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Ad5426 5432 5443

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38 views24 pages

Ad5426 5432 5443

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EduFer
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© © All Rights Reserved
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8-/10-/12-Bit High Bandwidth

Multiplying DACs with Serial Interface


Data Sheet AD5426/AD5432/AD5443
FEATURES GENERAL DESCRIPTION
2.5 V to 5.5 V supply operation The AD5426/AD5432/AD54431 are CMOS 8-, 10-, and 12-bit
50 MHz serial interface current output digital-to-analog converters (DACs), respectively.
10 MHz multiplying bandwidth These devices operate from a 2.5 V to 5.5 V power supply,
2.5 MSPS update rate making them suitable for battery-powered applications and
INL of ±1 LSB for 12-bit DAC many other applications.
±10 V reference input
These DACs use a double buffered, 3-wire serial interface that is
Low glitch energy < 2 nV-s
compatible with SPI, QSPI™, MICROWIRE, and most DSP
Extended temperature range −40°C to +125°C
interface standards. In addition, a serial data out pin (SDO)
10-lead MSOP
allows for daisy-chaining when multiple packages are used.
Pin-compatible 8-, 10-, and 12-bit current output DACs
Data readback allows the user to read the contents of the DAC
Guaranteed monotonic
register via the SDO pin. On power-up, the internal shift register
4-quadrant multiplication
and latches are filled with 0s and the DAC outputs are at zero scale.
Power-on reset with brownout detection
Daisy-chain mode As a result of manufacturing on a CMOS submicron process,
Readback function the parts offer excellent 4-quadrant multiplication characteristics
0.4 µA typical power consumption with large signal multiplying bandwidths of 10 MHz. The applied
external reference input voltage, VREF, determines the full-scale
APPLICATIONS output current. An integrated feedback resistor, RFB, provides
Portable battery-powered applications temperature tracking and full-scale voltage output when combined
Waveform generators with an external current to voltage precision amplifier.
Analog processing
The AD5426/AD5432/AD5443 DACs are available in small,
Instrumentation
10-lead MSOPs.
Programmable amplifiers and attenuators
Digitally controlled calibration The EV-AD5443/46/53SDZ evaluation board is available for
Programmable filters and oscillators evaluating DAC performance. For more information, see the
Composite video UG-327 evaluation board user guide.
Ultrasound
Gain, offset, and voltage trimming
FUNCTIONAL BLOCK DIAGRAM
VDD VREF

R
AD5426/ RFB
AD5432/ 8-/10-/12-BIT IOUT1
AD5443 R-2R DAC IOUT2

DAC REGISTER

POWER-ON
RESET
INPUT LATCH

SYNC
CONTROL LOGIC AND
SCLK
INPUT SHIFT REGISTER
SDIN SDO
03162-001

GND

Figure 1.
1
Protected by U.S. Patent No. 5,689,257.

Rev. H Document Feedback


Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Tel: 781.329.4700 ©2004–2015 Analog Devices, Inc. All rights reserved.
Trademarks and registered trademarks are the property of their respective owners. Technical Support www.analog.com
AD5426/AD5432/AD5443 Data Sheet

TABLE OF CONTENTS
Features .............................................................................................. 1 Circuit Operation ....................................................................... 15
Applications ....................................................................................... 1 Single-Supply Applications ....................................................... 17
General Description ......................................................................... 1 Adding Gain ................................................................................ 17
Functional Block Diagram .............................................................. 1 DACs Used as a Divider or Programmable Gain Element ... 18
Revision History ............................................................................... 2 Reference Selection .................................................................... 18
Specifications..................................................................................... 3 Amplifier Selection .................................................................... 18
Timing Characteristics ................................................................ 5 Serial Interface ............................................................................ 20
Absolute Maximum Ratings ............................................................ 6 PCB Layout and Power Supply Decoupling................................ 22
ESD Caution .................................................................................. 6 Overview of the AD5426/AD5432/AD5443 and Related DACs .. 23
Pin Configuration and Function Descriptions ............................. 7 Outline Dimensions ....................................................................... 24
Typical Performance Characteristics ............................................. 8 Ordering Guide .......................................................................... 24
Terminology .................................................................................... 14
Theory of Operation ...................................................................... 15
REVISION HISTORY
9/15—Rev. G to Rev. H Deleted 80C51/80L51 to AD5426/AD5432/AD5443 Interface
Deleted Positive Output Voltage Section and Figure 45; Section, Figure 55, MC68HC11 Interface to AD5426/AD5432/
Renumbered Sequentially.............................................................. 17 AD5443 Interface Section, Figure 56, MICROWIRE to
Changes to Adding Gain Section ................................................. 17 AD5426/AD5432/AD5443 Interface Section, Figure 57,
Changed Overview of AD54xx and AD55xx Devices Section PIC16C6x/7x to AD5426/AD5432/AD5443, and Figure 58 .... 22
to Overview of the AD5426/AD5432/AD5443 and Related Deleted Evaluation Board for the AD5426/AD5432/AD5443
DACs Section .................................................................................. 23 Series of DACs Section, Operating the Evaluation Board
Changes to Ordering Guide .......................................................... 24 Section, and Power Supplies Section ........................................... 23
Deleted Figure 59 and Figure 60................................................... 24
6/13—Rev. F to Rev. G Updated Outline Dimensions ....................................................... 24
Change to General Description Section ........................................ 1 Changes to Ordering Guide .......................................................... 24
Changes to Ordering Guide .......................................................... 24 Deleted Figure 61............................................................................ 25
Deleted Figure 62............................................................................ 26
7/12—Rev. E to Rev. F
No Change to Content, Changed VDD Values in 7/12 Revision 2/09—Rev. B to Rev. C
History Only ...................................................................................... 2 Changes to Low Power Serial Interface Section and Daisy-
Chain Mode Section....................................................................... 20
7/12—Rev. D to Rev. E Updated Outline Dimensions ....................................................... 28
Changed VDD = 3 V to VDD = 2.5 V ............................. Throughout
Changes to Table 2 ............................................................................ 4 11/08—Rev. A to Rev. B
Changes to Table 4 ............................................................................ 7 Changes to Ordering Guide .......................................................... 28
Change to Daisy-Chain Mode Section ........................................ 20
Change to Ordering Guide ............................................................ 24 5/05—Rev. 0 to Rev. A
Updated Format .................................................................. Universal
4/12—Rev. C to Rev. D Changes to Specifications .................................................................3
Changed VDD = 2.5 V to VDD = 3 V ............................. Throughout Changes to Figure 42...................................................................... 16
Changes to General Description Section ...................................... 1 Change to Figure 45 ....................................................................... 17
Deleted Microprocessor Interface Section, ADSP-21xx to Change to Figure 46 ....................................................................... 18
AD5426/AD5432/AD5443 Interface Section, Figure 51, Changes to Table 7, Table 8, and Table 9 ..................................... 19
Figure 52, Table 11, ADSP-BF5x to AD5426/AD5432/AD5443 Additions to Microprocessor Interface Section.......................... 21
Interface Section, Figure 53 and Figure 54; Renumbered
Sequentially ..................................................................................... 21 2/04—Revision 0: Initial Version

Rev. H | Page 2 of 24
Data Sheet AD5426/AD5432/AD5443

SPECIFICATIONS
VDD = 2.5 V to 5.5 V, VREF = 10 V, IOUT2 = 0 V; temperature range for Y version: −40°C to +125°C; all specifications TMIN to TMAX, unless
otherwise noted; dc performance measured with OP177; ac performance with AD8038, unless otherwise noted.

