UNIT -3

Oscilloscopes
Introduction:
In studying the various electronic, electrical networks and systems, signals which are
functions of time, are often encountered. Such signals may be periodic or non periodic in
nature. The device which allows, the amplitude of such signals, to be displayed primarily as "
function of time, is called cathode ray oscilloscope, commonly known as C.R.O. The CR.O
gives the visual representation of the time varying signals. The oscilloscope has become an
universal instrument and is probably most versatile tool for the development of electronic
circuits and systems. It is an integral part of electronic laboratories.
The oscilloscope is, in fact, a voltmeter. Instead of the mechanical deflection of a
metallic pointer as used in the normal voltmeters, the oscilloscope uses the movement of an
electron beam against a fluorescent screen, which produces the movement of a visible spot. The
movement of such spot on the screen is proportional to the varying magnitude of the signal,
which is under measurement.
Basic Principle:
The electron beam can be deflected in two directions : the horizontal or x-direction and
the vertical or y-direction. Thus an electron beam producing a spot can be used to produce two
dimensional displays, Thus CRO. can be regarded as a fast x-y plotter. The x-axis and y-axis
can be used to study the variation of one voltage as a function of another. Typically the x-axis
of the oscilloscope represents the time while the y-axis represents variation of the input voltage
signal. Thus if the input voltage signal applied to the y -axis of CRO. is sinusoidally varying
and if x-axis represents the time axis, then the spot moves sinusoidally, and the familiar
sinusoidal waveform can be seen on the screen of the oscilloscope. The oscilloscope is so fast
device that it can display the periodic signals whose time period is as small as microseconds
and even nanoseconds. The CRO. Basically operates on voltages, but it is possible to convert
current, pressure, strain, acceleration and other physical quantities into the voltage using
transducers and obtain their visual representations on the CRO.
Cathode Ray Tube (CRT):
The cathode ray tube (CRT) is the heart of the CR.O. the CRT generates the
electron beam, ,accelerates the beam, deflects the beam and also has a screen where beam
becomes visible ,as a spot. The main parts of the CRT are:

i) Electron gun ii) Deflection system iii) Fluorescent screen

iv) Glass tube or envelope v) Base

A schematic diagram of CRT, showing its structure and main components is shown
in the Fig.

Electron Gun:
The electron gun section of the cathode ray tube provides a sharply focused electron
beam directed :towards the fluorescent-coated screen. This section starts from thermally heated
cathode, eimiting the electrons. The control grid is gives negative potential with respect to
cathode dc. This grid controls the number of electrons in the beam, going to the screen.
The momentum of the electrons (their mass * their velocity) determines the intensity, or
brightness, of the light emitted from the fluorescent screen due to the electron bombardment.
The light emitted is usually of the green colour. Because the electrons are negatively charged, a
repulsive force is created by applying a negative voltage to the control grid (in CRT, voltages
applied to various grids are stated with respect to cathode, which is taken as common point).
This negative control voltage can be made variable.
Deflection System:
When the electron beam is accelerated it passes through the deflection system, with
which beam can be positioned anywhere on the screen. The deflection system of the cathode-
ray-tube consists of two pairs of parallel plates, referred to as the vertical and horizontal
deflection plates. One of the plates' in each set is connected to ground (0 V), To the other plate
of each set, the external deflection voltage is applied through an internal adjustable gain amplifier
stage, To apply the deflection voltage externally, an external terminal, called the Y input or the X
input, is available.
As shown in the Fig. , the electron beam passes through these plates. A positive voltage
applied to the Y input terminal (Vy) Causes the beam to deflect vertically upward due to the
attraction forces, while a negative voltage applied to. the Y input terminal will cause the
electron beam to deflect vertically downward, due to the repulsion forces. When the voltages
are applied simultaneously to vertical and horizonta1 deflecting plates, the electron beam is
deflected due to the resultant-of these two voltages.
 Fluorescent Screen:
The light produced by the screen does not disappear immediately when bombardment
by electrons ceases, i.e., when the signal becomes zero. The time period for which the trace
remains on the screen after the signal becomes zero is known as "persistence". The persistence
may be as short as a few microsecond, or as long as tens of seconds and minutes.
Long persistence traces are used in the study.. of transients. Long persistence helps in
the study of transients since the trace is still seen on the screen after the transient has
disappeared.
Phosphor screen characteristics:
Many phosphor materials having different excitation times and colours as well as
different phosphorescence times are available. The type PI, P2, PI1 or P3I are the short
persistence phosphors and are used for the general purpose oscilloscope
Medical oscilloscopes require a longer phosphor decay and hence phosphors like P7
and P39 are preferred for such applications. Very slow displays like radar require long
persistence phosphors to maintain sufficient flicker free picture. Such phosphors are P19, P26
and, P33.
The phosphors P19, P26, P33 have low burn resistance. The phosphors PI, P2, P4, P7,
Pll have medium burn resistance while PIS, P3I have high burn resistance.
Block diagram of simple oscilloscope:

