Brochure Jasco V-700 Series LQ
Brochure Jasco V-700 Series LQ
Spectrophotometers
V-700 Series
Performance
Innovation
Reliability
2
For scientists performing spectral characterization, thermodynamic
studies, and quantitative measurements for advanced bio- and
materials research, who need confidence in the accuracy and
reproducibility of their measurements and rely on the results. The
V-700 Series UV-Visible/NIR spectrophotometers provides an
excellent optical system with wide wavelength range for a diverse
array of applications.
The V-700 Series comprises five distinct models covering the entire
spectrum from the far-UV (187 nm) to the near-IR(3200 nm). The compact
optical design of the V-700 Series UV-Visible spectrophotometers
significantly reduces the requirement for bench space in the modern
laboratory.
Table of Contents
Instrument and Systems
Instrument Features 4
Accessories and Applications
Temperature Control 10
Ambient Accessories 13
Micro Volume 14
Optical Fiber Units 15
Integrating Spheres 16
Absolute Reflectance 18
Specular Reflectance 19
Autosampler, Sippers & Flow Cells 20
Software and Accessories
Spectra Manager™ 22
Standard Measurement Programs 24
Optional Programs 26
iRM-1000 30
Specifications 31
3
Common Features
of the V-700 Series
Compact Design
The compact design of the V-700 Series UV-Visible spectrophotometers significantly reduces the
requirement for bench space in the modern laboratory.
Dark Correction
Stray light reduction features that enable accurate measurement of strongly absorbing samples.
User-Friendly Operation
Spectra Manager™ Suite for Windows and iRM hand-held controller for comprehensive control, acquisition
and data processing. 21 CFR part 11 compliance is available for PC.
IQ Start
For routine operation a measurement can be made from a simple push of the ‘Start Button’, great for
speeding up measurement, and for multiple users.
Regulatory Compliance
All models can be used in GxP compliant laboratories, a comprehensive validation to USP, EP and JP is
included as standard. Installation and Operational Qualification (IQ, OQ) are available for installation and
maintenance.
4
V-730 UV-Visible
Spectrophotometer
The V-730 is a general-purpose double-
beam spectrophotometer with a compact
space-saving design. Its excellent
spectroscopic performance is suitable
for routine QC, teaching and research
applications.
System Features
• Double-beam spectrophotometer with single • Fixed spectral bandwidth 1.0 nm for high
monochromator and silicon photodiode resolution measurement
detectors • High-speed scanning up to 8,000 nm/min
• Compact with dimensions of only 440 (W) x 470 • Stray light 0.02% for exceptional absorbance
(D) x 215 (H) mm. linearity up to 3 Abs
• Wide wavelength range – 190 to 1100 nm
With an optimal balance between light intensity, signal to noise and resolution, with fast response and rapid
monochromator slew speed, the V-730 can be used with a wide range of sampling accessories and optional
programs for a broad range of analyses.
3
― 57.750 mg/L 3.5
― 48.125 mg/L
― 38.500 mg/L y = 0.0499x
3
― 28.875 mg/L R2 = 0.9999
― 19.250 mg/L
2 ― 9.625 mg/L
― Solvent
2
Abs
Abs
1
1
0 0
230 240 260 280 300 320 0 20 40 60
Wavelength [nm] mg/L
The dedicated V-730BIO has been designed specifically for applications in Life Sciences. Comprising a
V-730, with either Spectra Manager™ or an intelligent Remote Module (iRM) for biological and clinical analysis,
and a micro cell holder. Bio-analytical application programs included are: protein/nucleic acid measurement,
temperature ramping/DNA melting analysis, kinetics measurement with advanced analysis, and quantitative
protein analysis with six different calibration methods.
5
V-750 UV-Visible
Spectrophotometer
High resolution UV-Visible
spectrophotometer with
double-beam, single
monochromator.
