175

IEEE Transactions on Power Delivery, Vol. 8, No. 1, January 1993.

INFLUENCE OF SWITCHING OPERATIONS ON THE
VACUUM INTERRUPTER DIELECTRIC STRENGTH
P. OsmokroviC
Faculty of Electrical Engineering,
University of Belgrade,
Bulevar Revolucije 73, Be 1grade, Yugoslavia

Abstract - Switching operations influence on significantly after completion of switching

dielectric strength of vacuum interrupters are operations. This is the consequence of contact
described in this paper. Detailed experimental surfaces changes during switching operations, 161; 2)
procedure and numerical processing of experimental Standard dielectric testing of vacuum interrupters
results are presented. The breakdown voltage and having open contacts and discharge with limited
emission current before and after switching operations current results in increased dielectric strength. This
were experimentally determined. Experimental procedure dielectric strength rise results because small
included "closing without currentlbreaking without currents condition the contact surface. Therefore, the
current", "closing without currentlbreaking with rated conventional dielectric test (in accordance to IEC
current" and "closing without current/breaking of Publication 6 0 ) is not a suitable technique for
rated short-circuit current" influence to breakdown application in real operating conditions.
voltage and emission current. Inter-contact gap was
varied in these experiments. We applied following According to the manner in which the vacuum
voltage shapes: D.C., lightning impulse voltage interrupter contact surfaces are changing their
(1.2150 p ) , and A.C. with 50 Hz. Three types of topography, switching operations can be classified
commercially available vacuum interrupter were tested. into: 1) Switching operations that cause welding and
Two of these devices were with transverse and one with breaking of the welded contacts ("closing under
axial magnetic field. All having CuCr contacts. Based prescribed currentlbreaking without current" and
on experimental results and theoretical considerations "closing without currentlbreaking without current");
we concluded how switching operations influence the 2) Switching operations where the electrical arc
vacuum interrupter dielectric strength. We discovered exists ("closing without currentlbreaking with rated
which physical mechanisms determine the influence of current" and "closing without currentlbreaking of
switching operations to vacuum interrupter dielectric rated short-circuit current").
strength.
The purpose of this paper is testing the influence
m:dielectric strength, vacuum interrupter, of switching operations "closing without
switching operations, conditioning. currentlbreaking without current " , "closing without
currentlbreaking with rated current'' and "closing
INTRODUCTION without currentlbreaking of rated short-circuit
current" on the dielectric properties of commercially
Vacuum is an extraordinary good insulator and available vacuum interrupters with CuCr contacts.
extinguisher. There are two major reasons for the use
of vacuum interrupters for medium voltages: high EXPERIMENT
dielectric strength in small inter-electrode gaps and
its rapid regeneration upon current zero crossing. A Experimental arrangement.
short displacement of contacts in these interrupters
enables low operating energy and high mechanical Tests were conducted with three different types of
strength in comparison with other types of vacuum interrupters. All the interrupters were with
interrupters 111. CuCr contacts. Type A and type B interrupters were
with transverse magnetic field contacts, while type C
Vacuum electrical breakdown is generated by w a s with axial magnetic field contacts. Rated data for
evaporated material of electrodes. This implies that the interrupters are given in Table I.
condition of electrode surfaces is critical for the
dielectric strength t2.31. In vacuum interrupters, a
microscopic state of the contact surfaces is
determined by: 1) pre-history of electrical discharge
(i.e. change of contact topography by previous
switching operations); and 2) characteristics of
\Rated voltage [kVl I 12 1 12 I 12

electrode material 14.51. Therefore, vacuum Rated current [kAl 2 1.6 2

interrupters differ from interrupters with other
insulating media. This difference occurs due to: 1) Rated short-circuit
Vacuum interrupters dielectric strength decreases breaking current [kAl 20 20 25

