ECT 201 SSD Module 1 Final
ECT 201 SSD Module 1 Final
Joseph George K N
Syllabus
MODULE I
Elemental and compound semiconductors, Intrinsic and Extrinsic semiconductors,
concept of effective mass, Fermions-Fermi Dirac distribution, Fermi level, Doping
& Energy band diagram, Equilibrium and steady state conditions, Density of states
& Effective density of states, Equilibrium concentration of electrons and holes.
Excess carriers in semiconductors: Generation and recombination mechanisms of
excess carriers, quasi Fermi levels
MODULE II
Carrier transport in semiconductors, drift, conductivity and mobility, variation of
mobility with temperature and doping, Hall Effect. Diffusion, Einstein relations,
Poisson equations, Continuity equations, Current flow equations, Diffusion length,
Gradient of quasi Fermi level
MODULE III
PN junctions : Contact potential, Electrical Field, Potential and Charge distribution
at the junction, Biasing and Energy band diagrams, Ideal diode equation. Metal
Semiconductor contacts, Electron affinity and work function, Ohmic and Rectifying
Contacts, current voltage characteristics. Bipolar junction transistor, current
components, Transistor action, Base width modulation.
MODULE IV
Ideal MOS capacitor, band diagrams at equilibrium, accumulation, depletion and
inversion, threshold voltage, body effect, MOSFET-structure, types, Drain current
equation (derive)- linear and saturation region, Drain characteristics, transfer
characteristics.
MODULE V
MOSFET scaling – need for scaling, constant voltage scaling and constant field
scaling. Sub threshold conduction in MOS. Short channel effects- Channel length
modulation, Drain Induced Barrier Lowering, Velocity Saturation, Threshold
Voltage Variations and Hot Carrier Effects. Non-Planar MOSFETs: Fin FET –
Structure, operation and advantages
Text-Books:
1. Ben G. Streetman and Sanjay Kumar Banerjee, Solid State Electronic Devices,
Pearson 6/e, 2010 (Modules I, II and III)
o To develop the basic tools which can be used later to learn about newly
developed devices and applications.
Module 1
Semiconductor Devices
Classification
Small signal Large Signal
Low frequency High frequency
Discrete Integrated
Semiconductor Materials
Semiconductor materials
A special class of elements having a conductivity between that of a
good conductor and that of an insulator.
Two types –
The concept was introduced in the year 1925 with the help of the Schrodinger
equation.
……..( 1)
……..( 2)
Note:
Since the periodicity of most lattices is different in various directions, the (E, k) diagram
must be plotted for the various crystal directions, and the full relationship between E and
k is a complex surface which should be visualized in three dimensions.
Based on the E–k, diagram, there are two classes of semiconductor energy
bands: direct and indirect.
Direct Bandgap Semiconductor
Materials
Indirect Bandgap Semiconductors
Indirect band has its valence band maximum at a different value of k than its conduction
band minimum.
A transition from the minimum point in the conduction band to the
maximum point of the valence band requires some change in k.
Materials
Charge Carriers in Semiconductors -Electrons and Holes
For electrons to experience acceleration in an applied electric field, they
must be able to move into new energy states. But the silicon band structure
is such that the valence band is completely filled with electrons at 0 K and
the conduction band is empty.
Thus,
silicon at 0 K has a high resistivity typical of insulators
At 0 K
T1 T2 T3
Fig: Electrons from the lower (valence) band are excited to the upper
(conduction) band by giving reasonable amounts of thermal or optical energy.
(with T1 <T2 <T3)
After excitation to the conduction band,
• an electron is surrounded by a large
number of unoccupied energy states.
e.g.,
Equilibrium number of EHPs at room temperature is only about 1010 EHP/cm3,
compared to the Si atom density of 5 x 1022 atoms/cm3.
Thus the few electrons in the conduction band are free to move about via the many
available empty states.
Intrinsic Semiconductor
A perfect semiconductor crystal with no
impurities or lattice defects is called an intrinsic
semiconductor.
There are no charge carriers at 0 K.
The energy required to break the bond is the band gap energy Eg
When impurities or lattice defects are introduced, additional levels are created in
the energy band structure, usually within the band gap.
n – type
Si Ge
Column V (P, As, Sb) 0.03 eV below the 0.01 eV below the conduction
donor levels lie conduction band band
Column III (Al, Ga, 0.06 eV above the valence 0.01 eV above the valence
In) acceptor levels lie band. band.
For example,
f(E) Gives
• the probability that an available energy state at E will be occupied by an
electron at absolute temperature T.
where,
……..( 5) k (Boltzmann’s constant) = 1.38 x 10 - 23 J/K,
EF - the Fermi level
EF -the highest energy level that an
electron can occupy at T = 0K
For an energy E = EF ,the occupation probability is,
with T = 0K
, for i.e., every single energy level
below EF will be occupied,
and, , for and every energy level
above EF will be vacant.
For T > 0, some probability exists for states above the Fermi level to be filled.
At T = T1, there is some probability f(E) that states above EF are filled, and
a corresponding probability [1-f(E)] that states below EF are empty.
