SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017

KIM LONG CALIBRATION AND TECHNOLOGIES CO. LTD.

No. 111, Luong Dinh Cua Street
Town 3, An Khanh Ward, Thu Duc City, Ho Chi Minh City
VIETNAM
Tran Minh Cuong (Kevin) Phone: 84 28 6281 8479

CALIBRATION

Valid To: February 28, 2025 Certificate Number: 4184.01

In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to this
laboratory at the location listed above as well as the satellite laboratory location listed below to perform the
following calibrations1:

I. Acoustical

Parameter/Equipment Range CMC2 (±) Comments

Sound Level Meter3 –

(@ 1 kHz) (94 and 114) dB 0.59 dB KQT-33K3-4-2911-1,
BK Cal 73

II. Chemical

Parameter/Equipment Range CMC2 (±) Comments

Conductivity Meter3 1.3 µS/cm 0.018 µS/cm KQT-CD-01

5 µS/cm 0.10 µS/cm manufacturer’s manual,
84 µS/cm 0.38 µS/cm standard solution
1413 µS/cm 7.4 µS/cm
12.88 mS/cm 0.041 mS/cm

(A2LA Cert. No. 4184.01) 05/30/2023 Page 1 of 55

 Parameter/Equipment Range CMC2, 5 (±) Comments

pH Meter3 4.01 pH 0.025 pH KQT-17-20SC-42

7.00 pH 0.025 pH manufacturer’s manual,
10.00 pH 0.025 pH standard solution

Refractometer3 (5 to 85) % Brix 0.28 % Brix KQT-RE-01

Up to 10 % Salinity 0.25 % Salinity manufacturer’s manual,
Hanna HI96801

Turbidity Meter3 (0 to 800) NTU 2.4 % + 0.02 NTU KQT-TU-01

manufacturer’s manual,
Hanna HI98703

TDS Meter3 50 mg/L 0.44 mg/L KQT-TDS-01

500 mg/L 2.0 mg/L reference conductivity
1000 mg/L 4.3 mg/L standard solution

Dissolved Oxygen Meter (0.0 to 50.0) mg/L 0.13 mg/L KQT-DO-01

manufacturer’s manual
standard solution
Hanna HI9147

Hydrometer (0.600 to 2.000) g/cm3 0.002 g/cm3 KQT-HY-01,

manufacturer’s manual
standard hydrometers

Alcoholmeter Up to 100 % V 0.4 % V KQT-AL-01

manufacturer’ manual
standard alcoholmeter

(A2LA Cert. No. 4184.01) 05/30/2023 Page 2 of 55

 Parameter/Equipment Range CMC2, 5 (±) Comments

Gas Detectors

H2S 0.0025 % 7.0 % KQT-17-20SY-06,

CO 0.0050 % 2.8 % manufacturer’s manual,
CH4 50 % LEL 3.0 % standard gas
C4H8 0.001 % 2.3 %
C4H8 0.01 % 2.3 %
O2 12 % 2.5 %
O2 20.9 % 2.4 %
CO2 2% 2.3 %
CO2 0.2 % 2.3 %
NH3 0.0025 % 5.8 %
NO2 0.0005 % 12 %
C2H4O 0.001 % 12 %
SO2 0.001 % 12 %
NO 0.04 % 2.0 %
SO2 0.05 % 2.1 %
CO 0.03 % 2.1 %
NO2 0.01 % 5.0 %

Viscosity Meter (100 to 200 000) cP 0.5 % KQT-17-20MV-01

standard solution

III. Dimensional

Parameter/Equipment Range CMC2 (±) Comments

Angle Up to 90° 43" KQT-33K6-4-157-1,

Meter/Clinometer angle block set

Calipers3 Up to 500 mm 0.0014 mm/m + 8.8 µm KQT-33K6-4-552-1,

(> 500 to 2000) mm 0.056 mm/m + 6.7 µm gauge block grade 0 +1,
caliper checker

Depth Gages3 Up to 1000 mm 0.017 mm/m + 0.007 mm KQT-33K6-4-17-1,

gauge block grade 0 +1

(A2LA Cert. No. 4184.01) 05/30/2023 Page 3 of 55

 Parameter/Equipment Range CMC2 (±) Comments

Coordinate Measuring
Machines (CMM) 3 –

3-Axis Linearity Only X: (10 to 900) mm 8.2 µm/m KQT-CMM-01

Y: (10 to 900) mm 8.2 µm/m Manufacturer’s
Z: (10 to 500) mm 8.2 µm/m manual, gauge block
grade 0+1

Micrometers3 Up to 25 mm 0.27 µm KQT-33K6-4-15-1,

(> 25 to 100) mm 0.044 mm/m + 0.7 µm gauge block grade 0
(> 100 to 500) mm 0.008 mm/m + 0.3 µm +1
(> 500 to 1000) mm 0.013 mm/m – 2.4 µm

Dial Indicator3/Dial Test Up to 1 mm 6.8 mm/m + 0.42 µm KQT-IN-01,

Indicator3 (1 to 100) mm 0.12 mm/m + 0.58 µm gauge block grade 0
+1, Mitutoyo UDT-3

Dial Bore Gages3 (1 to 100) mm 0.0043 mm/m + 0.63 µm KQT-IN-01,

(> 100 to 500) mm 0.0078 mm/m + 0.33 µm gauge block grade 0
(> 500 to 800) mm 0.0073 mm/m + 0.53 µm +1

Gage Blocks3 (1 to 25) mm 0.0013 mm/m + 0.19 µm KQT-33K6-4-1-1,

(> 25 to 100) mm 0.0032 mm/m + 0.14 µm Pratt & Whitney B
(> 100 to 500) mm 0.0044 mm/m + 0.025 µm Mahr ULM-1000E

Height Gages3 (1 to 100) mm 0.0036 mm/m + 0.17 µm KQT-33K6-4-1626-1,

(> 100 to 500) mm 0.0054 mm/m - 0.12 µm gauge block grade 0
(> 500 to 1000) mm 0.076 mm/m – 1.1 µm +1

Holtest (6 to 75) mm 0.0014 mm/m + 1.9 µm KQT-HT-01, setting

ring

Microscope, Measuring (0.01 to 1) mm 0.091 mm/m + 0.6 µm KQT-33K6-4-1268-1,

Profile Projector/Optical (> 1 to 500) mm 0.0041 mm/m + 2.4 µm manufacturer’s
Comparator3 manual, KLC source
procedure, standard
glass scale

(A2LA Cert. No. 4184.01) 05/30/2023 Page 4 of 55

 Parameter/Equipment Range CMC2 (±) Comments

Pin/Plug Gages3 Up to 100 mm 0.0027 mm/m + 0.19 µm KQT-33K6-4-121-1,

Pratt & Whitney B
Mahr ULM-1000E

Thread Plug Gage Up to 100 mm 0.032 mm/m + 0.22 µm KQT-TPG-01

KLC source
procedure, Mahr
ULM-1000E

Setting Rings Up to 150 mm 0.011 mm/m + 0.6 µm KQT-33K6-4-2-1,

Mahr ULM-1000E

Thread Ring Gage Up to 125 mm 0.027 mm/m + 0.22 µm KQT-TRG-01

KLC source
procedure,
Mahr ULM-1000E

Surface Plate Flatness – [(12 x 12) to (48 x 62 µin KQT-17-20MD-14,

Repeatability Only3, 4 96)] in repeat-o-zero

Thickness Gages/Feeler Up to 1 mm 0.7 µm KQT-TH-01,

Gages and Thickness (> 1 to 50) mm 0.0037 mm/m + 0.61 µm gauge block grade 0
Films3 (> 50 to 500) mm 0.081 mm/m + 0.18 µm +1, Mitutoyo MDH-
25M

Steel Ruler Up to 2000 mm 0.06 mm KQT-SR-01

DLVN 283:2015
standard glass scale

Measuring Tape Up to 100 m 0.6 mm KQT-MT-01

DLVN 266
standard glass scale
standard weight

(A2LA Cert. No. 4184.01) 05/30/2023 Page 5 of 55

 Parameter/Equipment Range CMC2 (±) Comments

Distance & Length Up to 50 m 0.003 m KQT-D&L-01

Measuring Instruments laser distance meter

Precision Level/Square 0.02 mm/m 0.026 mm/m KQT-PL-01

Level/Sprit Level 0.05 mm/m 0.037 mm/m DLVN 120
0.1 mm/m 0.062 mm/m standard precision
level

Radius Gauge 0.1 mm to 50 mm 0.02 mm/m+ 3.6 µm KQT-RAG-01

video measuring
system VMS-3020G

Sieve (0.15 to 5) mm 0.08 mm/m + 3.6 µm KQT-SI-01

digimatic caliper,
video measuring
system VMS-3020G

Metal Detector3 –

Ferrous (0.5 to 2.5) mm 0.0009 mm KQT-ME-01,

Brass (0.5to 2.5) mm 0.0009 mm manufacturer’s
Sus (0.5 to 3.5) mm 0.0009 mm manual,
precision balls

(A2LA Cert. No. 4184.01) 05/30/2023 Page 6 of 55

IV. Electrical – DC/Low Frequency

Parameter/Range Frequency CMC2, 6 (±) Comments

AC Current – Generate3

Up to 2.2 mA (20 to 40) Hz 0.2 mA/A + 0.035 µA KQT-17-20AQ-101,

40 Hz to 1 kHz 0.2 mA/A + 0.035 µA KLC source procedure
(1 to 5) kHz 0.2 mA/A + 0.11 µA manufacturer’s manual,
(5 to 10) kHz 1.5 mA/A + 0.65 µA Fluke 5720A

(2.2 to 22) mA (20 to 40) Hz 0.2 mA/A + 0.35 µA

40 Hz to 1 kHz 0.2 mA/A + 0.35 µA
(1 to 5) kHz 0.2 mA/A + 0.55 µA
(5 to 10) kHz 1.4 mA/A + 5 µA

(22 to 220) mA (20 to 40) Hz 0.2 mA/A + 3.5 µA

40 Hz to 1 kHz 0.2 mA/A + 2.5 µA
(1 to 5) kHz 0.2 mA/A + 3.5 µA
(5 to 10) kHz 1.3 mA/A + 10 µA

220 mA to 2.2 A (1 to 5) kHz 0.5 mA/A + 80 µA

(5 to 10) kHz 8.5 mA/A + 160 µA

(1.5 to 11) A (45 to 65) Hz 0.8 mA/A+ 2 mA Fluke 5500A

(65 to 500) Hz 1.2 mA/A+ 2 mA
(0.5 to 1) kHz 3.8 mA/A + 2 mA

(11 to 500) A 45 Hz to 1 kHz 0.6 mA/A + 100 mA Fluke 5500A w/

5500/coil

AC Current – Measure3

(5 to 100) μA (10 to 20) Hz 4.6 mA/A + 0.03 µA KQT-17-20AH-06,

(20 to 45) Hz 1.8 mA/A + 0.03 µA KLC source procedure,
(45 to 100) Hz 0.9 mA/A + 0.03 µA manufacturer’s manual,
100 Hz to 5 kHz 0.9 mA/A + 0.03 µA HP 3458A

100 μA to 10 mA (10 to 20) Hz 4.6 mA/A + 2 µA

(20 to 45) Hz 1.8 mA/A + 2 µA
(45 to 100) Hz 0.9 mA/A + 2 µA
100 Hz to 5 kHz 0.64 mA/A + 0.2 µA

(A2LA Cert. No. 4184.01) 05/30/2023 Page 7 of 55

 Parameter/Range Frequency CMC2, 6 (±) Comments

AC Current – Measure3
(cont)

(10 to 100) mA (10 to 20) Hz 4.6 mA/A + 20 µA KQT-17-20AH-06,

(20 to 45) Hz 1.7 mA/A + 20 µA KLC source
(45 to 100) Hz 0.9 mA/A + 20 µA procedure,
100 Hz to 5 kHz 0.6 mA/A + 20 µA manufacturer’s
manual,
100 mA to 1 A (10 to 20) Hz 4.7 mA/A + 0.2 mA HP 3458A
(20 to 45) Hz 1.9 mA/A + 0.2 mA
(45 to 100) Hz 1.1 mA/A + 0.2 mA
100 Hz to 5 kHz 1.3 mA/A + 0.2 mA

