HORIBA - A Guidebook To Particle Size Analysis - 2022
HORIBA - A Guidebook To Particle Size Analysis - 2022
PARTICLE SIZE
ANALYSIS
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TABLE OF CONTENTS
33 References
Why is
particle size important?
Particle size influences many properties of particulate materials and is
a valuable indicator of quality and performance. This is true for powders,
Particle size is critical within
suspensions, emulsions, and aerosols. The size and shape of powders influences
a vast number of industries.
flow and compaction properties. Larger, more spherical particles will typically flow
For example, it determines:
more easily than smaller or high aspect ratio particles. Smaller particles dissolve appearance and gloss of paint
more quickly and lead to higher suspension viscosities than larger ones. Smaller
flavor of cocoa powder
droplet sizes and higher surface charge (zeta potential) will typically improve
suspension and emulsion stability. Powder or droplets in the range of 2-5µm reflectivity of highway paint
aerosolize better and will penetrate into lungs deeper than larger sizes. For these hydration rate & strength of cement
and many other reasons it is important to measure and control the particle size properties of die filling powder
distribution of many products.
absorption rates of pharmaceuticals
appearances of cosmetics
Measurements in the laboratory are often made to support unit operations taking
place in a process environment. The most obvious example is milling (or size
reduction by another technology) where the goal of the operation is to reduce
particle size to a desired specification. Many other size reduction operations and
technologies also require lab measurements to track changes in particle size
including crushing, homogenization, emulsification and microfluidization. Separation
steps such as screening, filtering, cyclones, etc. may be monitored by measuring
particle size before and after the process. Particle size growth may be monitored
during operations such as granulation or crystallization. Determining the particle size
of powders requiring mixing is common since materials with similar and narrower
distributions are less prone to segregation.
1
WHICH SIZE TO MEASURE?
VERTICAL
(i.e. scattered light, settling rate) and determining the size of the sphere that could
PROJECTION produce the data. Although this approach is simplistic and not perfectly accurate,
the shapes of particles generated by most industrial processes are such that the
spherical assumption does not cause serious problems. Problems can arise, however,
if the individual particles have a very large aspect ratio, such as fibers or needles.
Shape factor causes disagreements when particles are measured with different
particle size analyzers. Each measurement technique detects size through the
use of its own physical principle. For example, a sieve will tend to emphasize the
second smallest dimension because of the way particles must orient themselves to
pass through the mesh opening. A sedimentometer measures the rate of fall of the
particle through a viscous medium, with the other particles and/or the container
HORIZONTAL
PROJECTION walls tending to slow their movement. Flaky or plate-like particles will orient to
maximize drag while sedimenting, shifting the reported particle size in the smaller
figure 1
| SHAPE FACTOR direction. A light scattering device will average the various dimensions as the
Many techniques make the particles flow randomly through the light beam, producing a distribution of sizes
general assumption that every from the smallest to the largest dimensions.
particle is a sphere and report the
value of some equivalent
The only techniques that can describe particle size using multiple values are
diameter. Microscopy or
automated image analysis are the microscopy or automated image analysis. An image analysis system could
only techniques that can describe describe the non-spherical particle seen in Figure 1 using the longest and shortest
particle size using multiple values diameters, perimeter, projected area, or again by equivalent spherical diameter.
for particles with larger aspect When reporting a particle size distribution the most common format used even for
ratios.
image analysis systems is equivalent spherical diameter on the x axis and percent
on the y axis. It is only for elongated or fibrous particles that the x axis is typically
displayed as length rather than equivalent spherical diameter.
2
Understanding and interpreting
particle size distribution calculations
Performing a particle size analysis is the best way to answer the question:
What size are those particles? Once the analysis is complete the user has
a variety of approaches for reporting the result. Some people prefer a single
number answer—what is the average size? More experienced particle scientists
cringe when they hear this question, knowing that a single number cannot describe
the distribution of the sample. A better approach is to report both a central point of
the distribution along with one or more values to describe the width of distribution.
Other approaches are also described in this document.
For symmetric distributions such as the one shown in Figure 2 all central values are
equivalent: mean = median = mode. But what do these values represent?
MEAN
Mean is a calculated value similar to the concept of average. The various mean
calculations are defined in several standard documents (ref.1,2). There are multiple
definitions for mean because the mean value is associated with the basis of the
figure 2
| SYMMETRIC DISTRIBUTION
WHERE MEAN=MEDIAN=MODE
3
The volume mean diameter has several names including D4,3. In all HORIBA
diffraction software this is simply called the “mean” whenever the result is displayed
as a volume distribution. Conversely, when the result in HORIBA software is
converted to a surface area distribution the mean value displayed is the surface
mean, or D 3,2. The equation for the surface mean is shown below.
The description for this calculation is the same as the D4,3 calculation, except
that Di values are raised to the exponent values of 3 and 2 instead of 4 and 3.
The generalized form of the equations seen above for D4,3 and D3,2 is shown below
(following the conventions from ref. 2, ASTM E 799, ).
Where:
D = the overbar in D designates an averaging process
(p-q)p>q = the algebraic power of Dpq
Di = the diameter of the ith particle
Σ = the summation of Dip or Diq, representing all particles in the sample
The example results shown in ASTM E 799 are based on a distribution of liquid
droplets (particles) ranging from 240 – 6532 µm. For this distribution the following
results were calculated:
D10 = 1460 µm
D32 = 2280 µm
D50 = 2540 µm
D43 = 2670 µm
These results are fairly typical in that the D43 is larger than the D50—
the volume-basis median value.
