BPT 602 Lecture 14-16
BPT 602 Lecture 14-16
14.03.2022
Topics
• Reciprocal space
• X-ray diffraction
• Bragg’s law
• Laue equation
• Qualitative determination of the crystal
structure
• Ewald's construction
2
Introduction
Crystals can’t be examined directly using optical microscopes;
X ray scattering/Diffraction
4
Reciprocal Lattice vector
3D 2D
* * * * *
*
Ghkl h b1 k b2 lb3 G*
hkl h b1 k b2
* 2 * 1
b1 a2 a3 b1 a2 n
V A
* 1
* 2
b2 a3 a1 b2 n a1
V A
* 2
b3 a1 a2 A a1 a2
V
V a1. a2 a3 ai . b j 2 ij
Reciprocal space
• Reciprocal space is also called Fourier space, k- space, or
momentum space in contrast to real space or direct space.
• The reciprocal space lattice is a set of imaginary points
constructed in such a way that the direction of a vector from one
point to another coincides with the direction of a normal to the real
space planes and the separation of those points (absolute value of
the vector) is equal to the reciprocal of the real interplanar
distance.
• The things which are larger in real space are smaller in reciprocal
space by definition.
6
Properties of Reciprocal lattice
• The reciprocal lattice of a Bravais lattice is again a Bravais lattice.
• The reciprocal lattice of a reciprocal lattice is the (original) direct
lattice.
• Consider a reciprocal lattice vector G such that:
* * *
G ha kb lc
• where h, k and l are both integers, and are the Miller Indices of a plane
in real space (h k l)
• This vector G has two important properties
1
G (hkl ) G
d hkl
b a c a
B ;C
k h l h
B C G (hkl )
G (hkl )
n
G (hkl )
a a G (hkl )
d hkl .n .
h h G (hkl )
* * *
a ha kb lc 2
.
h G (hkl ) G (hkl )
Construction of reciprocal lattice
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The moduli (lengths) of the perpendicular vectors (σhkl) are reciprocal to the
interplanar spacings. The end points of these vectors (blue arrows in figure) also
produce a periodic lattice that, due to this reciprocal property, is known as the
reciprocal lattice of the original direct lattice. The reciprocal points obtained in this
way (green points) are identified with the same numerical triplets hkl (Miller
indices) which represent the corresponding plane family.
Crystal X-ray diffraction
• Diffraction occurs when each object in a periodic array scatters
radiation coherently, producing concerted constructive interference at
specific angles.
• The electrons in an atom coherently scatter X-rays. The electrons
interact with the oscillating electric field of the X-ray.
• The atoms in a crystal are a periodic array of coherent scatterers and
thus can diffract X-rays.
• Diffraction from different planes of atoms produces a diffraction
pattern, which contains information about the atomic arrangement
within the crystal
• X-Rays are also reflected, scattered incoherently, absorbed, refracted,
and transmitted when they interact with matter.
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Scattering
• X-rays, Electrons, Neutrons
• X-rays scatter from the electrons X-rays are scattered by the electrons in a
material through an interaction between the negatively charged electrons
and the electromagnetic field of the incoming X-rays.
• respond to the applied field of the X-ray flux, oscillating with the period of
the X-ray beam. These accelerated charged particles then emit their own
electromagnetic field, identical in wavelength and phase to the incident X-
rays. The resultant field, which propagates radially from every scattering
source, is called the scattered wave.
• Intensity proportional to the density n(r) - Mainly the core electrons
around the nucleus
• Similarly for high energy electrons. Electrons are scattered much more
strongly than X-rays as electrons are scattered both by the electron cloud
and by the nucleus of an atom.
• Neutrons scatter from the nuclei (and electron magnetic moment)
X-ray scattering
Penetration
depth Interaction Volume
1 mm
13
X-ray scattering
14
Braggs Law
Bragg’s equation
2dsinθ=nλ
n=order of diffraction
λ=X-ray wavelength,
d=distance between lattice planes,
θ=angle of incidence of the radiation
• Diffraction occurs ONLY when the path difference between the parallel X-
rays are an integer of the wavelength.
• Additionally, the plane normal [hkl] must be parallel to the diffraction
vector s where diffraction vector s: the vector that bisects the angle
between the incident and diffracted beam
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Bragg’s equation tells us about the position of the diffraction peaks (in terms of ) but tells
us nothing about the intensities.
Diffraction: single crystal
A single crystal specimen in a Bragg-Brentano diffractometer would produce only one
family of peaks in the diffraction pattern.
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Sample rotation
• Diffraction from a single crystal will
[400]
produce a diffraction point for each set
s of planes. Therefore need to rotate
sample to see different planes
2
[220] [220]
s s
The sample can be tilted to measure
Bragg peaks with different crystallographic
directions
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Diffraction: polycrystalline
A polycrystalline sample should contain thousands of crystallites. Therefore, all possible
diffraction peaks should be observed.
19
Diffraction from single crystal
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Diffraction from single crystal
• The diffraction pattern of a single crystal
consists of spots whose distance from the
center depends on the interplanar(d) spacing of
the crystallographic planes which generated the
diffraction effect.
• The closer the spots to the center, the lower the
θ angle at which diffraction occurs, the larger
the interplanar(d) spacing.
• Every family of crystallographic planes generates
a group of spots at the same distance from the
center i.e. these spots will lie on a circle.
• The number of these spots depends on the
symmetry of the crystal.