Up to 2000 A (50 to 1000) Hz 3.1 mA/A HP 3458A and high

voltage divider and
Kyoritsu 2009R

AC Voltage – Generate3

(Up to 220) mV
40 Hz to 20 kHz 0.11 mV/V + 7 µV KQT-17-20AQ-101,
(20 to 50) kHz 0.26 mV/V + 7 µV KLC source
(50 to 100) kHz 0.59 mV/V + 17 µV procedure,
(100 to 300) kHz 1.1 mV/V + 20 µV manufacturer’s
300 kHz to 1 MHz 3.4 mV/V + 45 µV manual, Fluke 5720A
and 5500A
220 mV to 2.2 V 40 Hz to 20 kHz 0.06 mV/V + 8 µV
(20 to 50) kHz 0.10 mV/V + 10 µV
(50 to 100) kHz 0.14 mV/V + 30 µV
(100 to 300) kHz 0.52 mV/V + 80 µV
300 kHz to 1 MHz 2.1 mV/V + 0.3 mV

(2.2 to 22) V 40 Hz to 20 kHz 0.06 mV/V + 0.05 mV

(20 to 50) kHz 0.10 mV/V + 0.1 mV
(50 to 100) kHz 0.13 mV/V + 0.2 mV
(100 to 300) kHz 0.35 mV/V + 0.6 mV
300 kHz to 1 MHz 1.9 mV/V + 3.2 mV

(22 to 220) V 40 Hz to 20 kHz 0.07 mV/V + 0.6 mV

(20 to 50) kHz 0.10 mV/V + 1 mV
(50 to 100) kHz 0.14 mV/V + 2.5 mV

220 V to 1.1 kV 50 Hz to 1 kHz 0.09 mV/V + 3.5 mV

(A2LA Cert. No. 4184.01) 05/30/2023 Page 8 of 55

 Parameter/Range Frequency CMC2, 6 (±) Comments

AC Voltage – Measure3

(0 to 10) mV 40 Hz to 1 kHz 0.2 mV/V + 1.1 µV KQT-17-20AH-06,

1 kHz to 20 kHz 0.4 mV/V + 1.1 µV KLC source procedure,
50 kHz to 100 kHz 6 mV/V + 1.1 µV manufacturer’s manual
HP 3458A
(10 to 100) mV 40 Hz to 1 kHz 0.1 mV/V + 2 μV
1 kHz to 20 kHz 0.2 mV/V + 2 μV
50 kHz to 100 kHz 0.9 mV/V + 2 μV

100 mV to 1 V 40 Hz to 1 kHz 0.1 mV/V + 20 μV

1 kHz to 20 kHz 0.2 mV/V + 20 μV
50 kHz to 100 kHz 0.9 mV/V + 20 μV

(1 to 10) V 40 Hz to 1 kHz 0.1 mV/V + 0.2 mV

1 kHz to 20 kHz 0.2 mV/V + 0.2 mV
50 kHz to 100 kHz 0.9 mV/V + 0.2 mV

(10 to 100) V 40 Hz to 1 kHz 0.2 mV/V + 2 mV

1 kHz to 20 kHz 0.2 mV/V + 2 mV
50 kHz to 100 kHz 1.4 mV/V + 2 mV

100 V to 1 kV 40 Hz to 1 kHz 0.5 mV/V + 20 mV

1 kHz to 20 kHz 0.7 mV/V + 20 mV
50 kHz to 100 kHz 3.5 mV/V + 20 mV

Parameter/Equipment Range CMC2, 6 (±) Comments

Capacitance – Generate3 (0.5 to 1.1) nF 1.4 mF/F + 10 pF KQT-17-20AQ-101,

(@ 1 kHz) (1.1 to 3.3) nF 1.2 mF/F + 10 pF KLC source procedure,
(3.3 to 11) nF 1.9 mF/F + 10 pF manufacturer’s manual,
(11 to 33) nF 3.1 mF/F + 100 pF Fluke 5500A
(33 to 110) nF 3.3 mF/F + 100 pF
(110 to 330) nF 3.3 mF/F + 300 pF
330 nF to 1.1 µF 3.8 mF/F + 1 nF
(1.1 to 3.3) µF 4.2 mF/F + 3 nF
(3.3 to 11) µF 4.5 mF/F + 10 nF
(11 to 33) µF 4.8 mF/F + 30 nF
(33 to 110) µF 6.4 mF/F + 0.1 µF
(110 to 330) µF 8.2 mF/F + 0.3 µF

(A2LA Cert. No. 4184.01) 05/30/2023 Page 9 of 55

 Parameter/Equipment Range CMC2, 5, 6 (±) Comments

DC Current – Generate3 (0 to 220) μA 110 μA/A + 6 nA KQT-17-20AQ-101,

220 μA to 22 mA 52 μA/A + 40 nA KLC source procedure,
(22 to 220) mA 69 μA/A + 0.7 µA manufacturer’s manual,
220 mA to 2.2 A 110 μA/A + 12 µA Fluke 5720A

(2.2 to 11) A 710 μA/A + 330 µA Fluke 5500A

(11 to 500) A 0.7 mA/A + 17 mA Fluke 5500A w/

550/coil

DC Current – Measure3 (0 to 100) μA 25 µA/A + 0.8 nA KQT-17-20AH-06,

100 μA to 1 mA 25 µA/A + 5 nA KLC source procedure,
(1 to 10) mA 25 µA/A + 5 nA manufacturer’s manual
(10 to 100) mA 45 µA/A + 0.5 µA HP 3458A,
(0.1 to 1) A 120 µA/A + 10 µA Fluke 8845A

(1 to 10) A 0.58 mA/A + 0.5 mA HP 3458A and shunt

(10 to 2000) A 6 mA/A + 10 mA Kyoritsu 2009R

DC Voltage – Generate3 (0 to 220) mV 14 µV/V + 0.7 µV KQT-17-20AQ-101,

220 mV to 2.2 V 8.1 µV/V + 1.4 µV KLC source procedure,
(2.2 to 11) V 5.6 µV/V + 5 µV manufacturer’s manual,
(11 to 22) V 5.6 µV/V + 9 µV Fluke 5720A and 5500A
(22 to 220) V 8.1 µV/V + 90 µV
(220 to 1100) V 11 µV/V + 0.7 mV

DC Voltage – Measure3 (0 to 100) mV 12 µV/V + 0.35 µV KQT-17-20AH-06,

100 mV to 1V 9.3 µV/V + 0.4 µV KLC source procedure,
(1 to 10) V 9.3 µV/V + 1 µV manufacturer’s manual,
(10 to 100) V 12 µV/V + 40 µV Fluke 8845A,
(100 to 1000) V 12 µV/V + 0.15 mV HP 3458A

(0.5 to 10) kV 1.7 % 149-10A HV DMM

Power Analyzer/Meter3 Up to 5 kW 0.13 % KQT-33K1-4-1683-1,

KLC source procedure,
manufacturer’s manual,
Fluke 5500A

(A2LA Cert. No. 4184.01) 05/30/2023 Page 10 of 55

 Parameter/Equipment Range CMC2, 5, 6 (±) Comments

Resistance – Generate3 (0.13 to 1) Ω 0.64 mΩ/Ω + 2 mΩ KQT-17-20AQ-101,

(1 to 100) Ω 0.12 mΩ/Ω + 2 mΩ KLC source
(0.13 to 10) kΩ 0.12 mΩ/Ω + 2 mΩ procedure,
10 kΩ to 1 MΩ 0.19 mΩ/Ω + 2 mΩ manufacturer’s
(1 to 100) MΩ 1.2 mΩ/Ω manual, standard
resistance HARS-X-
9-0.001

Resistance – Measure3 Up to 10 Ω 0.03 mΩ/Ω + 0.05 mΩ KQT-17-20AH-06,

(10 to 100) Ω 0.03 mΩ/Ω + 0.5 mΩ KLC source
100 Ω to 1 kΩ 0.015 mΩ/Ω + 0.5 mΩ procedure,
(1 to 10) kΩ 0.023 mΩ/Ω + 5 mΩ manufacturer’s
(10 to 100) kΩ 5.5 mΩ/Ω + 50 mΩ manual, HP 3458A
(0.1 to 1) MΩ 0.1 mΩ/Ω + 2 Ω
(1 to 10) MΩ 0.2 mΩ/Ω + 100 Ω

Oscilloscopes3 –

DC Gain (Into 1MΩ) (1.8 to 200) mV 3.1 mV/V + 0.1 mV KQT-CG-7,

200 mV to 33 V 2.9 mV/V + 0.1 mV KLC source
procedure,
DC Gain (Into 50 Ω) (1.8 to 200) mV 3.1 mV/V + 0.1 mV manufacturer’s
200 mV to 2 V 4.1 mV/V + 0.1 mV manual,
Fluke 5500A-SC300
Leveled Sine Wave 50 kHz to 10 MHz 0.006 mHz/Hz
(Into 50 Ω) (10 to 300) MHz 0.17 mHz/Hz

Time Base Sweep 5 s to 100 µs 2 m/s

Rate – (Into 50 Ω) (50 to 2) µs 17 ms/s
1 µs to 20 ns 0.04 m/s
10 ns to 2 ns 0.03 ms/s

Electrical Calibration of (-200 to ˂ 0) ºC 0.05 % KQT-33K5-4-42-1

Thermocouple Type K (˃ 0 to 1200) ºC 0.01 % Fluke 5500A
with Indicators

Magnetic Flux – Gauss 3 mT 0.49 % KQT-33K1-4-1658-1

Meters3 50 mT 0.46 % manufacturer’s
300 mT 0.71 % manual, magnetic tool

(A2LA Cert. No. 4184.01) 05/30/2023 Page 11 of 55

 Parameter/Equipment Range CMC2, 5, 6 (±) Comments

Hipot/Withstanding (0.5 to 10) kV (AC) 13 mV/V + 5 V KQT-33K1-4-181-1,

Testers3 (0.5 to 10) kV (DC) 7.6 mV/V + 3 V KLC source procedure,
(10 to 20) kV (AC/DC) 3.5 % manufacturer’s manual,
(0.5 to 100) mA 1.4 % Kikusui 149-10A and
TOS 1200 and Tektronix
P6015A

Insulation Testers3 (0 to 100) MΩ 0.2 % KQT-33K2-4-33-1,

(0.1 to 10) GΩ 1.6 % KLC source procedure,
manufacturer’s manual,
HRRS decade resistance

LCR Meters3 (˃ 0 to 50) MΩ 0.23 % KQT-33K1-4-1260-1,

Resistance KLC source procedure,
manufacturer’s manual,
Inductance 1 μH to 999 mH 2.3 % + 0.5 µH LCR standard

Capacitance (Fixed 1 pF 0.19 %

Points) 10 pF 0.12 %
100 pF 0.12 %
1000 pF 0.12 %

V. Electrical – RF/Microwave

Parameter/Range Frequency CMC2, 6 (±) Comments

RF Power – Measure and

Measuring Instruments3

(-70 to 20) dBm 100 kHz to 18 GHz 0.54 dBm KQT-33K4-4-715-1,

KQT-33K4-4-105-1
(-30 to 20) dBm 50 MHz to 26.5 GHz 0.39 dBm KLC source procedure,
manufacturer’s manual,
HP 8340B monitored w/
Agilent N1911A w/
E4412A/8340B

(A2LA Cert. No. 4184.01) 05/30/2023 Page 12 of 55

VI. Fluid Quantities

Parameter/Equipment Range CMC2, 5 (±) Comments

Air Speed/Velocity Up to 30 m/s 0.21 m/s KQT-33K6-4-1769-1,

Meters velocity standard

Air/Mass Flow Meters3 (0.1 to 1) lpm 0.03 % lpm KQT-33K6-4-1769-

(> 1 to 30) lpm 1.7 % lpm 1A, mini-AP buck
(> 30 to 2500) lpm 2.7 % lpm flow calibrator M30B

Flow Meter for Liquid Up to 1000 lpm (0.0084V) lpm + 0.17 lpm KQT-33K6-4-1769-
1B, flow rate rig,
magnetic flowmeter

Burets (100 to 1000) µL 1.1 mL/L KQT-VO-01, standard

(1 to 10) mL 0.2 mL/L weight E2 and balance
(10 to 500) mL 0.1 mL/L

Pipettes (10 to 100) µL 5.2 mL/L KQT-VO-01,

(100 to 1000) µL 1.1 mL/L standard weight E2
(1 to 10) mL 0.2 mL/L and standard scale
(10 to 500) mL 0.1 mL/L

Volumetric Flasks (0 to 1000) mL 0.17 mL/L KQT-VO-01,

(1000 to 5000) mL 0.14 mL/L standard weight E2
and standard scale

(A2LA Cert. No. 4184.01) 05/30/2023 Page 13 of 55

VII. Mechanical

Parameter/Equipment Range CMC2, 5 (±) Comments

Balances and Scales3

Class I and II (1 to 500) mg 0.042 mg/g + 9.8 µg KQT-BA-01,

(0.5 g to 100) g 0.0016 mg/g + 35 µg OIML R76-1
(100 to 500) g 0.002 mg/g - 23 µg standard weights
(500 to 10000) g 0.0097 mg/g - 7.7 mg
(10000 to 20000) g 0.006 mg/g + 28 mg
(20000 to 30000) g 0.045 mg/g – 0.75 g