MEDIAN
Median values are defined as the value where half of the population resides above
this point, and half resides below this point. For particle size distributions the
median is called the D50 (or x50 when following certain ISO guidelines). The D50
is the size in microns that splits the distribution with half above and half below this
diameter. The Dv50 (or Dv0.5) is the median for a volume distribution, Dn50 is
used for number distributions, and Ds50 is used for surface distributions. Since the
primary result from laser diffraction is a volume distribution, the default D50 cited
is the volume median and D50 typically refers to the Dv50 without including the
v. This value is one of the easier statistics to understand and also one of the most
meaningful for particle size distributions.
4
MODE
The mode is the peak of the frequency distribution, or it may be easier to visualize MODE
it as the highest peak seen in the distribution. The mode represents the particle
size (or size range) most commonly found in the distribution. Less care is taken to MEDIAN
denote whether the value is based on volume, surface or number, so either run the
risk of assuming volume basis or check to assure the distribution basis. The mode is
MEAN
not as commonly used, but can be descriptive; in particular if there is more than one
peak to the distribution, then the modes are helpful to describe the mid-point of the
different peaks.
For non-symmetric distributions the mean, median and mode will be three different
values shown in Figure 3.
DISTRIBUTION WIDTHS
Most instruments are used to measure the particle size distribution, implying an
figure 3
interest in the width or breadth of the distribution. Experienced scientists typically
shun using a single number answer to the question “What size are those particles?”,
| A NON-SYMMETRIC DISTRIBTION
Mean, median and mode
will be three different values.
and prefer to include a way to define the width. The field of statistics provides
several calculations to describe the width of distributions, and these calculations are
sometimes used in the field of particle characterization. The standard deviation
(St Dev.) is the preferred value in our field of study. As shown in Figure 4, for a
normal (Guassian) distribution, 68.27% of the total population lies within +/- 1 St
Dev, and 95.45% lies within +/- 2 St Dev.
Although occasionally cited, the use of standard deviation declined when hardware
and software advanced beyond assuming normal or Rosin-Rammler distributions. -1 STD 68.27% +1 STD
95.45%
figure 4
In rare situations the span equation may be defined using other values such as
Dv0.8 and Dv0.2. Laser diffraction instruments should allow users this flexibility. | A NORMAL DISTRIBUTION
The mean value is flanked
by 1 and 2 standard
deviation points.
Be cautious with the term standard deviation. This term is also used to describe
the variation in measurement results as well as the width of a size distribution.
For example, when evaluating repeatability, one commonly uses the Coefficient of
Variation (COV), also referred to as the relative standard deviation. See for example
ISO 13320 (ref. 4). And this is not the width of the distribution.
5
Another common approach to define the distribution width is to cite three values
on the x-axis, the D10, D50, and D90 as shown in Figure 5. The D50, the median,
Dv0.5 MEDIAN
has been defined as the diameter where half of the population lies below this value.
Similarly, 90 percent of the distribution lies below the D90, and 10 percent of the
population lies below the D10.
TECHNIQUE DEPENDENCE
Dv0.1 Dv0.9
HORIBA Instruments Incorporated offers particle characterization tools based on
10% 50% 90% several principles including laser diffraction, dynamic light scattering, image analysis,
below below below
this size this size this size nanoparticle tracking analysis (NTA), and centrifugal sedimentation. Each of these
techniques generates results in both similar and unique ways. Most techniques
can describe results using standard statistical calculations such as the mean and
standard deviation. But commonly accepted practices for describing results have
figure 5
| THREE X-AXIS VALUES
D10, D50 and D90
evolved for each technique.
LASER DIFFRACTION
All of the calculations described in this document are generated by the HORIBA laser
diffraction software package. Results can be displayed on a volume, surface area,
or number basis. Statistical calculations such as standard deviation and variance
are available in either arithmetic or geometric forms. The most common approach
for expressing laser diffraction results is to report the D10, D50, and D90 values
based on a volume distribution. The span calculation is the most common format to
express distribution width. That said, there is nothing wrong with using any of the
available calculations, and indeed many customers include the D4,3 when reporting
results.
6
DYNAMIC LIGHT SCATTERING
IMAGE ANALYSIS
The primary results from image analysis are based on number distributions. These
are often converted to a volume basis, and in this case this is an accepted and valid
conversion. Image analysis provides far more data values and options than any of
the other techniques described in this document. Measuring each particle allows the
user unmatched flexibility for calculating and reporting particle size results.
With the ability to measure particles in any number of ways comes the decision
to report those measurements in any number of ways. Users are again cautioned
against reporting a single value—the number mean being the worst choice of the
possible options. Experienced particle scientists often report D10, D50, and D90, or
include standard deviation or span calculations when using image analysis tools.
Like image analysis, the primary results from NTA are based on number
distributions. These are less often converted to a volume basis. In addition, NTA
can be used to determine the particle number concentration or the concentration of
particles in each size class.
CONCLUSIONS
All particle size analysis instruments provide the ability to measure and report the
particle size distribution of the sample. There are very few applications where a
single value is appropriate and representative. The modern particle scientist often
chooses to describe the entire size distribution as opposed to just a single point on it.
(One exception might be extremely narrow distributions such as latex size standards
where the width is negligible.) Almost all real world samples exist as a distribution
of particle sizes and it is recommended to report the width of the distribution for any
sample analyzed. The most appropriate option for expressing width is dependent
on the technique used. When in doubt, it is often wise to refer to industry accepted
standards such as ISO or ASTM in order to conform to common practice.
7
Particle size result interpretation:
number vs. volume distributions
Interpreting results of a particle size measurement requires an under-
standing of which technique was used and the basis of the calculations.
D = 1µm
Each technique generates a different result since each measures different
VOLUME = 0.52µm
% BY VOLUME = 0.52/18.8 = 2.8% physical properties of the sample. Once the physical property is measured a
calculation of some type generates a representation of a particle size distribution.