D.C. percentage XI 50 30 30
92 WM 2 3 5 - 2 PWRD A paper recommended and approved Rated short-circuit
by the IEEE Switchgear Committee of the IEEE Power closing current [kAl 50 50 50
Engineering Society for presentation at the IEEE/PES
1992 Winter Meeting, New York, New York, January 26- stroke [mml 8 8 8
Contact
30, 1992. Manuscript submitted May 20, 1991; made
available for printing January 1 3 , 1992. Average opening
speed [Wsl
Table I: Rated data for vacuum interrupters tested

0885-8977/92/$3.0001993 IEEE
176
A pneumatic cylinder was used as a drive for a The voltage impulse was generated due to inter-contact
movable contact of the vacuum interrupter, so that the gap breakdown.
required opening speed was adjusted efficiently. The
opening time scattering of the pneumatic drive was
less than 1.2 m s . In order to avoid outside flashovers VND RI~P
the tested interrupter was placed in a vessel filled
with SF6 (at 2 bar pressure).

Fig.1 shows the measuring circuit scheme. In this

test the vacuum interrupter dielectric properties were
tested by impulse voltages. The impulse voltage source
was a Marx generator adjusted for 1.2150 ps
wave-shapes. The impulse voltage was measured with a
low Ohmic voltage divider with the ratio of 273.
Measuring signal was digitized (Tektronix 390AD: two
channels, 50 kHz sampling frequency, 10 bit %
resolution, 4 kB memory, external triggering).
220 v -
- 1

Fig.2:A.C. and D.C. high voltage test-circuit

(PR-over-current relay, ZP-interrupter protection,
RT-regulating transformer, IT-H.V. test-transformer,

MARX PULSE GENERATOR

4 ,(ti+’ 971 RP-pre-resi stor, CiCz-capaci tive vo 1 tage divider,
VK-vacuum interrupter tested, RsH-aUtOmatiC switch off
transducer of the test transformer, TISK-automatic
switch-off device for the test transformer,
Rm-measuring resistor for the emission current
measurement in a D. C. test-circuit, PROV3-tested A.C.
Fig. 1: Impulse voltage test-circuit (Cs-impulse circuit switching-odswitching-off conductor,
capacitor, I-controlled spark gap, RE-the wave-tail PROV2-PROV1 -D.C. circuit suitchi ng-on/swi t ching-off
resistor, Rd-damping resistor, Rim- voltage divider conductors, VND-high voltage diode, ZI-protection
(low Ohmic resistors), VK-vacuum interrupter tested, spark gap, CsP-rectifier capacitor, RI-rectifier
Rp pre-resistance, DIG-digitizer. resistor, Rim-voltage divider (high Ohmic resistors),
DIG-Digit izer.
Fig. 2 shows the measuring circuit scheme for
vacuum interrupter dielectric properties tests by A.C.
and D.C. voltages. During A.C. test, PROVl and PROV2
conductors were taken off, while PROV3 was on. During
D.C. voltage tests, PROVl and PROV2 conductors were on I I I -4

and PROV3 was taken off. In course of D.C. voltage

- SHUNT
testing, emission characteristics of the vacuum
interrupter contacts were measured. We used a high
- INPUT

voltage transformer (130 kVeff/30 LVA) supplied from a

regulating transformer 22OV-5OOV for A. C. MONOSTABLE OPlOCOUPLER
3.
measurements. A D.C. supply source, having maximum ---o
MULlIVIBRAlOR ANlIPARALLELLY
30kV output was used for D.C. experiments. Ripple D.C. INlERCONNEClEC
voltage was less than 1%. High voltage transformer of TRIGERRING LEVEL THVRISTORS