The V-750 UV-Vis spectrophotometer
includes a precision double-beam
optical system with variable spectral
bandwidth. A high sensitivity PMT
detector provides accurate and
reproducible measurements for low to high
absorbing samples. By controlling the high voltage applied
to the PMT, the dynode feedback offers a wider dynamic range than is
generally found in UV-Visible spectrophotometers. For high resolution measurements, such as gas and vapor
phase spectroscopy, the spectral bandwidth can be set as narrow as 0.1 nm. Special low stray light slit settings
which optimize the light image on the grating provide increased linearlity up to 4 Abs. units.
• Double-beam spectrophotometer with single The V-750 can be used with any absorbance,
monochromator transmittance or reflectance measurements in the
• High sensitivity PMT detector UV-Visible region, including liquids, solids and
• Wide wavelength range – 190 to 900 nm with options for specular, absolute and diffuse
• Variable spectral bandwidth reflectance.
• High-speed scanning up to 4,000 nm/min
(Scanning speed in Preview Mode is 8,000 nm/min)
• Stray light 0.005%
4
6
V-760 UV-Visible
Spectrophotometer
High resolution UV-Visible double-beam
spectrophotometer with double monochromator
for Photometric Linearity to greater than 6 Abs.
The V-760 double beam, double monochromator optical design with lowest stray light (0.00008 %) offers
high absorbance linearity across the entire photometric range. The V-760 can measure up to 6 Abs in the
UV-Visible region (and up to 8 Abs in the visible region*). Variable spectral band width can be set down to
0.1 nm with special height slits to further reduce stray light and absorbance linearity is made even higher
with rear beam attenuation.
*Measurement of KMnO4 solution.
System Features Measurement in the Far UV to 187 nm
• Double-beam spectrophotometer with double The lower stray light optical design enables
monochromator measurement in the UV down to 187 nm without N2
• High sensitivity PMT detector purging. The transmittance spectra of three optical
• Wide wavelength range – 187 to 900 nm materials - quartz, sapphire and BK-7 measured
• Variable spectral bandwidth using the FLH-741 film holder are shown below.
• Low stray light 0.00008 %
• High-speed scanning up to 4,000 nm/min
(Scanning speed in Preview Mode is 8,000 nm/min) 100
%T
absorbance, transmittance or reflectance in the
UV-Visible region, including liquids, solids and with 40
Step-Scan Measurement 0
187 300 400
5
R2=0.9999 R2=0.9999
4 4
Abs Abs
3
2 2
0 0
187 400 600 800 900 0 5 10 15 20 25 30 35
Wavelength [nm] Concentration (mg/L)
Spectra of Various Solutions measured by V-760 Calibration Curves of Ranitidine Hydrochloride and NiSO4
(Green: Ranitidine hydrochloride, Yellow: Aluminium Lake,
Orange: Amaranth, Blue: Indigocarmine, Pink: NiSO4)
7
V-770 UV-Visible/NIR
Spectrophotometer
Single monochromator, dual gratings and
PbS detector for wide wavelength in the
NIR region up to 3200 nm.
T h e V-770 o f f e r s t h e u n i q u e b e n e f i t o f s i n g l e
monochromator for higher optical throughput compared
to double monochromated systems. This is especially useful
for diffuse and specular reflectance measurements in the NIR
where signal to noise can be a problem.
System Features
• Double-beam spectrophotometer with single • Variable spectral bandwidth
monochromator • High-speed scanning up to 4,000 nm/min
• High sensitivity PMT and PbS detectors (Scanning speed in Preview Mode is 8,000 nm/min)
• UV-Visible and NIR optimized gratings • Stray light 0.005% (UV-Visible) to 0.04% and 0.1%
• Wide wavelength range PbS detector (NIR)
• Wide wavelength range – 190 to 2700 nm
(3200 nm as option)
The V-770 can be used with most absorbance, transmittance or reflectance measurement in the UV-Visible to
NIR region, including liquids, solids and with options for specular absolute and diffuse reflectance.
0
200 1000 2000 3000 3200
Wavelength [nm]
8
V-780 UV-Visible/NIR
Spectrophotometer
Single monochromator, dual
gratings and InGaAs detector
for enhanced sensitivity in the
NIR region up to 1600 nm.
The V-780 has the same unique benefit as the V-770
of a single monochromator for higher optical throughput, but
also has improved sensitivity from the InGaAs detector with better
response in the NIR.
