SPC Second Edition
SPC Second Edition
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Second Edition
SPC
Statistical Process Control
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ISBN# 978-1-60534-108-8
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CONTROL
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STATISTICAL PROCESS
Daimler Chrysler Corporation, Ford Motor Company, and General Motors Corporation
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STATISTICAL PROCESS CONTROL
SPC
FOREWORD to Second Edition
This Reference Manual was developed by the Statistical Process Control (SPC) Work Group, sanctioned
by the DaimlerChrysler/Ford/General Motors Supplier Quality Requirements Task Force, and under the
auspices of the American Society for Quality (ASQ) and the Automotive Industry Action Group (AIAG).
The Work Group responsible for this Second edition was prepared by the quality and supplier assessment
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staffs at DaimlerChrysler Corporation, Delphi Corporation, Ford Motor Company, General Motors
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Corporation, Omnex, Inc. and Robert Bosch Corporation working in collaboration with the Automotive
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Industry Action Group (AIAG).
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The Task Force charter is to standardize the reference manuals, reporting formats and technical
al
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nomenclature used by DaimlerChrysler, Ford and General Motors in their respective supplier assessment
ma ry
ati
systems. Accordingly, this Reference Manual can be used by any supplier to develop information
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responding to the requirements of either DaimlerChrysler’s, Ford’s or General Motors’ supplier
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assessment systems. This second edition was prepared to recognize the needs and changes within the
automotive industry in SPC techniques that have evolved since the original manual was published in
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1991.
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The manual is an introduction to statistical process control. It is not intended to limit evolution of SPC
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to:
methods suited to particular processes or commodities. While these guidelines are intended to cover
ted y t ira
normally occurring SPC system situations, there will be questions that arise. These questions should be
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directed to your customer’s Supplier Quality Assurance (SQA) activity. If you are uncertain as to how to
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contact the appropriate SQA activity, the buyer in your customer’s purchasing office can help.
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The Task Force gratefully acknowledges: the leadership and commitment of Vice Presidents Peter
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Andersson of General Motors Corporation; the assistance of the AIAG in the development, production
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and distribution of the manual; the guidance of the Task Force principals Hank Gryn (DaimlerChrysler
E- der ocu
Corporation), Russ Hopkins (Ford Motor Company), and Joe Bransky (General Motors Corporation).
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Therefore this manual was developed to meet the specific needs of the automotive industry.
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This Manual is copyrighted by DaimlerChrysler Corporation, Ford Motor Company, and General Motors
Corporation, all rights reserved, 2005. Additional manuals can be ordered from AIAG and/or permission
to copy portions of this manual for use within supplier organizations may be obtained from AIAG at 248-
358-3570 or http://www.aiag.org.
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ACKNOWLEDGEMENTS to Second Edition
The joint consensus on the contents of this document was effected through Task Team Subcommittee
Members representing DaimlerChrysler, Ford, and General Motors, respectively, whose approval
signatures appear below, and who gratefully acknowledge the significant contribution of Gregory Gruska
of Omnex Inc., Gary A. Hiner of Delphi Corporation, and David W. Stamps of The Robert Bosch Corp.
The latest improvements were updating the format to conform to the current AIAG/ ISO/ TS 16949:2002
documentation, more clarification and examples to make the manual more user friendly and additional
areas which where not included or did not exist when the original manual was written.
The current re-write subcommittee is chaired by Mike Down from General Motors Corporation and
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consists of Todd Kerkstra and Dave Benham from DaimlerChrysler Corporation, Peter Cvetkovski from
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Ford Motor Company, Gregory Gruska, as a representative of the Omnex Inc. and ASQ, Gary A. Hiner of
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Delphi Corporation, and David W. Stamps of The Robert Bosch Corp.
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STATISTICAL PROCESS CONTROL
SPC
FOREWORD to First Edition
This Reference Manual was prepared by the quality and supplier assessment staffs at Chrysler, Ford and
General Motors, working under the auspices of the Automotive Division of the American Society for Quality
Control Supplier Quality Requirements Task Force, in collaboration with the Automotive Industry Action
Group.
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The ASQC/AIAG Task Force charter is to standardize the reference manuals, reporting formats and technical
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nomenclature used by Chrysler, Ford and General Motors in their respective supplier assessment systems:
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Supplier Quality Assurance, Total Quality Excellence and Targets for Excellence. Accordingly, this Reference
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Manual can be used by any supplier to develop information responding to the requirements of either
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Chrysler’s, Ford’s or General Motors’ supplier assessment systems. Until now, there has been no unified
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formal approach in the automotive industry on statistical process control. Certain manufacturers provided
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methods for their suppliers, while others had no specific requirements. In an effort to simplify and minimize
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variation in supplier quality requirements, Chrysler, Ford, and General Motors agreed to develop and, through
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AIAG, distribute this manual. The work team responsible for the Manual’s content was led by Leonard A.
Brown of General Motors. The manual should be considered an introduction to statistical process control. It is
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not intended to limit evolution of statistical methods suited to particular processes or commodities nor is it
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intended to be comprehensive of all SPC techniques. Questions on the use of alternate methods should be
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The Task Force gratefully acknowledges: the senior leadership and commitment of Vice Presidents Thomas T.
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Stallkamp at Chrysler, Clinton D. Lauer at Ford, and Donald A. Pais at General Motors; the technical
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competence and hard work of their quality and supplier assessment teams; and the invaluable contributions of
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the Automotive Industry Action Group (under AIAG Executive Director Joseph R. Phelan) in the
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development, production and distribution of this Reference manual. We also wish to thank the ASQC reading
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team led by Tripp Martin of Peterson Spring, who reviewed the Manual and in the process made valuable
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Bruce W. Pince
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Sandy Corporation
Troy, Michigan
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December, 1991
This Manual is copyrighted by Chrysler Corporation, Ford Motor Company, General Motors Corporation,
all rights reserved, 1991. Additional copies can be ordered from A.I.A.G., and/or permission to copy portions
of the Manual for use within supplier organizations may be obtained from A.I.A.G. at (248) 358-3570.
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ACKNOWLEDGEMENTS to First Edition
The joint consensus on the contents of this document was effected through Task Team Subcommittee
Members representing General Motors, Ford, and Chrysler, respectively, whose approval signatures appear
below, and who gratefully acknowledge the significant contribution of Pete Jessup of the Ford Motor
Company, who was responsible for developing the majority of the material found in Chapters I, II, and III, and
the Appendix of this document.
Harvey Goltzer of the Chrysler Corporation contributed concepts relative to process capability and capability
studies, found in the introduction section of Chapter I. Jack Herman of Du Pont contributed some of the
concepts relative to capability and performance indices and the importance of measurement variability, found
in portions of Chapters II and IV, respectively.
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The General Motors Powertrain Division contributed the discussion and examples relative to subgrouping and
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process over-adjustment. The section in Chapter II which provides understanding of process capability and
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related issues was developed by the General Motors Corporate Statistical Review Committee. This committee
also contributed to the development of Chapter IV, Process Measurement Systems Analysis, as well as to some
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Appendix items.
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Finally, valuable input to all sections of the manual was provided by ASQC representatives Gregory Gruska,
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TABLE OF CONTENTS
CHAPTER I ................................................................................................................................................ 1
Continual Improvement and Statistical Process Control......................................................................... 1
Introduction ........................................................................................................................................... 3
Six Points ............................................................................................................................................... 4
CHAPTER I – Section A ............................................................................................................................ 7
Prevention Versus Detection ..................................................................................................................... 7
CHAPTER I – Section B ............................................................................................................................ 9
A Process Control System......................................................................................................................... 9
CHAPTER I – Section C .......................................................................................................................... 13
Variation: Common................................................................................................................................. 13
and Special Causes .................................................................................................................................. 13
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Local Actions And Actions On The System ........................................................................................... 17
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Process Control and Process Capability .................................................................................................. 19
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Approach: ............................................................................................................................................ 32
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Introduction:........................................................................................................................................ 43
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Variables Control Charts .................................................................................................................... 79
Average and Range Charts ( X , R ) ............................................................................................. 79
Average and Standard Deviation Charts ( X , s ) ........................................................................... 83
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Number of Nonconformities Chart (c Chart) ................................................................................... 97
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CHAPTER III ........................................................................................................................................... 99
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Other Types of Control Charts ................................................................................................................ 99
Introduction ....................................................................................................................................... 101
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Probability Based Charts .................................................................................................................. 101
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Charts for Detecting Small Changes ................................................................................................. 109
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Autocorrelated Data .......................................................................................................................... 157
Multiple Stream Process Example..................................................................................................... 162
Effects of Sample Size on Indices....................................................................................................... 168
APPENDIX B .......................................................................................................................................... 171
Some Comments on Special Causes ..................................................................................................... 171
Over-Adjustment ................................................................................................................................ 171
Time Dependent Processes ................................................................................................................ 173
Repeating Patterns............................................................................................................................. 175
APPENDIX C .......................................................................................................................................... 177
Selection Procedure for the Use of the Control Charts Described in This Manual............................... 177
APPENDIX D .......................................................................................................................................... 179
Relationship Between Cpm and Other Indices ....................................................................................... 179
APPENDIX E .......................................................................................................................................... 181
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Table of Constants and Formulas for Control Charts............................................................................ 181
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APPENDIX F .......................................................................................................................................... 185
Capability Index Calculations Example ................................................................................................ 185
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Data Set: ................................................................................................................................................ 186
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Analysis................................................................................................................................................. 187
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INDEX...................................................................................................................................................... 217
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LIST OF ILLUSTRATIONS
Figure I.1: A Process Control System........................................................................................................... 8
Figure I.2: Variation: Common Cause and Special Cause.......................................................................... 12
Figure I.3: Process Control and Process Capability.................................................................................... 18
Figure I.4: The Process Improvement Cycle .............................................................................................. 24
Figure I.5: Control Charts ........................................................................................................................... 28
Figure II.1: Variables Data ......................................................................................................................... 44
Figure II.2: Attributes Data......................................................................................................................... 46
Figure II.3: Elements of Control Charts...................................................................................................... 49
Figure II.4a: Sample Control Chart (Front side)........................................................................................ 51
Figure II.4b: Sample Control Chart (back side) – Event Log ..................................................................... 52
Figure II.5: Extending Control Limits ........................................................................................................ 56
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Figure II.6: Control Limits Recalculation................................................................................................... 61
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Figure II.7: Extend Control Limits for Ongoing Control............................................................................ 64
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Figure II.8: Process Variation Relative to Specification Limits ................................................................. 67
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Figure II.9: Points Beyond Control Limits ................................................................................................. 70
Figure II.10: Runs in an Average Control Chart......................................................................................... 71
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Figure II.11: Runs in a Range Control Chart .............................................................................................. 72
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Figure II.12: Nonrandom Patterns in a Control Chart................................................................................. 74
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Figure II.13: Average and Range Charts .................................................................................................... 78
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Continual Improvement
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Statistical Process Control
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CHAPTER I
Continual Improvement and Statistical Process Control
Introduction
To prosper in today’s economic climate, we – automotive manufacturers,
suppliers and dealer organizations – must be dedicated to continual
improvement. We must constantly seek more efficient ways to produce
products and services. These products and services must continue to
improve in value. We must focus upon our customers, both internal and
external, and make customer satisfaction a primary business goal.
To accomplish this, everyone in our organizations must be committed to
improvement and to the use of effective methods. This manual describes
several basic statistical methods that can be used to make our efforts at
improvement more effective. Different levels of understanding are
needed to perform different tasks. This manual is aimed at practitioners
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and managers beginning the application of statistical methods. It will
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also serve as a refresher on these basic methods for those who are now
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using more advanced techniques. Not all basic methods are included
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here. Coverage of other basic methods (such as check sheets, flowcharts,
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Pareto charts, cause and effect diagrams) and some advanced methods
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(such as other control charts, designed experiments, quality function
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deployment, etc.) is available in books and booklets such as those
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referenced in Appendix H.
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also introduces the control chart, which can be a very effective tool for
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Chapter II describes the construction and use of control charts for both
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Chapter III describes other types of control charts that can be used for
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The term “Variables”, although awkward sounding, is used in order to distinguish the difference
between something that varies, and the control chart used for data taken from a continuous variable.
3
CHAPTER I
Continual Improvement and Statistical Process Control
Six Points
Six points should be made before the main discussion begins:
1) Gathering data and using statistical methods to interpret them are not
ends in themselves. The overall aim should be increased
understanding of the reader’s processes. It is very easy to become
technique experts without realizing any improvements. Increased
knowledge should become a basis for action.
2) Measurement systems are critical to proper data analysis and they
should be well understood before process data are collected. When
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such systems lack statistical control or their variation accounts for a
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substantial portion of the total variation in process data,
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inappropriate decisions may be made. For the purposes of this
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manual, it will be assumed that this system is under control and is
not a significant contributor to total variation in the data. The reader
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is referred to the Measurement Systems Analysis (MSA) Manual
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should be only the first step. Until the processes that generate the
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output become the focus of our efforts, the full power of these
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CHAPTER I
Continual Improvement and Statistical Process Control
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CHAPTER I – Section A
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Prevention Versus Detection
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THE NEED FOR
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Prevention – Avoids Waste
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Detection – Tolerates Waste
PROCESS CONTROL
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CHAPTER I – Section A
Prevention Versus Detection
CHAPTER I – Section A
Prevention Versus Detection
In the past, Manufacturing often depended on Production to make the
product and on Quality Control to inspect the final product and screen
out items not meeting specifications. In administrative situations, work
is often checked and rechecked in efforts to catch errors. Both cases
involve a strategy of detection, which is wasteful, because it allows time
and materials to be invested in products or services that are not always
usable.
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It is much more effective to avoid waste by not producing unusable
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Inc
A prevention strategy sounds sensible – even obvious – to most people.
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However, slogans are not enough. What is required is an understanding
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of the elements of a statistical process control system. The remaining
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As this material is being studied, the reader may wish to refer to the
Glossary in Appendix G for brief definitions of key terms and symbols.
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CHAPTER I – Section B
A Process Control System
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CHAPTER I – Section B
A Process Control System
CHAPTER I – Section B
A Process Control System
A process control system can be described as a feedback system. SPC is
one type of feedback system. Other such systems, which are not
statistical, also exist. Four elements of that system are important to the
discussions that will follow:
1. The Process – By the process, we mean the whole combination of
suppliers, producers, people, equipment, input materials, methods, and
environment that work together to produce output, and the customers
din p
.
who use that output (see Figure I.1). The total performance of the
or ou
gly
process depends upon communication between supplier and customer,
cc Gr
the way the process is designed and implemented, and on the way it is
Inc
d a ion
operated and managed. The rest of the process control system is useful
rke Act
al
only if it contributes either to maintaining a level of excellence or to
on
improving the total performance of the process.
ma ry
ati
ter ust
2. Information About Performance – Much information about the
en e 11
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comes, however, from understanding the process itself and its internal
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target values for those characteristics that result in the most productive
xp
op en ite 426 sed
operation of the process, and then monitor how near to or far from those
h
ro ed E
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
or output) from varying too far from their target values. This ensures the
stability and the variation of the process output is maintained within
Th
9
CHAPTER I – Section B
A Process Control System
din p
.
or ou
gly
cc Gr
Inc
d a ion
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b
en
an is d ume be t is
5
tec
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o
s c um S
E- der ocu
gh
Or is d
Th
10
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Or is d
E- der ocu
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CHAPTER I – Section B
A Process Control System
CHAPTER I – Section C
Variation: Common and Special Causes
din p
.
or ou
gly
cc Gr
Inc
d a ion
SIZE SIZE SIZE
rke Act
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on
DISTRIBUTION CAN DIFFER IN:
ma ry
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xp
GET
ARE PRESENT, THE OUTPUT OF A PROCESS TAR
h
ro ed E
E
LIN
t p wn se
b
en
PREDICTION
an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E
TIM
E- der ocu
SIZE ? GET
? ?? TAR
gh
?
Or is d
SIZE
12
CHAPTER I – Section C
Variation: Common and Special Causes
CHAPTER I – Section C
Variation: Common and Special Causes
In order to effectively use process control measurement data, it is
important to understand the concept of variation, as illustrated in Figure
I.2.
No two products or characteristics are exactly alike, because any process
contains many sources of variability. The differences among products
may be large, or they may be immeasurably small, but they are always
present. The diameter of a machined shaft, for instance, would be
susceptible to potential variation from the machine (clearances, bearing
din p
.
wear), tool (strength, rate of wear), material (diameter, hardness),
or ou
gly
operator (part feed, accuracy of centering), maintenance (lubrication,
cc Gr
replacement of worn parts), environment (temperature, constancy of
Inc
d a ion
power supply) and measurement system. Another example is the time
rke Act
al
required to process an invoice could vary according to the people
on
performing various steps, the reliability of any equipment they were
ma ry
ati
using, the accuracy and legibility of the invoice itself, the procedures
ter ust
en e 11
rn
as m
variation tend to cause changes in the output only over a longer period of
o
o
time. These changes may occur either gradually as with tool or machine
i
d h ut
t
to:
ted y t ira
and conditions over which measurements are made are critical since they
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
will affect the amount of the total variation that will be observed.
b
en
tec
13
CHAPTER I – Section C
Variation: Common and Special Causes
din p
.
either detrimental or beneficial. When detrimental, they need to be
or ou
gly
understood and removed. When beneficial, they should be understood
cc Gr
and made a permanent part of the process. With some mature processes2,
Inc
d a ion
the customer may give special allowance to run a process with a
rke Act
al
consistently occurring special cause. Such allowances will usually
on
require that the process control plans can assure conformance to
ma ry
ati
customer requirements and protect the process from other special causes
ter ust
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b
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an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E- der ocu
gh
Or is d
Th
2
Processes that have undergone several cycles of continual improvement.
14
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
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yri t is Lic 2 to:
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t p wn se
en Ma
ro ed E gn
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15
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or ou
din p
gly
.
Variation: Common and Special Causes
CHAPTER I – Section C
CHAPTER I – Section D
Local Actions And Actions On The System
din p
.
or ou
gly
cc Gr
Local Actions
Inc
d a ion
• Are usually required to eliminate special causes of variation
rke Act
al
• Can usually be taken by people close to the process
on
ma ry
• Can correct typically about 15% of process problems
ati
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o
o
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d i oc nt r: 4 lice
b
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an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E- der ocu
gh
Or is d
Th
16
CHAPTER I – Section D
Local Actions And Actions On The System
CHAPTER I – Section D
Local Actions And Actions On The System
There is an important connection between the two types of variation just
discussed and the types of action necessary to reduce them.3
Simple statistical process control techniques can detect special causes of
variation. Discovering a special cause of variation and taking the proper
action is usually the responsibility of someone who is directly connected
with the operation. Although management can sometimes be involved to
correct the condition, the resolution of a special cause of variation
din p
.
or ou
gly
usually requires local action, i.e., by people directly connected with the
cc Gr
operation. This is especially true during the early process improvement
efforts. As one succeeds in taking the proper action on special causes,
Inc
d a ion
those that remain will often require management action, rather than local
rke Act
al
action.
on
ma ry
ati
These same simple statistical techniques can also indicate the extent of
ter ust
en e 11
common causes of variation, but the causes themselves need more
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identify them and pass them on to management for action. Overall, the
an e A n:
Ma
as m
system.
to:
ted y t ira
xp
op en ite 426 sed
t p wn se
yri t is Lic 2
people directly connected with the operation. The majority – the other
d i oc nt r: 4 lice
b
en
tec
Th Doc Num men
3
Dr. W. E. Deming has treated this issue in many articles; e.g., see Deming (1967).
4
These observations were first made by Dr. J. M. Juran, and have been borne out in Dr. Deming’s
experience.
17
CHAPTER I – Section E
Process Control and Process Capability
PROCESS CONTROL
IN CONTROL
(SPECIAL CAUSE ELIMINATED)
din p
.
or ou
gly
ME
TI
cc Gr
Inc
d a ion
SIZE
rke Act
al
on
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OUT OF CONTROL
ati
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(SPECIAL CAUSES PRESENT)
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d i oc nt r: 4 lice
IN CONTROL AND
b
CAPABLE
en
OF MEETING
an is d ume be t is
5
SPECIFICATIONS
tec
CAUSES
HAS BEEN REDUCED)
s c um S
E- der ocu
gh
Or is d
SIZE
ME
TI
Th
18
CHAPTER I – Section E
Process Control and Process Capability
CHAPTER I – Section E
Process Control and Process Capability
The process control system is an integral part of the overall business
management system.5 As such, the goal of the process control system is
to make predictions about the current and future state of the process. This
leads to economically sound decisions about actions affecting the
process. These decisions require balancing the risk of taking action when
action is not necessary (over-control or “tampering”) versus failing to
take action when action is necessary (under-control).6 These risks should
be handled, however, in the context of the two sources of variation -
special causes and common causes (see Figure I.3).
din p
.
or ou
gly
A process is said to be operating in statistical control when the only
cc Gr
sources of variation are common causes. One function of a process
Inc
d a ion
control system, then, is to provide a statistical signal when special causes
rke Act
al
of variation are present, and to avoid giving false signals when they are
on
not present. This allows appropriate action(s) to be taken upon those
ma ry
ati
special causes (either removing them or, if they are beneficial, making
ter ust
en e 11
rn
The process control system can be used as a one-time evaluation tool but
1
aI
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need to be considered:
Th Doc Num men
•
s c um S
Process capability
E- der ocu
gh
• Process performance
Or is d
5
See TS 16949.
6
See W. E. Deming, (1994), and W. Shewhart, (1931).
19
CHAPTER I – Section E
Process Control and Process Capability
din p
.
or ou
gly
cc Gr
The process must first be brought into statistical control by detecting and
Inc
d a ion
acting upon special causes of variation. Then its performance is
rke Act
predictable, and its capability to meet customer expectations can be
al
on
assessed. This is a basis for continual improvement.
ma ry
ati
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following chart:
gn
an e A n:
Ma
as m
o
o
Statistical Control
i
d h ut
t
to:
ted y t ira
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op en ite 426 sed
In-Control Out-of-Control
h
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n
t p wn se
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d i oc nt r: 4 lice
Capability
an is d ume be t is
5
o
s c um S
E- der ocu
the capability (common cause variation) must be less than the tolerance.
The ideal situation is to have a Case 1 process where the process is in
Th
20
CHAPTER I – Section E
Process Control and Process Capability
• The economics involved in acting upon the special cause exceed the
benefit to any and all customers. Economically allowable special
causes may include tool wear, tool regrind, cyclical (seasonal)
variation, etc.
• The special cause has been identified and has been documented as
consistent and predictable.
In these situations, the customer may require the following:
• The process is mature.
• The special cause to be allowed has been shown to act in a consistent
manner over a known period of time.