the rectifier was supplied by a regulating ADJUSTMENT

transformer. This enabled setting the D.C. voltage
rise rate. It was adjusted to 2OkV/s, therefore the
capacitive current between the contacts could be Fig.3:An electronic switch block diagram for the test
neglected in course of the D.C. testing. The A.C. transformer automatic switching-off.
voltage was measured with a capacitive voltage divider
(800 ratio). The D.C. voltage was measured with high Fig. 4 shows the measuring circuit scheme for
Ohmic voltage divider of 5600 ratio. The measured vacuum interrupter used for testing in respect to the
signal in both cases was digitized (Tektronix 390 AD). prescribed current breaking capacity. We used the
Ernission current was measured with a shunt of 1500Ll, short-circuit generator of 2x40MVA output and voltage
placed in series with the test object. The shunt 1080V, 625V and 540V depending on the generator
voltage was digitized during the same measurement. windings coupling. The current in the generator
circuit was limited with a short-circuit line trap.
The micro-second clearing of the vacuum breakdowns This limit could be set by the circuit inductance
results with the fact that a short-circuit current can variation or by the generator excitation variation.
not flow through the tested transformer primary. Electric arc voltage was measured with an Ohmic
Because of that, the protection can not be effective voltage divider (5 ratio). The measured signal was
when placed on transformer primary sides, as it is recorded with a multichannel chart recorder. In
usually done. Therefore, we designed the thyristor parallel to the chart recorder inputs two Zener diodes
protection device and placed it in the transformer were connected to cut off the T.R.V. (Transient
primary. A block diagram of the protection thyristor Recovering Voltage) peak values that occurred upon
device is shown in Fig.3. This protection device was electric arc extinction. Electric arc current was
triggered by a voltage impulse, from a shunt of 150Ll. measured by the coaxial shunt, 0.lmR. The measured
The shunt was connected to test interrupter in series. signal was plotted with chart recorder.
 111
Numerical processing of measured data.

Measured breakdown voltage data were statistically

processed by specially developed numerical programs.
The aim of statistical processing was to determine if
breakdown voltage can be represented in the form of
usual distribution functions (normal, Weibull,
zn double-exponential). This was done using the software
which performs estimation of parameters for usual
distribution functions from measured data and then
performs testing of the assumed statistical model [81.
Parameter estimation is done by the maximum likelihood
I
and extremization of log-likelihood function is done
u,lt)

[e]
UL(t)
by the Powell's non-derivative approach. Testing of
the measured data compliance to the proposed
statistical model is accomplished by the chi-square
test or Kolmogoroff test. Besides that, measured data
can be presented in the form of probability paper
plots for usual distribution functions.

RESULTS AND DISCUSSION

Fig.4: High current low voltage test-circuit
(G-short-circuit generator with a flywheel, Dielectric properties of vacuum interrupters with
ZP-protection interrupter, US-making switch, L-line conditioned contacts.
trap, VK-vacuum interrupter tested, POC-interrupter
test operating mechanism, Rm-measuring coaxial shunt, Fig. 5. shows the dependencies of mean, maximum
Rim-resistor divider, ZD-protection diodes for the and minimum breakdown voltages versus the
chart recorder input, 0%-chart recorder with a inter-contact gap for type A interrupter. Values for
luminous beam, SINH-sinhronisation equipment. impulse voltage practically do not differ in respect
to values for A.C. voltage. Fig. 6. shows mean values
Measurements were performed in the shielded of the emission characteristics V-4 for a particular
measuring cabin. Due to higher levels of applied measuring series, depending on inter-contact gaps. In
voltage X-ray protection was required. The X-ray Fig.7. the breakdown voltage mean value in
protection was realized by lead shields (6" thick) corresponding emission characteristic V-4 is
placed between tested interrupter and measuring cabin. presented.
The dose values being measured in the cabin were far
below the maximum permissible doses given by [71.