Some techniques report only a central point and spread of the distribution, others
provide greater detail across the upper and lower particle size detected. The particle
size distribution can be calculated based on several models: most often as a number
D = 2µm
or volume/mass distribution.
VOLUME = 4.2µm
% BY VOLUME = 4.2/18.8 = 22%
figure 7
| NUMBER DISTRIBUTION figure 8
| VOLUME DISTRIBUTION
When presented as a volume distribution it becomes more obvious that the majority
of the total particle mass or volume comes from the 3µm particles. Nothing changes
between the left and right graph except for the basis of the distribution calculation.
8
Another way to visualize the difference between number and volume distributions
is supplied courtesy of the City of San Diego Environmental Laboratory. In this case
beans are used as the particle system. Figure 9 shows a population where there are
13 beans in each of three size classes, equal on a number basis. Figure 10 shows
these beans placed in volumetric cylinders where it becomes apparent that the larger
beans represent a much larger total volume than the smaller ones.
Figure 11 shows a population of beans where it may not be intuitively obvious, but
there is an equal volume of each size, despite the wide range of numbers present.
It becomes apparent in Figure 12 when the beans are placed in volumetric cylinders
that each volumes are equal.
figure 9
| 13 BEANS OF EACH SIZE
TRANSFORMING RESULTS
figure 10
|
On the other hand, converting a volume result from laser diffraction to a number THE SAME 39 BEANS PLACED
basis can lead to undefined errors and is only suggested when comparing to IN VOLUMETRIC CYLINDERS
12
NUMBER
10
8
figure 11
|EQUAL VOLUME OF EACH OF
THE THREE TYPES OF BEANS
AREA VOLUME
0
0.34 0.58 1.15 2.27 4.47 8.82 17.38 34.25
PARTICLE SIZE
NUMBER DISTRIBUTION VOLUME DISTRIBUTION
MEAN = 0.38µm MEAN = 12.65µm
figure 12
|
MEDIAN = 0.30µm MEDIAN = 11.58µm
SA = 13467 cm²/cm³ SA = 13467 cm²/cm³ EQUAL VOLUMES IN
STANDARD DEV = 0.40 STANDARD DEV = 8.29 VOLUMETRIC CYLINDERS
figure 13
| VOLUME DISTRIBUTION CONVERTED
TO AREA AND NUMBER
Conversion errors can result when
deriving number or area values from
a laser diffraction volume result.
9
Setting particle size specifications
The creation of a meaningful and product-appropriate particle size
specification requires knowledge of its effect on product performance
in addition to an understanding of how results should be interpreted
for a given technique. This section provides guidelines for setting particle size
specifications on particulate materials—primarily when using the laser diffraction
technique, but also with information about dynamic light scattering (DLS) and image
analysis.
DISTRIBUTION BASIS
Different particle sizing techniques report primary results based on number, volume,
weight, surface area, or intensity. As a general rule specifications should be based
in the format of the primary result for a given technique. Laser diffraction generates
results based on volume distributions and any specification should be volume based.
Likewise, a number basis should be used for image analysis and NTA while dynamic
light scattering specifications should be in terms of Z-average and polydispersity
index. Conversion to another basis such as number—although possible in the
software—is inadvisable because significant error is introduced. The exception to
this guideline is converting a number based result from a technique such as image
analysis into a volume basis (ref. 7). The error involved is generally very low in this
scenario.
DISTRIBUTION POINTS
10
Rather than use a single point in the distribution as a specification, it is suggested
to include other size parameters in order to describe the width of the distribution.
The span is a common calculation to quantify distribution width: (D90 – D10) /
D50. However, it is rare to see span as part of a particle size specification. The
more common practice is to include two points which describe the coarsest and
finest parts of the distribution. These are typically the D90 and D10. Using the
same convention as the D50, the D90 describes the diameter where ninety percent
of the distribution has a smaller particle size and ten percent has a larger particle
size. The D10 diameter has ten percent smaller and ninety percent larger. A three
point specification featuring the D10, D50, and D90 will be considered complete and
appropriate for most particulate materials.
How these points are expressed may vary. Some specifications use a format where
the D10, D50, and D90 must not be more than (NMT) a stated size.
Although only one size is stated for each point there is an implied range of
acceptable sizes (i.e. the D50 passes if between 20 and 80µm).
This approach better defines the acceptable size distribution, but may be
perceived as overly complicated for many materials.
11
1.0 X VS. Y AXIS
0.9 Other published specifications are based on the percent below a given particle
0.8 size such as: 50% below 20µm and 90% below 100µm. This type of specification
0.7 is based on points along the y axis (which reports frequency percent) as opposed
undersize error of +/- 20%
to the x axis (which reports diameter) as in the previous examples. Although
0.6
% UNDER
this approach has been used in many specifications, it is important to realize the
0.5
difference between using the x (size) and y (percent) axes. All measurements
0.4
include an error which should always be considered when setting a specification.
0.3
0.2 For the example shown in Figure 14, the D50 is 100µm with an error of +/- 5%
size error
0.1 of +/- 5% on the x (size) axis. This error includes all sources such as sampling and sample
preparation. The same error becomes +/- 20% when translated to the y (percent)
20 40 60 80 100 120 140 axis. Stating an error of +/- 5% is more attractive than +/- 20%, even when
SIZE IN µm
expressing the same actual error range. The degree to which the y axis error is
figure 14
| MEASUREMENT ERROR
Error appears exaggerated on
the Y axis because of the
exaggerated vs. the x axis depends upon the steepness of the distribution curve.