• A process control plan is in effect which will assure conformance to
din p
.
specification of all process output and protection from other special
or ou
gly
causes or inconsistency in the allowed special cause.
cc Gr
Inc
See also Appendix A for a discussion on time dependent processes.
d a ion
Process Indices
rke Act
al
on
ma ry
ati
The accepted practice in the automotive industry is to calculate the
ter ust
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as a basis for prediction of how the process will perform. There is little
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is not stable and not repeatable over time. Special causes are responsible
Ma
as m
o
o
ted y t ira
thus can rapidly invalidate prediction about the process. That is, in
xp
h
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t p wn se
yri t is Lic 2
b
en
control.
an is d ume be t is
5
Process indices can be divided into two categories: those that are
tec
Th Doc Num men
total variation when estimating a given index (see also chapter IV).
E- der ocu
gh
21
CHAPTER I – Section E
Process Control and Process Capability
din p
.
or ou
gly
cc Gr
Inc
d a ion
rke Act
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on
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n
t p wn se
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d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E- der ocu
gh
Or is d
Th
22
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
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23
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.
Process Control and Process Capability
CHAPTER I – Section E
CHAPTER I – Section F
The Process Improvement Cycle and Process Control
din p
- Detect special cause
.
- What can go wrong?
or ou
gly
- What is the process doing? variation and act upon it.
cc Gr
- Achieve a state of statistical control.
Inc
d a ion
- Determine capability
rke Act
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on
PLAN DO PLAN DO
ma ry
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ACT ACT
gn
STUDY STUDY
an e A n:
Ma
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to:
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PLAN DO
en
an is d ume be t is
5
3
tec
Th Doc Num men
variation.
Th
24
CHAPTER I – Section F
The Process Improvement Cycle and Process Control
CHAPTER I – Section F
The Process Improvement Cycle and Process Control
In applying the concept of continual improvement to processes, there is a
three-stage cycle that can be useful (see Figure I.4). Every process is in
one of the three stages of the Improvement Cycle.
din p
better understanding of the process are:
.
or ou
gly
cc Gr
• What should the process be doing?
Inc
What is expected at each step of the process?
d a ion
What are the operational definitions of the deliverables?
rke Act
al
on
• What can go wrong?
ma ry
ati
What can vary in this process?
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en e 11
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•
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control?
d h ut
t
to:
ted y t ira
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
gh
• Group meetings
Or is d
7
Chrysler, Ford, and General Motors, (1995).
25
CHAPTER I – Section F
The Process Improvement Cycle and Process Control
din p
.
or ou
gly
Some, perhaps many, processes should be at this stage. However, failure
cc Gr
to proceed to the next stage in this cycle can result in a significant
competitive disadvantage. The attainment of “world class” requires a
Inc
d a ion
steady and planned effort to move into the next stage of the Cycle.
rke Act
al
on
ma ry
ati
3. Improve the Process
ter ust
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Up to this point, the effort has been to stabilize the processes and
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as m
ted y t ira
t p wn se
tec
When new process parameters have been determined, the Cycle shifts
gh
back to Analyze the Process. Since changes have been made, process
Or is d
26
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
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h t i
27
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wa Ind
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d a ion
cc Gr
or ou
din p
gly
.
The Process Improvement Cycle and Process Control
CHAPTER I – Section F
CHAPTER I – Section G
Control Charts: Tools For Process Control and Improvement
CONTROL CHARTS
din p
Upper Control Limit
.
or ou
gly
cc Gr
Inc
d a ion
Center Line
rke Act
al
on
ma ry
ati
ter ust
Lower Control Limit
en e 11
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to:
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1. Collection
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d i oc nt r: 4 lice
2. Control
b
en
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Th Doc Num men
gh
28
CHAPTER I – Section G
Control Charts: Tools For Process Control and Improvement
CHAPTER I – Section G
Control Charts:
Tools For Process Control and Improvement
In his books8, Dr. W. E. Deming identifies two mistakes frequently made
in process control:
“Mistake 1. Ascribe a variation or a mistake to a special cause,
when in fact the cause belongs to the system (common causes).
Mistake 2. Ascribe a variation or a mistake to a system (common
causes), when in fact the cause was special.
din p
.
or ou
gly
Over adjustment [tampering] is a common example of mistake
cc Gr
No. 1. Never doing anything to try to find a special cause is a
Inc
d a ion
common example of mistake No.2.”
rke Act
al
on
For effective variation management during production, there must be an
ma ry
ati
effective means of detecting special causes. There is a common
ter ust
en e 11
rn
as m
o
o
i
d h ut
t
to:
ted y t ira
normal distribution may have no special causes acting upon it but its
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
tec
several classes of methods are useful in this task, the most versatile and
s c um S
E- der ocu
robust is the genre of control charts which were first developed and
implemented by Dr. Walter Shewhart of the Bell Laboratories9 while
gh
Or is d
8
Deming (1989) and Deming (1994).
9
Shewhart (1931).
29
CHAPTER I – Section G
Control Charts: Tools For Process Control and Improvement
din p
.
or ou
gly
economic control of processes; i.e., action is taken on the process only
cc Gr
when special causes are present. To do this, sample statistics are
compared to control limits. But how are these limits determined?
Inc
d a ion
Consider a process distribution that can be described by the normal form.
rke Act
al
on
The goal is to determine when special causes are affecting it. Another
ma ry
way of saying this is, “Has the process changed since it was last looked
ati
ter ust
en e 11
at it or during the period sampled?”
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evidence in the data for all the predictions that might be made from these
an e A n:
Ma
as m
data.
o
o
ted y t ira
the summary should not mislead the user into taking any action that the
xp
op en ite 426 sed
user would not take if the data were presented in a time series.
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
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o
s c um S
E- der ocu
gh
Or is d
Th
30
CHAPTER I – Section G
Control Charts: Tools For Process Control and Improvement
every part produced by the process, but that is usually not economical.
The alternative is to use a sample of the process, and calculate the mean
of the sample.
din p
.
or ou
gly
cc Gr
Inc
d a ion
rke Act
al
If the process has not changed, will the sample mean be equal to the
on
distribution mean?
ma ry
ati
ter ust
en e 11
The answer is that this very rarely happens. But how is this possible?
rn
be otiv /20
After all, the process has not changed. Doesn’t that imply that the
wa Ind
nte
process mean remains the same? The reason for this is that the sample
1
aI
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To make this a little clearer, consider taking a sample of size one. The
an e A n:
Ma
as m
o
mean of the sample is the individual sample itself. With such random
o
i
d h ut
t
to:
ted y t ira
samples from the distribution, the readings will eventually cover the
xp
( )
ro ed E
n
t p wn se
1
yri t is Lic 2
d i oc nt r: 4 lice
n
an is d ume be t is
5
for a sample of size four, the resulting range of sample averages will be
tec
Th Doc Num men
2
s c um S
1 100 = 1
10
gh
Or is d
Th
12
See the Central Limit Theorem.
13
Shewhart selected the ±3 standard deviation limits as useful limits in achieving the economic control of
processes.
31
CHAPTER I – Section G
Control Charts: Tools For Process Control and Improvement
take n samples
din p
calculate x
.
or ou
gly
cc Gr
LCL UCL
Inc
d a ion
due to Sampling Variation
rke Act
al
on
In general, to set up a control chart we calculate:
ma ry
ati
Centerline = average of the statistic being analyzed
ter ust
en e 11
rn
1
LCL = lower control limit = centerline - 3 x standard deviation of the averages
aI
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gn
an e A n:
Ma
as m
Approach:
o
o
i
d h ut
t
to:
ted y t ira
xp
control,” they are useful tools at every stage of the Improvement Cycle
ro ed E
n
(see Chapter I, Section F). Within each stage, the PDSA14 cycle should
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
be used.
an is d ume be t is
5
tec
Th Doc Num men
14
Plan-Do-Study-Act cycle; also known as the PDCA, (Plan-Do-Check-Act) cycle.
32
CHAPTER I – Section G
Control Charts: Tools For Process Control and Improvement
din p
.
or ou
gly
Process capability can also be calculated. If the variation from common
cc Gr
causes is excessive, the process cannot produce output that consistently
meets customer requirements. The process itself must be investigated,
Inc
d a ion
and, typically, management action must be taken to improve the system.
rke Act
al
on
ma ry
ati
ter ust
en e 11
rn
3/3
as m
ted y t ira
used?
h
ro ed E
n
b
en
Often it is found that although the process was aimed at the target
value during initial setup, the actual process location ( µ )15 may not
15
The Greek letter µ is used to indicate the actual process mean, which is estimated by the sample
mean X .
33
CHAPTER I – Section G
Control Charts: Tools For Process Control and Improvement
match this value. For those processes where the actual location
deviates from the target and the ability to relocate the process is
economical, consideration should be given to adjusting the process
so that it is aligned with the target (see Chapter IV, Section C). This
assumes that this adjustment does not affect the process variation.
This may not always hold true, but the causes for any possible
increase in process variation after re-targeting the process should be
understood and assessed against both customer satisfaction and
economics.
The long-term performance of the process should continue to be
analyzed. This can be accomplished by a periodic and systematic
review of the ongoing control charts. New evidence of special
causes might be revealed. Some special causes, when understood,
will be beneficial and useful for process improvement Others will
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be detrimental, and will need to be corrected or removed.
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The purpose of the Improvement Cycle is to gain an understanding of the
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process and its variability to improve its performance. As this
on
understanding matures, the need for continual monitoring of product
ma ry
variables may become less – especially in processes where
ati
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documented analysis shows that the dominant source of variation are
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this variation will have the effect of “shrinking” the control limits on the
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control chart (i.e., the limits, upon their recalculation, will be closer
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together). Many people, not familiar with control charts, feel this is
5
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process is stable and the control limits are calculated correctly, the
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the same regardless of the distance between the control limits (see
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Control Charts: Tools For Process Control and Improvement
CHAPTER I – Section G
CHAPTER I – Section H
Effective Use and Benefits Of Control Charts
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– Higher effective capability
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• Provide a common language for discussing the performance of the
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process
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• Distinguish special from common causes of variation, as a guide to
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36
CHAPTER I – Section H
Effective Use and Benefits Of Control Charts
CHAPTER I – Section H
Effective Use and Benefits of Control Charts
Important benefits can be obtained from the effective use of control
charts. The gains and benefits from the control charts are directly related
to the following:
Management Philosophy: How the company is managed can directly
impact the effectiveness of SPC.
The following are examples of what needs to be present:
• Focus the organization on variation reduction.
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• Establish an open environment that minimizes internal competition
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and supports cross-functional teamwork.
Inc
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• Support and fund management and employee training in the proper
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use and application of SPC.
on
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• Show support and interest in the application and resulting benefits of
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those areas.
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processes.
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can and will have an influence on the level and type of variation in the
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finished product.
E- der ocu
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The following are some ways that engineering can show effective use of
Or is d
SPC:
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37
CHAPTER I – Section H
Effective Use and Benefits Of Control Charts
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• Apply SPC in the understanding of variation in the manufacturing
cc Gr
processes.
Inc
d a ion
• Require an understanding of variation and stability in relation to
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al
measurement and the data that are used for process design
on
ma ry
development.
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employees.
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in the organization.
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SPC.
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38
CHAPTER I – Section H
Effective Use and Benefits Of Control Charts
• Interact and learn about the process from the information collected.
• Use the SPC information in real time to run the process.
din p
quality of the product and process.
.
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CHAPTER I – Section H
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Effective Use and Benefits Of Control Charts
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CHAPTER II
Control Charts
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CHAPTER II
Control Charts
Introduction:
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.
Some of the more common chart types, Average ( X ) and Range ( R )
or ou
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charts, Individuals ( I ) chart, Moving Range ( MR ) chart, etc., belong to
cc Gr
the variables chart family. Charts based on count or percent data (e.g., p,
Inc
d a ion
np, c, u) belong to the attributes chart family.
rke Act
al
When introducing control charts into an organization, it is important to
on
ma ry
prioritize problem areas and use charts where they are most needed.
ati
ter ust
Problem signals can come from the cost control system, user complaints,
en e 11
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overall quality measures often points the way to the specific process
1
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areas that would need more detailed examination including the possible
gn
as m
o
ted y t ira
useful information than attributes data for the same amount of effort. For
example you need a larger sample size for attributes than for variables
xp
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data to have the same amount of confidence in the results. If the use of
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43
CHAPTER II
Control Charts
1 2 3 4 5 6 7 8
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Outcome Example Control Chart Examples
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The measurement method must produce accurate and precise results over time
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Not Accurate
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Accurate*
*Note: Some current metrology literature defines accuracy as the lack of bias.
44
CHAPTER II
Control Charts
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measurement costs due to increased efficiency;
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• Because fewer parts need to be checked before making reliable
Inc
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decisions, the time delay between an “out-of-control” signal and
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corrective action is usually shorter; and
on
ma ry
• With variables data, performance of a process can be analyzed, and
ati
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improvement can be quantified, even if all individual values are
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within the specification limits. This is important in seeking continual
nte
improvement.
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this, control charts for variables are usually prepared and analyzed in
i
d h ut
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to:
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pairs, one chart for process average and another for the process variation.
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The most commonly used pair are the X and R charts. X is the
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number of other control charts that may be more useful under certain
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circumstances.
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The X and R charts may be the most common charts, but they may not
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45
CHAPTER II
Control Charts
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Outcome Example Control Chart Examples
Inc
d a ion
Vehicle does not leak p Chart for Proportion of
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on
Units Nonconforming
Lamp lights does not light
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The conformance criteria must be clearly defined and the procedures for deciding if
en
those criteria are met must produce consistent results over time.
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CHAPTER II
Control Charts
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of door margins to a visual or gage check, or on-time delivery
cc Gr
performance. Control charts for attributes are important for several
reasons:
Inc
d a ion
• Attributes data situations exist in any technical or administrative
rke Act
al
process, so attributes analysis techniques are useful in many
on
ma ry
applications. The most significant difficulty is to develop precise
ati
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operational definitions of what is conforming.
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The only expense involved is for the effort of converting the data to
an e A n:
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are often are not required. There are many occasions where
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attributes form and can benefit from control chart analysis. Examples
s c um S
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management reports.
This manual will use conforming/nonconforming throughout attributes
discussions simply because
• These categories are “traditionally” used
• Organizations just starting on the path to continual improvement
usually begin with these categories
• Many of the examples available in literature use these categories.
It should not be inferred that these are the only “acceptable” categories or
that attributes charts cannot be used with Case 1 processes; see Chapter I,
Section E.17
16
See the Attribute Measurement System Study chapter in the MSA Reference Manual.
17
See also: Montgomery (1997), Wheeler (1991, 1995), Wise and Fair (1998).
47
CHAPTER II
Control Charts
ACT STUDY
• (A) Appropriate scale
IMPROVE
The scale should be such that the natural variation of the process can
be easily viewed. A scale which yields a “narrow” control chart does
not enable analysis and control of the process.
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• (B) Centerline
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48
CHAPTER II
Control Charts
If there has not been any change in the process between subgroups, it is
not necessary to include an entry on the process event log.
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CHAPTER II
Control Charts
For control charts which are included as a part of a report and for those
which are maintained manually the following “header” information
should be included:
• What: part/product/service name and number/identification
• Where: operation/process step information, name/identification
• Who: operator and appraiser
• How: measurement system used, name/number, units (scale)
• How many: subgroup size, uniform or by sample
•
din p
When: sampling scheme (frequency and time)
.
or ou
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Inc
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Figure II.4 shows a completed manually maintained control chart which
includes all these elements
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CHAPTER II - Section A
Control Chart Process
Preparatory Steps
Before control charts can be used, several preparatory steps should be
taken:
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.
or ou
gly
Determine the features or characteristics to be charted based on:
cc Gr
Inc
d a ion
The customer’s needs.
rke Act
al
Current and potential problem areas.
on
ma ry
Correlation between characteristics.
ati
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conditions.
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variables.
53
CHAPTER II - Section A
Control Charting Process
din p
.
or ou
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subsequent process analysis.
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Inc
Assure selection scheme is appropriate for detecting expected
d a ion
special causes.
rke Act
al
on
ma ry
WARNING: Even though convenience sampling and/or haphazard
ati
ter ust
sampling is often thought of as being random sampling, it is not. If one
en e 11
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assumes that it is, and in reality it is not, one carries an unnecessary risk
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54
CHAPTER II - Section A
Control Charting Process
Data Collection
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Control charts are developed from measurements of a particular
cc Gr
characteristic or feature of the process. These measurements are
combined into a (control) statistic (e.g., average, median, range, standard
Inc
d a ion
deviation, individual) which describes an attribute of the process
rke Act
al
distributional form. The measurement data are collected from individual
on
samples from a process stream. The samples are collected in subgroups
ma ry
ati
and may consist of one or more pieces. In general, a larger subgroup size
ter ust
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selected so that the chance for variation due to special causes occurring
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consecutive samples for the subgroups minimizes the opportunity for the
Th Doc Num men
The sampling frequency will determine the opportunity the process has
E- der ocu
18
See also Appendix A.
55
Control Charting Process
CHAPTER II - Section A
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The subgroup size should remain constant but there may be situations
where the subgroup size varies within a single control chart. The
calculation of the control limits depends on the subgroup size and if one
varies the subgroup size the control limits will change for that subgroup.
There are other techniques that deal with variable subgroup sizes; for
example, see Montgomery (1997) and Grant and Leavenworth (1996).
Subgroup Frequency – The subgroups are taken sequentially in time,
e.g., once every 15 minutes or twice per shift. The goal is to detect
changes in the process over time. Subgroups should be collected often
enough, and at appropriate times so that they can reflect the potential
opportunities for change. The potential causes of change could be due to
work-shift differences, relief operators, warm-up trends, material lots,
etc.
din p
.
Number of Subgroups – The number of subgroups needed to establish
or ou
gly
control limits should satisfy the following criterion: enough subgroups
cc Gr
should be gathered to assure that the major sources of variation which
Inc
d a ion
can affect the process have had an opportunity to appear. Generally, 25
rke Act
al
or more subgroups containing about 100 or more individual readings
on
give a good test for stability and, if stable, good estimates of the process
ma ry
ati
location and spread. This number of subgroups ensures that the effect of
ter ust
en e 11
rn
In some cases, existing data may be available which could accelerate this
1
aI
first stage of the study. However, they should be used only if they are
3/3
gn
as m
documented.
d h ut
t
to:
ted y t ira
Sampling Scheme – If the special causes affecting the process can occur
xp
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selected. A random sample is systematic and planned; that is, all sample
an is d ume be t is
5
tec
points are determined before any data are collected. For special causes
Th Doc Num men
that are known to occur at specific times or events, the sampling scheme
s c um S
57
CHAPTER II - Section A
Control Charting Process
din p
.
or ou
This should also include a space for the calculations based
gly
on the readings and the calculated control statistic(s).
cc Gr
Inc
d a ion
For plotting each of the control statistics being analyzed.
rke Act
al
on
The value for the control statistic is usually plotted on the
ma ry
ati
vertical scale and the horizontal scale is the sequence in
ter ust
en e 11
rn
time. The data values and the plot points for the control
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minimum values.
o
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to:
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To log observations.
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CHAPTER II - Section A
Control Charting Process
Plot the control statistic on the chart. Make sure that the plot points for
the corresponding control statistics are aligned vertically. Connect the
points with lines to help visualize patterns and trends.
The data should be reviewed while they are being collected in order to
identify potential problems. If any points are substantially higher or
lower than the others, confirm that the calculations and plots are correct
and log any pertinent observations.
din p
Control limits are defined by the natural variation of the control statistic.
.
or ou
gly
They define a range of values that the control statistic could randomly
cc Gr
fall within, given there is only common cause to the variation. If the
Inc
d a ion
average of two different subgroups from the same process is calculated,
it is reasonable to expect that they will be about the same. But since they
rke Act
al
on
were calculated using different parts, the two averages are not expected
ma ry
to be identical. Even though the two averages are different, there is a
ati
ter ust
en e 11
limit to how different they are expected to be, due to random chance.
rn
be otiv /20
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This is the basis for all control chart techniques. If the process is stable
3/3
gn
probability that for any subgroup sample the calculated control statistic
as m
o
o
will fall within the control limits. If the control statistic exceeds the
i
d h ut
t
to:
ted y t ira
control limits then this indicates that a special cause variation may be
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present.
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CHAPTER II - Section A
Control Charting Process
din p
In the subsequent discussion, the Average will be used for the location
.
or ou
gly
control statistic and the Range for the variation control statistic. The
cc Gr
conclusions stated for these control statistics also apply equally to the
Inc
other possible control statistics.
d a ion
Since the control limits of the location statistic are dependent on the
rke Act
al
on
variation statistic, the variation control statistic should be analyzed first
ma ry
ati
for stability. The variation and location statistics are analyzed separately,
ter ust
en e 11
rn
but comparison of patterns between the two charts may sometimes give
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o
o
i
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chart is analyzed first. The data points are compared with the control
en
limits, for points out of control or for unusual patterns or trends (see
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For each indication of a special cause in the range chart data, conduct an
Th
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CHAPTER II - Section A
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t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E- der ocu
gh
Or is d
Th
61
CHAPTER II - Section A
Control Charting Process
din p
.
or ou
gly
revised R and X should be used to recalculate the trial control limits
cc Gr
for averages, X ± A2 R (see Figure II.6).
Inc
d a ion
rke Act
al
NOTE: The exclusion of subgroups representing unstable conditions is
on
not just “throwing away bad data.” Rather, by excluding the points
ma ry
ati
affected by known special causes, there is a better estimate of the
ter ust
en e 11
rn
the most appropriate basis for the control limits to detect future
occurrences of special causes of variation. Be reminded, however, that
1
aI
3/3
the process must be changed so the special cause will not recur (if
gn
as m
o
o
i
d h ut
t
to:
ted y t ira
h
ro ed E
Once the special cause which affect the variation (Range Chart) have
n
t p wn se
yri t is Lic 2
been identified and their effect have been removed, the Average Chart
d i oc nt r: 4 lice
b
en
can be evaluated for special causes. In Figure II.6 the new control limits
an is d ume be t is
for the averages indicate that two samples are out of control.
5
tec
Th Doc Num men
for the special cause; correct that condition, and prevent it from
gh
recurring. Use the chart data as a guide to when such conditions began
Or is d
62
CHAPTER II - Section A
Control Charting Process
Final Comments
The preceding discussions were intended to give a functional
introduction to control chart analysis. Even though these discussions
used the Average and Range Charts, the concepts apply to all control
chart approaches.
Furthermore, there are other considerations that can be useful to the
analyst. One of the most important is the reminder that, even with
processes that are in statistical control, the probability of getting a false
din p
signal of a special cause on any individual subgroup increases as more
.
or ou
gly
data are reviewed.
cc Gr
While it is wise to investigate all signals as possible evidence of special
Inc
d a ion
causes, it should be recognized that they may have been caused by the
rke Act
al
system and that there may be no underlying local process problem. If no
on
clear evidence of a special cause is found, any “corrective” action will
ma ry
ati
probably serve to increase, rather than decrease, the total variability in
ter ust
en e 11
rn
3/3
as m
Gordon (1978), Ishikawa (1976), Wheeler (1991, 1995), and Ott (2000).
o
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E- der ocu
gh
Or is d
Th
63
Control Charting Process
CHAPTER II - Section A
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i
64
an e A n: o rn
ati
d h ut on
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1 al
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en e 11
wa Ind
ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
din p
gly
When the initial (or historical) data are consistently contained within the
trial control limits, extend the limits to cover future periods. It might be
desirable here to adjust the process to the target if the process center is
off target. These limits would be used for ongoing monitoring of the
process, with the operator and local supervision responding to signs of
out-of-control conditions on either the location and variation X or R
chart with prompt action (see Figure II.7).
