OPERATION AND SERVICE MANUAL

MODEL 7564SA QUADCHEKII

MODEL 7550DT HypotULTRAII
MODEL 7540DT HypotULTRAII
MODEL 7530DT HypotULTRAII
MODEL 7520DT HypotULTRAII
Electrical Safety Compliance Analyzers

AC/DC HIPOT WITH INSULATION RESISTANCE TESTER including

IEEE-488 (GPIB) INTERFACE or RS-232 on 7564SA and 7550DT
RS-232 or PRINTER PORT on 7530DT, 7540DT, 7520DT
4 PORT SCANNER on Model 7540DT
GROUND BOND TESTER on 7564SA
CONTINUITY TESTER on 7550DT, 7530DT, 7540DT and 7520DT

SERIAL NUMBER

Models © Associated Research, Inc., 2003

7564SA 13860 West Laurel Drive
Lake Forest, Illinois, 60045-4546
7520/30/40/50DT U.S.A.
Item 37737 Ver 2.11 Printed Mar 24, 2003

i
 DECLARATION OF CONFORMITY
Manufacturer: Associated Research, Inc.

Address: 13860 W. Laurel Dr.

Lake Forest, IL 60045
USA

Product Name: QUADCHEK® Electrical Safety

Compliance Analyzer

Model Number: 7520DT/7530DT

Conforms to the following Standards:

Safety:
IEC 61010-1: 1993 + A2,
EN 61010-2-031: 1994

EMC:
EN 50 082-1: 1992, EN 50 081-1: 1992,
IEC 801-2: 1984, EN 55 022: 1994,
IEC 801-3: 1984, EN 60 555-2:1987,
IEC 801-4: 1988

Supplementary Information

The product herewith complies with the requirements of the Low

Voltage Directive 73/23/EEC as amended by 93/68/EEC and the EMC
Directive 89/336/EEC as amended by 92/31/EEC.

The CE marking has been affixed on the device according to

article 10 of the EMC Directive 8/336/EEC.

The technical file and other documentation are on file with

Associated Research, Inc.

______________________________

Joseph Guerriero
Vice President / General Manager

Associated Research, Inc.

Lake Forest, Illinois USA
April 11, 2003

ii
 DECLARATION OF CONFORMITY
Manufacturer: Associated Research, Inc.

Address: 13860 W. Laurel Dr.

Lake Forest, IL 60045
USA

Product Name: QUADCHEK® Electrical Safety

Compliance Analyzer

Model Number: 7540DT

Conforms to the following Standards:

Safety:
IEC 61010-1: 1993 + A2,
EN 61010-2-031: 1994

EMC:
EN 61326: 1997 + A1: 1998 Class A
(EN 61000-3-2: 1995/A12: 1996/A13: 1997/A1: 1998/A2: 1998,
EN 61000-3-3: 1995/A1: 1998, EN 61000-4-2: 1995,
EN 61000-4-3: 1996, EN 61000-4-4: 1995, EN 61000-4-5: 1995,
EN 61000-4-6: 1996, EN 61000-4-8: 1993, EN 61000-4-11: 1994)

Supplementary Information

The product herewith complies with the requirements of the Low

Voltage Directive 73/23/EEC as amended by 93/68/EEC and the EMC
Directive 89/336/EEC as amended by 92/31/EEC.

The CE marking has been affixed on the device according to

article 10 of the EMC Directive 8/336/EEC.

The technical file and other documentation are on file with

Associated Research, Inc.

______________________________

Joseph Guerriero
Vice President / General Manager

Associated Research, Inc.

Lake Forest, Illinois USA
April 11, 2003

iii
 DECLARATION OF CONFORMITY
Manufacturer: Associated Research, Inc.

Address: 13860 W. Laurel Dr.

Lake Forest, IL 60045
USA

Product Name: QUADCHEK® Electrical Safety

Compliance Analyzer

Model Number: 7564SA/7550DT

Conforms to the following Standards:

Safety:
IEC 61010-1: 1993 + A2,

EMC:
EN 50 082-1: 1992, EN 50 081-1: 1992,
IEC 801-2: 1984, EN 55 022: 1994,
IEC 801-3: 1984, EN 60 555-2:1987,
IEC 801-4: 1988

Supplementary Information

The product herewith complies with the requirements of the Low

Voltage Directive 73/23/EEC as amended by 93/68/EEC and the EMC
Directive 89/336/EEC as amended by 92/31/EEC.

The CE marking has been affixed on the device according to

article 10 of the EMC Directive 8/336/EEC.

The technical file and other documentation are on file with

Associated Research, Inc.

______________________________

Joseph Guerriero
Vice President / General Manager

Associated Research, Inc.

Lake Forest, Illinois USA
April 11, 2003

iv
 Warranty Policies

Associated Research, Inc., certifies that the instrument listed in this manual meets or
exceeds published manufacturing specifications. This instrument was calibrated using
standards that are traceable to the National Institute of Standards and Technology (NIST).

Your new instrument is warranted to be free from defects in workmanship and material
for a period of (1) year from date of shipment. You must complete the on-line
registration at www.asresearch.com/register or call 1-800-858-TEST ext. 210 to register
over the phone

5-Year Program
AR recommends that your instrument be calibrated on a twelve-month cycle. Instruments
purchased and used in North America only, may have their warranty extended in one year
increments to a maximum of (5) years provided they are returned to AR at least annually
for calibration and inspection. The annual calibration and inspection must be performed
annually every year following receipt of instrument. Any instrument not calibrated and
inspected annually will not be eligible for extended warranty status. This extended
warranty is non-transferable and is offered only to the original purchaser. A return
material authorization (RMA) must be obtained from AR before returning this instrument
for warranty service. Please contact our Customer Support Center at 1-800-858-TEST
(8378) to obtain an RMA number. It is important that the instrument is packed in its
original container for safe transport. If the original container in not available please
contact our customer support center for proper instructions on packaging. Damages
sustained as a result of improper packaging will not be honored. Transportation costs for
the return of the instrument for warranty service must be prepaid by the customer. AR
will assume the return freight costs when returning the instrument to the customer. The
return method will be at the discretion of Associated Research.

3-Year Program
A 3-Year warranty is also available for instruments purchased and used in North
America. All costs for this warranty are paid with the initial purchase and include
warranty coverage, annual calibration and standard ground return freight for three years.
However, unlike our 5-year program annual calibration and inspection by Associated
Research is not required.

Except as provided herein, Associated Research makes no warranties to the purchaser of

this instrument and all other warranties, express or implied (including, without limitation,
merchantability or fitness for a particular purpose) are hereby excluded, disclaimed and
waived.

Any non-authorized modifications, tampering or physical damage will void your

warranty. Elimination of any connections in the earth grounding system or bypassing any
safety systems will void this warranty. This warranty does not cover batteries or
accessories not of Associated Research manufacture. Parts used must be parts that are

v
recommended by AR as an acceptable specified part. Use of non-authorized parts in the
repair of this instrument will void the warranty.

TABLE OF CONTENTS

SECTION I OPERATORS MANUAL ............................................................................1

SAFETY ..................................................................................................................2

INTRODUCTION....................................................................................................7

SPECIFICATIONS ................................................................................................13

WHAT’S NEW ......................................................................................................21

CONTROLS ..........................................................................................................24

INSTALLATION...................................................................................................32

QUICK START .....................................................................................................35

OPERATION .........................................................................................................38

OPTIONS...............................................................................................................83

SECTION II SERVICE MANUAL................................................................................98

CALIBRATION.....................................................................................................99

PARTS LIST ........................................................................................................107

PARTS LIST ........................................................................................................108

SCHEMATICS ....................................................................................................109

vi
 SECTION 1
OPERATORS MANUAL
 SAFETY

SAFETY PRECAUTIONS REQUIRED FOR HIGH

VOLTAGE TESTING!

GENERAL:
This product and its related documentation must be reviewed for familiarization with
safety markings and instructions before operation.

This product is a Safety Class I instrument (provided with a protective earth terminal).
Before applying power verify that the instrument is set to the correct line voltage (110 or
220) and the correct fuse is installed.

SAFETY SYMBOLS:

INSTRUCTION MANUAL SYMBOL. PLEASE REFER TO THE

INSTRUCTION MANUAL FOR SPECIFIC WARNING OR
CAUTION INFORMATION TO AVOID PERSONAL INJURY OR
DAMAGE TO THE PRODUCT

INDICATES HAZARDOUS VOLTAGES MAY BE PRESENT.

CHASSIS GROUND SYMBOL.

CALLS ATTENTION TO A PROCEDURE, PRACTICE, OR

WARNING CONDITION, THAT COULD POSSIBLY CAUSE BODILY
INJURY OR DEATH.

CALLS ATTENTION TO A PROCEDURE, PRACTICE, OR

CAUTION CONDITION THAT COULD POSSIBLY CAUSE DAMAGE TO
EQUIPMENT OR PERMANENT LOSS OF DATA.

2
 SAFETY

WARNING: A Hipot produces voltages and currents that can cause harmful or fatal
electric shock. To prevent accidental injury or death, these safety procedures must be
strictly observed when handling and using the test instrument.

SERVICE AND MAINTENANCE

User Service
To prevent electric shock do not remove the instrument cover. There are no user
serviceable parts inside. Routine maintenance or cleaning of internal parts is not
necessary. Any external cleaning should be done with a clean dry or slightly damp cloth.
Avoid the use of cleaning agents or chemicals to prevent any foreign liquid from entering
the cabinet through ventilation holes or damaging controls and switches, also some
chemicals may damage plastic parts or lettering. Schematics, when provided, are for
reference only. Any replacement cables and high voltage components should be acquired
directly from Associated Research, Inc. Refer servicing to an Associated Research, Inc.
authorized service center.

!PHONE: 1 (847) 367-4077

ASSOCIATED RESEARCH, INC. 1 (800) 858-TEST (8378)
13860 WEST LAUREL DRIVE FAX: 1 (847) 367-4080
LAKE FOREST, IL., 60045 -4546 U.S.A. E-MAIL : [email protected]
http://www.asresearch.com

Service Interval
The instrument and its power cord, test leads, and accessories must be returned at least
once a year to an Associated Research authorized service center for calibration and
inspection of safety related components. Associated Research will not be held liable for
injuries suffered if the instrument is not returned for its annual safety check and
maintained properly.

User Modifications
Unauthorized user modifications will void your warranty. Associated Research will not
be responsible for any injuries sustained due to unauthorized equipment modifications or
use of parts not specified by Associated Research. Instruments returned to Associated
Research with unsafe modifications will be returned to their original operating condition
at your expense.

TEST STATION

Location
Select an area away from the main stream of activity which employees do not walk
through in performing their normal duties. If this is not practical because of production
line flow, then the area should be roped off and marked for HIGH VOLTAGE

3
 SAFETY
TESTING. No employees other than the test operators should be allowed inside.

If benches are placed back-to-back, be especially careful about the use of the bench
opposite the test station. Signs should be posted: "DANGER - HIGH VOLTAGE
TEST IN PROGRESS - UNAUTHORIZED PERSONNEL KEEP AWAY."

Power
Dielectric Voltage-Withstand Test Equipment must be connected to a good ground. Be
certain that the power wiring to the test bench is properly polarized and that the proper
low resistance bonding to ground is in place.

Power to the test station should be arranged so that it can be shut off by one prominently
marked switch located at the entrance to the test area. In the event of an emergency,
anyone can cut off the power before entering the test area to offer assistance.

Work Area
Perform the tests on a nonconducting table or workbench, if possible. If you cannot avoid
using a conductive surface, be certain that it is securely grounded to a good earth ground
and insulate the high voltage connection from the grounded surface.

There should not be any metal in the work area between the operator and the location
where products being tested will be positioned. Any other metal in the work area should
be connected to a good ground, never left "floating".

Position the tester so the operator does not have to reach over the product under test to
activate or adjust the tester. If the product or component being tested is small, it may be
possible to construct guards or an enclosure, made of a non-conducting material such as
clear acrylic, such that the item being tested is within the guards or enclosure during the
test, and fit them with switches so that the tester will not operate unless the guards are in
place or the enclosure closed.

Keep the area clean and uncluttered. All test equipment and test leads not absolutely
necessary for the test should be removed from the test bench and put away. It should be
clear to both the operator and to any observers, which product is being tested, and which
ones are waiting to be tested or have already been tested.

Do not perform Hipot tests in a combustible atmosphere or in any area where combustible
materials are present.

TEST OPERATOR

Qualifications
This instrument generates voltages and currents that can cause harmful or fatal electric
shock and must only be operated by a skilled worker trained in its use.

4
 SAFETY
The operator should understand the electrical fundamentals of voltage, current, and
resistance. They should recognize that the test instrument is a variable high-voltage
power supply with the return circuit directly connected to earth ground and therefore,
current from the high-voltage output will flow through any available ground path.

Safety Procedures
Operators should be thoroughly trained to follow these and all other applicable safety
rules and procedures before they begin a test. Defeating any safety system should be
treated as a serious offense and should result in severe penalties, such as removal from
the Hipot testing job. Allowing unauthorized personnel in the area during a test should
also be dealt with as a serious offense.

Dress
Operators should not wear jewelry that could accidentally complete a circuit.

Medical Restrictions
This instrument should not be operated by personnel with heart ailments or devices such
as pacemakers.

TEST PROCEDURES

!NEVER PERFORM A HIPOT TEST ON ENERGIZED CIRCUITRY OR EQUIPMENT!

If the instrument has an external safety ground connection be sure that this is connected.
Then Connect the return lead first for any test regardless of whether the item under test is
a sample of insulating material tested with electrodes, a component tested with the high
voltage test lead, or a cord-connected device with a two or three prong plug.

Plug in the high voltage test lead only when it is being used. Handle its clip only by the
insulator---never touch the clip directly. Be certain that the operator has control over
any remote test switches connected to the Hipot. Double-check the return and high
voltage connections to be certain that they are proper and secure.

On Models 7530DT, 7540DT, 7550DT, and 7564SA, the return lead of

CAUTION
the instrument is not grounded (earthed). This allows for the monitoring
of very low leakage levels of current. It is therefore important that the device under test
is never grounded (earthed) or the current meter will essentially be bypassed and you
will get incorrect current meter readings.

WARNING
NEVER TOUCH THE ITEM UNDER TEST OR ANYTHING CONNECTED TO IT WHILE HIGH
VOLTAGE IS PRESENT DURING THE HIPOT TEST.

When testing with DC, always discharge the capacitance of the item under test and
anything the high voltage may have contacted--such as test fixtures--before handling it or
disconnecting the test leads.

5
 SAFETY

HOT STICK probes can be used to discharge any capacitance in the item under test as a
further safety precaution. A hot stick is a nonconducting rod about two feet long with a
metal probe at the end that is connected to a wire. To discharge the device under test, two
hot sticks are required. First connect both probe wires to a good earth ground. Then
touch one probe tip to the same place the return lead was connected. While holding the
first probe in place, touch the second probe tip to the same place where the high voltage
lead was connected.

KEY SAFETY POINTS TO REMEMBER:

• Keep unqualified and unauthorized personnel away from the test area.
• Arrange the test station in a safe and orderly manner.
• Never touch the product or connections during a test.
• In case of any problem, turn off the high voltage first.
• Properly discharge any item tested with DC before touching connections.

6
 INTRODUCTION

GLOSSARY OF TERMS
(as used in this manual)

Alternating Current, AC: Current that reverses direction on a regular basis, commonly in the
U.S.A. 60 per second, in other countries 50 times per second.

Breakdown: The failure of insulation to effectively prevent the flow of current, sometimes evidenced
by arcing. If voltage is gradually raised, breakdown will begin suddenly at a certain voltage level. Current
flow is not directly proportional to voltage. Once breakdown current has flown, especially for a period of
time, the next gradual application of voltage will often show breakdown beginning at a lower voltage than
initially.

Conductive: Having a volume resistivity of no more than 103 ohm-cm or a surface resistivity of no
more than 105 ohms per square.

Conductor: A solid or liquid material which has the ability to let current pass through it, and which has
a volume resistivity of no more than 103 ohm-cm.

Current: The movement of electrons through a conductor. Current is measured in amperes,

milliamperes, microamperes, nanoamperes, or picoamperes. Symbol = I

Dielectric: An insulating material that is positioned between two conductive materials in such a way that
a charge or voltage may appear across the two conductive materials.

Direct Current, DC: Current that flows in one direction only. The source of direct current is said to
be polarized and has one terminal that is always at a higher potential than the other.

Hipot Tester: Common term for dielectric-withstand test equipment.

Hypot®: Registered trademark of Associated Research, Inc., for its dielectric-withstand test equipment.

Insulation: Gas, liquid or solid material which has a volume resistivity of at least 1012 ohm-cm and is
used for the purpose of resisting current flow between conductors.

Insulation Resistance Tester: An instrument or a function of an instrument capable of measuring

resistance's in excess of 200 megohms. Usually employs a higher voltage power supply than used in
ohmmeters measuring up to 200 megohms.

Leakage: Ac or DC current flow through insulation and over its surfaces, and AC current flow through a
capacitance. Current flow is directly proportional to voltage. The insulation and/or capacitance is thought
of as a constant impedance, unless breakdown occurs.

Resistance: That property of a substance that impedes current and results in the dissipation of power in
the form of heat. The practical unit of resistance is the ohm. Symbol = R

Trip Point: The minimum current flow required to cause an indication of unacceptable performance
during a dielectric voltage-withstand test.

Voltage: Electrical pressure, the force which causes current through an electrical conductor.
Symbol = V

7
 INTRODUCTION
INTRODUCTION

The importance of testing... User safety

In an era of soaring liability costs, original manufacturers of electrical and electronic
products must make sure every item is as safe as possible. All products must be designed
and built to prevent electric shock, even when users abuse the equipment or by-pass built
in safety features.

To meet recognized safety standards, one common test is the "dielectric voltage-
withstand test". Safety agencies which require compliance safety testing at both the
initial product design stage and for routine production line testing include: Underwriters
Laboratories, Inc. (UL), the Canadian Standards Association (CSA), the International
Electrotechnical Commission (IEC), the British Standards Institution (BSI), the
Association of German Electrical Engineers (VDE) and (TÜV), the Japanese Standards
Association (JSI). These same agencies may also require that an insulation resistance test
and high current ground bond test be performed.

The Dielectric Withstand (Hipot) Test....

The principle behind a dielectric voltage - withstand test is simple. If a product will
function when exposed to extremely adverse conditions, it can be assumed that the
product will function in normal operating circumstances.

The most common applications of the dielectric-withstand test are:

• Design (performance) Testing.... determining design adequacy to meet service

conditions.

• Production Line Testing.... detecting defects in material or workmanship during

processing.

• Acceptance Testing.... proving minimum insulation requirements of purchased parts.

• Repair Service Testing.... determine reliability and safety of equipment repairs.

The specific technique varies with each product, but basically, during a dielectric voltage
- withstand test, an electrical devise is exposed to a voltage significantly higher than it
normally encounters. The high voltage is continued for a given period of time.

During the test, all "stray" current flow to ground is measured. If, during the time the
component is tested, stray current flow remains within specified limits, the device is
assumed to be safe under normal conditions. The basic product design and use of the
insulating material will protect the user against electrical shock.
The equipment used for this test, a dielectric-withstand tester, is often called a "hipot"
(for high potential tester). The "rule of thumb" for testing is to subject the product to

8
 INTRODUCTION
twice its normal operating voltage, plus 1,000 volts.

However, specific products may be tested at much higher voltages than 2X operating
voltages + 1,000 volts. For example, a product designed to operate in the range between
100 to 240 volts, can be tested between 1,000 to 4,000 volts or higher. Most "double
insulated" products are tested at voltages much higher than the "rule of thumb".

Testing during development and prototype stages is more stringent than production run
tests because the basic design of the product is being evaluated. Design tests usually are
performed on only a few samples of the product. Production tests are performed on each
and every item as it comes off the production line.

The hipot tester must also maintain an output voltage between 100% and 120% of
specification. The output voltage of the hipot must have a sinusoidal waveform with a
frequency between 40 to 70 Hz and has a peak waveform value that is not less than 1.3
and not more than 1.5 times the root-mean-square value.

Advantages and Disadvantages of AC Testing and DC Testing....

Please check with the Compliance Agency you are working with to see which of the two
type of voltages you are authorized to use. In some cases a Compliance Agency will
allow either AC or DC testing to be done. However in other cases the Compliance
Agency only allows for an AC test. If you are unsure which specification you must
comply with please contact our CUSTOMER SUPPORT GROUP at 1-800-858-TEST
(8378).

Many safety agency specifications allow either AC or DC voltages to be used during the
hipot test. When this is the case the manufacturer must make the decision on which type
of voltage to utilize. In order to do this it is important to understand the advantages and
the disadvantages of both AC and DC testing.

AC testing characteristics

Most items that are hipot tested have some amount of distributed capacitance. An AC
voltage cannot charge this capacitance so it continually reads the reactive current that
flows when AC is applied to a capacitive load.

AC testing advantages

1. AC testing is generally much more accepted by safety agencies than DC testing.

The main reason for this is that most items being hipot tested will operate at AC
voltages and AC hipot testing offers the advantage of stressing the insulation
alternately in both polarities which more closely simulates stresses the product will
see in real use.
2. Since AC testing cannot charge a capacitive load the current reading remains

9
 INTRODUCTION
consistent from initial application of the voltage to the end of the test. Therefore,
there is no need to gradually bring up the voltage since there is no stabilization
required to monitor the current reading. This means that unless the product is
sensitive to a sudden application of voltage the operator can immediately apply full
voltage and read current without any wait time.

3. Another advantage of AC testing is that since AC voltage cannot charge a load there
is no need to discharge the item under test after the test.

