Agilent

LCR Meters, Impedance Analyzers

and Test Fixtures
Selection Guide

Component and Material Measurement Solutions

 Cost Effective Solutions for Your Applications

Whether your application is in R&D, production, quality Advanced measurement techniques

assurance, or incoming inspection, Agilent Technologies
has the right impedance measurement solution for you. for a wide range of applications
Agilent has a complete line of impedance test equipment
and test accessories to help you task efficiently. When Figure 1 is a comparison of different measurement
you choose an impedance measurement product from techniques used in Agilent's LCR meter and impedance
Agilent, you get more than accurate and reliable test analyzers. As you can see, each technique has special
results. Agilent offers: measurement advantages:

Complete solution: Covering frequencies from 20 Hz • Auto-balancing bridge offers widest impedance
to 3 GHz, Agilent's impedance product line offers you measurement range with typical frequency range
the widest selection of equipment for your application. of 20 Hz to 110 MHz. This technique is best for
In addition, several third-party companies have comple- low-frequency, general-purpose testing.
mentary products designed to work with Agilent equipment
for special applications. This brochure gives an overview
of all the products you can choose from. Agilent's impedance product measuremant
technique comparison 10% accuracy range
100M
Knowledge: Agilent has decades of experience providing Auto-balancing
impedance measurement solutions. Years of experience 10M bridge
and continuing technical innovations go into the design Impedance measurement range (ohms) 1M I-V
and manufacturing of each Agilent LCR meter and
impedance analyzer. Agilent also has a list of technical 100K
publication to assist you in many different applications 10K
(see page 15 for full listing.)
1K RF I-V
Convenience: Any time you have an impedance measure- 100
ment need, help is only one phone call away. Agilent offers Network analysis
three types of impedance measurement solutions as shown 10

in Table 1. Calling Agilent will put you in contact with 1

one of our trained engineers to help you find a solution.
100m

10m

1m
1 10 100 1K 10K 100K 1M 10M 100M 1G 10G
Measurement frequency range (Hz)

Figure 1. Impedance measurement technique

Table 1. Impedance measurement product type

Product type
Product highlights LCR meter Impedance analyzer Combination analyzer
Frequency sweep Spot Continuous Continuous
capability
Display Numeric only Graphics Graphics
Others Handler interfaces Equivalent circuit Equivalent circuit
analysis built in analysis built in,
multiple functions in
one instrument
Advantage Lower-cost solution, Frequency Cost-effective,
ease of use, characteristics and time-saving, and
high speed resonant analysis, compact in size
circuit modeling

2
• I-V technique covers from 40 Hz to 110 MHz with a more How to use this selection guide
focused impedance measurement range. I-V technique
also allows probing for in-circuit testing. Table 2 is a summary of all of Agilent's impedance
products. It is designed to assist you in better comparing
• RF I-V, an enhancement of the I-V technique, offers Agilent's wide range of instrumentation and in choosing
some of the high-frequency benefit of network analysis possible solutions for your applications, depending on
while retaining some of the impedance measurement your requirements in the following areas:
range of the I-V technique. Designed for accuracy and
high-frequency performance, the RF I-V technique is • Test frequency range
excellent for RF component analysis, especially for
• Device type or application type
small inductance and capacitance values.
• Accuracy requirement (measurement technique)
• Network analysis offers the highest frequency coverage, • Any other special needs
but works best when the measurement range is close
to 50 Ω. With this measurement technique, impedance If you find several possible solutions for your application,
values are derived from reflection coefficients. Network go to the corresponding pages to find more details about
analysis is most widely used for RF and microwave each product. Call Agilent if you need further assistance.
component and circuit analysis.