A change in the subgroup sample size would affect the expected average
range and the control limits for both ranges and averages. This situation
din p
.
or ou
gly
could occur, for instance, if it were decided to take smaller samples more
cc Gr
frequently, so as to detect large process shifts more quickly without
Inc
increasing the total number of pieces sampled per day. To adjust central
d a ion
lines and control limits for a new subgroup sample size, the following
rke Act
al
steps should be taken:
on
ma ry
ati
• Estimate the process standard deviation (the estimate is shown as
ter ust
en e 11
rn
3/3
2
gn
as m
h
ro ed E
n
n 2 3 4 5 6 7 8 9 10
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
tec
Th Doc Num men
o
s c um S
E- der ocu
• Using the table factors based on the new subgroup size, calculate the
gh
Rnew = σˆ C ⋅ d 2
Plot these new control limits on the chart as the basis for ongoing process
control. As long as the process remains in control for both averages and
ranges, the ongoing limits can be extended for additional periods. If,
however, there is evidence that the process average or range has changed
(in either direction), the cause should be determined and, if the change is
justifiable, control limits should be recalculated based on current
performance.
19
This manual will distinguish between the estimated standard deviation due to the within-subgroup
variation and the total variation by using the subscripts “C” and “P”, respectively.
65
CHAPTER II - Section A
Control Charting Process
din p
.
or ou
gly
Obviously, there are different levels or degrees of statistical control. The
cc Gr
definition of control used can range from mere outliers (beyond the
Inc
d a ion
control limits), through runs, trends and stratification, to full zone
rke Act
al
analysis. As the definition of control used advances to full zone analysis,
on
the likelihood of finding lack of control increases (for example, a process
ma ry
ati
with no outliers may demonstrate lack of control through an obvious run
ter ust
en e 11
rn
still within the control limits). For this reason, the definition of control
be otiv /20
wa Ind
nte
used should be consistent with your ability to detect this at the point of
1
aI
control and should remain the same within one time period, within one
3/3
process. Some suppliers may not be able to apply the fuller definitions of
gn
as m
o
ted y t ira
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E- der ocu
gh
Or is d
Th
20
AT&T (1984)
66
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i
67
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wa Ind
ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
din p
gly
.
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i
68
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ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
din p
gly
.
CHAPTER II - Section B
Defining “Out of Control” Signals
CHAPTER II - Section B
Defining “Out-of-Control” Signals
Point Beyond a Control
Limit.
.
The presence of one or more points beyond either control limit is primary
evidence of special cause variation at that point. This special cause could
have occurred prior to this point.
din p
.
or ou
gly
Since points beyond the control limits would be rare if only variation
cc Gr
from common causes were present, the presumption is that a special
Inc
d a ion
cause has accounted for the extreme value. Therefore, any point beyond
a control limit is a signal for analysis of the operation for the special
rke Act
al
cause. Mark any data points that are beyond the control limits for
on
ma ry
investigation and corrective action based on when that special cause
ati
ter ust
en e 11
actually started.
rn
be otiv /20
wa Ind
nte
following:
3/3
gn
as m
o
o
ted y t ira
of a trend.
h
ro ed E
n
instrument).
en
an is d ume be t is
5
For charts dealing with the spread, a point below the lower control limit
s c um S
gh
When the ranges are in statistical control, the process spread – the
within-subgroup variation – is considered to be stable. The averages can
then be analyzed to see if the process location is changing over time.
Since control limits for X are based upon the amount of variation in the
ranges, then if the averages are in statistical control, their variation is
related to the amount of variation seen in the ranges – the common-cause
69
CHAPTER II - Section B
Defining “Out of Control” Signals
variation of the system. If the averages are not in control, some special
causes of variation are making the process location unstable.
din p
.
or ou
gly
cc Gr
Inc
d a ion
rke Act
al
on
ma ry
ati
ter ust
en e 11
rn
be otiv /20
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1
aI
3/3
gn
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
tec
Th Doc Num men
The presence of unusual patterns or trends, even when all ranges are
Th
70
CHAPTER II - Section B
Defining “Out of Control” Signals
Runs
Runs – Each of the following are signs that a process shift or trend has
begun:
din p
.
or ou
gly
cc Gr
Inc
d a ion
rke Act
al
on
ma ry
ati
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
1
aI
3/3
gn
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E- der ocu
gh
Or is d
Th
71
CHAPTER II - Section B
Defining “Out of Control” Signals
din p
.
or ou
gly
cc Gr
Inc
d a ion
rke Act
al
on
ma ry
ati
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en e 11
rn
be otiv /20
wa Ind
nte
1
aI
3/3
gn
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
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xp
op en ite 426 sed
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
tec
Th Doc Num men
A run below the average range, or a run down, signifies one or both of
s c um S
E- der ocu
the following:
gh
process improvement.
A change in the measurement system, which could mask real
performance changes.
72
CHAPTER II - Section B
Defining “Out of Control” Signals
din p
.
or ou
gly
Distance of points from R or X : Generally, about 2/3 of the plotted
cc Gr
points should lie within the middle third of the region between the
Inc
control limits; about 1/3 of the points should be in the outer two-thirds of
d a ion
the region. If substantially more than 2/3 of the plotted points lie close to
rke Act
al
on
R or X investigate one or more of the following:
ma ry
ati
ter ust
• The control limits or plot points have been miscalculated or
en e 11
rn
•
1
aI
streams that have very different process averages (e.g., one piece
an e A n:
Ma
as m
o
ted y t ira
• The data have been edited (subgroups with ranges that deviated
xp
op en ite 426 sed
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
If substantially fewer than 2/3 of the plotted points lie close to R (for 25
an is d ume be t is
5
tec
misplotted.
Or is d
73
CHAPTER II - Section B
Th
Or is d
E- der ocu
Defining “Out of Control” Signals
74
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wa Ind
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ma ry
rke Act
d a ion
cc Gr
or ou
din p
din p
3 6 points in a row, all increasing or all decreasing
.
or ou
gly
4 14 points in a row, alternating up and down
cc Gr
Inc
5 2 out of 3 points > 2 standard deviations from centerline (same side)
d a ion
6 4 out of 5 points > 1 standard deviation from centerline (same side)
rke Act
al
on
7 15 points in a row within 1 standard deviation of centerline (either side)
ma ry
ati
ter ust
8 8 points in a row > 1 standard deviation from centerline (either side)
en e 11
rn
be otiv /20
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Table II.1
1
aI
3/3
gn
Note 1: Except for the first criterion, the numbers associated with the
an e A n:
Ma
as m
ted y t ira
process.
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
21
In this table, “standard deviation” refers to the standard deviation used in the calculations of the
control limits.
75
CHAPTER II - Section B
Defining “Out of Control” Signals
din p
.
or ou
gly
1
cc Gr
ARL0 =
Pr {Type I Error }
Inc
d a ion
rke Act
al
The ARL is dependent on how out-of-control signals are defined, the
on
true target value’s deviation from the estimate, and the true variation
ma ry
ati
ter ust
relative to the estimate.
en e 11
rn
be otiv /20
wa Ind
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control chart with exceeding the ± 3σ X control limits as the only out-of-
3/3
gn
control signal.
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
Shift in Target
xp
op en ite 426 sed
h
ro ed E
σX ARL
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
0 370.4
an is d ume be t is
5
0.1 352.9
tec
Th Doc Num men
0.2 308.4
s c um S
E- der ocu
0.3 253.1
gh
Or is d
0.5 155.2
Th
1.0 43.9
1.5 15.0
2.0 6.3
3.0 2.0
4.0 1.2
This table indicates that a mean shift of 1.5 standard deviations (of the
mean) would be signaled (on average) by the 15th subgroup after the
shift. A shift of 4 standard deviations would be identified within 2
subgroups.
76
CHAPTER II - Section B
Defining “Out of Control” Signals
This table also shows that a false signal may be indicated for a process
without a shift (i.e., the process remains in statistical control) every 370
subgroups (on average).
σ
Since σ X = , the practical magnitude of the shifts can be reduced by
n
increasing the number of items in each subgroup. Larger subgroups
reduce the size of σ X and tighten the control limits around X .
din p
.
or ou
gly
the runs test of 7-points in a row on one side of X .
cc Gr
Inc
d a ion
Shift in Target
rke Act
al
σ X ’s on
ma ry
ati
ARL
ter ust
en e 11
rn
0
be otiv /20 59.8
wa Ind
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1
aI
0.1 53.9
3/3
gn
0.2 41.8
an e A n:
Ma
as m
o
0.3 30.8
o
i
d h ut
t
to:
ted y t ira
0.5 17.9
xp
op en ite 426 sed
1.0 8.7
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
1.5 6.9
en
an is d ume be t is
2.0 6.1
5
tec
Th Doc Num men
3.0 2.0
o
s c um S
4.0 1.2
E- der ocu
gh
Or is d
reduces the ARLs for small shifts in the mean, a decrease in the risk of a
Type II error. Note that the zero-shift (the in-control) ARL is also
reduced significantly. This is an increase in the risk of a Type I error or
false alarm.
This balance between wanting a long ARL when the process is in
control versus a short ARL when there is a process change has led to the
development of other charting methods. Some of those methods are
briefly described in Chapter III.
77
Control Chart Formulas:
CHAPTER II - Section C
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
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78
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wa Ind
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ma ry
rke Act
d a ion
CHAPTER II - Section C
Control Chart Formulas
Control chart constants for all control charts discussed in this section are
listed in Appendix E.
din p
.
or ou
gly
Subgroup Average:
cc Gr
Inc
d a ion
x1 + x2 + ... + xn
X = ;
rke Act
al
n
on
ma ry
n = number of samples in a subgroup
ati
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
Subgroup Range:
1
aI
3/3
gn
as m
o
o
i
d h ut
t
to:
Grand Average:
ted y t ira
xp
op en ite 426 sed
X 1 + X 2 + ... + X k
h
ro ed E
X= ;
n
k
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
Average Range:
s c um S
E- der ocu
R1 + R2 + ....Rk
gh
R= ;
Or is d
k
Th
σˆ C = R d
2
σˆ X = σ C
ˆ
n
79
Control Chart Formulas:
CHAPTER II - Section C
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
CLR = R
CLX = X
t p wn se Ma
ro ed E gn
tec b xp aI
Chart Features:
80
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wa Ind
ter ust
UCLR = D4 R
ma ry
Control Limits
UCLX = X + A2 R
rke Act
d a ion
cc Gr
or ou
din p
gly
.
LCLR = D3 R
LCLX = X − A2 R
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i
81
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ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
din p
gly
.
Control Chart Formulas:
CHAPTER II - Section C
Control Chart Formulas:
CHAPTER II - Section C
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
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t p wn se
en Ma
ro ed E gn
tec b xp aI
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82
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wa Ind
ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
din p
sk =
∑(X i ,k −X k )2
n −1
din p
.
or ou
gly
Grand Average:
cc Gr
X 1 + X 2 + ... + X k
Inc
d a ion
X=
k
rke Act
al
on
k = number of subgroups used to determine
ma ry
ati
the Grand Average and Average
ter ust
en e 11
rn
1
aI
3/3
gn
as m
s1 + s2 + ....sk
o
o
i
s=
d h ut
t
to:
ted y t ira
k
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
σˆ C = s c
5
tec
Th Doc Num men
4
s c um S
gh
σˆ X = σ C
Or is d
ˆ
n
Th
Chart Features:
Centerline Control Limits
CLX = X UCLX = X + A3 s LCLX = X − A3 s
22
Also known as the pooled standard deviation.
83
Control Chart Formulas:
CHAPTER II - Section C
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i
84
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en e 11
wa Ind
ter ust
ma ry
rke Act
n2+1
din p
X if n is odd
.
or ou
gly
X k = n
cc Gr
n+2
X + X 2
2
Inc
d a ion
if n is even
2
rke Act
al
on
n = number of elements in a subgroup
ma ry
ati
ter ust
en e 11
rn
3/3
gn
Subgroup Range:
an e A n:
Ma
as m
o
o
ted y t ira
xp
op en ite 426 sed
Average Median:
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
X 1 + X 2 + ... + X k
b
X =
en
;
k
an is d ume be t is
5
tec
Th Doc Num men
Average Range:
o
s c um S
R1 + R2 + ....Rk
E- der ocu
R= ;
gh
k
Or is d
σˆ C = R d
2
Chart Features:23
Centerline Control Limits
23
This approach to the Median Chart uses averages in the calculation of the centerline and control
limits. There are other approaches in the literature which do not use averages.
85
Control Chart Formulas:
CHAPTER II - Section C
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i
86
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wa Ind
ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
din p
din p
.
or ou
gly
cc Gr
Average Moving Range:
Inc
d a ion
MR2 + MR3 + ....MRk
MR =
rke Act
al
k −1
on
ma ry
ati
Estimate of the Standard Deviation of X :
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
σˆ C = R d
1
aI
2
3/3
gn
an e A n:
Ma
as m
o
o
Chart Features:
i
d h ut
t
to:
ted y t ira
h
ro ed E
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
tec
Th Doc Num men
Because moving ranges are involved, the points being plotted on the
s c um S
E- der ocu
range chart are correlated. Therefore, valid signals occur only in the
gh
form of points beyond the control limits. Other rules used to evaluate the
Or is d
data for non-random patterns (see Chapter II, Section B) are not reliable
indicators of out-of-control conditions.
Th
87
Control Chart Formulas:
CHAPTER II - Section C
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i
88
an e A n: o rn
ati
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1 al
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en e 11
wa Ind
ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
din p
.
or ou
gly
tracking positive events. However, we will follow tradition and refer to
cc Gr
these as nonconformances and nonconformities.
Inc
d a ion
rke Act
al
Proportion Nonconforming (p Chart)
on
ma ry
ati
ter ust
en e 11
Guideline:
rn
be otiv /20
wa Ind
nte
an e A n:
Ma
as m
o
o
i
Individual Value
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
npi
pi = ni = number of parts inspected;
h
ro ed E
ni
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
tec
Th Doc Num men
n1 + n2 + .... + nk
Th
p1 + p2 + .... + pk
p= if all the ni’s are equal
k
24
An alternative to these charts is the Individuals and Moving Range Chart (see Wheeler (1995)).
89
CHAPTER II - Section C
Control Chart Formulas:
Chart Features:
Centerline Control Limits
p (1 − p )
CLp = p UCLPi = p + 3
ni
p (1 − p )
LCLPi = p − 3
ni
din p
.
or ou
Control Limits
gly
cc Gr
p (1 − p )
Inc
d a ion
UCLP = p + 3
n
rke Act
al
p (1 − p ) on
ma ry
ati
LCLP = p − 3
ter ust
en e 11
rn
be otiv /20n
wa Ind
nte
1
aI
3/3
an e A n:
Ma
as m
min ni
≥ 0.75 )
o
max ni
to:
ted y t ira
xp
op en ite 426 sed
Control Limits
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
p (1 − p )
en
n
tec
Th Doc Num men
p (1 − p )
s c um S
n
gh
Or is d
Example Uses:
Th
25
This is alternatively known as FTC (First Time Capability) and RTY (Rolled Throughput Yield).
26
This chart is sometimes called a q-chart; this is based on the practice of calculating the parameter
q = 1 – p.
90
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i
91
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wa Ind
This page intentionally left blank
ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
din p
gly
.
Control Chart Formulas:
CHAPTER II - Section C
Control Chart Formulas:
CHAPTER II - Section C
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i
92
an e A n: o rn
ati
d h ut on
as m o 3/3
1 al
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en e 11
wa Ind
ter ust
ma ry
rke Act
d a ion
cc Gr
Individual Value:
npi n = number of parts inspected;
din p
.
or ou
gly
np = number of nonconforming items found
cc Gr
Inc
Average of Individual Values:
d a ion
rke Act
al
np1 + np2 + .... + npk
np =
on
ma ry
k
ati
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
Chart Features:
1
aI
3/3
gn
as m
o
o
np
i
d h ut
t
to:
n
xp
op en ite 426 sed
h
ro ed E
n
np
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
n
an is d ume be t is
5
tec
Th Doc Num men
Example Uses:
s c um S
E- der ocu
•
gh
Number conforming
Number of items above (or below) a threshold value
• Judgment Decisions
Number of items within a specified category
Number of items above (or below) a threshold value
Number of times a condition occurs
93
Control Chart Formulas:
CHAPTER II - Section C
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i
94
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wa Ind
ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
din p
gly
din p
.
or ou
gly
u1 + u2 + .... + uk
cc Gr
u=
Inc
k
d a ion
rke Act
al
Chart Features:
on
ma ry
Centerline Control Limits
ati
ter ust
en e 11
rn
be otiv /20 3 u u
wa Ind
nte
CLu = u UCLu = u + =u +3
ni ni
1
aI
3/3
gn
an e A n:
3 u u
Ma
as m
LCLu = u −
=u −3
o
o
i
ni ni
d h ut
t
to:
ted y t ira
h
ro ed E
min ni
n
t p wn se
yri t is Lic 2
≥ 0.75 )
d i oc nt r: 4 lice
max ni
an is d ume be t is
5
tec
Th Doc Num men
Control Limits:
o
s c um S
E- der ocu
3 u u
UCLu = u + = u +3 ( n = average sample size)
gh
n
Or is d
n
Th
3 u u
LCLu = u − = u −3 ( n = average sample size)
n n
Example Uses:
• Accept/Reject Decisions with variable number items per unit
Quality rates for specified unit designation
Average number (rate) of nonconformities per unit
Average number (rate) of items within one or more categories
• Judgment Decisions
Average number (rate) of items within one or more categories
Average number (rate) of items above (or below) a threshold
value per unit
95
Control Chart Formulas:
CHAPTER II - Section C
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i
96
an e A n: o rn
ati
d h ut on
as m o 3/3
1 al
be otiv /20 Inc
en e 11
wa Ind
ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
Individual Value:
ci = number of nonconformities found in sample; i = 1,… , k
din p
.
or ou
gly
cc Gr
Inc
d a ion
Average of Individual Values:
rke Act
al
c1 + c2 + .... + ck
on
c= k = number of samples
ma ry
k
ati
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
Chart Features:
1
aI
3/3
gn
as m
o
CLC = c UCLC = c + 3 c
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
LCLC = c − 3 c
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
Example Uses:
an is d ume be t is
5
tec
Th Doc Num men
• Judgment Decisions
Th
97
Control Chart Formulas:
CHAPTER II - Section C
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i
98
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ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
din p
gly
.
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i
99
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en e 11
CHAPTER III
wa Ind
ter ust
ma ry
rke Act
d a ion
cc Gr
Other Types of Control Charts
or ou
din p
gly
.
CHAPTER III
Other Types of Control Charts
CONTROL CHARTS
din p
.
or ou
gly
Center Line
cc Gr
Inc
d a ion
rke Act
al
on
Lower Control Limit
ma ry
ati
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
1
aI
3/3
gn
an e A n:
Ma
as m
o
o
i
1. Collection
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
t p wn se
2. Control
yri t is Lic 2
d i oc nt r: 4 lice
b
en
tec
Th Doc Num men
gh
Or is d
100
CHAPTER III
Other Types of Control Charts
Introduction
There are several types of control charts other than those discussed in the
previous chapters. Most of these charts were developed to address
specific process situations or conditions which can affect the optimal use
of the standard control charts. A brief description of the more common
charts will follow below. This description will define the charts, discuss
when they should be used and list the formulas associated with the chart,
as appropriate. If more information is desired regarding these charts or
others, please consult a reference text that deals specifically with these
types of control charts.
din p
.
or ou
gly
cc Gr
Probability based charts belong to a class of control charts that uses
Inc
d a ion
categorical data and the probabilities related to the categories. The
analysis of categorical data generally uses the binomial, multinomial or
rke Act
al
on
poisson distribution. Examples of these charts are the attributes charts
ma ry
ati
discussed in Chapter II Section C. The attributes charts use the categories
ter ust
en e 11
rn
of “good” and “bad” (e.g., conforming and nonconforming). However,
be otiv /20
wa Ind
nte
there is nothing inherent in any of these forms (or any other forms) that
requires one or more categories to be “bad.”
1
aI
3/3
gn
as m
is the student’s. There is a tendency to take the easy way out, using
i
d h ut
t
to:
ted y t ira
that quality practitioners once had (or were constrained to) the tolerance
h
ro ed E
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
Stoplight Control
o
s c um S
With stoplight control charts, the process location and variation are
E- der ocu
controlled using one chart. The chart tracks the number of data points in
gh
Red
Or is d
Yellow the sample in each of the designated categories. The decision criteria are
based on the expected probabilities for these categories.
Th
Green
A typical scenario will divide the process variation into three parts:
warning low, target, warning high. The areas outside the expected
process variation ( 6σ̂ ) are the stop zones. One simple but effective
control procedure of this type is stoplight control which is a semi-
variables (more than two categories) technique using double sampling. In
this approach the target area is designated green, the warning areas as
yellow, and the stop zones as red. The use of these colors gives rise to
the “stoplight” designation.
101
CHAPTER III
Other Types of Control Charts
LSL LSL
Stop Stop
Warning Warning
Target
Target
Warning
Stop
Warning
din p
.
or ou
gly
cc Gr
Stop
Inc
USL USL
d a ion
rke Act
al
on
ma ry
ati
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
3/3
gn
an e A n:
Ma
as m
tec
Th Doc Num men
the process. That is, this is an appropriate tool for stage 2 activities27
E- der ocu
27
See Chapter I, Section F.
102
CHAPTER III
Other Types of Control Charts
din p
.
or ou
gly
red.
cc Gr
If the process distribution follows the normal form, approximately
Inc
d a ion
86.6% of the distribution is in the green area, 13.2% is in the yellow area
rke Act
al
and 0.3% is in the red area. Similar conditions can be established if the
on
distribution is found to be non-normal.
ma ry
ati
Setup
ter ust
en e 11
For control equivalent to an X and R chart with a sample size of 5, the
rn
Process
be otiv /20
wa Ind
nte
1. Check 2 pieces; if both pieces are in the green area, continue to run.
3/3
Normal
gn
Production
2. If one or both are in the red zone, stop the process, notify the
an e A n:
Ma
as m
designated person for corrective action and sort material. When setup
o
o
i
d h ut
t
to:
Select 2
Yes
Samples
xp
op en ite 426 sed
3. If one or both are in a yellow zone, check three more pieces. If any
h
ro ed E
pieces fall in a red zone, stop the process, notify the designated
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
All person for corrective action and sort material. When setup or other
b
en
Green?
corrections are made, repeat step # l.
an is d ume be t is
5
tec
No
If no pieces fall in a red zone, but three or more are in a yellow
Th Doc Num men
Implement zone (out of 5 pieces) stop the process, notify the designated
s c um S
No Any Red? Yes Reaction person for corrective action. When setup or other corrections are
E- der ocu
Plan
made, repeat step #1.
gh
Or is d
No If three pieces fall in the green zone and the rest are yellow,
continue to run.