There are applications where the percent below a given particle size is an important
narrowness of the PSD
result. Recently there has been interest in the presence of “nanoparticles” (at least
one dimension smaller than 100nm) in products such as cosmetics. The software
which calculates the PSD should be capable of easily reporting the percent under
any chosen size—in this case the percent below 100nm (Figure 15). In the LA-960V2
software this is displayed as “Diameter on Cumulative %”. In the example below the
value for percent less than 100nm is reported as 9.155%.
TESTING REPRODUCIBILITY
figure 15
| REPORTING PSD PERCENTAGE There are currently two internationally accepted standards written on the use of
SMALLER THAN THE GIVEN SIZE laser diffraction: ISO 13320 (ref. 9) and USP<429> (ref. 10). Both standards state
In this example, percentage of
that samples should be measured at least three times and reproducibility must
the PSD is reported at 100nm.
meet specified guidelines. Note that this means three independent measurements
(i.e. prepare the sample, measure the sample, empty the instrument, and repeat).
The coefficient of variation (COV, or (std dev/mean)*100) for the measurement set
must be less than 2.5% for D50, less than 3% for D10, and less than 4% for D90
to pass the ISO 13320 requirements. These guidelines change to less than 10%
at the D50 and less than 15% at the D10 and D90 when following the USP<429>
requirements. Finally, the guidelines all double when the D50 of the material is less
than 10µm.
12
INCLUDING THE ERROR
figure 16
| BUILDING SIZE SPECIFICATION
TO INCLUDE ERROR SOURCES
If the total measurement error is
+/- 10%, then the specification
PRODUCT PERFORMANCE SPECIFICATION must be tightened in order to
assure the product stays within
performance specification.
80 85 90 95 100 105 110 115 120
SIZE IN µm
The primary results from dynamic light scattering (DLS) systems are typically
reported as an intensity distribution. Key values included in DLS-based specifications
are the intensity-weighted average (often called the “z average”) and the
polydispersity index (PI), which quantifies distribution width. Mean values for one
or more peaks can be calculated and included in the results. The results can be
transformed into a volume-based or number-based distribution when comparing to
other techniques such as laser diffraction or microscopy.
13
IMAGE ANALYSIS
The primary result reported by image analysis is a number distribution since the
particles are inspected one at a time. Setting specifications based on the number
distribution is acceptable, but this is the one example where conversion to another
basis (i.e. volume) is both acceptable and often preferred. As long as a sufficient
number of particles are inspected to fully define the distribution, then the conversion
from number to volume does not introduce unknown errors into the result. The
pharmaceutical industry discussed the subject at a meeting organized by the AAPS
(ref. 6) and concluded that results are preferably reported as volume distributions.
Particle size distribution specifications based on the image analysis technique often
include the mean, D10, D50, and D90 values. Care should be taken to avoid basing
specifications on the number-based mean since this value may not track process
changes such as milling or agglomeration (ref. 12). Conversion from number to
volume distribution can be performed with high accuracy by specifying the typical
particle shape (spherical, cylindrical, ellipsoidal, tetragonal, etc.).
Particle shape parameters such as roundness, aspect ratio, and compactness are
used to describe particle morphology. Specifications for shape parameters are
typically reported using just the number-based mean value, so this is recommended
for setting specifications.
CONCLUSIONS
The task of setting a particle size specification for a material requires knowledge
of which technique will be used for the analysis and how size affects product
performance. Sources of error must be investigated and incorporated into the final
specification. Be aware that, in general, different particle sizing techniques will
produce different results for a variety of reasons including: the physical property
being measured, the algorithm used, the basis of the distribution (number, volume,
etc.) and the dynamic range of the instrument. Therefore, a specification based on
using laser diffraction is not easily compared to expectations from other techniques
such as particle counting or sieving. One exception to this rule is the ability of
dymanic image analysis to match sieve results.
14
LA-960V2
LASER
DIFFRACTION
TECHNIQUE
The LA-960V2 combines the most popular modern sizing technique with state of the
art refinements to measure wet and dry samples measuring 10 nanometers to 5
millimeters. The central idea in laser diffraction is that a particle will scatter light at an
angle determined by that particle’s size. Larger particles will scatter at small angles and
smaller particles scatter at wide angles. A collection of particles will produce a pattern
of scattered light defined by intensity and angle that can be transformed into a particle
size distribution result.
RANGE IN MICRONS
10 nm - 5,000 µm
INTRODUCTION
OPTIMAL APPLICATIONS
The knowledge that particles scatter light is not new. Rayleigh scattering of light from POWDERS, SUSPENSIONS,
particles in the atmosphere is what gives the sky a blue color and makes sunsets AND EMULSIONS
yellow, orange, and red. Light interacts with particles in any of four ways: diffraction, WEIGHT 56kG (123 lbs)
reflection, absorption, and refraction. Figure 17 shows the idealized edge diffraction FOOTPRINT
of an incident plane wave on a spherical particle. Scientists discovered more than a WIDTH 705mm (28”)
DEPTH 565mm (22”)
century ago that light scattered differently off of differently sized objects. Only the
HEIGHT 500mm (20”)
relatively recent past, however, has seen the science of particle size analysis embrace
light scattering as not only a viable technique, but the backbone of modern sizing.
figure 17
| DIFFRACTION PATTERN
OF A PLANE WAVE
SCATTERING FROM
A SPHEROID
The algorithm, at its core, consists of an optical model with the mathematical
transformations necessary to get particle size data from scattered light. However,
not all optical models were created equally.
In the beginning there was the Fraunhofer Approximation and it was good. This
model, which was popular in older laser diffraction instruments, makes certain
assumptions (hence the approximation) to simplify the calculation. Particles are
assumed:
• to be spherical
• to be opaque
Scattering Intensity
The Mie scattering theory overcomes these limitations. Gustav Mie developed a
figure 18
| REPRESENTATIONS OF
FRAUNHOFER AND MIE
SCATTERING
closed form solution (not approximation) to Maxwell’s electromagnetic equations for
scattering from spheres; this solution exceeds Fraunhofer to include sensitivity to
Angle, energy and size are used smaller sizes (wide angle scatter), a wide range of opacity (i.e. light absorption), and
as parameters in these examples.
the user need only provide the refractive index of particle and dispersing medium.
