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Deutsche Akkreditierungsstelle GMBH: Gigahertz Optik GMBH An Der Kälberweide 12, 82299 Türkenfeld

Gigahertz Optik GmbH is accredited to perform calibrations of optical quantities such as the spectral responsivity of photo diodes and spectral irradiance of lamps and deuterium lamps. The ranges and measurement uncertainties provided in the annex reflect the laboratory's calibration and measurement capabilities. The laboratory maintains a list of all testing procedures within its flexible scope of accreditation and operates in accordance with the management system standard DIN EN ISO/IEC 17025.

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0% found this document useful (0 votes)
40 views

Deutsche Akkreditierungsstelle GMBH: Gigahertz Optik GMBH An Der Kälberweide 12, 82299 Türkenfeld

Gigahertz Optik GmbH is accredited to perform calibrations of optical quantities such as the spectral responsivity of photo diodes and spectral irradiance of lamps and deuterium lamps. The ranges and measurement uncertainties provided in the annex reflect the laboratory's calibration and measurement capabilities. The laboratory maintains a list of all testing procedures within its flexible scope of accreditation and operates in accordance with the management system standard DIN EN ISO/IEC 17025.

Uploaded by

Mauro
Copyright
© © All Rights Reserved
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Deutsche Akkreditierungsstelle GmbH

Annex to the Accreditation Certificate D-K-15047-01-00


according to DIN EN ISO/IEC 17025:2018

Valid from: 08.06.2022


Date of issue: 07.07.2022

Holder of certificate:
Gigahertz Optik GmbH
An der Kälberweide 12, 82299 Türkenfeld

Calibration in the fields:


Electrical quantities
DC and low frequency quantities
− DC current
High Frequency and Radiation Quantities
Optical Quantities
− Radiometry

Within the scope of accreditation marked with *), the testing laboratory is permitted, without being
required to inform and obtain prior approval from DAkkS, to use standards or equivalent testing
methods listed here with different issue dates.
The testing laboratory maintains a current list of all testing procedures within the flexible scope of
accreditation.

The management system requirements of DIN EN ISO/IEC 17025 are written in the language relevant to the operations of
calibration laboratories. Laboratories that conform to the requirements of this standard. operate generally in accordance with
the principles of DIN EN ISO 9001.

The certificate together with the annex reflects the status as indicated by the date of issue.
The current status of any given scope of accreditation can be found in the directory of accredited bodies maintained by
Deutsche Akkreditierungsstelle GmbH at https://www.dakks.de/en/accredited-bodies-search.html.

Abbreviations used: see last page Page 1 of 5

This document is a translation. The definitive version is the original German annex to the accreditation certificate.
Annex to the accreditation certificate D-K-15047-01-00

Permanent Laboratory
Calibration and Measurement Capabilities (CMC)
Measurement quantity / Range Measurement Expanded Remarks
Calibration item conditions / measurement of
procedure uncertainty
Optical quantities
Spectral responsivity KA0041-spektrale
photo diodes Empfindlichkeit von
Photodioden-v007
wave length in nm
terminal voltage at
photo diode ≤ 50 µV
250 to 300 3.0 % 1 nW ≤ Φ ≤ 10 µW
18 °C ≤ t ≤ 28 °C
1 nm ≤ ∆λ ≤ 11 nm
> 300 to 320 2.9 % 100 nW ≤ Φ ≤ 100 µW
18 °C ≤ t ≤ 28 °C
> 320 to 340 2.6 %
1 nm ≤ ∆λ ≤ 11 nm
1 µA/W to 1 A/W > 340 to 360 2.3 % Φ = radiative power on
> 360 to 400 2.0 % active area
> 400 to 880 1.7 % t = ambient temp-
erature of calibration
> 880 to 920 2.0 % item
> 920 to 960 2.4 % ∆λ = full width at half
> 960 to 1040 3.0 % maxmimum

> 1040 to 1160 4.0 %


Spectral irradiance KA0042-spektrale
lamps Bestrahlungsstärke von
Glühlampen-v005
wave length in nm
250 to 275 3.5 %
> 275 to 300 3.2 %
> 300 to 345 2.5 %
> 345 to 370 2.4 %
> 370 to 390 2.1 %
> 390 to 490 2.0 %
10 0.30
to > 490 to 1000 1.9 %
µW/(m2·nm) W/(m2·nm)
> 1000 to 1150 2.3 %
> 1150 to 1250 2.5 %
> 1250 to 1400 2.7 %
> 1400 to 1450 2.8 %
> 1450 to 1550 3.6 %
> 1550 to 1650 3.7 %