CRT:
This is the cathode ray tube which is the heart of CR.O. It is' used to emit the electrons required
to strike the phosphor screen to produce the spot for the visual display of the signals.
 Vertical Amplifier:
The input signals are generally not strong to provide the measurable deflection on the screen.
Hence the vertical amplifier. stage is used to amplify the input signals. The amplifier stages
used are generally wide band amplifiers so as to pass faithfully the entire band of frequencies to
be measured. Similarly it contains the attenuator stages as well. The attenuators are used when
very high voltage signals are to be examined, to bring the signals within the proper range of
operation.

It consists of several stages with overall fixed sensitivity. The amplifier can be
designed for stability and required bandwidth very easily due to the fixed gain. The input
stage consists of an attenuator followed by FET source follower. It has very high input
impedance required to isolate the amplifier from the attenuator. It is followed by BJT
emitter follower to match the output impedance of FET output With input of phase inverter.
The phase inverter provides two antiphase output signals which are required to operate the
push pull output amplifier. The push pull operation has advantages like better hum voltage
cancellation, even harmonic suppression especially large 2nd harmonic, greater power
output per tube and reduced number of defocusing and nonlinear effects.
Delay line:
The delay line is used to delay the signal for some time in the vertical sections. When the
delay line is not used, the part of the signal gets lost. Thus the input signal is not applied
directly to the vertical plates but is deayed by some time using a delay line circuit as
shown in the Fig.

If the trigger pulse is picked off at a time t = to after the signal has passed through the main
amplifier then signal is delayed by XI nanoseconds while sweep takes YI nanoseconds to
reach. The design of delay line is such that the delay time XI is higher than the time YI'
Generally XI is 200. nsec while time YI is 80 ns, thus the sweep starts well in time and no
part of the signal is lost. There are two types of delay lines used in CR.O. which are:
i) Lumped parameter delay line
ii) Distributed parameter delay line
 Trigger circuit:
It is necessary that horizontal deflection starts at the same point of the input vertical signal,
each time it sweeps. Hence to synchronize horizontal deflection with vertical deflection a
synchronizing or triggering circuit is used. It converts the incoming signal into the
triggering pulses, which are used for the synchronization.
Time base generator:
The time base generator is used to generate the sawtooth voltage, required to deflect the
beam in the horizontal section. This voltage deflects the spot at a constant time dependent
rate. Thus the x-axis' on the screen can be represented as time, which, helps to display and
analyse the time varying signals.
Oscilloscope probes
Oscilloscopes are widely used for test and repair of electronics equipment of all types.
However it is necessary to have a method of connecting the input of the oscilloscope to the
point on the equipment under test that needs monitoring.
BNC (Bayonet Neil-Concelman or British Naval Connector)
To connect the scope to the point to be monitored it is necessary to use screened cable to
prevent any pick-up of unwanted signals and in addition to this the inputs to most
oscilloscopes use coaxial BNC connectors. While it is possible to use an odd length of coax
cable with a BNC connector on one end and open wires with crocodile / alligator clips on the
other, this is not ideal and purpose made oscilloscope probes provide a far more satisfactory
solution.
Oscilloscope probes normally comprise a BNC connector, the coaxial cable (typically around
a metre in length) and what may be termed the probe itself. This comprises a mechanical clip
arrangement so that the probe can be attached to the appropriate test point, and an earth or
ground clip to be attached to the appropriate ground point on the circuit under test.
Care should be taken when using oscilloscope probes as they can break. Although they are
robustly manufactured, any electronics laboratory will consider oscilloscope probes almost as
"life'd" items that can be disposed of after a while when they are broken. Unfortunately the
fact that they are clipped on to leads of equipment puts a tremendous strain on the mechanical
clip arrangement. This is ultimately the part which breaks.
X1 and X10 oscilloscope probes
There are two main types of passive voltage scope probes. They are normally designated X1
and X10, although 1X and 10X are sometimes seen. The designation refers to the factor by
which the impedance of the scope itelf is multiplied by the probe.
The X1 probes are suitable for many low frequency applications. They offer the same input
impedance of the oscilloscope which is normally 1 MΩ. However for applications where
better accuracy is needed and as frequencies start to rise, other test probes are needed.
To enable better accuracy to be achieved higher levels of impedance are required. To achieve
this attenuators are built into the end of the probe that connects with the circuit under test. The
most common type of probe with a built in attenuator gives an attenuation of ten, and it is
known as a X10 oscilloscope probe. The attenuation enables the impedance presented to the
circuit under test to be increased by a factor of ten, and this enables more accurate
measurements to be made.
 As the X10 probe attenuates the signal by a factor of ten, the signal entering the scope itself
will be reduced. This has to be taken into account. Some oscilloscopes automatically adjust
the scales according to the probe present, although not all are able to do this. It is worth
checking before making a reading.
The 10X scope probe uses a series resistor (9 M Ohms) to provide a 10 : 1 attenuation when it
is used with the 1 M Ohm input impedance of the scope itself. A 1 M Ohm impedance is the
standard impedance used for oscilloscope inputs and therefore this enables scope probes to be
interchanged between oscilloscopes of different manufacturers.