Accounting for light that refracts through the particle (a.k.a. secondary scatter)
allows for accurate measurement even in cases of significant transparency. The Mie
theory likewise makes certain assumptions that the particle:
• is spherical
• ensemble is homogeneous
• refractive index of particle and surrounding medium is known
16
BUILDING A STATE OF THE ART
LASER DIFFRACTION ANALYZER
The basics of what needs to be measured and how it’s transformed into particle size
data are understood (ref. 14). What constitutes a basic particle size analyzer has
also been discussed, but there’s a wide gulf between bare minimum and state of
the art. The latter is always the industry leader in accuracy, repeatability, usability,
flexibility, and reliability. The current state of the art in laser diffraction is the Partica
LA-960V2 featuring two high intensity light sources, a single, continuous cast alumi-
num optical bench (Figure 20), a wide array of sample handling systems, and expert
refinements expected from the fifth revision in the 900 series.
3
2
figure 21
| LIGHT SCATTERING PATTERNS
FOR 50nm AND 70nm PARTICLES
USING 650nm LASER
4 4
figure 20
| SIMPLIFIED LAYOUT OF THE LA-960V2 OPTICAL BENCH
1. Red wavelength laser diode for particles > 500nm
2. Blue LED for particles < 500nm
3. Low angle detectors for large particles
4. Side and back angle
Using two light sources of different wavelengths is of critical importance because the
figure 22
| LIGHT SCATTERING PATTERNS
FOR THE SAME SAMPLES
USING 405nm LED
measurement accuracy of small particles is wavelength dependent. Figure 21 shows
the 360° light scattering patterns from 50nm and 70nm particles as generated from
a 650 nm red laser. The patterns are practically identical across all angles and the 40
60
algorithm will not be able to accurately calculate the different particle sizes. Figure 50 LATEX
22 shows the same experiment using a 405nm blue LED. Distinct differences are STANDARDS
(µm)
50
now seen on wide angle detectors which allows for accurate calculation of these 30 70
materials. Integrating a second, shorter wavelength light source is the primary
40
means of improving nano-scale performance beyond that of a bare minimum laser
diffraction analyzer.
30
CONCLUSIONS
20
The HORIBA LA-960V2 particle size analyzer uses the laser diffraction method to
measure size distributions. This technique uses first principles to calculate size using
10
light scattered off the particle (edge diffraction) and through the particle (secondary
scattering refraction). The LA-960V2 incorporates the full Mie scattering theory to q (%)
cover the widest size range currently available. Wide measurement ranges, fast 0.010 0.100 1.000
analyses, exceptional precision, and reliability have made laser diffraction the most DIAMETER (µm)
|
popular modern sizing technique in both industry and academia. figure 23 30, 40, 50 AND 70 NANOMETER
MATERIALS MEASURED
INDEPENDENTLY ON THE LA-960V2
USING THE BLUE LED
17
LA-350
LASER
DIFFRACTION
TECHNIQUE
The LA-350 Laser Diffraction Particle Size Distribution Analyzer excels in applications as
diverse as slurries, minerals, and paper chemistry. Based on the advanced optical design
of previous LA-series analyzers, the LA-350 strikes a harmonious balance between high-
functionality, easy operation, and low maintenance. The optimized design allows for a
compact optical bench, resulting in an efficient use of bench space, while preserving the
accuracy, precision and resolution that HORIBA’s analyzers are famous for.
RANGE IN MICRONS
0.1 - 1,000 µm SMALL AND POWERFUL
OPTIMAL APPLICATIONS The combination optical bench and circulation pump in one system is one of HORIBA’s
POWDERS, SLURRIES, most popular designs. Now this design has a much smaller footprint which allows the
AND EMULSIONS
analyzer to be moved where it is needed. This is especially valuable for quality control
FOOTPRINT situations when the locations of sampling and analysis need to be separate to avoid
WIDTH 297 mm (12”)
contamination. The optical
DEPTH 420 mm (17”)
bench and circulation pump
HEIGHT 376 mm (15”)
are combined into a single
compact system. The compact
size and low weight make this a
convenient analyzer for today’s
crowded laboratories.
HOW IT WORKS
The instrument characterizes nanoparticles by analyzing their thermal-induced motion
(Brownian motion) and larger, micron-sized particles by analyzing gravitational
settling. The optical system includes innovative multispectral illumination and
detection techniques that enable video recording of scattered light from wide-ranging
sizes of individual particles simultaneously.
PARTICLE SIZE size, zeta potential, and molecular weight from 0.3 nm to 8 µm at concentrations ranging
from 0.1 mg/mL of lysozyme to 40% w/v. This section explains the underlying principles
ZETA POTENTIAL used by the SZ-100V2 DLS system.
WEIGHT Particle size can be determined by measuring the random changes in the intensity of
light scattered from a suspension or solution. Small particles in suspension undergo
random thermal motion known as Brownian motion. This random motion is measured to
RANGE IN MICRONS
calculate particle size using the process described below. A top view of the optical setup
0.3 nm - 10 µm
for particle size measurements in the SZ-100V2 is shown in Figure 24.
OPTIMAL APPLICATIONS
NANOSUSPENSIONS
AND EMULSIONS UNDER 10 µm,
ZETA POTENTIAL AND
MOLECULAR WEIGHT
|
figure 24 DYNAMIC LIGHT
SCATTERING LAYOUT
FOR THE SZ-100V2
0.0
TIME (microseconds)
2.0
|
figure 26 AUTOCORRELATION FUNCTION
FROM DYNAMIC LIGHT
SCATTERING
For a sample where all of
ACF
1.5
the particles are the same
size.