Table 2. Agilent impedance measurement products

Product Freq. Purpose Model Page Frequency Basic Z Measurement Feature 5 Measurement Main
type range range (Hz) accuracy 1 (%) display range (Ω) technique 6 application
Impedance RF High peformance E4991A 4 1 M to 3 G 0.8 200 m to 20 k 4 A,B RF I-V LCR component, material,
analyzer /multi function semiconductor
LF/HF High peformance 4294A 4 40 to 110 M 0.08 25 m to 40 M 4 A,B ABB LCR component, material,
/multi function semiconductor
probe measurement 4294A 4 40 to 110 M 1 50 m to 4 M 4 A,B IV LCR component, material,
with semiconductor
42941A
Combination RF Network/spectrum 4396B 3 5 100 k to 1.8 G 3 2 to 5 k 4 A,B RF I-V LCR component,
analyzer /impedance other passive component,
measurement active component,
circuit analysis
HF Network/spectrum 4395A3 5 100 k to 3 2 to 5 k 4 A,B RF I-V LCR component,
/impedance 500 M other passive component,
measurement active component,
circuit analysis
LCR meter RF High performance 4287A 6 1M to 3G 1 200 m to 3k 4 C RF I-V LCR component
/multi function
HF High performance 4285A 7 75 k to 30 M 0.1 0.01 m to 100 M D ABB LCR component, material,
/multi function semiconductor
LF High performance E4980A 7 20 to 2 M 0.05 1.000000 a to D ABB LCR component, material,
/multi function 999.9999 E semiconductor
LF High performance 4284A 7 20 to 1 M 0.05 0.01 m to 100 M D ABB LCR component, material,
/multi function semiconductor
LF Low-cost 4263B 8 100 to 100 k 0.1 0.01 m to 100 M D ABB LCR component, transformer
/multi function
Application LF For high-value 4268A 9 120 & 1 k 0.18 0.1 p to 10 mF 2 D ABB MLCC
specific capacitor only
measurement
LF For capacitor 4288A 9 1 k and 1 M 0.07 0.00001 p to D ABB Ceramic capacitor
measurement only 20 µF 2
LF For milliohm 4338B 8 1 k only 0.4 10 µ to 100 k D OTR Connector, resistor
measurement
DC For high resistance 4339B 8, 9 DC only 0.6 1 k to 1.6X10 16 D OTR Transformer, capacitor
measurement 4349B 2 1 k to 1.0X10 15 Capacitor
LF For C-V 4279A 9 1 M only 0.1 0.00001 p to D ABB Diode
measurement 1280 pF 2

1. Basic Z accuracies are best-case values and 5. Feature code: A: Built-in equivalent circuit analysis 6. Measurement ABB: Auto-balancing bridge
vary depending on measurement conditions. B: Frequency sweep with color LCD display technique code: I-V: I-V method
See product data sheet for detail. C: Spot frequency with color LCD display RF I-V: RF I-V method
2. Capacitance measurement only. D: Spot frequency with LCD display NA: Network analysis
3. Requires Option 4395A-010, 4396B-010, and 43961A. OTR: Others
4. Z range shows the 10% accuracy range.

3
 Impedance Analyzers

Impedance analyzers provide high measurement accuracy

and sophisticated measurement functions:

• Frequency, DC bias, and AC voltage/current sweep

capability lets you customize where and how test data
will be taken.

• Built-in equivalent-circuit analysis computes a multi-

element circuit model of the device under test.

• Color LCD/CRT can display multiple sets of

measurement curves at the same time.

• Advanced calibration and compensation methods

reduce measurement errors.

4294A precision impedance analyzer

• Highly accurate 4-terminal-pair impedance measurement
in a wide frequency range of 40 Hz to 110 MHz.
Extremely small variation in component characteristics
can be precisely evaluated with sweep measurements
of 0.08% basic accuracy.

• Best instrument for component evaluation like capacitors,

inductors, resonators, semiconductors and for material
evaluations like PC boards and toroidal cores. Improves
evaluation efficiency with various measurement &
analysis functions.

• In-circuit or grounded measurements with the 42941A

Impedance Probe

• Built-in LAN interface

E4991A RF impedance/material analyzer • Measurement parameters: |Z|, |Y|, θ, R, X, G, B, L, C, D, Q

• Provides top-of-the-line solution for measuring impedance
from 1 MHz to 3 GHz, with an optional material-test
function for measuring permitivity and permeability.

• Ideal instrument for RF surface mount inductors,

capacitors, PC board materials and magnetic toroids.

• Measurement parameters: |Z|, |Y|, θ, R, X, G, B, C, L, D, Q

• Optional material parameters : ε, ε', ε", µ, µ', µ"

• Built-in LAN, GPIB interface

4
Network/Spectrum/Impedance Analyzers

These combination analyzers offer a cost-effective and

time-saving alternative. Instead of buying a rack full of
stand-alone test equipment and spending extra time to
make them work together, you can get a combination
analyzer that has all the functions you need and is ready to
go when you press the power-on button. For impedance
measurement, analyzers have the same advanced features
as the impedance analyzers described on page 4.