The scope probe circuit shown is a typical one that might be seen - other variants with the
variable compensation capacitor at the tip are just as common.
In addition to the X1 and X10 scope probes, X100 probes are also available. These
oscilloscope probes tend to be used where very low levels of circuit loading are required, and
where the high frequencies are present. The difficulty using the is the fact that the signal is
attenuated by a factor of 100.
X10 oscilloscope probe compensation
The X10 scope probe is effectively an attenuator and this enables it to load the circuit under
test far less. It does this by decreasing he resistive and capacitive loading on the circuit. It
also has a much higher bandwidth than a traditional X1 scope probe.
The x10 scope probe achieve a better high frequency response than a normal X1 probe for a
variety of reasons. It does this by decreasing the resistive and capacitive loading on the The
X10 probe can often be adjusted, or compensated, to improve the frequency response.
Typical oscilloscope probe
For many scope probes there is a single adjustment to provide the probe compensation,
although there can be two on some probes, one for the LF compensation and the other for the
HF compensation.
Probes that have only one adjustment, it is the LF compensation that is adjusted, sometimes
the HF compensation may be adjusted in the factory.
To achieve the correct compensation the probe is connected to a square wave generator in the
scope and the compensation trimmer is adjusted for the required response - a square wave.
Compensation adjustment waveforms for X10 oscilloscope probe.