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Diffraction pattern (Example)
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Single Crystal 4 Crystallites rotated w.r.t each other
Polycrystalline
Water 2010, 2
Diffraction spectra
27
Information from Diffraction spectra
1) Peak positions:
- refer to geometrical parameters: (unit cell, space group)
- influenced by stresses
2) Peak intensities:
- refer to electron density distribution within the unit cell
- influenced by preferred orientation / texture in thin films and
manufactured materials (rolling processes,…)
3) Peak shape:
- refers to the quality (defects) in single crystal materials (broadness)
- refers to the crystallite size in polycrystalline materials (broadness)
- strain (asymmetry)
- (influenced by diffractometer setup)
28
Peak shape(Broadening)
Origin of Line Broadening
• Instrumental
– The radiation is not perfectly monochromatic(finite width of Kα line)
– Unresolved Kα and Kβ line
– Beam divergence
– Non ideal optics
• Imperfect crystal
– crystallite size (smaller the crystallite size, fewer lattice planes,
broader the peak)
– crystal lattice distortion (micro-strain) due to dislocations and
concentration gradients
– Structural defects like stacking faults, twin faults and more
– concentration gradients in non-stoichiometric compounds
Diffraction spectra
• With modern X-ray diffractometers the signals are converted into peaks
• The angular positions (2q) and intensities of the diffracted peaks of radiation(reflections
or peaks) produce a two dimensional pattern
• This pattern is characteristic of the material analysed (fingerprint)
2θ
44.48
51.83
76.35
92.90
98.40
121.87
144.54
155.51
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Equivalence of the Bragg and Laue formulations
• A Laue diffraction peak corresponding to a change in the wave vector given by the reciprocal lattice
vector corresponds to a Bragg reflection from the family of direct lattice planes perpendicular to 𝐺⃗ .
• The order, n, of the Bragg reflection is just the length of divided by the length of the shortest
reciprocal lattice vector parallel to 𝐺⃗ .
• (222) diffraction peak is the 2nd order (n=2) diffraction peak of the (111) plane.
Ewald sphere
Diffraction can be represented graphically using the Ewald construction as follows
• Construct the reciprocal lattice of the crystal
• Draw the incidence wave vector k0 with the origin chosen such that k0
terminates at the reciprocal lattice point.
• Draw a sphere of radius centered at the origin k0.
• Find the reciprocal lattice points lying on the surface of the surface and draw
the scattered vectors k to these points.
• Only the points lying on the Ewald sphere surface will give rise diffraction.
Coherent X-ray diffraction uses a monochromatic beam. With monochromatic X-rays the
Ewald sphere passes only through a limited number of reciprocal lattice points making it
necessary to rotate the sample to measure different Bragg reflections.
• Laue diffraction is based on polychromatic X-ray beams covering a large energy range.
• When employing a broad spectrum of X-rays, a large number of reciprocal lattice points
are accessible simultaneously.
• The two circles indicate the respective Ewald sphere for the X-rays with the largest
energy (shortest wavelength) and the lowest energy (longest wavelength) within the
spectrum of the polychromatic X-ray beam.
• All reciprocal lattice points which are in between these two circles (indicated by the
shaded area) are measured simultaneously without any rotation of the crystal.
• This technique using a white (or polychromatic) X-ray beam is known as Laue diffraction
which is historically the very first diffraction technique that has been employed in fact by
Max von Laue.
Ewald sphere for 2D lattice
• A 2D lattice can be thought as a 3D lattice with infinite Dotted horizontal line: Sample
periodicity in the normal direction 𝑐⃗ → ∞.
• This leads to the reciprocal lattice vector 𝑐 ∗ → 0. So
the reciprocal lattice points along the normal direction
is very closely spaced (i.e. they are infinitely dense)
forming rods.
• In contrast to 3D lattice, the 2D lattice has reciprocal
lattice rods associated with every 2D reciprocal lattice
points in the plane.
• The Ewald sphere will intersect the reciprocal lattice
rods.
• The incidence wave vector k0 that terminates at the
reciprocal lattice rod will give rise to diffraction.
• The wave vector component normal to the surface is
not conserved in this process.
• The law of conservation of momentum concerns with
∥ ∥
only the wave vector components parallel to the
surface.
• Tip of the incidence vector is the origin (00).
Ewald Sphere for 2D lattice
• The radius of the Ewald sphere is defined by the incident radiation energy and its center by the
wave vector of the incident beam.
• Spots are observed whenever the Ewald sphere intersects with reciprocal lattice rods of the surface.
• Accordingly, a one-dimensional scan through the LEED pattern corresponds to a line along the circle,
and the measured distances between LEED spots reflect the perimeter of the arc between
reciprocal lattice rods.
• Ideally Surface is one atomic layer.
• The mean free path of the of low-energy electrons (20–200 eV) is 5– 10 Å .
• If the interlayer spacing is ~ 2.5 Å, then LEED beam will see 4 layers (i.e. more than
one layer).
• Thus in reality the reciprocal lattice seen by LEED is a mixture between continuous
rods and discrete points.
• Energy conservation demands that the length of the k-vector is the same, for
both the incoming and the elastically scattered electron wave.
• and
ℏ ℏ
• ∥
• ℏ ∥
• There is no Laue-condition for the z-component of ko. The only condition for
diffraction into a spot is that kz,o has a real value.
• This condition is synonymous with the obvious fact that the length of the parallel
component of k cannot be greater than the length of the entire vector, but it
also limits the number of observable LEED spots.
• The number of observable spots increases With increasing electron energy while
the polar emission angle with respect to the specular spot (0,0) decreases for
each spot.