AC testing disadvantages

1. A key disadvantage of AC testing surfaces when testing capacitive products. Again,

since AC cannot charge the item under test, reactive current is constantly flowing.
In many cases the reactive component of the current can be much greater than the
real component due to actual leakage. This can make it very difficult to detect
products that have excessively high leakage current.

2. Another disadvantage of AC testing is that the hipot has to have the capability of
supplying reactive and leakage current continuously. This may require a current
output that is actually much higher than is really required to monitor leakage current
and in most cases is usually much higher than would be needed with DC testing.
This can present increased safety risks as operators are exposed to higher currents.

DC testing characteristics

During DC hipot testing the item under test is charged. The same test item capacitance
that causes reactive current in AC testing results in initial charging current which
exponentially drops to zero in DC testing.

DC testing advantages

1. Once the item under test is fully charged the only current flowing is true leakage
current. This allows a DC hipot tester to clearly display only the true leakage of the
product under test.

2. The other advantage to DC testing is that since the charging current only needs to be
applied momentarily the output power requirements of the DC hipot tester can
typically be much less than what would be required in an AC tester to test the same
product.

DC testing disadvantages

1. Unless the item being tested has virtually no capacitance it is necessary to raise the
voltage gradually from zero to the full test voltage. The more capacitive the item the
more slowly the voltage must be raised. This is important since most DC hipots

10
 INTRODUCTION
have failure shut off circuitry which will indicate failure almost immediately if the
total current reaches the leakage threshold during the initial charging of the product
under test.

2. Since a DC hipot does charge the item under test it becomes necessary to discharge
the item after the test.

3. DC testing unlike AC testing only charges the insulation in one polarity. This
becomes a concern when testing products that will actually be used at AC voltages.
This is a key reason that some safety agencies do not accept DC testing as an
alternative to AC.

4. When performing AC hipot tests the product under test is actually tested with peak
voltages that the hipot meter does not display. This is not the case with DC testing
since a sinewave is not generated when testing with direct current. In order to
compensate for this most safety agencies require that the equivalent DC test be
performed at higher voltages than the AC test. The multiplying factor is somewhat
inconsistent between agencies which can cause confusion concerning exactly what
equivalent DC test voltage is appropriate.

The Insulation Resistance Test....

Some "dielectric analyzers today come with a built in insulation resistance tester.
Typically the IR function provides test voltages from 500 to 1,000 volts DC and
resistance ranges from kilohms to gigaohms. This function allows manufacturers to
comply with special compliance regulations. BABT, TÜV and VDE are agencies that
may under certain conditions require an IR test on the product before a Hipot test is
performed. This typically is not a production line test but a performance design test.

The insulation resistance test is very similar to the hipot test. Instead of the go/no go
indication that you get with a hipot test the IR test gives you an insulation value usually in
Megohms. Typically the higher the insulation resistance value the better the condition of
the insulation. The connections to perform the IR test are the same as the hipot test. The
measured value represents the equivalent resistance of all the insulation which exists
between the two points and any component resistance which might also be connected
between the two points.

Although the IR test can be a predictor of insulation condition it does not replace the need
to perform a dielectric withstand test.

TYPES OF FAILURES DETECTABLE ONLY WITH A HIPOT TEST

• Weak Insulating Materials

• Pinholes in Insulation
• Inadequate Spacing of Components
• Pinched Insulation

11
 INTRODUCTION
The Ground Bond Test

The Ground Bonding test determines whether the safety ground circuit of the product
under test can adequately handle fault current if the product should ever become
defective. A low impedance ground system is critical in ensuring that in the event of a
product failure a circuit breaker on the input line will act quickly to protect the user from
any serious electrical shock.

International compliance agencies such as CSA, IEC, TÜV, VDE, BABT and others,
have requirements calling out this test. This test should not be confused with simple low
current continuity tests that are also commonly called out in some safety agency
specifications. A low current test merely indicates that there is a safety ground
connection, it does not completely test the integrity of that connection.

Compliance agency requirements vary on how different products are to be tested. Most
specifications call for test currents of between 10 and 30 amps. Test voltages at these
currents are typically required to be less than 12 volts. Maximum allowable resistance
readings of the safety ground circuit are normally between 100 and 200 milliohms.

The 7564SA provides up to 30 amps output current at any voltage between 3 and 8 volts
through the safety ground of the product under test. Simultaneously the instrument
measures the induced voltage across the safety ground circuit to determine the impedance
of the ground connection. The meter displays the resistance reading of the ground circuit
in milliohms.

The measured values are typically very low so it is extremely important to avoid reading
the resistance of the test leads that are used to connect the test instrument to the product
under test. If this is not done a device may be tagged as having a safety ground failure
when it is actually the combined resistance of the DUT and the test leads that has caused
the maximum resistance level to be exceeded. The 7564SA milliohm offset feature can
be adjusted to disregard the resistance of the test leads.

IF YOU SHOULD HAVE ANY QUESTIONS RELATING TO THE OPERATION

OF YOUR INSTRUMENT CALL 1-800-858-TEST(8378) IN THE U.S.A.

12
 SPECIFICATIONS

Models 7520DT, 7530DT, 7540DT, 7550DT and 7564SA

Functional Specifications
INPUT
Voltage 115/230 VAC ± 15%, Single Phase, User selection
Frequency 50/60 Hz ± 5%
Fuse 6.3 Amp 250V Slo-Blo for 7550DT and 7564SA
5 Amp 250V Slo-Blo for 75/20/30/40DT
DIELECTRIC WITHSTAND TEST MODE
Output Rating 5 KV @ 40 mA for 7550DT and 7564SA,
5 KV @ 20mA for 75/20/30/40DT
6 KV @ 10 mA DC for 75/30/40/50DT and 7564SA
Output Adjustment Range: 0 - 5 KV AC
0 - 6 KV DC
Resolution: 1 volt/step
Accuracy: ± (2% of setting + 5 volts)
Ramp-HI 12mA peak maximum, ON/OFF selectable
Charge-LO Range: 0.0 - 350.0µA DC or Auto set
HI-Limit AC Range: 0.00 - 40.00 mA for 7550DT and 7564SA,
0.00 - 20.00 mA for 75/20/30/40DT
Resolution: 0.01 mA/step
Accuracy: ± (2% of setting + 2 counts)
DC Range: 0 - 9999µA
Resolution: 1µA/step
Accuracy: ± (2% of setting + 2 counts)
LO-Limit AC Range: 0.000 - 9.999 mA
Resolution: 0.001 mA/step
Accuracy: ± (2% of setting + 2 counts)
DC Range: 0.0 - 999.9 µA
Resolution: 0.1 µA/step
Accuracy: ± (2% of setting + 2 counts)
Arc Detection Range: 1-9
Failure Detector Audible and Visual

13
 SPECIFICATIONS

Voltage Display Range: 0.00 - 6.00 KV Full Scale

0.00 - 5.00 KV Full Scale for 7520DT only
Resolution: 10 volt/step
Accuracy: ± (2% of reading + 2 counts)
Current Display Auto Range
AC Range 1: 0.000mA - 3.500mA
Resolution: 0.001mA/step
Range 2: 3.00 - 40.00 mA for 7550DT and 7564SA,
3.00 - 20.00 mA for 75/20/30/40DT
Resolution: 0.01 mA/step
DC Range 1: 0.0 µA - 350.0 µA
Resolution: 0.1 µA/step
Range 2: 300 µA - 3500 µA
Resolution: 1 µA/step
Range 3: 3000 µA - 9990 µA
Resolution: 10 µA/step
Accuracy: All Ranges ± (2% of reading + 2 counts)
DC Output Ripple ≤ 4% Ripple RMS at 6 KV DC @ 3.5 mA, Resistive Load
Discharge Time ≤ 200 ms
Maximum Capacitive 1uF < 1KV 0.08uF < 4KV
Load DC Mode 0.75uF < 2KV 0.04uF < 5KV
0.5uF < 3KV 0.01uF < 6KV
AC Output Wave Form Sine Wave, Crest Factor = 1.3 - 1.5
Output Frequency Range: 60 or 50 Hz, User Selection
Accuracy: ± 1%
Output Regulation ± (1 % of setting + 5 volts) from no load to full load
Dwell Timer Range: 0, 0.3 - 999.9 sec (0 = Constant)
Resolution: 0.1 sec increments
Accuracy: ± (0.1% + 0.05 sec)
Ramp Timer Range: AC 0.1 - 999.9 sec
DC 0.4 - 999.9 sec
Resolution: 0.1 sec increments
Accuracy: ± (0.1% + 0.05 sec)
14
 SPECIFICATIONS

Ground ContinuityCurrent : DC 0.1 A ± 0.01A, fixed

Max. ground resistance : 1 Ω ± 0.1Ω, fixed
For 75/20/30/40/50DT
Ground Fault Interrupt
GFI Trip Current: 450 µA max (AC or DC)
HV Shut Down Speed: < 1ms
INSULATION RESISTANCE TEST MODE Model 75/30/40/50DT, 7564SA
Output Voltage Range: 100 - 1000 Volts DC
Resolution: 1 volt/step
Accuracy: ± (2% of reading + 2 volts)
Short Circuit Current Maximum: 12mA peak
Voltage Display Range: 0 - 1000 V
Resolution: 1 volt/step
Accuracy: ± (2% of reading + 2 counts)
Resistance Display Range: 1 - 9999 MΩ (4 Digit, Auto Ranging)
Resolution: 500VDC 1000VDC
MΩ MΩ MΩ
0.001 1.000 - 5.388 1.000 - 9.999
0.01 1.40 - 53.88 2.80 - 99.99
0.1 14.0 - 538.8 28.0 - 999.9
1 104 - 9999 280 - 9999
Accuracy: ± (2% of reading + 2 counts) at test voltage
500 - 1000V and 1 - 1000 MΩ
± (8% of reading + 2 counts) at test voltage
500 - 1000V and 1000 - 9999 MΩ
± (8% of reading + 2 counts) at test voltage
100 - 500V and 0 - 1000 MΩ
Charge-LO Range: 0.000 - 3.500µA or Auto Set
HI-Limit Range: 0 - 9999 MΩ (0 = Off)
LO-Limit Range: 1 - 9999 MΩ
Delay Timer Range: 0, 0.5 - 999.9 sec (0 = Constant)
Resolution: 0.1 sec/step
Accuracy: ± (0.1% + 0.05 sec)
Ground Fault Interrupt GFI Trip Current: 450 µA max (AC or DC)
HV Shut Down Speed: < 1ms
15
 SPECIFICATIONS

GROUND BOND TEST MODE Model 7564SA only

Output Voltage Range: 3.00 - 8.00 Volts AC
(Open Circuit Limit) Resolution: 0.01 volt/step
Accuracy: ± (2 % of Setting + 0.03V ) O.C. Condition
Output Frequency Range: 60 or 50 Hz, User Selection
Accuracy: ±1%
Output Current Range: 3.00 - 30.00 Amps AC
Resolution: 0.01 Amp/step
Accuracy : ± (2 % of Setting + 0.02 A)
Current Display Range: 0.00 - 30.00 Amps
Resolution: 0.01 Amp/step
Accuracy: ± (3 % of Reading + 0.03 A)
Resistance Display Range: 0 - 600 mΩ
Resolution: 1 mΩ/step
Accuracy: ± (2 % of Reading + 2 mΩ )
HI-Limit Range: 0 - 600 mΩ for 3 - 10 A
0 - 150 mΩ for 3 - 30 A
Resolution: 1 mΩ/step
Accuracy: ± (2 % of Setting + 2 mΩ )
LO-Limit Range: 0 - 600 mΩ for 3 - 10 A
0 - 150 mΩ for 3 - 30 A
Resolution: 1 mΩ/step
Accuracy: ± (2 % of Setting + 2 mΩ )
Dwell Timer Range: 0, 0.5 - 999.9 sec (0 = Constant)
Resolution: 0.1 sec/step
Accuracy: ± (0.1% + 0.05 sec)
Milliohm Offset Max. Offset 200 mΩ
Capability:
Resolution: 1 mΩ / step
Accuracy: ± (2 % of Setting + 2 mΩ )

16
 SPECIFICATIONS

GENERAL SPECIFICATIONS
PLC Remote Control Input - Test, Reset, Recall memory # 1, # 2 and # 3
Output - Pass, Fail, Test-in-Process
Memory Allows storage of up to 50 groups different test programs
and 8 step/each memory. Step is not available on 7520DT
Security Programmable password lockout capability to avoid
unauthorized access to test set-up program.
LCD Contrast Setting 9 ranges set by the numeric keys on the front panel.
Buzzer Volume Setting 10 ranges set by the numeric key on the front panel.
Calibration Software and adjustments are made through front panel.
Mechanical Bench or rack mount with tilt up front feet.
Dimension 7540DT, 7550DT and 7564SA:
(W x H x D) 17 x 5.8 x 20.3 in. (432 x 147 x 515 mm)
7520DT and 7530DT:
(W x H x D) 17 x 5.8 x 12 in. (432 x 147 x 305 mm)
Weight 7564SA without scanner 52.5 lbs (24 Kgs)
7564SA with built-in scanner 57.0 lbs (26 Kgs)
7550DT without scanner 50.5 lbs (23 Kgs)
7550DT with built-in scanner 55.0 lbs (25 Kgs)
7540DT with 4 port scanner 39.6 lbs (18 Kgs)
7540DT with 8 port scanner 41.8 lbs (19 Kgs)
7530DT scanner not available 24.8 lbs (11.27 Kgs)
7520DT scanner not available 24.8 lbs (11.27 Kgs)
Scanner Port Two Port Maximum including the built-in scanner.
Not available on 7520DT, 7530DT and 7540DT.
Scanner High Voltage x 4 Ports (7540DT only)
Built-in Option High Voltage x 8 Ports (75/40/50DT and 7564SA)
Ground Bond x 8 Ports (7564SA only)

17
 WHAT’S NEW
KEY FEATURES & BENEFITS SUMMARY: MODELS 7550DT & 7564SA
" The first complete systems to HypotULTRA II combines the three most common
include AC Hipot, DC Hipot, dielectric safety tests (AC Hipot, DC Hipot & IR test)
Insulation Resistance and Ground required by agencies such as UL, CSA, IEC, VDE, TÜV,
Bond test into a single 19 inch BABT and others into a single instrument which takes up
rack mount cabinet less rack space and enables a single DUT connection.
QUADCHEK II includes the same dielectric tests along
with a high current Ground Bond test for applications
requiring a test of the safety ground circuit.
" Full GPIB (IEEE 488) or RS232 All the functions of the instrument can be programmed
interfaces as standard features over either interface which makes the instrument
adaptable to any type of automated production
environment.
" The only instruments that offer an These optional scanner configurations are ideal for multi-
optional built-in 8 port scanner point testing of a single item or multiple product testing.
and an interface to control up to The high voltage outputs of either the internal or external
two external scanners for scanner can be set as high, low or off. A front panel
expansion capabilities up to 16 display shows the status of each scanner output port. The
ports scanner for use with the QUADCHEK II also offers 8
ports for high current Ground Bond testing.
" A single 2 x 20 LCD display This single easy-to-view and simple-to-interpret LCD
provides a clear indication of all display allows the operator to monitor all test activity.
test results and setup parameters
" All setup parameters can be The operator is provided with an easy and safe way to set
adjusted through a simple menu trip currents and output voltages since all parameters are
driven program with hot keys to set without high voltage activated. The easy to follow
quickly access all functions by menu ensures that the operator correctly sets up each test
using the front panel mode.
" Storage of up to 50 setups with 8 A real benefit for manufacturers that test different
steps per setup products. Each setup can store up to 8 steps that can be
configured to perform any of the safety tests. In addition
each setup can be linked to the next for setting up as
many as 400 steps in sequence.
" Exclusive CHARGE LO and The RAMP HI feature allows the user to set a higher trip
RAMP HI testing features allow rate during the ramp to allow for quick charging of the
for more effective DC Hipot product without nuisance tripping thereby increasing
testing throughput when testing with DC. The CHARGE LO
provides the user with the capability to ensure that the
device under test is connected correctly.
" Exclusive SmartGFI function The SmartGFI (patent pending) provides maximum
operator protection to the user. If the circuit detects

18
 WHAT’S NEW
excessive leakage to ground it shuts down the high
voltage in less than 1 millisecond. SmartGFI is
automatically activated if the DUT is not grounded. The
operator does not need to make the decision whether to
activate the SmartGFI.
" Programmable security password Avoids tampering with settings by only allowing
system authorized personnel with a user programmable security
password to change test parameters.
" Line and Load regulation Maintains the output voltage to within 1% of setting even
if the load or the line voltage varies. This ensures that the
test results remain consistent and within safety agency
requirements.
" PLC remote inputs & outputs This allows the instruments to be remotely monitored and
set up completely through simple PLC control.
" Up to 40mA of current is available This makes these instruments true hipot testers with
in AC Hipot mode and 10mA in enough output current to test even highly capacitive loads
DC Hipot mode with resolutions while allowing them to be versatile enough to monitor
of 10 µA in AC and 1 µA in DC leakage current of items with very low leakage
measurement requirements.
" Digitally controlled arc detection Allows the operator to select whether low level arcs
system should be detected and provides the operator with the
ability to digitally select and program multiple sensitivity
levels.
" Four wire measurement (Kelvin The four wire measurement technique eliminates test lead
Method) and milliohm offset resistance when using the standard test leads. The
capability in the Ground Bond milliohm offset function allows the use of longer test
mode leads and test fixtures without compromising test results.

KEY FEATURES & BENEFITS SUMMARY: MODELS 7530DT

" The first complete systems to HypotULTRA II combines the three most common
include AC Hipot, DC Hipot, dielectric safety tests (AC Hipot, DC Hipot & IR test)
Insulation Resistance and Ground required by agencies such as UL, CSA, IEC, VDE, TÜV,
Bond test into a single 19 inch BABT and others into a single instrument which takes up
rack mount cabinet less rack space and enables a single DUT connection.
QUADCHEK II includes the same dielectric tests along
with a high current Ground Bond test for applications
requiring a test of the safety ground circuit.
" RS232 interfaces as standard All the functions of the instrument can be programmed
features through RS-232, which makes the instrument adaptable

19
 WHAT’S NEW
to any type of automated production environment.
" A single 2 x 20 LCD display This single easy-to-view and simple-to-interpret LCD
provides a clear indication of all display allows the operator to monitor all test activity.
test results and setup parameters
" All setup parameters can be The operator is provided with an easy and safe way to set
adjusted through a simple menu trip currents and output voltages since all parameters are
driven program with hot keys to set without high voltage activated. The easy to follow
quickly access all functions by menu ensures that the operator correctly sets up each test
using the front panel mode.

" Storage of up to 50 setups with 8 A real benefit for manufacturers that test different
steps per setup products. Each setup can store up to 8 steps that can be
configured to perform any of the safety tests. In addition
each setup can be linked to the next for setting up as
many as 400 steps in sequence.
" Exclusive CHARGE LO and The RAMP HI feature allows the user to set a higher trip
RAMP HI testing features allow rate during the ramp to allow for quick charging of the
for more effective DC Hipot product without nuisance tripping thereby increasing
testing throughput when testing with DC. The CHARGE LO
provides the user with the capability to ensure that the
device under test is connected correctly.
" Exclusive SmartGFI function The SmartGFI (patent pending) provides maximum
operator protection to the user. If the circuit detects
excessive leakage to ground it shuts down the high
voltage in less than 1 millisecond. SmartGFI is
automatically activated if the DUT is not grounded. The
operator does not need to make the decision whether to
activate the SmartGFI.
" Programmable security password Avoids tampering with settings by only allowing
system authorized personnel with a user programmable security
password to change test parameters.
" Line and Load regulation Maintains the output voltage to within 1% of setting even
if the load or the line voltage varies. This ensures that the
test results remain consistent and within safety agency
requirements.
" PLC remote inputs & outputs This allows the instruments to be remotely monitored and
set up completely through simple PLC control.
" Digitally controlled arc detection Allows the operator to select whether low level arcs
system should be detected and provides the operator with the
ability to digitally select and program multiple sensitivity

20
 WHAT’S NEW
levels.

What’s new with QUADCHEK II and HypotULTRA II.

• Optional built-in 8 port scanner - These instruments now offer the capability of
easily and quickly testing multiple products or multiple points with a single
instrument. The HypotULTRA II may be configured with a built-in 8 port high
voltage scanner. The QUADCHEK II built-in scanner option includes 8 ports for
Ground Bond in addition to 8 high voltage ports. In addition, either instrument
includes an interface to allow control of an external and internal scanner or two
external scanners for a total of 16 port control through the instrument without any
additional interface requirements.

• HS-8A & HS-16 External Multiplexer Scanners - Two new optional external
scanners are available for either instrument. The HS-8A features 8 high voltage and 8
ground bond ports. The HS-8A may be used alone as an external scanner or in
conjunction with the optional internal scanner providing a total of 16 ports. The HS-
16 has 16 high voltage and 16 ground bond ports. In addition, it may be controlled by
its own built-in GPIB or RS-232 interface providing complete automation control and
flexibility.

• RS-232 Interface - The standard interface on these new models continues to be GPIB
(IEEE-488). However, the instruments are now offered with the option of an RS-232
interface instead of GPIB to maximize their interface flexibility.

• Single 2 X 20 LCD display - A single easy to interpret display makes setup of the
instrument simple. All functions and test results are clearly displayed without
multiple displays and hard to understand abbreviations.

• Quick access user interface - To make access to each function of the instrument
easier we have now configured the instruments with dedicated “hot keys” that quickly
allow the user to step through each mode of the instrument without having to scroll
through the entire menu.

