Ad 674
Ad 674
A/D Converters
AD674B*/AD774B*
FEATURES FUNCTIONAL BLOCK DIAGRAM
Complete Monolithic 12-Bit A/D Converters with
Reference, Clock, and Three-State Output Buffers
Industry Standard Pinout 5V SUPPLY
VLOGIC 1 28
STATUS
STS
High Speed Upgrades for AD574A DATA MODE SELECT
12/8 2
MSB
27 DB11 (MSB)
N
8- and 16-Bit Microprocessor Interface CHIP SELECT
CS 3 CONTROL Y
26 DB10
3 B
8 s (Max) Conversion Time (AD774B) BYTE ADDRESS/
4
B
25 DB9
SHORT CYCLE A0 S L
15 s (Max) Conversion Time (AD674B) READ/CONVERT R/C 5
T E
A 24 DB8
CLOCK SAR 12
5 V, 10 V, 0 V–10 V, 0 V–20 V Input Ranges CHIP ENABLE
6
T
E
A
N 23 DB7
CE COMP
Commercial, Industrial, and Military Temperature 12V/15V SUPPLY
7
–
O
Y
B 22 DB6
VCC + U B DIGITAL
Range Grades 10V REFERENCE
8
10V
REF I DAC T L
21 DB5
DATA
REF OUT P E OUTPUTS
MIL-STD-883-Compliant Versions Available ANALOG COMMON
9
U
T 20 DB4
AC B
REFERENCE INPUT B N
10 19 DB3
REF IN I REF U Y
–12V/–15V SUPPLY F B
11 199.95 + B 18 DB2
VEE F
k L
BIPOLAR OFFSET
– E
12 R E 17 DB1
BIPOFF DAC S
10V SPAN INPUT N VEE C
13 16 DB0 (LSB)
10VIN LSB
20V SPAN INPUT
15
DIGITAL
14 VOLTAGE
20VIN COMMON DC
DIVIDER
AD674B/AD774B
REV. C
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
may result from its use. No license is granted by implication or otherwise Tel: 781/329-4700 www.analog.com
under any patent or patent rights of Analog Devices. Fax: 781/326-8703 © Analog Devices, Inc., 2002
AD674B/AD774B–SPECIFICATIONS
V
(T to T
= +5 V 10%, V = –15 V 10% or –12 V 5%, unless otherwise noted.)
MIN MAX with VCC = +15 V 10% or +12 V 5%,
LOGIC EE
RESOLUTION 12 12 12 12 12 Bits
LINEARITY ERROR @ 25°C 1 1/2 1 1/2 1/2 LSB
TMIN to TMAX 1 1/2 1 1/2 1 LSB
DIFFERENTIAL LINEARITY ERROR
(Minimum Resolution for Which No
Missing Codes are Guaranteed) 12 12 12 12 12 Bits
UNIPOLAR OFFSET 1 @ 25°C 2 2 2 2 2 LSB
BIPOLAR OFFSET @ 25°C 1
6 3 6 3 3 LSB
1, 2
FULL-SCALE CALIBRATION ERROR
@ 25°C (with Fixed 50 Ω Resistor
from REF OUT to REF IN) 0.1 0.25 0.1 0.125 0.1 0.25 0.1 0.125 0.1 0.125 % of FS
TEMPERATURE RANGE 0 70 0 70 –40 +85 –40 +85 –55 +125 °C
3
TEMPERATURE DRIFT
(Using Internal Reference)
Unipolar 2 1 2 1 1 LSB
Bipolar Offset 2 1 2 1 2 LSB
Full-Scale Calibration 6 2 8 5 7 LSB
POWER SUPPLY REJECTION
Max Change in Full-Scale Calibration