Class II, III, and IV (1 to 30) kg 0.0079 mg/g - 7 mg

(30 to 60) kg 0.24 g/kg - 7 g
(60 to 200) kg 0.039 g/kg + 5.1 g
(200 to 500) kg 0.093 g/kg – 5.7 g
(500 to 2000) kg 0.21 g/kg – 62 g

Durometer – Spring
Force

Type A – B – O Up to 4.5 kg 0.5 % KQT-33K6-4-1362-1,

ASTM D2240 partial
Type C – D – DO Up to 4.5 kg 0.1 % calibration, standard
weight E2 and
standard scale

Force Tester3 Up to 50 kgf 0.02 % KQT-17-20MF-04,

(50 to 500) kgf 0.1 % DLVN 109 KLC
(500 to 5000) kgf 0.46 % source procedure,
(5000 to 10 000) kgf 0.4 % standard weight E2,
M1 and load cell
LYLC-50and loadcell
VLC-10, loadcell
500-BE

(A2LA Cert. No. 4184.01) 05/30/2023 Page 14 of 55

 Parameter/Equipment Range CMC2, 5, 7 (±) Comments

Hardness Testers3 –

Indirect Verification HRBW:

of Rockwell Hardness Medium 0.93 HRBW KQT-HAR-01
Testers High 0.92 HRBW DLVN 63,
manufacturer’s manual
HRC:
Low 0.5 HRC
Medium 0.5 HRC
High 0.5 HRC

Hardness Testers3 –

Indirect Verification 300 HV 1.9 HV KQT-HAR-01

of Vickers Hardness 501 HV 9.1 HV DLVN 63,
Testers 703 HV 13 HV manufacturer’s manual

Mass/Weights

Class F1, F2, M1, (1 to 500) g 0.002 mg/g + 0.098 mg KQT-SW-01,

M2 and M3 OIML R111-1,
standard weight E2 and
Class F2, M1, M2, and (0.10 g to 1) g 0.089 mg/g +11 µg standard scale
M3 (500 to 5000) g 0.0069 mg/g - 2.3 mg

Class M1, M2, and M3 (5 to 20) kg 0.0097 mg/g - 17 mg

Particle Counter3/Dust (0.3 to 10) µm 4.5 % KQT-LCP-2800,

Monitor particle counter
(0.001 to 10.000) 6.8 % digital dust monitor
mg/m3

Pressure – Measuring
Equipment3
Gauges/Pressure (-12 to 300) psi 0.06 % DLVN 76,
Switch/Safety Valve Up to 10 000 psi 0.025 % KQT-17-20MP-06,
KLC source procedure,
Pressure Transmitter (4 to 20) mA 0.7 % Fluke 718 Seri and
module and Fluke 1G
Barometer/Manometer Up to 1100 hPa 0.06 % and Additel ADT681

(A2LA Cert. No. 4184.01) 05/30/2023 Page 15 of 55

 Parameter/Equipment Range CMC2, 5 (±) Comments

Surface Roughness & 0.48 µm 0.7 µm KQT-33K6-4-2021-1,

Surface Roughness 2.97 µm 0.4 µm manufacturer’s
Testers3 manual, Mitutoyo
178-602 and federal
reference standard

Crockmeter – (0 to 50) N 0.12 N KQT-CM-01

Force on the Finger (0 to 200) mm 0.03 mm digimatic caliper,
Rubbing Distance Test force gauge
Circular Friction Head

Torque Drivers & (0.10 to 300) N.m 0.8 % KQT-33K6-4-2930-1,

Wrenches3 (300 to 2000) N·m 1.3 % KLC source
procedure,
mount LTT-2100,
Insize IST-2200 N·m

Torque Analyzers Up to 500 N·m 0.1 % KQT-TA-01

DLVN 110:2002,
KLC source
procedure
torque wheel with
E2+M1+F1 weights

VIII. Optical Quantities

Parameter/Equipment Range CMC2, 5, 7 (±) Comments

Light Meters (20 to 100) lux 3.0 % + 0.1 lux KQT-33K4-4-475-1,

Illumination3 – Measure (100 to 1000) lux 3.0 % + 1 lux Konica CL-70F
and Measuring Equipment (1000 to 20 000) lux 3.0 % + 10 lux

Luminance
100 to 1000 cd/m2 4.3 % + 0.005 cd/m2 TES-137
Color Temperature
Fixed Point 2856 K 4.1 % + 1 K Konica CL 200A

(A2LA Cert. No. 4184.01) 05/30/2023 Page 16 of 55

 Parameter/Equipment Range CMC2 (±) Comments

Colorimeter &
Spectrophotometry –
Diffuse Reflectance
Color data: CIELAB

L* Illuminants C 2° Observer 64.80, 0.05 Chroma meter MFR

94.41, 72.64 and 72.27 manual
KQT-CH-01
10° Observer 66.15, 0.05 certified calibration
94.42, 71.94 and 71.17 plates

L* Illuminants D65 2° Observer 65.04, 0.05

94.42, 72.86 and 72.11

10° Observer 66.44, 0.05

94.41, 72.19 and 71.08

a* Illuminants C 2° Observer -29.16, - 0.05

0.16, -24.29 and 18.27

10° Observer -27.26, - 0.05

0.26, -19.97 and 20.17

a* Illuminants D65 2° Observer -29.51, - 0.05

0.31, -24.45 and 19.88

10° Observer -27.72, - 0.05

0.62, -20.16 and 21.40

b* Illuminants C 2° Observer 8.84, 2.35, 0.05

25.55 and 32.47

10° Observer 9.64, 0.05

2.31, 25.37 and 30.83

b* Illuminants D65 2° Observer 8.92, 2.22, 0.05

25.63 and 32.14

10° Observer 9.92, 0.05

2.26, 25.59 and 30.63

X Illuminants C 2° Observer 0.2772, 0.016

0.3152, 0.3237 and
0.4174

10° Observer 0.2832, 0.016

0.3155, 0.3312 and
0.4182

(A2LA Cert. No. 4184.01) 05/30/2023 Page 17 of 55

 Parameter/Equipment Range CMC2 (±) Comments

Colorimeter &
Spectrophotometry –
Diffuse Reflectance
Color data: CIELAB
(cont)

X Illuminants D65 2° Observer 0.2781, 0.016 Chroma meter MFR

0.3178, 0.3238 and manual
0.4194 KQT-CH-01
certified calibration
10° Observer 0.2849, 0.016 plates
0.3180, 0.3324 and
0.4208

Y Illuminants C 2° Observer 0.3652, 0.016

0.3219, 0.4019 and
0.3698

10° Observer 0.3692, 0.016

0.3221, 0.4004 and
0.3647

Y Illuminants D65 2° Observer 0.3813, 0.016

0.3346, 0.4152 and
0.3786

10° Observer 0.3833, 0.016

0.3348, 0.4128 and
0.3758

UV/Vis Spectrometer (254 to 875) mm 0.32 nm KQT-SP-01,

Light Absorbed Measure DLVN 91:2001,
at Wavelength (254 to Up to 0.3 Abs 0.0031 Abs ASTM E - 925
875) mm (0.3 to 0.5) Abs 0.0032 Abs type 666-S000/F7
(0.5 to 2) Abs 0.0047 Abs certified reference
standard

(A2LA Cert. No. 4184.01) 05/30/2023 Page 18 of 55

 Parameter/Equipment Range CMC2, 5, 7 (±) Comments

Radiometry – Measure,
Mass Fraction

As, Arsenic 4.7 mg/kg 0.4 mg/kg X-Ray analyzer,

Br, Bromine 181 mg/kg 9 mg/kg manufacturer’s manual
Cd, Cadmium 20.8 mg/kg 0.9 mg/kg KQT-XRF-01
Cr, Chromium 9.6 mg/kg 0.5 mg/kg low-density
Hg, Mercury 2.56 mg/kg 0.16 mg/kg polyethylene CRM
Pb, Lea 11.3 mg/kg 0.4 mg/kg
S, Sulfur 86 mg/kg 9 mg/kg
Sb, Antimony 9.6 mg/kg 0.7 mg/kg
Sn, Tin 20.7 mg/kg 1.6 mg/kg
Zn, Zinc 194 mg/kg 12 mg/kg

XRF – Measure Coating

Thickness

Ni, Nickel 9.6 µm 0.6 µm Manufacturer’s manual

KQT-XRF-01
Cu, Copper 9.2 µm 0.6 µm Calmetrics foil
standards
Au, Gold 0.26 µm 0.06 µm

Measuring Irradiance Up to 480 mW/cm2 7.0 % KQT-33K4-4-576-1,

OmniCure R2000 UV
radiometer MFR
manual

Specular Gloss3 – Gloss

Meters

High Gloss 7.6 GU @ 20° 0.6 GU KQT-GL-01,

Semi Gloss 37.4 GU @ 60° 1.1 GU standard gloss surface
Low Gloss 77.5 GU @ 85° 1.3 GU sample, manufacturer’s
96.8 GU @ 60° 1.1 GU manual

(A2LA Cert. No. 4184.01) 05/30/2023 Page 19 of 55

VIII. Thermodynamics

Parameter/Equipment Range CMC2, 5, 7 (±) Comments

Relative Humidity – KQT-33K5-4-84-1

Measuring Relative
Humidity Meters (20 to 90) % RH 2.8 % RH Vaisala HMP75 with
JIEO tech TH-ME 65

Temperature Measuring (-40 to 150) ºC 0.5 ºC Testo 735-1 with

Meters JIEO tech TH-KE 065
media chamber

Temperature – Measuring (-80 to -40) ºC 0.4 % + 0.05 ºC KQT-CG-13,

Equipment3 (-40 to 0) ºC 1.2 % + 0.05 ºC manufacturer’s
(0 to 300) ºC 0.08 % + 0.05 ºC manual,Testo 735-1
(300 to 1000) ºC 0.4 % + 0.05 ºC
(1000 to 1600) ºC 0.3 % + 0.05 ºC Fluke 725 with TC
sensors

Temperature – KQT-33K5-4-42-1,
Measuring Equipment (-40 to 0) ºC 0.22 ºC DLVN 137 and 138:
(0 to 150) ºC 0.21 ºC 2004, KLC source
Probe Thermometers3 (150 to 300) ºC 0.34 ºC procedure, E Testo
(300 to 650) ºC 1.0 ºC 735-1 Pt 100,
HS 5609 PRT with LK
LAB and Fluke dry/oil
bath

Infrared Temperature – (-18 to 150) ºC 1.3 ºC KQT-33K4-4-615-1,

Measuring Instruments3 (150 to 400) ºC 2.4 °C DLVN 124:2003,
(400 to 982) ºC 7 °C Omega BB701 + BB-
4A

(A2LA Cert. No. 4184.01) 05/30/2023 Page 20 of 55

 Parameter/Equipment Range CMC2, 5, 7 (±) Comments

Chamber/Dry Oven,3 –

Humidity (˃ 0 to 40) % RH 1.3 % RH KQT-CHDO-2015

(40 to 97) % RH 1.6 % RH ASTM D 5374 -1999
Vaisala MI 70 + Dickson
Temperature (-80 to -50) °C 0.4 °C DSB, Keysight 34970A
(-50 to 200) °C 0.6 °C data acquisition with data
(200 to 400) °C 1.2 °C loggers

Washing Machine, (30 to 70) ºC 0.15 ºC KQT-WM-01

Tumble Dry (50 to 2000) rpm 1.7 rpm Testo 735, Stopwatch,
Up to 10 800 s 2.2 s Tachometer RPM10
Up to 100 L 0.7 L Flow Meter

Moisture Content – KQT-WO-01

Measure

Moisture Meter (10 to 20) % 1% Orion 910 ,

Moisture Grain meter (3 to 10) % 0.5 % Ohaus MB25

Steam Sterilizer & (-40 to 140) °C 0.2 °C KQT-AC-01

Autoclave, Low Pressure (0 to 5) bar 0.06 bar Autoclave Temperature
Ovens and pressure data logger

Liquid Bath3 (-50 to 200) °C 0.6 °C KQT-CHDO-2015

(200 to 400) °C 1.2 °C ASTM D 5374 -1999
Dickson DSB
Keysight 34970A data
acquisition with data
loggers

(A2LA Cert. No. 4184.01) 05/30/2023 Page 21 of 55

IX. Time & Frequency

Parameter/Equipment Range CMC2, 5, 7 (±) Comments

Frequency – Measure3 Up to 1MHz 0.23 Hz KQT-33K3-4-3340-1

(1 to 100) MHz 1.0 Hz KLC source procedure,
(100 to 500) MHz 0.3 Hz manufacturer’s manual:
(0.5 to 1) GHz 1 Hz Agilent 53132A
(1 to 3) GHz 3 Hz
(3 to 5) GHz 5 Hz
(5 to 8) GHz 8 Hz
(8 to 12.4) GHz 12 Hz

Frequency –Measurement Up to 50 MHz 0.042 Hz KQT-33K3-4-3028-1

Equipment3 (0.05 to 1) GHz 0.42 Hz KLC source procedure,
(1 to 26.5) GHz 5 Hz manufacturer’s manual:
Agilent 33250A, Agilent
8340B

Stopwatch & Timer Up to 10 800 s 0.04 s KQT-ST&T -01

universal frequency
counter

Rotational Speed
(Contact)

Tachometers (CW) Up to 5000 rpm 1.5 rpm KQT-17-20MA-03,

Ideal 1790,

Rotational Speed Up to 5000 rpm 1.5 rpm KQT-17-20MA-03,

(Non-Contact) (5000 to 30 000) rpm 0.06 %
Tachometers Ideal 1790,
Led + Fluke 5500A

Rotational Speed (10 to 30 000) rpm 0.06 % + 1.4 rpm KQT-CF-01

RPM Measurement Extech 461995

Vibration Meter3 –

Acceleration 10 m/s2 0.37 m/s2 KQT-33K1-4-19-1,

Velocity 10 mm/s 0.48 mm/s vibration calibrator
Displacement 10 µm 0.64 µm
Frequency 159.2 Hz 1.8 Hz

(A2LA Cert. No. 4184.01) 05/30/2023 Page 22 of 55

 SATELLITE LABORATORY

KIM LONG CALIBRATION AND TECHNOLOGIES CO. LTD.

