - 5 µm = 0.05 µm
0.1-120 µm (0.04 - 4.8 mils) 5 - 10 µm = 1 %
Cu/Epoxy Range II: 5 - 120 µm only for flat specimen not relevant
5 - 50 µm = 0.25 µm no ---
50 - 80 µm = 0.5 %
> 80 µm = 2 %
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®
Characteristic values and technical data of probes to measure the electrical volume conductivity
(1)
: Probe can only be connected to FISCHERSCOPE ® MMS® module SIGMASCOPE ® and module DUPLEX (5)
: Probe can only be connected to SIGMASCOPE ® SMP10
(2)
: Probe can only be connected to SIGMASCOPE ® SMP1B (6)
: Probe can only be connected to CU-SCOPE ® CMP1A
(3)
: Probe can only be connected to SIGMASCOPE ® SMP2 (7)
: Probe can only be connected to FISCHERSCOPE ® MMS Module DUPLEX
(4)
: Probe can only be connected to FISCHERSCOPE ® MMS® EURO HF
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®
Characteristic values and technical data of probes to measure the electrical volume conductivity
(1)
: Probe can only be connected to FISCHERSCOPE ® MMS® module SIGMASCOPE ® and module DUPLEX (5)
: Probe can only be connected to SIGMASCOPE ® SMP10
(2)
: Probe can only be connected to SIGMASCOPE ® SMP1B (6)
: Probe can only be connected to CU-SCOPE ® CMP1A
(3)
: Probe can only be connected to SIGMASCOPE ® SMP2 (7)
: Probe can only be connected to FISCHERSCOPE ® MMS Module DUPLEX
(4)
: Probe can only be connected to FISCHERSCOPE ® MMS® EURO HF
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Characteristic values and technical data of probes to measure the ferrite content
EGAB1.3-FE 0 - 5 %Fe/5FN : 0.1 %FE/FN ø : 15 mm (590 mils) ø : 10 mm (400 mils) 0.75 mm (30 mils) --- Axial single tip probe with spring-loaded measuring system.
602-221 5 %Fe/5FN - 80 %/110FN : 2 % min. ø : 1 mm (80 mils) min. ø : 2 mm (80 mils) Measurement of the Delta Ferrite content in ferrite percent or
WRC ferrite number.
PVD coated 10 mm (0.4“) Suitable for the measurement of delta ferrite content in weld
metal and clad layers of austenitic or Duplex stainless steel.
0.1 - 80 % Fe 0 - 10 %Fe/10FN : 0.05 %Fe/FN ø : 30 mm (1.2“) D : 1 mm (40 mils) Also used to determine the ratio of martensite in austenitic
0.1 - 110 FN 10 %Fe/10FN - 80 %Fe/110FN : 0.5 % min. ø : 10 mm (400 mils) D : 1 mm (40 mils) yes 110 mm (4.3“) stainless steels.
EGABW1.3-FE
602-304 0 - 5 %Fe/5FN : 0.1 %FE/FN ø : 15 mm (590 mils) ø : 10 mm (400 mils) 0.75 mm (30 mils) 23 mm (0.9“)
EGABW1.3L-FE 5 %Fe/5FN - 80 %/110FN : 2 % min. ø : 1 mm (40 mils) min. ø : 2 mm (80 mils)
602-614 Single pole angle probe with spring-loaded measuring system.
PVD coated 14 mm (0.6“) Same application as EGAB1.3-FE probe, however preferred for
measurements in pipes, bore holes or recesses.
0.1 - 80 % Fe 0 - 10 %Fe/10FN : 0.05 %Fe/FN ø : 36 mm (1.4“) D : 1 mm (40 mils)
0.1 - 110 FN 10 %Fe/10FN - 80 %Fe/110FN : 0.5 % min. ø : 18 mm (720 mils) D : 1 mm (40 mils) yes 72 mm (2.8“)
All probes can be connected to FISCHERSCOPE ® MMS® module PERMASCOPE ® and FERITSCOPE ® MP30
(1)
: Measurement of Delta Ferrite content in sheet material. Thickness of the sheet material.
(2)
: Measurement of Delta Ferrite content in clad layers. Thickness of the cladding.