VCC = +15 V ± 1.5 V or +12 V ± 0.6 V 2 1 2 1 1 LSB
VLOGIC = +5 V ± 0.5 V 1/2 1/2 1/2 1/2 1/2 LSB
VEE = –15 V ± 1.5 V or –12 V ± 0.6 V 2 1 2 1 1 LSB
ANALOG INPUT
Input Ranges
Bipolar –5 +5 –5 +5 –5 +5 –5 +5 –5 +5 V
–10 +10 –10 +10 –10 +10 –10 +10 –10 +10 V
Unipolar 0 10 0 10 0 10 0 10 0 10 V
0 20 0 20 0 20 0 20 0 20 V
Input Impedance
10 V Span 3 5 7 3 5 7 3 5 7 3 5 7 3 5 7 kΩ
20 V Span 6 10 14 6 10 14 6 10 14 6 10 14 6 10 14 kΩ
POWER SUPPLIES
Operating Range
VLOGIC 4.5 5.5 4.5 5.5 4.5 5.5 4.5 5.5 4.5 5.5 V
VCC 11.4 16.5 11.4 16.5 11.4 16.5 11.4 16.5 11.4 16.5 V
VEE –16.5 –11.4 –16.5 –11.4 –16.5 –11.4 –16.5 –11.4 –16.5 –11.4 V
Operating Current
ILOGIC 3.5 7 3.5 7 3.5 7 3.5 7 3.5 7 mA
ICC 3.5 7 3.5 7 3.5 7 3.5 7 3.5 7 mA
IEE 10 14 10 14 10 14 10 14 10 14 mA
POWER CONSUMPTION 220 375 220 375 220 375 220 375 220 375 mW4
175 175 175 175 175 mW5
INTERNAL REFERENCE VOLTAGE 9.9 10.0 10.1 9.9 10.0 10.1 9.9 10.0 10.1 9.9 10.0 10.1 9.9 10.0 10.1 V
Output Current
(Available for External Loads) 2.0 2.0 2.0 2.0 2.0 mA
(External Load Should Not
Change During the Conversion)
NOTES
1
Adjustable to zero.
2
Includes internal voltage reference error.
3
Maximum change from 25°C value to the value at TMIN or TMAX.
4
Tested with REF OUT tied to REF IN through 50 Ω resistor, VCC = +16.5 V, VEE = –16.5 V, VLOGIC = +5.5 V, and outputs in high-Z mode.
5
Tested with REF OUT tied to REF IN through 50 Ω resistor, VCC = +12 V, VEE = –12 V, VLOGIC = +5 V, and outputs in high-Z mode.
–2– REV. C
AD674B/AD774B
(For all grades TMIN to TMAX with VCC = +15 V 10% or +12 V 5%, VLOGIC = +5 V 10%,
DIGITAL SPECIFICATIONS VEE = –15 V 10% or –12 V 5%, unless otherwise noted.)
Parameter Test Conditions Min Max Unit
LOGIC INPUTS
VIH High Level Input Voltage 2.0 VLOGIC + 0.5 V
VIL Low Level Input Voltage –0.5 +0.8 V
IIH High Level Input Current VIN = VLOGIC –10 +10 µA
IIL Low Level Input Current VIN = 0 V –10 +10 µA
CIN Input Capacitance 10 pF
LOGIC OUTPUTS
VOH High Level Output Voltage IOH = 0.5 mA 2.4 V
VOL Low Level Output Voltage IOL = 1.6 mA 0.4 V
IOZ High-Z Leakage Current VIN = 0 to VLOGIC –10 +10 µA
COZ High-Z Output Capacitance 10 pF
(For all grades TMIN to TMAX with VCC = +15 V 10% or +12 V 5%,
SWITCHING SPECIFICATIONS VLOGIC = +5 V 10%, VEE = –15 V 10% or –12 V 5%, unless otherwise noted.)