SH-37 CentaCity Project at Industry Zone,
VSIP Bac Ninh, Phu Chan Ward, Tu Son City, Bac Ninh, VIETNAM
Tran Minh Cuong (Kevin) Phone: 84 8 6281 8479

CALIBRATION

I. Acoustical

Parameter/Equipment Range CMC2 (±) Comments

Sound Level Meter – (94 and 114) dB 0.59 dB KQT-33K3-4-2911-1,

(@ 1 kHz)3 BK Cal 73

II. Chemical

Parameter/Equipment Range CMC2 (±) Comments

Conductivity Meter3 1.3 µS/cm 0.018 µS/cm KQT-CD-01

5 µS/cm 0.10 µS/cm manufacturer’s manual,
84 µS/cm 0.38 µS/cm standard solution
1413 µS/cm 7.4 µS/cm
12.88 mS/cm 0.041 mS/cm

pH Meter3 4.01 pH 0.025 pH KQT-17-20SC-42

7.00 pH 0.025 pH manufacturer’s manual,
10.00 pH 0.025 pH standard solution

Refractometer3 (5 to 85) % Brix 0.28 % Brix KQT-RE-01,

Up to 10 % Salinity 0.25 % Salinity manufacturer’s manual,
Hanna HI96801

(A2LA Cert. No. 4184.01) 05/30/2023 Page 23 of 55

 Parameter/Equipment Range CMC2, 5 (±) Comments

Turbidity Meter3 (0 to 800) NTU 2.4 % + 0.02 NTU KQT-TU-01, manufacturer’s

manual, Hanna HI98703

TDS Meter3 50 mg/L 0.44 mg/L KQT-TDS-01

500 mg/L 2.0 mg/L reference conductivity
1000 mg/L 4.3 mg/L standard solution

Dissolved Oxygen (0.0 to 50.0) mg/L 0.13 mg/L KQT-DO-01, manufacturer’s

Meter manual, standard solution
Hanna HI9147

Hydrometer (0.600 to 2.000) g/cm3 0.002 g/cm3 KQT-HY-01, manufacturer’s

manual, standard hydrometers

Alcoholmeter Up to 100 % V 0.4 % V KQT-AL-01

manufacturer’ manual
standard alcoholmeter

Gas Detectors

H2S 0.0025 % 7.0 % KQT-17-20SY-06,

CO 0.0050 % 2.8 % manufacturer’s manual,
CH4 50 % LEL 3.0 % standard gas
C4H8 0.001 % 2.3 %
C4H8 0.01 % 2.3 %
O2 12 % 2.5 %
O2 20.9 % 2.4 %
CO2 2% 2.3 %
CO2 0.2 % 2.3 %
NH3 0.0025 % 5.8 %
NO2 0.0005 % 12 %
C2H4O 0.001 % 12 %
SO2 0.001 % 12 %
NO 0.04 % 2.0 %
SO2 0.05 % 2.1 %
CO 0.03 % 2.1 %
NO2 0.01 % 5.0 %

Viscosity Meter (100 to 200 000) cP 0.5 % KQT-17-20MV-01

standard solution

(A2LA Cert. No. 4184.01) 05/30/2023 Page 24 of 55

III. Dimensional

Parameter/Equipment Range CMC2 (±) Comments

Angle Meter/Clinometer Up to 90° 43" KQT-33K6-4-157-1,

angle block set

Calipers3 Up to 500 mm 0.0014 mm/m + 8.8 µm KQT-33K6-4-552-1,

(> 500 to 2000) mm 0.056 mm/m + 6.7 µm gauge block grade 0 +1,
caliper checker

Coordinate Measuring
Machines (CMM)3 –

3-Axis Linearity Only X: (10 to 900) mm 8 µm/m Manufacturer’s manual,

Y: (10 to 900) mm 8 µm/m gauge block grade 0 + 1
Z: (10 to 500) mm 8 µm/m

Depth Gages3 Up to 1000 mm 0.017 mm/m + 0.007 KQT-33K6-4-17-1,

mm gauge block grade 0 +1

Dial Indicator3/Dial Test (0.1 to 1) mm 6.8 mm/m + 0.42 µm KQT-IN-01,

Indicator3 (1 to 100) mm 0.12 mm/m + 0.58 µm gauge block grade 0 +1,
Mitutoyo UDT-3

Dial Bore Gages3 (1 to 100) mm 0.0043 mm/m + 0.63 µm KQT-IN-01,

(> 100 to 500) mm 0.0078 mm/m + 0.33 µm gauge block grade 0 +1
(> 500 to 800) mm 0.0073 mm/m + 0.53 µm

Height Gages3 (1 to 100) mm 0.0036 mm/m + 0.17 µm KQT-33K6-4-1626-1,

(> 100 to 500) mm 0.0054 mm/m - 0.12 µm gauge block grade 0 +1
(> 500 to 1000) mm 0.076 mm/m – 1.1 µm

Micrometers3 Up to 25 mm 0.27 µm KQT-33K6-4-15-1,

(> 25 to 100) mm 0.044 mm/m + 0.7 µm gauge block grade 0 +1
(> 100 to 500) mm 0.008 mm/m + 0.3 µm
(> 500 to 1000) mm 0.013 mm/m – 2.4 µm

(A2LA Cert. No. 4184.01) 05/30/2023 Page 25 of 55

 Parameter/Equipment Range CMC2, 7 (±) Comments

Microscope, Measuring3 (0.01 to 1) mm 0.091 mm/m + 0.6 µm KQT-33K6-4-1268-1,

Profile Projector/Optical (> 1 to 500) mm 0.0041 mm/m + 2.4 µm manufacturer’s manual,
Comparator3 KLC source procedure,
standard glass scale

Pin/Plug Gages3 Up to 100 mm 0.0027 mm/m + 0.19 um KQT-33K6-4-121-1,

Pratt & Whitney B

Surface Plate Flatness – [(12 x 12) to (48 x 50 µin KQT-17-20MD-14,

Repeatability Only3, 4 96)] in repeat-o-zero

Thickness Gages/Feeler Up to 1 mm 0.7 µm KQT-TH-01,

Gages and Thickness (> 1 to 50) mm 0.0037 mm/m + 0.61 µm gauge block grade 0 +1,
Films3 (> 50 to 500) mm 0.081 mm/m + 0.18 µm Mitutoyo MDH-25M

Holtest (6 to 75) mm 0.0014 mm/m + 1.9 µm KQT-HT-01

setting ring

Distance & Length Up to 50 m 0.003 m KQT-D&L-01

Measuring Instruments laser distance meter

Radius Gauge 0.1 mm to 50 mm 0.02 mm/m + 3.6 µm KQT-RAG-01

video measuring system
VMS-3020G

Sieve (0.15 to 5) mm 0.08 mm/m + 3.6 µm KQT-SI-01

digimatic caliper, video
measuring system
VMS-3020G

Metal Detector3 –
Ferrous (0.5 to 2.5) mm 0.0009 mm KQT-ME-01,
Brass (0.5to 2.5) mm 0.0009 mm manufacturer’s manual,
Sus (0.5 to 3.5) mm 0.0009 mm precision balls

(A2LA Cert. No. 4184.01) 05/30/2023 Page 26 of 55

IV. Electrical – DC/Low Frequency

Parameter/Range Frequency CMC2, 6 (±) Comments

AC Current – Generate3

Up to 2.2 mA (20 to 40) Hz 0.2 mA/A + 0.035 µA KQT-17-20AQ-101,

40 Hz to 1 kHz 0.2 mA/A + 0.035 µA KLC source
(1 to 5) kHz 0.2 mA/A + 0.11 µA procedure
(5 to 10) kHz 1.5 mA/A + 0.65 µA manufacturer’s
manual,
(2.2 to 22) mA (20 to 40) Hz 0.2 mA/A + 0.35 µA Fluke 5720A
40 Hz to 1 kHz 0.2 mA/A + 0.35 µA
(1 to 5) kHz 0.2 mA/A + 0.55 µA
(5 to 10) kHz 1.4 mA/A + 5 µA

(22 to 220) mA (20 to 40) Hz 0.2 mA/A + 3.5 µA

40 Hz to 1 kHz 0.2 mA/A + 2.5 µA
(1 to 5) kHz 0.2 mA/A + 3.5 µA
(5 to 10) kHz 1.3 mA/A + 10 µA

220 mA to 2.2 A (1 to 5) kHz 0.5 mA/A + 80 µA

(5 to 10) kHz 8.5 mA/A + 160 µA

(1.5 to 11) A (45 to 65) Hz 0.8 mA/A + 2 mA Fluke 5500A

(65 to 500) Hz 1.2 mA/A + 2 mA
(0.5 to 1) kHz 3.8 mA/A + 2 mA

(11 to 500) A 45 Hz to 1 kHz 0.6 mA/A + 100 mA Fluke 5500A w/

5500/coil

(A2LA Cert. No. 4184.01) 05/30/2023 Page 27 of 55

 Parameter/Range Frequency CMC2, 6 (±) Comments

AC Current – Measure3

(5 to 100) μA (10 to 20) Hz 4.6 mA/A + 0.03 µA KQT-17-20AH-06,

(20 to 45) Hz 1.8 mA/A + 0.03 µA KLC source
(45 to 100) Hz 0.9 mA/A + 0.03 µA procedure,
100 Hz to 5 kHz 0.9 mA/A + 0.03 µA manufacturer’s
manual, HP 3458A
100 μA to 10 mA (10 to 20) Hz 4.6 mA/A + 2 µA
(20 to 45) Hz 1.8 mA/A + 2 µA
(45 to 100) Hz 0.9 mA/A + 2 µA
100 Hz to 5 kHz 0.64 mA/A + 0.2 µA

(10 to 100) mA (10 to 20) Hz 4.6 mA/A + 20 µA

(20 to 45) Hz 1.7 mA/A + 20 µA
(45 to 100) Hz 0.9 mA/A + 20 µA
100 Hz to 5 kHz 0.6 mA/A + 20 µA

100 mA to 1 A (10 to 20) Hz 4.7 mA/A + 0.2 mA

(20 to 45) Hz 1.9 mA/A + 0.2 mA
(45 to 100) Hz 1.1 mA/A + 0.2 mA
100 Hz to 5 kHz 1.3 mA/A + 0.2 mA

Up to 500 A (50 to 1000) Hz 3.1 mA/A HP 3458A and high

voltage divider

AC Voltage – Generate3

(Up to 220) mV 40 Hz to 20 kHz 0.11 mV/V + 7 µV KQT-17-20AQ-101,

(20 to 50) kHz 0.26 mV/V + 7 µV KLC source
(50 to 100) kHz 0.59 mV/V + 17 µV procedure,
(100 to 300) kHz 1.1 mV/V + 20 µV manufacturer’s
300 kHz to 1 MHz 3.4 mV/V + 45 µV manual, Fluke
5720A and 5500A
220 mV to 2.2 V 40 Hz to 20 kHz 0.06 mV/V + 8 µV
(20 to 50) kHz 0.10 mV/V + 10 µV
(50 to 100) kHz 0.14 mV/V + 30 µV
(100 to 300) kHz 0.52 mV/V + 80 µV
300 kHz to 1 MHz 2.1 mV/V + 0.3 mV