System Features
• Double-beam spectrophotometer with single • Variable spectral bandwidth
monochromator • High-speed scanning up to 4,000 nm/min
• High sensitivity PMT and InGaAs detectors (Scanning speed in Preview Mode is 8,000 nm/min)
• UV-Visible and NIR optimized gratings • Stray light 0.005% (UV-Visible) to 0.04% (NIR)
• Wide wavelength range – 190 to 1600 nm
The V-780 can be used with most absorbance, transmittance or reflectance measurements in the UV-Visible
to NIR region, including liquids, solids and with options for specular, absolute and diffuse reflectance in a
narrower wavelength range than the V-770 but with higher sensitivity.
The figure (below) compares a 1.3 μm band cutoff filter The figures (below) show the vibrational NIR spectrum
for optical communication measured using the V-770 of CO2 gas (pathlength: 100 mm), measured using the
with a Peltier-cooled PbS photo-conductive detector V-780. Overtones are seen near 1430 nm. Zooming in
and the V-780 with a Peltier-cooled InGaAs photodiode shows that the V-780 has excellent resolution for
detector. The V-780 offers significantly increased S/N. observing the rotational peaks in the vibrational
spectrum.
0.1 99
― V-770
0.08 ― V-780
98
0.06
%T %T 97
0.04
100 100
96
80 0.02
60
0 95 95
%T %T 1435 1440 1445 1450
1200 1250 1300 1350 1400
Wavelength [nm]
40
Wavelength [nm]
20
90
0
850 1000 1200 1400 1600 1400 1450 1500 1550 1600
Wavelength [nm] Wavelength [nm]
Temperature Control
Specifications
Model PSC-763 PAC-743 PAC-743R
Temperature Control System Heating/cooling system with Peltier effect (PAC-743R includes temperature controlled reference cell) PSC-763
Heat Radiating System Air cooled Water cooled
Temperature Accuracy With cell holder sensor: ±0.5°C (20 to 40°C), ±1°C (other temp range)
* A tempererature sensor will be included in a standard configuration.
PAC-743
PAC-743R
10
Peltier Thermostatted Single Cell Holders
EHCS-760 | Single Position Cuvette (Air-Cooled)
Specifications
Model EHCS-760 ETCS-761 ETCR-762
Temperature Control Range 10 to 60°C (at 25°C) 0 to 100°C (for cooling water temperature at 20°C)
With cell holder sensor: ±0.5°C (20°C to 40°C), ±1°C (other temp. range)
Temperature Accuracy
With optional temp. sensor: ±0.2°C
* A tempererature sensor will be included in a standard configuration.
ETCS-761
Options
Sample Masks and cell-height adjustment for the cell position (a 2 mm path width micro cell can be used to measure sample
Cell Mask Kit
with a min. 100 µL volume.
For cells with an optical path length of 1, 2 and 5 mm. (P/N: 6939-0501PB for 2 mm cell, 6916-6018PB for 2 mm cell and
Cell Spacers
6916-6019PA for 5 mm cell)
ETCR-762
11
ACCESSORIES
Temperature Control
Specifications
Model STR-773 HMC-711 MHT-745 NCP-706 HMC-711
Rectangular cells: 10x10,
Rectangular cells:
Rectangular cells: 10x5, 2x10, 4x10, 2x5 mm Rectangular cells: 10x10,
Compatible Cells 10x10, 4x10, 2x10
10x10, 4x10, 2x10 mm (50 µL minimum sample 4x10, 2x10 mm
mm
volume)
NCP-706
Temperature Sensor/Control
±0.2°C / ±0.5°C (at 20°C)
Accuracy
CSP-909
. | Optional Sample Compartment Lid with Syringe Port
Used for fast reaction to inject a reaction initiator into the cuvette without opening
the sample chamber lid. Can only be used with a 10x10 mm rectangular cell and
requires a syringe with 2 inch (50 mm) needle.
.