CE tHEC
CONVERTER START TIMING (Figure 1)
tHSC
J, K, A, B Grades T Grade tSSC
CS
Parameter Symbol Min Typ Max Min Typ Max Unit
tSRC tHRC
Conversion Time R/C
8-Bit Cycle (AD674B) tC 6 8 10 6 8 10 µs
12-Bit Cycle (AD674B) tC 9 12 15 9 12 15 µs
8-Bit Cycle (AD774B) tC 4 5 6 4 5 6 µs A0 tHAC
12-Bit Cycle (AD774B) tC 6 7.3 8 6 7.3 8 µs tSAC
STS Delay from CE tDSC 200 225 ns STS
CE Pulsewidth tHEC 50 50 ns tC
CS to CE Setup tSSC 50 50 ns tDSC
DB11 – DB0 HIGH
CS Low During CE High tHSC 50 50 ns IMPEDANCE
R/C to CE Setup tSRC 50 50 ns
Figure 1. Convert Start Timing
R/C LOW During CE High tHRC 50 50 ns
A0 to CE Setup tSAC 0 0 ns CE
A0 Valid During CE High tHAC 50 50 ns tHSR
tSSR
CS
READ TIMING—FULL CONTROL MODE (Figure 2)
R/C tSRR tHRR
J, K, A, B Grades T Grade
Parameter Symbol Min Typ Max Min Typ Max Unit
A0 tSAR tHAR
Access Time
CL = 100 pF tDD1 75 150 75 150 ns STS
tHD
Data Valid After CE Low tHD 252 252 ns
HIGH DATA HIGH
203 154 ns DB11 – DB0
IMPEDANCE IMPEDANCE
5 tDD VALID
Output Float Delay tHL 150 150 ns tHL
CS to CE Setup tSSR 50 50 ns
R/C to CE Setup tSRR 0 0 ns
Figure 2. Read Cycle Timing
5V
A0 to CE Setup tSAR 50 50 ns
CS Valid After CE Low tHSR 0 0 ns 3k
R/C High After CE Low tHRR 0 0 ns DBN DBN
A0 Valid After CE Low tHAR 50 50 ns 3k 100pF 100pF
NOTES
1 HIGH-Z TO LOGIC 1 HIGH-Z TO LOGIC 0
tDD is measured with the load circuit of Figure 3a and is defined as the time required
for an output to cross 0.4 V or 2.4 V. High-Z to Logic 1 High-Z to Logic 0
2
0°C to TMAX.
3
At –40°C.
Figure 3a. Load Circuit for Access Time Test
4
At –55°C. 5V
5
tHL is defined as the time required for the data lines to change 0.5 V when loaded with 3k
the circuit of Figure 3b. DBN DBN
Specifications shown in boldface are tested on all devices at final electrical test with 3k 100pF 100pF
worst case supply voltages at TMIN, 25°C, and TMAX. Results from those tests are used
to calculate outgoing quality levels. All min and max specifications are guaranteed, LOGIC 1 TO HIGH-Z LOGIC 0 TO HIGH-Z
although only those shown in boldface are tested.
Specifications subject to change without notice. Logic 1 to High-Z Logic 0 to High-Z
Figure 3b. Load Circuit for Output Float Delay Test
REV. C –3–
AD674B/AD774B
TIMING—STAND ALONE MODE (Figures 4a and 4b) tHRL
tHL
*Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only and functional operation of Figure 4b. Standalone Mode Timing High Pulse for R/C
the device at these or any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
ORDERING GUIDE
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although WARNING!
the AD674B/AD774B features proprietary ESD protection circuitry, permanent damage may occur
on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are
ESD SENSITIVE DEVICE
recommended to avoid performance degradation or loss of functionality.
–4– REV. C
AD674B/AD774B
DEFINITION OF SPECIFICATIONS Quantization Uncertainty
Linearity Error Analog-to-digital converters exhibit an inherent quantization
Linearity error refers to the deviation of each individual code uncertainty of ± 1/2 LSB. This uncertainty is a fundamental
from a line drawn from “zero” through “full scale.” The point characteristic of the quantization process and cannot be reduced
used as “zero” occurs 1/2 LSB (1.22 mV for 10 V span) before for a converter of given resolution.
the first code transition (all zeroes to only the LSB “on”). “Full Left-Justified Data
scale” is defined as a level 1 1/2 LSB beyond the last code tran- The output data format is left-justified. This means that the
sition (to all ones). The deviation of a code from the true straight data represents the analog input as a fraction of full scale, rang-
line is measured from the middle of each particular code. ing from 0 to 4095/4096. This implies a binary point 4095 to
The K, B, and T grades are guaranteed for maximum nonlinear- the left of the MSB.