Table 1.
Parameter Min Typ Max Unit Test Conditions/Comments
STATIC PERFORMANCE
AD5426
Resolution 8 Bits
Relative Accuracy ±0.25 LSB
Differential Nonlinearity ±0.5 LSB Guaranteed monotonic
AD5432
Resolution 10 Bits
Relative Accuracy ±0.5 LSB
Differential Nonlinearity ±1 LSB Guaranteed monotonic
AD5443
Resolution 12 Bits
Relative Accuracy ±1 LSB
Differential Nonlinearity −1/+2 LSB Guaranteed monotonic
Gain Error ±10 mV
Gain Error Temperature Coefficient1 ±5 ppm FSR/°C
Output Leakage Current ±10 nA Data = 0x0000, TA = 25°C, IOUT1
±20 nA Data = 0x0000, T = −40°C to 125°C, IOUT1
REFERENCE INPUT1
Reference Input Range ±10 V
VREF Input Resistance 8 10 12 kΩ Input resistance TC = −50 ppm/°C
RFB Resistance 8 10 12 kΩ Input resistance TC = −50 ppm/°C
Input Capacitance
Code Zero Scale 3 6 pF
Code Full Scale 5 8 pF
DIGITAL INPUT/OUTPUT1
Input High Voltage, VIH 1.7 V
Input Low Voltage, VIL 0.6 V
Output High Voltage, VOH VDD − 1 V VDD = 4.5 V to 5 V, ISOURCE = 200 μA
VDD − 0.5 V VDD = 2.5 V to 3.6 V, ISOURCE = 200 μA
Output Low Voltage, VOL 0.4 V VDD = 4.5 V to 5 V, ISINK = 200 μA
0.4 V VDD = 2.5 V to 3.6 V, ISINK = 200 μA
Input Leakage Current, IIL 1 μA
Input Capacitance 4 10 pF
DYNAMIC PERFORMANCE1
Reference Multiplying Bandwidth 10 MHz VREF = ±3.5 V; DAC loaded all 1s
Output Voltage Settling Time VREF = 10 V; RLOAD = 100 Ω, DAC latch alternately
loaded with 0s and 1s
Measured to ±16 mV of FS 50 100 ns
Measured to ±4 mV of FS 55 110 ns
Measured to ±1 mV of FS 90 160 ns
Digital Delay 40 75 ns Interface delay time
10% to 90% Rise/Fall Time 15 30 ns Rise and fall time, VREF = 10 V, RLOAD = 100 Ω
Digital-to-Analog Glitch Impulse 2 nV-s 1 LSB change around major carry, VREF = 0 V
Multiplying Feedthrough Error DAC latch loaded with all 0s, VREF = ±3.5
70 dB 1 MHz
48 dB 10 MHz

Rev. H | Page 3 of 24
AD5426/AD5432/AD5443 Data Sheet
Parameter Min Typ Max Unit Test Conditions/Comments
Output Capacitance
IOUT1 12 17 pF All 0s loaded
10 12 pF All 1s loaded
IOUT2 22 25 pF All 0s loaded
10 12 pF All 1s loaded
Digital Feedthrough 0.1 nV-s Feedthrough to DAC output with SYNC high and
alternate loading of all 0s and all 1s
Analog THD 81 dB VREF = 3.5 V p-p, all 1s loaded, f = 1 kHz
Digital THD Clock = 1 MHz, VREF = 3.5 V, CCOMP = 1.8 pF
50 kHz fOUT 73 dB
20 kHz fOUT 74 dB
Output Noise Spectral Density 25 nV/√Hz @ 1 kHz
SFDR Performance (Wide Band) Clock = 1 MHz, VREF = 3.5 V
50 kHz fOUT 75 dB
20 kHz fOUT 76 dB
SFDR Performance (Narrow Band) Clock = 1 MHz, VREF = 3.5 V
50 kHz fOUT 87 dB
20 kHz fOUT 87 dB
Intermodulation Distortion 78 dB Clock = 1 MHz, f1 = 20 kHz, f2 = 25 kHz, VREF = 3.5 V
POWER REQUIREMENTS
Power Supply Range 2.5 5.5 V
IDD 0.6 µA TA = 25°C, logic inputs = 0 V or VDD
0.4 5 µA T = −40°C to +125°C , logic inputs = 0 V or VDD
Power Supply Sensitivity1 0.001 %/% ∆VDD = ±5%
1
Guaranteed by design and characterization, not subject to production testing.

Rev. H | Page 4 of 24
Data Sheet AD5426/AD5432/AD5443
TIMING CHARACTERISTICS
All input signals are specified with tr = tf = 1 ns (10% to 90% of VDD) and timed from a voltage level of (VIL + VIH)/2. VDD = 2.5 V to 5.5 V,
VREF = 10 V, IOUT2 = 0 V; temperature range for Y version: −40°C to +125°C; all specifications TMIN to TMAX, unless otherwise noted.

Table 2.
Parameter 2.5 V to 5.5 V 4.5 V to 5.5 V Unit Test Conditions/Comments
fSCLK 50 50 MHz max Max clock frequency
t1 20 20 ns min SCLK cycle time
t2 8 8 ns min SCLK high time
t3 8 8 ns min SCLK low time
t4 1 13 13 ns min SYNC falling edge to SCLK active edge setup time
t5 5 5 ns min Data setup time
t6 3 3 ns min Data hold time
t7 5 5 ns min SYNC rising edge to SCLK active edge
t8 30 30 ns min Minimum SYNC high time
t9 2, 3 80 45 ns typ SCLK active edge to SDO valid
120 65 ns max
1
Falling or rising edge as determined by control bits of serial word.
2
Daisy-chain and readback modes cannot operate at maximum clock frequency. SDO timing specifications measured with load circuit, as shown in Figure 4.
3
SDO operates with a VDD of 3.0 V to 5.5 V.

t1

SCLK

t2 t3
t8 t4
t7

SYNC

t6
t5
DIN
DB15 DB0

03162-002
ALTERNATIVELY, DATA MAY BE CLOCKED INTO INPUT SHIFT REGISTER ON RISING EDGE OF
SCLK AS DETERMINED BY CONTROL BITS. TIMING AS PER ABOVE, WITH SCLK INVERTED.

Figure 2. Standalone Mode Timing Diagram

t1
SCLK

t2 t3 t7
t4 t8
t6
SYNC

t6
t5
DB15� DB0
SDIN DB15 (N) DB0 (N)
(N + 1) (N + 1)
t9

SDO DB15(N) DB0(N)

ALTERNATIVELY, DATA MAY BE CLOCKED INTO INPUT SHIFT REGISTER ON RISING EDGE OF SCLK AS
03162-003

DETERMINED BY CONTROL BITS. IN THIS CASE, DATA WOULD BE CLOCKED OUT OF SDO ON FALLING
EDGE OF SCLK. TIMING AS PER ABOVE, WITH SCLK INVERTED.

Figure 3. Daisy-Chain and Readback Modes Timing Diagram

Rev. H | Page 5 of 24
AD5426/AD5432/AD5443 Data Sheet

ABSOLUTE MAXIMUM RATINGS


Transient currents of up to 100 mA do not cause SCR latch-up. Stresses at or above those listed under Absolute Maximum
TA = 25°C, unless otherwise noted. Ratings may cause permanent damage to the product. This is a
Table 3. stress rating only; functional operation of the product at these
Parameter Rating
or any other conditions above those indicated in the operational
section of this specification is not implied. Operation beyond
VDD to GND −0.3 V to +7 V
the maximum operating conditions for extended periods may
VREF, RFB to GND −12 V to +12 V
affect product reliability.
IOUT1, IOUT2 to GND −0.3 V to VDD + 0.3 V
Logic Inputs and Output 1 −0.3 V to VDD + 0.3 V 200µA IOL
Operating Temperature Range
Extended Industrial (Y Version) −40°C to +125°C
VOH (MIN) + VOL (MAX)
Storage Temperature Range −65°C to +150°C TO OUTPUT PIN
CL 2
Junction Temperature 150°C 20pF

10-lead MSOP θJA Thermal Impedance 206°C/W

03162-004
200µA IOH
Lead Temperature, Soldering (10 sec) 300°C
IR Reflow, Peak Temperature (<20 sec) 235°C Figure 4. Load Circuit for SDO Timing Specifications