4395A network/spectrum/impedance
analyzer (with 43961A RF impedance test
kit and Option 4395A-010)
• 500 MHz three-in-one analyzer for components and
circuit design up to 500 MHz.

• Advanced features for meeting your future test

requirements: time gated spectrum analysis for
pulsed signal analysis, digital resolution bandwidth
4396B network/spectrum/impedance for faster sweeps, and more.
analyzer (with 43961A RF impedance test
• Best-valued bench-top tool for R&D
kit and Option 4396B-010)
• Built-in IBASIC function
• 1.8 GHz three-in-one analyzer with no sacrifice
in performance. • Optional dc bias source

• Advanced features for meeting your future test • Measurement parameters: |Z|, |Y|, θ, Γ, X, G, B, C,
requirements: time gated spectrum analysis for L, D, Q
pulsed signal analysis, digital resolution bandwidth
for faster sweeps, and more.

• Saves you money and time for RF component and

circuit analysis.

• Built-in IBASIC function

• Measurement parameters: |Z|, |Y|, θ, Γ, X, G, B, C,

L, D, Q

5
 Precision LCR Meters

Designed for measurement precision and ease-of-use,

this family of LCR meters fits both R&D and production
applications. Although the LCR meters do not have all
the sophisticated features as impedance analyzers, the LCR
meters offer excellent performance at an affordable price:

• Wide selection of frequency range from 20 Hz to 3 GHz.

• Frequency list sweep for continuos testing at multiple

frequency points.

• Great for general-purpose testing of leaded components

surface-mount components, materials, and more.

• GPIB and handler interface for easy test automation in

production environment. E4980A precision LCR meter
• 20 Hz to 2 MHz

• 0.05% basic accuracy

• Option E4980A-001 adds ±20 Vrms test signal and

±40 V internal dc bias voltage

• For testing power inductors and transformers, choose

Option E4980A-002, 42841A, and 42842A/B to get
up to 20 A dc bias current 1

• Measurement parameters: |Z|, |Y|, θ, R, X, G, B, L,

C, D, Q, Rdc, Idc, Vdc

4287A RF LCR meter

• 3 GHz LCR meter for precisely testing actual
characteristics of components at demanded RF
operating frequencies.

• RF I-V technique provides a wide impedance range

(0.2 Ω to 3 k Ω).

• 9 ms high speed measurement and 1% accuracy

suitable for production testing.

• Highly stable measurement of low-inductance and

excellent Q accuracy (6% @ Q=100, 100 MHz) for
meeting chip inductor test requirements.

• Handler, GPIB and LAN interfaces

• Measurements parameter |Z|, |Y|, θ, R, X, G, B, C, L, D, Q

1. 40A dc bias current, when using 2 x 42841A and 1 x 42842B.

6
 4285A precision LCR meter
• 75 kHz to 30 MHz

• 0.1% basic accuracy

• Option 4285A-001 adds ±40 V dc bias voltage

4284A precision LCR meter • Option 4285A-002, 42841A, and 42842C
provide up to 10 A dc bias current
• 20 Hz to 1 MHz
• Measurement parameters: |Z|, |Y|, θ, R, X, G, B, C, L, D, Q
• 0.05% basic accuracy

• Option 4284A-001 adds ±40 V internal dc bias voltage

• For testing power inductors and transformers, choose

Option 4284A-002, 42841A, and 42842A/B to get up to
20 A dc bias current 1

• Measurement parameters: |Z|, |Y|, θ, R, X, G, B, C, L, D, Q

1. 40A dc bias current, when using 2 x 42841A and 1 x 42842B.

7
 Basic Products

The following products are designed for basic or special-

purpose applications. Their features are optimized to achieve
maximum performance for the particular applications.