• Enhanced storage capability - The total number of setup memories have been
increased to 50. In addition, each memory can include up to 8 steps which all can be
linked together for a maximum of 400 steps in sequence.

• Exclusive Charge-LO function - This new function enhances DC hipot testing by

ensuring that the DUT is connected properly. A problem with LO-Limit detect
circuitry in DC applications is that once the DUT is fully charged steady current is
normally well below the range of LO-Limit detect circuitry. This new feature
monitors the momentary charging current pulse and uses it to detect whether the DUT
is connected. The Charge-LO function has an auto setup mode so the user does not

21
 WHAT’S NEW
need to make any difficult calculations to determine what the setting should be.

• Exclusive SmartGFI function - The SmartGFI provides maximum operator

protection to the user. If the circuit detects excessive leakage to ground it shuts down
the high voltage in less than 1 millisecond. SmartGFI is automaticly activated if the
DUT is not grounded. The operator does not need to make the decision whether to
activate the SmartGFI.

• Enhanced Milliohm offset - The milliohm offset function has been added to each
step in the memory to allow for different lead lengths when using a scanner to
perform multiple ground bond tests.

• Ramp-HI function - This is another enhancement for DC hipot testing. During a DC

test once the DUT is charged the actual leakage current is very low. Unfortunately,
users have not been able to set the trip point this low because unless the ramp time
was very slow false failures would occur during the ramp cycle when the DUT draws
more current due to charging. The new Ramp-HI function allows the instrument to
provide the full 10 mA output during the charge cycle and then monitor a much lower
setting during the dwell cycle when the DUT is fully charged.

• Programmable security password - Users can now program their own numeric
password to lock the front panel and only allow authorized personnel to change test
parameters.

• Lighter weight and reduced size - Both instruments are now enclosed in a smaller
3U rack mount cabinet to minimize their rack space needs. The weight of both
instruments has been reduced to less than 50 pounds.

• High resolution current metering - Resolution in AC hipot mode is now 1

microamp and 0.1 microamp in DC hipot mode.

• High resolution timers - The ramp and dwell time resolution has been improved to
0.1 second increments.

• Digitally adjustable arc detection - The arc detection mode is now menu controlled
and can be adjusted over a range of 1 - 9 to allow it to be adjusted for the DUT. In
addition, the arc detection sensitivity can now be controlled through the remote
interface that makes all functions completely programmable.

• HypotULTRA II Continuity mode - A continuity test mode has been added to the
HypotULTRA II to comply with UL and other safety agency specifications that call
for a basic low current ground continuity test.

• Fail Stop ON/OFF mode - This new mode is particularly useful in scanner

22
 WHAT’S NEW
applications. This allows either instrument to be setup to continue testing after
detecting a failure. A display of all final PASS/FAIL results on items tested is
provided at the conclusion of the test cycle.

• Buffer Memory - This new feature stores the complete test results for up to 8 tests,
so that the user can go back and review the complete test results for each step at the
end of a test.

• Enhanced GPIB Functions - The GPIB remote control has been improved to allow
for Service Request Interrupt (SRQ) capability. The instrument is now capable of
interrupting or Requesting Service (RQS) from the controller (CIC) for special events
such as test failures, aborted tests, GPIB command errors, or to indicated all tests
were passed. In addition the GPIB controller can retrieve stored test results from up
to 8 different tests that have been stored in the instruments memory as well as, polling
the instrument for real time data acquisition.

• Real Current Option - The Real Current option allows the user to monitor only the
real portion of the leakage current and ignore any reactive components due to
capacitance in the device under test. Since the real component is usually much smaller
than the reactive current, a doubling of the real current increases the total current by
only a small amount. Unless the two components are separated, a doubling of the real
leakage current can go virtually undetected by a total current measurement.

• Printer Port Option - The printer port option allows the user to generate hard copy
output of test results as test are being processing to meet requirement for verification
of testing, in production or test lab applications.

23
 CONTROLS
FRONT PANEL CONTROLS 7520DT, 7530DT, 7540DT, 7550DT and 7564SA
1 2 3 4 5

6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22

1 2 3 4

6 7 8 9 11 13 12 14 15 16 17 18 19 20 21 22

1. ARC LED: This indicator will illuminate when the Arc Detector has detected an arcing
condition. This indicator will function even when the Arc Fail has been disabled.

2. LOCK LED: When the Lock LED is on, the "password" software lockout has been
enabled. This means that the users will be unable to access the "program" mode of the
instrument to change any settings. When Memory-Lock is OFF the user can change
memory locations.

3. BUS REMOTE LED: This indicator will light when the instrument is in the
Remote Control mode. When the BUS Remote is on the instrument is able to send
and receive signals across the GPIB IEEE-488 or RS-232 bus.

4. LCD DISPLAY: The 2x20 character display indicates test function, memory and
step location, test parameter and failure type as well as test measurements during a
test.

5. SCANNER STATUS LED’s: (Models 7540DT, 7550DT and 7564SA) These

LED’s indicate the status of the 8 H.V. and 8 G-Bond ports on the internal scanner.
G-Bond ports on model 7564SA only.

6. POWER SWITCH: Rocker-style switch with international ON ( | ) and OFF (0)

markings.

24
 CONTROLS
1 2 3 4 5

6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22

1 2 3 4

6 7 8 9 11 13 12 14 15 16 17 18 19 20 21 22

7. RESET BUTTON: This is a momentary contact switch. If an out-of-range leakage

current condition, an arc breakdown, HI-limit, LO-Limit or ground bond failure
occur you will need to reset the system before you can proceed to the next test. Press
and release the red “RESET” button.

8. TEST BUTTON: This is a momentary contact switch. Press the green button to
turn on the high voltage output. Also illuminates to indicate a Pass condition.

9. MEMORY: (PROGRAM KEY) Use this key to select one of the 50 memories to
modify or run stored test parameters.

10. STEP: (PROGRAM KEY) Use this key to select one of the 8 locations contained
within each memory.

11. LOCK: (PROGRAM KEY) Use this key to select key lockout mode. A password
may be used when setup in the calibration mode.

12. LOCAL or LOCAL\PRN: (PROGRAM KEY) Use this key when you wish to go
from the Remote operation of the instrument to the Local mode. This key also is
used as a Printer key on models with the option installed.

25
 CONTROLS
1 2 3 4 5

6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22

1 2 3 4

6 7 8 9 11 13 12 14 15 16 17 18 19 20 21 22

13. FUNCTION KEYS: (Models 7530DT, 7540DT, 7550DT, and 7564SA) Use these
keys to select the test function that will be performed for the memory and step
indicated. The four selections are:
AC-W: AC Withstand Test
DC-W: DC Withstand Test
INSULATION: Insulation Resistance Test
G-BOND: Ground Bond Test on model 7564SA or CONTINUITY: Ground
Continuity Test on models 7530DT, 7540DT and 7550DT.

CONTINUITY: (On model 7520DT only) Use this key to select condition of
Ground Continuity Test.

14. EXIT: (PARAMETER KEY) Use this key to exit any menu or to clear an unwanted
entry in a parameter field.

15. SETUP: (PARAMETER KEY) Use this key to enter the setup menu and view or
change the GPIB address, display contrast, alarm volume, PLC remote settings, or
the stop on fail setting.

16. UP-DOWN ARROW KEYS: (PARAMETER KEY) Use these keys to enter and move
through the function parameter menus for AC-W, DC-W, IR, and G-BOND tests.

17. DATA ENTRY KEYS: Use these keys to input numeric parameters followed by
the ENTER key.

26
 CONTROLS
1 2 3 4 5

6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22

1 2 3 4

6 7 8 9 11 13 12 14 15 16 17 18 19 20 21 22

18. ENTER/REVIEW KEY: Use this key as an ENTER key to accept numeric data for
parameter settings. Or use this key as a REVIEW key to recall up to 8 connected test
results after a test has been completed (Models 7530DT, 7540DT, 7550DT and
7564SA).

19. HIGH VOLTAGE OUTPUT JACK: For the connection of the detachable 5 foot (1.52
m) high voltage test lead. The silicone rubber insulation is flexible for easy handling and
is rated at 30KVDC. The jack is recessed for safety when this lead is not being used.

20. HIGH VOLTAGE ON INDICATOR: This indicator flashes to warn the operator that
high voltage is present at the high voltage output terminal.

21. RETURN OUTPUT JACK: For the connection of the detachable 5 foot (1.52 m)
return test lead. On model 7564SA this jack will carry high current for the Ground Bond
test

22. CURRENT OUTPUT JACK: (Model 7564SA only) For the connection of the
detachable 5 foot (1.52 m) high current output lead used for the ground bond test. This
lead is only used for the ground bond test.

GROUND CONTINUITY JACK: (Models 7520DT, 7530DT, 7540DT and 7550DT)

connection of the detachable 5 foot (1.52 m) low current return lead used for the ground
continuity test.

27
 CONTROLS
REAR PANEL CONTROLS 7540DT, 7550DT and 7564SA
1 2 3 4 5 6 7 8 9

10 11 12 13

1. HIGH VOLTAGE OUTPUT JACK: For the connection of the detachable 5 foot
(1.52 m) high voltage test lead. The silicone rubber insulation is flexible for easy
handling and is rated at 30KVDC. The jack is recessed for safety when this lead is
not being used.

2. RETURN OUTPUT JACK: For the connection of the detachable 5 foot (1.52 m)
return test lead. On model 7564SA this jack will carry high current for the Ground
Bond test

3. CURRENT OUTPUT JACK: (Model 7564SA only) For the connection of the
detachable 5 foot (1.52 m) high current output lead used for the ground bond test.
This lead is only used for the ground bond test.

GROUND CONTINUITY JACK: (Model 7540DT and 7550DT) For the

connection of the detachable 5 foot (1.52 m) low current return lead used for the
ground continuity test.

4. INPUT POWER RECEPTACLE: Standard IEC 320 connector for connection to a

standard NEMA style line power (mains) cord.

5. SCANNER OUTPUTS: Optional scanner matrix that provides 8 HV/Return

connections and 8 Ground Bond connections. Ground Bond available on model
7564SA only

6. FUSE RECEPTACLE: To change the fuse unplug the power (mains) cord and
turn the fuse receptacle counter-clockwise. The fuse compartment will be exposed.
Please replace the fuse with one of the proper rating.

28
 CONTROLS

1 2 3 4 5 6 7 8 9

10 11 12 13

7. CHASSIS GROUND (EARTH) TERMINAL: This terminal should be connected

to a good earth ground before operation.

8. INPUT POWER SWITCH: Line voltage selection is set by the position of the
switch. In the up position it is set for 110-120 volt operation, in the down position it
is set for 220-240 volt operation.

9. THERMAL COOLING FAN: Runs continuously to cool the instrument.

10. SCANNER 1, SCANNER2 CONNECTORS: (Not available on model 7540DT)

For connection of optional Scanning Matrix HS-8A (or previous model HS-8).

11. REMOTE SIGNAL OUTPUT: 9-Pin D subminiature female connector for

monitoring PASS, FAIL, and PROCESSING output relay signals.

12. REMOTE SIGNAL INPUT: 9-Pin D subminiature male connector for remote
control of test and reset functions as well as program memory selection 1, 2, or 3.

13. BUS INTERFACE: Standard connector for interconnection to the IEEE 488 Bus
interface. Optional RS-232 interface can be substituted for this interface on model
7564SA and 7550DT.

29
 CONTROLS

REAR PANEL CONTROLS 7520DT and 7530DT

1 2 3 4 5 6

7 8 9 10 11

1. GROUND CONTINUITY JACK: (Model 7520DT and 7530DT) For the

connection of the detachable 5 foot (1.52 m) low current return lead used for the
ground continuity test.

2. RETURN OUTPUT JACK: For the connection of the detachable 5 foot (1.52 m)
return test lead.

3. HIGH VOLTAGE OUTPUT JACK: For the connection of the detachable 5 foot
(1.52 m) high voltage test lead. The silicone rubber insulation is flexible for easy
handling and is rated at 30KVDC. The jack is recessed for safety when this lead is
not being used.

4. REMOTE SIGNAL OUTPUT: 9-Pin D subminiature female connector for

monitoring PASS, FAIL, and PROCESSING output relay signals.

5. REMOTE SIGNAL INPUT: 9-Pin D subminiature male connector for remote

control of test and reset functions as well as program memory selection 1, 2, or 3.

6. BUS INTERFACE: Standard connector for interconnection to the RS-232 interface

bus. A simple Printer Port can be substituted for this interface.

7. INPUT POWER SWITCH: Line voltage selection is set by the position of the
switch. In the up position it is set for 110-120 volt operation, in the down position it
is set for 220-240 volt operation.

30
 CONTROLS
1 2 3 4 5 6

7 8 9 10 11

8. INPUT POWER RECEPTACLE: Standard IEC 320 connector for connection to a

standard NEMA style line power (mains) cord.

9. FUSE RECEPTACLE: To change the fuse unplug the power (mains) cord and turn
the fuse receptacle counter-clockwise. The fuse compartment will be exposed.
Please replace the fuse with one of the proper rating.

10. CHASSIS GROUND (EARTH) TERMINAL: This terminal should be connected

to a good earth ground before operation.

11. THERMAL COOLING FAN: Runs continuously to cool the instrument.

31
 INSTALLATION
INSTALLATION

Introduction

This section contains information for the unpacking, inspection, preparation for use and
storage of your Associated Research, Inc., product.

Unpacking and Inspection

Your instrument was shipped in a custom foam insulated container that complies with
ASTM D4169-92a Assurance Level II Distribution Cycle 13 Performance Test Sequence.

If the shipping carton is damaged, inspect the contents for visible damage such as dents,
scratches or broken meters. If the instrument is damaged, notify the carrier and the
Associated Research customer support department immediately. Please save the shipping
carton and packing material for the carriers inspection. Our customer support department
will assist you in the repair or replacement of your instrument. Please do not return your
product without first notifying us and receiving an RMA (return material authorization)
number.

Preparation for Use

Power Requirements and Line Voltage Selection

This instrument requires a power source of either 115 volts AC ± 15%, 47-63 Hz single
phase or 230 volts AC ±15%, 47-63 Hz single phase. Please check the rear panel to be
sure the proper switch setting is selected for your line voltage requirements before turning
your instrument on. In addition please be sure the correct fuse is selected and installed
while the instrument is in the off position (see page 28 for fuse changing instructions).

CAUTION Do not switch the line voltage selector switch located on the rear panel
while the instrument is on or operating. This may cause internal damage
and represents a safety risk to the operator.

NOTE
For operation at 115 and 230 Volts AC use a 6.3A slow-blow fuse.

32
 INSTALLATION
Power Cable

BEFORE CONNECTING POWER TO THIS INSTRUMENT, THE

WARNING PROTECTIVE GROUND (EARTH) TERMINALS OF THIS INSTRUMENT
MUST BE CONNECTED TO THE PROTECTIVE CONDUCTOR OF THE LINE (MAINS)
POWER CORD. THE MAIN PLUG SHALL ONLY BE INSERTED IN A SOCKET OUTLET
(RECEPTACLE) PROVIDED WITH A PROTECTIVE GROUND (EARTH) CONTACT. THIS
PROTECTIVE GROUND (EARTH) MUST NOT BE DEFEATED BY THE USE OF AN
EXTENSION CORD (POWER CABLE) WITHOUT A PROTECTIVE CONDUCTOR
(GROUNDING).

This instrument is shipped with a three-wire power cable. When this cable is connected
to an appropriate AC power source, this cable connects the chassis to earth ground. The
type of power cable shipped with each instruments depends on the country of destination.

Operating Environment

This instrument may be operated in temperatures from 32° - 113° F

(0° - 45° C).
Relative humidity of 0 to 95%.
Altitude up to 15,000 feet (4,600 meters).

STORAGE AND SHIPMENT

Environment

This instrument may be stored or shipped in environments with the following limits:
Temperature......................... -40° to +75°C
Altitude............................ 7,620 meters (25,000 feet)
The instrument should also be protected against temperature extremes that may cause
condensation within the instrument.

Packaging

Original Packaging: Please retain all original packaging materials that you originally
received. If you are returning your instrument to us for servicing please repackage the
instrument in its original container. Contact our customer support department (1-800-
858-8378) for a RMA (return material authorization) number. Please enclose the
instrument with all options, accessories and test leads. Indicate the nature of the problem
or type of service needed. Also, please mark the container "FRAGILE" to insure proper
handling. Upon receipt your instrument will be issued an AR service number. Please
refer to this number in all correspondence.

Other Packaging: If you do not have the original packaging materials please follow these
guidelines:

33
 INSTALLATION

1). Wrap the instrument in a bubble pack or similar foam. Enclose the same information
as above.

2). Use a strong double-wall container that is made for shipping instrumentation. 350 lb.
test material is adequate.

3). Use a layer of shock-absorbing material 70 to 100 mm (3 to 4 inch) thick around all
sides of the instrument. Protect the control panel with cardboard.

4). Seal the container securely.

5). Mark the container "FRAGILE" to insure proper handling.

6). Please refer in all correspondence to your AR service number.

Field Installation Of Options

There are no field installable options on this instrument.

34
 QUICK START
QUICK START

This quick start guide assumes the operator has some familiarity with automated testing
and desires to use the "default" settings on the instrument. The default settings shown
will remain in memory unless you choose to override them with your own test program.
The instrument default settings that appear in memories 1-40 are as follows:

DEFAULTS for Models 7530DT, 7540DT, 7550DT, and 7564SA

Function Parameter Value

ACW Voltage 1240VAC
HI-Limit 10.00mA
LO-Limit 0.000mA
Ramp Time 1.0s
Dwell Time 1.0s
Frequency 60Hz
Arc Sense 5
Arc Fail OFF
Scanner (7540DT, 7550DT, 7564SA) OOOOOOOOOOOOOOOO
Connect OFF
Continuity (7530DT, 7540DT, 7550DT) OFF

DCW Voltage 1500VDC

HI-Limit 3500µA
LO-Limit 0.0µA
Ramp Time 1.0s
Dwell Time 1.0s
Ramp-HI OFF
Charge-LO 0.0µA
Arc Sense 5
Arc Fail OFF
Scanner (7540DT, 7550DT, 7564SA) OOOOOOOOOOOOOOOO
Connect OFF
Continuity (7530DT, 7540DT, 7550DT) OFF

IR Voltage 1000VDC
Charge-LO 0.000µA
HI-Limit 0MΩ
LO-Limit 10MΩ
Delay 1.0s
Scanner (7540DT, 7550DT, 7564SA) OOOOOOOOOOOOOOOO
Connect OFF

35
 QUICK START
Defaults for Models 7530DT, 7540DT, 7550DT, 7564SA cont.:

Function Parameter Value

GND Current 25.00A
(7564SA Voltage 6.00V
only) HI-Limit 100mΩ
LO-Limit 0mΩ
Dwell 1.0s
Frequency 60Hz
Scanner 0
Offset 0mΩ
Connect OFF

Setup PLC Remote OFF

Address (GPIB only) 8
Contrast 5
Volume 5
Fail Stop ON

Calibration Password 0
MR-Lock ON

DEFAULTS for Model 7520DT only

Function Parameter Value

ACW Voltage 1240VAC
HI-Limit 10.00mA
LO-Limit 0.000mA
Ramp Time 1.0s
Dwell Time 1.0s
Frequency 60Hz
Arc Sense 5
Arc Fail OFF
Continuity OFF
Setup PLC Remote OFF
Contrast 5
Volume 5

Calibration Password 0
MR-Lock ON

Quick Start Instructions Cont.:

a). Unpack the instrument from its special shipping container. Be sure to save all
packaging materials in case you need to return it to the factory for service.

36
 QUICK START

WARNING b). Locate a suitable testing area and be sure you have read all safety
instructions for the operation of the instrument and suggestions on the
test area set-up in the Safety section. Locate a three prong grounded outlet. Be sure the
outlet has been tested for proper wiring before connecting the instrument to it.

CAUTION c). Check to be sure the correct input line voltage has been selected on
the rear panel. Either 115 volts AC or 230 volts AC. Connect the power
input plug into its socket on the rear panel of the instrument. Connect the male end of the
plug to the outlet receptacle. Please be sure that the safety ground on the power line cord
is not defeated and that you are connecting to a grounded power source.

d). Turn on the POWER switch located on the lower left hand side of the front panel.
Upon powering the instrument all LEDs on the Front Panel will be lit for visual
inspection. For detailed instructions on setting up testing parameters refer to the
OPERATION section.

e). If the instrument defaults are acceptable then be sure to connect the appropriate test
leads to the device under test (DUT) or test fixture. Be sure to connect this safety ground
to a suitable known good ground before energizing this instrument, then connect the
return lead first (black) to the test fixture or item followed by the high voltage output lead
(red). Note: The Return Lead of this instrument is not connected directly to Earth
Ground. If the DUT contacts Earth Ground directly, the instrument automatically operates
in a grounded return mode. See the Smart GFI paragraph in the OPERATION section
page 60 for details.

f). Please check your connections to be sure they are making good
WARNING
contact and that the test station or area is clear of debris and other
personnel. DO NOT TOUCH THE DEVICE UNDER TEST ONCE THE TEST HAS
BEEN STARTED. To initiate the test press the GREEN test button on the front panel.
This is a momentary button and does not need to be held in the pressed position during
the test. The instrument will then cycle ON and begin the automated test sequence using
the defaults. If a failure occurs you will HEAR an audible alarm go off. To stop the
alarm you must depress the RED button marked “RESET” This will silence the alarm and
reset the instrument to begin another test.

