1 s2.0 S0272884218304073 Main
1 s2.0 S0272884218304073 Main
Ceramics International
journal homepage: www.elsevier.com/locate/ceramint
A R T I C L E I N F O A B S T R A C T
Keywords: Highly (110)-oriented BiFeO3-Bi(Zn/Ti)O3-SrTiO3 thin films were prepared on conductive Nb doped SrTiO3
BiFeO3 substrates by pulsed laser deposition. The results demonstrate that the films show a pure perovskite phase with
Pulsed laser deposition R3c symmetry. The films have a low dielectric loss, and a typical multiferroics character, possessing both of
Multiferroics ferroelectric and ferromagnetic properties. The reduced dielectric loss is attributed to thermodynamic stabili-
zation and charge compensation mechanisms in the BiFeO3 system. The remnant polarization (Pr) and the
remnant magnetization (Mr) are ~ 46.2 μC/cm2 and ~ 4.6 emu/cm3 respectively.
⁎
Corresponding author.
E-mail address: [email protected] (T. Lin).
https://doi.org/10.1016/j.ceramint.2018.02.109
Received 29 January 2018; Received in revised form 11 February 2018; Accepted 12 February 2018
Available online 13 February 2018
0272-8842/ © 2018 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
C. Meng et al. Ceramics International 44 (2018) 9053–9057
Fig. 2. a) XPS spectrum of the (110) oriented epitaxial film of BFO70-BZT4-STO26 grown on STO. b)–d) High-resolution XPS spectra of the Bi 4f, Fe 2p, and O 1s core level, respectively.
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C. Meng et al. Ceramics International 44 (2018) 9053–9057
Fig. 3. a) εr/tanδ-f curves from frequency ranging from 100 to 10E6 Hz, Dissipation curves between 1000 and 10,000 Hz shows that the relaxation was eliminated by the annealing
process and valid for films of different thicknesses. b) εr/tanδ-f − 1000/T curves at 100–10,000 Hz, from 160 K to 330 K.
Fig. 5. a) Hysteresis loops with 1000-ms preset delay and 1-ms hysteresis period. The electrode area is 0.04 mm2. b) Magnetic hysteresis loops of the < 110 > oriented epitaxial BF-BZT-
ST film grown on STO.
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hysteresis loops) were carried out by using PPMS-9 with vibrating drive voltage, which are up to 585 kV/cm and ~ 46.2 μC/cm2, re-
sample magnetometer (Quantum Design). All the measurements were spectively, as the drive voltage is 23 V. The Pr of our films is smaller
carried out at room temperature. than that of the other reported BFO thin films [20], which can be at-
tributed to the (110) orientation of our films while the spontaneous
3. Results and discussion ferroelectric polarization points along < 111 > directions in BFO
crystals. However, our films exhibit much better ferroelectricity than its
Fig. 1a shows XRD patterns of the BF70-BZT4-ST26 films. The counterpart in ceramics form. The enhancement of ferroelectricity in
patterns show a highly (110) orientation with only (110) BFO pseu- film form compared with ceramics can be caused by the constraints
docubic peaks apart from the NSTO substrate peaks. The only (110) resulted from the substrates. Note that the P-E loops show an asym-
oriented diffraction peaks indicate that the films have a pure phase, and metric feature, which is normally due to the pining effect by defect
demonstrate a thermodynamic equilibrium in our films as their coun- dipoles or defect clusters on domain walls. In our case, the different
terpart in bulk ceramics [4]. The result also show that the BF-BZT-ST materials for the top and bottom electrodes also have a contribution to
films belong to the combination of R3c space group compared to their the asymmetric P-E loops. Although the P-E loops obtained at high drive
bulk counterpart structure which only keeps (110) peaks around 32.4° voltages are close to saturated shape, there is still a slight rounded
[15]. Fig. 1b provides the SEM image of the film grown on NSTO. It feature near the maximum voltage in the loop, indicating the existence
could be concluded that the film was grown in islands with a thickness of weak leakage currents. In addition, a pinched part is demonstrated in
of around 200 nm. the second quadrant of the P-E loops. The weak leakage current and
Fig. 2(a–d) are the XPS spectrum of the films. It can be seen that the slightly distorted P-E loop are resulted from the potential residual
films are constituted of elements of Bi, Fe, O and Sr, which is constant to charged defects in the BF-BZT-ST films.
the main elements of the target. The two peaks positioned at 158 and The out-plane and in-plane magnetic moments depending on ex-
164 eV respectively are corresponding to Bi 4f7/2 and Bi 4f5/2, con- ternal magnetic field hysteresis (M-H hysteresis) are shown in Fig. 5b.
firming the trivalent oxidation state of Bi, i.e., Bi3+ in our BF-BZT-ST The coercive magnetic field (Mc) and the remanent magnetization (Mr)
films. The peaks located at 710.2 eV and 724.1 eV are ascribed to Fe3+. are ~ 330 Oe and ~ 4.6 emu/cm3, respectively. Although both the films
A weak peak is shown adjacent to the peak associated with O 1s at and ceramics have the same composition, the Mr of our films is much
528 eV, which may be resulted from the surface contamination of the higher that of the ceramics. On the one hand, this is consistent to the
samples. No other distinct peaks of any impurities are observed in the assumption of that the un-neutralized spin order perpendicular to the
XPS spectrum, confirming the high purity of our films. spin cycloid of < 111 > direction generates a parasitic ferromagnetism.