Experimental Rocedure. CkV 1

ZO0Fy
In our experiments, we firstly tested the
dielectric strength of the interrupters (type A ,B and
C) on conditioned contacts. Dielectric strength of the 160-
interrupters was tested for different inter-contact
gaps. Lightning impulse voltage was applied. Contact
conditioning was made before each series of
measurement by means of 100 breakdown operations. Each 120 -
measurement series consisted of 100 breakdown voltage
measurements. Between two successive measurements we
paused for 30 seconds. For all measurements, after 80 -
each fifth breakdown we measured the emission current
and we determined the voliage V-4 (voltage at which
emission current was 10- A). After completion of 40 -
dielectric tests on conditioned contacts, the
following switching current operations were made:
/'
#f d Cmm'l
"closing without current /breaking without current", I I I I
"closing without current /breaking of rated
short-circuit current", and "closing without
current/breaking with rated current". After completion
of any switching operation, dielectric tests were
repeated without previous conditioning. We repeated Fig 5:Breakdown voltage versus inter-electrode gap for
this procedure 100 times for each switching operation. type A interrupter ( 9 -
impulse voltage wave form, o -
After each fifth switching operation emission D.C. voltage)
characteristic V-4 was measured. Before repeating of
each "closing without current/breaking without It has been found that experimentally obtained
current" switching operation we conditioned contacts breakdown voltage values, for interrupter with
with a diffuse electric arc (in order to prevent conditioned contacts, belong to the Weibull
contacts hardening due to successive switching distribution, Fig. 8 . By estimating the suitable
operations: "closing without current/breaking without parameters of the distribution it was found that the
current"). For the switching operation of rated parameter of distribution shape is approximately
short-circuit current, arc duration was controlled for constant for all measuring series, Table 11.
8flms.
Based on the dependence of the mean of the
Disconnection of interrupter contacts was realized corresponding emission characteristic V-4, it can be
by a mechanical device of 0.lmm measuring inaccuracy. concluded that the breakdown occurs by the emission
Zero distance of the contacts was determined by their mechanism. The same can be concluded on the basis of
electrical resistance measurement. Weibull's distribution. The shape parameters constancy
178

indicates that all breakdowns are initiated by the

same type of weak points, which are cathode micro tips
only. According to the linear dependence of the
breakdown voltage (V) versus the inter-contact gap type A type B type C
(d), for the D.C. voltage, Fig.5, it can be stated
that in this case a cathode mechanism is involved. The
Koltw
1.2/50 50 Hz 1.2/50 50 Hz 1.2/50 50 Hz
same is true for A.C. voltage, for d<2nun. For d>2mm,
by fitting the experimental results per exponent, for 0.5mm 7.03 6.936 6.50 6.72 6.93 7.01
A.C. voltage it is found
1 mm 7.05 6.85 6.57 6.56 7.04 6.82
V(d) = [d/d2lkm, V2=V(d21, d2=2mm 1 I I I I I I I
2 nun 6.83 6.80 6.41 6.45 6.81 6.79
k=0.786 for type A interrupter, k=0.753 for type B
interrupter and k=O. 764 for type C interrupter which 3 mm 6.95 7.10 6.65 6.69 6.95 7.01
I I
means that an anode mechanism is involved. Although
for d>2mm both emission mechanisms of breakdown may be I 4 nun I 7.11 I 7.02 I 6.92 I 6.64 I 7.12 I 6.89 I
involved, the distribution function is not of mixed
type, Fig.8. According to this fact, it can be Table 11. Weibull distribution shape of breakdown
concluded that an A.C. breakdown for d>Zmm is realized voltages for interrupters with conditioned contacts.
by the anode mechanism.

8o t
P

40 F
2$: I I , I I r4
d lmm3
0
0 1 2 3 4 5 6
Fig.8:A.C. breakdown voltages on Weibull probability
scale, for type A interrupter with conditioned
contacts (d=4mm).
Fig.6: 50% voltage value V-4 versus inter-electrode
gap for type A interrupter(* - V-4 measurements It has not been identified a significant
during dielectric tests by impulse voltage, o V-4 - difference in dielectric properties between type A,
measurements during dielectric tests by A.C. voltage). type B, and type C interrupters for conditioned
contacts.