This “RESET” button may also be used as a safety button to quickly ABORT a test and
cut off the HIGH VOLTAGE. When HIGH VOLTAGE is present a RED arrow indicator
located in the lower right side of the front panel near the high voltage connector will flash
until the HIGH VOLTAGE is shut OFF. If the device under test PASSED the test then
no audible alarm will sound. You will hear a brief BEEP to let you know the item was
successfully tested and it PASSED. In the case of a FAIL condition the instrument will
provide a memory of the test results on the display, that will remain until the next test is
initiated. Depressing the “RESET” button will prepare the instrument for the next test
but will not clear the display until the next test is started or another reset is executed.

37
 OPERATION

1. General Setup Procedures

1.1 Key Lock setting

Press the “LOCK” key. If the Password is enabled, the display will show:

Password = _ _ _ _
Range : 0 - 9 9 9 9

To view the password or enter a new one refer to the calibration procedure. Use the
Numeric Key to enter the password and then press the “ENTER” key. The program
will switch the Key Lock function from “LOCK” to ”UNLOCK” or “UNLOCK” to
“LOCK” mode and advance the program to Operation mode automatically. If the
instrument is in the Lock mode, the “LOCK” indicator on the front panel will light.
If the wrong password is entered, the program will give a warning sound and the
display will show:

Password = ERROR
Range : 0 - 9 9 9 9

And then the program will return to the original screen and wait to enter the new
password. If the Password is Disabled (Password is set “0”), the display will show:

Key Lock = O N or Key Lock = O F F

<ENTER> to Select <ENTER> to Select

Use the “ENTER” key to select the Key Lock mode, then press the “EXIT” key.
The program will switch the Key Lock function from “LOCK” to “UNLOCK” or
“UNLOCK” to “LOCK” mode and advance the program to the Operation mode
automatically. If the Key Lock function is in the Lock mode, the “LOCK” indicator
on the front panel will light.

If the Memory Lock function (MR-Lock) is selected to “ON”, the Memory selection
Menu will be disabled when in the Lock Mode. If the MR-Lock is selected to
“OFF”, the Memory selection Menu will be enabled when in the Lock Mode.
Different memories can be recalled but the test parameters or steps cannot be
changed. The MR-Lock default is preset to “ON” at the factory.
Please refer to the calibration procedure, on page 99, to set the MR-Lock mode.

1.2 Memory Configuration

Each memory location contains 8 separate steps that can be connected sequentially
to the next consecutive step. Each step contains 4 separate locations, 1 for each
function. Only one function can be selected for each step, but the other three
function parameters remain stored in the memory. The following memory map
illustrates the separate locations for each function.

38
 OPERATION
Memory map

Memory 1 Step 1 Step 2 . . . . Step 8

ACW ACW ACW
DCW DCW DCW
IR IR IR
G-Bond G-Bond G-Bond

Memory 2 Step 1 Step 2 . . . . Step 8

ACW ACW ACW
DCW DCW DCW
IR IR IR
G-Bond G-Bond G-Bond
.
.
.
Memory 50

Note: On model 7550DT disregard the location for G-Bond parameters. The
Continuity parameter is stored within the ACW and DCW functions as a single
setting for both modes.

1.3 Memory Program selection

Press the “MEMORY” key, the display will show:

Memory = X X
Range : 1 - 50

Use the Numeric Key to enter the Memory location number, and then press the
“ENTER” key. The program will recall the test parameters stored in this location
and return to the operation mode automatically.

1.4 Step Selection

Press the “STEP” key, the display will show the test parameters of the functions
selected for that step, i.e. the parameters of AC Withstand Voltage, DC Withstand
Voltage, Insulation Resistance or Ground Bond test. Pressing the step key again
will advance to the next step in sequence with step 1 following step 8.

Note: When the steps have been interconnected you will see an underbar character
on the display just after the step number. This indicates that the step after the active
step will run immediately after the active step is completed. The display will show:

ACW Set XXX.X s

M25-1_ X.XX KV XX.XX mA

39
 OPERATION

2. Function Parameters Setup Procedures

Before going to setup the Test Parameters, make sure that the Keyboard is in the
“Unlock” mode, then follow this procedures to setup the Test Parameters.

2.1 AC Withstand Voltage test setting

Press the “ACW” key and the display will show:

ACW Set XXX.X s

MXX-X X.XX KV XX.XX mA Note: X = Numeric

ACW Set : AC Withstand Voltage test setting screen

XXX.X s : Dwell Time setting
MXX : Memory Program number
-X : Test Step number
X.XX KV : AC Output Voltage setting
XX.XX mA : AC High-Limit current setting

Use the “∧” or “∨” arrow keys to progress through the test parameters menu. The
“∨” key will advance forward and “∧" key will advance backward. The sequential
forward menu items are Voltage, HI-Limit, LO-Limit, Ramp Time, Dwell Time,
Frequency, Arc Sense, Arc Fail, Scanner Set, Offset, Connect.

2.1.1 AC Output Voltage setting

Advance the menu to the Voltage parameter. The display will show:

Voltage = XXXX V
Range : 0 - 5000

Use the “Numeric” keys to enter the voltage setting, then press the “ENTER” key.
The program will store the voltage setting and advance to the High Limit parameter
automatically. The unit is “volt" and 1 volt per step.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

2.1.2 HI-Limit Current setting

Advance the menu to the HI-Limit parameter. The display will show:

Models 7550DT and 7564SA

HI-Limit = XX.XX mA
Range : 0.00 - 40.00

Models 7520DT, 7530DT, and 7540DT

HI-Limit = XX.XX mA
Range : 0.00 - 20.00

40
 OPERATION
Use the “Numeric” keys to enter the HI-Limit setting, then press the “ENTER” key.
The program will store the HI-Limit setting and advance to the LO-Limit parameter
automatically. The unit is “mA" and 0.01 mA per step.

Press the “EXIT" key to exit from the setting mode to the operation mode if all
parameters have been set.

2.1.3 LO-Limit Current setting

Advance the menu to the LO-Limit parameter. The display will show:

LO-Limit = X.XXX mA
Range : 0.000 - 9.999

Use the “Numeric” keys to enter the LO-Limit setting, then press the “ENTER” key.
The program will store the LO-Limit setting and advance to the Ramp Time
parameter automatically. The unit is “mA” and 0.001 mA per step.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

If the LO-Limit is set to “0”, the LO-Limit is disabled.

2.1.4 Ramp Time setting

Advance the menu to the Ramp Time parameter. The display will show:

Ramp Time = XXX.X s

Range : 0.1 - 999.9

Use the “Numeric” keys to enter the Ramp Time setting, then press the “ENTER”
key. The program will store the Ramp Time setting and advance to the Dwell Time
setting automatically. The unit is “second” and 0.1 second per step.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

2.1.5 Dwell Time setting

Advance the menu to the Dwell Time parameter. The display will show:

Dwell Time = XXX.X s

Range : 0.3 - 999.9 0 = Constant

Use the “Numeric” keys to enter the Dwell Time setting, then press the “ENTER”
key. The program will store the Dwell Time setting and advance to the Frequency
selection parameter automatically. The unit is “second” and 0.1 second per step.
The display will show the elapsed time during the testing.

41
 OPERATION
Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

If the Dwell Time is set to “0”, the timer will continue to count to the maximum test
time then reset to “0” and start over automatically. The test will continue until a
reset is executed or a failure occurs.

2.1.6 Frequency Selection

Advance the menu to the Frequency parameter and the display will show:

Frequency = 60 Hz or Frequency = 50 Hz
<ENTER> to Select <ENTER> to Select

Use the “ENTER” key to select the Output Frequency, then press the “∧” or “∨” key
to advance to another test parameter or press the “EXIT” key to exit from the setting
mode to the operation mode.

2.1.7 Arc Sensitivity setting and Arc Fail selection

Advance the menu to the Arc Sense parameter. The display will show:

Arc Sense = 1 - 9
Range : 1 - 9 9 = High

Use the “Numeric” keys to enter the Arc Sense setting, then press the “ENTER”
key. The numeric value is proportional to the amount of sensitivity, i.e. “9” is the
highest sensitivity. The program will store the Arc Sense setting and advance to the
ARC Fail mode selection automatically. The display will show:

Arc Fail = O N or Arc Fail = O F F

<ENTER> to Select <ENTER> to Select

Use the “ENTER” key to select the Arc Fail mode, then press the “∧” or “∨” key to
advance the program to another test parameter or press the “EXIT” key to exit from
the setting mode to the operation mode.

If the Arc Fail mode is set to “ON”, the program will indicate an arc failure when
the arc current is over the setting. The program will shut down the test immediately
and the ARC indicator on the front panel will light.

If the Arc Fail mode is set to “OFF”, the program will not indicate an arc failure
when the arc current is over the setting. The program will not shut down the test
but the ARC indicator on the front panel will light when arcing is present.

42
 OPERATION
2.1.8 Scanner Channel setting model 7540DT, 7550DT and 7564SA
Advance the menu to the Scanner Set parameter. The display will show:

Scanner Set CH = 1 - 16
XXXXXXXXXXXXXXXX Note: X = H, O or L.

Use the “Numeric” keys to enter the status of High, Open or Low for each scanner
channel, then press the “ENTER” key. The program will store the Scanner Channel
status and advance to the Connection setting automatically. The following table is
the cross-reference of the numeric keys, which are used for the Scanner channel
setting.

Channel Status Numeric Key Description

H (High) 1 Connected to High Voltage Output
L (Low) 0 Connected to Return
O (Open) • Not connected to High Voltage or
Return

The Channel setting will start from Channel 1 on the left end and stop at Channel 16
on the right end (the 7540DT will display an 8 channel selection). The program will
set any unassigned channel(s) to OPEN automatically after pressing the “ENTER”
key. Therefore it is necessary to set only the channels that are required for the test.

If the Scanner is not installed, this setting is not necessary.

2.1.9 Step Connection setting

Advance the menu to the Connection parameter. The display will show:

Connect = ON or Connect = OFF

<ENTER> to Select <ENTER> to Select

Use the “ENTER” key to select the Step Connection mode, then press “∧” or “∨”
key to advance the program to another test parameter or press the “EXIT” key to
exit from the setting mode to the operation mode.

If Connect is set to “ON”, the next step in the sequence will be executed. If
Connect is set to “OFF”, the test sequence will stop at this step.

If Step 8 is set to “ON” the test process will be connected to the first step of the next
Memory.

2.2 DC Withstand Voltage test setting

Press the “DCW” key and the display will show:

DCW Set XXX.X s

MXX-X X.XX KV XXXXX µA Note: X = Numeric
43
 OPERATION

DCW Set : DC Withstand Voltage test Setting screen

XXX.X s : Dwell Time setting
MXX : Memory Program number
-X : Test Step number
X.XX KV : DC Output Voltage setting
XXXX µA: DC High-Limit current setting

Use the “∧” or “∨” arrow keys to progress through the test parameters menu. The
“∨” key will advance forward and “∧” key will advance backward. The sequential
forward menu items are Voltage, HI-Limit, LO-Limit, Ramp Time, Dwell Time,
Charge-LO, Ramp-HI, Arc Sense, Arc Fail, Scanner Set, Offset, Connect.

2.2.1 DC Output Voltage setting

Advance the menu to the Voltage parameter. The display will show:

Voltage = XXXX V
Range : 0 - 6000

Use the “Numeric” keys to enter the voltage setting, then press the “ENTER” key.
The program will store the voltage setting and advance to the HI-Limit parameter
automatically. The unit is “volt” and 1 volt per step.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

2.2.2 HI-Limit Current setting

Advance the menu to the HI-Limit parameter. The display will show:

HI-Limit = XXXX µA
Range : 0 - 9999

Use the “Numeric” keys to enter the HI-Limit setting, then press the “ENTER” key.
The program will store the HI-Limit setting and advance to the Low Limit
parameter automatically. The unit is “µA” and 1µA per step.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

2.2.3 LO-Limit Current setting

Advance the menu to the LO-Limit parameter. The display will show:

LO-Limit = XXX.X µA
Range : 0.000 - 9.999

Use the “Numeric” keys to enter the LO-Limit setting, then press the “ENTER” key.

44
 OPERATION
The program will store the LO-Limit setting and advance to the Ramp Time
parameter automatically. The unit is “µA” and 0.001µA per step.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

The LO-Limit will be disabled during the Ramp Up period. If the LO-Limit is set to
“0”, the LO-Limit is disabled.

2.2.4 Ramp Time setting

Advance the menu to the Ramp Time parameter. The display will show:

Ramp Time = XXX.X s

Range : 0.4 - 999.9

Use the “Numeric” keys to enter the Ramp Time setting, then press the “ENTER”
key. The program will store the Ramp Time setting and advance to the Dwell Time
parameter automatically. The unit is “second” and 0.1 second per step.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

2.2.5 Dwell Time setting

Advance the menu to the Dwell Time parameter. The display will show:

Dwell Time = XXX.X s

Range : 0.3 - 999.9 0 = Constant

Use the “Numeric” keys to enter the Dwell Time setting, then press the “ENTER”
key. The program will store the Dwell Time setting and advance to the Charge-LO
parameter automatically. The unit is “second” and 0.1 second per step.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

If the Dwell Time is set to “0”, the timer will continue to count to the maximum test
time then reset to “0” and start over automatically. The test will continue until a
reset is executed or a failure occurs.

2.2.6 Charge-LO
Advance the menu to the Charge-LO parameter. The display will show:

Charge-LO = XXX.X µA
<TEST> to Auto Set

The Charge-LO function is used to check if the test cables are connected properly at

45
 OPERATION
the beginning of a test. A capacitive DUT will draw charging current on the DC
Withstand Voltage test when the Output is activated. If the charging current was
lower then the setting, the test cables may not be connected properly.

This instrument can set the Charge-LO value manually or automatically. To set the
Charge-LO value manually, use the numeric keys to enter the Charge-LO current
setting and then press the ENTER key. The program will store the Charge-LO
setting and advance to the Ramp-HI parameter. The setting range of Charge-LO is
from 0.0 to 350.0 µA. The unit is “µA” and 0.1µA per step.

To use Auto Set, be sure that the test parameter of Output Voltage and Ramp Time
have been set to the values that will be used for the Final test and connect the test
cables and/or test fixture between the instrument and DUT. If the scanner is to be
used then the scanner channel must also be set, and then press the TEST button.
The instrument will apply the voltage that has been entered for this memory-step
selection.

Please be aware that the program will activate high voltage on

WARNING
the output connector while the Test button is pressed.

The program will read the charging current of DUT and set the Charge-LO current
at approximately one half (1/2) of the reading. The display will show:

Charge-LO = XXX.X µA
<TEST> to Auto Set

The value showing on the display is the Charge-LO setting and is not the reading of
the charging current of the DUT.

Then press the “∧”or “∨” key to advance the program to another test parameter or
press the “EXIT” key to exit from the setting mode to the operation mode.

2.2.7 Ramp-HI
Advance the menu to the Ramp-High parameter. The display will show:

Ramp-HI = ON or Ramp-HI = OFF

<ENTER> to Select <ENTER> to Select

Use the “ENTER” key to select the Ramp-HI mode, then press the “∧” or “∨ ” key
to advance the program to another test parameter or press the “EXIT” key to exit
from the setting mode to the operation mode.
The Ramp-HI function is active during the Ramp period only. Ramp-HI will allow
current higher than the normal HI-Limit current setting of the DC Withstand
Voltage test to avoid false failure due to charging current.

46
 OPERATION
2.2.8 Arc Sensitivity setting and Arc Fail selection
Advance the menu to the Arc Sense parameter. The display will show:

Arc Sense = 1 - 9
Range : 1 - 9 9 = High

Use the “Numeric” keys to enter the Arc Sense setting, then press the “ENTER”
key. The numeric value is proportional to the amount of sensitivity, i.e. “9” is the
highest sensitivity. The program will store the Arc Sense setting and advance to the
ARC Fail mode selection automatically. The display will show:

Arc Fail = ON or Arc Fail = OFF

<ENTER> to Select <ENTER> to Select

Use the “ENTER” key to select the Arc Fail mode, then press the “∧” or “∨” key to
advance the program to another test parameter or press the “EXIT” key to exit from
the setting mode to the operation mode.

If the Arc Fail mode is set to “ON”, the program will indicate an arc failure when
the arc current is over the setting. The program will shut down the test immediately
and the ARC indicator on the front panel will light.

If the Arc Fail mode is set to “OFF”, the program will not indicate an arc failure
when the arc current is over the setting. The program will not shut down the test
but the ARC indicator on the front panel will light only when arcing is present.

2.2.9 Scanner Channel setting model 7540DT, 7550DT and 7564SA

Advance the menu to the Scanner Set parameter. The display will show:

Scanner Set CH = 1 - 16
XXXXXXXXXXXXXXXX Note: X = H, O or L.

Use the “Numeric” keys to enter the status of High, Open or Low for each scanner
channel, then press the “ENTER” key. The program will store the scanner channel
status and advance to the Connection setting automatically. The following table is
the cross-reference of the numeric keys, which are used for the scanner channel
setting.

Channel Status Numeric Key Description

H (High) 1 Connected to High Voltage Output
L (Low) 0 Connected to Return
O (Open) • Not connected to High Voltage or
Return

The Channel setting will start from Channel 1 on the left end and stop at Channel 16
on the right end (the 7540DT will display an 8 channel selection). The program will
47
 OPERATION
set any unassigned channel(s) to OPEN automatically after pressing the “ENTER”
key. Therefore it is necessary to set only the channels that are required for the test.

If the Scanner is not installed, this setting is not necessary.

2.2.10 Step Connection setting

Advance the menu to the Connection parameter. The display will show:

Connect = ON or Connect = OFF

<ENTER> to Select <ENTER> to Select

Use the “ENTER” key to select the Step Connection mode, then press the “∧” or
“∨” key to advance the program to another test parameter or press the “EXIT” key
to exit from the setting mode to operation mode.

If Connect is set to “ON”, the next step in the sequence will be executed. If
Connect is set to “OFF”, the test sequence will stop at this step.

If Step 8 is set to “ON” the test process will be connected to the first step of the next
Memory.

2.3 Insulation Resistance test setting

Press the “INSULATION” key and the display will show:

IR Set XXX.X s
MXX-X XXXX V XXXXX MΩ Note: X = the numeric

IR Set : Insulation Resistance test setting screen

XXX.X s : Delay Time setting
MXX : Memory Program number
-X : Test Step number
XXXX V : DC Output Voltage
XXXX MΩ : Low-Limit of Insulation Resistance

Use the “∧”or “∨” arrow keys to progress through the test parameters menu. The
“∨” key will advance forward and “∧” key will advance backward. The sequential
forward menu items are Voltage, Charge-LO, HI-Limit, LO-Limit, Delay Time,
Scanner Set, Connect.

2.3.1 Output Voltage setting

Advance the menu to the Voltage parameter. The display will show:

Voltage = XXXX V
Range : 0 - 6000

Use the “Numeric” keys to enter the voltage setting, then press the “ENTER” key.
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The program will store the voltage setting and advance to the Charge-LO parameter
automatically. The unit is “volt” and 1 volt per step.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

2.3.2 Charge-LO
Advance the menu to the Charge-LO parameter. The display will show:

Charge-LO = X.XXX µA
<TEST> to Auto Set

The Charge-LO function is used to check if the test cables are connected properly at
the beginning of a test. A capacitive DUT will draw charging current on the
Insulation Resistance test when the Output is activated. If the charging current was
lower then the setting, the test cables may not be connected properly.

This instrument can set the Charge-LO value manually or automatically. To set the
Charge-LO value manually, use the numeric keys to enter the Charge-LO current
setting and then press the “ENTER” key. The program will store the Charge-LO
setting and advance to the HI-Limit parameter. The setting range of Charge-LO is
from 0.000 to 3.500 µA. The unit is “µA” and 0.001µA per step.

To use Auto Set, be sure that the test parameter of Output Voltage has been set to
the values that will be used for the final test and connect the test cables and/or test
fixture between the instrument and DUT. If the scanner is to be used then the
scanner channel must also be set. Then press the TEST button. The instrument will
apply the voltage that has been entered for this memory-step selection.

Please be aware that the program will activate high voltage on

WARNING
the output connector while the Test button is pressed.

The program will read the charging current of DUT and set the Charge-LO current
at approximately one half (1/2) of the reading. The display will show:

Charge-LO = X.XXX µA
<TEST> to Auto Set

The value showing on the display is the Charge-LO setting and is not the reading of
the charging current of DUT.

Then press the “∧” or “∨” key to advance the program to another test parameter or
press the “EXIT” key to exit from the setting mode to the operation mode.

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2.3.3 HI-Limit Resistance setting
Advance the menu to the HI-Limit parameter. The display will show:

HI-Limit = XXXX MΩ
Range : 1 - 9999

Use the “Numeric” keys to enter the HI-Limit setting, then press the “ENTER” key.
The program will store the HI-Limit setting and advance to the LO-Limit parameter
automatically. The unit is “MΩ” and 1 MΩ per step.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

2.3.4 LO-Limit Resistance setting

Advance the menu to the LO-Limit parameter. The display will show:

LO-Limit = XXXX MΩ
Range : 1 - 9999

Use the “Numeric” keys to enter the LO-Limit setting, then press the “ENTER” key.
The program will store the LO-Limit setting and advance to the Delay Time
parameter automatically. The unit is “MΩ” and 1 MΩ per step.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

2.3.5 Delay Time setting

Advance the menu to the Delay Time parameter. The display will show:

Delay Time = XXX.X s

Range : 0.5 - 999.9 0 = Constant

Use the “Numeric” keys to enter the Delay Time setting, then press the “ENTER”
key. The program will store the Delay Time setting and advance to the Scanner
Channel parameter automatically. The unit is “second” and 0.1 second per step.
Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

Delay Time selects the time when the instrument will compare actual readings to
the HI-Limit and LO-limit settings. This delay allows charging current to stabilize
before a test judgment is made. The capacitance of the DUT will dictate what delay
setting is required to perform an accurate IR measurement.