The frequency dependence of the dielectric permittivity of the films On the other hand, enhancement in ferromagnetism may be related to
is displayed in Fig. 3a. Compared with the as-grown films, the annealed the distortion in the crystal symmetry of BF-BZT-ST films.
films show a rather lower dielectric loss with less than 0.05, which is Although our (110)-oriented BF-BZT-ST films show both a high
slightly higher than that of the ceramics, but much lower than that of electric polarization and high remanent magnetization, no direct po-
the pure BFO thin films. The lower dielectric loss is due to the stable larization change is observed by applying external direct magnetic field
thermodynamic equilibrium suppression of the secondary phases, bias (up to 1 T) and alternative magnetic field (~ 1 Oe from 1 kHz to
which can stabilize the desired perovskite phase. In addition, no ob- 5 kHz). This is contradictory to our aforementioned theoretical ex-
vious change is observed in the dielectric loss for the films with dif- pectation in the introduction part. The discrepancy is assumed to be
ferent thicknesses (not shown here). The lower dielectric loss guaran- offset by the inconsistent domains in our films. Due to the unclear
tees the regular measurements of the P-E loops. Fig. 3b presents the mechanisms in the ME coupling, these inconsistent domains may gen-
results of dielectric permittivity and dielectric loss depends on 1000/T erate polarity offset by each other and exhibit zero output in total. In
from 100 to 10,000 Hz with the temperature ranging from 160 K to further investigation, the epitaxial BF-BZT-ST films with a single-do-
330 K. Both of the curves show a remarkably increase when the tem- main structure will be pursued to verify our assumptions.
perature goes higher than the room temperature. It can be contributed
to the substrate-induced strain commonly existing in films [16]. How-
ever, we didn’t obtain the dielectric loss peaks which are usually as- 4. Conclusions
signed to the loss of Bi2O3 through volatilization and reaction [17].
Though further experiments may be needed to investigate the dielectric We have prepared highly (110)-oriented BF-BZT-ST thin films on
properties, this result partially demonstrates the stability of our films. conductive NSTO substrates by PLD technique. The BFO films show a
Fig. 4 gives the Arrhenius plot ln(σ) at 1 kHz. The electrical con- pure perovskite phase with R3c symmetry. The films demonstrate a low
ductivity of semiconductor materials is usually thermally activated over dielectric loss, which is due to the suppression of the impurity phases.
a limited temperature and follows the Arrhenius law, Our investigations provide a way to enhance the multiferroic properties
both in ferroelectricity and magnetism by preparing BFO films with
Ea
σ = σ0exp (− ) (110) orientation. However, no obvious ME coupling is found in our
kB T
films. The ME coupling effect may be enhanced by optimize the crys-
where σ0 is a pre-exponential factor determined by the properties of the tallization and domain structure of the films.
material. Ea, kB, and T are the activation energy for conduction,
Boltzmann constant, and absolute temperature, respectively. Ea can be
calculated from the slope of the straight line given by least-mean-square Acknowledgements
analysis of ln(σ) vs. 1000/T [18]. In the low temperature region, the
plot fits the Arrhenius law with Ea ~ 0.0111 eV which is greatly lower We would like to thank Yuanyuan Zhang (East China Normal
than the generally oxygen-vacancy contributed electron hopping [19]. University) for the magnetism measurement and the insightful discus-
In the high temperature region from 290 K to 330 K, the slope turns to sions. This work was partially supported by the Major State Basic
positive and no longer corresponds to the Arrhenius law. It indicates Research Development Program (Grant nos. 2016YFB0400801 and
that the electron hopping is not thermally activated or the conduction is 2016YFB0400104), Key Research Project of Frontier Sciences of
not dominated by electrons. Chinese Academy of Sciences (QYZDY-SSW-JSC042), National Natural
Fig. 5a shows the P-E loops for the films measured with the fre- Science Foundation of China (Grant nos. 61474131, 61574152 and
quency of 1 kHz at room temperature. It can be seen that both the 61674157). Natural Science Foundation of Shanghai (Grant no.
coercive filed (Ec) and the remanent polarization (Pr) increase with the 16ZR1447600).
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