Compatible with the following cell holders: STR-773, EHCS-760, ETCS-761, ETCR-762 CSP-909
12
used only with V-730 V-730
ACCESSORIES used only with V-730BIO V-730BIO
used only with V-750 V-750
Cylindrical cells,
Rectangular cell, Rectangular cell, Rectangular cell, Rectangular cell, Φ22 or 30 mm
Reference pathlength 10, 20, pathlength 10, 20, pathlength 10 pathlength 10 mm, pathlength 10, 20, SSE-704
50 or 100 mm, 1 pc 50 or 100 mm, 1 pc or 20 mm, 1 pc 1 pc 50 or
100 mm, 1 pc
Minimum Sample Size 15 (H) x 15 (W) x 0.5 (t) mm 5 (H) x 5 (W) x 0.5 (t) mm
Maximum Sample Size 80 (H) x 100 (W) x 10 (t) mm 80 (H) x 100 (W) x 25 (t) mm
CYH-708
Model RSH-744
Angle of Rotation Optical axis: 360°, Perpendicular to the optical axis: ±50°
FLH-741
Model VTA-752
13
ACCESSORIES
Micro Volume
UCB-710
SAH-769 | One Drop Measurement Unit
For high-speed measurement of micro-volumes of proteins and nucleic acids. 1 mm and
0.2 mm pathlengths with sample volumes of 5 and 0.6 μL, respectively.
SAH-769
50 µL 5 µL Micro
Micro Cell Cell Spacer EMC-709
5 µL Micro Cell
EMC-759
14
Optical Fiber Units
FAP-927
15
ACCESSORIES
Integrating Spheres
Sample Cell (Transmittance) Rectangular cell 5, 10, 20, 30 and 50 mm path length
Optional Holders
PSH-002
PSH-002 | Powder Sample Holder
For diffuse reflectance measurements of powder samples. Sample: 16 mm dia., thickness: 0.5-6 mm
Optional Holders
16
used only with V-730 V-730
ACCESSORIES AND APPLICATIONS used only with V-730BIO V-730BIO
used only with V-750 V-750
Sample Cell (Transmittance) Rectangular cell 5, 10, 20, 30 and 50 mm path length
Reference Cell (Transmittance) Rectangular cell 5, 10, 20 mm path length. Reference cell block is optional.
Optional Holders
HISV-728
*It is necessary to choose an optional fiber from followings for operating HISV-728 and HISN-729.
Optional Accessories
17
ACCESSORIES
Absolute Reflectance
ARV-913/ARN-914/ARN-915i | Absolute Reflectance Measurement (Manual Synchronous Type)
The ARV and ARN accessories are used for absolute reflectance measurements with manual, synchronous
movement of the sample stage and detector. The angle of incident of the sample and the detector positions
are moved simultaneously, the absolute reflectance of the sample can be measured at varied incident angles.
Model ARV-913 ARN-914 ARN-915i ARSV-916 ARSN-917 ARSN-918i ARMV-919 ARMN-920 ARMN-921i
Wavelength Range 250-850 mm 250-2000 mm 250-1600 mm 250-850 mm 250-2000 mm 250-1600 mm 250-850 mm 250-2000 mm 250-1600 mm
Measurement Mode Absolute reflectance, Relative reflectance Absolute reflectance, Relative reflectance, Transmittance
Absolute reflectance mode: Max. 70 (H) x 100 (W) x 10 (t) mm 70 (H) x 70 (W) x 10 (t) mm
Sample Size
Relative reflectance mode: Min. 20 (H) x 20 (W) x 0.5 (t) mm
Relative reflectance mode: Max. 70 (H) x 100 (W) x 10 (t) mm 70 (H) x 70 (W) x 10 (t) mm
Optional Accessories
18
ACCESSORIES AND APPLICATIONS
Specular Reflectance
Reflectance Measurement
SLM-907/SLM-908 | Spectacular Reflectance Accessory
Measure the relative specular reflectance of a sample using an aluminum-deposited
plane mirror as a reference. The SLM can be used to measure the reflectance and
thickness of metal-deposited films. The SLM-908 can measure larger samples such as 6
inch silicon wafers.
Specifications
SLM-907
Model SLM-907 SLM-908
V-770 200-2500 nm
V-780 200-1600 nm
Optional Accessories
DPL-515
19
ACCESSORIES
Dust Cover
ASU-800 protective cover.
