Single Slit Diffraction

Aim:

To study the intensity distribution due to diffraction from single slit and to determine the slit
width (d).

Apparatus:
Optical bench, diode Laser, screen with a rectangular slit, photo cell, micro ammeter

Formula Used:

Slit width ‘ d’ is given by

2𝐷𝜆
d=
𝛽

where D = is the distance of screen from slit

λ = Wave length diode laser (650 nm)
β = width of central maxima

First minima on either side of Central maxima is given by condition for diffraction minima. viz,
d sin θ = m λ . with m = 1
Theory:
DIFFRACTION OF LIGHT:

Light travels in a straight line. However, when light passes through a small hole, there is
a certain amount of spreading of light. Similarly, when light passes by an obstacle, it appears to
bend round the edges of the obstacle and enters its geometrical shadow.
The phenomenon of bending of light around the corners of small obstacles or apertures and its
consequent spreading into the regions of geometrical shadow is called diffraction of light.
The effect of diffraction is more pronounced if the size of the aperture or the obstacle is of
the order of the wavelength of the light. As the wavelength of visible light (~ 10-6 m) is much
smaller than the size of the objects around us, so diffraction of light is not easily seen. On the

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other hand sound waves have large wavelength (~ 101 m) so sound waves easily exhibit
diffraction by the objects around us.
Here we study the Fraunh offer class of diffraction in which light source is at infinite
distance from obstacle, to ensure this source S of monochromatic light is placed at the focus of a
convex lens L1. A parallel beam of light and hence a plane wave front WW’ gets incident on a
narrow rectangular slit AB of width d.
The incident wave front disturbs all parts of the slit AB simultaneously. According to
Huygens theory all parts of the slit AB will become source of secondary wavelets, which all start
in same phase. These wavelets spread out as rays in all directions, thus causing diffraction of light
after it emerges through slit AB. Suppose the diffraction pattern is focused by a convex lens L2 on
a screen placed in its focal plane.

Figure 1 Diffraction through single slit

Calculation of path difference:

Suppose the secondary wavelets diffracted at an angle are focused at point P. The secondary
wavelets start from different parts of the slit in same phase but they reach point P in different phases.
The path difference (p) b/w the wavelets from A & B will be
p = BP-AP = BN = AB sin = d sin θ
Central Maxima:
All the secondary wavelets going straight across the slit AB are focused at the central point O of
the screen. The wavelets from any two corresponding points of the two halves of the slit reach the
point O in the same phase, they add constructively to produce a central bright fringe, whose width
is decided by the first minima on either side.
Positions of minima:
Let the point P be so located on the screen that the path difference p = λ and the angle be θ1.
Then from the above equation, we get .

d sin θ1 = λ
we can divide the slit AB into two halves AC & CB. Then the path difference b/w the wavelets
from A & C will be λ/2. Similarly corresponding to every point in the upper half AC, there is a

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point in the lower half CB for which the path difference is λ/2. Hence they interfere destructively
so as to produce a minimum.
Thus the condition for first minima is
d sin θ1 = λ
similarly the condition for second minima is
d sin θ2 = 2λ
Hence the condition for nth minima can be written as
d sin θn = nλ

Now lets calculate the width of central maxima

The directions of 1st minima on either side of central maximum are given by
𝜆
θ1 ≈ sin θ1 = 1. …………………(1)
𝑑
Angle θ1 is called half angular width of central maximum.
2𝜆
⸫ Angular width of central maximum 2 θ1 =
𝑑

If D is the distance of the screen from the single slit, For the lens L2 kept close to the slit D ≈ f 2
then the linear width of central maximum will be
2𝐷𝜆
β = D * 2 θ1 = …………. (2)
𝑑

Intensity of secondary maxima decreases with the order of the maximum. The reason is that the
intensity of the central maximum is due to the constructive interference of wavelets from all parts
of the contribution of wavelets form one third part of the slit (wavelets from remaining two parts
interfere destructively), the second secondary maximum is due to the contribution of wavelets from
the one fifth part only (the remaining four interfere destructively) and so on. Hence the intensity of
secondary maximum decreases with the increase in the order ‘n’ of the maximum.

Figure 2 Diffraction pattern obtained through single slit

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Set-up and Procedure

1. Switch on the laser source about 15 minutes before the experiment is due to start. This ensures
that the intensity of light from the laser source is constant.

2. Allow the laser beam to fall on a slit formed in the screen provided. The photo detector is secured
to a mount and is kept as far behind the slit as possible.

3. Try to observe the diffraction pattern by putting a screen (paper) in front of photo detector. After
getting diffraction pattern on the screen (paper) remove it.

4. Adjust the position of photo detector somewhere around second minima & keep on recording the
current with the position of photo detector moving it towards central maxima and continue in same
direction till second minima on other side is obtained. The intensity distribution of the diffraction
pattern is measured with the help of a photo detector connected to a microammeter.

5. Measure the distance between slit & photo detector.

6. Plot a graph (position of detector) vs (current). It will be of shape shown in fig(3). Now measure
the distance (β) between two first minima on either side of central maxima from graph. This is the
width of central maxima ‘β’. Now calculate width of slit using eq (2).

Observation table

Wave length diode laser λ=650 nm

Position of Slit (a)= ….. cm
Position of detector on bench (b)=…….

Table 1:
S.No. Lateral Position of the Current in ammeter
detector (cm) ( amp)
1
2
3
..
..
..
..

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 Table 2:
S.No. Distance between two first Distance between the Slit width
minimum on either side of detector & slit (microns)
central maxima (β in cm) 𝟐𝑫𝝀
D =(a-b) in cm d=
from the graph 𝜷

Result:

1. The intensity distribution due to diffraction at a single slit was studied.

2. The width of central maxima ‘β’=……mm
3. The width of the single slit is……..microns.

Precautions:
1. The laser beam should not penetrate into eyes as this may damage the eyes permanently.
2. The photo detector should be as away from the slit as possible.
3. The laser should be operated at a constant voltage 220V obtained from a stabilizer. This avoids
the flickering of the laser beam.
4. Laser should be started at least 15 minutes before starting the experiment.
5. Scale of vernier should be rotated slowly.

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