Th
Select 3
Additional
Samples
Measurements can be made with variables as well as attributes gaging.
Certain variables gaging such as dial indicators or air-electronic columns
Yes are better suited for this type of program since the indicator background
Any Red? can be color coded. Although no charts or graphs are required, charting is
Yes recommended, especially if subtle trends (shifts over a relatively long
period of time) are possible in the process.
3 -5
Yellow?
In any decision-making situation there is a risk of making a wrong
decision. With sampling, the two types of errors are:
• Probability of calling the process bad when it is actually good
(false alarm rate).
• Probability of calling the process good when it is actually bad
(miss rate).
103
CHAPTER III
Other Types of Control Charts
din p
.
or ou
gly
cc Gr
Pre-Control
Inc
d a ion
An application of the stoplight control approach for the purpose of
rke Act
al
on
nonconformance control instead of process control is called Pre-
ma ry
control. It is based on the specifications not the process variation. Its
ati
ter ust
en e 11
origins can be traced to work by Frank Satterthwaite from Rath & Strong
rn
1
aI
3/3
gn
as m
• the process has a flat loss function (see section on Loss Function, in
o
o
i
d h ut
t
Chapter IV.)
to:
ted y t ira
xp
op en ite 426 sed
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
The first assumption means that all special sources of variation in the
tec
Th Doc Num men
process are being controlled. The second assumption states that 99.73%
o
that Nominal ± ¼ Tolerance is labeled as the green area and the rest of
the area within the specification is yellow. The area outside the
Th
specifications is labeled red. For a process that is normal with Cp, Cpk
equal to 1.00, approximately 86.6% of the pieces are in the green area,
13.2% are in the yellow area and 0.3% are in the red area. Similar
calculations could be done if the distribution was found to be non-normal
or highly capable.
The pre-control sampling uses a sample size of two. However, before the
sampling can start, the process must produce 5 consecutive parts in the
green zone. Each of the two data points are plotted on the chart and
reviewed against a set of rules.
28
See Bhote (1991) and ASQ Statistics Newsletter Vol 05 No 2 Feb. 1984.
104
CHAPTER III
Other Types of Control Charts
Nominal Nominal
din p
.
or ou
gly
cc Gr
Nom + ¼ Tol Nom + ¼ Tol
Inc
d a ion
rke Act
al
Nom + ½ Tol USL Nom + ½ Tol
on
USL
ma ry
ati
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
1
aI
3/3
gn
as m
o
o
i
d h ut
t
to:
ted y t ira
•
ro ed E
Two data points in the green zone – continue to run the process.
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
• One data point in the green zone and one data point in the yellow
en
tec
Th Doc Num men
and investigate
gh
Or is d
Every time the process is adjusted, before the sampling can start the
process must produce 5 consecutive parts in the green zone.
105
CHAPTER III
Other Types of Control Charts
Loss Functions
Target Target
“Flat” Loss Function Sensitive Loss Function
din p
.
or ou
gly
cc Gr
The benefit of pre-control is its simplicity. The disadvantage of pre-
Inc
d a ion
control is that potential diagnostics that are available with normal process
rke Act
al
control methods are not available. Further, pre-control does not evaluate
on
nor monitor process stability. Pre-control is a compliance based tool not
ma ry
ati
a process control tool.
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
1
aI
3/3
gn
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E- der ocu
gh
Or is d
Th
106
CHAPTER III
Other Types of Control Charts
din p
been satisfactory to make 10,000 parts per month in batches of 2,500 per
.
or ou
gly
week. Now, customer demand, flexible manufacturing methods and JIT
cc Gr
requirements might lead to making and shipping only 500 parts per day.
Inc
d a ion
To realize the efficiencies of short-run processes it is essential that SPC
rke Act
al
methods be able to verify that the process is truly in statistical control,
on
(i.e., predictable), and be able to detect special-cause variation during
ma ry
ati
these “short runs.”
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
3/3
gn
as m
ted y t ira
c. The process aim must be set and maintained at the proper level.
xp
op en ite 426 sed
d. The Natural Process Limits must fall within the specification limits."
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
data. Short-run oriented charts allow a single chart to be used for the
tec
Th Doc Num men
gh
29
Caution should be used when subgroups are formed from small populations or when the subgroups
use measurements taken over extended periods of time (see Appendix A). Wheeler (1991) discusses
evaluating the data with an Individuals and Moving Range (I & MR) chart to ensure that important
process behavior information is not being masked by the subgrouping.
107
CHAPTER III
Other Types of Control Charts
Sample Mean
_
_
X=0.167
0
-2
LCL=-2.414
1 2 3 4 5 6 7 8 9 10 11 12 13 14
Sample
UCL=6.495
6
Sample Range
din p
.
or ou
gly
_
R=2.523
2
cc Gr
Inc
d a ion
0 LCL=0
1 2 3 4 5 6 7 8 9 10 11 12 13 14
rke Act
Sample
al
on
ma ry
Figure III.4: DNOM Control Chart
ati
ter ust
en e 11
rn
1
aI
as m
o
the process target becomes problematic. In such cases the data may be
o
i
d h ut
t
to:
ted y t ira
h
ro ed E
X−µ
n
t p wn se
Z=
yri t is Lic 2
d i oc nt r: 4 lice
σ
en
an is d ume be t is
5
process and reduce the control chart to a report card function. But when
subgrouping is possible, the measurements can be standardized to
Th
108
CHAPTER III
Other Types of Control Charts
din p
Shewhart chart uses only the information supplied by the most recent
.
or ou
gly
datum point, the Cumulative Sum (CUSUM) and the Exponentially
cc Gr
Weighted Moving-Average (EWMA) charts exploit the information
Inc
d a ion
available in accumulated, historical data. See Montgomery (1997),
Wheeler (1995) and Grant and Leavenworth (1996) for in-depth
rke Act
al
on
discussions of these methods and comparisons with the supplemental
ma ry
detection rules for enhancing the sensitivity of the Shewhart chart to
ati
ter ust
en e 11
small process shifts
rn
be otiv /20
wa Ind
nte
1
aI
as m
o
shifts (0.5 sigma or below) in the process mean will eventually signal
ted y t ira
that a shift has occurred. For larger shifts, Shewhart control charts are
xp
op en ite 426 sed
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
These charts are most often used to monitor continuous processes, such
b
en
effects.
tec
Th Doc Num men
0.0 Target=0
gh
Or is d
-0.2
Th
-0.4
Cumulative
-0.6
-0.8
-1.0
-1.2
-1.4
1 5 10 15 20 23 25 30 35
Sample
109
CHAPTER III
Other Types of Control Charts
The CUSUM chart evaluates the slope of the plotted line. A graphical
tool (V-mask) is laid over the chart with a vertical reference line offset
from origin of the V passing through the last plotted point (see Figure
III.5). The offset and angle of the arms are functions of the desired level
of sensitivity to process shifts. An out-of-control
Vmask Chart for Coating Thickness
condition (e.g., a significant process shift) is
indicated when previously plotted points fall
0.00 Target=0 outside of the V-mask arms. These arms take the
place of the upper and lower control limits.
-0.25
Cumulative Sum
-0.50
din p
.
detected until sample 23 was plotted. When the
or ou
gly
-1.25
V-mask was positioned on prior data points, all
cc Gr
1 5 10 15 20 21 25 30 35
samples fell within the control limits, so there was
Inc
d a ion
Sample
no indication of an out-of-control situation.
rke Act
al
In comparison, an Individual and Moving Range (X, MR) plot of the
on
same data (Figure III.6) does not detect the process shift until sample 27.
ma ry
ati
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
3/3
gn
U C L=1.0536
5
an e A n:
Ma
as m
6
1.02
o
Individual V alue
o
i
d h ut
t
_
to:
ted y t ira
X=0.9702
0.96
xp
op en ite 426 sed
h
ro ed E
n
0.90
t p wn se
yri t is Lic 2
LC L=0.8869
d i oc nt r: 4 lice
b
en
1
0.84 1
an is d ume be t is
1
5
1 5 9 13 17 21 25 29 33 37
tec
Th Doc Num men
O bser vation
o
s c um S
E- der ocu
0.12
gh
1
Or is d
U C L=0.1024
M oving Range
Th
0.08
0.04 __
M R=0.0313
2
0.00 LC L=0
1 5 9 13 17 21 25 29 33 37
O bser vation
110
CHAPTER III
Other Types of Control Charts
din p
.
or ou
gly
x t is the current sample value, and
cc Gr
zt is the current weighted moving average.
Inc
d a ion
An initial value, z0 must be estimated to start the process with the first sample.
rke Act
al
on
ma ry
ati
Through recursive substitution, successive values of Z t can be
ter ust
en e 11
rn
t −1
1
aI
zt = λ ∑ (1 − λ ) xt −i + (1 − λ ) z0
i i
for 0 < λ < 1
3/3
gn
i =0
an e A n:
Ma
as m
ted y t ira
But, current literature indicates that this approach may not necessary.
h
ro ed E
n
process mean shifts, typically less then 1.5 sigma, and it can be used with
o
30
In contrast, the CUSUM chart gives equal weight to the previous data.
31
Another type of time weighted control chart is the Moving Average chart (MA chart). This approach
is based on a simple, unweighted moving average. See Montgomery (1997).
32
See Appendix A.
111
CHAPTER III
Other Types of Control Charts
Valid signals occur only in the form of points beyond the control limits.33
Other rules used to evaluate the data for non-random patterns (see
Chapter II, Section B) are not reliable indicators of out-of-control
conditions.
80.4
80.2
_
_
EWMA
80.0 X=80
din p
.
or ou
gly
79.8
cc Gr
79.6
Inc
d a ion
79.4
rke Act
al
LCL=79.312
on
79.2
ma ry
1 4
ati 7 10 13 16 19 22 25 28 30
ter ust
Sample
en e 11
rn
be otiv /20
wa Ind
nte
3/3
gn
an e A n:
Ma
as m
X, MR Chart of Viscosity
o
o
i
d h ut
t
to:
UCL=83
ted y t ira
82.5
xp
Individual Value
81.0
h
_
ro ed E
X=80
n
79.5
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
78.0
en
LCL=77
an is d ume be t is
5
1 4 7 10 13 16 19 22 25 28
tec
Observation
Th Doc Num men
4
s c um S
UCL=3.686
E- der ocu
3
Moving Range
gh
Or is d
2
__
1 MR=1.128
Th
0 LCL=0
1 4 7 10 13 16 19 22 25 28 30
Observation
33
Because moving averages are involved, the points being plotted are correlated (dependent) and
therefore detection of special causes using pattern analysis is not appropriate since they assume
independence among the points.
112
CHAPTER III
Other Types of Control Charts
adjust (maintain) a process. But they are not appropriate as tools for
process improvement (see Wheeler (1995)).
Multivariate forms of these charts, MCUSUM and MEWMA, have been
developed. See Lowery et al. (1992) and Lowry and Montgomery
(1995).
Non-Normal Charts
If the underlying distribution of a process is known to be non-normal,
there are several approaches that can be used:
din p
• Use the standard Shewhart control charts with appropriate sample
.
or ou
gly
size.
cc Gr
• Use adjustment factors to modify the control limits to reflect the non-
Inc
d a ion
normal form.
rke Act
al
on
• Use a transformation to convert the data into a (near) normal form
ma ry
ati
and use the standard charts.
ter ust
en e 11
rn
1
aI
process.
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
h
ro ed E
Although the sensitivity and risks associated with the standard control
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
normality. His goal was to develop a tool useful for the economic control
5
tec
Th Doc Num men
sensitivity to change decreases, and the risk associated with the Type I
Sample Mean
gh
error increases.
Or is d
Th
Subg
roup 0 10 20
sufficiently large subgroup size is used,34 the Shewhart control chart can
be used with near normal sensitivity and degree of risk.
34
For example, see Wheeler (1995).
113
CHAPTER III
Other Types of Control Charts
∑X i
Consider the average Xn = i =1
.
n
σX
The distribution of X n approaches the normal distribution N µ X ,
din p
n
.
or ou
gly
as n → ∞
cc Gr
Inc
d a ion
rke Act
al
on
The “rule of thumb” is that the range chart should be used with
ma ry
subgroups of size fifteen or less. The standard deviation chart can be
ati
ter ust
en e 11
used for all subgroup sizes.
rn
be otiv /20
wa Ind
nte
1
aI
3/3
gn
Adjustment Factors
an e A n:
Ma
as m
o
o
When a large subgroup size is not possible, the control limits of the
i
d h ut
t
to:
ted y t ira
distributions are either asymmetric, have heavier tails than the normal
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
increase the risk of false alarms, especially if pattern analysis for special
an is d ume be t is
5
causes is used.
tec
Th Doc Num men
UCL
LCL
S 0 10 20 10 20
35
For example see: Burr, I. W., (1967), Chan, L.K., and Cui, Heng, J, and (2003) Pham, H., (2001).
114
CHAPTER III
Other Types of Control Charts
For this and the following approaches, the process should be studied
periodically to verify that the distributional form has not changed. Any
significant change in the distribution is an indicator that the process is
being affected by special causes.
Transformations
An alternative to the adjustment factors is to convert the data instead of
the control limits. In this approach, a transformation is determined which
transforms the non-normal process distribution into a (near) normal
distribution. Examples of transformations36 used in these situations are
the Johnson family of transformations and the Box-Cox transformations.
din p
.
The selected transformation is then used to transform each datum point
or ou
gly
and the standard Shewhart control chart methodologies are used on the
cc Gr
converted data.
Inc
d a ion
rke Act
al
on
ma ry
ati
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
1
aI
3/3
gn
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
o
s c um S
Non-Normal Form
E- der ocu
gh
Or is d
There are situations when the above approaches are not easily handled.
Examples of these situations occur when the process distribution is
Th
highly non-normal and the sample size cannot be large, e.g., when
tracking equipment reliability. In these situations a control chart can be
developed using the non-normal form directly to calculate the chart
control limits.
36
For example, see Johnson (1949) and Box and Cox (1964).
115
CHAPTER III
Other Types of Control Charts
UCL
Mean
LCL
0 10 20
din p
.
the exponential distribution with parameter θ equal to the mean time
or ou
gly
between failures (MTBF). In general, control limits for this approach are
cc Gr
selected to be the 0.135 and 99.865 percentile points of the underlying
Inc
d a ion
distribution.
rke Act
al
Like the other approaches above, for this approach to be effective, it
on
ma ry
typically requires a capability study with a sample size sufficiently large
ati
ter ust
en e 11
to capture the non-normal form. Advantages of this approach are that the
rn
be otiv /20
wa Ind
data can be plotted without complex calculations and it provides more
nte
3/3
gn
an e A n:
Multivariate
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
relationships.
gh
Or is d
116
CHAPTER III
Other Types of Control Charts
statistic but the analysis of the charted results may not tell which variable
caused it. Additional analysis using other statistical tools may be
required to isolate the special cause(s). See Kourti and MacGregor
(1996).
Multivariate charts are mathematically complex, and computerized
implementation of these methods is essential for practical application. It
is important, however, that the use of appropriate techniques for
estimating dispersion statistics be verified. See Wheeler (1995),
Montgomery (1997) and current literature such as Mason and Young
(2001), for detailed discussions of multivariate control charts.
Other Charts
din p
.
or ou
gly
cc Gr
Inc
d a ion
In Chapter I, Section E, a Case 3 process was defined as one not in
rke Act
al
statistical control but acceptable to tolerance. Special causes of variation
on
are present, the source of variation is known and predictable but may not
ma ry
ati
be eliminated for economic reasons. However, this predictability of the
ter ust
en e 11
rn
Regression chart.
3/3
gn
as m
o
o
i
d h ut
t
ted y t ira
Regression charts track the linear correlation between two variables, for
5
tec
Th Doc Num men
example:
o
s c um S
gh
For example, if a tool has constant wear relative to each cycle of the
process, a dimensional feature such as diameter (Y) could be predicted
based on the cycles (X) performed. Using data collected over time this
linear relationship can be modeled as
Y = b0 + b1 X
117
CHAPTER III
Other Types of Control Charts
b0 and b1 are estimated using the equations for simple linear regression.
The chart is constructed by drawing the line Yˆ = βˆ0 + βˆ1 X which is the
estimate for Y = b0 + b1 X and computing the 95% or 99% predictive
interval. The predictive limits computed are curved lines with the
tightest point at X . Often they are replaced with the Yˆ ± 3s in order to
tighten the control limits at each extreme for X .
Points that exceed the control limits indicate tooling which has a tool life
which is significantly different from the base tool life. This can be
advantageous or detrimental depending on the specific situation.
din p
.
or ou
gly
cc Gr
A line is only one type of correlation between variables. Regression
Inc
charts can be applied to any relationship for which the mathematical
d a ion
model can be determined.
rke Act
al
on
ma ry
ati
Care should be taken in making predictions (extrapolating) outside of the
ter ust
en e 11
range of the original observations. The accuracy of the regression model
rn
be otiv /20
wa Ind
for use outside of this range should be viewed as highly suspect. Both
nte
the prediction interval for future values and the confidence interval for the
1
aI
as m
o
o
i
d h ut
t
to:
ted y t ira
Montgomery (1980).
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
Residual Charts
an is d ume be t is
5
tec
Th Doc Num men
gh
The Residuals Chart and the Regression Chart are technically equivalent
and differ only in their presentation.
This approach would be more useful and intuitive when the variable
relationships are more complex.
Autoregressive Charts
Control chart methods generally assume that the data output from a
process are independent and identically distributed. For many processes
this assumption is not correct. Data from a time series, data taken
118
CHAPTER III
Other Types of Control Charts
din p
.
which drift, walk or cycle through time are good candidates for time
or ou
gly
series analysis and an ARMA method may be appropriate.
cc Gr
Inc
The autoregressive (AR) model is defined by
d a ion
rke Act
al
X i = ξ + φ1 X i −1 + φ2 X i −2 … + ε i (AR)
on
ma ry
ati
The current value observed is equal to a constant, a weighted
ter ust
en e 11
rn
3/3
X i = µ − θ1ε i −1 −θ 2ε i −2 … + ε i (MA)
gn
an e A n:
Ma
as m
X i = ξ + φ1 X i −1 − θ1ε i −1 + φ2 X i −2 − θ 2ε i −2 … + ε i (ARMA)
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
tec
gh
X i = ξ + φ1 X i −1 + ε i .
Th
119
CHAPTER III
Other Types of Control Charts
din p
.
or ou
gly
combinations and it is feasible to estimate them all before selecting the
cc Gr
best.
Inc
d a ion
To estimate the parameters use Non-Linear Estimation.
rke Act
al
Once the model is determined and stationary, and the parameters are
on
estimated then the next observation can be predicted from past
ma ry
ati
observations. For example (ARMA(1,0,1)):
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
Xˆ t = ξ + φ1 X t −1 − θ1ε t −1
1
aI
3/3
an e A n:
Ma
as m
ε t = X t − Xˆ t
o
o
i
d h ut
t
to:
ted y t ira
Chart. For a more complete discussion see Box, Jenkins and Reinsel
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
(1994).
en
an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E- der ocu
gh
Or is d
Th
120
CHAPTER III
Other Types of Control Charts
Zone Charts
Chapter II, Section B, Table II.1 provides various rules for detecting out-
of-control signals. The first four rules can be easily implemented with
manual control charts, but the latter rules do not lend themselves to rapid
visual identification since they require the determination of the number
of standard deviations a plotted point is from the centerline. This can be
aided by dividing the control chart into “zones” at 1, 2, and 3 standard
deviations from the centerline.
din p
.
or ou
gly
cc Gr
Inc
d a ion
rke Act
al
on
ma ry
ati
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
1
aI
3/3
gn
as m
o
the standard deviation of the distribution of the sample averages, not the
o
i
d h ut
t
to:
ted y t ira
whether a special cause exists using one or more of the tabled criteria.
op en ite 426 sed
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E- der ocu
gh
Or is d
Th
This division of the control chart can be coupled with run sums analysis
of control chart to produce the Zone Control Chart. The run sums control
chart analysis was introduced by Roberts (1966) and studied further by
Reynolds (1971). This approach assigns a score to each zone. The score
α i , assigned to the region R+i is nonnegative; and the score, β i assigned
to the region R-i is nonpositive. A typical set of scores are:
121
CHAPTER III
Other Types of Control Charts
Zone Score
µ X , µ X + σ X ) 0 or +1
µ X + σ X , µ X + 2 σ X ) +2
µ X + 2σ X , µ X + 3σ X ) +4
µ X + 3σ X , ∞ ) +8
The four regions placed symmetrically below the centerline are assigned
din p
.
the corresponding negative scores.
or ou
gly
cc Gr
A zone control chart is a hybrid between an X (or Individuals) chart
Inc
d a ion
and a CUSUM chart. It analyzes a cumulative score, based on the zones.
The cumulative score is the absolute value of the sum of the scores of the
rke Act
al
on
zones in which the points are plotted. Every time the centerline is crossed
ma ry
the cumulative score is reset to zero.
ati
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
1
aI
3/3
gn
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E- der ocu
gh
Or is d
8. Thus, the analyst does not need to recognize the patterns associated
with non-random behavior as on a Shewhart chart. With the scoring of 0,
2, 4, 8 this method is equivalent to the standard criteria 1, 5, and 6 for
special causes in an X (or Individuals) chart and is more stringent than
criterion 8. With the scoring of 1, 2, 4, 8 this method is equivalent to the
standard criteria 1, 2, 5, and 6 for special causes in an X (or Individuals)
chart and is more stringent than criteria 7 and 8. As shown in the figure
above, trends (criterion 3) can also be detected depending on the start
and stop of the trend.
Zone control charts can be modified to eliminate the point-plotting
process; the points are plotted in the zone not to a scale. Thus, one
standard zone control chart can fit most needs; when to act on a process
is determined by the charting procedure.
122
CHAPTER III
Other Types of Control Charts
din p
.
or ou
gly
cc Gr
Inc
d a ion
rke Act
al
on
ma ry
ati
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
1
aI
3/3
gn
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
The zone chart can be used with a weighting scheme to provide the
xp
op en ite 426 sed
sensitivity needed for a specific process. For example, one set of weights
h
ro ed E
(scores) can be used during the initial phase for detecting special causes.
n
t p wn se
yri t is Lic 2
Then the weights could be changed when the process is in control and it
d i oc nt r: 4 lice
b
en
average run lengths with those of standard control tests. For the chart
s c um S
123
CHAPTER III
Th
Or is d
Other Types of Control Charts
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i o rn
124
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ma ry
rke Act
d a ion
cc Gr
or ou
din p
gly
.