1
Overvoltages at SCLK, SYNC, and DIN are clamped by internal diodes.
ESD CAUTION

Rev. H | Page 6 of 24
Data Sheet AD5426/AD5432/AD5443

PIN CONFIGURATION AND FUNCTION DESCRIPTIONS


IOUT1 1 10 RFB
IOUT2 2
AD5426/ 9 VREF
AD5432/
GND 3 8 VDD
AD5443
SCLK 4 7 SDO
TOP VIEW

03162-005
SDIN 5 (Not to Scale) 6 SYNC

Figure 5. Pin Configuration

Table 4. Pin Function Descriptions


Pin No. Mnemonic Description
1 IOUT1 DAC Current Output.
2 IOUT2 DAC Analog Ground. This pin should normally be tied to the analog ground of the system.
3 GND Digital Ground Pin.
4 SCLK Serial Clock Input. By default, data is clocked into the input shift register on the falling edge of the serial clock
input. Alternatively, by means of the serial control bits, the device may be configured such that data is clocked into
the shift register on the rising edge of SCLK. The device can accommodate clock rates up to 50 MHz.
5 SDIN Serial Data Input. Data is clocked into the 16-bit input register on the active edge of the serial clock input. By
default, on power-up, data is clocked into the shift register on the falling edge of SCLK. The control bits allow the
user to change the active edge to rising edge.
6 SYNC Active Low Control Input. This is the frame synchronization signal for the input data. When SYNC goes low, it
powers on the SCLK and DIN buffers, and the input shift register is enabled. Data is loaded to the mode, the serial
interface counts clocks, and data is latched to the shift register on the 16th active clock edge.
7 SDO Serial Data Output. This allows a number of parts to be daisy-chained. By default, data is clocked into the shift
register on the falling edge and out via SDO on the rising edge of SCLK. Data is always clocked out on the
alternate edge to loading data to the shift register. Writing the readback control word to the shift register makes
the DAC register contents available for readback on the SDO pin, clocked out on the opposite edges to the active
clock edge. SDO operates with a VDD of 3.0 V to 5.5 V.
8 VDD Positive Power Supply Input. These parts can be operated from a supply of 2.5 V to 5.5 V.
9 VREF DAC Reference Voltage Input.
10 RFB DAC Feedback Resistor Pin. Establish voltage output for the DAC by connecting to external amplifier output.

Rev. H | Page 7 of 24
AD5426/AD5432/AD5443 Data Sheet

TYPICAL PERFORMANCE CHARACTERISTICS


0.20 0.20
TA = 25°C TA = 25°C
VREF = 10V VREF = 10V
0.15 VDD = 5V 0.15 VDD = 5V

0.10 0.10

0.05 0.05
INL (LSB)

INL (LSB)
0 0

–0.05 –0.05

–0.10 –0.10

–0.15 –0.15

–0.20 –0.20

03162-006

03162-009
0 50 100 150 200 250 0 50 100 150 200 250
CODE CODE

Figure 6. INL vs. Code (8-Bit DAC) Figure 9. DNL vs. Code (8-Bit DAC)

0.5 0.5
TA = 25°C TA = 25°C
0.4 VREF = 10V 0.4 VREF = 10V
VDD = 5V VDD = 5V
0.3 0.3

0.2 0.2

0.1 0.1
DNL (LSB)
iNL (LSB)

0 0

–0.1 –0.1

–0.2 –0.2

–0.3 –0.3

–0.4 –0.4

–0.5 –0.5
03162-007

03162-010
0 200 400 600 800 10000 0 200 400 600 800 1000
CODE CODE

Figure 7. INL vs. Code (10-Bit DAC) Figure 10. DNL vs. Code (10-Bit DAC)

1.0 1.0
TA = 25°C TA = 25°C
0.8 VREF = 10V 0.8 VREF = 10V
VDD = 5V VDD = 5V
0.6 0.6

0.4 0.4

0.2 0.2
DNL (LSB)
INL (LSB)

0 0

–0.2 –0.2

–0.4 –0.4

–0.6 –0.6

–0.8 –0.8

–1.0 –1.0
03162-008

03162-011

0 500 1000 1500 2000 2500 3000 3500 4000 0 500 1000 1500 2000 2500 3000 3500 4000
CODE CODE

Figure 8. INL vs. Code (12-Bit DAC) Figure 11. DNL vs. Code (12-Bit DAC)

Rev. H | Page 8 of 24
Data Sheet AD5426/AD5432/AD5443
0.6 2.0

0.5 1.5

0.4 MAX INL MAX INL


1.0
TA = 25°C
0.3
0.5 VREF = 0V
VDD = 3V
0.2 AD5443
INL (LSB)

TA = 25°C 0

LSB
VDD = 5V MAX DNL
0.1
AD5443
–0.5
0
–1.0 MIN INL
–0.1 MIN INL
MIN DNL
–0.2 –1.5

–0.3 –2.0

03162-012

03162-015
2 3 4 5 6 7 8 9 10 0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2 1.3 1.4 1.5
REFERENCE VOLTAGE VBIAS (V)

Figure 12. INL vs. Reference Voltage Figure 15. Linearity vs. VBIAS Voltage Applied to IOUT2

–0.40 4
TA = 25°C TA = 25°C
VDD = 5V VREF = 2.5V MAX DNL
3
AD5443 VDD = 3V
–0.45
AD5443
2
MAX INL
–0.50 1

0
DNL (LSB)

–0.55
LSB

–1 MIN DNL

–0.60 –2
MIN INL
MIN DNL –3
–0.65
–4

–0.70 –5
03162-013

03162-016
2 3 4 5 6 7 8 9 10 0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0
REFERENCE VOLTAGE VBIAS (V)

Figure 13. DNL vs. Reference Voltage Figure 16. Linearity vs. VBIAS Voltage Applied to IOUT2

5 0.5
VREF = 10V TA = 25°C
4 0.4 VREF = 0V
VDD = 3V AND 5V
3 0.3
VDD = 5V
2 0.2

1 0.1
VOLTAGE (mV)
ERROR (mV)

GAIN ERROR
0 0
VDD = 3V
OFFSET ERROR
–1 –0.1

–2 –0.2

–3 –0.3

–4 –0.4

–5 –0.5
03162-014

03162-017

–60 –40 –20 0 20 40 60 80 100 120 140 0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2 1.3 1.4 1.5
TEMPERATURE (°C) VBIAS (V)

Figure 14. Gain Error vs. Temperature Figure 17. Gain and Offset Errors vs. VBIAS Voltage Applied to IOUT2

Rev. H | Page 9 of 24
AD5426/AD5432/AD5443 Data Sheet
0.5 0.7
TA = 25°C TA = 25°C
0.4 VREF = 2.5V
VDD = 3V AND 5V 0.6
0.3 GAIN ERROR

0.2 0.5
VDD = 5V
0.1

CURRENT (mA)
VOLTAGE (mV)

0.4
0 OFFSET ERROR

0.3
–0.1

–0.2 0.2

–0.3
0.1
–0.4
VDD = 3V
–0.5 0

03162-018

03162-021
0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 0 1 2 3 4 5
VBIAS (V) INPUT VOLTAGE (V)

Figure 18. Gain and Offset Errors vs. VBIAS Voltage Applied to IOUT2 Figure 21. Supply Current vs. Logic Input Voltage, SYNC (SCLK), DATA = 0

3 1.6
TA = 25°C
VREF = 0V
VDD = 5V MAX INL 1.4
2 AD5443

1.2
1 IOUT1 VDD 5V
IOUT LEAKAGE (nA)

1.0
MAX DNL
0 0.8
LSB

0.6
–1
MIN INL
0.4
IOUT1 VDD 3V
–2
MIN DNL 0.2

–3 0

03162-022
03162-019

0.5 1.0 1.5 2.0 2.5 –40 –20 0 20 40 60 80 100 120


VBIAS (V) TEMPERATURE (°C)

Figure 19. Linearity vs. VBIAS Voltage Applied to IOUT2 Figure 22. IOUT1 Leakage Current vs. Temperature

4 0.50
TA = 25°C
V = 2.5V 0.45
3 REF
VDD = 5V
AD5443 0.40
2
VDD = 5V
MAX DNL 0.35
1 ALL 0s
0.30
CURRENT (µA)

0 MAX INL ALL 1s


0.25
LSB

–1 MIN DNL
0.20
–2 VDD = 3V
0.15
–3 0.10 ALL 1s ALL 0s

–4 MIN INL
0.05

–5 0
03162-023
03162-020

0.5 1.0 1.5 2.0 –60 –40 –20 0 20 40 60 80 100 120 140
VBIAS (V) TEMPERATURE (°C)