Dielectric properties of vacuum interrupters after

switching operation "closing without currenthreaking
without current"

It has been found that experimentally obtained

0
breakdown voltage values, upon the "closing without
/ current/breaking without current'' applied switching
&
00 d=3mm operation, belong to the Weibull distribution, Fig. 9.
/ Also, it can be concluded that the "closing without
/ current/breaking without current'' switching operation
0
,Yod=2 mm affects a significant reduction of corresponding
80 ' ,
dielectric strength. On the basis of the same shape
/ parameters of the Weibull distribution for conditioned
/
0 contacts, as well as contacts after the "closing
40 /'d=1 mm without current /breaking without current'' switching
operation (&7.31 for type A interrupter, 6=6.98 for
.d-0.5 mm type B interrupter and 6=7.09 for type C interrupter),
V-i,[kVI
I I I I I - it was found that only vacuum electrical breakdown by
0 20 40 60 eo emission mechanism occurs. Thls conclusion can be
confirmed on the basis of similarity of the emission
characteristic V-4 versus 50% breakdown voltage,
obtained for conditioned contacts, and contacts after
a completed "closing without current/breaking without
Fig.7:50% A.C. breakdown voltage versus voltage V-4 current'' switching operation. On the basis of the
for type A interrupter, obtained results and knowing the mechanism of the
change of contact topography under switching operation
"closing without current/breaking without current''
 179

(welding and breaking of the welded contacts) it can

be stated that the mechanism initiating the breakdown
after this switching operation is of the anode type.

I
Fig. 10:A. C. breakdown voltages on Weibull probability
scale, after the switching operation "closing without
current/breaking with rated current'' for type A
interrupter, (d=4mm).

Fig.3:A.C. breakdown voltages on Weibull probability

scale, after the switching operation "closing without
current/breaking without current" for type A
interrupter, ( d=4mm).

Significant difference in influence of this

switching operation on dielectric properties of type
A, type B and type C interrupters has not been
observed.

Dielectric properties of vacuum interrupters after

switching operation "closing without currentlbreaking
with rated current''

It has been also established that experimentally

obtained breakdown voltage values upon "closing
without current/breaking with rated current" applied

.-
switching operation belong to the Weibull
distribution, Fig. 10. Also, it was found that the
time
"closing without current/breaking with rated current''
applied switching operation did not significantly
affect the dielectric strength. The emission Fig.1l:Temporal change of arc voltage 3 and arc
characteristic V 4 measurement and estimation the current i, during the switching operation "closing
shape parameter of the Weibull's distribution (6=7.15 without currenthreaking with rated current'' for type
for type A interrupter, 6=6.62 for type B interrupter A interrupter.
and 6=6.98 for type C interrupter) are indicating that
vacuum breakdown, after the switching operation Dielectric properties of vacuum interrupters after
"closing without current/breaking with rated current" switching operation "closing without current/breaking
is occurring by the emission mechanism. This can be of rated short-circuit current"
explained by the occurrence of a diffuse electric arc
during this switching operation. The diffuse electric Also, it has been established that experimentally
arc moves along the interrupter contacts and melts the obtained values of breakdown voltages, upon the
micro tips, formed by breaking of the welded contacts. "closing without currenthreaking of rated
In such a way. a diffuse arc performs the conditioning short-circuit current" applied switching operation,
of contacts. The presumption of the diffuse electric belong to the Weibull distribution, Fig.12. After this
arc occurrence is confirmed by Fig. 11. This figure is switching operation the dielectric. strength of
illustrating a scope trace of the "closing without interrupter is reduced. Namely, the switching
current/breaking with rated current" switching operation "closing without currenthreaking of rated
operation. The scope trace from Fig. 11 is a typical short-circuit current'' affects the dielectric strength
one for the diffuse arc occurrence. On the basis of of type B interrupters in greater extent than of type
the obtained results it can be stated that the A interrupters. The emission characteristics V-4
mechanism initiating the breakdown after switching measurement could not be performed because the
operation "closing without current/breaking with rated bryikdown occurred before emission current reached a
current" is one of the emission type. 10 A value. By estimating the parameters of the shape
of Weibull distribution (6=2.32 for type A interrupter
Significant difference in influence of this , 6=4.11 for type B interrupter and 8=3.12 for type C
switching operation on dielectric properties of type interrupter) one obtains the values significantly
A, type B and type C interrupters has not been .differing from the ones obtained for the case of
observed. interrupter with conditioned contacts.
180
lower observed value of breakdown voltage after
switching operation "closing without current/breaking
of rated short-circuit current'' for type C interrupter
(axial field) in comparison with type A and B
interrupters (transversal field) can be explained by
higher generation of micro particles in the case of
interrupter with axial field. In other words, for
interrupters with transverse magnetic field micro
particles were created mainly by melting in anode
1I spot, while for interrupters with axial magnetic field
besides formation in cathode spots they were created
also by bridge explosion during contact parting.