If the Delay Time is set to “0”, the test will continue until the “RESET” button is
pressed. The display will show the measured readings during the test. The timer
will continue to count the total test time and then will automatically reset to “0” and
start over.
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2.3.6 Scanner Channel setting model 7540DT, 7550DT and 7564SA
Advance the menu to the Scanner Set parameter. The display will show:

Scanner Set CH = 1 - 16
XXXXXXXXXXXXXXXX Note: X = H, O or L.

Use the “Numeric” keys to enter the status of High, Open or Low for each scanner
channel, then press the “ENTER” key. The program will store the Scanner Channel
status and advance to the Connection setting automatically. The following table is
the cross-reference of the numeric keys, which are used for the Scanner channel
setting.

Channel Status Numeric Key Description

H (High) 1 Connected to High Voltage Output
L (Low) 0 Connected to Return
O (Open) • Not connected to High Voltage or
Return

The Channel setting will start from Channel 1 on the left end and stop at Channel 16
on the right end (the 7540DT will display an 8 channel selection). The program will
set any unassigned channel(s) to OPEN automatically after pressing the “ENTER”
key. Therefore it is necessary to set only the channels that are required for the test.

If the Scanner is not installed, this setting is not necessary.

2.3.7 Step Connection setting

Advance the menu to the Connection parameter. The display will show:

Connect = ON or Connect = OFF

<ENTER> to Select <ENTER> to Select

Use the “ENTER” key to select the Step Connection mode, then press the “∧” or
“∨” key to advance the program to another test parameter or press the “EXIT” key
to exit from the setting mode to the operation mode.
If Connect is set to “ON”, the next step in the sequence will be executed. If
Connect is set to “OFF”, the test sequence will stop at this step.

If Step 8 is set to “ON” the test process will be connected to the first step of the next
Memory.

2.4 Ground Bond test setting model 7564SA only

Press the “GROUND” key and the display will show:

GND Set XXX.X s

MXX-X XX.XX A XXX mΩ Note: X = the numeric

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GND Set : Ground Bond test setting screen
XXX.X s : Dwell Time setting
MXX : Memory Program number
-X : Test Step number
XX.XX A : AC Output Current setting
XX.XX mΩ : High-Limit of Ground Continuity Resistance

Use the “∧” or “∨” arrow keys to progress through the test parameters menu. The
“∨” key will advance forward and “∧” key will advance backward. The sequential
forward menu items are Current, Voltage, HI-Limit, LO-Limit, Dwell Time,
Frequency, Scanner Set, Offset, Connect.

2.4.1 Output Current setting

Advance the menu to the Current parameter. The display will show:

Current = XX.XX A
Range : 3.00 - 30.00

Use the “Numeric” keys to enter the Current setting, then press the “ENTER” key.
The program will store the Current setting and advance to the Output Voltage
parameter automatically. The unit is “amps” and 0.01A per step.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

2.4.2 Output Voltage setting

Advance the menu to the Voltage parameter. The display will show:

Voltage = X.XX V
Range : 3.00 - 8.00

Use the “Numeric” keys to enter the voltage setting, then press the “ENTER” key.
The program will store the Voltage setting and advance to the HI-Limit parameter
automatically. The unit is “volt” and 0.01 volt per step. This setting controls the
open circuit voltage and does not take effect when the current is being regulated at
the Output Current setting.
Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

2.4.3 HI-Limit Ground Resistance setting

Advance the menu to the HI-Limit parameter. The display will show:

HI-Limit = XXX mΩ
Range : 0 - 600

Use the “Numeric” keys to enter the HI-Limit setting, then press the “ENTER” key.

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The program will store the HI-Limit setting and advance to the LO-Limit parameter
automatically. The unit is “mΩ” and 1 mΩ per step.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

2.4.4 Low Limit Ground Resistance setting

Advance the menu to the LO-Limit parameter. The display will show:

LO-Limit = XXX mΩ
Range : 0 - 600

Use the “Numeric” keys to enter the LO-Limit setting, then press the “ENTER” key.
The program will store the LO-Limit setting and advance to the Dwell Time
parameter automatically. The unit is “mΩ” and 1 mΩ per step.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

If the LO-Limit is set to “0”, the LO-Limit is disabled.

2.4.5 Dwell Time setting

Advance the menu to the Dwell Time parameter. The display will show:

Dwell Time = XXX.X s

Range : 0.5 - 999.9 0 = Constant

Use the “Numeric” keys to enter the Dwell Time setting, then press the “ENTER”
key. The program will store the Dwell Time setting and advance to the Frequency
selection parameter automatically. The unit is “second” and 0.1 second per step.
The display will show the elapsed time during the testing.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

If the Dwell Time is set to “0”, the timer will continue to count to the maximum test
time then reset to “0” and start over automatically. The test will continue until a
reset is executed or a failure occurs.

2.4.6 Frequency Selection

Advance the menu to the Frequency parameter. The display will show:

Frequency = 60 Hz or Frequency = 50 Hz
<ENTER> to Select <ENTER> to Select

Use the “ENTER” key to select the Output Frequency, then press the “∧” or “∨” key
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to advance the program to another test parameter setting or press the “EXIT” key to
exit from the setting mode to the operation mode.

2.4.7 Scanner Channel setting

Advance the menu to the Scanner Set parameter. The display will show:

Scanner CH = X
Range: 1-16 0 = OFF

Use the "Numeric” keys to enter the scanner channel number, then press the
“ENTER” key. The program will store the scanner channel number and advance to
the Offset parameter automatically.

If the Scanner is not installed, it is not necessary to enter this parameter.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

To operate from the front panel output connectors with the Scanner option installed,
the Scanner Channel must be set to “0” to receive accurate readings.

2.4.8 Offset setting

Advance the menu to the Offset parameter. The display will show:

Offset = XXX mΩ
<TEST> to Auto Set

This instrument can set the mΩ offset value by two different methods. One is the
Manual Offset and the other is Auto Offset.

For Manual Offset, use the “Numeric” keys to enter the mΩ Offset value and then
press the “ENTER” key. The program will store the mΩ Offset setting and advance
to the Connect setting. The range of mΩ Offset is from 0 to 200 mΩ. The unit is
“mΩ” and 1mΩ per step.

For Auto Offset, setup the test parameter of Output Voltage, Current and Frequency
and connect the test cables and/or test fixture to the instrument first. Then short
circuit the ends of the test cables. If the scanner is being used, the scanner channel
has to be set. Then press the “TEST” button. The program will activate the test
current and frequency that has been set for this memory-step. The display will
show:

Offset = XXX mΩ
<TEST> to Auto Set

The display will show the measured mΩ Offset value and the program will use this
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value for the Offset setting. Each step has its own individual Offset value and must
be set separately. This allows the user to compensate for different lead lengths
when using a scanner or external fixturing for Ground Bond testing.

Then press the “∧” or “∨” key to advance the program to another test parameter
setting or press the “EXIT” key to exit from the setting mode to operation mode.

2.4.9 Step Connection setting

Advance the menu to the Connection parameter. The display will show:

Connect = ON or Connect = OFF

<ENTER> to Select <ENTER> to Select

Use the “ENTER” key to select the Step Connection mode, then press the “∧” or
“∨” key to advance the program to another test parameter or press the “EXIT” key
to exit from the setting mode to the operation mode.

If Connect is set to “ON”, the next step in the sequence will be executed. If
Connect is set to “OFF”, the test sequence will stop at this step.

If Step 8 is set to “ON” the test process will be connected to the first step of the next
Memory.

3. System Parameter Settings

Use the “SETUP” key to progress through the menu of System Parameters.
Successive key presses will advance the menu forward. The sequential forward
menu items are: PLC Remote, Address, Contrast, Volume, Fail Stop.

The setting of system parameters affect the operating conditions of the instrument
and are separate from the functional settings. The system settings are also global
and are not specific to any memory location.

3.1 PLC Remote selection

Press the Setup key to advance to the PLC Remote parameter. The display will
show:

PLC Remote = ON or PLC Remote = OFF

<ENTER> to Select <ENTER> to Select

Use the “ENTER” key to select the mode PLC Remote Control.

After selecting PLC Remote mode, press the “SETUP” key to advance to the
address setting if the GPIB interface card is installed on this instrument. If this
instrument does not have the GPIB interface card, the program will advance to the
contrast setting, or press the “EXIT” key to exit from the PLC Remote selection to
the operation mode. The instrument will store the selection of PLC Remote
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automatically.

If the Remote Control is set to “ON”, the test function will be controlled by the
“Remote Control” via the remote connectors located on the rear panel. The “TEST”
button on the front panel is disabled but the “RESET” button is still enabled.

The remote Memory Program recall functions can be performed only when the PLC
Remote is set “ON”. In addition, when the PLC remote is set to ON the remote
TEST signal input is active while in the Bus Remote Mode.

If the Remote Control is set to “OFF”, the operation of the instrument will be
controlled by the local “TEST” and “RESET” buttons on the front panel.

3.2 GPIB Address setting model 7550DT and 7564SA only

If the GPIB interface card is not installed on this instrument, this setup program will
not appear on the setup menu.

Press the Setup key to advance the menu to the address parameter. The display will
show:

Address = XX
Range : 0 - 30

Use the “Numeric” keys to enter the GPIB Address number, then press the
“ENTER” key and the display will show the current address immediately.

Press the “SETUP” key to advance to the Contrast setting, or press the “EXIT” key
to exit from the address setting to the operation mode. The program will store the
address setting automatically.

3.3 LCD Contrast setting

Press the Setup key to advance the menu to the Contrast parameter. The display
will show:

Contrast = X
Range : 1 - 9 9 = High

Use the “Numeric” keys to enter the LCD Contrast level, then press the “ENTER”
key. The program will change the LCD Contrast immediately when the “ENTER”
key is pressed, so the setting can be viewed.

Change the LCD Contrast again or press the “SETUP” key to advance to the
Volume setting, or press the “EXIT” key to exit from the LCD Contrast setting to
the operation mode. The program will store the Contrast setting automatically.

The LCD Contrast level is from 1 - 9, a total of 9 levels. Level 1 is the lowest

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contrast and level 9 is the highest contrast.
3.4 Audible Alarm Volume setting
Press the Setup key to advance the menu to the Volume parameter. The display will
show:

Volume = X
Range : 0 - 9 0 = OFF 9 = High

The Audible Alarm Volume level is from 0 - 9, a total 10 levels. Level 0 is used to
disable the Audible Alarm. Level 1 is the lowest volume and level 9 is the loudest.

Use the “Numeric” keys to enter the Audible Alarm level, then press the “ENTER”
key. The program will provide a sample sound for checking immediately when the
“ENTER” key is pressed.

Change the Volume again or press the “SETUP” key to forward to the Fail Stop
selection program, or press the “EXIT” key to exit from the Audible Alarm setting
to the operation mode. The program will store the Volume setting automatically.

3.5 Fail to Stop/Continue selection

Press the Setup key to advance the menu to the Fail Stop parameter. The display
will show:

Fail Stop = ON or Fail Stop = OFF

<ENTER> to Select <ENTER> to Select

Use the “ENTER” key to select the mode of Fail Stop.

After the selection of Fail Stop mode, press the “SETUP” key to advance to the
beginning of the menu (PLC Remote), or press the “EXIT” key to exit from the Fail
Stop selection to the operation mode. The Program will store the selection of Fail
Stop automatically.

This function is used when multiple steps have been connected. If the Fail Stop
mode is set “ON”, the test process will stop at the step that fails, or at the end of test
process. When there are unfinished steps to be completed, pressing the “TEST”
button will continue the test process at the next step. Pressing the “RESET” button
and then the “TEST” button will start the test process from the first step.

If the Fail Stop is set to “OFF”, the instrument will continue to complete the entire
test process even if there were failed steps during the test. The display will show
the results of each step at the end of test process, as follows:

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Test P F P F P F P F P F P F P F P F
Step 1 2 3 4 5 6 7 8 1 2 3 4 5 6 7 8

First Memory Program Second Memory Program

The pass fail status is indicated by the letter F (Fail) or P (Pass). The Pass/Fail
status of the first memory Program will show on the left end and the second one
will be on the right. The pass/fail status of the first 16 steps can be displayed. A
maximum of 16 steps will be saved. If more than 16 steps are executed in sequence.
Results from those steps greater than 16 cannot be retrieved from memory.

4. Operation Procedure

4.1 Setup
Before the operation of this instrument, make sure that all Test Parameters have
been set properly according to the Test Parameters Setup Procedures. Also, check
the system setting of Remote Control, LCD Contrast, the Alarm Volume and Fail
Stop.

Be sure to connect the appropriate test leads to the device under test (DUT) or test
fixture. Be sure to connect the safety ground (on the rear panel) to a suitable known
good ground before energizing this instrument. Then connect the return lead first to
the test fixture or the DUT followed by the high voltage lead.
Check your connections to be sure they are making good contact and that the test
station or area is clear of debris or other personnel.

WARNING DO NOT TOUCH THE DEVICE UNDER TEST ONCE THE

TEST HAS BEEN STARTED.

4.2 Power Up
Turn on the Input Power Switch. The display will show the Trade Mark, Model
Number and Version Number first, as follows:

ARI QUADCHEK II
7564SA VER : X.X Note: X = Numeric.

Then, all status LEDs will light up, and the Scanner status LEDs will light
sequentially if the internal scanner has been installed. The program will then recall
the Memory and Step that was last executed.

4.3 Settings Screen

The settings screen will show parameter settings of the test that will be performed
and the memory locations that they are stored in. This screen can be accessed after
a test is Aborted or Passed by pressing the “Reset” key, or after a test failure by

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pressing the “Reset” key twice. The Function is indicated on the left side of the first
line and the mode, or test result, is indicated just to the right of the Function. The
timer is always shown on the right side of the first line. The left side of the second
line always indicates the Memory and Step that has been selected and an underbar
character to the right of the step number indicates that the step has been connected
to the next step in sequence. The display will show the underbar as follows for an
ACW test, and step 1 connected to step 2:

ACW Set XXX.X s

M25-1_ X.XX KV XX.XX mA

The following are examples of the four types of Setting Screens before any test has
been executed.

If the first step selected is an AC Withstand test, the display will show:

ACW Set XXX.X s

M25-1 X.XX KV XX.XX mA

ACW Set : AC Withstand Voltage test setting screen

XXX.X s : Dwell Time setting
MXX : Memory Program number
-X : Test Step number
X.XX KV : AC Output Voltage setting
XX.XX mA : AC High-Limit current setting

If the first step selected is a DC Withstand test, the display will show:

DCW Set XXX.X s

M25-1 X.XX KV XXXX µA

DCW Set : DC Withstand Voltage test setting screen

XXX.X s : Dwell Time setting
MXX : Memory Program number
-X : Test Step number
X.XX KV : DC Output Voltage setting
XXXX µA : DC High-Limit current setting

If the first step selected is an Insulation Resistance test, the display will show:

IR Set XXX.X s
M25-1 XXXX V XXXX MΩ

IR Set : Insulation Resistance test setting screen

XXX.X s : Delay Time setting
MXX : Memory Program number
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-X : Test Step number
XXXX V : DC Output Voltage
XXXX MΩ : Low-Limit of Insulation Resistance

If the first step selected is a Ground Bond test, the display will show:

GND Set XXX.X s

M25-1 XX.XX A XXX mΩ
GND Set : Ground Bond test setting screen
XXX.X s : Dwell Time setting
MXX : Memory Program number
-X : Test Step number
XX.XX A : AC Output Current setting
XX.XX mΩ : High-Limit of Ground Continuity Resistance

4.4 Ground Continuity Test (7520DT, 7530DT, 7540DT and 7550DT)

If you are performing a Ground Continuity Check, the Ground Continuity must be
set to the “ON” (Enabled) position. The ground check cable must be connected
properly to the chassis of the DUT. The display will indicate “Ready” before
activating the “TEST” button. Otherwise, the instrument will signal a continuity
failure when the “TEST” button is activated. When continuity is “ON” and
continuity is Good the display will show:

ACW Ready XXX.X s

M25-1 X.XX KV XX.XX mA

If you are not performing a “Ground Continuity Check” the Ground Continuity must
be set to the “OFF” (Disabled) position. It is not necessary to connect the “Cont.
Check” cable since this test will not be performed if the circuit is disabled. The
instrument will proceed with the Hipot Test when the “TEST” button is activated.

Press the “TEST” button to activate the test process or press the “MEMORY” key
to recall the new Test Parameters for testing.

4.5 Smart GFI (Ground Fault Interrupt)

The High Voltage power supply of the instrument is internally referenced to earth
ground. The leakage current measuring circuits monitor only currents that flow
through the Return lead. Therefore, the possibility exists for current to flow directly
from the High Voltage output to earth ground that typically would not be monitored.

GFI is a circuit that monitors the current between the High Voltage output and earth
ground. The GFI's main purpose is to protect the operator from prolonged exposure
to High Voltage in the case of an accidental contact with the High Voltage lead and
earth ground. If the operator accidentally touches the High Voltage lead and earth
ground, the High Voltage will be shut off immediately and the test aborted. If the
GFI threshold is exceeded, the display will indicate a GND Fault.
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Smart GFI allows the user to automatically configure the instruments return
configuration. When the Return lead is earth grounded, the GFI circuit is disabled
and the instrument operates in a grounded return mode of operation. Grounded
Return allows the user to perform tests on devices that have their chassis earth
grounded by the test fixture or test environment. The standard configuration of the
instruments is a floating return connection that is not directly connected to Earth
ground. The standard configuration allows monitoring of very low level leakage
current without internal or external stray earth ground leakage currents being
measured and thereby causing errors in the reading. Grounding the return will
create some amount of leakage current that is proportional to the High Voltage
output and can cause small amounts of error depending on the test voltage and
physical environment.

4.6 Reviewing Test Results

The test results from the first 8 test that are executed can be reviewed by pressing
the “Enter/Review” key. Successive key presses will continue advancing to the next
result. The results of the last step in the process will be followed by the first step
when scrolling through the results.

If two or more memories are connected together (more than an 8 step process) then
only the first 8 steps executed in the process will be stored into the results memory.
The results from the steps executed after the first 8 steps in the process will not be
retrievable. Results can be reviewed at any time before the next test is executed.
All 8 buffers are cleared at the start of the next test cycle.