Figure 20. Linearity vs. VBIAS Voltage Applied to IOUT2 Figure 23. Supply Current vs. Temperature

Rev. H | Page 10 of 24
Data Sheet AD5426/AD5432/AD5443
3.5 3
TA = 25°C
AD5443 VREF = ±0.15V, AD8038 CC 1pF
3.0 LOADING 010101010101 VREF = ±2V, AD8038 CC 1pF

0
2.5
VREF = ±3.51V, AD8038 CC 1.8pF

2.0 VREF = ±2V, AD8038 CC 1.47pF

GAIN (dB)
IDD (mA)

–3
VREF = ±0.15V, AD8038 CC 1.47pF
1.5 VCC = 5V

1
–6
VCC = 3V
0.5 TA = 25°C
VDD = 5V
AD8038 AMPLIFIER
0 –9

03162-024

03162-027
1 10 100 1k 10k 100k 1M 10M 100M 10k 100k 1M 10M 100M
FREQUENCY (Hz) FREQUENCY (Hz)

Figure 24. Supply Current vs. Update Rate Figure 27. Reference Multiplying Bandwidth vs. Frequency and
Compensation Capacitor

6 0.060
LOADING ALL ON VDD 5V, 0V REF TA = 25°C
0
ZS TO FS DB11 NRG = 2.049nVs VREF = 0V
–6 0.050 0x7FF TO 0x800 AD8038 AMPLIFIER
–12 DB10
CCOMP = 1.8pF
–18 DB9
AD5443
DB8 0.040
–24
DB7
OUTPUT VOLTAGE (V)
–30 VDD 3V, 0V REF
DB6 0.030 NRG = 0.088nVs
–36
DB5 0x800 TO 0x7FF
–42
GAIN (dB)

DB4
–48 0.020
DB3 VDD 3V, 0V REF
–54
DB2 NRG = 1.877nVs
–60 0.010
DB1 0x7FF TO 0x800
–66
DB0
–72
0
–78 TA = 25°C
–84 VDD = 5V
VDD 5V, 0V REF
–90 VREF = ±3.5V –0.010
ALL OFF NRG = 0.119nVs,
–96 CCOMP = 1.8pF
0x800 TO 0x7FF
AD8038 AMPLIFIER
–102 –0.020
03162-025

03162-028
1 10 100 1k 10k 100k 1M 10M 100M 0 50 100 150 200 250 300
FREQUENCY (Hz) TIME (ns)

Figure 25. Reference Multiplying Bandwidth vs. Frequency and Code Figure 28. Midscale Transition VREF = 0 V

0.2 –1.70
VDD 5V, 3.5V REF TA = 25°C
NRG = 1.184nVs VREF = 3.5V
0x7FF TO 0x800 AD8038 AMPLIFIER
–1.71 CCOMP = 1.8pF
0
AD5443
OUTPUT VOLTAGE (V)

–1.72
VDD 3V, 3.5V REF
–0.2
NRG = 1.433nVs
GAIN (dB)

0x7FF TO 0x800
–1.73

–0.4
VDD 3V, 3.5V REF
–1.74
NRG = 0.647nVs
0x800 TO 0x7FF
TA = 25°C
–0.6
VDD = 5V –1.75
VREF = ±3.5V
CCOMP = 1.8pF VDD 5V, 3.5V REF, NRG = 0.364nVs,
AD8038 AMPLIFIER 0x800 TO 0x7FF
–0.8 –1.76
03162-026

03162-029

1 10 100 1k 10k 100k 1M 10M 100M 0 50 100 150 200 250 300
FREQUENCY (Hz) TIME (ns)

Figure 26. Reference Multiplying Bandwidth—All 1s Loaded Figure 29. Midscale Transition VREF = 3.5 V

Rev. H | Page 11 of 24
AD5426/AD5432/AD5443 Data Sheet
20 100
TA = 25°C
VDD = 3V
0 AMPLIFIER = AD8038 MCLK = 200kHz
80
–20 MCLK = 500kHz
MCLK = 1MHz
60
–40
PSRR (dB)

SFDR (dB)
–60
FULL SCALE 40

–80
ZERO SCALE
20
TA = 25°C
–100
VREF = 3.5V
AD8038 AMP
AD5443
–120 0

03162-030

03162-034
1 10 100 1k 10k 100k 1M 10M 0 10 20 30 40 50
FREQUENCY (Hz) fOUT (kHz)

Figure 30. Power Supply Rejection vs. Frequency Figure 33. Wideband SFDR vs. fOUT Frequency (AD5443)

–60 80
TA = 25°C
VDD = 3V MCLK = 500kHz
VREF = 3.5V p-p
–65

60 MCLK = 1MHz MCLK = 200kHz

–70
THD + N (dB)

SFDR (dB)

–75 40

–80

20
–85 TA = 25°C
VREF = 3.5V
AD8038 AMP
–90 AD5426
03162-031

03162-035
1 10 100 1k 10k 100k 1M 0 10 20 30 40 50
FREQUENCY (Hz) fOUT (kHz)

Figure 34. Wideband SFDR vs. fOUT Frequency (AD5426)


Figure 31. THD and Noise vs. Frequency

1.8 0
TA = 25°C
TA = 25°C
VREF = 3.5V
–10
1.6 AD8038 AMPLIFIER
AD5443
–20
1.4
VIH
THRESHOLD VOLTAGE (V)

–30
1.2
–40
SFDR (dB)

1.0
VIL –50
0.8
–60

0.6 –70

0.4 –80

0.2 –90

–100
03162-036

0
03162-033

2.5 3.0 3.5 4.0 4.5 5.0 5.5 0 50 100 150 200 250 300 350 400 450 500
VOLTAGE (V) FREQUENCY (Hz)

Figure 32. Threshold Voltages vs. Supply Voltage Figure 35. Wideband SFDR fOUT = 50 kHz, Update = 1 MHz

Rev. H | Page 12 of 24
Data Sheet AD5426/AD5432/AD5443
0 0
TA = 25°C TA = 25°C
VREF = 3.5V VREF = 3.5V
–10 –10
AD8038 AMPLIFIER AD8038 AMPLIFIER
AD5443 AD5443
–20 –20

–30 –30

–40 –40
SFDR (dB)

SFDR (dB)
–50 –50

–60 –60

–70 –70

–80 –80

–90 –90

–100 –100

03162-037

03162-039
0 50 100 150 200 250 300 350 400 450 500 10 12 14 16 18 20 22 24 26 28 30
FREQUENCY (Hz) FREQUENCY (Hz)

Figure 36. Wideband SFDR fOUT = 20 kHz, Update = 1 MHz Figure 38. Narrowband (±50%) SFDR fOUT = 20 kHz, Update = 1 MHz

0 0
TA = 25°C TA = 25°C
VREF = 3.5V VREF = 3.5V
–10 –10
AD8038 AMPLIFIER AD8038 AMPLIFIER
AD5443 AD5443
–20 –20

–30 –30

–40 –40
SFDR (dB)

–50 –50
dB

–60 –60

–70 –70

–80 –80

–90 –90

–100
03162-038

–100

03162-040
25 30 35 40 45 50 55 60 65 70 75 10 15 20 25 30 35
FREQUENCY (Hz) FREQUENCY (Hz)
Figure 37. Narrowband (±50%) SFDR fOUT = 50 kHz, Update = 1 MHz Figure 39. Narrowband (±50%) IMD fOUT = 20 kHz, 25 kHz, Update = 1 MHz