4338B milliohm meter

(10 µΩ to 100 kΩ)
• 1 kHz ac measurement with selectable test signal
current from 1 µ A to 10 mA
• Designed for ultra-low resistance measurements of
4263B LCR meter switches, batteries, relays, cables, connectors, and
• Spot frequency testing at 100 Hz, 120 Hz, 1 kHz, 10 kHz, PC boards.
and 100 kHz (optional 20 kHz) • Measurement parameters: R, X, |Z|, L, Q
• Compact, easy-to-use, entry-level LCR meter • Contact check function for reliable tests.
• Measurement parameters: |Z|, |Y|, θ, R, X, G, B, C, L, D, Q • Select the number of displayed digits (3, 4, or 5)
• Add N, M, DCR (Option 4263B-001) for
transformer/Coil measurements
• Set signal level (20 mV to 1 Vrms) in 5 mVrms steps
• Monitor actual ac voltage and current levels
• Select the number of displayed digit (3, 4, or 5)

4339B high-resistance meter

• Test voltage: 0.1 to 1000 Vdc
• Measurement range: R: 1 x 103Ω to 1.6 x 1016Ω,
I: 60 fA to 100 µ A
• Great solution for evaluating leakage current and
insulation resistance of components.
• Can be programmed to measure surface and volume
resistivity.
• Measurement parameters: I, R, surface, and volume
resistivity
• Contact check function for reliable tests.

8
Capacitance Meters

4268A 120 Hz/1 kHz capacitance meter 4288A 1 kHz/1 MHz capacitance meter
• Suitable for high value multi-layer ceramic capacitor • Two standard frequencies (1 kHz and 1 MHz) for
testing capacitor testing
• 120 Hz and 1 kHz test frequencies • Measurement speed and accuracy optimized for
• Constant test signal level and 25 msec high speed production testing
measurement by newly- developed high speed auto • Measurement parameters: C, D, Q, ESR, G
level control function.
• Measurement parameters: C, D, Q, ESR, G

Others

4279A C-V meter 4349B 4-channel high-resistance meter

• 1 MHz only for semiconductor C-V testing • 4-channel simultaneous testing 1
• Internal programmable dc bias sweep source • Fast contact check function for reliable testing
• Automatic bias polarity control for quick selection of • Measurement range:
the correct polarity bias voltage R: 1 x 103Ω to 1.0 x 1015Ω
• Measurement Parameters: C, D, Q, ESR, G I: 1 pA to 100 µ A

1. The 4349B has 4-measurement channels, with no internal dc source. An external dc source is required.
9
 Test Fixtures and Accessories (Four-Terminal-Pair)

Basic test fixtures

16034E SMD/chip test fixture 16034G small SMD/chip test fixture 16034H SMD/chip test fixture
Frequency: ≤ 40 MHz Frequency: ≤ 110 MHz Frequency: ≤ 110 MHz
Maximum dc bias: ±40 V Maximum dc bias: ±40 V Maximum dc bias: ±40 V
Suitable for array-type devices

16043A/B test fixture 16044A SMD Kelvin contact test 16334A SMD/chip tweezers
Frequency: ≤ 110 MHz fixture Frequency: ≤ 15 MHz
Maximum dc bias: ±40 V Frequency: ≤ 10 MHz Maximum dc bias: ±42 V
Maximum dc bias: ±40 V

16047A/D axial & radial test fixture 16047E test fixture 16089A/B/C/D/E clip leads
Frequency: A: ≤ 13 MHz, D: ≤ 40 MHz Frequency: ≤ 110 MHz Connector type: A/B/C/E: Kelvin
Maximum dc bias: A: ±35 V, D: ±40 V Maximum dc bias: ±40 V D: alligator
Frequency: 5 Hz to 100 kHz
Cable length: A/B/C/D: 0.94 m
E: 1.3 m

10
Test Fixtures and Accessories (Four-Terminal-Pair)

External DC bias fixtures

16065A axial and radial test fixture 16065C external bias adapter
with safety cover Frequency: 50 Hz to 1 MHz
Frequency: 50 Hz to 2 MHz Maximum externally supplied dc
Maximum externally supplied dc bias: ±40 V
bias: ±200 V Blocking capacitor of 50 µF is connect-
Blocking capacitor of 5.6 µF is connect- ed in series with the Hc terminal
ed in series with the Hc terminal