Listed are the maximum diameter (respective to width) and the maximum height of the
probe, as well as the overall length from the probe tip to the cable entry point.
Length Length
Length Length
Height
Diameter Height
Height
Width
Example EGAB1.3 Example EGABW1.3 Diameter Example EKB25 Width Example V1EGA1HR34
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Characteristic values and technical data of probes to measure the ferrite content
EGAB1.3-FE 0 - 5 %Fe/5FN : 0.1 %FE/FN ø : 15 mm (590 mils) ø : 10 mm (400 mils) 0.75 mm (30 mils) --- Axial single tip probe with spring-loaded measuring system.
602-221 5 %Fe/5FN - 80 %/110FN : 2 % min. ø : 1 mm (80 mils) min. ø : 2 mm (80 mils) Measurement of the Delta Ferrite content in ferrite percent or
WRC ferrite number.
PVD coated 10 mm (0.4“) Suitable for the measurement of delta ferrite content in weld
metal and clad layers of austenitic or Duplex stainless steel.
0.1 - 80 % Fe 0 - 10 %Fe/10FN : 0.05 %Fe/FN ø : 30 mm (1.2“) D : 1 mm (40 mils) Also used to determine the ratio of martensite in austenitic
0.1 - 110 FN 10 %Fe/10FN - 80 %Fe/110FN : 0.5 % min. ø : 10 mm (400 mils) D : 1 mm (40 mils) yes 110 mm (4.3“) stainless steels.
EGABW1.3-FE
602-304 0 - 5 %Fe/5FN : 0.1 %FE/FN ø : 15 mm (590 mils) ø : 10 mm (400 mils) 0.75 mm (30 mils) 23 mm (0.9“)
EGABW1.3L-FE 5 %Fe/5FN - 80 %/110FN : 2 % min. ø : 1 mm (40 mils) min. ø : 2 mm (80 mils)
602-614 Single pole angle probe with spring-loaded measuring system.
PVD coated 14 mm (0.6“) Same application as EGAB1.3-FE probe, however preferred for
measurements in pipes, bore holes or recesses.
0.1 - 80 % Fe 0 - 10 %Fe/10FN : 0.05 %Fe/FN ø : 36 mm (1.4“) D : 1 mm (40 mils)
0.1 - 110 FN 10 %Fe/10FN - 80 %Fe/110FN : 0.5 % min. ø : 18 mm (720 mils) D : 1 mm (40 mils) yes 72 mm (2.8“)
All probes can be connected to FISCHERSCOPE ® MMS® module PERMASCOPE ® and FERITSCOPE ® MP30
(1)
: Measurement of Delta Ferrite content in sheet material. Thickness of the sheet material.
(2)
: Measurement of Delta Ferrite content in clad layers. Thickness of the cladding.
Listed are the maximum diameter (respective to width) and the maximum height of the
probe, as well as the overall length from the probe tip to the cable entry point.
Length Length
Length Length
Height
Diameter Height
Height
Width
Example EGAB1.3 Example EGABW1.3 Diameter Example EKB25 Width Example V1EGA1HR34
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®
Accessories Test Instruments
For the accurate measurement of coating thickness on small parts, *: included with standard V12 measurement stand
such as fasteners, stampings, sleeves, etc. or parts with complex (order number 602-260) or V12-SP stand (order number A series of hand-held and bench top instruments are available for the probes coating thickness measurement, the DUALSCOPE® MP20 and MP40 series
listed. For magnetic induction based measurement the DELTASCOPE ® combine the magnetic induction and eddy current methods.
geometry. Probe specific mounting adapters are required. 602-262)
MPxC series is used, the ISOSCOPE ® MP series is used for eddy current
V12 measurement stand with base* and V12 measurement stand with V-table*, V12 measurement stand with adapter
adapter 600-796* to mount the following adapter 600-173* and adapter 600-077 to 600-213 to mount the following probes:
mount the following probes: • ESD1, ESD2 DELTASCOPE ® MP10 displays individual DUALSCOPE ® MP20 with statistical measure- Measurement of the paint coating thickness on
probes: measurement values without statistics, it has ment series evaluation capability. Does not store a curved surface using ETD3.3 probe and
• ETA3.3H, ETA3.3F, ETA3.3T • EGABW1.3, EGBW2, EGABW1.3FE • ESC1, ESC2
• EAW3.3, EA9 • ES2 no serial interface (no printing, no data transfer) measurements, it has no serial interface. DUALSCOPE® MP40.