Th
Or is d
E- der ocu
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d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
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CHAPTER IV
wa Ind
ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
din p
Understanding Process Capability
gly
.
and Process Performance for Variables Data
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i o rn
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rke Act
d a ion
cc Gr
or ou
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gly
.
CHAPTER IV
Understanding Process Capability and Process Performance for Variables Data
Introduction
The output of a stable process can be described by its statistical
distribution. The process must be stable (in statistical control) in order
for the distribution to be useful for predicting future results.37 A
distribution is described in terms of characteristics (statistics) that are
calculated from measurements of samples taken from the process.
The statistics of most frequent interest are estimates of distribution
location (or center) and spread relative to the customer requirements.
Typically, the location is estimated by the sample mean or sample
median. Spread usually is estimated using the sample range or sample
standard deviation.
din p
Process centering and spread interact with respect to producing an
.
or ou
gly
acceptable product. As the distribution moves off center, the “elbow
cc Gr
room” available to accommodate process variation (spread) is reduced.
Inc
d a ion
A shift in process location, an increase in process spread or a
combination of these factors may produce parts outside the specification
rke Act
al
limits. A process with such a distribution would not be qualified to meet
on
ma ry
the customer’s needs.
ati
ter ust
en e 11
rn
as m
o
o
ted y t ira
h
ro ed E
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
This section will discuss only the more popular indices and ratios:
an is d ume be t is
5
tec
Pp .
s c um S
E- der ocu
NOTE: Although other indices are not discussed in this manual, see
Appendix D and References for information on other indices.
37
See Chapter I, Sections C-F.
38
For non-normal distributions and autocorrelated processes see Chapter IV, Section B.
127
CHAPTER IV
Understanding Process Capability and Process Performance for Variables Data
din p
.
or ou
gly
cc Gr
Inc
d a ion
rke Act
al
on
ma ry
ati
ter ust
en e 11
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be otiv /20
wa Ind
nte
1
aI
3/3
gn
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E- der ocu
gh
Or is d
Th
128
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
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d a ion
cc Gr
or ou
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gly
.
Understanding Process Capability and Process Performance for Variables Data
CHAPTER IV
Th
CHAPTER IV - Section A
Definition of Process Terms
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
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rke Act
d a ion
cc Gr
or ou
din p
gly
CHAPTER IV - Section A
Definitions of Process Terms
din p
.
or ou
gly
R s
variation. It can be estimated from control charts by d 2 or c4 .
cc Gr
Inc
d a ion
• Between-subgroup Variation – This is the variation due to the
rke Act
al
variation between subgroups. If the process is in statistical control
on
this variation should be zero.
ma ry
ati
ter ust
Total Process Variation ( σ P ) – This is the variation due to both
en e 11
•
rn
be otiv /20
wa Ind
nte
3/3
as m
o
ted y t ira
n
( xi − x ) 2
chart or a process study: σ P = s = ∑i n − 1 where xi is an
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
b
en
R s
by d 2 or c4 .
gh
Or is d
131
CHAPTER IV - Section A
Definition of Process Terms
CAUTION: The indices discussed below are valid only when the process
is stable (in statistical control). If the process is not in statistical control
then these indices can be very misleading, as can be seen by Figure
din p
IV.4.
.
or ou
gly
cc Gr
Cp: This is a capability index. It compares the process capability to the
Inc
Cp
d a ion
maximum allowable variation as indicated by the tolerance. This index
rke Act
al
provides a measure of how well the process will satisfy the variability
on
USL − LSL USL − LSL
ma ry
requirements. Cp is calculated by C p = =
( )
ati
ter ust
6σ C
en e 11
6 R
rn
be otiv /20 d2
wa Ind
nte
1
aI
as m
o
o
i
d h ut
t
to:
ted y t ira
Cpk: This is a capability index. It takes the process location as well as the
Cpk
xp
op en ite 426 sed
capability into account. For bilateral tolerances Cpk will always be less
h
ro ed E
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
C pk ≤ C p
en
an is d ume be t is
5
tec
USL − X USL − X
gh
CPU = =
Or is d
( )
and
3σ C 3 R
Th
d2
X − LSL X − LSL
CPL = =
3σ C 3 R
d2( )
Cpk and Cp should always be evaluated and analyzed together. A Cp value
significantly greater than the corresponding Cpk indicates an opportunity
for improvement by centering the process.
39
As discussed in Chapter II, Section A, process analysis requires that the data have been collected
using measurement system(s) that are consistent with the process and have acceptable measurement
system characteristics.
132
CHAPTER IV - Section A
Definition of Process Terms
din p
.
or ou
gly
Ppk
cc Gr
Ppk: This is a performance index. It takes the process location as well as
the performance into account. For bilateral tolerances Ppk will always be
Inc
d a ion
less than or equal to Pp. Ppk will be equal to Pp only if the process is
rke Act
al
centered.
on
ma ry
ati
Ppk ≤ Pp
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
3/3
USL − X USL − X
gn
PPU = = and
3σ P 3s
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
X − LSL X − LSL
PPL = =
xp
op en ite 426 sed
3σ P 3s
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E- der ocu
gh
Or is d
Th
133
CHAPTER IV - Section A
Definition of Process Terms
CR CR: This is the capability ratio and is simply the reciprocal of Cp;
1
din p
.
or ou
gly
CR = .
Cp
cc Gr
Inc
d a ion
rke Act
al
PR PR: This is the performance ratio and is simply the reciprocal of Pp;
1 on
ma ry
ati
PR = .
ter ust
en e 11
rn
Pp be otiv /20
wa Ind
nte
1
aI
3/3
Appendix F.
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
134
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i o rn
135
an e A n: ati
d h ut on
as m o 3/3
1 al
be otiv /20 Inc
en e 11
wa Ind
ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
din p
gly
.
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i o rn
136
an e A n: ati
Process
d h ut on
as m o 3/3
1 al
be otiv /20 Inc
en e 11
wa Ind
ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
din p
gly
.
Figure IV.4: Cpk and Ppk Values Produced by a Predictable and Immature
CHAPTER IV - Section A
Definition of Process Terms
Indices –
Unilateral Tolerances
This section discusses commonly used indices where the specification
has either an upper or lower limit but not both.
din p
If the product characteristic has a physical limit (e.g., flatness cannot be
.
or ou
gly
less than zero), a Cp could be calculated using the physical limit (0.0) as
cc Gr
a surrogate lower limit. But this number will not have the same
Inc
d a ion
relationship to Cpk as it does in the bilateral case.
rke Act
al
on
ma ry
ati
ter ust
en e 11
rn
Cpk: This is a capability index. It takes the process location as well as the
be otiv /20
wa Ind
nte
as m
ted y t ira
xp
op en ite 426 sed
USL − X
h
ro ed E
CPU =
( )
n
t p wn se
3 Rd
yri t is Lic 2
d i oc nt r: 4 lice
b
en
2
an is d ume be t is
5
tec
X − LSL
Th Doc Num men
CPL =
( )
s c um S
3 Rd
E- der ocu
gh
2
Or is d
Th
137
CHAPTER IV - Section A
Definition of Process Terms
USL − X
PPU =
3s
X − LSL
PPL =
3s
din p
.
or ou
gly
cc Gr
CR: This is the capability ratio and is simply the reciprocal of Cp. As
CR
Inc
d a ion
such, this index has no meaning for unilateral tolerances.
rke Act
al
on
ma ry
PR: This is the performance ratio and is simply the reciprocal of Pp. As
ati
ter ust
PR en e 11
such, this index has no meaning for unilateral tolerances.
rn
be otiv /20
wa Ind
nte
1
aI
3/3
gn
as m
Appendix F.
o
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E- der ocu
gh
Or is d
Th
138
CHAPTER IV - Section B
Description of Conditions
CHAPTER IV - Section B
Description of Conditions
It is appropriate to point out that process variation and process centering
are two separate process characteristics. Each needs to be understood
separately from the other. To assist in this analysis it has become
convenient to combine the two characteristics into indices, such as Cp,
Cpk or Pp, Ppk. These indices can be useful for:
• Measuring continual improvement using trends over time.
• Prioritizing the order in which processes will be improved.
din p
.
or ou
The capability index, Cpk , is additionally useful for determining whether
gly
cc Gr
or not a process is capable of meeting customer requirements. This was
the original intent of the capability index. The performance index, Ppk,
Inc
d a ion
shows whether the process performance is actually meeting the customer
rke Act
al
requirements. For these indices (as well as all of the other process
on
measures described in Chapter IV, Section A) to be effectively used, the
ma ry
ati
CONDITIONS which surround them must be understood. If these
ter ust
en e 11
rn
conditions are not met, the measures will have little or no meaning and
be otiv /20
wa Ind
nte
generated. The following three conditions are the minimum that must be
3/3
gn
as m
• The process from which the data come is statistically stable, that is,
o
o
i
d h ut
t
ted y t ira
xp
op en ite 426 sed
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
tec
Th Doc Num men
Commonly, the computed index (or ratio) value is accepted as the “true”
s c um S
index (or ratio) value; i.e., the influence of sampling variation on the
E- der ocu
1.30 and 1.39 can be from the same stable process simply due to
sampling variation.
Th
40
For non-normal distributions, see the pages that follow.
139
CHAPTER IV - Section B
Description of Conditions
41
Handling Non-Normal and Multivariate Distributions
Although the normal distribution is useful in describing and analyzing a
wide variety of processes, it cannot be used for all processes. Some
processes are inherently non-normal, and their deviations from normality
are such that using the normal distribution as an approximation can lead
to erroneous decisions. Other processes have multiple characteristics that
are interrelated and should be modeled as a multivariate distribution.
Of the indices described above, Cp, Pp, CR, and PR are robust with
respect to non-normality. This is not true for Cpk, and Ppk.
din p
.
or ou
Relationship of Indices and
gly
cc Gr
Proportion Nonconforming
Inc
d a ion
rke Act
al
Although many individuals use the Cpk, and Ppk indices as scalar-less
on
(unit-less) metrics, there is a direct relationship between each index and
ma ry
ati
ter ust
the related process parameter of proportion nonconforming (or ppm).
en e 11
rn
1
2
aI
x
−
3/3
zc
proportion nonconforming = 1 − ∫ e 2
dx
gn
−∞
an e A n:
Ma
as m
o
zc = 3 C pk and
o
where
i
d h ut
t
to:
ted y t ira
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
through:
an is d ume be t is
5
z p = 3 Ppk
tec
Th Doc Num men
o
s c um S
Non-Normal Distributions
Using Transformations
One approach is to transform the non-normal form to one that is (near)
normal. The specifications are also transformed using the same
41
As discussed in Chapter II, Section A, process analysis requires that the data have been collected
using measurement system(s) that are consistent with the process and have acceptable measurement
system characteristics.
140
CHAPTER IV - Section B
Description of Conditions
parameters. The Cpk, and Ppk indices are then determined in the
transformed space using standard calculations based on the normal
distribution.
Two general transformation approaches which have gained support are:
• Box-Cox Transformations
The methods of analysis of designed experiments are “appropriate
and efficient when the models are (a) structurally adequate, and the
(supposedly independent) errors (b) have constant variance and (c)
are normally distributed.42” Box and Cox (1964) discussed a
transformation which reasonably satisfies all three of these
requirements. This transformation is given by:
din p
.
or ou
gly
w = xλ
cc Gr
Inc
−5 ≤ λ ≤ 5
d a ion
where
rke Act
al
and λ = 0 for the natural log transformation
on
ma ry
ati
λ = 0.5 for the square root transformation
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
3/3
an e A n:
Ma
as m
o
o
i
d h ut
t
•
to:
Johnson Transformations
ted y t ira
xp
op en ite 426 sed
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
x
5
SB
w = log
tec
Bounded
Th Doc Num men
(1- x)
o
s c um S
w = log ( x )
E- der ocu
SL Log Normal
gh
Or is d
SU (
w = sinh -1 ( x ) = log x + 1 + y2 + 1 ) Unbounded
Th
42
Box, G. E. P., Hunter, W. G., and Hunter, J. S., Statistics for Experimenters, John Wiley and Sons,
New York, 1978, pg.239.
43
See Johnson (1949).
141
CHAPTER IV - Section B
Description of Conditions
Non-Normal Distributions
Using Non-Normal Forms
Non-normal forms model the process distribution and then determine the
proportion nonconforming, i.e., the area of the non-normal distribution
outside the specifications.
A common approach to the modeling of the non-normal distribution is to
use the Pearson Family of Curves. The most appropriate member of this
family is determined by the method of matching moments; i.e., the curve
with skewness (SK) and kurtosis (KU) that match that of the sampled
distribution is used as a model for the underlying form. As in the case of
the Johnson Transformation System (see above), this family of curves
din p
encompasses all the possible unimodal distributional forms; i.e., it covers
.
or ou
gly
the entire feasible SK-KU plane.
cc Gr
To calculate the non-normal equivalent to the Ppk index, the non-normal
Inc
d a ion
form ( f ( x ) ) is used to determine the proportion nonconforming, i.e.,
rke Act
al
the area of the non-normal distribution outside the upper and lower
on
ma ry
specifications:
ati
ter ust
en e 11
rn
LSL
pL = ∫be otiv /20
wa Ind
f ( x ) dx and
nte
−∞
1
aI
3/3
∞
∫
gn
pU = f ( x ) dx .
an e A n:
Ma
USL
as m
o
o
These values are converted to a z value using the inverse standard normal
i
d h ut
t
to:
ted y t ira
distribution. That is, the zL and zU values in the following equations are
xp
op en ite 426 sed
t p wn se
2
yri t is Lic 2
x
d i oc nt r: 4 lice
zL −
pL = ∫ 2
en
e dx and
−∞
an is d ume be t is
5
tec
Th Doc Num men
2
x
o
∞ −
pU = ∫ e 2
dx
s c um S
E- der ocu
zU
gh
min {z L , zU }
Or is d
Then Ppk =
3
Th
44
For the normal form: Q0.99865 = − Q0.00135 = z0.99865 s
142
CHAPTER IV - Section B
Description of Conditions
Q0.00135
0.00135 = ∫−∞
f ( x) dx and
∞
0.99865 = ∫Q0.99865
f ( x) dx .
din p
( d)
.
or ou
gly
The capability index Cp is calculated as above replacing s with R .
cc Gr
2
Inc
d a ion
Because this approach uses the total variation to calculate the proportion
nonconforming, there is no analogue of a non-normal Cpk available.
rke Act
al
on
ma ry
ati
An alternate approach to calculating Ppk using quantiles is given in some
ter ust
en e 11
rn
USL − X X − LSL
Ppk = min ,
1
aI
3/3
Q0.00865 − X X − Q0.00135
gn
an e A n:
Ma
as m
This approach does not tie the Ppk index to the proportion
o
o
i
nonconforming. That is, different non-normal forms will have the same
d h ut
t
to:
ted y t ira
compare these indices, the non-normal form as well as the index value
h
ro ed E
should be considered.
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E- der ocu
gh
Or is d
Th
143
CHAPTER IV - Section B
Description of Conditions
Multivariate Distributions
When multiple characteristics are interrelated, the process distribution
should be modeled using a multivariate form. The process performance
index Ppk can be evaluated by first determining the proportion
nonconforming, i.e., the area of the multivariate distribution outside the
specifications.
For many geometrically dimensioned (GD&T) characteristics, the
bivariate normal form is useful in describing the process.
A pair of random variables X and Y have a bivariate normal distribution
if and only if their joint probability density is given by
din p
− z
.
or ou
( )
gly
1 2 1− ρ 2
f ( x, y ) = e
cc Gr
2πσ xσ y 1 − ρ 2
Inc
d a ion
2ρ ( x − µx ) ( y − µ y ) y − µ y
rke Act
al
2 2
x − µx
on
where z = − +
σ
ma ry
σx σ xσ y
ati
ter ust
y
en e 11
rn
be otiv /20
wa Ind
nte
σ xy
ρ = cov ( x , y ) =
1
aI
σ xσ y
3/3
gn
an e A n:
Ma
for
o
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
tec
Th Doc Num men
pz = ∫∫ f ( x, y ) dx dy and
s c um S
E- der ocu
tolerance zone
gh
Or is d
Tolerance Zone
Th
pz
Bivariate Distribution
144
CHAPTER IV - Section B
Description of Conditions
2
x
z −
pz = ∫−∞
e 2
dx
z
Then Ppk =
3
An estimate Pp can be found using:
specification area
Pp =
Est 99.73% area
where the multivariate form is used to calculate the estimated 99.73%
din p
area.
.
or ou
gly
Because this approach uses the total variation to calculate the proportion
cc Gr
nonconforming, there is no analogue of a multivariate Cpk available.45
Inc
d a ion
rke Act
al
on
ma ry
ati
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
1
aI
3/3
gn
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E- der ocu
gh
Or is d
Th
45
See also Bothe (2001) and Wheeler (1995).
145
Th
CHAPTER IV - Section C
Or is d
E- der ocu
Suggested Use of Process Measures
146
an e A n: ati
d h ut on
as m o 3/3
1 al
be otiv /20 Inc
en e 11
wa Ind
This page intentionally left blank
ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
din p
gly
.
CHAPTER IV - Section C
Suggested Use of Process Measures
CHAPTER IV - Section C
Suggested Use of Process Measures
The key to effective use of any process measure continues to be the level
of understanding of what the measure truly represents. Those in the
statistical community who generally oppose how Cpk indices are being
used, are quick to point out that few “real world” processes completely
satisfy all of the conditions, assumptions, and parameters within which
Cpk has been developed (see Gunter, B. (1989) and Herman, J. T. (1989)).
It is the position of this manual that, even when all conditions are met, it
is difficult to assess or truly understand a process on the basis of a single
index or ratio number, for reasons discussed below.
din p
.
or ou
gly
No single index or ratio should be used to describe a process. It is
cc Gr
strongly recommended that all four indices (Cp, Cpk and Pp, Ppk) be
Inc
d a ion
calculated on the same data set. The comparison of the indices among
rke Act
al
themselves can provide insight to potential process issues and aid in
on
measuring and prioritizing improvement over time. For example, low Cp,
ma ry
ati
Cpk values may indicate within-subgroup variability issues, whereas low
ter ust
en e 11
rn
as m
o
ted y t ira
h
ro ed E
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
Generally, the size of this gap is an indication of the effect that special
b
en
done for better process understanding even if process indices are not
5
tec
Th Doc Num men
used.
o
s c um S
46
See Figure I.1.
47
Methods for addressing multivariate processes are addressed in Chapter IV, Section B.
147
CHAPTER IV - Section C
Suggested Use of Process Measures
din p
.
or ou
gly
cc Gr
Inc
d a ion
rke Act
al
on
ma ry
ati
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
1
aI
3/3
gn
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E- der ocu
gh
Or is d
Th
148
CHAPTER IV - Section C
Suggested Use of Process Measures
Although this mental model (good/bad) has been extensively used in the
past, it is suggested that a more useful model (i.e., one that is a lot closer
to the behavior of the real world), is illustrated in Figure IV.5(B). In
general, this model is a quadratic form and uses the principle that an
increasing loss is incurred by the customer or society the further a
particular characteristic gets from the specification target. Implicit in
this concept, referred to as the loss function, is the presumption that the
design intent (specification target) is aligned with the customer’s
requirement.
din p
.
“allowable” is based on the design engineer’s understanding of the
or ou
gly
functional requirements and the physics of the design and usage
cc Gr
environment (engineering subject matter knowledge), tempered by the
Inc
d a ion
economic constraints of the production process. The results of this part
rke Act
al
of the design process are reflected in the engineering specifications
on
(tolerances).
ma ry
ati
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
1
aI
3/3
gn
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
design should be equal to the design intent – the target value that would
o
yield perfect results. But variation exists. So what is the difference to the
s c um S
E- der ocu
and one having the same characteristic off target but within
Or is d
specification?
Th
149
CHAPTER IV - Section C
Suggested Use of Process Measures
This approach may be valid for discrete characteristics (e.g., the part has
a clearance hole or not), but when dealing with characteristics with a
continuous response, this approach does not reflect how the customer
din p
.
reacts to different levels of the output.
or ou
gly
cc Gr
Without considering the specifications, it is possible to determine the
Inc
d a ion
customer’s sensitivity to deviations from the target (design intent). See
Goble, et al (1981). As a characteristic deviates farther from the target,
rke Act
al
more customers will be able to “sense” that it is different than the design
on
ma ry
intent - primarily because it takes more “effort” to use. In many cases a
ati
ter ust
en e 11
loss (in time, cost, efficiency, etc.) can be associated with each deviation
rn
increment. This loss can apply to the individual customer, but it also may
be otiv /20
wa Ind
nte
3/3
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
Increasing sensitivity or
h
ro ed E
n
Sensitivity Curve
t p wn se
b
en
tec
Th Doc Num men
Target
s c um S
E- der ocu
There are two ways to analyze a loss function. It can be compared either
gh
150
CHAPTER IV - Section C
Suggested Use of Process Measures
din p
characteristic’s expected variation.
.
or ou
gly
cc Gr
Inc
d a ion
rke Act
al
on
ma ry
ati
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
1
aI
3/3
gn
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
gh
Or is d
Th
48
Alternative definition: A design is robust if it is tolerant (insensitive) to variation that is expected
from the manufacturing, processes, materials and environment.
151
CHAPTER IV - Section C
Suggested Use of Process Measures
VOICE
OF THE
din p
PROCESS
.
or ou
gly
cc Gr
Inc
d a ion
STATISTICAL
rke Act
al
METHODS
on
ma ry
ati
ter ust
en e 11
rn
PRODUCTS
3/3
MATERIAL WE WORK/
gn
OR CUSTOMERS
METHODS BLENDING OF
an e A n:
Ma
as m
SERVICES
o
MEASUREMENT RESOURCES
o
i
d h ut
t
to:
ted y t ira
ENVIRONMENT
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
yri t is Lic 2
IDENTIFYING
d i oc nt r: 4 lice
b
en
CHANGING NEEDS
an is d ume be t is
5
o
s c um S
E- der ocu
VOICE
gh
Or is d
OF THE
Th
CUSTOMER
152
CHAPTER IV - Section C
Suggested Use of Process Measures
Alignment of Process to
Customer Requirements
In Chapter I, Section B (see Figure IV.8), a process control system is
described as a feedback system. An output characteristic of such a
process can also be expressed graphically in terms of a probability
distribution. This distribution might be referred to as the process
distribution (see Figure IV.9(a)).
din p
.
or ou
gly
cc Gr
Inc
d a ion
rke Act
al
on
ma ry
ati
ter ust
en e 11
rn
and the specification together shows that the total loss to the customer
3/3
gn
as m
ted y t ira
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
• How well the process center is aligned with the customer target
b
en
requirement.
an is d ume be t is
5
tec
153
Th
CHAPTER IV - Section C
Or is d
E- der ocu
Suggested Use of Process Measures
154
an e A n: ati
d h ut on
as m o 3/3
1 al
be otiv /20 Inc
en e 11
wa Ind
ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
This was determined by estimating the total loss: combining the loss
generated by the actual distribution of the parts (nonconforming parts)
and the loss due to the customer’s sensitivity to variation within the
specifications. This strongly suggests that the “Goal Post” model, or
computing percentage of “bad” parts (parts beyond specifications), in
and of itself does not provide a proper appreciation for understanding the
effect the process is actually having on the customer.
din p
.
or ou
gly
cc Gr
Inc
d a ion
rke Act
al
on
ma ry
ati
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
1
aI
3/3
gn
an e A n:
Ma
as m
o
o
i
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155
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CHAPTER IV - Section C
Or is d
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.