Test leads

16048A/D/E BNC test leads 16048B SMC test leads 16048G/H BNC test leads
Frequency: A: ≤ 30 MHz, D: ≤ 30 MHz, Frequency: ≤ 30 MHz Frequency: ≤ 110 MHz
E: ≤ 1 MHz Cable length: 0.94 m Cable length: G: 1 m, H: 2 m
Cable length: A: 0.94 m, D: 1.89 m, Maximum dc bias: ±40 V Maximum dc bias: ±40 V
E: 3.8 m Use with only 4294A
Maximum dc bias: ±40 V

Terminal adapters

42942A four-terminal-pair to 7 mm 16085B four-terminal-pair to 7 mm

terminal adapter terminal adapter
Frequency: ≤ 110 MHz Frequency: ≤ 40 MHz
Maximum dc bias: ±40 V Maximum dc bias: ±40 V
Use with only 4294A

11
 Test Fixtures and Accessories (Four-Terminal-Pair)

Others

42941A impedance probe kit 16060A transformer test fixture 16064B LED display/trigger box
Frequency: 40 Hz to 100 MHz Frequency: dc to 100 kHz For production test applications.
Maximum dc bias: ±40 V Use with only 4263B Use with only 4263B, 4338B, 4339B
Probe cable length: 1.5 m and 4349B
Use with only 4294A

Material measurements

16451B dielectric test fixture 16452A liquid test fixture

Measurement parameters: Measurement parameter:
capacitance (C), dissipation factor (D), capacitance (C), dielectric constant
and dielectric constant (εr', εr'') (εr', εr'') Liquid sample
Material-under-test size: Quantity: ≤ 6.8 ml
thickness: ≤ 10 mm Frequency: 20 Hz to 30 MHz
diameter: 10 to 56 mm
Frequency: ≤ 30 MHz

Balanced/unbalanced test fixture

16314A balanced/unbalanced 16315A1 50 Ω balanced/

4-terminal converter 50 Ω unbalanced converter
Frequency: 100 Hz to 10 MHz Frequency: 100 Hz to 10 MHz
Connectors: 4 BNCs (unbal.), 2 signal 16316A1 100 Ω Balanced/50 Ω
terminals (bal.) & 1 ground terminal Unbalanced Converter
Characteristic Z: 50 Ω Frequency: 100 Hz to 10 MHz
16317A1 600 Ω Balanced/50 Ω
Unbalanced Converter
Frequency: 100 Hz to 3 MHz 1. All have 1 BNC connector (unbalanced) and
2 signal terminals (balanced) and 1 ground terminal.

12
Test Fixtures and Accessories (7-mm Terminal)

RF SMD/chip components

16196A/B/C/D SMD test fixture 16197A bottom-electrode SMD 16092A axial, radial, and
Coaxial fixture for parallel test fixture SMD test fixture
electrode SMDs. Frequency: dc to 3 GHz Frequency: ≤ 500 MHz
Frequency: dc to 3 GHz Maximum dc bias: ±40 V Maximum dc bias: ±40 V
Maximum dc bias: ±40 V
Applicable SMD size:
16196A: 1.6 mm x 0.8 mm
16196B: 1.0 mm x 0.5 mm
16196C: 0.6 mm x 0.3 mm
16196D: 0.4mm x 0.2mm

16191A bottom-electrode SMD test 16192A parallel-electrode SMD 16194A high temperature component
fixture test fixture test fixture
Frequency: dc to 2 GHz Frequency: dc to 2 GHz Frequency: dc to 2 GHz
Maximum dc bias: ±40 V Maximum dc bias: ±40 V Maximum dc bias: ±40 V
Operating temperature: -55 °C to
+200 °C

Material measurements

16200B external DC bias adapter 16453A dielectric test fixture 16454A magnetic test fixtures
Frequency: 1 MHz to 1 GHz Frequency: 1 MHz to 1 GHz Frequency: 1 kHz to 1 GHz
External dc bias: up to 5 A, ±40 V Sample size (smooth sheets only): Sample size (toroids only):
thickness: 0.3 mm to 3 mm height: ≤ 8.5 mm
diameter: ≥ 15 mm inner diameter: ≥ 3.1 mm
outer diameter: ≤ 20 mm
13
 Simplify and Improve Your Measurements
with Agilent's Test Accessories
Selecting a test fixture is as important as selecting the right You will improve your measurement results with the
instrument. Agilent offers a wide range of accessories proper test fixture.
for axial, radial, and SMD/Chip devices. In addition, a • more reliable and repeatable measurement
variety of test leads are available to simplify remote testing • higher through-put
and systems applications. External test fixtures with • fewer handling errors
safety covers are also available. • tighter test limits
• better measurement accuracy