• EGAB1.3-SD and does not store measurement values.
• V6EKB4 • ENW3
V12 measurement stand with magnetic shuttle V12 measurement stand with V-table*, adapter V12-SP measurement stand with quick loading
table 600-019 and adapter 600-173* and adapter 601-691 to mount the screw fixture and adapter 602-370* to mount Measurement of a duplex coating (paint/zinc Measurement system Fischerscope® MMS with Hand-held NICKELSCOPE® NMP2 for the
600-173* to mount the following probes: following probes: the following probes: coating on iron) using EDX10 probe and various methods for coating thickness mea- measurement of nickel or nonferrous metal
• EGA2H • EGABI1.3-150, EGABI1.3-260, • EGAB1.3, EGB2, EGAB1.3FE DUALSCOPE® MP40. surement and material testing. coating on steel, as well as nonferrous metal
• EN3 V1EKB4, V1EKB10, EGABI1.3-150FE coatings on nonconductive substrates.
• EAI3.3-150
Screw measurement device for accurate Measuring stand V12 mot. MP for automated Measuring head MD4 for automatic measure-
measurements of coating thicknesses on The CU-SCOPE CMP1A is used to measure SIGMASCOPE® SMP10 for measuring the The FERITSCOPE® MP30 determines the delta
measurements specifically for paint coatings ments of coatings on ferromagnetic substrate
metallic fasteners according to ISO DIN 4042. copper plating thickness in PCB through holes. electrical conductivity of nonferromagnetic, ferrite content in austenitic weld metal or duplex
without indentation- or positioning errors. materials. Easy integration into production lines
electrically conducting metals. stainless steel.
26 for 100% testing.
Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com 27
®
Accessories Test Instruments
For the accurate measurement of coating thickness on small parts, *: included with standard V12 measurement stand
such as fasteners, stampings, sleeves, etc. or parts with complex (order number 602-260) or V12-SP stand (order number A series of hand-held and bench top instruments are available for the probes coating thickness measurement, the DUALSCOPE® MP20 and MP40 series
listed. For magnetic induction based measurement the DELTASCOPE ® combine the magnetic induction and eddy current methods.
geometry. Probe specific mounting adapters are required. 602-262)
MPxC series is used, the ISOSCOPE ® MP series is used for eddy current
V12 measurement stand with base* and V12 measurement stand with V-table*, V12 measurement stand with adapter
adapter 600-796* to mount the following adapter 600-173* and adapter 600-077 to 600-213 to mount the following probes:
mount the following probes: • ESD1, ESD2 DELTASCOPE ® MP10 displays individual DUALSCOPE ® MP20 with statistical measure- Measurement of the paint coating thickness on
probes: measurement values without statistics, it has ment series evaluation capability. Does not store a curved surface using ETD3.3 probe and
• ETA3.3H, ETA3.3F, ETA3.3T • EGABW1.3, EGBW2, EGABW1.3FE • ESC1, ESC2
• EAW3.3, EA9 • ES2 no serial interface (no printing, no data transfer) measurements, it has no serial interface. DUALSCOPE® MP40.
• EGAB1.3-SD and does not store measurement values.
• V6EKB4 • ENW3
V12 measurement stand with magnetic shuttle V12 measurement stand with V-table*, adapter V12-SP measurement stand with quick loading
table 600-019 and adapter 600-173* and adapter 601-691 to mount the screw fixture and adapter 602-370* to mount Measurement of a duplex coating (paint/zinc Measurement system Fischerscope® MMS with Hand-held NICKELSCOPE® NMP2 for the
600-173* to mount the following probes: following probes: the following probes: coating on iron) using EDX10 probe and various methods for coating thickness mea- measurement of nickel or nonferrous metal
• EGA2H • EGABI1.3-150, EGABI1.3-260, • EGAB1.3, EGB2, EGAB1.3FE DUALSCOPE® MP40. surement and material testing. coating on steel, as well as nonferrous metal
• EN3 V1EKB4, V1EKB10, EGABI1.3-150FE coatings on nonconductive substrates.