Dust Cover
Reproducibility of Volume
Within ±1%
Delivery
ASP-849
20
used only with V-730 V-730
used only with V-730BIO V-730BIO
used only with V-750 V-750
used only with V-760 V-760
used only with V-770 V-770
.
SFC-712
LFC-713
MFC-714
FIC-715
AWU-828
ASU-800 with NPF-782 Peristaltic Sipper ASU-800 with ASP-849 Syringe Pump ASU-800 with NQF-930 Vacuum Sipper
and SFC-712 Micro Flow Cell
21
Spectra Manager™
Software Suite
Instrument Control
Spectra Manager™ includes control of a wide range of
instruments with easy to edit parameter files and data
processing functions. Data acquired from the instrument
is automatically loaded into an analysis program to free
up the PC and control software to acquire further data
during post-acquisition processing. Each instrument also
has its own range of dedicated applications for analysis,
instrument diagnostics and validation.
Flexible Display Features
User-friendly features include flexible customization of the
GUI, user-adaptable toolbars and sophisticated handling of
spectral and time course data in two- and three- dimensions.
Data Processing and Spectral Analysis
View and process the different types of measurement
data (UV-Visible/NIR, FTIR, Fluorescence, CD) in a single
window, using a comprehensive range of data processing
functions. Features include instrument specific corrections
and analysis, arithmetic operations, derivatives, peak
detection, smoothing, and baseline correction.
22
A SINGLE PLATFORM FOR
EVERY INSTRUMENT.
JASCO is the only manufacturer to have developed a single, cross-platform 64-bit Windows
software package for operating a wide range of spectroscopic instrumentation. Spectra Manager™
is a comprehensive lab companion for designing experimental measurement and processing data,
eliminating the need to learn multiple software programs and allowing data from more than one
instrument to be displayed and analyzed together on the same computer.
23
SOFTWARE SUITE
Standard Measurement
Programs
Spectra Measurement
Measures the absorbance, transmittance, or reflectance
spectrum of a sample. Sequential measurements can
also be made on multiple samples, each of which can
be assigned different measurement parameters. A
customizable flowchart can be used to automate the flow
of measurement, data processing, saving and reporting
functions.
Quantitative Measurement
Create a calibration curve using the absorbances of
standards with known concentrations, and then use the
absorbance for samples with unknown concentrations to
interpolate the concentration from the calibration curve.
Several quantitation methods are included. The calibration
curve can be constructed using linear or polynomial fitting
with linearity criteria and 'goodness of fit' statistics.
24
Abs/%T Meter
The photometric value in absorbance or transmittance is
displayed in analog, digital, or graphical modes.
Validation
Check the functional performance of a UV-Visible/NIR
spectrophotometer using a variety of inspection methods,
including those required by regulatory compliance. These
include wavelength accuracy and repeatability, photometric
accuracy and repeatability, resolution, stray light, noise
level, and baseline stability and flatness.
Daily Check
This simple performance check of the spectrophotometer
can be made regularly by measuring the absorbance
spectrum of a holmium standard supplied with the
instrument. The statistics are accumulated over a period of
time to monitor and ensure continuous optimal operation.
25
Optional Programs
26
Reflectance Measurement VWAP-794 | Phase Difference Spectra VWAP-791 | Multi-Layer Film Thickness
Measurement Analysis
VWAM-968 | Absolute Reflectance Automatically measure transmittance Use a reflectance spectra and select
Spectra Measurement and reflectance phase difference spectra a multilayer model to calculate the
Measure reflectance and transmittance with multiple incident angles using refractive index (n), extinction coefficient
spectra by setting the incidence and an automated absolute measurement (k), and layer thickness (d) of unknown
detection angles. For reflectance accessory. The spectrum can be layer(s) using a least squares method.
measurements, the incident angle can measured by rotation of either polarizer or Standard libraries are included for metals,
be set from 5 to 85º and from 0 to 85º analyzer. semiconductors and insulators. The user
for transmittance measurements. S- (0º), *This program is included in PDU-926 as can also create their own library.