Rev. H | Page 13 of 24
AD5426/AD5432/AD5443 Data Sheet

TERMINOLOGY
Relative Accuracy Digital Feedthrough
Relative accuracy or endpoint nonlinearity is a measure of the When the device is not selected, high frequency logic activity
maximum deviation from a straight line passing through the on the device digital inputs may be capacitively coupled to show
endpoints of the DAC transfer function. It is measured after up as noise on the IOUT pins and subsequently into the following
adjusting for 0 and full scale and is normally expressed in LSBs circuitry. This noise is digital feedthrough.
or as a percentage of full-scale reading. Multiplying Feedthrough Error
Differential Nonlinearity This is the error due to capacitive feedthrough from the DAC
Differential nonlinearity is the difference between the measured reference input to the DAC IOUT1 terminal, when all 0s are
change and the ideal 1 LSB change between any two adjacent loaded to the DAC.
codes. A specified differential nonlinearity of −1 LSB maximum Total Harmonic Distortion (THD)
over the operating temperature range ensures monotonicity. The DAC is driven by an ac reference. The ratio of the rms sum
Gain Error of the harmonics of the DAC output to the fundamental value is
Gain error or full-scale error is a measure of the output error the THD. Usually only the lower order harmonics are included,
between an ideal DAC and the actual device output. For these such as second to fifth.
DACs, ideal maximum output is VREF − 1 LSB. Gain error of the
DACs is adjustable to 0 with external resistance. (V
2
2
+ V3 2 + V4 2 + V5 2 )
THD = 20 log
V1
Output Leakage Current
Output leakage current is current that flows in the DAC ladder Digital Intermodulation Distortion
switches when these are turned off. For the IOUT1 terminal, it Second-order intermodulation distortion (IMD) measurements
can be measured by loading all 0s to the DAC and measuring are the relative magnitude of the fa and fb tones generated
the IOUT1 current. Minimum current flows in the IOUT2 line digitally by the DAC and the second-order products at 2fa − fb
when the DAC is loaded with all 1s. and 2fb − fa.
Output Capacitance Spurious-Free Dynamic Range (SFDR)
Capacitance from IOUT1 or IOUT2 to AGND. SFDR is the usable dynamic range of a DAC before spurious
Output Current Settling Time noise interferes or distorts the fundamental signal. It is the mea-
This is the amount of time it takes for the output to settle to a sure of the difference in amplitude between the fundamental
specified level for a full-scale input change. For these devices, it and the largest harmonically or nonharmonically related spur
is specified with a 100 Ω resistor to ground. from dc to full Nyquist bandwidth (half the DAC sampling rate,
or fS/2). Narrow band SFDR is a measure of SFDR over an
The settling time specification includes the digital delay from arbitrary window size, in this case 50% of the fundamental.
SYNC rising edge to the full-scale output charge. Digital SFDR is a measure of the usable dynamic range of the
Digital-to-Analog Glitch Impulse DAC when the signal is a digitally generated sine wave.
The amount of charge injected from the digital inputs to the
analog output when the inputs change state. This is normally
specified as the area of the glitch in either pA-s or nV-s
depending upon whether the glitch is measured as a current
or voltage signal.

Rev. H | Page 14 of 24
Data Sheet AD5426/AD5432/AD5443

THEORY OF OPERATION
The AD5426, AD5432, and AD5443 are 8-, 10-, and 12-bit Note that the output voltage polarity is opposite to the VREF
current output DACs consisting of a standard inverting R-2R polarity for dc reference voltages.
ladder configuration. A simplified diagram for the 8-bit AD5426 is These DACs are designed to operate with either negative or
shown in Figure 40. The matching feedback resistor, RFB, has a positive reference voltages. The VDD power pin is used by only the
value of R. The value of R is typically 10 kΩ (minimum 8 kΩ internal digital logic to drive the DAC switches’ on and off states.
and maximum 12 kΩ). If IOUT1 and IOUT2 are kept at the same
potential, a constant current flows in each ladder leg, regardless These DACs are also designed to accommodate ac reference
of digital input code. Therefore, the input resistance presented input signals in the range of −10 V to +10 V.
at VREF is always constant and nominally of value R. The DAC With a fixed 10 V reference, the circuit shown in Figure 41 gives
output (IOUT) is code-dependent, producing various resistances a unipolar 0 V to −10 V output voltage swing. When VIN is an ac
and capacitances. External amplifier choice should take into signal, the circuit performs 2-quadrant multiplication. Table 5
account the variation in impedance generated by the DAC on shows the relationship between digital code and expected output
the amplifiers inverting input node. voltage for unipolar operation (AD5426, 8-bit device).
R R R
VREF Table 5. Unipolar Code Table
2R 2R 2R 2R 2R Digital Input Analog Output (V)
S1 S2 S3 S8 R
RFBA 1111 1111 −VREF (255/256)
IOUT1 1000 0000 −VREF (128/256) = −VREF/2
IOUT2
0000 0001 −VREF (1/256)
03162-041

DAC DATA LATCHES


AND DRIVERS 0000 0000 −VREF (0/256) = 0

Figure 40. Simplified Ladder


VDD R2
Access is provided to the VREF, RFB, IOUT1, and IOUT2 terminals of
the DAC, making the device extremely versatile and allowing it C1
VDD RFB
to be configured in several different operating modes. For example, AD5426/ IOUT1
it can be configured to provide a unipolar output, 4-quadrant VREF VREF AD5432/ A1
A1
R1 IOUT2 VOUT = 0
multiplication in bipolar or single-supply modes of operation. AD5443 TO –VREF
SYNC SCLK SDIN GND
Note that a matching switch is used in series with the internal
RFB feedback resistor. If users attempt to measure RFB, power
MICROCONTROLLER AGND
must be applied to VDD to achieve continuity.
NOTES
CIRCUIT OPERATION 1. R1 AND R2 USED ONLY IF GAIN ADJUSTMENT IS REQUIRED.

03162-042
2. C1 PHASE COMPENSATION (1pF TO 2pF) MAY BE REQUIRED
Unipolar Mode IF A1 IS A HIGH SPEED AMPLIFIER.

Using a single op amp, these devices can easily be configured to Figure 41. Unipolar Operation
provide 2-quadrant multiplying operation or a unipolar output
voltage swing, as shown in Figure 41.
When an output amplifier is connected in unipolar mode, the
output voltage is given by
D
VOUT = − VREF ×
2n
where D is the fractional representation of the digital word
loaded to the DAC, and n is the number of bits.
D = 0 to 255 (8-bit AD5426)
= 0 to 1023 (10-bit AD5432)
= 0 to 4095 (12-bit AD5443)

Rev. H | Page 15 of 24
AD5426/AD5432/AD5443 Data Sheet
Bipolar Operation Table 6. Bipolar Code Table
In some applications, it may be necessary to generate full Digital Input Analog Output (V)
4-quadrant multiplying operation or a bipolar output swing. 1111 1111 +VREF (127/128)
This can easily be accomplished by using another external 1000 0000 0
amplifier and some external resistors, as shown in Figure 42. 0000 0001 −VREF (127/128)
In this circuit, the second amplifier, A2, provides a gain of 2. 0000 0000 −VREF (128/128)
Biasing the external amplifier with an offset from the reference Stability
voltage results in full 4-quadrant multiplying operation. The
In the I-to-V configuration, the IOUT of the DAC and the inverting
transfer function of this circuit shows that both negative and
node of the op amp must be connected as close as possible and
positive output voltages are created as the input data, D, which
proper PCB layout techniques must be employed. Since every
is incremented from code zero (VOUT = −VREF) to midscale
code change corresponds to a step function, gain peaking may
(VOUT = 0 V) to full scale (VOUT = +VREF).
occur if the op amp has limited gain bandwidth product (GBP)
D and there is excessive parasitic capacitance at the inverting node.
VOUT =  VREF × n − 1  − VREF
 2  This parasitic capacitance introduces a pole into the open-loop
where D is the fractional representation of the digital word response that can cause ringing or instability in closed-loop
loaded to the DAC and n is the resolution of the DAC. applications.