5. Displayed Messages

5.1 The following are the displayed messages for the Ground Bond test:
(Model 7564SA only)
If the test in process is Aborted with the “RESET” button or remote control, the
display will show:

GND Abort XXX.X s

MXX-X XX.XX A XXX mΩ

If the test in process is Aborted with the “RESET” button or remote control before
the meter readings are taken, the display will show:

GND Abort XXX.X s or GND Abort XXX.X s

MXX-X - - . - - A - - - mΩ MXX-X XX.XX A - - - mΩ

At the beginning of the Ground Bond test, before the meter readings are taken, the
display will show:

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GND Dwell XXX.X s
MXX-X - - . - - A - - - mΩ

During the Ground Bond test, when the values are being updated in real time, the
display will show:

GND Dwell XXX.X s

MXX-X XX.XX A XXX mΩ

If the DUT failed the HI-Limit of the Ground Bond test and the ground continuity
resistance is within the metering range, the display will show:

GND HI-Limit XXX.X s

MXX-X XX.XX A XXX mΩ

If the DUT failed the HI-Limit of the Ground Bond test and the ground continuity
resistance is beyond the metering range, the display will show:

GND HI-Limit XXX.X s

MXX-X 0.00 A > 600 mΩ

If the DUT resistance falls below the LO-Limit of the Ground Bond test, the display
will show:

GND LO-Limit XXX.X s

MXX-X XX.XX A XXX mΩ

If the GFI threshold is exceeded during of the Ground Bond test, the display will
show:

GND GND-Fault XXX.X s

MXX-X XX.XX A XXX mΩ

When the DUT passed the Ground Bond test when the test process is complete, the
display will show:

GND Pass XXX.X s

MXX-X XX.XX A XXX mΩ

5.2 The following are the displayed messages for the AC Withstand Voltage test:
If the test in process is Aborted with the “RESET” button or remote control, the
display will show:

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ACW Abort XXX.X s

MXX-X X.XX KV XX.XX mA

If the test in process is Aborted with the “RESET” button or remote control before
the meter readings are taken, the display will show:

ACW Abort XXX.X s or ACW Abort XXX.X s

MXX-X - . - - KV - - . - - mA MXX-X X.XX KV - - . - - mA

At the beginning of AC Withstand Voltage test when the voltage begins to ramp but
before the meter readings are taken, the display will show:

ACW Ramp XXX.X s

MXX-X - . - - KV - - . - - mA

During the AC Withstand Voltage test when the values are being updated in real
time during the ramp cycle, the display will show:

ACW Ramp XXX.X s

MXX-X X.XX KV XX.XX mA

During the AC Withstand Voltage test when the values are being updated in real
time during the dwell cycle, the display will show:

ACW Dwell XXX.X s

MXX-X X.XX KV XX.XX mA

If the ramp time is very short and the program has not read the meter readings, the
display will show:

ACW Dwell XXX.X s

MXX-X - . - - KV - - . - - mA

If the DUT current exceeds the HI-Limit of AC Withstand Voltage test and the
leakage current is within the metering range, the display will show:

ACW HI-Limit XXX.X s

MXX-X X.XX KV XX.XX mA

If the DUT current exceeds the HI-Limit of AC Withstand Voltage test and the
leakage current is not within the metering range, the display will show:

ACW HI-Limit XXX.X s

MXX-X X.XX KV > 40 mA

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If the DUT current is well beyond the metering range of AC Withstand Voltage test
the instrument assumes that the failure is due to a short circuit, the display will
show:

ACW Short XXX.X s

MXX-X - . - - KV > 40 mA

If the DUT current is well beyond the metering range of AC Withstand Voltage test
and an Arcing condition beyond the Arc Sense limit is indicated, the display will
show:

ACW Breakdown XXX.X s

MXX-X X.XX KV > 40 mA

If the DUT current falls below the LO-Limit of AC Withstand Voltage test the
display will show:

ACW LO-limit XXX.X s

MXX-X X.XX KV XX.XX mA

If the DUT current is within the metering range of the AC Withstand Voltage test
and an Arcing current exceeds the Arc-Sense limit and the Arc function is set to
“ON”, then an Arc failure has occurred and the display will show:

ACW Arc-Fail XXX.X s

MXX-X X.XX KV XX.XX mA

If the GFI threshold is exceeded during of the AC Withstand Voltage test, the
display will show:

ACW GND-Fault XXX.X s

MXX-X X.XX KV XX.XX mA

When the DUT passed the AC Withstand Voltage test, when the test process is
complete the display will show:

ACW Pass XXX.X s

MXX-X X.XX KV XX.XX mA

5.3 The following are the displayed messages for the DC Withstand Voltage test:
If the test in process is Aborted with the “RESET” button or remote control, the
display will show:

DCW Abort XXX.X s

MXX-X X.XX KV XXXX µA

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If the test in process is Aborted with the “RESET” button or remote control before
the meter readings are taken, the display will show:

DCW Abort XXX.X s or DCW Abort XXX.X s

MXX-X - . - - KV - - - - µA MXX-X X.XX KV - - - - µA

At the beginning of DC Withstand Voltage test when the voltage begins to ramp but
before the meter readings are taken, the display will show:

DCW Ramp XXX.X s

MXX-X - . - - KV - - - - µA

During the DC Withstand Voltage test when the values are being updated in real
time during the Ramp cycle, the display will show:

DCW Ramp XXX.X s

MXX-X X.XX KV XXXX µA

During the DC Withstand Voltage test when the values are being updated in real
time during the Dwell cycle, the display will show:

DCW Dwell XXX.X s

MXX-X X.XX KV XX.XX µA

If the Ramp time is very short and the program has not read the meter readings, the
display will show:
DCW Dwell XXX.X s
MXX-X - . - - KV - - - - µA

If the Ramp-HI function is enabled and the leakage current during the Ramp cycle
exceeds 10mA, then the display will show:

DCW Ramp-HI XXX.X s

MXX-X X.XX KV >9999 µA

If the leakage current during the Ramp cycle falls below the Charge -LO setting,
then the display will show:

DCW Charge-LO XXX.X s

MXX-X X.XX KV XXX.X. µA

If the DUT current exceeds the HI-Limit of DC Withstand Voltage test and the
leakage current is within the metering range, the display will show:

DCW HI-Limit XXX.X s

MXX-X X.XX KV XXXX µA
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If the DUT current exceeds the HI-Limit of DC Withstand Voltage test and the
leakage current is not within the metering range, the display will show:

DCW HI-Limit XXX.X s

MXX-X X.XX KV > 9999 µA

If the DUT current is well beyond the metering range of DC Withstand Voltage test
the instrument assumes that the failure is due to a short circuit, the display will
show:

DCW Short XXX.X s

MXX-X - . - - KV > 9999 µA

If the DUT current is well beyond the metering range of DC Withstand Voltage test
and an Arcing condition beyond the Arc Sense limit is indicated, the display will
show:

DCW Breakdown XXX.X s

MXX-X X.XX KV > 9999 µA

If the DUT current falls below the LO-Limit of DC Withstand Voltage test and the
leakage current is within the metering range, the display will show:

DCW LO-Limit XXX.X s

MXX-X X.XX KV XXX.X µA

If the DUT current within the metering range of the DC Withstand Voltage test and
an Arcing current exceeds the Arc-Sense limit and the Arc functions is set to ON
then an Arc failure has occurred and the display will show:

DCW Arc-Fail XXX.X s

MXX-X X.XX KV XX.X µA

If the GFI threshold is exceeded during of the DC Withstand Voltage test, the
display will show:

DCW GND-Fault XXX.X s

MXX-X X.XX KV XXX.X µA

When the DUT passed the DC Withstand Voltage test, when the test process is
complete the display will show:

DCW Pass XXX.X s

MXX-X X.XX KV XXXX µA

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5.4 The following are the displayed messages for the Insulation Resistance test:
If the test in process is Aborted with the “RESET” button or remote control, the
display will show:

IR Abort XXX.X s
MXX-X XXXX V XXXX MΩ

If the test in process is Aborted with the “RESET” button or remote control before
the meter readings are taken, the display will show:

IR Abort XXX.X s or IR Abort XXX.X s

MXX-X - - - - V - - - - MΩ MXX-X XXXX V - - - - MΩ

At the beginning of Insulation Resistance test when the voltage begins to ramp but
before the meter readings are taken, the display will show:

IR Delay XXX.X s
MXX-X - - - - V - - - - MΩ

During the Insulation Resistance test when the values are being updated in real time
during the Delay cycle, the display will show:

IR Delay XXX.X s
MXX-X XXXX V XXXX MΩ

If the leakage current during the Ramp cycle falls below the Charge -LO setting,
then the display will show:

IR Charge-LO XXX.X s
MXX-X - - - - V - - - - MΩ

If the DUT current exceeds the HI-Limit of Insulation Resistance test and the
resistance is within the metering range, the display will show:

IR HI-Limit XXX.X s
MXX-X XXXX V XXXX MΩ

If the DUT current exceeds the HI-Limit of Insulation Resistance test and the
resistance is not within the metering range, the display will show:

IR HI-Limit XXX.X s
MXX-X XXXX V > 9999 MΩ

If the DUT current falls below the LO-Limit of Insulation Resistance test and the

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resistance is within the metering range, the display will show:

IR LO-Limit XXX.X s
MXX-X XXXX V XXXX MΩ

If the DUT current falls below the LO-Limit of Insulation Resistance test and the
resistance is below the metering range, the display will show:

IR LO-Limit XXX.X s
MXX-X XXXX V < 1MΩ

If the GFI threshold is exceeded during of the Insulation Resistance test, the display
will show:

IR GND-Fault XXX.X s
MXX-X XXXX V XXXX MΩ

When the DUT passed the Insulation Resistance test, when the test process is
complete the display will show:

IR Pass XXX.X s
MXX-X XXXX V XXXX MΩ

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6. Connection Of Remote I/O

Two 9 pin “D” type connectors are mounted on the rear panel which provide
REMOTE-INPUT-OUTPUT control and information. These connectors mate with
standard 9 pin “D” subminiature connector provided by the user. The output mates
to a male (plug) connector while the input mates to a female (receptacle) connector.
For best performance a shielded cable should be used. To avoid ground loops the
shield should not be grounded at both ends of the cable. Suggested AMP part
numbers for interconnecting to the Remote I/O are shown below.

205204-4 PLUG SHELL WITH GROUND INDENTS

205203-3 RECEPTACLE SHELL
745254-7 CRIMP SNAP-IN PIN CONTACT (for plug)
745253-7 CRIMP SNAP-IN SOCKET CONTACT (for receptacle)
745171-1 SHIELDED CABLE CLAMP (for either plug or receptacle)
747784-3 JACKSCREW SET (2)

Remote Interface Rear Panel:

6.1 Signal Outputs on Remote I/O

The rear panel connector provides output signals to remotely monitor PASS, FAIL,
and PROCESSING conditions. These signals are provided by three normally open
internal relays that switch on to indicate the current condition of the tester. These
are normally open free contacts and will not provide any voltage or current. The
ratings of the contacts are 1A / 250 VAC ( 0.5 ADC ). The signal outputs are
provided on the 9 pin female type D connector. Below is a listing that indicates

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what conditions activate each pin. When a terminal becomes active the relay closes
thereby allowing the external voltage to operate an external device.

Pins 1 and 2 provide the PASS signal.

Pins 3 and 4 provide the FAIL signal.
Pins 5 and 6 provide the PROCESSING signal.
Pins 7, 8, and 9 are blank.

The following describes how the relays operate for each test condition.

PROCESSING - The relay contact closes the connection between pin (5) and pin (6)
while the instrument is performing a test. The connection is opened at the end of
the test.

PASS - The relay contact closes the connection between pin (1) and pin (2) after
detecting that the item under test passed all tests. The connection is opened when
the next test is initiated or the reset function is activated.

FAIL - The relay contact closes the connection between pin (3) and pin (4) after
detecting that the item under test failed any test. The connection is opened when the
next test is initiated or the reset function activated.

6.2 Signal Inputs of Remote I/O and Memory Programs

The HypotULTRA II or QUADCHEK II remote connector enables remote operation
of the TEST and RESET functions or allows the operator to select one of three pre-
programmed tests. When the remote function is (ON) the “TEST” switch on the
front panel will be disabled to prevent a test from being activated through the test
switch. A normally open momentary switch can then be wired across pins 3 and 5
to allow remote operation of the TEST function. A normally open momentary
switch can also be wired across pins 2 and 5 which allows remote operation of the
RESET function. For safety the front panel “RESET” switch remains active even
when a remote “RESET” switch is connected so that high voltage can be shut down
from either location.

The HypotULTRA II or QUADCHEK II also allow access to three MEMORY

PROGRAMS through the remote control connector. This gives the user the
capability to quickly change parameters and initiate a test remotely. The
HypotULTRA II or QUADCHEK II basically operates in a PLC mode by
responding to simple switch or relay contact closures. The built in memory
programs of the instrument are used to accomplish this. Three internal memory
programs can be accessed, by connecting terminals 7, 8 and 9 in different
combinations.

ACTIVATING MEMORY PROGRAM FUNCTIONS THROUGH THE

WARNING REMOTE CONNECTOR, SELECTS THE PROGRAM AND STARTS
THE TEST WHICH IS PREPROGRAMMED INTO THAT MEMORY

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DO NOT CONNECT VOLTAGE OR CURRENT TO THE SIGNAL
CAUTION INPUTS, THIS COULD RESULT IN DAMAGE TO THE CONTROL
CIRCUITRY.

MEMORY ONE - Momentarily connecting terminal 7 to 8 signals the instrument to

immediately begin the test program that is stored in memory one.

MEMORY TWO - Momentarily connecting terminal 7 to 9 signals the instrument

to immediately begin the test program that is stored in memory two.

MEMORY THREE - Momentarily connecting terminal 7 to terminals 8 and 9

signals the instrument to immediately begin the test program that is stored in
memory three.

7. Adapter Box Connection

The following diagram shows how to connect the adapter box to the HypotULTRA
II or QUADCHEK II and to the device under test.

7520DT, 7530DT, 7540DT, 7550DT and 7564SA

36541, 36544*
CONT/
CURRENT
G DUT
N
HV RTN
L

CHASSIS

Test Connections
*36544 Uses a High Voltage Modified NEMA 5-20R receptacle

The adapter box provides an easy way to connect an item that is terminated in a two
or three prong line cord. If you are testing a product which is terminated in a three
prong plug, you are also required to perform a continuity or ground bond test on the
ground conductor of the DUT to the chassis or dead metal of the product. With
HypotULTRA II, you can perform both the hipot and continuity tests at the same
time by activating the continuity function on the instrument.

When the HypotULTRA II tests the ground conductor of the line cord, if the
resistance of the ground conductor exceeds 1Ω, the hipot will signal a continuity
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 OPERATION
failure. If continuity is present, high voltage is applied to both conductors of the
line cord to insure that all current carrying conductors in the primary circuit are
tested. When testing products with two prong plugs, do not activate the continuity
circuit.

When the Ground Bond test is selected on the QUADCHEK II the High Current
will be applied through the Current lead to the Adapter box and flow back through
the Return lead. The resistance is measured and compared to the HI and LO- Limit
trip points stored in memory.

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8. Bus Remote Interface GPIB / RS-232

This section provides information on the proper use and configuration of the GPIB
and RS-232 interfaces. The GPIB (IEEE-488) remote interface is standard on
model 7550DT and 7564SA. The RS-232 interface is standard on the model
7520DT, 7530DT and 7540DT, and can be substituted for the GPIB interface on
models 7550DT and 7564SA. The RS-232 interface also uses the same command
list as the GPIB with the exception of the SRQ functions.

8.1 A Brief History of IEEE-488....

Hewlett-Packard designed in 1965 the Hewlett-Packard Interface Bus (HP-IB) to
connect their line of programmable instruments to computers. This bus had high
transfer rates (nominally 1 Mbytes/s), and thus quickly gained acceptance. Later, it
was accepted as the IEEE Standard 488-1975 and has since evolved into
ANSI/IEEE Standard 488.1-1987.

IEEE-488 has expanded over the years and is used with many more types of
computers and instruments than just HP. Because of this it is usually referred to as
the General Purpose Interface Bus, (GPIB).

8.2 GPIB Messages

There are typically two types of messages that GPIB devices use to communicate
with other interconnected GPIB devices;

Interface messages: often called commands or command messages and Device

dependent messages often called data or data messages.

Data Messages: contain information such as programming instructions or

measurement results. Command Messages perform functions such as initializing
the bus and addressing and unaddressing devices.

8.3 Functions
A GPIB device can be a Listener, Talker and/or Controller. A Talker sends data
messages to one or more Listeners, which receive data. A Controller manages the
information flow on the GPIB by sending commands to all devices. The GPIB bus
is much like a computer bus except a computer has circuit cards connected via a
backplane and the GPIB has stand alone devices connected via a cable.

8.4 Signals and Lines

The GPIB consists of 16 signal lines and 8 ground-return or shield drain lines. The
16 signal lines are grouped into 8 data lines, 3 handshake lines and 5 interface
management lines.

Data Lines: The eight data lines, DI01 through DI08 carry data and command
messages. The 7-bit ASCII or ISO code set is used and the eighth bit DI08 is unused.
Handshake Lines: The transfer of message bytes between devices is done via three

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asynchronously control lines. Referred to as three-wire interlocked handshake.
This guarantees that message bytes on the data lines are sent and received without
transmission error.

NRFD (not ready for data) indicates when a device is ready or not ready to receive
a message byte.

NDAC (not data accepted) indicates when a device has or has not accepted a
message byte.

DAV (data valid) tells when the signals on the data lines are stable (valid) and can
be accepted safely by devices.

Interface Management Lines: Five lines are used to manage the flow of information
across the interface.

ATN (attention) ATN is driven true by the controller when it uses the data lines to
send commands, and drivers ATN false when a Talker can send data messages.

IFC (interface clear) IFC is driven by the system controller to initialize the bus and
become CIC.

REN (remote enable) The REN line is driven by the controller that is used to place
devices in remote or local program mode.

SRQ (service request) The SRQ line can be driven by any device to
asynchronously request service from the Controller.

EOI (end or identify) This line has two purposes- the Talker uses this line to mark
the end of a message string, and the Controller uses it to tell devices to identify their
response in a parallel poll.

8.5 GPIB Connector

Connection is usually accomplished with a 24-conductor cable with a plug on one
end and a connector at the other end. Devices may be connected in a linear, star or
a combination configuration.

The standard connector is the Amphenol or Cinch Series 57 Microribbon or AMP

CHAMP type. The GPIB uses negative logic with standard transistor-transistor
logic (TTL) levels. When DAV is true, for example, it is a TTL low level (≤ 0/8 V),
and when DAV is false, it is a TTL high level (≥ 2.0 V).

Restrictions and Limitations on the GPIB

A maximum separation of 4 m between any two devices and an average separation
of 2 m over the entire bus.

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A maximum total cable length of 20 m.

No more than 15 device loads connected to each bus, with no less than two-thirds
powered on.
Note: A bus extender which is available from numerous manufacturers is available
to overcome these limitations.

8.6 Interface Functions

The capability of a device connected to the bus is specified by its interface
functions. These functions provide the means for a device to receive, process, and
send messages over the bus. The interface functions are listed in the chart below.
All functions may be controlled over the bus except input voltage which is
Selectable on the rear panel.

GPIB INTERFACE FUNCTIONS

IEEE-488 INTERFACE Complete handshake capability
Talker/Listener functions
Service request capability
No remote/local capability
No parallel poll capability
No device clear capability
No device trigger capability
No controller capability
3 state driver

CONTROLLABLE ITEMS Test/Reset control

Setting of test status/parameters for test
Display Reading
Results Reading

DATA CODES ASCII

DELIMITER CR + LF (+ EOI)

8.7 GPIB Address

Each device on the GPIB (IEEE-488) interface must have a unique address. You
can set the address of the 7564SA or 7550DT to any value between 0 and 30. The
address is set to “ 8 " when the instrument is shipped from the factory. The address
can only be set from the front panel. The address is stored in non-volatile memory
and does not change when the power has been off or after a remote interface reset.

8.8 RS-232 Interface

This interface may be substituted for the standard GPIB interface on model 7550DT
or 7564SA. This interface provides all of the function control of the GPIB interface
with the exception of the SRQ functions. All commands can be found in the
command list portion of the Operation section 8.9 of this manual.

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 OPERATION

The RS232 cabling should be configured as follows for a 9 pin serial port interface:

Instrument RS-232 Port PC / Bus Controller

RD 2 2 RD

TD 3 3 TD

SIG 5 5 SIG
GND GND

The COM port should have the following configuration. 9600 baud, 8 data bits, 1
stop bit, no parity. This interface does not support XON/XOFF protocol or any
hardware handshaking. The controller should be configured to ignore the
handshaking lines DTR (pin 4), DSR (pin 6) CTS (pin 8) and RTS (pin 7). If the
port can not be configured through software to ignore the lines then the handshake
lines should be jumpered together in two different sets. Pins 4 and 6 jumpered
together and pins 7 and 8 jumpered together at the controller end of the cable.

When sending command over the RS232 bus the instrument will echo a response
string identical to the string that was sent if the transfer was recognized and
accepted by the instrument. This allows for software handshaking, to monitor and
control data flow. If there is an error with the command string that is sent, the
instrument will respond with 15h or the “NAK” ASCII control code. When
requesting data from the instrument, it automatically send the data to the controller
input buffer. The controller input buffer will accumulate data being sent from the
instrument including the echo response string, until it is read by the controller

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8.9 Interface Bus Command List

The following commands are used to toggle ON/OFF functions or menu selection
items. No other values or parameters are needed to execute these commands.
However when using commands that are usable for a certain function only (function
specific), the appropriate function select command FC, FD, FE, or FF must be
executed first, to access the parameter for that function.

Command Function Function Specific

FA Test
FB Reset
FC ACW Function Select
FD DCW Function Select
FE IR Function Select
FF GND Function Select (7564SA only)
FG ACW/DCW: Continuity On (7550DT Only) x
FH ACW/DCW: Continuity Off (7550DT Only) x
FI ACW: 60Hz x
FJ ACW: 50Hz x
FK ACW: Arc Fail On x
FL ACW: Arc Fail Off x
FM DCW: Arc Fail On x
FN DCW: Arc Fail Off x
FO GND: 60hz (7564SA only) x
FP GND: 50hz (7564SA only) x
FQ Connect On
FR Connect Off
FS Fail Stop On
FT Fail Stop Off
FU GND: Auto Offset (7564SA only) x
FV DCW: Auto Charge-LO x
FW IR: Auto Charge-LO x
F0 Enable “All Pass” SRQ
F1 Disable “All Pass” SRQ
F2 Enable “Fail” SRQ
F3 Disable “Fail” SRQ
F4 Enable “Abort” SRQ
F5 Disable “Abort” SRQ
F6 Enable “Error Command” SRQ
F7 Disable “Error Command” SRQ
F8 DCW: Ramp-HI On x
F9 DCW: Ramp-HI Off x

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The following “S” commands will set test parameters on the instrument that require
numeric or alphanumeric input. To execute these commands, the appropriate
function must first be selected with the above Function Select command FC, FD,
FE, or FF, to have access to the parameter menu.

ACW
Command Parameter Value Unit
SA Voltage 0-5000 V
SB HI-Limit 0.00-40.00 mA
SC LO-Limit 0.000-9.999 mA
SD Ramp Time 0.1 - 999.9 S
SE Dwell Time 0, 0.3 - 999.9 S
SF Arc Sense 1-9 -
SG Scanner H=Hi,L=Low,O=Open -
up to 16 channels

DCW
Command Parameter Value Unit
SI Voltage 0-6000 V
SJ HI-Limit 0 - 3500 µA
SK LO-Limit 0.0 - 999.9 µA
SL Ramp Time 0.4 - 999.9 S
SM Dwell Time 0, 0.3 - 999.9 S
SO Charge-LO 0.0 - 350.0 µA
SP Arc Sense 1-9 -
SQ Scanner H=Hi,L=Low,O=Open -
up to 16 channels

IR
Command Parameter Value Unit
SS Voltage 100 - 1000 V
ST Charge-LO 0.000 - 9.999 µA
SU HI-Limit 0 - 9999 MΩ
SV LO-Limit 1 - 9999 MΩ
SW Delay-Time 0, 0.5 - 999.9 S
SX Scanner H=Hi,L=Low,O=Open -
up to 16 channels

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GND (7564SA only)

Command Parameter Value Unit
SY Current 3.00 - 30.00 A
SZ Volt 3.00 - 8.00 V
S0 HI-Limit 0 - 600 mΩ
S1 LO-Limit 0 - 600 mΩ
S2 Dwell Time 0.5 - 999.9 S
S3 Scanner 1 - 16 Channel
S4 Offset 0 - 200 mΩ

General Operation
Command Function Value Unit
S5 Memory Select 1 - 50 Integer
S6 Step Select (1-8) 1-8 Integer

When the Controller sends a correct “S" or “F" command the instrument will echo
back the identical command string if a GPIB read command is sent after the
command string.