ity of ± 1/2 LSB. For these grades, this means that an analog Full-Scale Calibration Error
value that falls exactly in the center of a given code width will The last transition (from 1111 1111 1110 to 1111 1111 1111)
result in the correct digital output code. Values nearer the upper should occur for an analog value 1 1/2 LSB below the nominal
or lower transition of the code width may produce the next upper full scale (9.9963 V for 10.000 V full scale). The full-scale cali-
or lower digital output code. The J and A grades are guaranteed bration error is the deviation of the actual level at the last transi-
to ± 1 LSB max error. For these grades, an analog value that tion from the ideal level. This error, which is typically 0.05% to
falls within a given code width will result in either the correct 0.1% of full scale, can be trimmed out as shown in Figures 7
code for that region or either adjacent one. and 8. The full-scale calibration error over temperature is given
Note that the linearity error is not user adjustable. with and without the initial error trimmed out. The temperature
Differential Linearity Error (No Missing Codes) coefficients for each grade indicate the maximum change in the
A specification that guarantees no missing codes requires that full-scale gain from the initial value using the internal 10 V
every code combination appear in a monotonic increasing sequence reference.
as the analog input level is increased. Thus every code must have a Temperature Drift
finite width. The AD674B and AD774B guarantee no missing codes The temperature drift for full-scale calibration, unipolar offset,
to 12-bit resolution, requiring that all 4096 codes must be present and bipolar offset specifies the maximum change from the initial
over the entire operating temperature ranges. (25°C) value to the value at TMIN or TMAX.
Unipolar Offset Power Supply Rejection
The first transition should occur at a level 1/2 LSB above analog The standard specifications assume use of +5.00 V and ± 15.00 V
common. Unipolar offset is defined as the deviation of the actual or ± 12.00 V supplies. The only effect of power supply error on
transition from that point. This offset can be adjusted as discussed the performance of the device will be a small change in the
later. The unipolar offset temperature coefficient specifies the full-scale calibration. This will result in a linear change in all
maximum change of the transition point over temperature, low-order codes. The specifications show the maximum full-
with or without external adjustment. scale change from the initial value with the supplies at the
Bipolar Offset various limits.
In the bipolar mode the major carry transition (0111 1111 1111 Code Width
to 1000 0000 0000) should occur for an analog value 1/2 LSB A fundamental quantity for A/D converter specifications is the
below analog common. The bipolar offset error and temperature code width. This is defined as the range of analog input values for
coefficient specify the initial deviation and maximum change in which a given digital output code will occur. The nominal value
the error over temperature. of a code width is equivalent to 1 least significant bit (LSB) of the
full-scale range or 2.44 mV out of 10 V for a 12-bit ADC.
REV. C –5–
AD674B/AD774B
PIN CONFIGURATION
VLOGIC 1 28 STS
CS 3 26 DB10
A0 4 25 DB9
AD674B 24 DB8
R/C 5
OR
CE 6 AD774B 23 DB7
REF IN 10 19 DB3
VEE 11 18 DB2
20 VIN 14 15 DGND
–6– REV. C
AD674B/AD774B
CIRCUIT OPERATION DRIVING THE ANALOG INPUT
The AD674B and AD774B are complete 12-bit monolithic A/D The AD674B and AD774B are successive-approximation analog-
converters that require no external components to provide the to-digital converters. During the conversion cycle, the ADC input
complete successive-approximation analog-to-digital conversion current is modulated by the DAC test current at approximately
function. A block diagram is shown in Figure 5. a 1 MHz rate. Thus it is important to recognize that the signal
source driving the ADC must be capable of holding a constant
5V SUPPLY STATUS
output voltage under dynamically changing load conditions.