4396B-010 and 43961A

4395A-010 and 43961A
For additional product information and literature, visit our
Accessories Web site: www.agilent.com/find/accessories

4395A w/Option

4396B w/Option
4294A with

E4980A
E4991A
42942A
4268A
4279A
4284A
4285A
4287A
4288A
4294A
4263B
Table 3. Test accessories/fixtures
16034E SMD/chip test fixture DC-40 MHz • • • • • • • •
16034G SMD/chip test fixture, small DC-110 MHz • • • • • • • •
16034H SMD/chip test fixture, general DC-110 MHz • • • • • • • •
1643A/B 3-terminal SMD test fixture DC-110 MHz • • • • • • • •
16044A SMD/chip test fixture, Kelvin contacts, 10 MHz DC-10 MHz • • • • • • • •
16047A Axial and radial test fixture DC-13 MHz • • • • • • • •
16047D Axial and radial test fixture DC-40 MHz • • • • • • • •
16047E Axial and radial test fixture, 110MHz DC-110 MHz • • • • • • • •
16048A One meter test leads, BNC DC-30 MHz • • • • • • •
16048B One meter test leads, SMC DC-30 MHz • • • • • • •
16048D Two meter test leads, BNC DC-30 MHz • • • • • • •
16048E Four meter test leads, BNC DC-1 MHz • • •
16048G One meter test leads, BNC, 110 MHz DC-110 MHz •
16048H Two meter test leads, BNC, 110 MHz DC-110 MHz •
16060A Transformer test fixture DC-100 kHz •
16065A Ext. voltage bias with safety cover (<=200 vdc) 50 Hz-2 MHz • • • • • • • •
16065C External bias adapter (<=40 vdc) 50 Hz-1 MHz • • •
16085B Four-terminal pair to 7-mm adapter DC-40 MHz • • • • • • •
16089A/B/C/D/E Kelvin clip leads 5 Hz-100 kHz • • • • • • •
16092A RF spring clip: axial, radial and SMD DC-500 MHz •1 •1 •1 •1 •1 •4 •1 • • • •1 •
16094A RF probe tip/adapter DC-125 MHz • 1,2 • 1,2 • 1,2 • 1,2 • 1,2 • 2,4 • 1,2 •2 •2 •2 • 1,2 •2
16095A LF impedance probe DC-13 MHz •3 •3 •3 •3 •3 •3 •3
16191A Side (bottom) electrode SMD test fixture DC-2 GHz •1 •1 •1 •1 •1 •4 •1 • • • •1 •
16192A Parallel electrode SMD test fixture DC-2 GHz •1 •1 •1 •1 •1 •4 •1 • • • •1 •
16194A High temperature component test fixture DC-2 GHz •1 •1 •1 •1 •1 •4 •1 • • • •1 •
16196A/B/C/D Parallel electrode SMD test fixture DC-3 GHz •1 •1 •1 •1 •1 •4 •1 • • • •1 •
16197A Bottom electrode SMD test fixture DC-3 GHz •1 •1 •1 •1 •1 •4 •1 • • • •1 •
16200B External DC bias adapter 1 MHz-1 GHz •4 • • • •
16314A 4-terminal balun (50 Ω bal. to 50 Ω unbal.) 100 Hz-10 MHz • • • • • • • •
16315A One terminal (BNC) Balun (50 Ω bal. to 50 Ω unbal.) 100 Hz-10 MHz • •
16316A One terminal (BNC) Balun (100 Ω bal. to 50 Ω unbal.) 100 Hz-10 MHz • •
16317A One terminal (BNC) Balun (600 Ω bal. to 50 Ω unbal.) 100 Hz-3 MHz • •
16334A SMD/chip tweezer DC-15 MHz • • • • • • • •
16451B Dielectric material test fixture 5 Hz-30 MHz • • • • • • • •
16452A Liquid test fixture 20 Hz-30 MHz • • • •
16453A Dielectric material test fixture 1 MHz-1 GHz •
16454A Dielectric material test fixture 1 kHz-1 GHz • •
42842A/B High bias current 20 A/40T test fixture 20 Hz-1 MHz • •
42842C High bias current 10 A test fixture 75 kHz-30 MHz •
42941A Impedance probe kit DC-110 MHz •
42942A Four-terminal pair to 7-mm adapter DC-110 MHz •