(2.2 to 22) V 40 Hz to 20 kHz 0.06 mV/V + 0.05 mV

(20 to 50) kHz 0.10 mV/V + 0.1 mV
(50 to 100) kHz 0.13 mV/V + 0.2 mV
(100 to 300) kHz 0.35 mV/V + 0.6 mV
300 kHz to 1 MHz 1.9 mV/V + 3.2 mV

(22 to 220) V 40 Hz to 20 kHz 0.07 mV/V + 0.6 mV

(A2LA Cert. No. 4184.01) 05/30/2023 Page 28 of 55

 Parameter/Range Frequency CMC2, 6 (±) Comments

AC Voltage – Generate3
(cont)

(22 to 220) V (20 to 50) kHz 0.10 mV/V + 1 mV KQT-17-20AQ-101,

(50 to 100) kHz 0.14 mV/V + 2.5 mV KLC source procedure,
220 V to 1.1 kV manufacturer’s manual,
50 Hz to 1 kHz 0.09 mV/V + 3.5 mV Fluke 5720A and
5500A

AC Voltage – Measure3

(0 to 10) mV 1 kHz to 20 kHz 0.4 mV/V + 1.1 µV KQT-17-20AH-06,

KLC source procedure,
(10 to 100) mV 40 Hz to 1 kHz 0.2 mV/V + 2 μV manufacturer’s manual

100 mV to 1 V 40 Hz to 1 kHz 0.2 mV/V + 20 μV

(1 to 10) V (1 to 40) Hz 0.8 mV/V + 0.4 mV HP 3458A

40 Hz to 1 kHz 0.1 mV/V + 0.2 mV
(1 to 20) kHz 0.2 mV/V + 0.2 mV
(50 to 100) kHz 1.0 mV/V + 0.2 mV

(10 to 100) V 10 Hz to 20 kHz 0.2 mV/V + 2 mV

100 V to 1 kV 40 Hz to 1 kHz 0.7 mV/V + 20 mV

Capacitance – Generate3 (0.5 to 1.1) nF 1.4 mF/F + 10 pF KQT-17-20AQ-101,

(@ 1 kHz) (1.1 to 3.3) nF 1.2 mF/F + 10 pF KLC source procedure,
(3.3 to 11) nF 1.9 mF/F + 10 pF manufacturer’s manual,
(11 to 33) nF 3.1 mF/F + 100 pF Fluke 5500A
(33 to 110) nF 3.3 mF/F + 100 pF
(110 to 330) nF 3.3 mF/F + 300 pF
330 nF to 1.1 µF 3.8 mF/F + 1 nF
(1.1 to 3.3) µF 4.2 mF/F + 3 nF
(3.3 to 11) µF 4.5 mF/F + 10 nF
(11 to 33) µF 4.8 mF/F + 30 nF
(33 to 110) µF 6.4 mF/F + 0.1 µF
(110 to 330) µF 8.2 mF/F + 0.3 µF

(A2LA Cert. No. 4184.01) 05/30/2023 Page 29 of 55

 Parameter/Equipment Range CMC2, 5, 6 (±) Comments

DC Current – Generate3 (0 to 220) μA 110 μA/A + 6 nA KQT-17-20AQ-101,

220 μA to 22 mA 52 μA/A + 40 nA KLC source procedure,
(22 to 220) mA 69 μA/A + 0.7 µA manufacturer’s manual, Fluke
220 mA to 2.2 A 113 μA/A + 12 µA 5720A

(2.2 to 11) A 710 μA/A + 330 µA Fluke 5500A

(11 to 500) A 0.7 mA/A + 17 mA Fluke 5500A w/ 550/coil

DC Current – Measure3 (0 to 100) μA 25 µA/A + 0.8 nA KQT-17-20AH-06,

100 μA to 1 mA 25 µA/A + 5 nA KLC source procedure,
(1 to 10) mA 25 µA/A + 5 nA manufacturer’s manual
(10 to 100) mA 45 µA/A + 0.5 µA HP 3458A,
(0.1 to 1) A 117 µA/A + 10 µA Fluke 8845A

(1 to 10) A 0.58 mA/A + 0.5 mA HP 3458A and shunt Kyoritsu

(10 to 2000) A 6 mA/A + 10 mA 2009R

DC Voltage – Generate3 (0 to 220) mV 14 µV/V + 0.7 µV KQT-17-20AQ-101,

220 mV to 2.2 V 8.1 µV/V + 1.4 µV KLC source procedure,
(2.2 to 11) V 5.6 µV/V + 5 µV manufacturer’s manual, Fluke
(11 to 22) V 5.6 µV/V + 9 µV 5720A + 5500A
(22 to 220) V 8.1 µV/V + 90 µV
(220 to 1100) V 11 µV/V + 0.7 mV

DC Voltage – Measure3 (0 to 100) mV 12 µV/V + 0.35 µV KQT-17-20AH-06,

100 mV to 1V 9.3 µV/V + 0.4 µV KLC source procedure,
(1 to 10) V 9.3 µV/V + 1 µV manufacturer’s manual,
(10 to 100) V 12 µV/V + 40 µV Fluke 8845A,
(100 to 1000) V 12 µV/V + 0.15 mV HP 3458A

(0.5 to 10) kV 1.7 % 149-10A HV DMM

Power Analyzer/Meter3 Up to 5 kW 0.13 % KQT-33K1-4-1683-1,

KLC source procedure,
manufacturer’s manual, Fluke
5500A

Resistance – Generate3 (0.13 to 1) Ω 0.64 mΩ/Ω + 2 mΩ KQT-17-20AQ-101,

(1 to 100) Ω 0.12 mΩ/Ω + 2 mΩ KLC source procedure,
(0.13 to 10) kΩ 0.12 mΩ/Ω + 2 mΩ manufacturer’s manual,
10 kΩ to 1 MΩ 0.19 mΩ/Ω + 2 mΩ standard resistance HARS-X-9-
(1 to 100) MΩ 1.2 mΩ/Ω 0.001

(A2LA Cert. No. 4184.01) 05/30/2023 Page 30 of 55

 Parameter/Equipment Range CMC2, 5, 6 (±) Comments

Resistance – Measure3 Up to 10 Ω 0.03 mΩ/Ω + 0.05 mΩ KQT-17-20AH-06,

(10 to 100) Ω 0.03 mΩ/Ω + 0.5 mΩ KLC source procedure,
100 Ω to 1 kΩ 0.015 mΩ/Ω + 0.5 mΩ manufacturer’s manual,
(1 to 10) kΩ 0.023 mΩ/Ω + 5 mΩ HP 3458A
(10 to 100) kΩ 5.5 mΩ/Ω + 50 mΩ
(0.1 to 1) MΩ 0.1 mΩ/Ω + 2 Ω
(1 to 10) MΩ 0.2 mΩ/Ω + 100 Ω

Oscilloscopes3 –
DC Gain (Into 1 (1.8 to 200) mV 3.1 mV/V + 0.1 mV KQT-CG-7,
MΩ) 200 mV to 33 V 2.9 mV/V + 0.1 mV KLC source procedure,
manufacturer’s manual,
DC Gain (Into 50 Ω) (1.8 to 200) mV 3.1 mV/V + 0.1 mV Fluke 5500A-SC300
200 mV to 2 V 4.1 mV/V + 0.1 mV
Leveled Sine Wave 50 kHz to 10 MHz 0.006 mHz/Hz
(Into 50 Ω) (10 to 300) MHz 0.17 mHz/Hz
Time Base Sweep 5 s to 100 µs 2 m/s
Rate – (Into 50 Ω) (50 to 2) µs 17 ms/s
1 µs to 20 ns 0.04 m/s
10 ns to 2 ns 0.03 ms/s

Electrical Calibration of (-200 to ˂ 0) ºC 0.5 % KQT-33K5-4-42-1

Thermocouple Type K (˃ 0 to 1200) ºC 0.1 % Fluke 5500A
with Indicators

Magnetic Flux – Gauss 3 mT 0.49 % KQT-33K1-4-1658-1

Meters3 50 mT 0.46 % manufacturer’s manual
300 mT 0.71 % Magnetic tool

Hipot/Withstanding (0.5 to 10) kV(AC) 13 mV/V + 5 V KQT-33K1-4-181-1,

Testers3 (0.5 to 10) kV(DC) 7.6 mV/V + 3 V KLC source procedure,
(10 to 20) kV (AC/DC) 3.5 % manufacturer’s manual,
(0.5 to 100) mA 1.4 % Kikusui 149-10A and
TOS 1200 and
Tektronix P6015A

(A2LA Cert. No. 4184.01) 05/30/2023 Page 31 of 55

 Parameter/Equipment Range CMC2, 5, 6 (±) Comments

Insulation Testers3 (0 to 100) MΩ 0.2 % KQT-33K2-4-33-1,

(0.1 to 10) GΩ 1.6 % KLC source procedure,
manufacturer’s manual,
HRRS decade resistance

LCR Meters3 (˃ 0 to 50) MΩ 0.23 % KQT-33K1-4-1260-1,

Resistance KLC source procedure,
manufacturer’s manual,
Inductance 1 μH to 999 mH 2.3 % + 0.5 µH LCR standard

Capacitance (Fixed 1 pF 0.19 %

Points) 10 pF 0.12 %
100 pF 0.12 %
1000 pF 0.12 %

V. Electrical – RF/Microwave

Parameter/Range Frequency CMC2, 6 (±) Comments

RF Power – Measure
& Measuring
Instruments3

(-70 to 20) dBm 100 kHz to 18 GHz 0.54 dBm KQT-33K4-4-715-1,

KQT-33K4-4-105-1
(-30 to 20) dBm 50 MHz to 26.5 GHz 0.39 dBm KLC source procedure,
manufacturer’s manual,
HP 8340B monitored w/
Agilent N1911A w/
E4412A/8340B

(A2LA Cert. No. 4184.01) 05/30/2023 Page 32 of 55

VI. Fluid Quantities

Parameter/Equipment Range CMC2, 5, 7 (±) Comments

Air Speed/Velocity – Up to 30 m/s 0.21 m/s KQT-33K6-4 1769-1,

Measuring Equipment velocity standard

Air/Mass Flow Meters3 (0.1 to 1) lpm 0.03 % lpm KQT-33K6-4-1769-1A,

(> 1 to 30) lpm 1.7 % lpm mini-AP Buck Flow
(> 30 to 2500) lpm 2.3 % lpm Calibrator M30B
flow rate standard meter
magnetic flowmeter

Flow Meter for Liquid Up to 1000 lpm (0.0028V) lpm + KQT-33K6-4-1769-1B,

0.33 lpm flow rate rig, magnetic
flowmeter

Burets (100 to 1000) µL 1.1 mL/L KQT-VO-01, standard

(1 to 10) mL 0.2 mL/L weight E2 and balance
(10 to 500) mL 0.1 mL/L

Pipettes (10 to 100) µL 5.2 mL/L KQT-VO-01,

(100 to 1000) µL 1.1 mL/L standard weight E2 and
(1 to 10) mL 0.2 mL/L standard scale
(10 to 500) mL 0.1 mL/L

Volumetric Flasks (0 to 1000) mL 0.17 mL/L KQT-VO-01,

(1000 to 5000) mL 0.14 mL/L standard weight E2 and
standard scale

(A2LA Cert. No. 4184.01) 05/30/2023 Page 33 of 55

VII. Mechanical

Parameter/Equipment Range CMC2, 5 (±) Comments

Durometer – Spring
Force

Type A – B – O Up to 4.5 kg 0.5 % KQT-33K6-4-1362-1,

ASTM D2240 partial
Type C – D – DO Up to 4.5 kg 0.1 % calibration,
standard weight E2 and
standard scale

Balances & Scales3

Class I and II (1 to 500) mg 0.042 mg/g + 9.8 µg KQT-BA-01,

(0.5 g to 100) g 0.0016 mg/g + 35 µg OIML R76-1
(100 to 500) g 0.002 mg/g – 23 µg standard weights
(500 to 10000) g 0.0097 mg/g – 7.7 mg
(10 000 to 20 000) g 0.006 mg/g + 28 mg
(20 000 to 30 000) g 0.045 mg/g – 0.75 g

Class II, III, and IV (1 to 30) kg 0.0079 mg/g - 7 mg

(30 to 60) kg 0.24 g/kg – 7 g
(60 to 200) kg 0.039 g/kg + 5.1 g
(200 to 500) kg 0.093 g/kg – 5.7 g
(500 to 2000) kg 0.21 g/kg – 62 g