The influence of switching operations on 50 %

breakdown A.C. voltage is shown in F i g . 14.

Fig.12: A.C. breakdown voltages on Weibull probability

scale. after the switching operation "closing without 240-
current/breaking with rated short-circuit current'' for

1'
type A interrupter, (d=4mm).
200 -
According to this data, it can be concluded that
vacuum breakdown, upon the switching operation
"closing without current/breaking of rated
short-circuit current'' is not initiated by the 160 -
emission mechanism. The high vacuum in the interrupter
does not allow the avalanche breakdown mechanism [31,
meaning that the vacuum breakdown after switching
operation "closing without current/breaking of rated 120 -
short-circuit current'' is initiated by the
micro-particles mechanism. The micro-particles occur
after melting of the contact material due to a 80 -
narrowed arcing effect. The presumption of narrowed
arc occurrence is confirmed to be correct, as shown in
F i g . 1 3 . F i g . 1 3 presents the scope trace of the
switching operation "closing without current/breaking 40 -
of rated short-circuit current". This trace
illustrates the characteristic rise rate of voltage
during the electric arc transition into a narrowed
shape [SI. A different influence of the switching 0
(1) (2) ( 31 (4)
operation "closing without current/breaking of rated
short-circuit current" on the dielectric properties of Fig.14:The SO % breakdown A.C. voltage for : 1
type A and type B interrupters can be explained by a -conditioned contacts, 2 - contacts after the
different composition of contact material [ 1 0 , 1 1 1 . The switching operation "closing without current/breaking
without current", 3 - contacts after the switching
operation "closing without current/breaking with rated
current", 4 - contacts after the switching operation
"closing without current/breaking of rqted
short-circuit current", (d=8mm,0 -type A interrupter,
-type B interrupter,* -type C interrupter).

CONCLUSION

This paper considers the switching operation

influence on dielectric properties of commercial
vacuum interrupters with CuCr contacts. It has been
found that dielectric strength strongly depends on the
type of switching operation adopted before dielectric
testing. It has been established that the switching
operation "closing without current/breaking without

--
current" ,as well as "closing without current/breaking
of rated short-circuit current", significantly reduce
the dielectric strength of the interrupters. The
switching operation "closing without current/breaking
with rated current'' does not cause the change in