VLOGIC 1 28
STS
DATA MODE SELECT MSB
2 27 DB11 (MSB)
12/8 N FEEDBACK TO AMPLIFIER
CHIP SELECT CONTROL Y
3 26 DB10
CS 3 B V+
BYTE ADDRESS/ B
4 25 DB9
SHORT CYCLE A0 S L
T E
READ/CONVERT R/C 5 A 24 DB8
CLOCK SAR 12 A
T
CHIP ENABLE E
6 N 23 DB7
CE COMP
12V/15V SUPPLY –
O
Y ADC
7 B 22 DB6
VCC 10V
+ U B DIGITAL CURRENT
10V REFERENCE REF I DAC T L DATA LIMITING
8 P 21 DB5
REF OUT E OUTPUTS RESISTORS RIN IIN CURRENT
U
ANALOG COMMON OUTPUT
9 T B 20 DB4
AC
IDIFF ITEST DAC
REFERENCE INPUT B N
10 19 DB3
REF IN I REF U Y IIN IS MODULATED BY
–12V/–15V SUPPLY F B CHANGES IN TEST CURRENT. COMPARATOR
11 199.95 + B 18 DB2
VEE F AMPLIFIER PULSE LOAD
k L
BIPOLAR OFFSET
– E
E 17 DB1
RESPONSE LIMITED BY
12 R
BIPOFF DAC S OPEN-LOOP OUTPUT IMPEDANCE.
10V SPAN INPUT VEE C
V–
13 N 16 DB0 (LSB)
10VIN LSB SAR
20V SPAN INPUT DIGITAL ANALOG COMMON
14 VOLTAGE 15
20VIN COMMON DC
DIVIDER
AD674B/AD774B
Figure 6. Op Amp—ADC Interface
Figure 5. Block Diagram of AD674B and AD774B
The closed-loop output impedance of an op amp is equal to the
When the control section is commanded to initiate a conversion open-loop output impedance (usually a few hundred ohms)
(as described later) it enables the clock and resets the divided by the loop gain at the frequency of interest. It is often
successive-approximation register (SAR) to all zeroes. Once a assumed that the loop gain of a follower-connected op amp is
conversion cycle has begun, it cannot be stopped or restarted sufficiently high to reduce the closed-loop output impedance to
and data is not available from the output buffers. The SAR, a negligibly small value, particularly if the signal is low fre-
timed by the clock, will sequence through the conversion cycle quency. However, the amplifier driving the ADC must either
and return an end-of-convert flag to the control section. The have sufficient loop gain at 1 MHz to reduce the closed-loop
control section will then disable the clock, bring the output output impedance to a low value or have low open-loop output
status flag low, and enable control functions to allow data read impedance. This can be accomplished by using a wideband op
by external command. amp, such as the AD711.
During the conversion cycle, the internal 12-bit current output If a sample-hold amplifier is required, the monolithic AD585 or
DAC is sequenced by the SAR from the most significant bit AD781 is recommended, with the output buffer driving the
(MSB) to least significant bit (LSB) to provide an output cur- AD674B or AD774B input directly. A better alternative is the
rent that accurately balances the input signal current through AD1674, which is a 10 µs sampling ADC in the same pinout as the
the divider network. The comparator determines whether the AD574A, AD674A, or AD774B and is functionally equivalent.
addition of each successively weighted bit current causes the
DAC current sum to be greater or less than the input current; if SUPPLY DECOUPLING AND LAYOUT
the sum is less, the bit is left on; if more, the bit is turned off. CONSIDERATION
After testing all the bits, the SAR contains a 12-bit binary code It is critical that the power supplies be filtered, well regulated,
that accurately represents the input signal to within ± 1/2 LSB. and free from high-frequency noise. Use of noisy supplies will
cause unstable output codes. Switching power supplies is not
The temperature-compensated reference provides the primary
recommended for circuits attempting to achieve 12-bit accuracy
voltage reference to the DAC and guarantees excellent stability
unless great care is used in filtering any switching spikes present
with both time and temperature. The reference is trimmed to
in the output. Few millivolts of noise represent several counts of
10.00 V ± 1%; it can supply up to 2.0 mA to an external load in
error in a 12-bit ADC.