Force Tester3 Up to 50 kgf 0.02 % KQT-17-20MF-04,

(50 to 500) kgf 0.1 % DLVN 109
(500 to 5000) kgf 0.46 % KLC source procedure,
(5000 to 10 000) kgf 0.4 % standard weight E2
and load cell

(A2LA Cert. No. 4184.01) 05/30/2023 Page 34 of 55

 Parameter/Equipment Range CMC2, 5 (±) Comments

Hardness Testers3 –

Indirect Verification HRBW:

of Rockwell Medium 0.93 HRBW DLVN 63,
Hardness Testers High 0.92 HRBW manufacturer’s
manual
HRC:
Low 0.5 HRC
Medium 0.5 HRC
High 0.5 HRC

Hardness Testers3 –

Indirect Verification 300 HV 1.9 HV DLVN 63,

of Vickers Hardness 501 HV 9.1 HV manufacturer’s
Testers 703 HV 13 HV manual

Mass/Weights

Class F1, F2, M1, (1 to 500) g 0.002 mg/g + 0.098 mg KQT-SW-01,

M2 and M3 OIML R111-1,
standard weight E2 +
Class F2, M1, M2 (0.10 g to 1) g 0.089 mg/g +11 µg standard scale
and M3 (500 to 5000) g 0.0069 mg/g - 2.3 mg

Class M1, M2, and (5 to 20) kg 0.0097 mg/g – 17 mg

M3

Particle Counter3/Dust (0.3 to 10) µm 4.5 % KQT-LCP-2800,

Monitor particle counter
(0.001 to 10.000) mg/m3 6.8 % digital dust monitor

Pressure3 –

Gauges/Pressure (-12 to 300) psi 0.06 % DLVN 76

Switch/Safety Valve Up to 10 000 psi 0.025 % KQT-17-20MP-06,
KLC source
Pressure Transmitter (4 to 20) mA 0.7 % procedure,
Barometer/ Up to 1100 hPa 0.06 % Fluke 718 Seri and
Manometer module and Fluke 1G

(A2LA Cert. No. 4184.01) 05/30/2023 Page 35 of 55

 Parameter/Equipment Range CMC2, 5 (±) Comments

Surface Roughness & 2.97 µm 0.9 µm KQT-33K6-4-2021-1,

Surface Roughness 18.9 µin 5 µin manufacturer’s manual,
Testers3 119.5 µin 5 µin Mitutoyo 178-602 and
federal reference
standard

Crockmeter – (0 to 50) N 0.05 N KQT-CM-01

Force on the Finger (0 to 200) mm 0.04 mm digimatic caliper,
Rubbing Distance Test force gauge
Circular Friction Head

Torque Drivers & (0.001 to 10) N·m 0.5 % KQT-33K6-4-2930-1,

Wrenches3 (10 to 300) N·m 0.8 % KLC source procedure,
(300 to 2000) N·m 1.3 % mount LTT-2100,
insize IST-2200 N·m

Torque Analyzers Up to 500 N·m 0.13 % KQT-TA-01

DLVN 110KLC source
procedure
torque wheel with
E2+M1+F1 weights

VIII. Optical Quantities

Parameter/Equipment Range CMC2, 5, 7 (±) Comments

Light Meters (20 to 100) lux 3.0 % + 0.1 lux KQT-33K4-4-475-1,

Illumination3 – Measure (100 to 1000) lux 3.0 % + 1 lux Konica CL-70F
& Measuring Equipment (1000 to 20 000) lux 3.0 % + 10 lux

Luminance (100 to 1000) cd/m2 4.3 % + 0.005 cd/m2 TES-137

Color Temperature 2856 K 4.1 % + 1 K Konica CL-70F

Fixed Point

(A2LA Cert. No. 4184.01) 05/30/2023 Page 36 of 55

 Parameter/Equipment Range CMC2 (±) Comments

Colorimeter &
Spectrophotometry –
Diffuse Reflectance
Color data: CIELAB

L* Illuminants C 2° Observer 64.80, 0.05 Chroma meter MFR

94.41, 72.64 and 72.27 manual
KQT-CH-01
10° Observer 66.15, 0.05 certified calibration
94.42, 71.94 and 71.17 plates

L* Illuminants D65 2° Observer 65.04, 0.05

94.42, 72.86 and 72.11

10° Observer 66.44, 0.05

94.41, 72.19 and 71.08

a* Illuminants C 2° Observer -29.16, - 0.05

0.16, -24.29 and 18.27

10° Observer -27.26, - 0.05

0.26, -19.97 and 20.17

a* Illuminants D65 2° Observer -29.51, - 0.05

0.31, -24.45 and 19.88

10° Observer -27.72, - 0.05

0.62, -20.16 and 21.40

b* Illuminants C 2° Observer 8.84, 2.35, 0.05

25.55 and 32.47

10° Observer 9.64, 0.05

2.31, 25.37 and 30.83

b* Illuminants D65 2° Observer 8.92, 2.22, 0.05

25.63 and 32.14

10° Observer 9.92, 0.05

2.26, 25.59 and 30.63

X Illuminants C 2° Observer 0.2772, 0.016

0.3152, 0.3237 and
0.4174

10° Observer 0.2832, 0.016

0.3155, 0.3312 and
0.4182

(A2LA Cert. No. 4184.01) 05/30/2023 Page 37 of 55

 Parameter/Equipment Range CMC2, 7 (±) Comments

Colorimeter &
Spectrophotometry –
Diffuse Reflectance
Color data: CIELAB
(cont)

X Illuminants D65 2° Observer 0.2781, 0.016 Chroma meter MFR

0.3178, 0.3238 and manual, KQT-CH-01,
0.4194 certified calibration
plates
10° Observer 0.2849, 0.016
0.3180, 0.3324 and
0.4208

Y Illuminants C 2° Observer 0.3652, 0.016

0.3219, 0.4019 and
0.3698

10° Observer 0.3692, 0.016

0.3221, 0.4004 and
0.3647

Y Illuminants D65 2° Observer 0.3813, 0.016

0.3346, 0.4152 and
0.3786

10° Observer 0.3833, 0.016

0.3348, 0.4128 and
0.3758

UV/Vis Spectrometer Up to 0.3 Abs 0.0031 Abs KQT-SP-01,

Light Absorbed – (0.3 to 0.5) Abs 0.0032 Abs DLVN 91:2001,
Measure at Wavelength (0.5 to 2) Abs 0.0047 Abs ASTM E - 925
(254 to 875) mm (254 to 875) mm 0.32 nm type 666-S000/F7
certified reference
standard

XRF - Measure Coating

Thickness

Ni, Nickel 9.6 µm 0.6 µm Manufacturer’s manual

Cu, Copper 9.2 µm 0.6 µm KQT-XRF-01
Au, Gold 0.26 µm 0.06 µm Calmetrics foil standards

(A2LA Cert. No. 4184.01) 05/30/2023 Page 38 of 55

 Parameter/Equipment Range CMC2, 5, 7 (±) Comments

XRF – Measure Coating

Thickness

Ni, Nickel 9.6 µm 0.6 µm Manufacturer’s manual

Cu, Copper 9.2 µm 0.6 µm KQT-XRF-01
Au, Gold 0.26 µm 0.06 µm Calmetrics foil standards

Specular Gloss3 – Gloss

Meters

High Gloss 7.6 GU @ 20° 0.6 GU KQT-GL-01,

Semi Gloss 37.4 GU @ 60° 1.1 GU standard gloss surface
Low Gloss 77.6 GU @ 85° 1.3 GU sample
96.8 GU @ 60° 1.1 GU manufacturer’s manual

IX. Thermodynamics

Parameter/Equipment Range CMC2, 5, 7 (±) Comments

Relative Humidity – KQT-33K5-4-84-1

Measuring Relative
Humidity Meters (20 to 90) % RH 2.8 % RH Vaisala HMP75 with
JIEO tech TH-ME 65

Temperature – Measuring (-40 to 150) ºC 0.5 ºC Testo 735-1 with

Meters JIEO tech TH-KE 065
media chamber

Temperature – Measuring (-80 to -40) ºC 0.4 % + 0.05 ºC KQT-CG-13,

Equipment3 (-40 to 0) ºC 1.2 % + 0.05 ºC manufacturer’s manual,
(0 to 300) ºC 0.08 % + 0.05 ºC Testo 735-1
(300 to 1000) ºC 0.4 % + 0.05 ºC
Fluke 725 with TC
(1000 to 1600) ºC 0.3 % + 0.05 ºC sensors

(A2LA Cert. No. 4184.01) 05/30/2023 Page 39 of 55

 Parameter/Equipment Range CMC2, 5, 7 (±) Comments

Temperature – (-40 to 0) ºC 0.22 ºC KQT-33K5-4-42-1,

Measuring Equipment, (0 to 150) ºC 0.21 ºC DLVN 137 and 138: 2004,
Probe Thermometers3 (150 to 300) ºC 0.34 ºC KLC source procedure,
(300 to 650) ºC 1.0 ºC Testo 735-1 Pt 100,
HS 5609 PRT with LK
LAB and Fluke dry/oil
bath

Infrared Temperature – (-18 to 150) ºC 1.3 ºC KQT-33K4-4-615-1,

Measuring Instruments3 (150 to 400) ºC 2.4 °C DLVN 124:2003,
(400 to 982) ºC 7 °C Omega BB701 + BB-4A

Chamber/Dry Oven,3 –
Humidity (˃ 0 to 40) % RH 1.3 % RH KQT-CHDO-2015
(40 to 97) % RH 1.6 % RH ASTM D 5374 -1999
Vaisala MI 70 and
Temperature (-80 to -50) °C 0.4 °C Dickson DSB
(-50 to 200) °C 0.6 °C Keysight 34970A data
(200 to 400) °C 1.2 °C acquisition with data
loggers

Washing Machine, (30 to 70) ºC 0.15 ºC KQT-WM-01

Tumble Dry (50 to 2000) rpm 1.7 rpm Testo 735, stopwatch,
Up to 10 800 s 2.2 s Tachometer RPM10
Up to 100 L 0.7 L flow meter

Moisture Content – KQT-WO-01

Measure
Moisture Meter (10 to 20) % 1% Orion 910
Moisture Grain Meter (3 to 10) % 0.5 % Ohaus MB25

Steam Sterilizer & (-40 to 140) °C 0.2 °C KQT-AC-01,

Autoclave, Low Pressure (0 to 5) bar 0.06 bar autoclave temperature and
Ovens pressure data logger

Liquid Bath3 (-50 to 200) °C 0.6 °C KQT-CHDO-2015

(200 to 400) °C 1.2 °C ASTM D 5374 -1999
Dickson DSB
Keysight 34970A data
acquisition with data
loggers

(A2LA Cert. No. 4184.01) 05/30/2023 Page 40 of 55

X. Time & Frequency

Parameter/Equipment Range CMC2, 5, 7 (±) Comments

Frequency – Measure Up to 1MHz 0.23 Hz KQT-33K3-4-3340-1

Instruments3 (1 to 100) MHz 1.0 Hz KLC source procedure,
(100 to 500) MHz 0.3 Hz manufacturer’s manual:
(0.5 to 1) GHz 1 Hz Agilent 53132A
(1 to 3) GHz 3 Hz
(3 to 5) GHz 5 Hz
(5 to 8) GHz 8 Hz
(8 to 12.4) GHz 12 Hz

Frequency –Generate Up to 50 MHz 0.042 Hz KQT-33K3-4-3028-1

Instruments3 (0.05 to 1) GHz 0.42 Hz KLC source procedure,
(1 to 26.5) GHz 5 Hz manufacturer’s manual:
Agilent 33250A, Agilent
8340B

Stopwatch & Timer Up to 10800 s 0.04 s KQT-ST&T -01

universal frequency
counter

Rotational Speed
(Contact)

Tachometers (CW) Up to 5000 rpm 1.5 rpm KQT-17-20MA-03,

Ideal 1790,

Rotational Speed Up to 5000 rpm 1.5 rpm KQT-17-20MA-03,

(Non-Contact) (5000 to 30 000) rpm 0.06 % Ideal 1790,
Tachometers Led and Fluke 5500A

Rotational Speed
RPM Measurement (10 to 30 000) rpm 0.06 % + 1.4 rpm KQT-CF-01
Extech 461995

Vibration Meter3 –

Acceleration 10 m/s2 0.37 m/s2 KQT-33K1-4-19-1,

Velocity 10 mm/s 0.48 mm/s vibration calibrator
Displacement 10 µm 0.64 µm
Frequency 159.2 Hz 1.8 Hz

(A2LA Cert. No. 4184.01) 05/30/2023 Page 41 of 55

 SATELLITE LABORATORY

KIM LONG CALIBRATION AND TECHNOLOGIES CO. LTD.