Note: Refer to the accessory descriptions for frequency and operational limits.
1. Compatible when used in conjunction with 16085B.
2. 7-mm cable is required
3. Do not connect the ground lead to the instrument
4. 3.5-mm (M) to 7-mm adapter is required
14
Applications Information

Helping you make better measurements

Agilent's application knowledge can help you make better
measurements.Use the matrix below to select the Agilent
Application Notes of interest. For copies of these
Application Notes, contact your local Agilent Technologies
sales office. "8 Hints for successful Impedance Measurement"
(P/N 5968-1947E) and "The Impedance Measurement
Handbook" (P/N 5950-3000) are comprehensive guide to
impedance measurements.

Beginning with the basics it contains in-depth practical

advice to help you make better measurements. These
documents answer many commonly asked questions.
To get your copy, contact your local Agilent Technologies
sales office.

Table 4. List of application notes

Kind NumberTitle Product P/N
OT - Impedamce Measurement Handbook 2nd Edition General 5950-3000
OT - Accessories Selection Guide For Impedance Measurement General 5965-4792E
AN 346-2 Balanced Circuit Measurement with an Impedance Analyzer/LCR Meter/Network Analyzer General AN 5091-4480E
AN 346-3 Effective Impedance Measurement Using OPEN/SHORT/LOAD Correction General AN 5091-6553E
AN 346-4 8 Hints for Successful Impedance Measurements General AN 5968-1947E
PN - 16196A/B/C/D Correlating RF Impedance Measurements When Using SMD Test Fixtures 16196A/B/C/D 5980-1336E
AN 1305-3Effective Transformer/LF Coil Testing 4263B 5967-5377E
AN 1305-4Effective Electrolytic Capacitors Testing 4263B 5967-5378E
AN 1224-5Effective Multi-tap Transformer Measurement using a Scanner and the 4263B LCR Meter 4263B 5091-6310E
AN 369-1 Optimizing Electronic Component and Material Impedance Measurements 4284A 5950-2949
AN 369-3 Impedance Measurements of Magnetic Heads Using Constant Current 4284A 5950-2951
AN 369-5 Multi-frequency C-V Measurements of Semiconductors E4980A/4284A 5950-2953
AN 369-6 Impedance Testing Using Scanner 4284A 5950-2975
AN 369-7 Measurement of Capacitance Charcteristics of Liquid Crystal Cell E4980A/4284A 5950-2994
AN 369-8 Wide Range DC Current Biased Inductance Measurement E4980A/4284A 5950-2367
AN 369-9 Improve Electronic Product Quality and Performance with Agilent Precision LCR Meters E4980A/4284A 5090-0233
AN 369-12Measurement of Impedance of Magnetic Heads 4285A 5965-6663E
PN 4294-1Reliable Electronic Component Evaluation and Circuit Design with the 4294A 4294A 5968-4505E
110 MHz Precision Impedance Analyzer
PN 4294-2 New Technologies For Accurate Impedance Measurements (40 Hz to 110 MHz) 4294A 5968-4506E
PN 4294-3 Evaluation of MOS Capacitor Oxide C-V Characteristics Using the 4294A 4294A 5988-5102EN
PN E4991A-1 New Generation Analyzer Offers Exceptional and Powerful Analysis Functions for E4991A 5988-0200EN
RF Impedance Measurement
PN E4991A-2 Achieving Fast Cycle Time Using an Electronic Design Automation (EDA) Tool and the E4991A 5988-3029EN
E4991A RF Impedamce/Material Analyzer
AN 1369-1 Solutions for Measuring Permittivity and Permeability with LCR Meters and Impedance Analyzers E4991A 5980-2862EN
AN 1369-2 Advanced Impedance Measurement Capabllity of the RF I-V Method Compared to the E4991A 5988-0728EN
Network Analysis Method
AN 1369-3 Accurate Impedance Measuremnet with Cascade Microtech Probe System E4991A 5988-3279EN
AN 1305-1 Contact Resistance and Insulation Resistance Measurements of Electro-Mechanical Components 4338B/4339B 5968-0325E
AN 1288-1 Combining Network and Spectrum Analysis and IBASIC to Improve Deveice Characterization and Test Time 4396B 5965-7656E
AN 1288-2 Configuring the 4396B 1.8 GHz Network/Spectrum Impedance Analyzer for O/E Testing 4396B 5965-7657E
AN 1288-4 How to Characterize CATV Amplifires Effectively 4396B 5965-9434E
PN 4395/96-1 How to Measure Noise Accurately Using the Agilent Combination Analyzers 4396B 5966-2292E
PN 4395-1 4395A Network/Spectrum/Impedamce Analyzer ADSL Copper Loop Measurements 4395A 5968-1196E
PN 4395-2 4395A Network/Spectrum/Impedamce Analyzer Switching Power Supply Evaluation 4395A 5968-7274E
AN 1308-1 “Network,Spectrum and Impedance Evaluation of Electronic Circuits and Components” 4395A 5967-5942E