As can be seen, the adjustment is quite obvious and it is quick and easy to undertake. It
should be done each time the probe is moved from one input to another, or one scope to
another. It does not hurt to check it from time to time, even if it remains on the same input.
As in most laboratories, things get borrowed and a different probe may be returned, etc . .
 A note of caution: many oscilloscope probes include a X1/X10 switch. This is convenient, but
it must be understood that the resistive and capacitive load on the circuit increase
significantly in the X1 position. It should also be remembered that the compensation
capacitor has no effect when used in this position.
As an example of the type of loading levels presented, a typical scope probe may present a
load resistance of 10MΩ along with a load capacitance of 15pF to the circuit in the X10
position. For the X1 position the probe may have a capacitance of possibly 50pF plus the
scope input capacitance. This may end up being of the order of 70 to 80pF.
Other types of probe
Apart from the standard 1X and 10X voltage probes a number of other types of scope probe
are available.
Current probes: It is sometimes necessary to measure current waveforms on an
oscilloscope. This can be achieved using a current probe. This has a probe that clips
around the wire and enables the current to be sensed. Sometimes using the maths
functions on a scope along with a voltage measurement on another channel it is possible to
measure power,
Active probes: As frequencies rise, the standard passive probes become less effective.
The effect of the capacitance rises and the bandwidth is limited. To overcome these
difficulties active probes can be used. They have an amplifier right at the tip of the probe
enabling measurements with very low levels of capacitance to be made. Frequencies of
several GHz are achievable using active scope probes.
Differential scope probes: In some instances it may be necessary to measure
differential signals. Low level audio, disk drive signals and many more instances use
differential signals and these need to be measured as such. One way of achieving this is to
probe both lines of the differential signal using one probe each line as if there were two
single ended signals, and then using the oscilloscope to add then differentially (i.e.
subtract one from the other) to providethedifference.
Using two scope probes in this way can give rise to a number of problems. The main one
is that single ended measurements of this nature do not give the required rejection of any
common mode signals (i.e. Common Mode Rejection Ratio, CMMR) and additional noise
is likely to be present. There may be a different cable length on each probe that may lead
to a time differences and a slight skewing between the signals.
To overcome this a differential probe may be used. This uses a differential amplifier at the
probing point to provide the required differential signal that is then passed along the scope
probe lead to the oscilloscope itself. This approach provides a far higher level of
performance.
 High voltage probes: Most standard oscilloscope voltage probes like the X1 or X10
are only specified for operation up to voltages of a few hundred volts at most. For
operation higher than this a proper high voltage probe with specially insulated probe is
required. It also will step down the voltage for the input to the scope so that the test
instrument is not damaged by the high voltage. Often voltage probes may be X50 or X100.
Special Purpose Oscilloscopes
Dual Beam CRO
The dual beam oscilloscope has one cathode ray gun, and an electronic switch which
switches two signals to a single vertical amplifier. The dual beam CRO uses two completely
separate electron beams, two sets of VDPs and a single set of HDPs. Only one beam can be
synchronised at one time, since the sweep is the same for both signals, i.e. a common time
base is used for both beams. Block diagram of a Dual Beam CRO.
Therefore, the signals must have the same frequency or must be related harmonically,
in order to obtain both beams locked on the CRT screen, e.g. the input signal of an amplifier
can be used as signal A and its output signal as signal B

DUAL TRACE OSCILLOSCOPE

This CRO has a single electron gun whose electron beam is split into two by an electronic
switch. There is one control for focus and another for intensity. Two signals are displayed
simultaneously. The signals pass through identical vertical channels or vertical amplifiers.
Each channel has its own calibrated input attenuator and positioning control, so that the
amplitude of each signal can be independently adjusted.
A mode control switch enables the electronic switch to operate in two modes. Wheri the
switch is in ALTERNATE position, the electronic switch feeds each signal alternately to the
vertical amplifier. The electronic switch alternately connects the main vertical amplifier to
channels A and B and adds a different dc component to each signal; this dc component
directs the beam alternately to the upper or lower half of the screen. The switching takes
place at the start of each new sweep of the sweep generator. The switching rate of
the electronic switch is synchronised to the sweep rate, so that the CRT spot traces the channel
A signal on one sweep and the channel B signal on the succeeding sweep [Fig. 7.19 (b)]

The sweep trigger signal is available from channels A or B and the trigger pick-off takes
place before the electronic switch. This arrangement maintains the correct phase relationship
between signals A and B.
When the switch is in the CHOP mode position, the electronic switch is free running at the
rate of 100-500 kHz, entirely independent of the frequency of the sweep generator. The
switch successively connects small segments of A and B waveforms to the main vertical
amplifier at a relatively fast chopping rate of 500 kHz e.g. 1 i.ts segments of each waveform
are fed to the CRT display (Fig. 7.19 (c)).
If the chopping rate is slow, the continuity of the display is lost and it is better to use the
alternate mode of operation. In the added mode of operation a single image can be displayed
by the addition of signal from channels A and B, i.e. (A + B), etc. In the X — Y mode of
operation, the sweep generator is disconnected and channel B is connected to the horizontal
amplifier. Since both preamplifiers are identical and have the same delay time, accurate X —
Y measurements can be made.