D = 0 to 255 (8-bit AD5426) An optional compensation capacitor, C1, can be added in parallel
= 0 to 1023 (10-bit AD5432) with RFB for stability, as shown in Figure 41 and Figure 42. Too
= 0 to 4095 (12-bit AD5443) small a value of C1 can produce ringing at the output, while
too large a value can adversely affect the settling time. C1 should
When VIN is an ac signal, the circuit performs 4-quadrant be found empirically, but 1 pF to 2 pF is generally adequate for
multiplication. compensation.
Table 6 shows the relationship between digital code and the
expected output voltage for bipolar operation (AD5426,
8-bit device).
R3
20kΩ
R5
VDD R2 20kΩ

C1
VDD RFB
R4
AD5426/ IOUT1 10kΩ
A1
VREF VREF AD5432/ IOUT2
A1
±10V R1 A2
AD5443
SYNC SCLK SDIN GND VOUT = –VREF
TO +VREF

MICROCONTROLLER AGND

NOTES
1. R1 AND R2 ARE USED ONLY IF GAIN ADJUSTMENT IS REQUIRED. ADJUST R1 FOR
VOUT = 0V WITH CODE 10000000 LOADED TO DAC.
2. MATCHING AND TRACKING IS ESSENTIAL FOR RESISTOR PAIRS R3 AND R4.
03162-043

3. C1 PHASE COMPENSATION (1pF TO 2pF) MAY BE REQUIRED IF A1/A2 IS A HIGH


SPEED AMPLIFIER.

Figure 42. Bipolar Operation

Rev. H | Page 16 of 24
Data Sheet AD5426/AD5432/AD5443
VDD
SINGLE-SUPPLY APPLICATIONS R1 R2

Current Mode Operation


RFB VDD
These DACs are specified and tested to guarantee operation in A1 VOUT
single-supply applications. In the current mode circuit of Figure 43, VIN IOUT1 VREF

IOUT2 and hence IOUT1 is biased positive by an amount applied to GND


VBIAS.
VDD
NOTES
1. ADDITIONAL PINS OMITTED FOR CLARITY.

03162-045
C1
VDD RFB 2. C1 PHASE COMPENSATION (1pF TO 2pF) MAY BE REQUIRED
IF A1 IS A HIGH SPEED AMPLIFIER.
IOUT1
VIN VREF A1
A1 VOUT
IOUT2 Figure 44. Single-Supply Voltage Switching Mode Operation
GND
It is important to note that VIN is limited to low voltages because
the switches in the DAC ladder no longer have the same source
drain drive voltage. As a result, their on resistance differs, which
degrades the linearity of the DAC.
A2
VBIAS
Also, VIN must not go negative by more than 0.3 V or an
NOTES internal diode turns on, exceeding the maximum ratings of the
1. ADDITIONAL PINS OMITTED FOR CLARITY.
device. In this type of application, the full range of multiplying
03162-044

2. C1 PHASE COMPENSATION (1pF TO 2pF) MAY BE


REQUIRED IF A1 IS A HIGH SPEED AMPLIFIER.
capability of the DAC is lost.
Figure 43. Single-Supply Current Mode Operation ADDING GAIN
In this configuration, the output voltage is given by In applications where the output voltage is required to be greater
VOUT = {D × (RFB/RDAC) × (VBIAS − VIN)} + VBIAS than VIN, gain can be added with an additional external amplifier or
it can be achieved in a single stage. It is important to consider the
As D varies from 0 to 255 (AD5426), 1023 (AD5432) or 4095
effect of temperature coefficients of the thin film resistors of the
(AD5443), the output voltage varies from
DAC. Simply placing a resistor in series with the RFB resistor causes
VOUT = VBIAS to VOUT = 2 VBIAS − VIN mismatches in the temperature coefficients, resulting in larger
VBIAS should be a low impedance source capable of sinking and gain temperature coefficient errors. Instead, the circuit shown
sourcing all possible variations in current at the IOUT2 terminal in Figure 45 is a recommended method of increasing the gain of
without any problems. the circuit. R1, R2, and R3 should all have similar temperature
coefficients, but they need not match the temperature coefficients
It is important to note that VIN is limited to low voltages because
of the DAC. This approach is recommended in circuits where
the switches in the DAC ladder no longer have the same source
gains of greater than 1 are required.
drain drive voltage. As a result, their on resistance differs, which
degrades the linearity of the DAC. See Figure 15 to Figure 20. Note that RFB is much greater than R2||R3 and that a gain error
percentage of 100 × (R2||R3)/RFB must be taken into consideration.
Voltage Switching Mode of Operation
VDD
Figure 44 shows these DACs operating in the voltage switching
mode. The reference voltage, VIN, is applied to the IOUT1 pin, C1
VDD RFB
IOUT2 is connected to AGND, and the output voltage is available
R1 IOUT1
at the VREF terminal. In this configuration, a positive reference VIN VREF A1 VOUT
IOUT2
voltage results in a positive output voltage, making single-supply R3
GND
operation possible. The output from the DAC is voltage at a GAIN = R2 + R3
R2
constant impedance (the DAC ladder resistance), thus an op R2

amp is necessary to buffer the output voltage. The reference R1 = R2R3


input no longer sees a constant input impedance, but one that NOTES R2 + R3
1. ADDITIONAL PINS OMITTED FOR CLARITY.
03162-047

varies with code. Therefore, the voltage input should be driven 2. C1 PHASE COMPENSATION (1pF TO 2pF) MAY BE REQUIRED
IF A1 IS A HIGH SPEED AMPLIFIER.
from a low impedance source.
Figure 45. Increasing Gain of Current Output DAC

Rev. H | Page 17 of 24
AD5426/AD5432/AD5443 Data Sheet
DACS USED AS A DIVIDER OR PROGRAMMABLE REFERENCE SELECTION
GAIN ELEMENT When selecting a reference for use with the AD5426 series of
Current-steering DACs are very flexible and lend themselves to current output DACs, pay attention to the references output
many different applications. If this type of DAC is connected as voltage temperature coefficient specification. This parameter not
the feedback element of an op amp and RFB is used as the input only affects the full-scale error, but can also affect the linearity (INL
resistor as shown in Figure 46, then the output voltage is inversely and DNL) performance. The reference temperature coefficient
proportional to the digital input fraction, D. should be consistent with the system accuracy specifications. For
For D = 1 − 2−n the output voltage is example, an 8-bit system required to hold its overall specification to
within 1 LSB over the temperature range 0°C to 50°C dictates
VOUT = −VIN/D = −VIN/(1 − 2−N) that the maximum system drift with temperature should be less
As D is reduced, the output voltage increases. For small values of than 78 ppm/°C. A 12-bit system with the same temperature
D, it is important to ensure that the amplifier does not saturate and range to overall specification within 2 LSBs requires a maximum
also that the required accuracy is met. For example, an 8-bit DAC drift of 10 ppm/°C. By choosing a precision reference with low
driven with the binary code 0x10 (00010000), that is, 16 decimal, in output temperature coefficient this error source can be minimized.
the circuit of Figure 46 should cause the output voltage to be 16 Table 7 suggests some references available from Analog Devices
× VIN. However, if the DAC has a linearity specification of ±0.5 that are suitable for use with this range of current output DACs.
LSB, then D can in fact have the weight anywhere in the range
15.5/256 to 16.5/256 so that the possible output voltage will be in AMPLIFIER SELECTION
the range 15.5 VIN to 16.5 VIN—an error of +3% even though the The primary requirement for the current-steering mode is an
DAC itself has a maximum error of 0.2%. amplifier with low input bias currents and low input offset
DAC leakage current is also a potential error source in divider voltage. The input offset voltage of an op amp is multiplied by
circuits. The leakage current must be counterbalanced by an the variable gain (due to the code-dependent output resistance
opposite current supplied from the op amp through the DAC. of the DAC) of the circuit. A change in this noise gain between
Since only a fraction D of the current into the VREF terminal is two adjacent digital fractions produces a step change in the
routed to the IOUT1 terminal, the output voltage has to change output voltage due to the amplifier’s input offset voltage. This
as follows: output voltage change is superimposed on the desired change in
output between the two codes and gives rise to a differential
Output Error Voltage due to DAC Leakage = (Leakage × R)/D linearity error, which, if large enough, could cause the DAC to
where R is the DAC resistance at the VREF terminal. For a DAC be nonmonotonic. In general, the input offset voltage should be
leakage current of 10 nA, R = 10 kΩ, and a gain (that is, 1/D) of 16, a fraction (approximately <1/4) of an LSB to ensure monotonic
the error voltage is 1.6 mV. behavior when stepping through codes.
VDD
VIN The input bias current of an op amp also generates an offset at
the voltage output as a result of the bias current flowing in the
RFB VDD feedback resistor, RFB. Most op amps have input bias currents low
IOUT1
VREF
enough to prevent any significant errors in 12-bit applications.
IOUT2
Common-mode rejection of the op amp is important in voltage
GND
switching circuits since it produces a code-dependent error at
the voltage output of the circuit. Most op amps have adequate
common-mode rejection at an 8-, 10-, or 12-bit resolution.
VOUT
Provided the DAC switches are driven from true wideband low
03162-048

impedance sources (VIN and AGND), they settle quickly.