P- (90º), or N- (45º) polarization can be set standard. *Absolute Reflectance Measurement Unit
for the incident light. is required.
*This program is included in ARMV-919, Material Analysis VWBG-773 | Band Gap Calculation
ARMN-920 and ARMN-921i as standard.
Calculate the band gap of a
VWSD-961 | Spectrum Diagnosis
VWAS-969 | Absolute Reflectance with semiconductor sample from its spectrum.
Perform data processing with pass/fail )
Variable Incident Angle Measurement The following calculation methods can be
evaluation on a measured spectrum
Measures the angular dependence of the selected:
based on photometric values at a
reflectance and transmittance spectra by - Direct transition: allowed
specified wavelength, full width at half
setting the incident and detection angles, - Direct transition: forbidden
maximum, peak photometric values,
for up to 20 wavelengths. For reflectance - Indirect transition: allowed
peak wavelengths etc. Sequential
measurements, the incident angle can - Indirect transition: forbidden
measurements can also be carried out on
be set from 5 to 85º and from 0 to 85º multiples samples, each of which can be
for transmittance measurements. S- (0º), assigned different sample measurement
P- (90º), or N- (45º) polarization can be set parameters.
for the incident light.
*Absolute Reflectance Measurement Unit
is required.
*This program is included in ARMV-919,
ARMN-920 and ARMN-921i as standard in
V-700 series.
27
Optional Programs
28
VWAC-769 | ASTM Color Analysis Solar Measurement and Sun VWAC-796 | UV Shield Factor
Calculate the sum of the tristimulus values Calculation
(X, Y, Z) and optical density from a sample Protection Calculate the UV shield factor for a
absorbance, reflectance, or transmittance specified wavelength range from a
spectrum and obtain the ASTM color. VWST-964 | Solar Transmittance/ transmittance, reflectance, or absorbance
The ASTM color, sum of optical densities, Reflectance Measurement spectrum. A maximum of five wavelength
and tristimulus values are all reported. Measure the spectral transmittance and ranges can be specified.
The ASTM color analysis can only be reflectance of a sample and calculates
performed in the wavelength range the solar reflectance, transmittance,
between 380 to 780 nm. and absorptance, as well as the light Haze and Turbidity
transmittance, reflectance etc. Measurement
VWSC-794 | Saybolt Color Analysis *V-770 only. Integrating sphere is
Calculate the Saybolt color of a sample required. VWWQ-953 | Chromaticity/Turbidity
spectrum for wavelengths between 380 Measurement
to 780 nm, according to the XYZ color VWSP-966 | SPF/PA Calculation Measure the absorbance or transmittance
system described by the International Using an integrating sphere, this of a sample in order to determine its
Commission on Illumination (CIE). application is used for evaluating the chromaticity or turbidity. The turbidity can
criteria the sun protection factor (SPF) and also be measured using an integrating
VWLU-963 | Luminous Color PA for sunscreens and cosmetics sphere in order to evaluate both
Measurement *requires an integrating sphere and SPF transmitted and scattered light.
Measure the luminescence spectrum cell
for a sample and calculate its VWHZ-965 | Sample Haze Calculation
chromaticity using the Luminous Color VWUP-967 | UPF Measurement Using an integrating sphere, the
Analysis program, pass/fail criteria Used to measure the transmittance of measured total luminous transmittance
can also be included. To correct for a sample to calculate the ultraviolet and diffuse transmittance spectra are
the spectrophotometer’s instrument protection factor (UPF), UPF rating, UVA used to calculate haze. Criteria can be
characteristics (i.e. wavelength-dependent transmittance and blocking, and UVB specified to perform a pass/fail evaluation.
grating efficiencies and detector transmittance and blocking according to a *cannot be used with a V-730, requires an
sensitivities), spectral correction can be variety of standards. 150 mm dia. integrating sphere
made using a standard light source. *cannot be used with a V-730, requires an
*not for use with the V-730. External light integrating sphere
source interface and calibrated reference
source are required.