APPENDIX A
Some Comments on Subgrouping
APPENDIX A
Some Comments on Sampling
Effects of Subgrouping
Control charts are used to answer questions about a process. In order to
have a control chart be useful, it is important that the charts answer the
right questions. An X chart asks the question, “Is the variation present
between subgroup averages more than is expected based on the variation
within subgroups?”. Therefore, understanding sources of variation within
and between subgroups is of paramount importance in understanding the
din p
control chart and the process variation. Most variables control charts
.
or ou
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compare within-subgroup variation to between-subgroup variation, so it
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is important in interpreting the control charts to form subgroups with an
Inc
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understanding of the possible sources of variation affecting the process
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results.
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Autocorrelated Data
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covered in most control plan templates. The type of sample can have a
Th Doc Num men
Some factors that influence the impact of the sample type have to do
gh
with the process itself – they are dependent on the nature of the
Or is d
157
APPENDIX A
Some Comments on Subgrouping
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autocorrelation on some characteristics. This is often because there is an
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underlying predictable special cause variation which is large when
Inc
compared to the common cause variation. That is, the important process
d a ion
input variables have not had time to vary much in the period of time the
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sample was taken when compared to the between sample variation. This
may be illustrated with examples. on
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Temperature example:
1
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a room (or outside patio), it does not make sense to have a sampling plan
an e A n:
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later when the next sample is taken, the temperature would likely be
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different than it was an hour before, yet those 5 readings would again be
h
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b
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random variation in the X chart, but the Range chart would be primarily
tec
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the grand average of the data, and most points would show as being out
Th
Stamping example:
Data from a coil-fed, progressive die process is typically autocorrelated.
If this data were randomized (i.e., coil-fed steel were to be cut into
blanks, randomized and then measured), the data would then not be
autocorrelated. Yet the final shipped outcome (the total process
distribution as indicated by a histogram) would be identical. The
underlying cause for the autocorrelation has been broken. Is this
practical or feasible to do forever? No, not in this case – but this
example does serve to illustrate the possible nature of autocorrelation in
a process.
158
APPENDIX A
Some Comments on Subgrouping
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while ignoring its effect on the process variation. Since Cpk is based on
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the above example that the Cpk will be extremely high, yet it is obvious
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that there is more variation in the process which has not been captured by
en
Cpk.
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Identifying Autocorrelation
gh
Or is d
50
Man, Material, Method, Machine, Mother Nature (Environment), Measurement System.
159
APPENDIX A
Some Comments on Subgrouping
Secondly, there are statistical analyses51 that can be used to determine the
actual autocorrelation coefficient and pattern. The methodology of
paired sample correlation analysis can be used to compare the current
sample to the prior sample, then the next sample to the current sample,
etc. When samples from a process are stable and independent, the plotted
point will be positioned “randomly” (random from a normal distribution)
between the control limits. The plotted points from an autocorrelated
process will not vary far from their neighboring sampling points, forming
a lazy, wandering pattern.
din p
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I and MR:
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Inc
If the within-subgroup variation is less than or equal to the
d a ion
discrimination of the measurement system which is appropriate for the
rke Act
al
process, an I and MR chart may be a suitable method to control the
on
process variation. However, very strong autocorrelation may still display
ma ry
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Structured Samples:
1
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The selection of the sampling quantity and frequency should reflect the
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dominant, then the sampling should occur whenever the material changes
o
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Autoregressive Charts:
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In cases where the assumption that the sample data are independent is
en
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Structured Charting:
o
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51
The Durbin-Watson test statistic is one method to determine the degree of autocorrelation and is
included in many statistical software packages. See Biometrika, 38, pp. 159-178, 1951.
52
For example, see Appendix A for discussion on autocorrelation.
160
APPENDIX A
Some Comments on Subgrouping
Summary
What is important here is considering the concept of autocorrelation and
the ability to recognize it in a process, then understanding its possible
impact on statistical results.
This discussion of autocorrelation is intended only to raise awareness
that such a phenomenon exists, how to recognize it, and that its effects, if
din p
.
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not recognized or understood, can be quite harmful to otherwise good
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SPC practices. If the reader should suspect autocorrelation in a process,
then a statistician should be consulted.
Inc
d a ion
It is important to understand the real meaning of “random”. In practice,
rke Act
al
on
many people think that by blindly selecting pieces here and there that
ma ry
what they are doing is “random” selection. In reality, this may be
ati
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haphazard sampling or convenience sampling (see Glossary). Selection
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conclusions.
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Or is d
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161
APPENDIX A
Some Comments on Subgrouping
din p
numerical example below provides an example of possible results
.
or ou
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obtained using these three methods.
cc Gr
Inc
d a ion
rke Act
al
Methods to collect data from the output of a multiple stream (spindle) production
on
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Every hour a 16 part sample is collected by taking the parts from four
consecutive cycles from each stream.
162
APPENDIX A
Some Comments on Subgrouping
din p
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cc Gr
One subgrouping scheme would be to plot the average and range of each
Inc
d a ion
column of each array of data. Using this subgrouping scheme, stream-to-
rke Act
al
stream variation would be contained within each subgroup. Hour-to-hour
on
variation and cycle-to-cycle variation would contribute to differences
ma ry
ati
between subgroups. Another possible subgrouping scheme would be to
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Data from 20 consecutive hours are used to construct control charts with
each subgrouping method.
163
APPENDIX A
Some Comments on Subgrouping
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164
APPENDIX A
Some Comments on Subgrouping
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Inc
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s c um S
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Or is d
The control charts for the different subgrouping schemes are very
different even though they are derived from the same data. The X chart
Th
165
APPENDIX A
Some Comments on Subgrouping
The second set of charts use cycle to cycle variation as a basis for
comparison. The R chart checks to see that the cycle-to-cycle variation is
stable over time and the X chart compares stream-to-stream variation
and hour-to-hour variation with the base level of variation established by
the ranges; i.e., cycle-to-cycle variation. The second set of charts identify
that a special cause is affecting the process; i.e., the third stream is
different from the other streams. Since the stream to stream differences
are so large, the control limits in the first set of charts are much wider
than the second set.
With the second subgrouping method, the data could be used to create
four separate sets of control charts from the data, one for each stream.
din p
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E- der ocu
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This comparison of the charts shows that the average of the third stream is
Or is d
higher than the others and the individual processes are out of control. The
Th
base level of variation used for study of the results from each stream is cycle-
to-cycle variation as reflected in the range. For each stream the effects of
hour-to-hour variation are shown on the X charts. By plotting the charts
using the same scale, the level and variation for each stream can be
compared.
Method 3:
The third method of sampling would be to sample the parts from the
combined output from all four streams. This method gives some insight
into the variation that is sent to the next process but the parts can no
longer be differentiated by production stream. Provided the parts in the
166
APPENDIX A
Some Comments on Subgrouping
din p
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variation is consistent over time. The X chart answers the question, “Is
b
en
subgrouping should be used that will allow questions about the effects of
potential sources of variation to be answered.
167
APPENDIX A
Some Comments on Subgrouping
din p
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different material, setups, procedures, etc.
cc Gr
• The initial sampling did not include all the possible sources of
Inc
d a ion
variation which are affecting the production process. This is a real
rke Act
possibility if the initial sample size is small.
al
• on
The actual process index is close to the target index and sampling
ma ry
ati
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variation is causing the difference in conclusions.
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The third reason deals with the sampling variation inherent in any
an e A n:
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as m
sampling scheme (see also Chapter I, Section G). Unless the sample
o
o
includes all the output of the process, there will be sampling variation53
i
d h ut
t
to:
ted y t ira
distribution.
h
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Actual Ppk
en
Sampling
an is d ume be t is
5
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Variation
Th Doc Num men
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E- der ocu
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Or is d
Th
Confidence Bounds
Using the sampling distribution (the distribution of the statistic (index)),
it is possible to calculate confidence bounds for the index. These values
53
Note: Although the actual sampling distribution of the indices will generally be non-normal, this
discussion will use a symmetric distribution as an example.
168
APPENDIX A
Some Comments on Subgrouping
din p
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Observed Ppk
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Inc
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Actual Ppk on
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Lower Confidence Bound
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Sample Size
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The larger the sample size the “tighter” the sampling distribution. It is
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contradictory conclusions.
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b
en
For example, when evaluating new processes the initial sample is usually
an is d ume be t is
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o
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Initial Extended
Or is d
Study Study
Th
Target Ppk
Observed Ppk
Actual Ppk
Sample Size
169
APPENDIX A
Some Comments on Subgrouping
When the actual index is close to the target index then the differences in
sampling variation can lead to seemingly contradictory conclusions even
if there are no changes in the process and both samples encompass the
same sources of variation.
Initial Extended
Study Study
Observed Ppk
Actual Ppk
din p
.
or ou
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Target Ppk
cc Gr
Inc
d a tion
al
ar Ac
on
rm try
ati
ke
n w In 1
ate dus
rn
ee tive 201
Sample Size
nte
/
ha tom /31
aI
gn
nd Au n: 3
sb o
In the case where the actual index (unknown) is exactly equal to the
Ma
d a the tio
target index then, regardless of the sample size, the probability of calling
to:
cte by xpira
the process acceptable is only 50%. In other words, the calculated index
will be greater or equal to the target index only half the time.
py ent te L 262 ed
pr ne e E
i 54 ns
d i oc nt r: 4 lice
Initial Extended
ht ow ns
ote d
rig is ice
Study Study
an is d ume be t is
Th Doc Num men
s c um S
E- der ocu
Actual Ppk
Or is d
oPpk
and
Th
Target Ppk
Observed
Sample Size
The sample size used in a process study and how close the actual index
is to the target index has a significant impact on the validity of any
predictive decision made about the process.
170
APPENDIX B
Some Comments on Special Causes
APPENDIX B
Some Comments on Special Causes
Over-Adjustment
din p
.
or ou
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following examples demonstrate this concept. The first graph shows the
cc Gr
variation in results with no adjustment. The second graph shows the
Inc
variation in results when an adjustment is made to the process to
d a ion
compensate for each deviation from the target. The third graph shows
rke Act
al
variation in results when adjustments are made to compensate only when
on
the last result was more than one unit from the target. This third case is
ma ry
ati
ter ust
an example of compensation to stay within a set of specifications. Each
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Or is d
Th
171
APPENDIX B
Th
Or is d
E- der ocu
Some Comments on Special Causes
172
an e A n: ati
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cc Gr
Inc
Xbar Chart of Process
d a ion
30
rke Act
al
on
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ati
25
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Sample Mean
UCL=20.92
_
_
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aI
20 X=19.65
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LCL=18.37
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15
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10
n
1 5 11 15 21 25 31 35 41 45 50
t p wn se
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Sample
en
an s d me be is
5
tec
t
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u
Th
LSL USL
i
Target
173
APPENDIX B
Some Comments on Special Causes
30
25
Frequency
20
15
10
din p
.
or ou
gly
0
12 14 16 18 20 22 24 26 28
cc Gr
Inc
d a ion
rke Act
al
The process is being run on one shift per day. When the data are
on
evaluated on that basis, the process exhibited short-term periods of
ma ry
ati
statistical control.
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Time Period 0 1 2 3 4
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20
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15
5
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o
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E- der ocu
10
1 5 11 15 21 25 31 35 41 45 50
gh
Sample
Or is d
Th
This implies that the process could be monitored using a short run chart
(see Chapter III). Other time dependent processes can be monitored by
the Individuals and Moving Range Chart, the EWMA Chart, the ARIMA
Chart and others.
The charts reveal sensitivity to some special cause. The need for further
investigation or process improvement should be considered in the
context of business priorities.
The question is whether process parameters are reliable when estimated
under such conditions. The answer is no. Deming (1986), Wheeler and
Chambers (1992) and Bothe (2002) discuss the risks involved in making
capability evaluations when the process lacks statistical control. The
consequences of making an erroneous decision based on data from an
174
APPENDIX B
Some Comments on Special Causes
din p
• The economics involved in acting upon the special cause exceed the
.
or ou
gly
benefit to any and all customers. Economically allowable special
cc Gr
causes may include tool wear, tool regrind, cyclical (seasonal)
Inc
d a ion
variation, etc.
rke Act
al
• The special cause has been identified and has been documented as
consistent and predictable.
on
ma ry
ati
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In these situations, the customer may require the following:
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•
i
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en
Repeating Patterns
an is d ume be t is
5
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Th Doc Num men
There are times when repetitive patterns are present in control charts due
s c um S
eliminated.
gh
Or is d
larger. In this example the average chart would have an increasing trend.
This trend would continue until the tool is replaced. Over time the
average chart will exhibit a sawtooth pattern. As this example
highlights, repetitive trends will be present when a process has
significant input variables that change consistently overtime which
cannot economically be reduced to random causes.
175
APPENDIX B
Some Comments on Special Causes
Where modified control limits are used caution should be employed since
these charts may fail to disclose the presence or absence of statistical
din p
.
or ou
gly
control in the manufacturing process.
cc Gr
An alternate approach is to use the Regression Control Chart discussed in
Inc
d a ion
Chapter III.
rke Act
al
Besides influencing trends, these types of special causes may also cause
on
a batch to batch mean shift. If this additional variation is acceptable to
ma ry
ati
the customer then the process may be controlled using Short Run Charts
ter ust
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o
s c um S
E- der ocu
gh
Or is d
Th
176
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
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h t i o rn
177
an e A n: ati
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APPENDIX C
wa Ind
ter ust
ma ry
rke Act
Described in This Manual
d a ion
cc Gr
or ou
din p
gly
.
Selection Procedure for the Use of the Control Charts
APPENDIX C
Selection Procedure for the Use of the Control Charts Described in This Manual
APPENDIX C
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i o rn
178
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Selection Procedure for the Use of the Control Charts Described in This Manual
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ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
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gly
.
APPENDIX D
Relationship Between Cpm and Other Indices
APPENDIX D
Relationship Between Cpm and Other Indices
The Cpm index, often associated with Taguchi's Loss Function, was
developed as an alternate way to account for the effect of process
centering on estimates of process capability or performance. The Cpk and
Ppk indices focus on the process mean and not the specification target
value, while the Cpm index focuses on the target value. As discussed in
Chapter IV, all four of the standard indices (Cp, Cpk, Pp, and Ppk) should
be evaluated for the same data set to obtain a comprehensive assessment
din p
of process capability and performance. A large difference between Cp
.
or ou
gly
and Cpk or between Pp and Ppk is an indication of a centering problem. In
cc Gr
contrast, by including the variation between the process mean and the
Inc
d a ion
specification target value in the calculation, the Cpm index evaluates how
well the process meets the specification target whether it is centered or
rke Act
al
not. See Boyles (1991) and Chan, L. J., S.W. Cheng, and F.A. Spiring
on
ma ry
(1988) for additional information.
ati
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en e 11
rn
be otiv /20
wa Ind
nte
The difference between Cpm and other indices discussed in this manual
1
aI
results from the way the standard deviation is calculated. The indices
3/3
discussed in the text use the standard deviation; i.e., the variation around
gn
an e A n:
Ma
process mean, X . Cpm uses an analogue based on the target, i.e., the
as m
o
o
ted y t ira
xp
op en ite 426 sed
h
ro ed E
n
USL − LSL n
(x i − T ) 2
t p wn se
∑
yri t is Lic 2
d i oc nt r: 4 lice
C pm = sC pm =
b
, where
en
6 sC pm i=1 n −1
an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
(USL – T) = (T – LSL)
gh
Or is d
Th
54
See Bothe (2001) for a discussion of the situation where T is not the middle of the specification.
179
APPENDIX D
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
Relationship Between Cpm and Other Indices
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i o rn
180
an e A n: ati
d h ut on
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1 al
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rke Act
d a ion
cc Gr
or ou
din p
gly
.
APPENDIX E
Table of Constants and Formulas for Control Charts
APPENDIX E
Table of Constants and Formulas for Control Charts*
X and R Charts X and s Charts
Chart for Chart for Ranges (R) Chart for Chart for Ranges (R)
Averages Averages
Control Divisors to Factors for Control Divisors to Factors for
Limits Estimate Control Limits Limits Estimate Control Limits
Factor σX Factor σX
Subgroup A2 d2 D3 D4 A3 c4 B3 B4
Size
din p
.
or ou
gly
2 1.880 1.128 3.267 2.659 0.7979 3.267
cc Gr
3 1.023 1.693 2.574 1.954 0.8862 2.568
Inc
d a ion
4 0.729 2.059 2.282 1.628 0.9213 2.266
rke Act
5 0.577 2.326 2.114 1.427 0.9400 2.089
al
on
6 0.483 2.534 2.004 1.287 0.9515 0.030 1.970
ma ry
ati
7 0.419 2.704 0.076 1.924 1.182 0.9594 0.118 1.882
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as m
ted y t ira
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
*
From ASTM publication STP-15D, Manual on the Presentation of Data and Control Chart Analysis, 1976;
pp 134-136. Copyright ASTM, 1916 Race Street, Philadelphia, Pennsylvania 19103. Reprinted, with
permission.
181
APPENDIX E
Table of Constants and Formulas for Control Charts
din p
.
3 1.187 1.693 2.574 1.772 1.693 2.574
or ou
gly
cc Gr
4 0.796 2.059 2.282 1.457 2.059 2.282
Inc
d a ion
5 0.691 2.326 2.114 1.290 2.326 2.114
rke Act
al
6 0.548 2.534 2.004 1.184 2.534 2.004
on
ma ry
ati
7 0.508 2.704 0.076 1.924 1.109 2.704 0.076 1.924
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wa Ind
8 0.433 2.847 0.136 1.864 1.054 2.847 0.136 1.864
nte
1
aI
as m
o
o
i
d h ut
t
to:
ted y t ira
Median Charts
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
tec
Th Doc Num men
**
A2 factors derived from ASTM-STP-15D Data and Efficiency Tables contained in Dixon and Massey
(1969), page 488.
182
APPENDIX E
Table of Constants and Formulas for Control Charts
Attributes Charts
din p
.
or ou
gly
np np
cc Gr
np chart for UCLnp = np + 3 np (1 − ) LCLnp = np − 3 np (1 − )
number/rate of CLnp = np n n
Inc
d a ion
units in a category
rke Act
= np + 3 np(1 − p ) = np − 3 np(1 − p )
al
c chart for number on
ma ry
ati
ter ust
of incidences in
en e 11
rn
categories
1
aI
3 u 3 u
an e A n:
Ma
as m
UCLu = u + LCLu = u −
o
o
ni ni
i
d h ut
t
to:
ted y t ira
xp
u u
op en ite 426 sed
=u +3 = u −3
h
ro ed E
ni ni
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
3 u 3 u
5
UCLu = u + LCLu = u −
tec
Th Doc Num men
u chart for
o
n n
number of CLu = u
s c um S
E- der ocu
in one or more
Or is d
n n
categories
If the sample size is constant (n)
Th
3 u 3 u
UCLu = u + LCLu = u −
n n
u u
= u +3 = u −3
n n
183
APPENDIX E
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
Table of Constants and Formulas for Control Charts
184
an e A n: ati
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ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
din p
gly
.
APPENDIX F
Capability Index Calculations Example
APPENDIX F
Capability Index Calculations Example
For capability indices to be valid, several assumptions should be satisfied
(see Chapter IV, Section A and Section B). They are:
• The process from which the data come is statistically stable, that is,
the normally accepted SPC rules must not be violated.
• The individual measurements from the process data form an
approximately normal distribution.55
• A sufficient number of parts must be evaluated in order to capture
din p
.
or ou
gly
the variation that is inherent in the process. It is recommended that at
cc Gr
least 125 individual values be collected using a subgroup size of five.
Other subgroup sizes may be more appropriate for a particular
Inc
d a ion
application, but the total sample size should be at least 125.
rke Act
al
on
• The specifications are based on customer requirements.
ma ry
ati
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wa Ind
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The following data set is evaluated against these assumptions and, since
the assumptions hold, the capability indices are calculated.
1
aI
3/3
gn
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
o
s c um S
E- der ocu
gh
Or is d
Th
55
For non-normal distributions, see Chapter IV, Section B.
185
APPENDIX F
Capability Index Calculations Example
Data Set:
Data Diameter Data Diameter Data Diameter Data Diameter Data Diameter
Point Point Point Point Point
1 22.30 26 22.37 51 22.28 76 22.65 101 22.48
2 22.54 27 22.34 52 22.55 77 22.50 102 22.38
3 22.01 28 22.75 53 22.38 78 22.41 103 22.28
4 22.62 29 22.71 54 22.65 79 22.39 104 22.72
5 22.65 30 22.51 55 22.56 80 22.48 105 22.96
din p
.
or ou
gly
6 22.86 31 22.23 56 22.54 81 22.50 106 22.53
cc Gr
7 22.68 32 22.36 57 22.25 82 22.86 107 22.52
Inc
d a ion
8 22.43 33 22.90 58 22.40 83 22.60 108 22.61
rke Act
al
on
9 22.58 34 22.45 59 22.72 84 22.60 109 22.62
ma ry
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rn
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an e A n:
Ma
as m
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t p wn se
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b
en
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Th Doc Num men
gh
186
APPENDIX F
Capability Index Calculations Example
Analysis
Histogram Chart, Normality Plot and the Xbar and R Chart can be used to determine the validity of the
first two assumptions.
LSL USL
Within
Overall
din p
.
or ou
gly
cc Gr
Inc
d a ion
rke Act
al
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gn
an e A n:
Ma
as m
o
o
i
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t
to:
ted y t ira
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
.999
an is d ume be t is
5
tec
.99
Th Doc Num men
.95
s c um S
E- der ocu
Probability
.80
gh
Or is d
.50
Th
.20
P-Value: 0.677
.05
.01
.001
The above two graphs provide evidence that the data likely came from a normally distributed population.