Dual trace Oscilloscope(0-15MHz)

Block Description Y-Channels

A and B vertical channels are identical for producing the dual trace facility. Each comprises an input
coupling switch, an input step attenuator, a source follower input stage with protection circuit, a pre-
amplifier from which a trigger signal is derived and a combined final amplifier. The input stage
protection circuit consists of a diode, which prevents damage to the FET transistors that could occur
with excessive negative input potentials, and a resistor network which protects the input stage from
large positive voltage swings.
As the transistors are the balanced pre-amplifier stage, they share the same IC block. The
resulting stabilisation provides a measure of correction to reduce the drift inherent in high
gain amplifiers. The trigger pick-off signal is taken from one side of the balanced pre-
amplifier to the trigger mode switch, where either channel A or channel B triggering can be
selected. The supply for the output of the pre-amplifier stage is derived from a constant
current source controlled by the channel switching logic. Under the control of channel
switching, signals from A and B channels are switched to the final amplifier. The
combined balanced final amplifier is a direct coupled one to the Y-plates of the CRT (refer to
Fig. 7.20).
Channel Switching

The front panel A and B channel selection (push button or switch), controls an oscillator in
the CHOP mode. For channel switching electronic switching logic and a F/F is used. When
either A or B channels are selected, the F/F is switched to allow the appropriate channel.
In the ALTERNATE mode, a pulse from the sweep-gating multivibrator via the electronic
switching logic, switches the F/F, thus allowing A and B channels for alternate sweeps.
In the CHOP mode, the oscillator is switched via the logic stage to provide rapid switching of
the channels via the F/F.
Triggering

A triggering signal can be obtained from the vertical amplifier of Channels A and B from an
external source or internally from the mains supply (LINE triggering). The triggering signal
is selected and normally fed via the amplifier stage to the pulse shaper, which supplies well
defined trigger pulses to the sweep-gating multivibrator for starting the sawtooth generator.
Triggering from the TV line and frame signals can be obtained from the sync separator and
peak detector stages. The latter stage is switched into circuit in the TOP position.
Time Base
The time base generator circuit operates on the constant current integrator principle.

The sweep-gating multivibrator, triggered by pulses from the differentiator and auto circuits,
starts the sawtooth generator. Sweep signals are fed to the final X-amplifier.
A gate pulse is supplied by the sweep-gating multivibrator for unblanking the CRT during the
forward sweep. In addition this pulse is supplied to an external socket for probe adjustment
via a diode network.
X–Channel
Under the control of diode switching from the TIME/DIV switch, the X- amplifier receives
its input signal from either the time base sawtooth generator or from an external source (X-
EXT input socket via the X and trigger pre-amplifier). The X-MAGN (x 5) circuit is
incorporated in the X-final amplifier. The output of this amplifier is direct coupled to the
horizontal deflection plates of the CRT.
Cathode–Ray Tube Circuit and Power Supply
The high voltages required for the CRT, which has an acceleration potential of 1.5 kV, are
generated by a voltage multiplier circuit controlled by a stabilised power supply. The CRT
beam current is controlled by:
The intensity potentials network across the Extra High Tension (EHT) supply. During
flyback (movement of electron beam from right to left) by the blanking pulses coming from
the sawtooth generator via the beam blanking stages to blank the trace during right to left
movement of the electron.

Regulation of the mains input voltage is achieved by a diode clipper network controlled by a
signal fed back from an LED in the + 14 V rectifier supply.

SAMPLING OSCILLOSCOPE (VHF)

An ordinary Sampling Oscilloscope has a B.W. of 10 MHz. The HF performance can be

improved by means of sampling the input waveform and reconstructing its shape from the
sample, i.e. the signal to be observed is sampled and after a few cycles the sampling point is
advanced and another sample is taken. The shape of the waveform is reconstructed by
joining the sample levels together. The sampling frequency may be as low as 1/10th of the
input signal frequency (if the input signal frequency is 100 MHz, the bandwidth of the CRO
vertical amplifier can be as low as 10 MHz). As many as 1000 samples are used to
reconstruct the original waveform.

Figure 7.24 shows a block diagram of a sampling oscilloscope. The input waveform is
applied to the sampling gate. The input waveform is sampled whenever a sampling pulse
opens the sampling gate. The sampling must be synchronised with the input signal frequency.
The signal is delayed in thevertical amplifier, allowing the horizontal sweep to be initiated by
the input signal. The waveforms are shown in Fig. 7.25.
At the beginning of each sampling cycle, the trigger pulse activates an oscillator and a linear
ramp voltage is generated. This ramp voltage is applied to a voltage comparator which
compares the ramp voltage to a staircase generator. When the two voltages are equal in
amplitude, the staircase advances one step and a sampling pulse is generated, which opens the
sampling gate for a sample of input voltage.