If an error occurs when the command is sent the instrument will send an ASCII code
“15h" after the read command is sent.

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The following functions will read data from the instrument when executed. For
every command written, a corresponding read command of the appropriate byte
length (shown below) must be executed to retrieve the data from the instrument.

Command Read Data Read Bytes Description

Function
?1 Step Buffer 1 40 Read the 2 x 20 display results of
the first test executed.
?2 Step Buffer 2 40 Read the 2 x 20 display results of
the second test executed.
?3 Step Buffer 3 40 Read the 2 x 20 display results of
the third test executed.
?4 Step Buffer 4 40 Read the 2 x 20 display results of
the fourth test executed.
?5 Step Buffer 5 40 Read the 2 x 20 display results of
the fifth test executed.
?6 Step Buffer 6 40 Read the 2 x 20 display results of
the sixth test executed.
?7 Step Buffer 7 40 Read the 2 x 20 display results of
the seventh test executed.
?8 Step Buffer 8 40 Read the 2 x 20 display results of
the eighth test executed.
?A Ground Bond 5 Read the Ground Offset Setting
Offset G-Bond mode must be active.
?B DCW Charge-LO 5 Read the DCW Charge-LO Setting.
DCW mode must be active.
?C IR Charge-LO 5 Read the IR Charge-LO Setting
IR mode must be active.
?D Remote Reset 1 01 hex = Reset ON
Status 00 hex = Reset OFF
?K LCD Display 40 Read the 2 x 20 display in real time
or after the test.

If an error occurs when the command is sent the instrument will send an ASCII code
“15h" after the read command is sent.

8.10 GPIB Service Request

The service request capability is not available with the RS-232 interface. The
service request status byte can be read from the instrument only after one or more of
the service request functions have been enabled. The status byte bit assignments are
as follows.

BIT 7 6 5 4 3 2 1 0
Function NA RQS NA NA ERROR ABORT FAIL PASS

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The appropriate SRQ bit will be active, or 1 when the SRQ function has been
enabled and the condition is true. Bit 6 is the RQS bit and will be active when the
instrument has detected that an enabled SRQ event has occurred and therefore has
requested service. Bit 4, 5, and 7 are not used and will be set to false, or 0 for all
status byte reads.

After the status byte has been read from the instrument the RQS bit will be cleared
to 0, and the remaining bits will remain unchanged. The status byte will not change
value until the next time service is requested.

For example after the All Pass SRQ has been enabled, when the test(s) have
finished with pass indications the instrument will set the hardware SRQ line and
output the status byte of 41 hex. This means that bit 6 and bit 0 are set to a value of
1. After reading the status byte the status byte value will change to 01 hex and
remain at 01 hex until next time service is requested.

8.11 Example of communicating over the IEEE bus

To write commands over the IEEE bus you must enter the code that is specific to
the software language you are using. Then follow the example below:

To set the output voltage across the IEEE bus at 1240 volts do the following. First
select the ACW mode by sending the string “FC” then send the string “SA 1240”:
This tells the instrument to set the AC voltage at 1240 volts. A string is a list of
ASCII characters, octal or hex bytes or special symbols, enclosed in double quotes.

If the Test Function has already been selected to ACW mode and you wish to set the
ramp time of the ACW test across the IEEE bus at 10 seconds, do the following,
send the string “SD 10.00”. This tells the instrument to set the AC Ramp Time at
10.00 seconds.

To set outputs 1 & 2 of the scanner to High, outputs 3 & 4 to Low and outputs 4-8
to Off type in the following string, “SGHHLLOOOO”, after the ACW Test
Function has been selected. All ports not being specifically set will automatically
be set to “O” open.

To read the 2 x 20 display, first send the string “?K” then send the GPIB command
to read 40 bytes. The instrument will send 40 bytes, one byte for each character on
the display, including spaces.

8.12 Non Volatile Memory

The instrument saves each parameter in non-volatile memory when the parameter is
changed. The non-volatile memory has a limited write cycle life, therefore there is a
special volatile memory location that is available for programmers who wish to send
all parameters before executing each test. Memory 50, step 8 is the memory
location that will NOT write the parameter to non-volatile memory. Settings

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written to this location from GPIB mode will be lost when power is shut down.
Parameter changes to this location is unlimited and will not effect the life of the
internal non-volatile memory chip.

FOR MORE INFORMATION ON IEEE (GPIB) PLEASE CONTACT:

The Institute of Electrical and Electronic Engineers, Inc.

345 East 47th Street,
New York, NY 10017

! 1-212-705-7018 (Communications Society of IEEE)

Internet: http://www.ieee.org

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 OPTIONS

Models 7520DT, 7530DT, 7540DT, 7550DT, and 7564SA

OPTIONS

Introduction

This section contains a list and descriptions of available factory installed options at the
time of this printing. The list of options contains an option code number that can be
referenced on the rear panel of the unit.

Option Label

On the rear panel of the instrument you will find a label that contains the option code.

For example your options code would appear as follows:

fitted with option 01 .............................................................. OPT: 01
fitted with option 01 and 02.................................................... OPT: 0102

7520DT, 7530DT, 7540DT, 7550DT, 7564SA Options

Options
Code Description 7520DT 7530DT 7540DT 7550DT 7564SA
01 8 Port Scanner No No Yes Yes Yes
02 Real Current Yes Yes Yes Yes Yes
05 RS232 Interface Standard Standard Standard Yes Yes
06 Dual Remote Test Yes Yes Yes Yes Yes
Switches
08 Printer Port Yes Yes Yes Yes Yes
10 GPIB Yes Yes Yes Standard Standard
11 Remote Interlock Yes Yes Yes Yes Yes
12 Enhanced Ramping Yes Yes Yes Yes Yes
14 3 mAAC Output Yes Yes Yes Yes Yes

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 OPTIONS
Description

01 8 Port Scanner
The Scanner option provides 8 high voltage ports and 8 ground bond ports on the
rear panel. The High Voltage Ports can be set to a High or Low level giving the
capability to test from one port to another port or from any port to a common Low
or Return point. The ports can be connected in parallel if desired but there is only
one leakage current measurement for all ports. The ground bond ports can test only
from one port to the common Return and only one port may be used for each test.

The common (G-COM.) connection of the ground bond outputs should be used
when a ground bond test requires a different Return point than the high voltage test
points require. The ground bond test will be performed between the output channel
selected and the ground bond common terminal. When an output channel is
selected, the Current output terminal is connected to the output channel, and the
Return output terminal is connected to the G-COM. terminal. The G-COM.
terminal is connected to the main Return output during ground bond operation, but
is disconnected from the main Return during high voltage operation. The Kelvin
connection (voltage sensing) point on the ground bond scanner is connected directly
to the ground bond output channels CH1- CH8 and the G-COM connections at the
output terminals. True 4-wire measurement through the scanner is not possible
because of the Kelvin lead termination but the milliohm offset feature should be
used to reduce measurement errors of the actual DUT.

Although the G-COM connection of the ground bond outputs provides separation
from the main Return lead output during the high voltage withstand, or insulation
resistance tests, the ground bond channels can be used to perform ground bond tests
referenced directly to the main Return lead without using the G-COM terminal for
return separation. However when using the main Return lead during scanner
applications the Return lead Kelvin connection point is not effective. The Return
lead Kelvin connection is terminated at the alligator clip of the test lead but the G-
COM terminal has an internal Kelvin connection that shorts out the test lead Kelvin
connection. Therefore the resistance of the Return test lead will be measured during
the test and should be offset using the milliohm offset feature to reduce
measurement errors of the actual DUT.

These high current connections can be disregarded for interconnection to

HypotULTRA II.

Descriptions for operating the scanner are contained within the standard operating
and setup procedures. The additional accessories provided come complete with
assembly instructions. Please refer to the instructions when installing the scanner
port connections.

The scanner will provide output to multiple test points and will have the same
operation specifications that apply to the standard instrument with the exception of

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 OPTIONS
one Ground Bond port limitation. Due to the characteristics of general-purpose High
Current relays, there is some additional contact resistance that can not be prevented.
Although this contact resistance can be offset using the milliohm offset feature of the
instrument, there will be some variation of the contact resistance because the relay
must open and close. Each relay closure may represent a different resistance value.
The Ground Bond ports will have the following characteristics:

Ground Bond Port Resistance Deviation

Deviation (Relay Test Current
Contact)
6mΩ maximum ≥10A

02 Real Current
The Real Current option allows the user to monitor only the real portion of the
leakage current and ignore any reactive components due to capacitance in the device
under test. It is important to recognize that the total current is the vector sum of the
reactive and real current, not the direct addition of the two components. As in a
right triangle, the total current is the square root of the sum of the squares of the real
and reactive currents.

Since the real component is usually much smaller than the reactive current, a
doubling of the real current increases the total current by only a small amount.
Unless the two components are separated, a doubling of the real leakage current can
go virtually undetected by a total current measurement.

The Associated Research Real Current option allows the operator to view either real
or total current. The real current and total current cannot be measured or monitored
simultaneously.

The specifications for the Real Current Option are as follows

AC Withstand Test Mode Real Current

Current Display Range: 0.00 - 10.00mA
Resolution: 0.01 mA
Accuracy: ±(3% of reading + 5 counts)
HI-Limit and LO-Limit Range: 0.00 - 10.00mA
Resolution: 0.01 mA
Accuracy: ±(3% of setting + 5 counts)

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 OPTIONS
Setup
The Real current or Total current mode can be selected from the ACW menu. The
second item of the menu will select the mode by pressing the Enter key. The
display will show:

Current = Total Current = Real

<ENTER> to Select or <ENTER> to Select
Displays
The following displays are active when the Real Current Mode has been selected.
The Setup display indicates the metering mode in the top center of the display.

ACW Set Real XXX.X s ACW Set Total XXX.X s

M25-1 X.XX KV XX.XX mA or M25-1 X.XX KV XX.XX mA

The metering mode will indicate the metering mode by displaying ACR for Real
current or ACT for Total current during all Run or Results screens. An example of
a Pass result is as follows:

ACR Pass XXX.X s ACT Pass XXX.X s

M25-1 X.XX KV XX.XX mA or M25-1 X.XX KV XX.XX mA

Trip Point
The HI-Limit and LO-Limit have the same functionality as the standard instrument
and only one value will be store for each step location. The value will represent
either Total current or Real current (not both) depending on what mode has been
selected for current metering. If a value greater the 10 mA has been pre set for the
HI-Limit value before switching to Real current mode the HI-Limit value will
automatically change to 10.00mA because of the limited current range in Real
current mode.

GPIB Commands
The following chart is a list of additional GPIB Commands that are added to the
command list when the Real Current option is installed. The additional commands
are as follows:

Real Current GPIB Commands

Command Function
FZ0 Total Current
FZ1 Real Current

05 RS232 Interface
This option may be substituted for the standard GPIB interface. This option
provides all of the function control of the GPIB interface with the exception of the
SRQ functions. All commands can be found in the GPIB portion of the Operation
section of this manual.

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 OPTIONS

The RS232 cabling should be configured as follows for a 9 pin serial port interface:

7564SA/7550DT PC / Bus Controller

RD 2 2 RD

TD 3 3 TD

SIG 5 5 SIG
GND GND

The COM port should have the following configuration. 9600 baud, 8 data bits, 1
stop bit, no parity. This interface does not support XON/XOFF protocol or any
hardware handshaking. The controller should be configured to ignore the
handshaking lines DTR (pin 4), DSR (pin 6) CTS (pin 8) and RTS (pin 7). If the
port can not be configured through software to ignore the lines then the handshake
lines should be jumpered together in two different sets. Pins 4 and 6 jumpered
together and pins 7 and 8 jumpered together at the controller end of the cable.

When sending command over the RS232 bus the 7564SA/7550DT will echo a
response string identical to the string that was sent if the transfer was recognized
and accepted by the instrument. This allows for software handshaking, to monitor
and control data flow. If there is an error with the command string that is sent, the
instrument will respond with 15h or the “NAK” ASCII control code. When
requesting data from the instrument, it automatically send the data to the controller
input buffer. The controller input buffer will accumulate data being sent from the
instrument including the echo response string, until it is read by the controller.

06 Dual Remote Test Switches

The Dual Remote Test Switch option allows the user to configure dual palm
switches for safe production line operation.
Please press the Setup key to open the Setup menu. The display will show:

PLC Remote = ON PLC Remote = OFF

< Enter > to Select or < Enter > to Select

Please scroll through the Setup setting until display will show:

Dual Test = ON Dual Test = OFF

< Enter > to Select or < Enter > to Select

To activate the option please select PLC Remote = ON and Dual Test = ON.
The rear panel remote interface is reconfigured to allow two test switches instead of
the standard reset and test inputs. The two test switches have to be pressed within
0.5 seconds to activate the test process. The two test switches must remain closed to

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 OPTIONS
continue the test. If either of the test switches is released, the process will be shut
down immediately. The functions of the Test and Reset switches on the front panel
will be disabled if the dual test switches are enabled. If the dual test switches
operation is disabled by the selection Dual Test = OFF, then the functions of front
and rear panel Test and Reset switches will remain the same as the standard
instrument, and are controlled by the PLC Remote On/Off selection.

08 Printer Port Option

This option allows the instrument to generate hardcopy printout of the test results.
The printout can be configured to print automatically with each test, or manually by
pressing a front panel key. There is also capability to enter a serial number
identifier to each test, that increments automatically after each test is performed.
The test can be further configured to print only results from tests that have failed or
to print all test results from every test performed.

The Printer Port is a parallel interface and should be compatible with most parallel
printers. The printer port output uses simple ASCII characters and control codes.
Simply connect the printer to the instrument and configure the printer output using
the Setup menu. The following sections describe the setup procedures for
configuring the printer output.

1. Auto Print
Please press the Setup key to enter the Setup menu. Press the setup key four more
times to scroll to the Auto Print selection the screen will show:

AUTO Print = ON AUTO Print = OFF

<ENTER> to Select <ENTER> to Select

To configure Autoprinting press the ENTER key to change the selection. When
Auto Print = ON the printer output will generate data every time the test has
completed, and will also enable two other menus to configure the Print Mode and
the Print Number. When Auto Print = OFF the user must press the LOCAL/PRN
key on the lower left section of the keypad to generate printer output.

When the LOCAL/PRN key is pressed after the test is completed the printer output
will be duplicate of the front panel LCD test results. This key should only be used
to retrieve test results after the test has been completed. Although the output will
print the LCD screen during a test, the actual elapsed test time may be effected
when printing while the test is active.

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 OPTIONS
2. Print Mode
Please press the Setup key. This menu selection is only available when Auto Print
has been enabled, when Auto Print = ON the screen will show:

Print Mode = All Print Mode = Fail

<ENTER> to Select <ENTER> to Select

The printer output will generate the 40 character LCD display test results when the
test is complete. This selection will determines when the 40 character output will
print. When Print Mode = All the printer output will print the test results from
every test performed. When Print Mode = Fail only the test that have failed will be
printed. The Print Number or Serial number will print for every test, followed by
the appropriate test results depending on the Print Mode that has been selected.

3. Print Number
Please press the Setup key. This menu selection is only available when Auto Print
has been enabled, when Auto Print = ON the screen will show:

Print NO. = 0
Range : 0 - 9999

The print number is used to identify each test result. The number can be set to
match the exact serial number or some portion of actual serial number of the item
under test or just used as an identifier or tracking number. Type in the desired
starting number in the range from 0 -9999. This number will increment as each test
is performed. The next number that will be used can be viewed from this menu at
any time after a test has been completed. This number is not save as part of the
non-volatile memory setup parameters. Therefore each time the power to the
instrument is turned off, the number will be reset to 0.

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 OPTIONS

4. Sample Printer Outputs

Sample printer output with the Sample printer output of the same
following setup: test results, but the
Auto Print = ON and Print Mode = Fail. In this case the
Print Mode = All and test number of every test is printed
Print No. = 1000 but fail result details are printed
only when a failure occurs.
NO. 1000
ACW Pass 1.0s NO. 1000
M 1_1 5.00KV 0.000mA NO. 1001
ACW Hi-Limit 0.5s
NO. 1001 M 1_1 5.00KV 10.21mA
ACW Hi-Limit 0.5s
M 1_1 5.00KV 10.21mA NO. 1002
NO. 1003
NO. 1002
ACW Pass 1.0s
M 1_1 5.00KV 0.000mA

NO. 1003
ACW Pass 1.0s
M 1_1 5.00KV 0.000mA

10 GPIB Interface
This option may be substituted for the RS232 interface in the 7520DT, 7530DT and
the 7540DT. This option provides all of the function control of the RS232 interface
with the addition of SRQ functions. All commands can be found in the GPIB
portion of the Operation section of this manual (reference page 74)

11 Remote Interlock
Option 11 is a Remote Interlock feature that inverts the present reset logic on the
instrument from normally opened (must close contacts to activate the reset) to
normally closed (must open contacts to activate the reset). Hardware and software
have been reconfigured to provide the interlock connections on pins 4 and 5 of the
Remote Interface, Signal Input port. This reset scheme is designed for use with an
external safety interlock device that utilizes a "Fail-When-Open" configuration on
its output interface. The instrument can still be used without the external reset
device as long as the Interlock Connector 38075 (provided with unit) is plugged into
the Remote Interface, Signal Input port. If there is nothing connected to the Remote
Interface, Signal Input port to provide a connection to the interlock (reset), then the
instrument will not function. Please refer to page 69 for further information about
the remote interface.

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 OPTIONS
The following is a list of additional GPIB commands that may be used with the
Remote Interlock option. All other GPIB commands can be found in the GPIB
portion of the Operation section of this manual.

Remote Interlock GPIB Commands

Command Read Data Read Bytes Description
Function
?E Interlock Status 1 01 hex = Interlock closed
Command 00 hex = Interlock open

12 Enhanced Ramping
AC Ramp Down
The AC ramp down feature allows the AC voltage applied to the DUT, to be
reduced linearly over a specified period at the end of a hipot test. There are three
set up screens associated with this feature that will allow control of Ramp-Up,
Dwell, and Ramp-Down.
The setup screens will appear as follows:

Ramp Up = XXX.X s
Range : 0.1 - 999.9

Use the “Numeric” keys to enter the Ramp Up time setting, then press the
“ENTER” key. The program will store the Ramp Up Time setting and advance to
the Dwell Time parameter automatically. The unit is “second” and 0.1 second per
step.

Dwell Time= XXX.X s

Range : 0.3 - 999.9 0=Constant

Use the “Numeric” keys to enter the Dwell time setting, then press the “ENTER”
key. The program will store the Dwell Time setting and advance to the Ramp
Down Time parameter automatically. The unit is “second” and 0.1 second per step.

Ramp Down = XXX.X s

Range : 0.0 - 999.9

Use the “Numeric” keys to enter the Ramp Down time setting, then press the
“ENTER” key. The program will store the Ramp Down Time setting and advance
to the Frequency parameter automatically. The unit is “second” and 0.1 second per
step.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

Displayed messages for Enhanced AC Ramping

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 OPTIONS
At the beginning of AC Withstand Voltage test when the voltage begins to ramp but
before the meter readings are taken, the display will show:

ACW Ramp-up XXX.X s

MXX-X - . - - KV - - . - - mA

During the AC Withstand Voltage test Ramp-up, the display will show the values
being updated in real time as follows:

ACW Ramp-up XXX.X s

MXX-X X.XX KV XX.XX mA

During the AC Withstand Voltage test dwell cycle, the display will show the values
being updated in real time as follows:

ACW Dwell XXX.X s

MXX-X X.XX KV XX.XX mA

If the ramp time is very short and the program has not read the meter readings, the
display will show:

ACW Dwell XXX.X s

MXX-X - . - - KV - - . - - mA

At the end of the dwell cycle when the voltage begins to ramp down, the display
will show the values being updated in real time as follows:

ACW Ramp-down XXX.X s

MXX-X X.XX KV XX.XX mA

NOTE: In order to view the ACW values measured during the dwell cycle the
review key must be pressed.

DC Ramp Down
The DC ramp down feature allows the DC voltage applied to the DUT (or stored in
the DUT), to be reduced linearly over a specified period at the end of a hipot test.
There are three set up screens associated with this feature that will allow control of
Ramp-Up, Dwell, and Ramp-Down.
The setup screens will appear as follows:

Ramp Up = XXX.X s
Range : 0.4 - 999.9

Use the “Numeric” keys to enter the Ramp Up time setting, then press the
“ENTER” key. The program will store the Ramp Up Time setting and advance to

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 OPTIONS
the Dwell Time parameter automatically. The unit is “second” and 0.1 second per
step.

Dwell Time= XXX.X s

Range : 0.3 - 999.9 0=Constant

Use the “Numeric” keys to enter the Dwell time setting, then press the “ENTER”
key. The program will store the Dwell Time setting and advance to the Ramp
Down Time parameter automatically. The unit is “second” and 0.1 second per step.