#380, Pham Hung Street, Hoa Phuoc – Hoa Vang Ward
Da Nang City VIETNAM
Tran Minh Cuong (Kevin) Phone: 84 86 281 8479

CALIBRATION

I. Acoustical

Parameter/Equipment Range CMC2 (±) Comments

Sound Level Meter –

(@ 1 kHz)3 (94 and 114) dB 0.59 dB KQT-33K3-4-2911-1,
BK Cal 73

II. Chemical

Parameter/Equipment Range CMC2 (±) Comments

Conductivity Meter3 1.3 µS/cm 0.018 µS/cm KQT-CD-01

5 µS/cm 0.10 µS/cm manufacturer’s manual,
84 µS/cm 0.38 µS/cm standard solution
1413 µS/cm 7.4 µS/cm
12.88 mS/cm 0.041 mS/cm

pH Meter3 4.01 pH 0.013 pH KQT-17-20SC-42

7.00 pH 0.013 pH manufacturer’s manual,
10.00 pH 0.013 pH standard solution

Hydrometer (0.600 to 2.000) g/cm3 0.002 g/cm3 KQT-HY-01 manufacturer’s

manual, standard hydrometers

(A2LA Cert. No. 4184.01) 05/30/2023 Page 42 of 55

 Parameter/Equipment Range CMC2, 5 (±) Comments

Refractometer3 (5 to 85) % Brix 0.28 % Brix KQT-RE-01

Up to 10 % Salinity 0.25 % Salinity manufacturer’s manual,
Hanna HI96801

TDS Meter3 50 mg/L 0.44 mg/L KQT-TDS-01

500 mg/L 2.0 mg/L reference conductivity
1000 mg/L 4.3 mg/L standard solution

Dissolved Oxygen Meter (0.0 to 50.0) mg/L 0.13 mg/L KQT-DO-01

manufacturer’s manual
standard solution
Hanna HI9147

Alcoholmeter Up to 100 % V 0.4 % V KQT-AL-01

manufacturer’ manual
standard alcoholmeter

Viscosity Meter (100 to 200 000) cP 0.5 % KQT-17-20MV-01

standard solution

Gas Detectors

H2S 0.0025 % 7.0 % KQT-17-20SY-06,

CO 0.0050 % 2.8 % manufacturer’s manual,
CH4 50 % LEL 3.0 % standard gas
C4H8 0.001 % 2.3 %
C4H8 0.01 % 2.3 %
O2 12 % 2.5 %
O2 20.9 % 2.4 %
CO2 2% 2.3 %
CO2 0.2 % 2.3 %
NH3 0.0025 % 5.8 %
NO2 0.0005 % 12 %
C2H4O 0.001 % 12 %
SO2 0.001 % 12 %
NO 0.04 % 2.0 %
SO2 0.05 % 2.1 %
CO 0.03 % 2.1 %
NO2 0.01 % 5.0 %

(A2LA Cert. No. 4184.01) 05/30/2023 Page 43 of 55

III. Dimensional

Parameter/Equipment Range CMC2 (±) Comments

Angle Meter/Clinometer Up to 90° 43" KQT-33K6-4-157-1,

angle block set

Calipers3 Up to 500 mm 0.005 mm/m + 0.008 mm KQT-33K6-4-552-1,

gauge block grade 0
and 1, caliper checker

Depth Gages3 Up to 500 mm 0.017 mm/m + 0.007 mm KQT-33K6-4-17-1,

gauge block grade 0
and 1

Dial Indicator3/ Dial Test Up to 200 mm 0.01 mm/m + 1.7 µm KQT-IN-01,

Indicator3 (0.1 to 1) mm 6.8 mm/m + 0.42 µm gauge block grade 0
(1 to 100) mm 0.12 mm/m + 0.58 µm and 1, Mitutoyo
UDT-3

Distance and Length Up to 50 m 0.003 m KQT-D&L-01

Measuring Instruments laser distance meter

Holtest Up to 150 mm 0.011 mm/m + 0.6 µm KQT-HT-01

setting ring

Height Gages3 (1 to 100) mm 0.0036 mm/m + 0.17 µm KQT-33K6-4-1626-

(> 100 to 500) mm 0.0054 mm/m – 0.12 µm 1, gauge block grade
(> 500 to 1000) mm 0.076 mm/m – 1.1 µm 0 +1

Micrometers3 Up to 25 mm 0.27 µm KQT-33K6-4-15-1,

(> 25 to 100) mm 0.044 mm/m + 0.7 µm gauge block grade 0
(> 100 to 500) mm 0.008 mm/m + 0.3 µm +1
(> 500 to 1000) mm 0.013 mm/m – 2.4 µm

Surface Plate Flatness – [(12 x 12) to (48 x 50 µin KQT-17-20MD-14,

Repeatability Only3, 4 96)] in repeat-o-zero

(A2LA Cert. No. 4184.01) 05/30/2023 Page 44 of 55

 Parameter/Equipment Range CMC2 (±) Comments

Thickness Gages/Feeler Up to 1 mm 0.7 µm KQT-TH-01,

Gages & Thickness (> 1 to 50) mm 0.0037 mm/m + 0.61 µm gauge block grade 0
Films3 (> 50 to 500) mm 0.081 mm/m + 0.18 µm +1, Mitutoyo MDH-
25M

Microscope, Measuring3 (0.01 to 1) mm 0.091 mm/m + 0.6 µm KQT-33K6-4-1268-

Profile Projector/Optical (>1 to 500) mm 0.0041 mm/m + 2.4 µm 1, manufacturer’s
Comparator3 manual, KLC source
procedure, standard
glass scale

Metal Detector3 –

Ferrous (0.5 to 2.5) mm 0.0009 mm KQT-ME-01,

Brass (0.5to 2.5) mm 0.0009 mm manufacturer’s
Sus (0.5 to 3.5) mm 0.0009 mm manual,
precision balls

IV. Electrical – DC/Low Frequency

Parameter/Equipment Range CMC2, 6 (±) Comments

DC Current – Generate3 (0 to 220) μA 110 μA/A + 6 nA KQT-17-20AQ-101,

220 μA to 22 mA 52 μA/A + 40 nA KLC source
(22 to 220) mA 70 μA/A + 0.7 µA procedure,
220 mA to 1 A 113 μA/A + 12 µA manufacturer’s
manual,
Keithley 2450

DC Current – Measure3 (0 to 100) μA 110 µA/A + 0.8 nA KQT-17-20AH-06,

100 μA to 1 mA 50 µA/A + 5 nA KLC source
(1 to 10) mA 47 µA/A + 50 nA procedure,
(10 to 100) mA 67 µA/A + 0.5 µA manufacturer’s
(0.1 to 3) A 150 µA/A + 10 µA manual
HP 34401A

(3 to 100) A 7.2 mA/A HP 34401A w/ L&N

4361 shunt

(A2LA Cert. No. 4184.01) 05/30/2023 Page 45 of 55

 Parameter/Equipment Range CMC2, 6 (±) Comments

DC Voltage – Generate3 (0 to 220) mV 14 µV/V + 0.7 µV KQT-17-20AQ-101,

220 mV to 2.2 V 8.1 µV/V + 1.4 µV KLC source procedure,
(2.2 to 11) V 5.6 µV/V + 5 µV manufacturer’s manual,
(11 to 22) V 5.6 µV/V + 9 µV Keithley 2450
(22 to 200) V 8.1 µV/V + 90 µV

DC Voltage – Measure3 (0 to 100) mV 12 µV/V + 0.35 µV KQT-17-20AH-06,

100 mV to 1V 9.3 µV/V + 0.4 µV KLC source procedure,
(1 to 10) V 9.3 µV/V + 1 µV manufacturer’s manual
(10 to 100) V 12 µV/V + 40 µV HP 34401A
(100 to 1000) V 12 µV/V + 0.15 mV

Capacitance – Generate3 (0.5 to 1.1) nF 1.4 mF/F + 10 pF KQT-17-20AQ-101,

(@ 1 kHz) (1.1 to 3.3) nF 1.2 mF/F + 10 pF KLC source procedure,
(3.3 to 11) nF 1.9 mF/F + 10 pF manufacturer’s manual,
(11 to 33) nF 3.1 mF/F + 100 pF decade capacitor
(33 to 110) nF 3.3 mF/F + 100 pF AEMC-BC05
(110 to 330) nF 3.3 mF/F + 300 pF
330 nF to 1.1 µF 3.8 mF/F + 1 nF
(1.1 to 3.3) µF 4.2 mF/F + 3 nF
(3.3 to 11) µF 4.5 mF/F + 10 nF
(11 to 33) µF 4.8 mF/F + 30 nF
(33 to 110) µF 6.4 mF/F + 0.1 µF
(110 to 330) µF 8.2 mF/F + 0.3 µF

Resistance – Generate3 (0.001 to 1) Ω 0.64 mΩ/Ω + 2 mΩ KQT-17-20AQ-101,

(1 to 100) Ω 0.12 mΩ/Ω + 2 mΩ KLC source procedure,
(0.1 to 10) kΩ 0.12 mΩ/Ω + 2 mΩ manufacturer’s manual,
10 kΩ to 1 MΩ 0.19 mΩ/Ω + 2 mΩ standard resistance
(1 to 100) MΩ 1.2 mΩ/Ω HARS-X-9-0.001
IET HRRS-B5-1M-5KV

Resistance – Measure3 Up to 10 Ω 0.03 mΩ/Ω + 0.05 mΩ KQT-17-20AH-06,

(10 to 100) Ω 0.03 mΩ/Ω + 0.5 mΩ KLC source procedure,
100 Ω to 1 kΩ 0.015 mΩ/Ω + 0.5 mΩ manufacturer’s manual,
(1 to 10) kΩ 0.023 mΩ/Ω + 5 mΩ HP 34401A
(10 to 100) kΩ 5.5 mΩ/Ω + 50 mΩ
(0.1 to 1) MΩ 0.1 mΩ/Ω + 2 Ω
(1 to 10) MΩ 0.2 mΩ/Ω + 100 Ω

(A2LA Cert. No. 4184.01) 05/30/2023 Page 46 of 55

 Parameter/Equipment Range CMC2, 5 (±) Comments

LCR Meters3

Resistance (˃ 0 to 50) MΩ 0.23 % KQT-33K1-4-1260-1,

KLC source procedure,
Inductance (1 μH to 999mH) 2.3 % + 0.5 µH manufacturer’s manual,
LCR standard
Capacitance (Fixed 1 pF 0.19 %
Points) 10 pF 0.12 %
100 pF 0.12 %
1000 pF 0.12 %

Power Analyzer/ ˃ 0 W to 5 kW 0.13 % KQT-33K1-4-1683-1,

Meter3 KLC source procedure,
manufacturer’s manual,
Fluke 5500A

Hipot/Withstanding (0.5 to 10) kV (AC) 13 mV/V + 5 V KQT-33K1-4-181-1,

Testers3 (0.5 to 10) kV (DC) 7.6 mV/V + 3 V KLC source procedure,
(10 to 20) kV (AC/DC) 3.5 % manufacturer’s manual,
(0.5 to 100) mA 1.4 % Kikusui 149-10A and
TOS 1200 and Tektronix
P6015A

Insulation Testers3 (0 to 100) MΩ 0.2 % KQT-33K2-4-33-1,

(0.1 to 10) GΩ 1.6 % KLC source procedure,
manufacturer’s manual,
HRRS decade resistance

V. Fluid Quantities

Parameter/Equipment Range CMC2 (±) Comments

Air Speed/Velocity Up to 30 m/s 0.21 m/s KQT-33K6-4-1769-1,

Meter velocity standard

Burets (100 to 1000) µL 1.1 mL/L KQT-VO-01, standard

(1 to 10) mL 0.2 mL/L weight F1 and balance
(10 to 400) mL 0.1 mL/L

(A2LA Cert. No. 4184.01) 05/30/2023 Page 47 of 55

 Parameter/Equipment Range CMC2 (±) Comments

Pipettes (100 to 1000) µL 1.1 mL/L KQT-VO-01, standard

(1 to 10) mL 0.2 mL/L weight F1 and balance
(10 to 400) mL 0.1 mL/L

Volumetric Flasks (0 to 1000) mL 0.17 mL/L KQT-VO-01,

(1000 to 4000) mL 0.14 mL/L standard weight F1 and
standard scale

VI. Mechanical

Parameter/Equipment Range CMC2, 5 (±) Comments

Balances and Scales3

Class I and II (1 to 500) mg 0.042 mg/g + 9.8 µg KQT-BA-01,

(0.5 g to 100) g 0.0016 mg/g + 35 µg OIML R76-1
(100 to 500) g 0.002 mg/g – 23 µg standard weights
(500 to 10000) g 0.0097 mg/g – 7.7 mg
(10 000 to 20 000) g 0.006 mg/g + 28 mg
(20 000 to 30 000) g 0.045 mg/g – 0.75 g