187
APPENDIX F
Capability Index Calculations Example
22.8
Sample Mean UCL=22.77
22.7
22.6
Mean=22.53
22.5
22.4
22.3 LCL=22.29
Subgroup 0 5 10 15 20 25
din p
1.0
.
or ou
gly
UCL=0.8847
Sample Range
cc Gr
Inc
d a ion
0.5
R=0.4184
rke Act
al
on
ma ry
ati
0.0 LCL=0
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gn
Control charts provide evidence that the process is in statistical control. Consequently it is
an e A n:
Ma
as m
ted y t ira
xp
op en ite 426 sed
Diameter Statistics:
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
tec
Subgroup Size = 5
Th Doc Num men
Number of Subgroups = 25
s c um S
E- der ocu
0.4184
Within-subgroup standard deviation = σ̂ C = R = = 0.179880
d2 2.326
n
(x i − x) 2
Total variation standard deviation = s = ∑i n − 1 = 0.189037
188
APPENDIX F
Capability Index Calculations Example
X − LSL USL − X
C pk = Minimum CPL = , CPU =
3 R 3 R
d 2 d2
din p
= Minimum CPL =
.
, CPU =
or ou
gly
3 × 0.179880 3 × 0.179880
cc Gr
Inc
d a ion
= Minimum ( CPL = 1.91, CPU = 1.80 )
rke Act
al
on
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gn
as m
6s 6 × 0.189037
o
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
USL − X
h
X − LSL
ro ed E
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
6s 6s
b
en
an is d ume be t is
5
tec
Th Doc Num men
3 × 0.189037 3 × 0.189037
gh
Or is d
= 1.71
189
APPENDIX F
Capability Index Calculations Example
Conclusion:
The following observations are made:
• Cpk is approximately equal to Cp, and Ppk is approximately equal to
Pp. Both of these conditions are indicators that the process is well
centered.
• All indices are relatively high indicating that the process is capable
of producing near-zero nonconformances if the process remains in
statistical control.
• Since the Cp and Pp are approximately equal it implies minimal
between-subgroup variation.
din p
.
or ou
gly
• A large discrepancy between Cpk and Ppk would indicate the presence
cc Gr
of excessive between-subgroup variation.
Inc
d a ion
• A large discrepancy between Cp and Cpk (or between Pp and Ppk)
rke Act
al
would indicate a process centering problem.
on
ma ry
ati
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NOTE: The process variability is an integral part of the capability index
be otiv /20
wa Ind
nte
3/3
shows there are two ways to estimate the process variability (σˆ C ) and its
gn
effect on the Cpk calculations. Both are correct; i.e., both are valid
an e A n:
Ma
as m
o
o
ted y t ira
d2
xp
op en ite 426 sed
c4
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
Th Doc Num men
gh
R 0.1799 1.80
Or is d
d2
Th
s 0.1820 1.78
c4
190
Appendix G
Glossary of Terms and Symbols
APPENDIX G
Glossary of Terms and Symbols
ARMA Control Chart The Autoregressive Moving Average Control Chart is a control
chart which uses a regression model to account for
interrelationship among the data. It may be used in cases where
the assumption that the sample data are independent is violated.
din p
.
or ou
gly
Attributes Data Qualitative data that can be categorized for recording and
cc Gr
analysis. Examples include characteristics such as: the
Inc
presence of a required label, the installation of all required
d a ion
fasteners, the absence of errors on an expense report. Other
rke Act
al
on
examples are characteristics that are inherently measurable
ma ry
ati
(i.e., could be treated as variables data), but where the
ter ust
en e 11
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ted y t ira
Data).
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
b
en
time series.
an is d ume be t is
5
tec
Th Doc Num men
Average (see also Mean) The sum of values divided by the number (sample size) of
s c um S
E- der ocu
Average Run Length The number of sample subgroups expected between out-of-
control signals. The in-control Average Run Length
191
Appendix G
Glossary of Terms and Symbols
Cause and Effect Diagram A simple tool for individual or group problem solving that
din p
.
or ou
gly
uses a graphic description of the various process elements
cc Gr
to analyze potential sources of process variation. Also
Inc
d a ion
called fishbone diagram (after its appearance) or Ishikawa
diagram (after its developer).
rke Act
al
on
ma ry
ati
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rn
Centerline The line on a control chart that represents the average value
be otiv /20
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as m
o
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
Common Cause A source of variation that affects all the individual values
h
ro ed E
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
tec
Th Doc Num men
Continual Improvement The operational philosophy that makes best use of the
talents within the Company to produce products of
increasing quality for our customers in an increasingly
efficient way that protects the return on investment to our
stockholders. This is a dynamic strategy designed to
192
Appendix G
Glossary of Terms and Symbols
din p
.
errors. It has two basic uses: as a judgment to determine if a
or ou
gly
process has been operating in statistical control, and to aid
cc Gr
in maintaining statistical control.
Inc
d a ion
rke Act
al
Control Limit on
A line (or lines) on a control chart used as a basis for
ma ry
ati
ter ust
judging the stability of a process. Variation beyond a
en e 11
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an e A n:
Ma
as m
o
o
i
d h ut
t
to:
Control Statistic The statistic used in developing and using a control chart.
ted y t ira
t p wn se
the process that produced the output from which the sample
yri t is Lic 2
d i oc nt r: 4 lice
b
en
came.
an is d ume be t is
5
Convenience Sampling A sample scheme wherein the samples are collected using
tec
Th Doc Num men
193
Appendix G
Glossary of Terms and Symbols
CUSUM Control Chart A control chart approach that uses the current and recent
past process data to detect small to moderate shifts in the
process average or variability. CUSUM stands for
“cumulative sum” of deviations from the target and puts
equal weight on the current and recent past data.
din p
.
unacceptable output after it has been produced and then
or ou
gly
separate it from acceptable output (see also Prevention).
cc Gr
Inc
d a ion
rke Act
al
Dispersion See Process Spread.
on
ma ry
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as m
t p wn se
b
en
tec
Th Doc Num men
EWMA Control Chart The Exponentially Weight Moving Average Control Chart
s c um S
E- der ocu
Haphazard Sampling A sample scheme wherein the samples are collected using
an unsystematic, indiscriminant, unplanned, and/or chaotic
approach. This type of sampling is not appropriate for
process analysis or control because it can lead to a biased
result and consequently a possible erroneous decision.
194
Appendix G
Glossary of Terms and Symbols
din p
Mean A measure of location. The average of values in a group of
.
or ou
gly
measurements.
cc Gr
Inc
d a ion
rke Act
al
MCUSUM Control Chart The Multivariate Cumulative Sum Control Chart is the
on
application of the CUSUM Control Chart approach to
ma ry
ati
ter ust
multivariate situations.
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wa Ind
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1
aI
as m
ted y t ira
t p wn se
yri t is Lic 2
b
en
subgroup.
an is d ume be t is
5
tec
Th Doc Num men
195
Appendix G
Glossary of Terms and Symbols
Multivariate Control Chart The genre of control charts that have been developed to
monitor and control processes that are more appropriately
modeled with a multivariate distribution rather than
multiple univariate distributions.
din p
.
analyze systems producing nonconforming units.
or ou
gly
cc Gr
Inc
d a ion
Nonconformity A specific occurrence of a condition which does not
rke Act
al
conform to a specification or other inspection standard. An
on
individual nonconforming unit can have more than one
ma ry
ati
ter ust
nonconformity. For example, a door could have several
en e 11
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as m
o
o
i
d h ut
t
to:
ted y t ira
Non-Normal Control Chart A control chart approach in which adjustments are made to
xp
op en ite 426 sed
t p wn se
b
en
tec
Th Doc Num men
Non-Normal Distribution A probability distribution that does not follow the normal
s c um S
E- der ocu
196
Appendix G
Glossary of Terms and Symbols
din p
.
or ou
gly
cc Gr
Pareto Chart A simple tool for problem solving that involves ranking all
Inc
d a ion
potential problem areas or sources of variation according to
their contribution to cost or to total variation. Typically, a
rke Act
al
on
few causes account for most of the cost (or variation), so
ma ry
ati
problem-solving efforts are best prioritized to concentrate
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many”.
1
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gn
an e A n:
Ma
ted y t ira
parameter it estimates.
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
charts.
s c um S
E- der ocu
gh
Or is d
56
See Deming (1982).
197
Appendix G
Glossary of Terms and Symbols
Probability Based Charts An approach which uses analysis and charts based on
categorical data and the probabilities related to the
categories for the control and analysis of products and
processes.
Probability Sampling See Random Sampling.
din p
.
or ou
gly
Process The combination of people, equipment, materials, methods,
cc Gr
measurement and environment that produce output – a
Inc
d a ion
given product or service. A process can involve any aspect
of the business. “6M’s” is a catch phrase sometimes used
rke Act
al
on
to describe a process: Man, Material, Method, Machine,
ma ry
ati
Mother Nature, Measurement.
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1
aI
as m
overall average, X .
o
o
i
d h ut
t
to:
ted y t ira
xp
op en ite 426 sed
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
tec
This is defined as 6 σˆ C .
Th Doc Num men
o
s c um S
E- der ocu
nonconformances or nonconformities.
Th
198
Appendix G
Glossary of Terms and Symbols
Random Sampling A random sample is one in which every sample point has
the same chance (probability) of being selected. A random
sample is systematic and planned; that is, all sample points
are determined before any data are collected.
din p
.
or ou
gly
The process of selecting units for a sample of size n, in
cc Gr
such a manner that each n unit under consideration has an
Inc
d a ion
equal chance of being selected in the sample.
rke Act
al
on
Convenience Sampling:
ma ry
ati
ter ust
See Convenience Sampling
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Haphazard Sampling:
1
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as m
o
o
ted y t ira
population.
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
yri t is Lic 2
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Regression Control Chart Regression Control Charts are used to monitor the
relationship between two correlated variables in order to
determine if and when deviation from the known
predictable relationship occurs.
Residuals Control Chart A chart that monitors a process using the residuals
(differences) between a fitted model and the data. A
process shift will cause a shift in the mean of the residuals.
199
Appendix G
Glossary of Terms and Symbols
din p
Short Run Control Chart A control chart approach in which adjustments are made to
.
or ou
gly
the data or the control limits to allow process control
cc Gr
similar to that of Shewhart charts for processes that only
Inc
d a ion
produce a small number of products during a single run
rke Act
al
on
ma ry
ati
Sigma (σ )
ter ust
The Greek letter used to designate a standard deviation of a
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population.
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Special Cause A source of variation that affects only some of the output of
an e A n:
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as m
o
o
ted y t ira
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b
en
an is d ume be t is
5
Bilateral:
A bilateral specification identifies requirements at both
extremes of the process range. Often referred to as a two-
sided specification or tolerance.
Unilateral:
A unilateral specification identifies requirements at only
one extreme of the process range. Often referred to as a
one-sided specification or tolerance.
200
Appendix G
Glossary of Terms and Symbols
Standard Deviation A measure of the spread of the process output or the spread
of a sampling statistic from the process (e.g., of subgroup
din p
averages).
.
or ou
gly
cc Gr
Inc
d a ion
Statistic A value calculated from or based upon sample data (e.g., a
rke Act
al
subgroup average or range) used to make inferences about
on
the process that produced the output.
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ati
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Statistical Control The condition describing a process from which the effect of
1
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as m
ted y t ira
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
tec
estimate).
Or is d
Th
Statistical Process Control The use of statistical techniques such as control charts to
analyze a process or its output so as to take appropriate
actions to achieve and maintain a state of statistical control
and to improve the process capability.
201
Appendix G
Glossary of Terms and Symbols
Stoplight Control Chart A probability based chart approach to process control that
uses three categories and double sampling. In this approach
the target area is designated green, the warning areas as
yellow, and the stop zones as red. The use of these colors
gives rise to the “stoplight” designation.
din p
.
or ou
causes) will appear as differences between subgroups.
gly
cc Gr
Rational subgroups are typically made up of consecutive
pieces, although random samples are sometimes used.
Inc
d a ion
rke Act
al
Tolerance See Specification. on
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an e A n:
Ma
as m
ted y t ira
xp
op en ite 426 sed
t p wn se
b
en
tec
Th Doc Num men
o
s c um S
E- der ocu
Type II Error Failing to reject an assumption that is false; e.g., not taking
gh
202
Appendix G
Glossary of Terms and Symbols
din p
.
This is the variation due only to the variation within the
or ou
gly
subgroups. If the process is in statistical control this variation is
cc Gr
a good estimate of the inherent process variation. It can be
Inc
d a ion
R s
estimated from control charts by d 2 or c4 .
rke Act
al
on
ma ry
ati
Between-subgroup Variation:
ter ust
en e 11
rn
as m
t p wn se
b
en
tec
Th Doc Num men
( xi − x )2
n
σˆ P = s = ∑i n − 1 where xi is an individual reading,
s c um S
E- der ocu
gh
57
See also AT&T. (1984) .
203
Appendix G
Glossary of Terms and Symbols
Symbols
as Used in This Manual
A2 A multiplier of R used to calculate the control limits for
averages; tabled in Appendix E.
din p
.
or ou
A3 A multiplier of s used to calculate the control limits for
gly
cc Gr
averages; tabled in Appendix E.
Inc
d a ion
rke Act
al
on
B3 , B4 Multipliers of s used to calculate the lower and upper
ma ry
ati
control limits, respectively, for sample standard deviations;
ter ust
en e 11
rn
tabled in Appendix E.
be otiv /20
wa Ind
nte
1
aI
3/3
gn
as m
ted y t ira
xp
op en ite 426 sed
constant size n.
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
an is d ume be t is
5
tec
gh
Or is d
(USL − LSL)
as .
6σˆ C
204
Appendix G
Glossary of Terms and Symbols
din p
d2
.
A divisor of R used to estimate the process standard
or ou
gly
cc Gr
deviation; tabled in Appendix E.
Inc
d a ion
rke Act
al
D3 , D4 Multipliers of R used to calculate the lower and upper
on
ma ry
ati
control limits, respectively, for ranges; tabled in Appendix
ter ust
en e 11
rn
E. be otiv /20
wa Ind
nte
1
aI
3/3
gn
as m
ted y t ira
E.
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
k
yri t is Lic 2
b
en
limits.
an is d ume be t is
5
tec
Th Doc Num men
LCL The lower control limit; LCLX , LCLR , LCLp , etc., are,
s c um S
E- der ocu
205
Appendix G
Glossary of Terms and Symbols
din p
chart is discussed in Chapter II, Section C.
.
or ou
gly
cc Gr
Inc
d a ion
p The average proportion of units nonconforming in a series
rke Act
al
of samples.
on
ma ry
ati
ter ust
en e 11
rn
3/3
gn
an e A n:
Ma
as m
o
o
i
ted y t ira
of PPU or PPL.
xp
op en ite 426 sed
h
ro ed E
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
( X − LSL)
tec
.
Th Doc Num men
3σˆ P
s c um S
E- der ocu
gh
Or is d
(USL − X )
.
3σˆ P
1
PR The performance ratio, typically defined as .
Pp
206
Appendix G
Glossary of Terms and Symbols
din p
The sample standard deviation for processes; s is discussed
.
or ou
gly
in Chapter IV, Section A.
cc Gr
Inc
d a ion
rke Act
s The average sample standard deviation of a series of
al
on
subgroups, weighted if necessary by sample size.
ma ry
ati
ter ust
en e 11
rn
be otiv /20
wa Ind
nte
3/3
gn
an e A n:
Ma
as m
ted y t ira
h
ro ed E
t p wn se
yri t is Lic 2
b
en
an is d ume be t is
5
tec
Th Doc Num men
UCL The upper control limit; UCLX , UCLR , UCLp , etc., are,
o
s c um S
207
Appendix G
Glossary of Terms and Symbols
din p
.
or ou
gly
cc Gr
z The number of standard deviation units from the process
Inc
d a ion
average to a value of interest such as an engineering
rke Act
al
specification. When used in capability assessment, zUSL is
on
ma ry
the distance to the upper specification limit, zLSL is the
ati
ter ust
en e 11
rn
3/3
gn
an e A n:
Ma
as m
deviation of a population.
to:
ted y t ira
xp
op en ite 426 sed
h
ro ed E
σ x , σ R , σ np , etc.
n
t p wn se
b
en
gh
Or is d
characteristic.
208
Th
Or is d
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i o rn
209
an e A n: ati
d h ut on
as m o 3/3
1 al
be otiv /20 Inc
en e 11
variation of the process.
wa Ind
ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
din p
gly
.
Appendix G
Th
Or is d
Glossary of Terms and Symbols
E- der ocu
Th Doc Num men
an is d ume be t is
d i oc nt r: 4 lice
s c um S 5 n
op en ite 426 sed
yri t is Lic 2 to:
gh o
t p wn se
en Ma
ro ed E gn
tec b xp aI
ted y t ira nte
h t i o rn
210
an e A n: ati
d h ut on
as m o 3/3
1 al
be otiv /20 Inc
en e 11
wa Ind
This page intentionally left blank
ter ust
ma ry
rke Act
d a ion
cc Gr
or ou
din p
gly
.
APPENDIX H
References and Suggested Readings
APPENDIX H
References and Suggested Readings58
American National Standards Committee Z-1 (1996). Guide for Quality Control Charts; Control Chart
Method of Analyzing Data; Control Chart Method of Controlling Quality During Production, American
Society for Quality (ASQ), Milwaukee, WI.
ASQC Statistics Division, Statistical “How-To” Techniques Series, ASQC Quality Press (15 Volumes),
1979-1991.
din p
.
or ou
gly
ASQC (1987). Definitions, Symbols, Formulas, and Tables for Control Charts, ANSI/ASQC A1-1987.
cc Gr
Inc
d a ion
ASTM International (2002). Manual on Presentation of Data and Control Chart Analysis (STP-15D),
rke Act
al
7th edition.59
on
ma ry
ati
ter ust
AT&T Technologies, Inc. (1984). Statistical Quality Control Handbook. AT&T Technologies, Inc.
en e 11
rn
1
aI
an e A n:
Ma
as m
ted y t ira
Box, G.E.P., Jenkins, G.M. and Reinsel, G.C. (1994). Time Series Analysis, Forecasting and Control.
xp
op en ite 426 sed
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
Bissell, B.A.F. (1990). “How Reliable Is Your Capability Index?”, Applied Statistics, Vol. 39, 1990, pp.
an is d ume be t is
331-340.
5
tec
Th Doc Num men
Boyles, R.A. (1991). “The Taguchi Capability Index”, Journal of Quality Technology, Vol. 23, 1991, pp.
s c um S
E- der ocu
17-26.
gh
Or is d
Box, G.E.P. and Cox, D.R. (1964). “An Analysis of Transformations”, J. Royal Stat. Soc., Series B,
Th
V26, p. 211
Brase, C.H., and Brase, C.P. (1999). Understanding Statistics, 6th edition, Houghton Mifflin Company,
New York.
Burr, I.W. (1942). “Cumulative Frequency Distributions”, Annals of Mathematical Statistics, Vol. 13,
pp. 215-232.
Burr, I.W. (1967). “The Effect Of Non-Normality On Constants For Charts”, Industrial Quality Control,
May, pp. 563-569.
58
See Freund and Williams (1966) for an extensive listing of statistical terms and definitions.
59
Available from the ASTM International, 100 Barr Drive, West Conshohocken, PA 19428-2959.
211
APPENDIX H
References and Suggested Readings
Chan, L.J., Cheng, S.W. and. Spiring, F.A. (1988). “A New Measure of Process Capability: Cpm”,
Journal of Quality Technology, Vol. 20, No. 3, 1988, pp. 162-175.
Chan, L.K., and Cui, H.J. (2003). “Skewness Correction charts for Skewed Distributions”, Naval
Research Logistics, Volume 50, Issue 6, pp. 555 - 573.
Champ, C.W., and Rigdon, S.E. (1997). “An Analysis of the Run Sum Control Chart”, Journal of
Quality Technology, Vol. 29, No. 4.
Charbonneau, H.C. and Gordon, L.W. (1978). Industrial Quality Control, Prentice-Hall, Inc.
Chrysler, Ford, and General Motors (1995). Advanced Product Quality Planning Manual, AIAG.
din p
.
or ou
gly
DaimlerChrysler, Ford, and General Motors (2003). Measurement Systems Analysis Reference Manual,
cc Gr
AIAG.
Inc
d a ion
Davis, R.B., Homer, A., and Woodall, W.H. (1990). “Performance of the Zone Control Chart”,
rke Act
al
Communications in Statistics − Theory and Methods, 19, pp. 1581-1587.
on
ma ry
ati
ter ust
en e 11
rn
Deming, W. Edwards (1950). Some Theory of Sampling, Dover Publications Inc., New York.
be otiv /20
wa Ind
nte
1
aI
Deming, W. Edwards (1967). “What Happened in Japan?”, Industrial Quality Control, Vol. 24, No. 3,
3/3
gn
as m
o
o
Deming, W. Edwards (1982). Quality, Productivity and Competitive Position, Massachusetts Institute of
i
d h ut
t
to:
ted y t ira
h
ro ed E
Deming, W. Edwards (1989). Out of the Crisis, Massachusetts Institute of Technology, Center for
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
Deming, W. Edwards (1994). New Economics: for Industry, Government, Education, Massachusetts
tec
Th Doc Num men
Dixon, W.J and Massey, F.J., Jr. (1969). Introduction to Statistical Analysis, Third Edition,
gh
Or is d
Doty, L.A. (1991). Statistical Process Control, ASQ Quality Press, Milwaukee WI.
Dovich, R.A. (1991). Statistical Terrorists, Quality in Manufacturing Magazine, March-April, 1991.
Duncan, A.J. (1974). Quality Control and Industrial Statistics, 5th ed., Richard D. Irwin, Inc.
English, J.R., Lee, S., Martin, T.W., Tilmon, C. (2000). “Detecting Changes In Autoregressive Processes
with X and EWMA charts”, IIE Transactions, December.
Farnum, N.R. (1992). “Control Charts for Short Runs: Nonconstant Process and Measurement Error”,
Journal of Quality Technology, Vol. 24.
212
APPENDIX H
References and Suggested Readings
Fellers, G., (1991). SPC for Practitioners: Special Cases and Continuous Processes, ASQ Quality Press,
Milwaukee, WI.
Freund, J.E. and Williams, F.J. (1966). Dictionary/Outline of Basic Statistics, Reprint. Originally
published: McGraw-Hill, New York. Dover edition 1991.
General Motors Corporation (1991). Key Characteristics Designation System, GM-1805 QN.
Grant, E.L. and. Leavenworth, R.S. (1980). Statistical Quality Control, 7th ed., McGraw-Hill, Inc.
Gruska, G.F., Mirkhani, K., and Lamberson, L.R. (1973). Point Estimation Samples, The Third
Generation, Inc. Troy, MI.
din p
.
or ou
gly
cc Gr
Gruska, G.F. (2004). Enumerative vs. Analytic Studies, Omnex, Ann Arbor, MI.
Inc
d a ion
Gunter, B. (1989). “Use and Abuse of Cpk”, 4 parts, Quality Progress, January 1989, March 1989, May
rke Act
al
on
1989 and July 1989.
ma ry
ati
ter ust
en e 11
rn
Heaphy, M.S. and Gruska, G.F., (1982). “Markovian Analysis of Sequenced Sampling”, 36th AQC
be otiv /20
wa Ind
nte
Transactions, ASQC.