1.0
0 100 200 300 400 500
EQUATION 1 C = exp(-2 Γ)
Γ is readily derived from experimental data by a curve fit. The diffusion coefficient
is obtained from the relation Γ=Dt q 2 where q is the scattering vector, given by
q= (4πn/λ) sin (θ/2). The refractive index of the liquid is n. The wavelength of the
laser light is λ, and scattering angle, θ. Inserting Dt into the Stokes-Einstein equation
then solves for particle size Dh is the final step.
kBT
EQUATION 2 Dh =
3πηDt
Where:
Dh = the hydrodynamic diameter
Dt = the translational diffusion coefficient
kB = Boltzmann’s constant
T = temperature
η = dynamic viscosity
21
ZETA POTENTIAL
The charge on the surface of a particle influences the ionic environment in the
region close to the particle surface. This ionic environment is typically described
using a double layer model – the Stern layer of ions firmly attached adjacent to
the particle surface, and the diffuse layer further away from the particle surface,
but still attracted to the particle such that these ions will move with the particle.
zeta
mV potential The boundary between the electric double layer and the ions in equilibrium in the
negatively charged solution is called the slipping plane, as shown in Figure 27. Zeta potential is defined
particle surface
dispersion as the potential measured in mV at the slipping plane distance from the particle
surface.
|
figure 27 ZETA POTENTIAL
The zeta potential is the the electric field is applied the particles move toward either the anode or cathode
charge in mV measured at depending on whether the surfaces are positively or negatively charged. The
the slipping plane. direction of the motion indicates positive vs. negative charge. The speed of the
particle motion is used to calculate the magnitude of the charge.
TRANSMITTED LIGHT
ELECTRODE PARTICLE MONITOR (PD)
FORWARD DETECTOR
(PMT)
MODULATOR
|
figure 28 OPTICAL DIAGRAM OF THE SZ-100V2
CONFIGURATION FOR ZETA POTENTIAL
As shown in the top view, above, of the optical setup for zeta potential
measurements in the SZ-100V2, the particles are illuminated with laser light and,
therefore, the particles scatter light. A second beam of light (the reference beam)
is mixed with the scattered beam in order to sensitively extract the frequency shift
in the scattered light. The measured magnitude of the frequency shift is then used
to determine the particle velocity. Equation 1 is used to calculate the electrophoretic
mobility (µ) using the measured frequency shift.
22
Δωλ0
EQUATION 1 μ =
θ’ )
4πnE sin( —
Where : 2
μ = the electrophoretic mobility
ω = the measured frequency shift
λ = the laser wavelength
n = the refractive index of the medium
θ’ contains the angular light scattering information
2ζε
EQUATION 2 μ = ƒ(κr)
3ηο
Where:
µ = the electrophoretic mobility
ζ = the zeta potential
ε = the dielectric permittivity of the medium
ηo = the viscosity
f=(κr) = a function describing the ratio of the particle radius to the double layer
MOLECULAR WEIGHT
The SZ-100V2 can also be used to measure the molecular weight of proteins,
starches, polymers, dendrimers and other large molecules. The data can be ob-
tained by two different methods: dynamic light scattering and static light
scattering. Both methods are discussed below.
Where:
Dt = diffusion coefficient
k = empirical constant
M = molecular weight
α = an empirical constant
The values for k and a are found empirically for polymer/solvent pairs. That is,
they must be specified for the polymer, solvent, and temperature. These values can
be found in the literature.
The advantages of this technique are that polymer concentration need not be
known and that molecular weight can be determined rapidly. It does, however, rely
on empirical constants and the nature of the average molecular weight.
23
Static Light Scattering
The SZ-100V2 can also be used in a static light scattering mode to measure the
molecular weight of proteins, small particles, and polymers. These results are
generated using a Debye plot (Figure 29) created by measuring the scattered
light at a single angle (90°) at multiple sample concentrations. The intercept of
the Debye plot is used to determine the molecular weight and the slope is used to
calculate the second virial coefficient.
Molecular weight from static light scattering experiments uses the Rayleigh
equation given below:
lim Kc = 1 + 2A 2c
θg0 ΔRθ Mw
Where:
K = the Debye constant
C = the sample concentration
Rθ = the Rayleigh ratio
Mw = the weight average molecular weight
A2 = the second virial coefficient
The limit given in the equation above deserves special attention. The equation only
works at the limit of zero angle. One practice required for larger macromolecules is
to use a multi-angle scattering instrument and extrapolate the result to zero angle.
For smaller molecules (Rg<20nm), this is not necessary and data at a single angle
can be used. However, this does introduce a systematic error that increases with
angle used. That is, measurement results using back angle have about twice the
systematic error compared to results obtained using scattering at right angle (90°).
For this reason, the SZ-100V2 collects light scattering data at 90°.
The advantage of this technique is that the results are well-defined and not reliant
on empirical correlations, although it requires careful sample preparation and is a
more time-intensive process.