Class II, III and IV (1 to 30) kg 0.0079 mg/g – 7 mg

(30 to 60) kg 0.24 g/kg – 7 g
(60 to 200) kg 0.039 g/kg + 5.1 g
(200 to 500) kg 0.093 g/kg – 5.7 g
(500 to 2000) kg 0.21 g/kg – 62 g

Durometer – Spring
Force

Type A – B – O Up to 4.5 kg 0.5 % KQT-33K6-4-1362-1,

ASTM D2240 partial
Type C – D – DO Up to 4.5 kg 0.1 % calibration, standard
weight F1 and standard
scale

(A2LA Cert. No. 4184.01) 05/30/2023 Page 48 of 55

 Parameter/Equipment Range CMC2, 5 (±) Comments

Force Tester3 Up to 50 kgf 0.02 % KQT-17-20MF-04,

(50 to 500) kgf 0.1 % DLVN 109,
(500 to 5000) kgf 0.46 % KLC source procedure,
(5000 to 10 000) kgf 0.4 % standard weight E2
and load cell

Mass/Weights

Class F1, F2, M1, (1 to 500) g 0.002 mg/g + 0.098 mg KQT-SW-01,

M2 and M3 OIML R111-1,
standard weight E2 and
Class F2, M1, M2 and (0.10 g to 1) g 0.089 mg/g +11 µg standard scale
M3 (500 to 5000) g 0.0069 mg/g – 2.3 mg

Class M1, M2, and (5 to 20) kg 0.0097 mg/g – 17 mg

M3

Pressure3 –
Gauges/Pressure (-12 to 300) psi 0.06 % DLVN 76,
Switch/Safety Valve Up to 10 000 psi 0.025 % KQT-17-20MP-06,
KLC source procedure,
Pressure Transmitter (4 to 20) mA 0.7 % Fluke 718 Seri and
Barometer/Manometer Up to 1100 hPa 0.06 % module and Fluke 1G

Torque Drivers & (0.001 to 10) N·m 0.5 % KQT-33K6-4-2930-1,

Wrenches3 (10 to 300) N·m 0.8 % KLC source procedure,
(300 to 2000) N·m 1.3 % mount LTT-2100, Insize
IST-2200 N·m

Torque Analyzers Up to 10 N·m 0.13 % KQT-TA-01

DLVN 110 KLC source
procedure torque wheel
with E2+M1+F1
weights

(A2LA Cert. No. 4184.01) 05/30/2023 Page 49 of 55

VIII. Optical Quantities

Parameter/Equipment Range CMC2 (±) Comments

Colorimeter &
Spectrophotometry –
Diffuse Reflectance
Color Data: CIELAB

L* Illuminants C 2° Observer 64.80, 0.05 Chroma meter MFR

94.41, 72.64 and 72.27 manual
KQT-CH-01
10° Observer 66.15, 0.05 certified calibration
94.42, 71.94 and 71.17 plates

L* Illuminants D65 2° Observer 65.04, 0.05

94.42, 72.86 and 72.11

10° Observer 66.44, 0.05

94.41, 72.19 and 71.08

a* Illuminants C 2° Observer -29.16, - 0.05

0.16, -24.29 and 18.27

10° Observer -27.26, - 0.05

0.26, -19.97 and 20.17

a* Illuminants D65 2° Observer -29.51, - 0.05

0.31, -24.45 and 19.88

10° Observer -27.72, - 0.05

0.62, -20.16 and 21.40

b* Illuminants C 2° Observer 8.84, 2.35, 0.05

25.55 and 32.47

10° Observer 9.64, 0.05

2.31, 25.37 and 30.83

b* Illuminants D65 2° Observer 8.92, 2.22, 0.05

25.63 and 32.14

10° Observer 9.92, 0.05

2.26, 25.59 and 30.63

(A2LA Cert. No. 4184.01) 05/30/2023 Page 50 of 55

 Parameter/Equipment Range CMC2, 5, 7 (±) Comments

Colorimeter &
Spectrophotometry –
Diffuse Reflectance
Color Data: CIELAB
(cont)

X Illuminants C 2° Observer 0.2772, 0.016 Chroma meter MFR

0.3152, 0.3237 and manual
0.4174 KQT-CH-01
certified calibration
10° Observer 0.2832, 0.016 plates
0.3155, 0.3312 and
0.4182

X Illuminants D65 2° Observer 0.2781, 0.016

0.3178, 0.3238 and
0.4194

10° Observer 0.2849, 0.016

0.3180, 0.3324 and
0.4208

Y Illuminants C 2° Observer 0.3652, 0.016

0.3219, 0.4019 and
0.3698

10° Observer 0.3692, 0.016

0.3221, 0.4004 and
0.3647

Y Illuminants D65 2° Observer 0.3813, 0.016

0.3346, 0.4152 and
0.3786

10° Observer 0.3833, 0.016

0.3348, 0.4128 and
0.3758

Light Meters (20 to 100) lux 3.0 % + 0.1 lux KQT-33K4-4-475-1,

Illumination3 – Measure (100 to 1000) lux 3.0 % + 1 lux Konica CL-70F
& Measuring Equipment (1000 to 20 000) lux 3.0 % + 10 lux

Luminance (100 to 1000) cd/m2 4.3 % + 0.005 cd/m2 TES-137

Color Temperature 2856 K 4.1 % + 1 K Konica CL-70F

Fixed Point

(A2LA Cert. No. 4184.01) 05/30/2023 Page 51 of 55

 Parameter/Equipment Range CMC2, 7 (±) Comments

UV/Vis Spectrometer Up to 0.3 Abs 0.0031 Abs KQT-SP-01,

Light Absorbed – (0.3 to 0.5) Abs 0.0032 Abs DLVN 91:2001,
Measure at Wavelength (0.5 to 2) Abs 0.0047 Abs ASTM E - 925
(254 to 875) mm (254 to 875) mm 0.32 nm Type 666-S000/F7
certified reference
standard

Radiometry – Measure
Mass Fraction

As, Arsenic 4.7 mg/kg 0.4 mg/kg X-Ray Analyzer

Br, Bromine 181 mg/kg 9 mg/kg Manufacturer’s manual
Cd, Cadmium 20.8 mg/kg 0.9 mg/kg KQT-XRF-01
Cr, Chromium 9.6 mg/kg 0.5 mg/kg low-density
Hg, Mercury 2.56 mg/kg 0.16 mg/kg polyethylene CRM
Pb, Lea 11.3 mg/kg 0.4 mg/kg
S, Sulfur 86 mg/kg 9 mg/kg
Sb, Antimony 9.6 mg/kg 0.7 mg/kg
Sn, Tin 20.7 mg/kg 1.6 mg/kg
Zn, Zinc 194 mg/kg 12 mg/kg

XRF – Measure Coating

Thickness

Ni, Nickel 9.6 µm 0.6 µm Manufacturer’s manual

Cu, Copper 9.2 µm 0.6 µm KQT-XRF-01
Au, Gold 0.26 µm 0.06 µm Calmetrics foil
standards

(A2LA Cert. No. 4184.01) 05/30/2023 Page 52 of 55

VIII. Thermodynamics

Parameter/Equipment Range CMC2, 5, 7 (±) Comments

Relative Humidity – KQT-33K5-4-84-1

Measuring Relative
Humidity Meters (20 to 90) % RH 2.8 % RH Vaisala HMP75 with
JIEO tech TH-ME 65

Temperature – (-40 to 150) ºC 0.5 ºC Testo 735-1 with

Measuring Meters JIEO tech TH-KE 065
media chamber

Temperature – Measuring (-80 to -40) ºC 0.4 % + 0.05 ºC KQT-CG-13,

Equipment3 (-40 to 0) ºC 1.2 % + 0.05 ºC manufacturer’s
(0 to 300) ºC 0.08 % + 0.05 ºC manual,
(300 to 1000) ºC 0.4 % + 0.05 ºC Testo 735-1
(1000 to 1600) ºC 0.3 % + 0.05 ºC Fluke 725 with TC
sensors

Temperature – (-40 to 0) ºC 0.22 ºC KQT-33K5-4-42-1,

Measuring Equipment (0 to 150) ºC 0.21 ºC DLVN 137 and 138:
Probe Thermometers3 (150 to 300) ºC 0.34 ºC 2004, KLC source
(300 to 650) ºC 1.0 ºC procedure,
Testo 735-1 Pt 100,
HS 5609 PRT with LK
LAB and Fluke dry/oil
bath

Infrared Temperature – (-18 to 150) ºC 1.3 ºC KQT-33K4-4-615-1,

Measuring Instruments3 (150 to 400) ºC 2.4 °C DLVN 124:2003,
(400 to 982) ºC 7 °C Omega BB701 and
BB-4A

Chamber/Dry Oven,3 – KQT-CHDO-2015

ASTM D 5374 -1999
Humidity (˃ 0 to 40) % RH 1.3 % RH Vaisala MI 70 and
(40 to 97) % RH 1.6 % RH Dickson DSB
Keysight 34970A data
Temperature (-80 to -50) °C 0.4 °C acquisition with data
(-50 to 200) °C 0.6 °C loggers
(200 to 400) °C 1.2 °C

(A2LA Cert. No. 4184.01) 05/30/2023 Page 53 of 55

 Parameter/Equipment Range CMC2 (±) Comments

Washing Machine, (30 to 70) ºC 0.15 ºC KQT-WM-01

Tumble Dry (50 to 2000) rpm 1.7 rpm Testo 735, stopwatch,
Up to 10 800 s 2.2 s tachometer RPM10
Up to 100 L 0.7 L flow meter

Steam Sterilizer &

Autoclave, Low Pressure
Ovens (-40 to 140) °C 0.2 °C KQT-AC-01,
(0 to 5) bar 0.06 bar autoclave temperature
and pressure data logger

Liquid Bath3 (-50 to 200) °C 0.6 °C KQT-CHDO-2015

(200 to 400) °C 1.2 °C ASTM D 5374 -1999
Dickson DSB
Keysight 34970A data
acquisition with data
loggers
____________________________________________

1
This laboratory offers commercial calibration service and field calibration service.
2
Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement
that a laboratory can achieve within its scope of accreditation when performing more or less routine
calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent
expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage
factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory
may be greater than the CMC due to the behavior of the customer’s device and to influences from the
circumstances of the specific calibration.
3
Field calibration service is available for this calibration. Please note the actual measurement uncertainties
achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA
Scope. Allowance must be made for aspects such as the environment at the place of calibration and for
other possible adverse effects such as those caused by transportation of the calibration equipment. The
usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g., resolution) must
also be considered and this, on its own, could result in the actual measurement uncertainty achievable on
a customer’s site being larger than the CMC.
4
Surface plate calibrations are only offered as a partial calibration that is limited to repeat readings that
reflect local variations in flatness, as agreed upon by the customer as documented during the contract
negotiation process in compliance with ISO/IEC 17025:2017, section 7.1.
5
In the statement of the CMC, percentages are percent of reading, unless otherwise indicated. In the
statement of the CMC, V is defined as volume measured.

(A2LA Cert. No. 4184.01) 05/30/2023 Page 54 of 55

6
The stated measured values are determined using the indicated instrument (see Comments). This capability
is suitable for the calibration of the devices intended to measure or generate the measured value in the
ranges indicated. CMC’s are expressed as either a specific value that covers the full range or as a
percentage or fraction of the reading plus a fixed floor specification.
7
The type of instrument or material being calibrated is defined by the parameter. This indicates the
laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated
for the listed measurement parameter.

(A2LA Cert. No. 4184.01) 05/30/2023 Page 55 of 55

 Accredited Laboratory
A2LA has accredited

KIM LONG CALIBRATION AND TECHNOLOGIES CO. LTD.

Ho Chi Minh City, VIETNAM
for technical competence in the field of

Calibration
This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017
General requirements for the competence of testing and calibration laboratories. This laboratory also meets R205 – Specific
Requirements: Calibration Laboratory Accreditation Program. This accreditation demonstrates technical competence for a
defined scope and the operation of a laboratory quality management system
(refer to joint ISO-ILAC-IAF Communiqué dated April 2017).

Presented this 30th day of May 2023

_______________________
Mr. Trace McInturff, Vice President, Accreditation Services
For the Accreditation Council
Certificate Number 4184.01
Valid to February 28, 2025

For the calibrations to which this accreditation applies, please refer to the laboratory’s Calibration Scope of Accreditation.