addition to the requirements of the reference input resistor
(0.5 mA) and bipolar offset resistor (0.5 mA). Any external load Decoupling capacitors should be used on all power supply pins;
on the reference must remain constant during conversion. The the 5 V supply decoupling capacitor should be connected directly
thin-film application resistors are trimmed to match the full- from Pin 1 to Pin 15 (digital common) and the +VCC and –VEE
scale output current of the DAC. The input divider network pins should be decoupled directly to analog common (Pin 9). A
provides a 10 V or 20 V input range. The bipolar offset resistor suitable decoupling capacitor is a 4.7 µF tantalum type in paral-
is grounded for unipolar operation and connected to the 10 V lel with a 0.1 µF ceramic disc type.
reference for bipolar operation.
REV. C –7–
AD674B/AD774B
Circuit layout should attempt to locate the ADC, associated UNIPOLAR CALIBRATION
analog input circuitry, and interconnections as far as possible The connections for unipolar ranges are shown in Figure 7. The
from logic circuitry. For this reason, the use of wire-wrap circuit AD674B or AD774B is trimmed to a nominal 1/2 LSB offset so
construction is not recommended. Careful printed-circuit layout that the exact analog input for a given code will be in the middle
and manufacturing is preferred. of that code (halfway between the transitions to the codes above
and below it). Thus, when properly calibrated, the first transition
UNIPOLAR RANGE CONNECTIONS FOR THE AD674B (from 0000 0000 0000 to 0000 0000 0001) will occur for an input
AND AD774B level of +1/2 LSB (1.22 mV for 10 V range).
The AD674B and AD774B contain all the active components If Pin 12 is connected to Pin 9, the unit will behave in this manner,
required to perform a complete 12-bit A/D conversion. Thus, within specifications. If the offset trim (R1) is used, it should be
for most situations, all that is necessary is connection of the trimmed as above, although a different offset can be set for a
power supplies (+5 V, +12/+15 V, and –12/–15 V), the analog particular system requirement. This circuit will give approximately
input, and the conversion initiation command, as discussed on ± 15 mV of offset trim range.
the next page.
The full-scale trim is done by applying a signal 1 1/2 LSB below
AD674B/AD774B the nominal full scale (9.9963 for a 10 V range). Trim R2 to
OFFSET
2 12/8 STS 28 give the last transition (1111 1111 1110 to 1111 1111 1111).
R1
–12V/ 100k +12V/
3 CS
HIGH BITS
–15V +15V 4 A0
24–27
BIPOLAR OPERATION
5 R/C
GAIN The connections for bipolar ranges are shown in Figure 8.
6 CE MIDDLE BITS
100k R2 20–23 Again, as for the unipolar ranges, if the offset and gain specifica-
10 REF IN
100 LOW BITS tions are sufficient, one or both of the trimmers shown can be
100
8 REF OUT 16–19 replaced by a 50 Ω ± 1% fixed resistor. The analog input is
12 BIP OFF applied as for the unipolar ranges. Bipolar calibration is similar
+5V 1
0 TO 10V to unipolar calibration. First, a signal 1/2 LSB above negative
13 10VIN +15V 7
ANALOG
INPUTS full scale (–4.9988 V for the ± 5 V range) is applied and R1 is
14 20VIN –15V 11
0 TO 20V trimmed to give the first transition (0000 0000 0000 to 0000
9 ANA COM DIG COM 15
0000 0001). Then a signal 1 1/2 LSB below positive full scale
(+4.9963 V for the ± 5 V range) is applied and R2 trimmed to
give the last transition (1111 1111 1110 to 1111 1111 1111).