0 5 10 15 20 25 30 35
|
figure 29
3.5 1.4
DEBYE PLOTS TO MEASURE
MOLECULAR WEIGHT OF
SEVERAL SAMPLES
AND CHLOROPHYLL
3.0 1.3
POLYSTYRENE (1kDa)
2.5 1.2
CHLOROPHYLL
1.5 1.0
1.0 0.9
0 1 2 3 4 5
24
PSA300
IMAGE
ANALYSIS
TECHNIQUE
The microscope has always been the referee technique in particle
characterization since it is accepted as the most direct measurement
of particle size and morphology. Automating manual microscopy has
been driven by the desire to replace a tedious, somewhat subjective
measurement with a sophisticated technique for quantifying size and
shape of a sufficient number of particles to assure statistical confidence
with the end result. Analysts performing manual microscopy tend to describe RANGE IN MICRONS
particle shape using language such as round, blocky, sharp, fibrous, etc. By 0.5 nm - 1,000 µm
assigning quantitative values rather than qualitative to various shape descriptors, OPTIMAL APPLICATIONS
image analysis systems provide numerical distributions of well defined shape POWDERS AND SUSPENSIONS
parameters WEIGHT 34kG (75 lbs) w/o computer
FOOTPRINT
Two distinct development paths have emerged over time differing in how the WIDTH 686mm (27”)
sample is introduced to the measurement zone: dynamic image analysis where DEPTH 483mm (19”)
HEIGHT 446mm (17.5”)
particles flow past one or more cameras and static image analysis where particles
sit on a slide moved by an automated stage for inspection by camera and
microscope.
Many basic functions operate the same with either approach (Figure
29): particles are presented to the measurement zone, images are
captured with a digital (CCD) camera, the particles are distinguished
from the background, various size and shape parameters are
measured for each particle, and a result report is generated. Additional
features built into modern image analysis software include the ability
to automatically separate two particles touching each other, filling
holes, smoothing or removing small protuberances,
separating overlapping circular objects, and
keeping track of incomplete objects in a field
in order to recombine them once all fields
are analyzed.
The samples measured by static image analysis typically rest on a slide that is
moved by an automated stage. With the PSA300 static image analysis system
a microscope and digital camera collect images of the particles as the slide is
scanned. Samples prepared on slides can include powders, suspensions, or creams.
Aerosol delivery forms such as metered dose inhalers or dry powder inhalers can
be inspected using static image analysis by actuating the device onto a slide for
measurement. In addition, particles in suspension (such as parenterals) can be
collected on a filter for characterization.
The majority of static image analysis measurements are made on powders, typically
used for solid oral dosage forms. Most powders require a sample preparation
step prior to analysis. Powder preparation devices—using either positive pressure
to impact on a hard surface or pulling and releasing a vacuum—break apart
agglomerates and create an even dispersion on the slide. After the sample has
been prepared and the automated stage has presented multiple fields to the
optics and camera for capture, a series of image processing steps occur in the
software. The first step is to separate the particles from the background by setting a
parameter with some threshold value. Setting this threshold can be done manually
or automatically based on phases in the grayscale image or through a contrast
threshold function based on the particle/background contrast.
After the threshold operation is completed several functions may be applied to the
image to improve the edge definition. The basic functions of erosion and dilation
improve edge definition by performing opposite tasks of removing or adding dark
pixels at the particle edge. Advanced functions using combinations of erosion and
dilation steps such as delineation and convex hull improve the edge definition of
particles, leading to accurate area and perimeter determinations that are critical for
shape factor calculations. Other software functions perform the task of separating
touching particles including the crossed fibers in order to quantify fiber length
distributions and aspect ratios.
75 100
60 80
45 60
30 40
15 20
0 0
1 2 5 10 30 50 100
|
figure 30 BASIC IMAGE ANALYSIS FUNCTIONS
Both static and dynamic image analysis
involve these basic steps.
26
Eyecon2 ™ IN-LINE
IMAGE
ANALYSIS
TECHNIQUE
In-line image analysis shares many of the features of laboratory analysis.
The major difference is that the measurement takes place directly in the
process and this poses several challenges. First, the process must have an
appropriate window for imaging. Second, the window location must have a
sufficient number of particles visible for good statistics and those particles
must be replaced over time to accurately reflect the current state of the RANGE IN MICRONS
process. Finally, the instrument, both camera and illumination, need to 50 - 5500 μm
be optimized for this application. If these conditions are met, then in-line OPTIMAL APPLICATIONS
analysis gives real-time feedback that enables better process monitoring POWDERS AND BULK SOLIDS
FOOTPRINT
WIDTH 250mm (9.8”)
DEPTH 128mm (5”)
HEIGHT 132mm (5.2”)
Direct imaging with the Eyecon2 enables users to understand particle size and shape
variation and in turn determine why a process is failing, why yield is reduced, what
the source of product variation is, and whether or how a
process can be best scaled up to commercial manufacturing.
RANGE IN MICRONS
movement. It is possible to measure particles while classifying them.
10 nm - 40 μm
FOOTPRINT
WIDTH 634mm (25”)
DEPTH 550 mm (21.7”)
HEIGHT 341mm (13.4”)
Surface area can impact shelf life, stability, dissolution and efficacy of
pharmaceutical powders and tablets. Likewise, surface area can affect the RANGE
rheological properties and hiding powers of pigments, paints, and coatings. It has Total Surface Area: 0.1 to 50 m2
a significant impact on the ability for materials like catalysts, adsorbents, filtration Specific Surface Area: ~ 0.01 – 2,000 m2/g
materials and air separation products to react in the designed application. OPTIMAL APPLICATIONS
Ceramics used in applications ranging from; dinner plates, to dental implants, to POWDERS
electronics, all are affected by surface area. WEIGHT 14.5 - 18.14kG (34.5 - 42lbs)
FOOTPRINT
While particle size is frequently used to control size reduction and milling WIDTH 356mm (14”)
DEPTH 356mm (14”)
of minerals and other substances, surface area can provide substantial size
HEIGHT 508mm (20”)
reduction feedback. Many times, a material which may have the same particle
size across different batches may reveal completely different surface areas due to
small changes in processing.
These tools use the robust and proven flowing gas method to
acquire gas adsorption and desorption data. This information
is then used to calculate total surface area utilizing the well-
known BET method. The advantage of the flowing gas method
is most evident in single-point mode where up to thirty sample
analyses can be performed per hour.