The resolution of the final image depends upon the size of the steps of the staircase
generator.The smaller the size of the steps the larger the number of samples and higher the
resolution of the image.

STORAGE OSCILLOSCOPE
Storage targets can be distinguished from standard phosphor targets by their ability to retain a
waveform pattern for a long time, independent of phosphor peristence. Two storage
techniques are used in oscilloscope CRTs, mesh storage and phosphor storage.
A mesh-Storage Oscilloscope uses a dielectric material deposited on a storage mesh as the
storage target. This mesh is placed between the deflection plates and the standard phosphor
target in the CRT. The writing beam, which is the focussed electron beam of the standard
CRT, charges the dieletric material positively where hit. The storage target is then bombarded
with low velocity electrons from a flood gun and the positively charged areas of the storage
target allow these electrons to pass through to the standardphosphor target and thereby
reproduce the stored image on the screen. Thus the mesh storage has both a storage target and
a phosphor display target. The phosphor Storage Oscilloscope uses a thin layer of phosphor
to serve both as the storage and the display element.
Mesh Storage
It is used to display Very Low Frequencies (VLF) signals and finds many applications in
mechanical and biomedical fields. The conventional scope has a display with a phosphor
peristence ranging from a few micro seconds to a few seconds. The persistence can be
increased to a few hours from a few seconds.
A mesh Storage Oscilloscope, shown in Fig. 7.26, contains a dielectric material deposited on
a storage mesh, a collector mesh, flood guns and a collimator, in addition to all the elements
of a standard CRT. The storage target, a thin deposition of a dielectric material such as
Magnesium Fluoride on the storage mesh, makes use of a property known as secondary
emission. The writing gun etches a positively charged pattern on the storage mesh or target
by knocking off secondary emission electrons. Because of the excellent insulating property of
the Magnesium Fluoride coating, this positively charged pattern remains exactly in the
position where it is deposited. In order to make a pattern visible, a special electron gun, called
the flood gun, is switched on (even after many hours).

The electron paths are adjusted by the collimator electrode, which constitutes a low voltage
electrostatic lens system (to focus the electron beam), as shown in Fig. 7.27. Most of the
electrons are stopped and collected by the collector mesh. Only electrons near the stored
positive charge are pulled to the storage target with sufficient force to hit the phosphor
screen. The CRT will now display the signal and it will remain visible as long as the flood
guns operate. To erase the pattern on the storage mesh, a negative voltage is applied to
neutralise the stored positive charge.

Since the storage mesh makes use of secondary emission, between the first and second
crossover more electrons are emitted than are absorbed by the material, and hence a net
positive charge results.

Below the first crossover a net negative charge results, since the impinging electrons do not
have sufficient energy to force an equal number to be emitted. In order to store a trace,
assume that the storage surface is uniformly charged and write gun (beam emission gun) will
hit the storage target. Those areas of the storage surface hit by the deflecting beam lose
electrons, which are collected by the collector mesh. Hence, the write beam deflection pattern
is traced on the storage surface as a positive charge pattern. Since the insulation of the
dielectric material is high enough to prevent any loss of charge for a considerable length of
time, the pattern is stored. To view, the stored trace, a flood gun is used when the write gun is
turned off.
The flood gun, biased very near the storage mesh potential, emits a flood of electrons which
move towards the collector mesh, since it is biased slightly more positive than the deflection
region. The collimator, a conductive coating on the CRT envelope with an applied potential,
helps to align the flood electrons so that they approach the storage target perpendicularly.
When the electrons penetrate beyond the collector mesh, they encounter either a positively
charged region on the storage surface or a negatively charged region where no trace has been
stored.
The positively charged areas allow the electrons to pass through to the post accelerator region
and the display target phosphor. The negatively charged region repels the flood electrons
back to the collector mesh. Thus the charge pattern on the storage surface appears reproduced
on the CRT display phosphor just as though it were being traced with a deflected beam.

Figure 7.28 shows a display of the stored charge pattern on mesh storage.

