INTRODUCTION TO

ELECTRICAL AND ELECTRONICS

ENGINEERING

Unit-5
Software and Labs
Software
1. MATLAB (Software for Numerical Computing)

2. Simulink (GUI based software for Dynamic System Simulation)

3. P Spice (Electrical Schematic Software)

4. Multisim (Circuit Simulation & PCB Design Software)

5. ETAP (Software for Electrical Power Systems)

6. Power World Simulator (Visual power system analysis software)

7. PSCAD (Electromagnetic Transient Analysis Software)

8. LabVIEW (Designing Interfacing and HMIs)

MATLAB
• MATLAB integrates computation, visualization, and
programming in an user friendly environment
where problems and solutions are expressed in
familiar mathematical notation.

• MATLAB (matrix laboratory) is a multi-paradigm

numerical computing environment and
proprietary programming language developed by
MathWorks.
Strengths of MATLAB
• MATLAB is relatively easy to learn
• MATLAB code is optimized to be relatively quick
when performing matrix operations
• MATLAB may behave like a calculator or as a
programming language
• MATLAB is interpreted, errors are easier to fix
• Although primarily procedural, MATLAB does have
some object-oriented elements
Weaknesses of MATLAB
• MATLAB is NOT a general purpose programming
language
• MATLAB is an interpreted language (making it for
the most part slower than a compiled language
such as C++)
• MATLAB is designed for scientific computation and
is not suitable for some things (such as parsing text)
Multivariable Newton’s Method
• Single variable algorithm Scalar equation

xi 1  xi   f ' ( xi ) f ( xi )
1

• Each iteration solves a linear approximation to function

• Multivariable algorithm Vector-matrix equation

xi 1  xi  J ( xi ) f ( xi )
1

• Each function approximated by a linear equation

• Each iteration solves a set of linear equations
Example (I)
• Solve the pair of equations:
Solution is:
f1 ( x1 , x2 )  x1  x  0
2
2
f1 ( x1 , x2 )  x1  x22  0
x1f =( x4, x x) 2 =x x2 8  0
1 1 2 1 2

f 2 ( x1 , x2 )  x1 x2  8  0

• Elements of the Jacobian matrix

 f1 f1 
 x  1 x2
 2 x2 
 1 
 f 2  x f 2
 x1 
 x1 2
x2 
 Example (II)
• Use as initial estimate for solution (3, 3)
• Next estimate obtained from:
Functions evaluated at old
point
New point = (3.5714, 2.0952)

1
 x1   3   1  6   6 
         
 x2   3   3 3  1 

Jacobian evaluated at old

Old point = (3, 3)
point
Solution in Matlab
counter = 1;
error = 10;
xold = [3;3];
while error > 1e-3 & counter < 10
fold(1) = xold(1) - xold(2)^2; fold(2) = xold(1)*xold(2) - 8;
J(1,1) = 1; J(1,2) = -2*xold(2); J(2,1) = xold(2); J(2,2) = xold(1);
xnew = xold - inv(J)*fold'
error = max(abs(xnew(1)-xold(1)),abs(xnew(2)-xold(2)));
counter = counter + 1;
xold = xnew;
end
Advice on Iterative Methods

