Education Institute for

Equipment & Process Design

Safety Integrated Level ( SIL ) Verification

 Education Institute for

Equipment & Process Design

General Definition
What is risk?

A Risk is the amount of harm that can be expected to occur during a given time period
due to specific harm event.
 Education Institute for

Equipment & Process Design

Safety related system consists of:

• Mechanical protection system
• Passive protection system
• Basic process control system
• Alarms
• Safety instrumented system (SIS)

What is SIS?
A relative level of risk-reduction provided by a safety function, or to specify a target level
of risk reduction. In simple terms, SIL is a measurement of performance required for a
Safety Instrumented Function (SIF).

Notes
1. The function of SIS is called SIF. More than one SIF could be allocated to a SIS.
2. A SIS consists of a sensor, logic solver and final element.

3. The ability of a SIS is to carry out the actions necessary to achieve a safe state in
process.
 Education Institute for

Equipment & Process Design

4. Standards: IEC-60508 for general industry and IEC-60511 for oil and gas industry.

IEC-61508:
Functional Safety of Electrical/Electronic/Programmable Electronic Safety Related
Systems

IEC-61511:
Functional safety –safety instrumented systems for the process industry sector

ANSI ISA-84.00.01:
Application of Safety Instrumented Systems for the Process Industries
 Education Institute for

Equipment & Process Design

 Education Institute for

Equipment & Process Design

Stages of SIL Study

1.Target SIL Evaluation
What SIL should be allocated for the SIF?

2.SIL Verification
Does SIS fulfill Target SIL requirements?
 Education Institute for

Equipment & Process Design

SIL Verification Procedure

In order to verify the selected SIL in a loop, 3 components should be taken into account.
A. SIL capability stated in the certificate
B. Calculate PFD for each and then sum them and find the corresponding SIL
C. Check architectural constrains by checking first rout.
 Education Institute for

Equipment & Process Design

1.SIL capability stated in the certificate

---------------------------------------------------------------------------------------------------------------------
 Education Institute for

Equipment & Process Design

2.Calculate PFD for each and then sum them and find the corresponding SIL
Primary Definitions:
---------------------------------------------------------------------------------------------------------------------
Failure Frequency:
The probability that a system fails during a specified period of time.

Mean Time To Fail (MTTF)

Probability of Failure upon Demand (PFD) : equals to λ times TI divided by 2 if λ.TI<<1.

It is assumed that after each time interval the equipment is as new as first day. Time
interval is really important when regarding sil target.

Test intervals (TI) (directly affects PFD)

 Education Institute for

Equipment & Process Design

3.Check architectural constrains by checking first rout.

Primary Definition
---------------------------------------------------------------------------------------------------------------------
HFT (Hardware Fault Tolerance): maximum number of failures that can be tolerated in a
SIS component
HFT for the following system:

SYSTEM HTF

1001 0

1002 1

1003 2

2002 0

2003 1

2004 2

------------------------------------------------------------------------------------------------------------------------------------------

SFF (Safe Failure Fraction): fraction of safe failures.

SIF Failure Modes

Based on consequence

• Safe
• Dangerous
 Education Institute for

Equipment & Process Design

Based on diagnostic

• Detected (overt)
• Undetected (covert, hidden)

Safe/Detected: λSD
Safe/Undetected: λSU
Dangerous/Detected: λDD
Dangerous/Undetected: λDU

SFF = (Ysd + Ysu + Ydd)/ (Ysd + Ysu + Ydd+ Ydu)

---------------------------------------------------------------------------------------------------------------------

Subsystem type A: A subsystem can be regarded as type A if, for the components
required to achieve the safety function
the failure modes of all constituent components are well defined; and
the behavior of the subsystem under fault conditions can be completely determined; and
there is sufficient dependable failure data from field experience to show that the claimed
rates of failure for detected and undetected dangerous failures are met.

Subsystem type B: A subsystem shall be regarded as type B, if for the components

required to achieve the safety function
the failure mode of at least one constituent component is not well defined; or
the behavior of the subsystem under fault conditions cannot be completely determined;
or there is insufficient dependable failure data from field experience to support claims
for rates of failure for detected and undetected dangerous failures.
Simplifying, one can say that as long as programmable or highly integrated electronic
components are used, a subsystem must be considered as type B.
---------------------------------------------------------------------------------------------------------------------
 Education Institute for

Equipment & Process Design

Architectural Constraints (Route 1H) (IEC 61508 part 2 –table 2)

 Education Institute for

Equipment & Process Design

Real Case Example

 Education Institute for

Equipment & Process Design

Calculation
1.SIL capability stated in the certificate
 Education Institute for

Equipment & Process Design

2.Calculate PFD for each and then sum them and find the corresponding SIL

Device λ TI PFD PFD

Level Transmitter 5.4E-08 8760 λ3. TI3 /4 2.65E-11

Barrier input 5.30E-08 8760 λ. TI /2 2.32E-04

Logic Solver 3.012E-09 8760 λ. TI /2 1.32E-04

Barrier Output 5.30E-08 8760 λ. TI /2 2.32E-04

Solenoid Valve 1.88E-07 8760 λ. TI /2 8.23E-04

Actuator 1.56E-07 8760 λ. TI /2 6.83E-04

Globe Valve 8.16E-07 8760 λ. TI /2 3.57E-03

5.68E-03
 Education Institute for

Equipment & Process Design

3.Check architectural constrains by checking first rout.

1. Level Transmitter
 Education Institute for

Equipment & Process Design

2.Barrier Input / Output

 Education Institute for

Equipment & Process Design

3.Selonoid Valve
 Education Institute for

Equipment & Process Design

 Education Institute for

Equipment & Process Design

4.Actuator
 Education Institute for

Equipment & Process Design

 Education Institute for

Equipment & Process Design

Results

SIL Capability SIL 3

Probability of Failure SIL2
Architectural Constraints SIL1
Verified SIL SIL1
 Education Institute for

Equipment & Process Design

References and Software

Failure Rate Data

• OREDA -SINTEF
• PERD -CCPS
• TECDOC & EIREDA–IAEA
• SERH -Exida
• GS EP EXP 405 TOTAL
• www.sael-online.com

Software

• exSILentiaby exida, www.exida.com

• SILSolverby SIS-Tech, www.sis-tech.com
• SILCoreby ACM (Canada), www.silcore.com
• AEShieldby AE Solutions, www.aesolns.com