29
iRM-1000
Intelligent Remote Module
Standard Analysis Programs for iRM Optional Programs for the iRM-1000
Spectra Analysis VRBP-790 | Bio Package
Enzymatic Reaction Rate Calculation Includes: Protein Nucleic Acid Measurement, Kinetics
Color Analysis Analysis, Temperature Control Measurement, and DNA
Film thickness Melting Analysis.
30
Specifications
Model V-730 V-750 V-760 V-770 V-780
Rowland off-circle Czerny-Turner mount Czerny-Turner mount Czerny-Turner mount Czerny-Turner mount
arrangement Single monochromator Double monochromator Single monochromator Single monochromator
Optical System
Single monochromator Fully symmetrical double Fully symmetrical double Fully symmetrical double Fully symmetrical double
Double beam type beam type beam type beam type beam type
Light Source Halogen lamp, Deuterium lamp (Light source exchange wavelength: Any wavelength between 330 and 350 nm can be selected)
Photomultiplier tube
Photomultiplier tube
Detector Silicon photodiode Photomultiplier tube Peltier cooled InGaAs
Peltier cooled PbS
photodiode
190 to 2700 nm
Wavelength Range 190 to 1100 nm 190 to 900 nm 187 to 900 nm 190 to 1600 nm
(3200 nm, option)
Scanning Speed 10 to 8000 nm/min 10 to 4000 nm/min (8000 nm/min in preview mode)
UV-Vis: UV-Vis:
Spectral Bandwidth 0.1, 0.2, 0.5, 1, 2, 5, 10 nm 0.1, 0.2, 0.5, 1, 2, 5, 10 nm
(SBW) L2, L5, L10 nm L2, L5, L10 nm
0.1, 0.2, 0.5, 1, 2, 5, 10 nm
L: M1, M2 nm M1, M2 nm
1.0 nm fixed L2, L5, L10 nm
Low Stray Light Mode M1, M2 nm
NIR: NIR:
M: 0.4, 0.8, 2, 4, 8, 20, 40 nm 0.2, 0.4, 1, 2, 4, 10, 20 nm
Micro Cell Mode L8, L20, L40 nm L4, L10, L20 nm
M4, M8 nm M2, M4 nm
RMS Noise *1 0.00004 Abs 0.00003 Abs 0.00003 Abs 0.00003 Abs 0.00003 Abs
Baseline
±0.0005 Abs *2 ±0.0002 Abs *3 ±0.0003 Abs *4 ±0.0002 Abs *5 ±0.0002 Abs *6
Flatness
Baseline
±0.0004 Abs/hour *7 ±0.0003 Abs/hour *8
Stability
1 % (198 nm KCl 12 g/L)
0.005 % (220 nm NaI 10 g/L) 1 % (198 nm KCl 12 g/L)
1 % (198 nm KCl 12 g/L)
1 % (198 nm KCl 12 g/L) 1 % (198 nm KCl 12 g/L) 0.005 % (340 nm NaNO2 0.005 % (220 nm NaI 10 g/L)
0.00008 % (220 nm NaI
0.02 % (220 nm NaI 10 g/L) 0.005 % (220 nm NaI 10 g/L) 50 g/L) 0.005 % (340 nm NaNO2
10 g/L)
0.02 % (340 nm NaNO2 0.005 % (340 nm NaNO2 0.005 % (370 nm NaNO2 50 g/L)
0.00008 % (340 nm NaNO2
50 g/L) 50 g/L) 50 g/L) 0.005 % (370 nm NaNO2
Stray Light 50 g/L)
0.02 % (370 nm NaNO2 0.005 % (370 nm NaNO2 Aqueous solution, SBW: 50 g/L)
0.00008 % (370 nm NaNO2
50 g/L) 50 g/L) L2 nm Aqueous solution, SBW:
50 g/L)
Aqueous solution, SBW: Aqueous solution, SBW: 0.04 % (1420 nm: H2O) L2 nm
Aqueous solution, SBW:
1.0 nm L2 nm 0.1 % (1690 nm: CH2Br2 50 0.04 % (1420 nm: H2O)
L2 nm
mm cell) SBW: L4 nm
SBW: L8 nm
Power
120 VA 150 VA 150 VA 150 VA 150 VA
Requirements
*1: 0 Abs, wavelength: 500 nm, measurement time: 60 sec, response: medium, SBW: 1 nm (V-730), 2 nm (V-750, 760, 770, 780)
*2: Value obtained more than two hours after turning on the light source, when the room temperature is stabilized, wavelength: 200 to 1000 nm, response: Slow and wave-
length scanning speed: 400 nm/min with smoothing processing
3: Value obtained more than an hour after turning on the light source, when the room temperature is stabilized, wavelength: 200 to 850 nm, response: Slow, SBW: 2 nm