Must the new instrument match is DLS, then the decision is simple. On the other hand, if this is the first particle size
historic data? analyzer bought by a company for general purpose use, then flexibility and a wide
dynamic range should be important factors.
Do I need only particle size
distribution, or do I need additional
Sometimes the goal to buy a new instrument includes being able to correlate
information such as shape or surface
to existing data. Accomplishing this goal can range from easy to difficult. Just
charge?
upgrading from an older to newer model diffraction analyzer could cause a change in
results. The changes originate from many sources including differences in dynamic
range, advances in algorithms, and mechanic improvements to samplers. Switching
from an existing technique such as sieving to newer techniques like laser diffraction
or dynamic image analysis could also lead to changes in results. Data from sieves
are typically smaller than data from laser diffraction depending on the shape of the
particles. The less spherical the particle, the greater the difference will likely be.
30
Particle size distribution is sufficient information for the majority of particle char-
acterization applications. But some techniques are higher resolution than others.
Ensemble technologies such as laser diffraction and dynamic light scattering are
powerful techniques than are “resolution limited” compared to high resolution
techniques which are based on particle counting (such as electro zone counting
or image analysis). If the goal of the measurement is finding small populations of
particles larger or smaller than the main distribution, then an investigation of the
sensitivity to second distributions should be part of the selection process.
Particle shape information may be either desirable or critical depending on the de-
gree to which shape affects product performance. Particle shape influences bulk
properties of powders including flow and compaction behavior and the viscosity
of suspensions. For specific application such as glass beads used in highway
paint, shape is a critical factor for reflectivity. When particle shape information is
required, microscopy and image analysis are the only techniques that delivery
the desired data. Manual microscopy provides basic qualitative size and shape
information, but automated image analysis generates quantitative data that is
statistically significant. For this reason, both dynamic and static image analysis
are growing techniques replacing manual microscopy.
Laser diffraction is the most popular particle size technique for reasons including
speed, ease of use, and flexibility. The most basic laser diffraction system can
measure solid particles in suspensions and emulsions. With the addition of a dry
powder feeder the instrument can then also measure dry powders in air. This is a
low concentration technique, so dilution is often required. The complex refractive
index of the sample and diluent must be known for optimum accuracy, but this
information is easier to obtain than is often indicated (more often by competi-
tors than informed scientists). The HORIBA LA-960V2 has a wide dynamic range
capable of measuring down to 30nm and up to 5000µm. This unique ability to
measure particles < 100nm as well as agglomerates as large as hundreds of
microns makes this a credible choice even for nanotechnology applications. Since
this is such a powerful, flexible technique laser diffraction is often the best option
for companies buying their first analyzer, or hoping to satisfy multiple needs and
applications.
31
WHEN TO CHOOSE DYNAMIC LIGHT SCATTERING
Dynamic Light Scattering (DLS) can measure suspensions and emulsions from 1nm
to 1µm. Both the lower and upper limits are sample dependent. The lower limit
is influenced by concentration and how strongly the particles scatter light. A low
concentration sample of weakly scattering particles near 1nm can be extremely
difficult or at least difficult to reproduce. The upper size limit is determined mainly
by the density of the particles. DLS algorithms are based on all particle movement
coming from Brownian motion. Motion due to settling is not interpreted correctly
by DLS systems. In addition, particles settled on the bottom of the sample cuvette
can not be inspected by the laser light source. Particles with a high density will
settle more quickly than low density particles. The upper limit of DLS may be 8µm
for emulsion samples where the two phases have similar density. The upper limit
of uranium particles may be as small as 300nm. The upper limit of particles with a
density of 1.7 may be around 1µm.
Using DLS does not require any knowledge of the sample RI (it would be required
to convert from intensity to volume distribution), or concentration. What is required
is viscosity, especially for higher concentration samples. Although most modern
DLS systems claim the ability to work at higher concentrations, this is again sample
dependent. Serious DLS work could involve a dilution study to determine the nature
of the particle-particle interactions and presence of multiple scattering. Easy samples
are simply a matter of pipetting the sample into a cuvette and clicking one button.
More sophisticated DLS systems can also measure other sample characteristics
including zeta potential, molecular weight, and second virial coefficient. Generating
this additional information may require a greater skill set of the operator.
Many laboratories are now replacing manual microscopy with automated image
analysis. While microscopy provides qualitative accuracy and shape information, it
requires automated image analysis to inspect the number of particles requited to
obtain statistically valid quantitative results. Choosing image analysis is often driven
by the desire to generate results that are accurate, sensitive to second populations,
contains shape information, and includes images of the particles. Dynamic image
analysis is used in both research and QC laboratories for particles ranging from
30µm to 30mm. Static image analysis is typically a research tool for measuring
particles in the 0.5 to 1000µm range. Deciding between dynamic or static image
analysis is seldom difficult, as the applications are typically better served by one
technique or the other, as proven through application development studies.
32
REFERENCES
5 (PAGE 7)
ISO 13322-2 Particle size analysis – Image
analysis methods – Part 2: Dynamic image
analysis methods
7 (PAGE 10)
TN154, Particle Size Result Interpretation:
Number vs. Volume Distributions, available at
www.horiba.com/us/particle
8 (PAGE 11)
TN156, Particle Size Result Interpretation:
Understanding Particle Size Distribution Calcula-
tions, available at www.horiba.com/us/particle
9 (PAGE 12)
ISO 13320-1 Particle size analysis – Laser dif-
fraction methods
10 (PAGE 12)
USP<429> Light Diffraction Measurement of
Particle Size
33
HORIBA INSTRUMENTS INCORPORATED
www.horiba.com/particle