15
Complementary Products and Remove all doubt
Accessories
Our repair and calibration services will get your equipment
To help you find a complete solution, we have listed the back to you, performing like new, when promised. You will get
following companies that make complementary products full value out of your Agilent equipment throughout its lifetime.
orspecialized accessories for Agilent's impedance measure- Your equipment will be serviced by Agilent-trained technicians
ment products. Please contact each company directly if using the latest factory calibration procedures, automated
you are interested in its products. (Agilent does not make repair diagnostics and genuine parts. You will always have the
any special endorsement of these companies’ products; utmost confidence in your measurements.
this list is for reference only.)
Agilent offers a wide range of additional expert test and
Company name Product specialty/ Web site address measurement services for your equipment, including initial
expertise start-up assistance, onsite education and training, as well as
Cascade RF and microwave probers www.cascademicrotech.com/ design, system integration, and project management.
Microtech, Inc. and accessories for
semiconductor and
For more information on repair and calibration services, go to
IC applications.
Inter-continental Automated device handling www.icmicrowave.com/
Microwave (ICM) systems, RF and microwave
www.agilent.com/find/removeal l d oubt
test fixtures and non-coaxial
calibration standards.
North Hills Wide-band transformers www.northhills-sp.com/ www.agilent.com
Signal Processing (baluns) for balanced
measurement.
For more information on Agilent Technologies’ products,
Espec/ Temperature chamber for www.espec.com/
ESPEC Corp. component and material www.espec.co.jp/english applications or services, please contact your local Agilent office.
(America) testing. The complete list is available at:
BH Electronics Wideband transformers www.bhelectronics.com/
ArumoTech (Asia) Custom test fixtures www.arumotech.com/en www.agilent.com/find/contactus

Phone or Fax
Agilent Web Resources United States: Korea:
LCR Meters: (tel) 800 829 4444 (tel) (080) 769 0800
www.agilent.com/find/lcrmeters (fax) 800 829 4433 (fax) (080) 769 0900
Canada: Latin America:
RF & MW test accessories: (tel) 877 894 4414 (tel) (305) 269 7500
www.agilent.com/find/accessories (fax) 800 746 4866
Taiwan:
China: (tel) 0800 047 866
Agilent Email Updates (tel) 800 810 0189 (fax) 0800 286 331
(fax) 800 820 2816
www.agilent.com/find/emailupdates Other Asia Pacific
Get the latest information on the products and applications Europe: Countries:
you select. (tel) 31 20 547 2111 (tel) (65) 6375 8100
Japan: (fax) (65) 6755 0042
Agilent Direct (tel) (81) 426 56 7832 Email: [email protected]
www.agilent.com/find/agilentdirect (fax) (81) 426 56 7840 Revised: 11/08/06

Quickly choose and use your test equipment solutions with

confidence. Product specifications and descriptions in this document subject
to change without notice.
Agilent
Open
© Agilent Technologies, Inc. 2003, 2005, 2006
www.agilent.com/find/open Printed in USA, December 16, 2006
Agilent Open simplifies the process of connecting and programming 5952-1430E
test systems to help engineers design, validate and manufacture
electronic products. Agilent offers open connectivity for a broad
range of system-ready instruments, open industry software, PC-
standard I/O and global support, which are combined to more
easily integrate test system development.

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