• Follow one cycle through code by hand

• Initially use modest convergence criterion
• Put in a ‘counter’ ( to prevent infinite loop )
• Check final solution
• Be prepared for multiple solutions
• Initial guess has a big impact:
• On the final solution obtained
• On the time taken to converge to solution
Software used for embedded and IOT
1. Embedded C
2. Node RED
3. Raspbian
4. C++
5. SQL
6. HTSQL
7. Java
8. Python
9. Android App builder
Important Labs
• Electrical Machines
• Electronic Circuits
• Digital Electronics
• Linear Integrated Circuits
• Microprocessor and Micro controllers
• Measurements and Instrumenatation
• Control Systems
• Power Converters
• Power System / Power Electronics Simulation
Measurements
Ammeter (Ampermeter) Measures current
Capacitance meter Measures the capacitance of a component
Current clamp Measures current without physical connection
Curve tracer Applies swept signals to a device and allows display of the respon
Cos Phi Meter Measures the power factor
Distortion meter Measures the distortion added to a circuit
Electricity meter Measures the amount of energy dissipated
ESR meter Measures the equivalent series resistance of capacitors
Frequency counter Measures the frequency of the current
Leakage tester Measures leakage across the plates of a capacitor
LCR meter Measures the inductance, capacitance and resistance of a
component
Megger tester Measures Resistance Of An Winding Of Motor Or Generator And
Measures Earthing's Resistance
Microwave power meter Measures power at microwave frequencies
Multimeter General purpose instrument measures voltage, current and
resistance (and sometimes other quantities as well)
Network analyzer Measures network parameters
Ohmmeter Measures the resistance of a component
Oscilloscope Displays waveform of a signal, allows measurement of frequency,
timing, peak excursion, offset, ...
Psophometer Measures AF signal level and noise
Q meter Measures Q factor of the RF circuits
Tachometer Measures speed of motors
Signal analyzer Measures both the amplitude and the modulation of a
RF signal
Signal generator Generates signals for testing purposes
Spectrum analyser Displays frequency spectrum
Sweep generator Creates constant-amplitude variable frequency sine
waves to test frequency response
Transistor tester Tests transistors
Tube tester Tests vacuum tubes (triode, tetrode etc.)
Wattmeter Measures the power
Vectorscope Displays the phase of the colors in color TV
Video signal generator Generates video signal for testing purposes
Voltmeter Measures the potential difference between two points
in a circuit.
Power supplies

Rectified DC power supply, 24V

Regulated DC power supply auto transformer

Raw AC power supply

• Single Phase AC, 220V, 50Hz
• Three Phase AC, 415V, 50 Hz

Regulated AC power supply

• Single phase auto transformer
• Three phase auto transformer

Constant AC power supply

• Automatic ac voltage regulator
• SMPS Voltage stabilizer
Testing a diode
• A diode is best tested by measuring the voltage drop across
the diode when it is forward-biased.
• A forward-biased diode acts as a closed switch, permitting
current to flow.
• Multimeter produces a small voltage between test leads.
The multimeter then displays the voltage drop when the
test leads are connected across a diode when forward-
biased.
• Cut off power to the circuit
• Ensure that no voltage exists at the diode. (Voltage may be present
in the circuit due to charged capacitors. If so, the capacitors need to
be discharged)
• Connect the test leads to the diode. Record the measurement
displayed.
• Reverse the test leads. Record the measurement displayed.
• A diode is forward-biased when the positive (red) test lead is on the anode and the
negative (black) test lead is on the cathode.
• The forward-biased resistance of a good diode should range from 1000 Ω to 10 MΩ.
• The resistance measurement is high when the diode is forward-biased because current
from the multimeter flows through the diode, causing the high-resistance measurement
required for testing.
• A diode is reverse-biased when the positive (red) test lead is on the cathode and the
negative (black) test lead is on the anode.
• The reverse-biased resistance of a good diode displays OL on a multimeter. The diode is
bad if readings are the same in both directions.

Courtesy: fluke
Resistance mode diode test
procedure

Courtesy: fluke
Testing a transistor (BJT)
• Identify the transistor pins or at least the ‘base’ pin.
• Test the resistance between collector and emitter.
• Then reverse the positive and negative meter
connections and test again.
• If the meter reads zero or a few ohms in the above
tests, there is a short circuit between collector and
emitter and the transistor is faulty.
• If both readings are infinity, continue with next test.
Testing a transistor (BJT) contd…
• Connect the positive to the base, and test the
resistance of both junctions by connecting the negative
meter probe to one of the other two pins one by one.
• Typical forward resistance reading in both cases should
be around 500 to 1K ohms.
• A reading of zero ohms indicates a short circuit and a
faulty transistor.
• Alternatively, connect the negative to the base and the
positive lead to other pins, one by one.
• If the readings are infinity, the BJT is ok else it has
failed.
Semiconductor test equipment
(IC Chip tester)
• Semiconductor test equipment (IC tester) is a system for giving electrical
signals to a semiconductor device to compare output signals against
expected values for the purpose of testing if the device works as
specified in its design specifications.
• Testers are roughly categorized into logic testers, memory testers and
analog testers.
• IC testing is conducted at two levels:
• Wafer test also called die sort or probe test that tests wafers
• Package test also called final test after packaging using a handler and a
test socket, together with a tester.
Logic Tester μTAT 5100

Courtesy: Micronics Japan

End