ADDITIONAL PINS OMITTED FOR CLARITY. Consequently, the slew rate and settling time of a voltage switching
Figure 46. Current Steering DAC as a Divider or Programmable Gain Element DAC circuit is determined largely by the output op amp.
To obtain minimum settling time in this configuration, it is
important to minimize capacitance at the VREF of the DAC. This
is done by using low input capacitance buffer amplifiers and
careful board design. Most single-supply circuits include ground as
part of the analog signal range, which in turn requires an amplifier
that can handle rail-to-rail signals. There is a large range of
single-supply amplifiers available from Analog Devices.

Rev. H | Page 18 of 24
Data Sheet AD5426/AD5432/AD5443
Table 7. Suitable ADI Precision References
Part No. Output Voltage (V) Initial Tolerance (%) Temp Drift (ppm/°C) ISS (mA) Output Noise µV p-p Package
ADR01 10 0.05 3 1 20 SOIC-8
ADR01 10 0.05 9 1 20 TSOT-23, SC70
ADR02 5 0.06 3 1 10 SOIC-8
ADR02 5 0.06 9 1 10 TSOT-23, SC70
ADR03 2.5 0.10 3 1 6 SOIC-8
ADR03 2.5 0.10 9 1 6 TSOT-23, SC70
ADR06 3 0.10 3 1 10 SOIC-8
ADR06 3 0.10 9 1 10 TSOT-23, SC70
ADR431 2.5 0.04 3 0.8 3.5 SOIC-8
ADR435 5 0.04 3 0.8 8 SOIC-8
ADR391 2.5 0.16 9 0.12 5 TSOT-23
ADR395 5 0.10 9 0.12 8 TSOT-23

Table 8. Suitable ADI Precision Op Amps


0.1 Hz to 10 Hz
Part No. Supply Voltage (V) VOS (Max) (µV) IB (Max) (nA) Noise (µV p-p) Supply Current (µA) Package
OP97 ±2 to ±20 25 0.1 0.5 600 SOIC-8
OP1177 ±2.5 to ±15 60 2 0.4 500 MSOP, SOIC-8
AD8551 2.7 to 5 5 0.05 1 975 MSOP, SOIC-8
AD8603 1.8 to 6 50 0.001 2.3 50 TSOT
AD8628 2.7 to 6 5 0.1 0.5 850 TSOT, SOIC-8

Table 9. Suitable ADI High Speed Op Amps


Part No. Supply Voltage (V) BW @ ACL (MHz) Slew Rate (V/µs) VOS (Max) (µV) IB (Max) (nA) Package
AD8065 5 to 24 145 180 1,500 6,000 SOIC-8, SOT-23, MSOP
AD8021 ±2.5 to ±12 490 100 1,000 10,500 SOIC-8, MSOP
AD8038 3 to 12 350 425 3,000 750 SOIC-8, SC70-5
AD9631 ±2 to ±6 320 1,300 10,000 7,000 SOIC-8

Rev. H | Page 19 of 24
AD5426/AD5432/AD5443 Data Sheet
DB15 (MSB) DB0 (LSB)
SERIAL INTERFACE C3 C2 C1 C0 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0 X X X X

03162-049
The AD5426/AD5432/AD5443 have an easy to use 3-wire inter- CONTROL BITS DATA BITS

face that is compatible with SPI/QSPI/MICROWIRE and DSP Figure 47. AD5426 8-Bit Input Shift Register Contents
interface standards. Data is written to the device in 16 bit words. DB15 (MSB) DB0 (LSB)
This 16-bit word consists of 4 control bits and either 8 , 10 , or 12 C3 C2 C1 C0 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0 X X

03162-050
data bits as shown in Figure 47, Figure 48, and Figure 49. The CONTROL BITS DATA BITS
AD5443 uses all 12 bits of DAC data. The AD5432 uses 10 bits
Figure 48. AD5432 10-Bit Input Shift Register Contents
and ignores the 2 LSBs, while the AD5426 uses 8 bits and ignores
DB15 (MSB) DB0 (LSB)
the last 4 bits.
C3 C2 C1 C0 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0

03162-051
Low Power Serial Interface CONTROL BITS DATA BITS

To minimize the power consumption of the device, the interface Figure 49. AD5443 12-Bit Input Shift Register Contents
powers up fully only when the device is being written to, that is,
on the falling edge of SYNC. The SCLK and DIN input buffers SYNC Function
are powered down on the rising edge of SYNC. The SYNC of SYNC is an edge-triggered input that acts as a frame synchro-
the AD5426/AD5432/AD5443 needs to be synchronous with nization signal and chip enable. Data can be transferred into the
the microprocessor control. Unfinished data frames are latched device only while SYNC is low. To start the serial data transfer,
into the part and will affect the output. SYNC should be taken low observing the minimum SYNC
DAC Control Bits C3 to C0 falling to SCLK falling edge setup time, t4.
Control Bits C3 to C0 allow control of various functions of the Daisy-Chain Mode
DAC, as seen in Table 10. Default settings of the DAC on Daisy-chain is the default power-on mode. Note that the SDO
power-on are as follows: Data is clocked into the shift register line operates with a VDD of 3.0 V to 5.5 V. To disable the daisy
on falling clock edges and daisy-chain mode is enabled. Device chain function, write 1001 to the control word. In daisy-chain
powers on with zero-scale load to the DAC register and IOUT lines. mode, the internal gating on SCLK is disabled. The SCLK is
The DAC control bits allow the user to adjust certain features continuously applied to the input shift register when SYNC is
on power-on, for example, daisy-chaining may be disabled if low. If more than 16 clock pulses are applied, the data ripples
not in use, active clock edge may be changed to rising edge, and out of the shift register and appears on the SDO line. This data
DAC output may be cleared to either zero scale or midscale. is clocked out on the rising edge of SCLK (this is the default, use
The user may also initiate a readback of the DAC register the control word to change the active edge) and is valid for the
contents for verification purposes. next device on the falling edge (default). By connecting this line
to the DIN input on the next device in the chain, a multidevice
Table 10. DAC Control Bits interface is constructed. Sixteen clock pulses are required for
C3 C2 C1 C0 Function Implemented each device in the system. Therefore, the total number of clock
0 0 0 0 No operation (power-on default) cycles must equal 16 N where N is the total number of devices
0 0 0 1 Load and update in the chain. See the timing diagram in Figure 4.
0 0 1 0 Initiate readback
When the serial transfer to all devices is complete, SYNC
0 0 1 1 Reserved
should be taken high. This prevents any further data being
0 1 0 0 Reserved
clocked into the input shift register. A burst clock containing
0 1 0 1 Reserved
the exact number of clock cycles may be used and SYNC taken
0 1 1 0 Reserved
0 1 1 1 Reserved high some time later. After the rising edge of SYNC, data is
1 0 0 0 Reserved automatically transferred from each device’s input shift register
1 0 0 1 Daisy-chain disable to the addressed DAC.
1 0 1 0 Clock data to shift register on rising edge When control bits = 0000, the device is in no operation mode.
1 0 1 1 Clear DAC output to zero scale This may be useful in daisy-chain applications where the user
1 1 0 0 Clear DAC output to midscale does not want to change the settings of a particular DAC in the
1 1 0 1 Reserved chain. Simply write 0000 to the control bits for that DAC and
1 1 1 0 Reserved the following data bits will be ignored. To re-enable the daisy-
1 1 1 1 Reserved chain mode, if disabled, a power recycle is required.