1
aI
3/3
Herman, J.T. (1989). “Capability Index-Enough for Process Industries?”, Proceedings, ASQC 43rd
gn
AQC.
an e A n:
Ma
as m
o
o
i
d h ut
t
to:
ted y t ira
Ishikawa, K. (1976). Guide to Quality Control, Asian Productivity Organization, Revised Edition.
xp
op en ite 426 sed
h
ro ed E
Jaehn, A.H. (1991). “The Zone Control Chart”, Quality Progress, Vol. 24, No. 7, pp. 65-68.
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
b
en
o
s c um S
Juran, J. and Godfrey A.B. (1999). Quality Handbook, 5th ed., McGraw-Hill, Inc.
E- der ocu
gh
Or is d
Kane, V.E. (1989). Defect Prevention- Use of Simple Statistical Tools, Marcel Dekker, Inc. and ASQC
Quality Press.
Th
Keats, J.B. and Montgomery D. C. (1991). Statistical Process Control in Manufacturing, ASQ Quality
Press, Milwaukee, WI.
Kourti, T., MacGregor, J.F. (1996). “Multivariate SPC Methods for Process and Product Monitoring”,
Journal of Quality Technology, Vol. 28, No. 4.
Lowry, C.A., Woodall, W.H., Champ, C.W., and Rigdon, S.E. (1992). “A Multivariate Exponentially
Weighted Moving Average Control Chart”, Technometrics, 34, pp. 46-53.
Lowry, C.A. and Montgomery, D.C. (1995). “A Review Of Multivariate Control Charts”, IIE
Transactions, 27, pp. 800.
213
APPENDIX H
References and Suggested Readings
Mauch, P.D. (1991). Basic SPC: A Guide For the Service Industries, ASQ Quality Press, Milwaukee,
WI.
Mason, R.I. and Young, J.C. (2001). “Implementing Multivariate Statistical Process Control Using
Hotelling’s T2 Statistic”, Quality Progress.
Montgomery, D.C. (1997). Introduction to Statistical Quality Control, 3rd ed., John Wiley, New York.
Pham, H., (2001). Recent Advances In Reliability And Quality Engineering, Series on Quality,
Reliability and Engineering Statistics - Vol. 2, World Scientific.
din p
.
or ou
gly
Reynolds, J.H. (1971). “The Run Sum Control Chart Procedure”, Journal of Quality Technology Vol 3,
cc Gr
pp. 23-27.
Inc
d a ion
Roberts, S.W. (1966). “A Comparison of Some Control Chart Procedures”, Technometrics, Vol 8, pp.
rke Act
al
on
411-430.
ma ry
ati
ter ust
en e 11
rn
Scherkenbach, W.W. (1991). Deming's Road to Continual Improvement, SPC Press, Knoxville TN.
be otiv /20
wa Ind
nte
1
aI
Shewhart, Walter A. (1931). Economic Control of Quality of Manufactured Product, Van Nostrand;
3/3
an e A n:
Ma
as m
o
o
Spiring, F.A (1991). Assessing Process Capability in the Presence of Systematic Assignable Cause,
i
d h ut
t
to:
ted y t ira
h
ro ed E
Wadsworth, H.M. (1989). Handbook of Statistical Methods for Engineers and Scientists, McGraw-Hill,
n
t p wn se
yri t is Lic 2
d i oc nt r: 4 lice
New York.
b
en
an is d ume be t is
5
Wheeler, D.J. (1991). Short run SPC, SPC Press, Knoxville, TN.
tec
Th Doc Num men
o
s c um S
Wheeler, D.J. (1995). Advanced Topics in Statistical Process Control, SPC Press, Knoxville TN.
E- der ocu
gh
Or is d
Wheeler, D.J. and Chambers, D.S. (1986). Understanding Statistical Process Control, 2nd ed., SPC
Press, Knoxville, TN.
Th
Wheeler, D.J. (1999). Beyond Capability Confusion, SPC Press, Knoxville, TN.
Wise, S.A. and Fair, D.C. (1998). Innovative Control Charting, ASQ Quality Press, Milwaukee, WI.
214
APPENDIX I
Standard Normal Tables
APPENDIX I
Standard Normal Tables
z x.x0 x.x1 x.x2 x.x3 x.x4 x.x5 x.x6 x.x7 x.x8 x.x9
0.0 0.50000000 0.50398940 0.50797830 0.51196650 0.51595340 0.51993880 0.52392220 0.52790320 0.53188140 0.53585640
0.1 0.53982780 0.54379530 0.54775840 0.55171680 0.55567000 0.55961770 0.56355950 0.56749490 0.57142370 0.57534540
0.2 0.57925970 0.58316620 0.58706440 0.59095410 0.59483490 0.59870630 0.60256810 0.60641990 0.61026120 0.61409190
din p
0.3 0.61791140 0.62171950 0.62551580 0.62930000 0.63307170 0.63683070 0.64057640 0.64430880 0.64802730 0.65173170
.
or ou
gly
0.4 0.65542170 0.65909700 0.66275730 0.66640220 0.67003140 0.67364480 0.67724190 0.68082250 0.68438630 0.68793310
cc Gr
0.5 0.69146250 0.69497430 0.69846820 0.70194400 0.70540150 0.70884030 0.71226030 0.71566120 0.71904270 0.72240470
Inc
d a ion
0.6 0.72574690 0.72906910 0.73237110 0.73565270 0.73891370 0.74215390 0.74537310 0.74857110 0.75174780 0.75490290
rke Act
al
0.7 0.75803630 0.76114790 0.76423750 0.76730490 0.77035000 0.77337260 0.77637270 0.77935010 0.78230460 0.78523610
on
ma ry
ati
0.8 0.78814460 0.79102990 0.79389190 0.79673060 0.79954580 0.80233750 0.80510550 0.80784980 0.81057030 0.81326710
ter ust
1
rn
1
0.9 0.81593990 0.81858870 0.82121360 0.82381450 0.82639120 0.82894390 0.83147240 0.83397680 0.83645690 0.83891290
be tiv 0
wa nd
nte
1/2
1.0 0.84134470 0.84375240 0.84613580 0.84849500 0.85083000 0.85314090 0.85542770 0.85769030 0.85992890 0.86214340
I
aI
en e
3
1.1 0.86433390 0.86650050 0.86864310 0.87076190 0.87285680 0.87492810 0.87697560 0.87899950 0.88099990 0.88297680
/
gn
3
o
1.2 0.88493030 0.88686060 0.88876760 0.89065140 0.89251230 0.89435020 0.89616530 0.89795770 0.89972740 0.90147470
an he A tion:
Ma
as m o
1.3 0.90319950 0.90490210 0.90658250 0.90824090 0.90987730 0.91149200 0.91308500 0.91465650 0.91620670 0.91773560
d h ut
to:
ted by t pira
1.4 0.91924330 0.92073020 0.92219620 0.92364150 0.92506630 0.92647070 0.92785500 0.92921910 0.93056340 0.93188790
x
1.5 0.93319280 0.93447830 0.93574450 0.93699160 0.93821980 0.93942920 0.94062010 0.94179240 0.94294660 0.94408260
ro ed E
n
1.6 0.94520070 0.94630110 0.94738390 0.94844930 0.94949740 0.95052850 0.95154280 0.95254030 0.95352130 0.95448600
t p own nse
yri t is Lic 2
d i oc nt r: 4 lice
1.8 0.96406970 0.96485210 0.96562050 0.96637500 0.96711590 0.96784320 0.96855720 0.96925810 0.96994600 0.97062100
tec
Th Doc Num men
1.9 0.97128340 0.97193340 0.97257110 0.97319660 0.97381020 0.97441190 0.97500210 0.97558080 0.97614820 0.97670450
s c um S
2.0 0.97724990 0.97778440 0.97830830 0.97882170 0.97932480 0.97981780 0.98030070 0.98077380 0.98123720 0.98169110
E- der ocu
gh
2.1 0.98213560 0.98257080 0.98299700 0.98341420 0.98382260 0.98422240 0.98461370 0.98499660 0.98537130 0.98573790
Or is d
2.2 0.98609660 0.98644740 0.98679060 0.98712630 0.98745450 0.98777550 0.98808940 0.98839620 0.98869620 0.98898930
Th
2.3 0.98927590 0.98955590 0.98982960 0.99009690 0.99035810 0.99061330 0.99086250 0.99110600 0.99134370 0.99157580
2.4 0.99180250 0.99202370 0.99223970 0.99245060 0.99265640 0.99285720 0.99305310 0.99324430 0.99343090 0.99361280
2.5 0.99379030 0.99396340 0.99413230 0.99429690 0.99445740 0.99461390 0.99476640 0.99491510 0.99506000 0.99520120
2.6 0.99533880 0.99547290 0.99560350 0.99573080 0.99585470 0.99597540 0.99609300 0.99620740 0.99631890 0.99642740
2.7 0.99653300 0.99663580 0.99673590 0.99683330 0.99692800 0.99702020 0.99710990 0.99719720 0.99728210 0.99736460
2.8 0.99744490 0.99752290 0.99759880 0.99767260 0.99774430 0.99781400 0.99788180 0.99794760 0.99801160 0.99807380
2.9 0.99813420 0.99819290 0.99824980 0.99830520 0.99835890 0.99841110 0.99846180 0.99851100 0.99855880 0.99860510
3.0 0.99865010 0.99869380 0.99873610 0.99877720 0.99881710 0.99885580 0.99889330 0.99892970 0.99896500 0.99899920
215
APPENDIX I
Standard Normal Tables
z x.x0 x.x1 x.x2 x.x3 x.x4 x.x5 x.x6 x.x7 x.x8 x.x9
3.1 0.99903240 0.99906460 0.99909570 0.99912600 0.99915530 0.99918360 0.99921120 0.99923780 0.99926360 0.99928860
3.2 0.99931290 0.99933630 0.99935900 0.99938100 0.99940240 0.99942300 0.99944290 0.99946230 0.99948100 0.99949910
3.3 0.99951660 0.99953350 0.99954990 0.99956580 0.99958110 0.99959590 0.99961030 0.99962420 0.99963760 0.99965050
3.4 0.99966310 0.99967520 0.99968690 0.99969820 0.99970910 0.99971970 0.99972990 0.99973980 0.99974930 0.99975850
3.5 0.99976740 0.99977590 0.99978420 0.99979220 0.99979990 0.99980740 0.99981460 0.99982150 0.99982820 0.99983470
3.6 0.99984090 0.99984690 0.99985270 0.99985830 0.99986370 0.99986890 0.99987390 0.99987870 0.99988340 0.99988790
3.7 0.99989220 0.99989640 0.99990040 0.99990430 0.99990800 0.99991160 0.99991500 0.99991840 0.99992160 0.99992470
din p
3.8 0.99992770 0.99993050 0.99993330 0.99993590 0.99993850 0.99994090 0.99994330 0.99994560 0.99994780 0.99994990
.
or ou
gly
3.9 0.99995190 0.99995390 0.99995570 0.99995750 0.99995930 0.99996090 0.99996250 0.99996410 0.99996550 0.99996700
cc Gr
4.0 0.99996830 0.99996960 0.99997090 0.99997210 0.99997330 0.99997440 0.99997550 0.99997650 0.99997750 0.99997840
Inc
d a ion
4.1 0.99997930 0.99998020 0.99998110 0.99998190 0.99998260 0.99998340 0.99998410 0.99998480 0.99998540 0.99998610
rke Act
al
on
4.2 0.99998670 0.99998720 0.99998780 0.99998830 0.99998880 0.99998930 0.99998980 0.99999020 0.99999070 0.99999110
ma ry
ati
4.3 0.99999150 0.99999180 0.99999220 0.99999250 0.99999290 0.99999320 0.99999350 0.99999380 0.99999410 0.99999430
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4.4 0.99999460 0.99999480 0.99999510 0.99999530 0.99999550 0.99999570 0.99999590 0.99999610 0.99999630 0.99999640
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4.5 0.9999966023 0.9999967586 0.9999969080 0.9999970508 0.9999971873 0.9999973177 0.9999974423 0.9999975614 0.9999976751 0.9999977838
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4.6 0.9999978875 0.9999979867 0.9999980813 0.9999981717 0.9999982580 0.9999983403 0.9999984190 0.9999984940 0.9999985656 0.9999986340
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4.7 0.9999986992 0.9999987614 0.9999988208 0.9999988774 0.9999989314 0.9999989829 0.9999990320 0.9999990789 0.9999991235 0.9999991661
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4.8 0.9999992067 0.9999992453 0.9999992822 0.9999993173 0.9999993508 0.9999993827 0.9999994131 0.9999994420 0.9999994696 0.9999994958
x
4.9 0.9999995208 0.9999995446 0.9999995673 0.9999995889 0.9999996094 0.9999996289 0.9999996475 0.9999996652 0.9999996821 0.9999996981
ro ed E
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5.0 0.9999997133 0.9999997278 0.9999997416 0.9999997548 0.9999997672 0.9999997791 0.9999997904 0.9999998011 0.9999998113 0.9999998210
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5.2 0.9999999004 0.9999999056 0.9999999105 0.9999999152 0.9999999197 0.9999999240 0.9999999280 0.9999999318 0.9999999354 0.9999999388
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5.3 0.9999999421 0.9999999452 0.9999999481 0.9999999509 0.9999999535 0.9999999560 0.9999999584 0.9999999606 0.9999999628 0.9999999648
s c um S
5.4 0.9999999667 0.9999999685 0.9999999702 0.9999999718 0.9999999734 0.9999999748 0.9999999762 0.9999999775 0.9999999787 0.9999999799
E- der ocu
gh
5.5 0.9999999810 0.9999999821 0.9999999831 0.9999999840 0.9999999849 0.9999999857 0.9999999865 0.9999999873 0.9999999880 0.9999999886
Or is d
5.6 0.9999999893 0.9999999899 0.9999999905 0.9999999910 0.9999999915 0.9999999920 0.9999999924 0.9999999929 0.9999999933 0.9999999936
Th
5.7 0.9999999940 0.9999999944 0.9999999947 0.9999999950 0.9999999953 0.9999999955 0.9999999958 0.9999999960 0.9999999963 0.9999999965
5.8 0.9999999967 0.9999999969 0.9999999971 0.9999999972 0.9999999974 0.9999999975 0.9999999977 0.9999999978 0.9999999979 0.9999999981
5.9 0.9999999982 0.9999999983 0.9999999984 0.9999999985 0.9999999986 0.9999999987 0.9999999987 0.9999999988 0.9999999989 0.9999999990
6.0 0.9999999990
The tabled values are 1 - PZ = the proportion of process output beyond a particular value
of interest (such as a specification limit) that is z standard deviation units away from the
process average (for a process that is in statistical control and is normally distributed). For
example, if z = -2.17, PZ = 1 - 0.98499660 = 0.0150 or 1.5%. In any actual situation, this
proportion is only approximate.
216
Index
INDEX
American National Standards Committee Z-1, Median and Range Chart, 84, 85
211 MEWMA, 113, 116, 195
ASQ, 211, 213, 214 np chart, 183, 192, 206
ASQ Statistics Division, 211 p chart, 70, 183
ASTM, 181, 182, 211 Regression Chart, 118
Autocorrelation, 159, 160, 191 Residuals Chart, 118, 120
Average (See also Mean), 43, 60, 62, 63, 71, 76, Short Run Chart, 176
78, 79, 82, 83, 85, 87, 89, 93, 95, 97, 109, Stoplight Control Chart, 202
111, 116, 119, 191, 194, 195, 198, 213 u chart, 108, 183, 207
Average and Range Chart, 63, 78, 79 Zone Chart, 121
Average and Standard Deviation Chart, 82, 83 Control Limit, 30, 55, 56, 59, 61, 62, 64, 65, 69,
din p
Average Run Length, 76, 111, 191 70, 80, 83, 85, 87, 90, 93, 95, 97, 181, 182,
.
or ou
gly
Bhote, K.R, 104, 211 183, 193
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Binomial Distribution, 192 Control Statistic, 58, 59, 193
Inc
d a ion
Bissell, B.A.F., 139, 211 Convenience Sampling, 193, 199
rke Act
Bothe, D., 145, 174, 179, 211 Correlation, 53, 193
al
on
Box, G.E.P., 115, 120, 141, 211 Correlation Matrix, 193
ma ry
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Boyles, R.A., 139, 179, 211 Cox, D.R., 115, 141, 211
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Brase, 211 Cui, H., 114, 212
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Burr, I.W., 114, 211 CUSUM, 109, 110, 111, 112, 122, 194, 195
c chart, 183, 204 Davis, R.B., 123, 212
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Capability, 19, 20, 128, 185, 211, 213, 214 Deming, W. Edwards, 17, 19, 29, 57, 171, 174,
gn
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Centerline, 32, 48, 59, 80, 83, 85, 87, 90, 93, 95, Detection, 7, 194, 197
o
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Common Cause (See also Special Cause), 13 EWMA, 109, 111, 112, 174, 194, 195, 212
s c um S
Control, 7, 9, 19, 20, 25-34, 37, 38, 41, 43, 45, Fellers, G., 213
47-74, 79, 80, 83, 85, 87, 89, 90, 93, 95, 97, Freund, J.E., 211, 213
Th
99-108, 113, 117, 118, 121, 128, 157, 176, Godfrey A.B., 63, 109, 192, 201, 213
177, 181-183, 188, 191-202, 211-214 Gordon, L. W., 63, 212
Control Chart, 28, 29, 32, 37, 41, 45-55, 58, 59, Grant, E.L., 57, 63, 109, 176, 213
71, 72, 74, 79, 89, 99, 100, 107, 108, 113, Gruska, G.F., 57, 102, 213
117, 121, 176, 177, 181-183, 191-196, 199, Gunter, B., 147, 213
200, 202, 211- 214 Haphazard Sampling, 194, 199, 200
Average and Range Chart, 63, 78, 79 Heaphy, M.S., 102, 213
Average and Standard Deviation Chart, 82, 83 Herman, J.T., 147, 213
c chart, 183, 204 Homer, A., 212
CUSUM, 109, 110, 111, 112, 122, 194, 195 Index (See Process Capabiltiy), 185, 211, 213
EWMA, 109, 111, 112, 174, 194, 195, 212 Individual, 86, 87, 89, 93, 95, 97, 110, 194
Individuals and Moving Range Chart, 87, 89, Individuals and Moving Range Chart, 87, 89,
174 174
MCUSUM, 113, 116, 195 Inherent Variation, 195, 203
217
Index
Ishikawa, K, 61, 62, 63, 192, 213 135, 136, 147, 152, 153, 154, 162, 194, 198,
Jaehn, A.H., 213 201-203, 211- 214
Jenkins, G.M., 119, 120, 211 Process Average, 198
Johnson, N.L., 115, 141, 142, 213 Process Capability, 18, 19, 125, 131, 198, 211,
Juran, J., 17, 63, 109, 192, 201, 213 212, 214
Kane, V. E., 213 Variables Data Case, 198
Keats, J. B., 213 Process Control (See Statistical Process
Kourti, T., 117, 213 Control), 1, 4, 8, 9, 18, 19, 25, 29, 152, 198,
Lamberson, L.R., 213 201, 212, 213, 214
Leavenworth, RS, 57, 63, 109, 176, 213 Process Performance, 125, 131, 198
Lee, S., 212 Process Spread, 194, 198, 201
Location, 13, 194, 195 Quadratic, 199
Loss Function, 104, 148, 150, 151, 179, 195 Randomness, 199
Lowry, C.A., 113, 213 Range, 31, 43, 60, 62, 72, 79, 85, 87, 158, 160,
din p
.
MacGregor, J.F., 117, 213 164, 195, 199
or ou
gly
Martin, T.W., v, 212 Rational Subgroup, 199
cc Gr
Mason, R.I., 117, 214 Regression Chart, 118
Inc
d a ion
Massey, F.J Jr., 182, 212 Reinsel, G.C., 120, 211
rke Act
al
Mauch, P. D., 214 Residuals Chart, 118, 120
on
MCUSUM, 113, 116, 195 Reynolds, J.H, 121, 214
ma ry
ati
Mean (See also Average), 191, 195 Rigdon, S.E, 212, 213
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Median and Range Chart, 84, 85 Run, 76, 107, 111, 191, 200, 212, 214
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MEWMA, 113, 116, 195 Sample, 51, 52, 58, 85, 163, 168, 188, 200
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Montgomery, D.C., 47, 57, 109, 110, 111, 113, Haphazard Sampling, 194, 199, 200
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117, 118, 121, 192, 201, 213, 214 Probability Sampling, 198
Moving Range, 43, 86, 87, 89, 107, 110, 160, Random Sampling, 198, 199
xp
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Nonconformity, 196 Shewhart, Walter A., 19, 29, 30, 31, 76, 109,
5
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Non-Normal Chart, 113 111, 113, 114, 115, 122, 123, 196, 200, 203,
Th Doc Num men
p chart, 70, 183 13, 60, 62, 75, 171, 200, 203
Pareto Chart, 197 Specification, 67, 188, 200, 202
Performance, 9, 128, 212 Bilateral, 132
Pham, H, 114, 214 Unilateral, 137
Point Estimate, 197 Spiring, F.A., 127, 179, 212, 214
Poisson Distribution, 197 Spread (See also Variation), 13, 127, 198, 201
Prediction Interval, 197 Stability, 201
Prevention, 7, 194, 197, 213 Stable Process, 201
Probability based charts, 101, 198 Standard Deviation, 79, 83, 85, 87, 160, 201
Probability Sampling, 198 Statistic, 58, 59, 193, 201, 214
Problem Solving, 198 Statistical Control, 20, 55, 60, 193, 201
Process, 1, 4, 8, 9, 18, 19, 21, 24, 25, 26, 29, 31, Statistical Inference, 201
33, 34, 53, 67, 103, 107, 125, 127, 131, 132, Statistical Process Control, i, 4, 198, 201, 212,
213, 214
218
Index
Statistical Tolerance Limits, 201, 202 Variation, 12, 13, 67, 83, 130, 131, 190, 192,
Stoplight Control Chart, 202 193, 195, 202, 203
Subgroup, 48, 55, 57, 58, 79, 83, 85, 130, 181, Inherent Variation, 195, 203
182, 188, 195, 199, 200, 202 Inherent Variation:, 203
Tilmon, C., 212 Total Process Variation:, 203
Tolerance (See Specification), 104, 201, 202 Wadsworth, H.M.,, 214
Total Process Variation, 131, 202, 203 Wheeler, D.J., 47, 63, 89, 107, 111, 117, 121,
Type I Error, 202 134, 145, 161, 174, 214
Type II Error, 202 Williams, F.J., 211, 213
u chart, 108, 183, 207 Wise, S.A., 47, 109, 214
Unimodal, 202 Woodall, W.H, 212, 213
Variables Data (See also Attribute Data), 44, Young, J.C., 117, 214
125, 191, 198, 202 Zone Analysis, 203
Zone Chart, 121
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