Digital Storage Oscilliscope

Digital Storage Oscilliscopes are available in processing and non-processing types.
Processing types include built in computing power, which takes advantage of the fact that all
data is already in digital form.
The inclusion of interfacing and a microprocessor provides a complete system for
information acquisition, analysis and output. Processing capability ranges from simple
functions (such as average, area, rms, etc.) to complete Fast Fourier Transform (FFT)
spectrum analysis capability.
Non–processing digital scopes are designed as replacements for analog instruments for both
storage and non-storage types. Their many desirable features may lead to replace analog
scopes entirely (within the Bandwidth range where digitization in feasible).
The basic principle of a digital scope is given in Fig. 7.51. The scope operating controls are
designed such that all confusing details are placed on the back side and one appears to be
using a conventional scope. However, some digital scope panels are simpler also; most digital
scopes provide the facility of switching selectable to analog operation as one of the operating
modes.
The basic advantage of digital operation is the storage capability, the stored waveform can be
repetitively read out, thus making transients appear repetitively and allowing their convenient
display on the scope screen. (The CRT used in Digital Storage Oscilliscope is an ordinary
CRT, not a storage type CRT.)
Furthermore, the voltage and time scales of display are easily changed after the waveform has
been recorded, which allows expansion (typically to 64 times) of selected portions, to observe
greater details.
A cross-hair cursor can be positioned at any desired point on the waveform and the
voltage/time values displayed digitally on the screen, and/or readout electrically.
Some scopes use 12 bit converters, giving 0.025% resolution and 0.1% accuracy on voltage
and time readings, which are better than the 2-5% of analog scopes.
Split screen capabilities (simultaneously displaying live analog traces and replayed stored
ones) enable easy comparison of the two signals.
Pretrigger capability is also a significant advantage. The display of stored data is possible in
both amplitude versus time and X- Y modes. In addition to the fast memory readout used for
CRT display, a slow readout is possible for producing hard copy with external plotters.
When more memory than the basic amount (typically 4096 points/words) is needed, a
magnetic disk accessory allows expansion to 32,000 points.
All Digital Storage Oscilliscope scopes are limited in bandwidth by the speed of their A/D
converters. However, 20 MHz digitizing rates available on some scopes yield a 5 MHz
bandwidth, which is adequate for most applications.
Consider a single channnel of Fig. 7.51. The analog voltage input signal is digitised in a 10
bit A/D converter with a resolution of 0.1% (1 part in 1024) and frequency response of 25
kHz. The total digital memory storage capacity is 4096 for a single channel, 2048 for two
channels each and 1024 for four channels each.

The analog input voltage is sampled at adjustable rates (up to 100,000 samples per second)
and data points are read onto the memory. A maximum of 4096 points are storable in this
particular instrument. (Sampling rate and memory size is selected to suit the duration and
waveform of the physical event being recorded.)

Once the sampled record of the event is captured in memory, many useful manipulations are
possible, since memory can be read out without being erased.
If the memory is read out rapidly and repetitively, an input event which was a single shot
transient becomes a repetitive or continuous waveform that can be observed easily on an
ordinary scope (not a storage scope). The digital memory also may be read directly (without
going through DAC) to, say, a computer where a stored program can manipulate the data in
almost any way desired.
 Pre-triggering recording allows the input signal preceding the trigger points to be recorded. In
ordinary triggering the recording process is started by the rise of the input (or some external
triggering) above some preset threshold value.
As in digital recorder, DSO can be set to record continuously (new data coming into the
memory pushes out old data, once memory is full), until the trigger signal is received; then
the recording is stopped, thus freezing data received prior to the trigger signal in the memory.
An adjustable trigger delay allows operator control of the stop point, so that the trigger may
occur near the beginning, middle or end of the stored information.
Digital Storage Oscilliscope Features

1. Sampling rate 20 Mega-samples per second per channel. Max. (simultaneous) capture
of both channels.
2. Pre-trigger: 25%, 50%, 75%, for Single Shot, Roll normal.

3. Roll mode: (Continuous and Single Shot with Pre-trigger of 25%, 50%, 75%)

4. Single shot (0.5 p.s Single shot @ 10 pts. /div resolution with pre-trigger 25%, 50%, 75%)

5. Digital Sweep rate: 0.5. μs/cm to 50 sec/cm, (event as long as 8.33 minutes can be
captured)
Computer built in Interface: (RS 232 Serial port and Centronics Parallel interface