Figure 7. Unipolar Input Connections
tables. For example, if no trims are used, ±2 LSB max zero offset R2
6 CE MIDDLE BITS
error and ± 0.25% (10 LSB) max full-scale error are guaranteed. GAIN
100
10 REF IN
20–23
If the offset trim is not required, Pin 12 can be connected directly 8 REF OUT LOW BITS
16–19
100
to Pin 9; the two resistors and trimmer for Pin 12 are then not OFFSET 12 BIP OFF
needed. If the full-scale trim is not required, a 50 Ω 1% metal R1
+5V 1
5V
film resistor should be connected between Pin 8 and Pin 10. ANALOG 13 10VIN +15V 7
INPUTS 14 20VIN –15V 11
The analog input is connected between Pins 13 and 9 for a 0 V 10V
9 ANA COM DIG COM 15
to 10 V input range, between Pins 14 and 9 for a 0 V to 20 V
input range. Input signals beyond the supplies are easily accommo-
dated. For the 10 V span input, the LSB has a nominal value of
Figure 8. Bipolar Input Connections
2.44 mV; for the 20 V span, 4.88 mV. If a 10.24 V range is
desired (nominal 2.5 mV/bit), the gain trimmer (R2) should be
GROUNDING CONSIDERATIONS
replaced by a 50 Ω resistor and a 200 Ω trimmer inserted in
The analog common at Pin 9 is the ground reference point for
series with the analog input to Pin 13 (for a full-scale range of
the internal reference and is thus the “high quality” ground for
20.48 V [5 mV/bit] use a 500 Ω trimmer into Pin 14). The
the ADC; it should be connected directly to the analog reference
gain trim described below is now done with these trimmers.
point of the system. To achieve the high-accuracy performance
The nominal input impedance into Pin 13 is 5 kΩ, and into Pin
available from the ADC in an environment of high digital noise
14 is 10 kΩ.
content, the analog and digital commons must be connected
together at the package. In some situations, the digital common
at Pin 15 can be connected to the most convenient ground ref-
erence point; digital power return is preferred.
–8– REV. C
AD674B/AD774B
VALUE OF A0 AT LAST CONVERT COMMAND
Q
D EOC 12
D
EN EN
EOC 8
START CONVERT
R
Q SAR
S S Q RESET
R QB
CE
HIGH IF CONVERSION
IN PROGRESS
CS
CLK EN
R/C STATUS
NYBBLE A
A0 ENABLE
NYBBLE B
READ ENABLE
TO
OUTPUT
NYBBLE C BUFFERS
ENABLE
12/8 NYBBLE = 0
ENABLE
REV. C –9–
AD674B/AD774B
STANDALONE MODE GENERAL A/D CONVERTER INTERFACE
“Standalone” mode is useful in systems with dedicated input CONSIDERATIONS
ports available and thus not requiring full bus interface capabil- A typical A/D converter interface routine involves several opera-
ity. Standalone mode applications are generally able to issue tions. First, a write to the ADC address initiates a conversion.
conversion start commands more precisely than full-control The processor must then wait for the conversion cycle to com-
mode, resulting in improved accuracy. plete, since most integrated circuit ADCs take longer than one
CE and 12/8 are wired HIGH, CS and A0 are wired LOW, and instruction cycle to complete a conversion. Valid data can, of
conversion is controlled by R/C. The three-state buffers are course, only be read after the conversion is complete. The
enabled when R/C is HIGH and a conversion starts when R/C AD674B and AD774B provide an output signal (STS) which
goes LOW. This gives rise to two possible control signals—a indicates when a conversion is in progress. This signal can be
high pulse or a low pulse. Operation with a low pulse is shown polled by the processor by reading it through an external three-
in Figure 4a. In this case, the outputs are forced into the high state buffer (or other input port). The STS signal can also
impedance state in response to the falling edge of R/C and generate an interrupt upon completion of conversion if the sys-
return to valid logic levels after the conversion cycle is completed. tem timing requirements are critical and the processor has other
The STS line goes HIGH 200 ns after R/C goes LOW and tasks to perform during the ADC conversion cycle. Another
returns low 600 ns after data is valid. possible time-out method is to assume that the ADC will take its
maximum conversion time to convert, and insert a sufficient
If conversion is initiated by a high pulse as shown in Figure 4b, number of “no-op” instructions to ensure that this amount of
the data lines are enabled during the time when R/C is HIGH. processor time is consumed.