• EAI3.3-150
Screw measurement device for accurate Measuring stand V12 mot. MP for automated Measuring head MD4 for automatic measure-
measurements of coating thicknesses on The CU-SCOPE CMP1A is used to measure SIGMASCOPE® SMP10 for measuring the The FERITSCOPE® MP30 determines the delta
measurements specifically for paint coatings ments of coatings on ferromagnetic substrate
metallic fasteners according to ISO DIN 4042. copper plating thickness in PCB through holes. electrical conductivity of nonferromagnetic, ferrite content in austenitic weld metal or duplex
without indentation- or positioning errors. materials. Easy integration into production lines
electrically conducting metals. stainless steel.
26 for 100% testing.
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® ®
Active Around the World Probes and Measurement Fixtures
FISCHERSCOPE® X-RAY to measure coating Microhardness testing system POROSCOPE® HV20 to test for pores and pinholes
thickness using the X-Ray fluorescence method. FISCHERSCOPE® H100C. in nonconductive coatings.
The high quality standard of FISCHER FISCHER is a reliable and competent Today, FISCHER instruments are used
instruments is the result of our efforts to partner, offering expert advice, extensive successfully in all technological fields of
provide the very best instrumentation to service, and training seminars. industry and research.
our customers.
Helmut Fischer GmbH+Co.KG Fischer Instrumentation (G.B.) Ltd. Fischer Technology, Inc.
71069 Sindelfingen, Germany Lymington/Hampshire SO41 8JD, England Windsor, Ct. 06095, USA
Tel. (+49) 70 31 303-0, Fax (+49) 70 31 303-79 Tel. (+44) 1590-683663, Fax (+44) 1590-684110 Tel. 860 683-0781, Fax 860 688-8496
Internet: http://www.Helmut-Fischer.com Internet: http://www.fischergb.co.uk Internet: http://www.fischer-technology.com
Sole Agent for Helmut Fischer GmbH+Co.KG, Germany: Fischer Instruments, S.A. Fischer Instrumentation (S) Pte Ltd.
08018 Barcelona, Spain Singapore 118529, Singapore
Helmut Fischer Elektronik und Messtechnik AG Tel. (+34) 93 309 79 16, Fax (+34) 93 485 05 94 Tel. (+65) 276 67 76, Fax (+65) 276 76 67
CH-6331 Hünenberg, Switzerland E-Mail: [email protected] E-Mail: [email protected]
Tel. (+41) 41 785 08 00, Fax (+41) 41 785 08 01
E-Mail: [email protected] Helmut Fischer Meettechniek B.V. Nantong Fischer Instrumentation Ltd.
5627 GB Eindhoven, The Netherlands Shanghai 200437, P.R.C., China
Tel. (+31) 40 248 22 55, Fax (+31) 40 242 88 85 Tel. (+86) 21 6555 7455, Fax (+86) 21 6555 2441
Branch Offices of Helmut Fischer AG, Switzerland: E-Mail: [email protected]
E-Mail: [email protected]
Fischer Instrumentation Electronique Fischer Instruments K.K.
78180 Montigny le Bretonneux, France Saitama-ken 340, Japan
Tel. (+33) (0) 1 30 58 00 58, Fax (+33) (0) 1 30 58 89 50 Tel. (+81) 489 32 3621, Fax (+81) 489 32 3618
E-Mail: [email protected] E-Mail: [email protected]
Helmut Fischer S.R.L., Tecnica di Misura Fischer Instrumentation (Far East) Ltd. ISO 9001
20128 Milano, Italy Kwai Chung, N.T., Hong Kong SQS Registration
01/01
Tel. (+39) 02 255 26 26, Fax (+39) 02 257 00 39 Tel. (+852) 24 20 11 00, Fax (+852) 24 87 02 18 No. 11899
E-Mail: [email protected] E-Mail: [email protected] Valid for Helmut Fischer AG and Branch Offices
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