Date of issue: 07.07.2022


Valid from: 08.06.2022 Page 2 of 5
- Translation -
Annex to the accreditation certificate D-K-15047-01-00

Permanent Laboratory
Calibration and Measurement Capabilities (CMC)
Measurement quantity / Range Measurement Expanded Remarks
Calibration item conditions / measurement of
procedure uncertainty
Spectral irradiance > 1650 to 1700 3.8 %
lamps > 1700 to 1750 3.9 %
> 1750 to 1800 4.6 %
> 1800 to 1900 4.7 %
> 1900 to 1950 4.8 %
> 1950 to 2000 5.2 %
> 2000 to 2050 5.5 %
10 0.30 > 2050 to 2100 5.7 %
to
µW/(m2·nm) W/(m2·nm) > 2100 to 2150 6.1 %
> 2150 to 2200 6.3 %
> 2200 to 2250 6.5 %
> 2250 to 2300 7.0 %
> 2300 to 2350 7.3 %
> 2350 to 2400 7.7 %
> 2400 to 2450 8.0 %
> 2450 to 2500 8.5 %
Spectral irradiance KA0061-spektrale In-house calibration
deuterium lamps Bestrahlungsstärke von method
Deuteriumlampen-v002
wave length in nm
200 to 205 7.6 %
210 to 220 6.6 %
225 to 230 5.8 %
235 to 245 4.8 %
250 to 285 4.1 %
1 1·105 290 to 310 4.9 %
to
µW/(m²·nm) W/(m²·nm) 315 to 340 5.7 %
345 to 355 6.6 %
360 to 365 7.5 %
370 to 370 8.4 %
375 to 385 9.5 %
385 to 390 10.4 %
395 to 400 11.4 %

Date of issue: 07.07.2022


Valid from: 08.06.2022 Page 3 of 5
- Translation -
Annex to the accreditation certificate D-K-15047-01-00

Permanent Laboratory
Calibration and Measurement Capabilities (CMC)
Measurement quantity / Range Measurement Expanded Remarks
Calibration item conditions / measurement of
procedure uncertainty
Irradiance/ broadband 200 nm to 349 nm ASTM G130-12:2020 In-house calibration
radiometer * method :
KA0057-integrale
1 µW/m² to 1·105 W/m² wave length in nm
Bestrahlungsstärke-
200 to 279 4.6 % Empfindlichkeit
350 nm to 799 nm 280 to 315 2.9 % ASTM G130-12
0.22 µW/m² to 1·105 W/m² 316 to 550 2.8 %
551 to 1020 2.5 %
800 nm to 1050 nm 1021 to 1050 3.0 %
1 µW/m² to 1·105 W/m²
Irradiance/ broadband CIE 220:2016 In-house calibration
radiometer * method :
by means of a reference KA0058-integrale
detector Bestrahlungsstärke-
Empfindlichkeit
CIE220-2016
wave length in nm
200 nm to 1050 nm 200 to 279 4.9 %
1 fA/(W/m²) to 1 A/(W/m²) 280 to 315 3.2 %
316 to 550 3.1 %
551 to 1020 2.9 %
1021 to 1050 3.4 %

DC and low frequency


DC current 1 pA to < 2 pA KA0060- 9.3 % In-house calibration
Measuring device 2 pA to < 20 pA Stromkalibrierung von 1.5 % method
Anzeigegeräte-v002 (based on VDI 2622)
20 pA to < 200 pA 0.32 %
200 pA to < 2 nA 0.20 %
2 nA to < 20 nA 0.18 %
20 nA to < 200 nA 0.13 %
200 nA to < 2 µA 0.12 %
2 µA to < 20 µA 0.12 %
20 µA to < 200 µA 0.12 %
200 µA to < 2 mA 0.12 %
2 mA to < 20 mA 0.36 %

Date of issue: 07.07.2022


Valid from: 08.06.2022 Page 4 of 5
- Translation -
Annex to the accreditation certificate D-K-15047-01-00

Abbreviations used:

ASTM ASTM American Standard for Testing and Materials


CIE International Commission on Illumination
CMC Calibration and measurement capabilities
DIN German Institute for Standardization e.V.
KA In-house Calibration method of the Gigahertz Optik GmbH
VDE Association for Electrical Engineering, Electronics and Information Technology e.V.
VDI Association of German Engineers

Date of issue: 07.07.2022


Valid from: 08.06.2022 Page 5 of 5
- Translation -

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