The falling edge of R/C starts the next conversion, and the data
lines return to three-state (and remain three-state) until the next Once conversion is complete, the data can be read. For convert-
high pulse of R/C. ers with more data bits than are available on the bus, a choice of
data formats is required, and multiple read operations are
CONVERSION TIMING needed. The AD674B and AD774B include internal logic to
Once a conversion is started, the STS line goes HIGH. Convert permit direct interface to 8-bit and 16-bit data buses, selected
start commands will be ignored until the conversion cycle is by the 12/8 input. In 16-bit bus applications (12/8 high) the
complete. The output data buffers can be enabled up to 1.2 µs data lines (DB11 through DB0) may be connected to either the
prior to STS going LOW. The STS line will return LOW at the 12 most significant or 12 least significant bits of the data bus.
end of the conversion cycle. The remaining 4 bits should be masked in software. The inter-
face to an 8-bit data bus (12/8 low) is done in a left-justified for-
The register control inputs, A0 and 12/8, control conversion mat. The even address (A0 low) contains the 8 MSBs (DB11
length and data format. If a conversion is started with A0 LOW, through DB4). The odd address (A0 high) contains the 4 LSBs
a full 12-bit conversion cycle is initiated. If A0 is HIGH during a (DB3 through DB0) in the upper half of the byte, followed by
convert start, a shorter 8-bit conversion cycle results. four trailing zeroes, thus eliminating bit masking instructions.
During data read operations, A0 determines whether the three- It is not possible to rearrange the output data lines for right-jus-
state buffers containing the 8 MSBs of the conversion result tified 8-bit bus interface.
(A0 = 0) or the 4 LSBs (A0 = 1) are enabled. The 12/8 pin
determines whether the output data is to be organized as two D7 D0
8-bit words (12/8 tied LOW) or a single 12-bit word (12/8 tied XXX0 DB11
DB10 DB9 DB8 DB7 DB6 DB5 DB4
(EVEN ADDR) (MSB)
HIGH). In the 8-bit mode, the byte addressed when A0 is high
XXX1 DB0
contains the 4 LSBs from the conversion followed by four trail- (ODD ADDR)
DB3 DB2 DB1
(LSB)
0 0 0 0
–10– REV. C
AD674B/AD774B
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
0.05 (1.27)
0.050 (12.83) 0.045 (1.14)
28 15
o
0.59 30 0.08 (2.0)
+
– 0.01
(14.98)
SEATING 0.125 MIN (3.17)
1 14 PLANE
0.085
1.42 (36.07) 0.095 (2.41) 0.145 +
– 0.02
(2.16)
1.40 (35.56) (3.68)
0.010 +
– 0.002
0.050 (0.254 +
– 0.05)
+
– 0.010
0.017 + 0.1 (2.54) (1.27) 0.6 (15.24)
– 0.003
(0.43) 0.047 +
– 0.007
(1.19)
1.565 (39.70)
1.380 (35.10)
28 15
0.580 (14.73)
0.485 (12.32)
1 14
PIN 1
0.060 (1.52) 0.625 (15.87)
0.015 (0.38) 0.600 (15.24)
0.250 0.195 (4.95)
(6.35) 0.125 (3.18)
MAX 0.150
(3.81)
MIN
0.200 (5.05) 0.015 (0.381)
0.022 (0.558) 0.100 0.070 SEATING
0.125 (3.18) (1.77) PLANE 0.008 (0.204)
0.014 (0.356) (2.54)
BSC MAX
0.7125 (18.10)
0.6969 (17.70)
28 15
0.2992 (7.60)
0.2914 (7.40)
0.4193 (10.65)
1 14
0.3937 (10.00)
8
0.0118 (0.30) 0.0500 0.0192 (0.49) SEATING 0 0.0500 (1.27)
0.0125 (0.32)
0.0040 (0.10) (1.27) 0.0138 (0.35) PLANE 0.0157 (0.40)
BSC 0.0091 (0.23)
REV. C –11–
AD674B/AD774B
Revision History
Location Page
Data Sheet changed from REV. B to REV. C.
Edits to ORDERING GUIDE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
C00808-0-4/02(C)
Add 28-Lead Wide Body SOIC Package Drawing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
PRINTED IN U.S.A.
–12– REV. C