-
I
dielectric strength of vacuum interrupters. This can
be explained by the conditioning of contacts during
time this switching operation, due to the diffuse electric
arc.
Fig.13:Temporal change of arc voltage U and arc
current i, during the switching operatiok "closing For the "breakdown voltage" random variable, after
without current/breaking with short circuit current'' all considered switching operations, it w a s found that
for type A interrupter. it belongs to Weibull distribution. At the same time,
the Weibull distribution with constant parameter shape
 181
was obtained approximately for all cases except for [61 Frochlich K., Widl W..Breakdown and field-emission
the case of switching operation "closing without Behavior of Differently Prestressed Vacuum Interrupter
current/breaking of rated short-circuit current". It Copper Contacts TEE Proc. pt E, ~01.128, No 4. pp
can be concluded that this is the consequence of the 143-249, 1981.
same weak insulator points in all cases i.e.micro tips
on cathodes. [71 Verordnunx -U den Schutz v s Schaden durch
Rontnenstralen, Bundesgesetzblatt, March 9, 1973.
By measuring the emission current for conditioned
contacts and contacts after switching operat ion [81 Dogo G., OsmokroviC P.,Statistical Properties of
"closing without current/breaking without current", Electrical Breakdown in Vacuum, IEEE Trans.
and "closing without current/breaking of rated Electrical Insulation, Vol 24, No 6, pp 949, 1989.
current", the existence of correlation between average
breakdown voltage and V-4 voltage has been found. On [91 OsmokroviC P., Influence of Switching Operations
the contrary, for contacts after switching operation on the Reversibility of the Vacuum Interrupter
"closing without current/breaking of rated Dielectrical Properties 14th ISDEIV, paper 4P18, Santa
short-circuit current", it has been found that there Fe 1990.
is no correlation between average breakdown voltage
and V-4 voltage. It can be concluded that the [ l o ] Osmokrovic. P., The Irreversibility of Dielectric
breakdown for conditioned contacts, contacts after Strength of Vacuum Interrupters After Short-circuit
switching operation "closing without current/breaking Current Interruption, IEEEIPES SM, 372-3, 1990.
without current", and contacts after switching
operation "closing without current/breaking of rated [111. Widl W., SDannungsfestinkeit van Vakuumschaltern
current", is initiated by the emission mechanism. nach verschiedenen Schalthaudlungen, Ph.D. Disertation
However, after the switching operat ion "closing Teh. Univ. Vienna 1980.
without currentlbreaking of rated short-circuit
current", the breakdown is initiated by the micro
particles mechanism. Any influence of the type of Born in Sarajevo (Yugoslavia). on
interrupter on the change of dielectric strength after August 20,1949. Completed high school
switching operations "closing without current/breaking education in Sarajevo and graduated
of rated current" and "closing without Electrical Engineering at the
current/breaking without current" has not University of Belgrade (Yugoslavia).
beenobserved. It was concluded that the contact Completed post-graduate studies and
material composition and magnetic field type did not got his M.Sc. and Ph.D. degrees at the
influence degradation of dielectric by these switching University of Belgrade. Spent a number
operations. Higher degradation of dielectric strength of years in Karlsruhe (West Germany),
by the switching operation "closing without working on various professional projects as a
current/breaking of rated short-circuit current" for scientific research collaborator of the H.V. Institute
the type B interrupter in comparison with the type A of the University of Karlsruhe.Permanent1y employed as
interrupter was explained by different composition of associate professor at the Faculty of Electrical
contact material. Higher degradation of dielectric Engineering University of Belgrade (Yugoslavia) and
strength after switching operation "closing without engaged as scientific research collaborator at the
current/breaking of rated short-circuit current" was IRCE Institute of "Energoinsvet" Company of Sarajevo,
explained by increasing generation of micro particles (Yugoslavia).
for the interrupter with axial magnetic field. This is
the consequence of the fact that for interrupters with
transverse magnetic field micro particles were created
mainly by melting in anode spot. On the other side for
interrupter's with axial magnetic field, besides
formation in cathode spots, micro particles were
created also by bridge explosion during contact
parting. It should be pointed out that the considered
switching operations did not degrade dielectric
strength of vacuum interrupters below rated values.

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After Currants Interruption in Vacuum, IEEE Trans. on
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[21 Latkom R.V., h

&
H Voltage Vacuum Insulation The
Physical w, Academic Press London 1981.

[31 OsmokroviC P. A Contribution to the Researches of

Vacuum Electrical Breakdown Mechanism 14th ISDEIV,
paper 1P12, Santa Fe 1990.

[41. Rider W., Widl W., High Voltage Testing of Vacuum

Interrupters, CIGRE R ~ L No. 13-08, 1982.

151 Farrall G. A.,Electrical Breakdown in Vacuum, E

Trans. on Electrical Insulation, vol. EI-20 No 5, pp
815-841, 1985.