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TESCAN VEGA For MS - Product Flyer

The document describes the TESCAN VEGA analytical scanning electron microscope for materials science applications. It provides key benefits such as easily acquiring compositional data correlated to SEM images, setting beam parameters quickly, navigating precisely at low magnifications, moving samples confidently to avoid collisions, and customizing the GUI to match application needs.
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0% found this document useful (0 votes)
62 views

TESCAN VEGA For MS - Product Flyer

The document describes the TESCAN VEGA analytical scanning electron microscope for materials science applications. It provides key benefits such as easily acquiring compositional data correlated to SEM images, setting beam parameters quickly, navigating precisely at low magnifications, moving samples confidently to avoid collisions, and customizing the GUI to match application needs.
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
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Product Flyer TESCAN VEGA for Materials Science

TESCAN VEGA
F O R M AT E R I A L S S C I E N C E

Analytical SEM for routine


materials characterization,
research and quality control
applications at the micron scale

50 µm 10 mm 10 µm

c Distribution of Si (green) and Ti (red) c Ceramic foam captured c Grains in the metal foam
in ancient plaster identified with Wide-Field Mode™ captured with the BSE detector
by Essence™ EDS in the live
scanning window of the VEGA SEM

Key benefits:
Ĭ Easily acquire compositional data and directly Ĭ Explore beam sensitive and charging samples quickly
correlate it to the SEM image with the overlay feature and easily with VEGA´s standard SingleVac function
of TESCAN’s optional, fully integrated Essence™ EDS
Ĭ Save cost and reduce your ecological footprint
Ĭ Set-up beam parameters quickly for optimal using TESCAN’S optional vacuum buffer that
imaging and analytical conditions using significantly reduces vacuum rotary pump run-time
TESCAN´s In-Flight Beam Tracing™
Ĭ Expand your analytical potential by configuring
Ĭ Navigate effortlessly and precisely VEGA with your choice from a wide selection of
– at magnifications as low as 2× – with TESCAN´s optional, fully integrated detectors, such as CL,
unique Wide Field Optics™ mode, which eliminates water-cooled BSE or RAMAN spectrometer
the need for an additional optical camera
Ĭ Free yourself from thinking about sample size
Ĭ Move samples confidently and avoid collisions and number with VEGA‘s GM chamber which
using TESCAN’s unique live 3D collision model features 130 × 130 mm stage movement
which replicates the size and geometry of samples and enough space to accommodate samples
and detectors within the chamber interior with size of 300 × 300 × 100 mm3
Ĭ Customize the GUI to match a user‘s experience Ĭ Expand your future analytical potential by having high
level and application for intuitive operation number of empty chamber ports at your disposal
of TESCAN´s Essence™ microscope control software

TESCAN ORSAY HOLDING reserves the right to change the document without notice. 2020.11.02 www.tescan.com

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