Note:
The distribution function has values within the band gap between Ev and Ec,
but there are no energy states available, and no electron occupancy results
from f(E) in this range.
For n type semiconductors,
The value of f(E) for each energy level in the conduction band (and
therefore the total electron concentration n0) increases as EF moves
closer to Ec.
The energy difference (Ec - EF ) gives a measure of n.
For p type semiconductors,
The value of [1 - f(E)] for each energy level in the valance band (and
therefore the total hole concentration p0) increases as EF moves closer to Ev.
……..( 6)
Thus, f(E)N(E) (number of electrons) decreases rapidly above Ec and a very few
electrons occupy energy states far above Ec.
Note:
Similarly, [1 - f(E)] decreases rapidly below Ev, and most holes occupy states
near the top of the valence band.
The conduction band electron concentration is
The subscript 0 indicates
……..( 7) equilibrium condition.
……..( 8)
……..( 12)
i.e.,
……..( 16)
Also,
……..( 17)
The intrinsic electron and hole concentrations are equal.
i.e., ……..( 18)
For Si,
……..( 19)
……..( 20a)
….( 20)
Also,
o ni is temperature dependent as indicated by Eq (18).
o Nc and Nv also vary with temperature as indicated by Eqs. (10), (14)
o EF can vary with temperature.
..( 18)
By combining Eqs. (18), (10), and (14),
..( 10)
..( 14)
…..( 21)
The temperature dependence of electron concentration in doped Si
n0 Nd = 1015 cm - 3
Fig: Carrier concentration vs. 1000/T for Si
doped with 1015 cm - 3.
When every available extrinsic
electron has been transferred to
the conduction band, n0 is
virtually constant until the ni
becomes comparable to the Nd.
Note:
It is desirable to control the carrier
concentration by doping rather than by
thermal EHP generation.
Recap…
Semiconductor at
Intrinsic Thermal equilibrium
At 0K, Conduction band is completely
empty and valance band is completely
filled.
At 50K, conduction band is partially
filled. At steady state, electrons make
continuous up (generation) and down
(recombination) movements.
and
n – type
Introduces Ed very near to Ec, which is filled
with electrons at 0 K, donates electrons at 50K
p – type
Introduces Ea very near to Ev, which is empty
at 0 K, filled at 50K
The Fermi Dirac Distribution Function f(E)
- the probability of finding an electron in the energy
• gives an idea about the number of electrons
available for conduction
Fermi level (EF ) -the highest energy level that an electron can occupy at T = 0K
If the net doping is much greater than ni, the majority carrier
concentration is equal to net doping.
Excess Carriers in Semiconductors
Excess Carriers in Semiconductors
Carriers generated in excess of thermal equilibrium values
Semiconductor devices operate by the creation of excess carriers
Optical excitation
Electron bombardment
Electron injection (across a forward-biased p-n junction)
Note:
the band gap is about 2 eV wide, only long wavelengths (infrared)
and the red part of the visible spectrum are transmitted;
If
If λ is in micrometers and E in
electron volts,
…..( 23)
μm
The rate of decay of excess carriers at any time t is proportional to the product
of number of electrons and holes remaining at time t.
where,
…………………
n(t) – total electron concentration
p(t) – total hole concentration
………………… no – equilibrium electron concentration
po – equilibrium electron concentration
δn(t) – excess electron concentration
δp(t) – excess hole concentration
…..( 24)
Assumptions….more
• Neglect if the excess carrier concentrations are
small.
• if the material is p type.
…..( 25)
…..( 26)
The solution is
- recombination lifetime
(minority carrier lifetime).
Note: The recombination can be slow or fast, depending on the average time
the first carrier is held before the second carrier is captured. In general,
trapping levels located deep in the band gap are slower in releasing trapped
carriers
excess
Steady state Carrier generation and Quasi Fermi Level
Under thermal equilibrium, thermal generation of EHPs at a rate is
balanced by the recombination rate so that the equilibrium
concentrations of carriers n0 and p0 are maintained and .
i.e.,
…..( 27)
If, an optical generation rate gop is added to the thermal generation, the
carrier concentrations n and p will increase to new steady state values.
……………………
……………………
…..( 28)
…..( 29)
…..( 30)
and therefore,
When excess carriers are present, it is convenient to write the steady state
electron and hole concentrations in terms of separate Fermi levels –
Quasi Fermi level
The resulting carrier concentration
equations are
…..( 31)
(a) Thus the minority carrier concentration changes from 2.25 x 106 cm-3
to 2 x 1013 cm-3.
= 2 x 1013 cm-3
= 1014 + 2 x 1013
= 1.2 x 1014 cm-3
ni =1.5 x 1010 cm-3
Also,
By similar calculation,
Ei - Fp = 0.186 eV
EF - Ei = 0.228 eV
Observations
= 1017 + 1015
= 1.01 x 1017 cm-3
ni = 2.5 x 1013 cm-3
Also,
By similar calculation,
Ei - Fp = xxxx eV
EF - Ei = xxxx eV