and wavelength scanning speed: 400 nm/min with smoothing processing
*4: Value obtained more than an hour after turning on the light source, when the room temperature is stabilized, wavelength: 200 to 800 nm, response: Slow, SBW: 2 nm,
wavelength scanning speed: 400 nm/min with smoothing processing
*5: Value obtained more than an hour after turning on the light source, when the room temperature is stabilized, wavelength: 200 to 2500 nm (200 to 850nm: SBW 2 nm,
850 to 2500 nm: SBW 8 nm), response: Slow, wavelength scanning speed: 400 nm/min with smoothing processing
*6: Value obtained more than an hour after turning on the light source, when the room temperature is stabilized, wavelength: 200 to 1600 nm (200 to 850 nm: SBW 2 nm,
850 to 1600 nm: SBW 4 nm), response: Slow, wavelength scanning speed: 400 nm/min with smoothing processing
*7: Value obtained more than two hours after turning on the light source, when the room temperature is stabilized, wavelength: 250 nm, response: slow
*8: Value obtained more than an hour after turning on the light source, when the room temperature is stabilized, wavelength: 250 nm, response: slow and SBW: 2 nm
*The contents of this brochure are for reference and illustrative purposes only. Information, descriptions, and specifications in this publication are subject to change without
notice. JASCO assumes no responsibility and will not be liable for any errors or omissions contained herein or for incidental, consequential damages or losses in connec-
tion with the furnishing, performance or use of this material.
31
JASCO INTERNATIONAL CO., LTD.
11-10, Myojin-cho 1-chome, Hachioji, Tokyo 192-0046, Japan
Tel: +81-42-649-3247 Fax: +81-42-649-3518 http://www.jascoint.co.jp/english/
Australia, Hong Kong, India, Indonesia, Korea, Malaysia, New Zealand,
Pakistan, Philippines, Russia, Singapore, Taiwan, Thailand, Vietnam
JASCO INCORPORATED
28600 Mary’s Court, Easton, Maryland 21601, U.S.A.
Tel: +1-410-822-1220 Fax: +1-410-822-7526 Web: www.jascoinc.com
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Paraguay, Peru, Puerto Rico, United States of America, Uruguay, Venezuela ISO
JASCO EUROPE S.R.L. 9001
Certified
Via Luigi Cadorna 1, 23894 Cremella (LC), Italy
Tel: +39-039-9215811 Fax: +39-039-9215835 Web: www.jascoeurope.com
JASCO Deutschland www.jasco.de | JASCO UK www.jasco.co.uk | JASCO France www.jascofrance.fr
JASCO Benelux www.jasco.nl | JASCO Spain www.jasco-spain.com ISO
Algeria, Austria, Belgium, Cyprus, Denmark, Egypt, Finland, France, Germany, Greece, Hungary, Iran, Iraq, Israel,
Italy, Jordan, Kuwait, Lebanon, Luxembourg, Morocco, Netherlands, Norway, Poland, Portugal, Romania, Saudi 14001
Certified
Arabia, South Africa, Spain, Sweden Switzerland, Tunisia, Turkey, United Arab Emirates, United Kingdom, Yemen
JASCO China (Shanghai) Co., Ltd. Products described herein are
Room No.D, 10F, World Plaza, 855 Pudong South Road, Pudong New Area,chi designed and manufactured by
ISO-9001- and ISO-14001-certified
Tel: +86-21-6888-7871 Fax: +86-21-6888-7879 http://www.jasco-global.com JASCO Corporation
BUV-2206