Ramp Down = XXX.X s

Range : 1.0 - 999.9 0=OFF

Use the “Numeric” keys to enter the Ramp Down time setting, then press the
“ENTER” key. The program will store the Ramp Down Time setting and advance
to the Frequency parameter automatically. The unit is “second” and 0.1 second per
step.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

Displayed messages for Enhanced DC Ramping

At the beginning of DC Withstand Voltage test when the voltage begins to ramp but
before the meter readings are taken, the display will show:

DCW Ramp-up XXX.X s

MXX-X - . - - KV - - - - µA

During the DC Withstand Voltage test Ramp-up, the display will show the values
being updated in real time as follows:

DCW Ramp-up XXX.X s

MXX-X X.XX KV XXXX µA

During the DC Withstand Voltage test dwell cycle, the display will show the values
being updated in real time as follows:

DCW Dwell XXX.X s

MXX-X X.XX KV XX.XX µA

If the Ramp time is very short and the program has not read the meter readings, the
display will show:

DCW Dwell XXX.X s

MXX-X - . - - KV - - - - µA

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 OPTIONS

At the end of the dwell cycle when the voltage begins to ramp down, the display
will show the values being updated in real time as follows:

DCW Ramp-down XXX.X s

MXX-X X.XX KV XXXX µA

NOTE: In order to see the DCW values measured during the dwell cycle the review
key must be pressed.

IR Ramp Down
The IR ramp down feature allows the IR voltage applied to the DUT, to be reduced
linearly over a specified period at the end of an insulation resistance test.
There are three set up screens associated with this feature that will allow control of
Ramp-Up, Dwell, and Ramp-Down.
The setup screens will appear as follows:

Ramp Up = XXX.X s
Range : 0.1 - 999.9

Use the “Numeric” keys to enter the Ramp Up time setting, then press the
“ENTER” key. The program will store the Ramp Up Time setting and advance to
the Dwell Time parameter automatically. The unit is “second” and 0.1 second per
step.

Delay Time= XXX.X s

Range : 0.5 - 999.9 0=Constant

Use the “Numeric” keys to enter the Dwell time setting, then press the “ENTER”
key. The program will store the Dwell Time setting and advance to the Ramp
Down Time parameter automatically. The unit is “second” and 0.1 second per step.

Ramp Down = XXX.X s

Range : 1.0 - 999.9 0=OFF

Use the “Numeric” keys to enter the Ramp Down time setting, then press the
“ENTER” key. The program will store the Ramp Down Time setting and advance
to the Frequency parameter automatically. The unit is “second” and 0.1 second per
step.

Press the “EXIT” key to exit from the setting mode to the operation mode if all
parameters have been set.

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 OPTIONS
Displayed messages for Enhanced IR Ramping
At the beginning of an Insulation Resistance test when the voltage begins to ramp
but before the meter readings are taken, the display will show:

IR Ramp-up XXX.X s
MXX-X XXXX V - - - - MΩ

NOTE: The Insulation Resistance display reading will remain blank until the
minimum Insulation Resistance Voltage has been reached.
During the Insulation Resistance test delay cycle, the display will show the values
being updated in real time as follows:

IR Delay XXX.X s
MXX-X XXXX V XXXX MΩ

At the end of the delay cycle, when the voltage begins to ramp down, the display
will show the last value measured during the delay cycle and the actual voltage
value as the voltage is ramping down:

IR Ramp-down XXX.X s
MXX-X XXXX V XXXX MΩ

NOTE: In order to see the IR values measured during the delay cycle the review
key must be pressed.

GPIB Commands
The following chart is a list of additional GPIB Commands that are added to the
command list when the Enhanced Ramping option is installed. The additional
commands are as follows:

Enhanced Ramping GPIB Commands

Command Parameter Value Unit
S7 ACW Ramp Down XXX.X S
S8 DCW Ramp Down XXX.X S
S90 IR Ramp Up XXX.X S
S91 IR Ramp Down XXX.X S

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 OPTIONS
14 3 mAAC Output
The 3 mAAC option limits the output current with both hardware and software control.
The trip points of AC mode are adjusted to a maximum of 3mA and the hardware has
been modified so the high-speed maximum current shutdown is fixed at 3mA. All other
specifications remain the same.
The revised Dielectric Withstand Test Mode specifications are as follows.

DIELECTRIC WITHSTAND TEST MODE

Output Rating 5 KV @ 3 mA AC
6 KV @ 10 mA DC for 75(30, 40, 50)DT and 7564SA
HI-Limit AC Range: 0.00 - 3.00 mA
Resolution: 0.01 mA/step
Accuracy: ± (2% of setting + 2 counts)
DC Range: 0 - 9999µA
Resolution: 1µA/step
Accuracy: ± (2% of setting + 2 counts)
LO-Limit AC Range: 0.000 - 3.000 mA
Resolution: 0.001 mA/step
Accuracy: ± (2% of setting + 2 counts)
DC Range: 0.0 - 999.9 µA
Resolution: 0.1 µA/step
Accuracy: ± (2% of setting + 2 counts)
Current Display Auto Range
AC Range 1: 0.000mA - 3.000mA
Resolution: 0.001mA/step
DC Range 1: 0.0 µA - 350.0 µA
Resolution: 0.1 µA/step
Range 2: 300 µA - 3500 µA
Resolution: 1 µA/step
Range 3: 3000 µA - 9990 µA
Resolution: 10 µA/step
Accuracy: All Ranges ± (2% of reading + 2 counts)

96
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 OPTIONS

SECTION 2
SERVICE MANUAL

98
 CALIBRATION
CALIBRATION PROCEDURES

To enter the Calibration Mode

Press the “0”and “1” keys simultaneously and then turn the input power switch on.
The program will automatically enter to the calibration mode and the display screen
will show:

Calibration Mode
∨ : Forward ∧ : Backward

Use the “∨” (Forward) and “∧” (Backward) keys to move through the calibration
menu. The following instructions follow the sequential Forward scrolling through
the menu.

1. Password setting
Press the “∨” key, the program will advance to the Password setting mode. The
display will show:

Password = 0 or Password = X X X X
Range : 0 - 9 9 9 9 Range : 0 - 9 9 9 9

The Password can be any four (4) digit number. If the Password is set to “0”, the
keyboard lock out will be selected by the LOCK key on the front panel without a
Password. The Password default is preset to “0” at the factory.

2. Memory Lock selection

Press the “∨” key, the program will advance to the Memory Lock selection mode.
The display will show:

MR-Lock = O N or MR-Lock = O F F
<ENTER> to Select <ENTER> to Select

If the MR-Lock is selected “ON”, the Memory selection Menu will be disabled
when in Lock Mode. If the MR-Lock is selected “OFF”, the Memory selection
Menu will be enabled when in Lock Mode. Different memories can be recalled but
the test parameters or steps can not be changed. The MR-Lock default is preset to
“ON” at the factory.

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 CALIBRATION
3. AC Hipot, Voltage
Press the “∨” key, the program will advance to the AC Voltage calibration of the
hipot test. The display will show:

ACW Voltage,5000V
<T E S T> t o C a l i b r a t e

Connect an AC standard voltage meter which can measure up to 5000V to the

output connectors and then press the “TEST” button, the program will
automatically generate an output of about 5000VAC and the display will show:

HI-Voltage = V
Enter Standard V-out

Use the Numeric keys to enter the standard value of voltage, unit “V”, and then
press the “ENTER” key to store the standard value of AC hipot voltage for
calibration and display will show:

ACW Voltage,5000V OK
<T E S T> t o C a l i b r a t e

4. DC Hipot, Voltage
Press the “∨” key, the program will advance to the DC Voltage calibration of the
hipot test. The display will show:

DCW Voltage, 6000V

<TEST> to Calibrate

Connect a DC standard voltage meter which can measure up to 6000V to the output
connectors and then press the “TEST” button, the program will automatically
generate an output of about 6000VDC and the display will show:

HI-Voltage = V
Enter Standard V-out

Use the Numeric keys to enter the standard value of voltage, unit “V”, and then
press the “ENTER” key to store the standard value of DC hipot voltage for
calibration and the display will show:

DCW Voltage, 6000V OK

<TEST> to Calibrate

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 CALIBRATION
5. IR test, DC Voltage
Press the “∨” key, the program will advance to the DC Voltage calibration of the IR
test. The display will show:

IR Voltage, 1000V
<T E S T> t o C a l i b r a t e

Connect a DC standard voltage meter which can measure up to 1000V to the output
connectors and then press the “TEST” button, the program will automatically
generate an output of about 1000VDC and the display will show:

IR-Voltage = V
Enter Standard V-out

Use the Numeric keys to enter the standard value of DC voltage, unit “V”, and then
press the “ENTER” key to store the standard value of IR test voltage for calibration
and the display will show:

IR Voltage, 1000V OK
<T E S T> t o C a l i b r a t e

6. AC Hipot, 40mA current range

Press the “∨” key, the program will advance to the AC 40/20mA (40mA for
7564SA and 7550DT or 20mA for 7520DT, 7530DT and 7540DT) range
calibration of the hipot test. The display will show:

AC 40mA, 100KΩ or AC 20mA, 100KΩ

<T E S T> t o C a l i b r a t e <T E S T> t o C a l i b r a t e

Connect a resistor about 100KΩ/10W in series with an AC standard Ammeter

which can measure up to 10mA to the output leads. The Ammeter should be
connected to the return lead, then press the “TEST” button, the program will
automatically generate an output of about 1000V/10mA and the display will show:

Current = mA
Enter Standard I-out

Use the Numeric keys to enter the standard value of current, unit “mA”, and then
press the “ENTER” key to store the standard value of AC 40/20mA range for
calibration and the display will show:

AC 40mA, 100KΩ or AC 20mA, 100KΩ

<T E S T> t o C a l i b r a t e <T E S T> t o C a l i b r a t e

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 CALIBRATION
7. DC Hipot, 10mA current range
Press the “∨” key, the program will advance to the DC 10mA range calibration of
the hipot test. The display will show:

DC 10mA, 100KΩ
<T E S T> t o C a l i b r a t e

Connect a resistor about 100KΩ/10W in series with a DC standard Ammeter which

can measure up to 10mA to the output leads. The Ammeter should be connected to
the return lead, then press the “TEST” button, the program will automatically
generate an output of about 1000V/10mA and the display will show:

Current = mA
Enter Standard I-out

Use the Numeric keys to enter the standard value of current, unit “mA”, and then
press the “ENTER” key to store the standard value of DC 10mA range for
calibration and the display will show:

DC 10mA, 100KΩ OK
<T E S T> t o C a l i b r a t e

8. AC Hipot, 3.5mA current range

Press the “∨” key, the program will advance to the AC 3.5mA range calibration of
the hipot test. The display will show:

AC 3.5mA, 100KΩ
<T E S T> t o C a l i b r a t e

Connect a resistor about 100KΩ/10W in series with an AC standard Ammeter

which can measure up to 3mA to the output leads. The Ammeter should be
connected to the return lead, then press the “TEST” button, the program will
automatically generate an output on the output connectors about 300V/3mA and the
display will show:

Current = mA
Enter Standard I-out

Use the Numeric keys to enter the standard value of current, unit “mA”, and then
press the “ENTER” key to store the standard value of AC 3.5mA range of the hipot
test and the display will show:

AC 3.5mA, 100KΩ OK
<T E S T> t o C a l i b r a t e

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 CALIBRATION
9. DC Hipot, 3500µ µA current range
Press the “∨” key, the program will advance to the DC 3500µA range calibration of
hipot test. The display will show:

DC 3500µA, 100KΩ
<T E S T> t o C a l i b r a t e

Connect a resistor about 100KΩ/10W in series with a DC standard Ammeter which

can measure up to 3000µA to the output leads. The Ammeter should be connected
to the return lead, then press the “TEST” button, the program will automatically
generate an output of about 300V/3000µA and the display will show:

Current = µA
Enter Standard I-out

Use the Numeric keys to enter the standard value of current, unit “µA”, and then
press the “ENTER” key to store the standard value of DC 3500µA range of hipot
test and the display will show:

DC 3500µA, 100KΩ OK
<T E S T> t o C a l i b r a t e

10. DC Hipot, 350µµA current range

Press the “∨” key, the program will advance to the setting and reading of DC
320µA range calibration of the hipot test. The display will show:

DC 350µA, 1MΩ
<T E S T> t o C a l i b r a t e

Connect a resistor about 1MΩ/0.25W in series with a DC standard Ammeter which

can measure up to 300µA to the output leads. Connect the Ammeter to the return
leads, then press the “TEST” button, the program will automatically generate an
output of about 300V/300µA and the display will show:

Current = µA
Enter Standard I-out

Use the Numeric keys to enter the standard value of current, unit “µA”, and then
press the “ENTER” key to store the standard value of DC 350µA range of the hipot
test and the display will show:
DC 350µA, 1MΩ OK
<T E S T> t o C a l i b r a t e

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 CALIBRATION
11. IR test, XXX.XMΩ Ω range
Press the “∨” key, the program will advance to the XXX.XMΩ range calibration of
the IR test. The display will show:

XXX.XMΩ,STD 50MΩ
<T E S T> t o C a l i b r a t e

Connect a 50MΩ/0.25W/1000VDC standard resistor to the output connectors, then

press the “TEST” button, the program will automatically calibrate the XXX.X MΩ
range of IR test and the display will show:

XXX.XMΩ,STD 50MΩ OK
<T E S T> t o C a l i b r a t e

12. IR test, XXXXMΩ Ω range

Press the “∨” key, the program will advance to the XXXXMΩ range calibration of
the IR test. The display will show:

XXXXMΩ,STD 50MΩ
<T E S T> t o C a l i b r a t e

Connect a 50MΩ/0.25W/1000VDC standard resistor to the output connectors, then

press the “TEST” button, the program will automatically calibrate the XXXX MΩ
range of IR test and the display will show:

XXXXMΩ,STD 50MΩ OK
<T E S T> t o C a l i b r a t e

13. Ground Bond, AC Voltage (Model 7564SA only)

Press the “∨” key, the program will advance to the AC Voltage calibration of the
Ground bond test. The display will show:

Ground V, 7V
<T E S T> t o Calibrate

Connect a AC standard voltage meter which can measure up to 10VAC to the High
current and Return output leads, then press the “TEST” button, the program will
automatically generate an output of about 7VAC and the display will show:

G-Voltage = V
Enter Standard V-out

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 CALIBRATION
Use the Numeric keys to enter the standard value of voltage, unit “V”, and then
press the “ENTER” key to store the standard value of AC Ground Bond voltage and
display will show:

Ground V, 7V OK
<T E S T> t o Calibrate

14. Ground Bond, AC Current (Model 7564SA only)

Press the “∨” key, the program will advance to the AC Current calibration of the
Ground bond test. The display will show:

Ground A, 30A
<T E S T> t o Calibrate

Connect a AC standard Ammeter which can measure up to 30AAC to the High

current and Return output leads, then press the “TEST” button, the program will
automatically generate an output on the output leads of about 30AAC and the
display will show:

G- Current = A
Enter Standard I-out

Use the Numeric keys to enter the standard value of current, unit “A”, and then
press the “ENTER” key to store the standard value of AC Ground Bond current and
display will show:

Ground A, 30A OK
<T E S T> t o Calibrate

15. Real Current

This menu item will be shown only when the Real Current option is installed.
Press the “∨” key, the program will advance to the Real Current calibration of the
AC withstand mode. The display will show:

AC 10mAR, 500K
<T E S T> t o C a l i b r a t e

Connect a resistor about 500KΩ/10W in series with an AC standard Ammeter

which can measure up to 10mA to the output leads. The Ammeter should be
connected to the return lead, then press the “TEST” button, the program will
automatically generate an output of about 5000V/10mA and the display will show:

AC Current = mA
Enter Standard I-out

105
 CALIBRATION
Use the Numeric keys to enter the standard value of current, unit “mA”, and then
press the “ENTER” key to store the standard value of AC Real current and display
will show:

AC 10mAR, 500K OK
<T E S T> t o C a l i b r a t e

106
 CALIBRATION

Replacement Parts List Models 7550DT and 7564SA

Rev. F 5/11/01 ECO 4816

Part Number Qty. Reference Description

Designator
Model 7550DT, 7564SA
38251 1 7440 Main Control Board
38254 1 CHV-06 HV Control Board
37740 1 AMP-270 Main Power Amplifier Board
37741 1 REC-17 Rectifier Board
37742 1 CKB-03 Keypad Board
37743 1 CSW-04 Input Protection Board
37744 1 DSP-06 Display LED Board
37745 1 CGP-03 GPIB Interface Board
37814 1 RS232 RS232 Interface Board
37748 1 CSU-CO2 Scanner Control Board
37804 1 - LCD Display 22 x 2 Characters
37807 1 - Reset Switch, Red
37806 1 - Test Switch, Green
37605 1 Reset Replacement Bulb 33V
37854 1 Test Replacement Bulb 28V
37555 1 - Power Switch 2P 10A/250V
37860 1 T1 Input Transformer with ground shield
37751 1 T2 Output High Voltage Transformer with ground shield
37780 1 - Fuse 6.3A 250V Slow Blow 20mm
37781 1 - Fuse Holder 20mm
37571 1 - Earth Connector
37800 2 - 3U Rack Mount Bracket
37801 2 - 3U Rack Mount Handle
33189 1 - Input Power Cable 10A/7Ft.
37478 2 - High Voltage Connector
04040A-08 1 - High Voltage Output Cable
38101 1 - Feet Kit w/o Rubber Inserts
38102 4 - Rubber Insert
37697 1 1C12 IC 89C52 Microcontroller 8-bit 20MHz
37374 1 IC32 IC W27E512 EEPROM
Model 7550DT only
37778 1 CGC-02 Ground Continuity Check Board
37747 1 CSU-105 Scanner Matrix Board
37749 1 DSP-07 Scanner Display Board
35999 4 - Black Banana Jacks
02100A-13 2 - Return Cable
36544 1 - Adapter Box HV Domestic
Model 7564SA only
37746 1 CSU-105 Scanner Matrix Board
37815 1 DSP-07 Scanner Display Board
37239 2 - High Current Return Jack
37239 2 - High Current Output Jack
05002D-37 1 - Cable Assembly High Current Return
05002D-24 1 - Cable Assembly High Current Output
36541 1 - Adapter Box HV, HC Domestic

107
 SCHEMATICS

Replacement Parts List Models 7520DT, 7530DT and 7540DT

Rev. H 1/02/03 ECO 4924

Part Number Qty. Reference Description

Designator
Model 7520DT, 7530DT, 7540DT
38250 1 7440 Main Control Board
37908 1 AMP-150 Main Power Amplifier Board
37742 1 CKB-03 Keypad Board
37743 1 CSW-04 Input Protection Board
37778 1 CGC-02 Ground Continuity Check Board
37814 1 RS232 RS232 Interface Board
37745 1 CGP-03 GPIB Interface Board
37940 1 CPR-01 Printer Port Parallel
38252 1 CHV-06 HV Control Board (7520DT only)
38253 1 CHV-06 HV Control Board (7530DT and 7540DT only)
37804 1 - LCD Display 22 x 2 Characters
37807 1 - Reset Switch, Red
37806 1 - Test Switch, Green
37605 1 Reset Replacement Bulb 33V
37854 1 Test Replacement Bulb 28V
37555 1 - Power Switch 2P 10A/250V
37907 1 T1 Input Transformer with ground shield
37906 1 T2 Output High Voltage Transformer with ground shield
37781 1 - Fuse Holder 20mm
37857 1 - Fuse 5.0A 250V Slow Blow 20mm (7520DT and
7530DT only)
37780 1 - Fuse 6.3A 250V Slow Blow 20mm (7540DT only)
37571 1 - Earth Connector
37800 2 - 3U Rack Mount Bracket
37801 2 - 3U Rack Mount Handle
33189 1 - Input Power Cable 10A/7Ft.
37478 2 - High Voltage Connector
04040A-08 1 - High Voltage Output Cable
37697 1 IC12 IC 89C52 Microcontroller 8-bit 20MHz
37374 1 IC32 IC W27E512 EEPROM
35999 4 - Black Banana Jacks
02100A-13 2 - Return Cable
36544 1 - Adapter Box HV Domestic
Model 7530DT only
37698 4 - Foot Plastic Molded
37699 2 - Foot Metal Wire Frame
37700 4 - Foot Pad Rubber Adhesive
Model 7520DT, 7540DT only
38101 1 - Feet Kit w/o Rubber Inserts
38102 4 - Rubber Insert
Model 7540DT only
37748 1 CSU-CO2 Scanner Control Board
38255 1 CSU-105 Scanner Matrix Board
37749 1 DSP-07 Scanner Display Board

108
 CALIBRATION

SCHEMATIC INDEX

Drawing Description Reference Pages

Number Designator
S07530DT Wiring Diagram (7520DT, 7530DT) - 1

S07540DT Wiring Diagram (7540DT) - 1

S07550DT Wiring Diagram (7550DT) - 2

S07564SA Wiring Diagram (7564SA) - 2

S38123 Main Control Board 7440 4

S38153 HV Control Board (7550DT, 7564SA) CHV-06B 1

S37739 HV Control Board (7530DT, 7540DT) CHV-06D 1

S38146 HV Control Board (7520DT) CHV-06D 1

S37740 Main Power Amplifier Board (7550DT, 7564SA) AMP-270 1

S37908 Main Power Amplifier Board (7520DT, 7530DT, 7540DT) AMP-150 1

S37741 Rectifier Board (7550DT, 7564SA) REC-17 1

S37742 Keypad Board CKB-03 1

S37743 Input Protection Board CSW-04 1

S37744 Display LED Board DSP-06 1

S37745 GPIB Interface Board CGP-03 1

S37746 Scanner Matrix Board (7540DT, 7550DT, 7564SA) CSU-105 1

S37748 Scanner Control Board (7540DT, 7550DT, 7564SA) CSU-C02 1

S37749 Scanner Display Board (7540DT, 7550DT, 7564SA) DSP-07 1

S37778 Ground Continuity Check Board (7520DT - 7550DT) CGC-02 1

S37814 RS232 Interface Board RS232 1

S37940 Printer Port Card CPR-01 1

Schematic Index for Options

S07500X-37 Real Current Board Opt. 02 37641 1

109