Rev. H | Page 20 of 24
Data Sheet AD5426/AD5432/AD5443
Standalone Mode After the falling edge of the 16th SCLK pulse, data is auto-
After power-on, write 1001 to the control word to disable daisy- matically transferred from the input shift register to the DAC.
chain mode. The first falling edge of SYNC resets a counter that For another serial transfer to take place, the counter must be
reset by the falling edge of SYNC.
counts the number of serial clocks, ensuring the correct number
of bits are shifted in and out of the serial shift registers. A rising
edge on SYNC during a write causes the write cycle to be aborted.

Rev. H | Page 21 of 24
AD5426/AD5432/AD5443 Data Sheet

PCB LAYOUT AND POWER SUPPLY DECOUPLING


In any circuit where accuracy is important, careful consideration of Fast switching signals such as clocks should be shielded with
the power supply and ground return layout helps to ensure the digital ground to avoid radiating noise to other parts of the
rated performance. The printed circuit board on which the board and should never be run near the reference inputs.
AD5426/AD5432/AD5443 is mounted should be designed so Avoid crossover of digital and analog signals. Traces on opposite
that the analog and digital sections are separated and confined sides of the board should run at right angles to each other. This
to certain areas of the board. If the DAC is in a system where reduces the effects of feedthrough through the board. A micro-
multiple devices require an AGND-to-DGND connection, the strip technique is by far the best, but not always possible with a
connection should be made at one point only. The star ground double-sided board. In this technique, the component side of the
point should be established as close to the device as possible. board is dedicated to ground plane while signal traces are placed
The DAC should have ample supply bypassing of 10 µF in parallel on the solder side.
with 0.1 µF on the supply located as close to the package as It is good practice to employ compact, minimum lead length
possible, ideally right up against the device. The 0.1 µF capacitor PCB layout design. Leads to the input should be as short as
should have low effective series resistance (ESR) and effective possible to minimize IR drops and stray inductance.
series inductance (ESI), like the common ceramic types that
provide a low impedance path to ground at high frequencies to The PCB metal traces between VREF and RFB should also be
handle transient currents due to internal logic switching. Low matched to minimize gain error. To maximize on high frequency
ESR, 1 µF to 10 µF tantalum or electrolytic capacitors should performance, the I-to-V amplifier should be located as close to
also be applied at the supplies to minimize transient disturbance the device as possible.
and filter out low frequency ripple.

Rev. H | Page 22 of 24
Data Sheet AD5426/AD5432/AD5443

OVERVIEW OF THE AD5426/AD5432/AD5443 AND RELATED DACs


Table 11.
Part No. Resolution No. DACs INL (LSB) Interface Package Features
AD5424 8 1 ±0.25 Parallel RU-16, CP-20 10 MHz BW, 17 ns CS pulse width
AD5426 8 1 ±0.25 Serial RM-10 10 MHz BW, 50 MHz serial
AD5428 8 2 ±0.25 Parallel RU-20 10 MHz BW, 17 ns CS pulse width
AD5429 8 2 ±0.25 Serial RU-10 10 MHz BW, 50 MHz serial
AD5450 8 1 ±0.25 Serial RJ-8 10 MHz BW, 50 MHz serial
AD5432 10 1 ±0.5 Serial RM-10 10 MHz BW, 50 MHz serial
AD5433 10 1 ±0.5 Parallel RU-20, CP-20 10 MHz BW, 17 ns CS pulse width
AD5439 10 2 ±0.5 Serial RU-16 10 MHz BW, 50 MHz serial
AD5440 10 2 ±0.5 Parallel RU-24 10 MHz BW, 17 ns CS pulse width
AD5451 10 1 ±0.25 Serial RJ-8 10 MHz BW, 50 MHz serial
AD5443 12 1 ±1 Serial RM-10 10 MHz BW, 50 MHz serial
AD5444 12 1 ±0.5 Serial RM-8 50 MHz serial interface
AD5415 12 2 ±1 Serial RU-24 10 MHz BW, 50 MHz serial
AD5405 12 2 ±1 Parallel CP-40 10 MHz BW, 17 ns CS pulse width
AD5445 12 2 ±1 Parallel RU-20, CP-20 10 MHz BW, 17 ns CS pulse width
AD5447 12 2 ±1 Parallel RU-24 10 MHz BW, 17 ns CS pulse width
AD5449 12 2 ±1 Serial RU-16 10 MHz BW, 50 MHz serial
AD5452 12 1 ±0.5 Serial RJ-8, RM-8 10 MHz BW, 50 MHz serial
AD5446 14 1 ±1 Serial RM-8 10 MHz BW, 50 MHz serial
AD5453 14 1 ±2 Serial UJ-8, RM-8 10 MHz BW, 50 MHz serial
AD5553 14 1 ±1 Serial RM-8 4 MHz BW, 50 MHz serial clock
AD5556 14 1 ±1 Parallel RU-28 4 MHz BW, 20 ns WR pulse width
AD5555 14 2 ±1 Serial RM-8 4 MHz BW, 50 MHz serial clock
AD5557 14 2 ±1 Parallel RU-38 4 MHz BW, 20 ns WR pulse width
AD5543 16 1 ±2 Serial RM-8 4 MHz BW, 50 MHz serial clock
AD5546 16 1 ±2 Parallel RU-28 4 MHz BW, 20 ns WR pulse width
AD5545 16 2 ±2 Serial RU-16 4 MHz BW, 50 MHz serial clock
AD5547 16 2 ±2 Parallel RU-38 4 MHz BW, 20 ns WR pulse width

Rev. H | Page 23 of 24
AD5426/AD5432/AD5443 Data Sheet

OUTLINE DIMENSIONS
3.10
3.00
2.90

10 6 5.15
3.10 4.90
3.00 4.65
2.90 1
5

PIN 1
IDENTIFIER

0.50 BSC

0.95 15° MAX


0.85 1.10 MAX
0.75
0.70
0.15 6° 0.23
0.30 0.55
0.05 0° 0.13 0.40
COPLANARITY 0.15
0.10

091709-A
COMPLIANT TO JEDEC STANDARDS MO-187-BA

Figure 50. 10-Lead Mini Small Outline Package [MSOP]


(RM-10)
Dimensions shown in millimeters

ORDERING GUIDE
Model 1 Resolution (Bit) INL (LSB) Temperature Range Package Description Package Option Branding
AD5426YRM 8 ±0.25 −40°C to +125°C 10-Lead MSOP RM-10 D1Q
AD5426YRM-REEL7 8 ±0.25 −40°C to +125°C 10-Lead MSOP RM-10 D1Q
AD5426YRMZ 8 ±0.25 −40°C to +125°C 10-Lead MSOP RM-10 D6W
AD5426YRMZ-REEL 8 ±0.25 −40°C to +125°C 10-Lead MSOP RM-10 D6W
AD5426YRMZ-REEL7 8 ±0.25 −40°C to +125°C 10-Lead MSOP RM-10 D6W
AD5432YRMZ 10 ±0.5 −40°C to +125°C 10-Lead MSOP RM-10 D1R#
AD5432YRMZ-REEL 10 ±0.5 −40°C to +125°C 10-Lead MSOP RM-10 D1R#
AD5432YRMZ-REEL7 10 ±0.5 −40°C to +125°C 10-Lead MSOP RM-10 D1R#
AD5443YRM 12 ±1 −40°C to +125°C 10-Lead MSOP RM-10 D1S
AD5443YRM-REEL 12 ±1 −40°C to +125°C 10-Lead MSOP RM-10 D1S
AD5443YRM-REEL7 12 ±1 −40°C to +125°C 10-Lead MSOP RM-10 D1S
AD5443YRMZ 12 ±1 −40°C to +125°C 10-Lead MSOP RM-10 D1S#
AD5443YRMZ-REEL 12 ±1 −40°C to +125°C 10-Lead MSOP RM-10 D1S#
AD5443YRMZ-REEL7 12 ±1 −40°C to +125°C 10-Lead MSOP RM-10 D1S#
EV-AD5443/46/53SDZ Evaluation Board
1
Z = RoHS Compliant Part, # denotes RoHS compliant product may be top or bottom marked.

©2004–2015 Analog Devices, Inc. All rights reserved. Trademarks and


registered trademarks are the property of their respective owners.
D03162-0-9/15(H)

Rev. H | Page 24 of 24

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